This document provides examples of different microscopy techniques at various magnifications to analyze material samples. It includes images taken with bright field, darkfield, differential interference contrast, crossed polarizers with a sensitive tint plate, and combinations of techniques of samples such as aluminum nitride with metal layers, a nickel/chromium coating on steel, and other unspecified materials at magnifications of x200 and x400.
This document provides examples of different microscopy techniques at various magnifications to analyze material samples. It includes images taken with bright field, darkfield, differential interference contrast, crossed polarizers with a sensitive tint plate, and combinations of techniques of samples such as aluminum nitride with metal layers, a nickel/chromium coating on steel, and other unspecified materials at magnifications of x200 and x400.
This document provides examples of different microscopy techniques at various magnifications to analyze material samples. It includes images taken with bright field, darkfield, differential interference contrast, crossed polarizers with a sensitive tint plate, and combinations of techniques of samples such as aluminum nitride with metal layers, a nickel/chromium coating on steel, and other unspecified materials at magnifications of x200 and x400.
This document provides examples of different microscopy techniques at various magnifications to analyze material samples. It includes images taken with bright field, darkfield, differential interference contrast, crossed polarizers with a sensitive tint plate, and combinations of techniques of samples such as aluminum nitride with metal layers, a nickel/chromium coating on steel, and other unspecified materials at magnifications of x200 and x400.