X-Ray Diffraction

Waves of wavelength comparable to the crystal lattice spacing are strongly scattered (diffracted).
Analysis of the diffraction pattern allows to obtain information such as lattice parameter,
crystal structure, sample orientation, and particle size. We will only mention that lattice
parameters are obtained from the Bragg formula:
2d sin = n, (5.1) where d is the lattice spacing.
In a typical set-up, a collimated beam of X-rays is incident on the sample. The intensity
of the diffracted X-rays is measured as a function of the diffraction angle 2 (Fig. 5.1). The
intensities of the spots provide information about the atomic basis. The sharpness and shape
of the spots are related to the perfection of the crystal. The two basic procedures involve
either a single crystal or a powder. With single crystals, a lot of info about the structure can be
obtained. On the other hand, single crystals might not be readily available and orientation of the
crystal is not straightforward.

One disadvantage of XRD is the low intensity of diffracted beam for low-Z materials.