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Layout Design Rules

Amir M. Sodagar
Spring 2003

K.N.Toosi University of
Amir M. Sodagar Technology ١
Layout of An MOS Transistor
‰ MOS Transistor

‰ A partially-finished
transistor

‰ The corresponding
layout of the Active,
Poly, and Contact
masks (for a minimum-
size transistor)

For a min. size tr.:


AS=AD=5λW, PS=PD=10λ+W [1]

Amir M. Sodagar K.N.Toosi University of Technology ٢


Why design rules?
‰ Minimum width
‰ An excessively narrow poly rectangle:

Layout After fabrication

It may simply break or at least suffer from a large local resistance

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Why design rules?
‰ Spacing

Mask misalignment that results in catastrophic short circuits


and an example of a non-catastrophic misalignment
Amir M. Sodagar K.N.Toosi University of Technology ٤
Why design rules?
‰ Spacing
¾ Two excessively close poly lines

Layout After fabrication

A short may occur between the two lines after fabrication.

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Design Rules
‰ Minimum spacing
between active and
poly

‰ Enclosure rule for poly


and metal surrounding
a contact

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Design Rules
‰ Extension of poly beyond the gate area

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Design Rules
‰ Layout of a differential pair with PMOS current-
source loads

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Design Rules
‰ Design Rules for a Double-Metal, Double-
Polysilicon, N-Well, Bulk CMOS Process.

Minimum Dimension Resolution (λ)


‰ 1. N-Well
¾ 1A. width .................................….....................………………….......6
¾ 1B. spacing (same potential)......….......................………………......8
¾ 1C. spacing (different potential) ................…..……………….........22

‰ 2. Active Area (AA)


¾ 2A. width ........................................................……………….............4

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Design Rules
Spacing to Well
¾ 2B. AA-n contained in n-Well ..................…………………..................1
¾ 2C. AA-n external to n-Well.................................…………………....10
¾ 2D. AA-p contained in n-Well ...........................…………………….....3
¾ 2E. AA-p external to n-Well...................................…………………....7
Spacing to other AA (inside or outside well)
¾ 2F. AA to AA (p or n) .........................................…………………...…3

‰ 3. Polysilicon Gate (Capacitor bottom plate)


¾ 3A. width........................................................……………….......….....2
¾ 3B. spacing...................................................……………….........…....3
¾ 3C. spacing of polysilicon to AA (over field)....…………………..........1
¾ 3D. extension of gate beyond AA (transistor width direction) ……….2
¾ 3E. spacing of gate to edge of AA (transistor length direction) ……..4

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Design Rules
‰ 4. Polysilicon Capacitor top plate
¾ 4A. width...................................................................……………......2
¾ 4B. spacing...................................................................…………......2
¾ 4C. spacing to inside of polysilicon gate (bottom plate)………….....2
‰ 5. Contacts
¾ 5A. size ........................................................................……….....2x2
¾ 5B. spacing..................................................................………..........4
¾ 5C. spacing to polysilicon gate ....................................………….....2
¾ 5D. spacing polysilicon contact to AA.......................………….........2
¾ 5E. metal overlap of contact .....................................………….........1
¾ 5F. AA overlap of contact .........................................……....…….....2
¾ 5G. polysilicon overlap of contact ..................................…………...2
¾ 5H. capacitor top plate overlap of contact........................……….…2
‰ 6. Metal-1
¾ 6A. width.........................................................................………......3
¾ 6B. spacing.....................................................................………......3

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Design Rules
‰ 7. Via
¾ 7A. size .......................................................................……….......3x3
¾ 7B. spacing................................................................………............4
¾ 7C. enclosure by Metal-1...........................................………............2
¾ 7D. enclosure by Metal-2..........................................……….............2
‰ 8. Metal-2
¾ 8A. width...................................................................…………..........4
¾ 8B. spacing...............................................................……….............3
Bonding Pad
¾ 8C. spacing to AA.......................................................……….........24
¾ 8D. spacing to metal circuitry ......................................……….......24
¾ 8E. spacing to polysilicon gate ....................................…….…......24
‰ 9. Passivation Opening (Pad)
¾ 9A. bonding-pad opening......................………....100 mm x 100 mm
¾ 9B. bonding-pad opening enclosed by Metal-2 ...........…….…........8
¾ 9C. bonding-pad opening to pad opening space ..........………......40

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Design Rules

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Design Rules

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Design Rules

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Design Rules

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Layout Design
‰ A series connection of two MOS transistors

A single junction (J3) is shared


between Q1 & Q2.
ÎThe area and specially the
perimeter of this junction gets
much smaller.
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Layout Design
‰ A CMOS Digital Inverter

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Layout Design
‰ Realization of a large transistor

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Layout Design
‰ A common-centroid layout

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Layout of Passive Devices
‰ A simplified layout of a capacitor array

Amir M. Sodagar K.N.Toosi University of Technology ٢١


Layout of Passive Devices
‰ Resistor Layout

A typical layout for an A more accurate, but larger,


integrated resistor layout for a resistor
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Undesired Effects
‰ Parasitic capacitance of the interconnects
¾ Parallel plate and fringe capacitance of an
interconnect

Amir M. Sodagar K.N.Toosi University of Technology ٢٣


Undesired Effects
‰ Latch-up Problem
NMOS PMOS
Cross section of a CMOS
inverter with superimposed
schematic of the parasitic
transistors responsible for
the latch-up mechanism

The equivalent The voltages


circuit of the after latch-up
parasitic bipolar has occurred
transistors

Amir M. Sodagar K.N.Toosi University of Technology ٢٤


Multi-Metal-Layer Processes
‰ Cross-over Metal

Metal Metal
Metal 2

Oxide
Metal 1
n+ or p+ Diffusion

Metal Metal

Metal 2

n+ or p+
Diffusion
Metal Metal 1

In Single-Metal In Double-Metal
Processes Processes
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Multi-Metal-Layer Processes

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Multi-Metal-Layer Processes
‰ Via

Metal 2

Metal 1
Oxide

Amir M. Sodagar K.N.Toosi University of Technology ٢٧


Layout vs. Die Photo
‰ University of Michigan BiCMOS Process

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Layout vs. Die Photo
‰ A 2mmx2mm Chip, AMI 1.6μm N-Well CMOS through MOSIS

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Terminology

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Die Photo

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Die Photo

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Die Photo

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Test & Monitoring After Fab

K.N.Toosi University of
Amir M. Sodagar Technology ٣٤
A Wafer

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Wafer Slice
‰ Dice on a wafer slice

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Holding a Die By a Tweezer

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Un-bonded Chip
‰ A 2mmx2mm Chip

Amir M. Sodagar K.N.Toosi University of Technology ٣٨


Probe Station
‰ Binocular microscope with platform for
micromanipulators
‰ Micromanipulators with sharp tips for
electrical and mechanical probing of
substrate
‰ Long focal depth microscope is needed
‰ Various designs possible, useful features:
¾ Move sample stage relative to probes
¾ Move microscope relative to sample and probes
¾ Zoom, video camera
EE527 - Microfabrication Techniques, University of Washington, 2000

Amir M. Sodagar K.N.Toosi University of Technology ٣٩


Probe Station

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Micromanipulator

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Probe Tips

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Micro-photograph of a 2mmx2mm Die

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Bonding Pads

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Test Points

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Fusible Links

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