Scanning electron microscope

The HITACHI S-3400N SEM is used for low to

medium

magnification

studies

of

variety

of

specimens; starting from failure analysis to microcompositional analysis . Samples of all shapes, sizes
and types can be examined using the SEM and it the
most heavily used microscope in the laboratory. This
SEM is in operation at NML from January 2006.
Technical Specifications/Features:
Variable accelerating voltage: 200 to 30,000V
Variable probe current: 1x10E-8 to 1x10E-12 Amps
Maximum sample size: 127 mm
Working distances: 5 to 65mm
Sample rotation: 360
Equipment location:- MST

Sample tilting: -20 to + 90

Make & Model:- HITACHI S-3400N

Variable magnification: 10x to 300,000x

Maximum resolution: 3 nm

Specification:- It is related to the area of Materials

Characterization
Reseaarch Area:- Microstructural Characterization
Range & Resolution:- Variable magnification: 10x to
300,000x

Detectors: ET Secondary Electron (SE), Solid state,

Backscattered Electron (BSE) detectors and Energy
Dispersive X-ray Spectrometry (EDS),HKL-EBSD
Detector.
Equipped with Thermo NORAN EDS capable of
detecting Ba to U and forming Xray maps/line of

Contact:-

Director , National Metallurgical

Laboratory, Jamshedpur

Contact ID:-

director@nmlindia.org

Contact No:-

0657- 2345202/28

composition; composition to within 0.1 wt%

Integrated digital imaging system
Application:- High resolution microscopy
.