Ellipsometry (Silicon)

Theoretical Refractive Index:

ZnO: 1.99
ZTO: <2.1
Method/
Film

30 Angle

50 Angle

Thickness (nm)

Refractive Index

Thickness (nm)

Refractive Index

M1: ZnO

83.0742

1.967764

83.0273

2.034415

M2: ZnO

82.9668

1.968240

83.9809

2.035605

M2: ZTO

82.9344

1.968954

83.9229

2.033939

Averaged Values
Method/ Film

Thickness (nm)

Refractive Index

M1: ZnO

83.0508

2.001090

M2: ZnO

83.4739

2.001923

M2: ZTO

83.4287

2.001447

* Neglected 70 Angles due as values did not fall into range of refractive indexes.

UV/ Vis Spectrometry (Quartz)

Theoretical Band Gap:
ZnO: 3.37eV
ZTO: 3.3eV 3.9eV
See Data.xls A lot of noise, will be re-characterised.
Method/ Film

Average Band Gap

Remarks

M1: ZnO

3.0925eV

M2: ZnO

2.9942eV

Bad Scattering

M2: ZTO

3.7216eV

Unclear Transition

Best Tauc Plots:

M1 ZnO

M2 ZnO

0.024

0.02

0.039

y = 0.0296x - 0.0916

0.019

M2 ZTO

y = 0.0331x - 0.1028
0.029

0.015

0.019

0.01

0.009

0.005

0.014
0.009
0.004
-0.001

-0.001
0

0
0