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Athens/Institution Login Not Registered? User Name: Password
Athens/Institution Login Not Registered? User Name: Password
Athens/Institution Login Not Registered? User Name: Password
PDF (109 K)
doi:10.1016/0026-2714(83)91216-7
Copyright © 1983 Published by Elsevier Science Ltd.
World abstract on microelectronics and reliability 2. Reliability of components,
tubes, transistors and ICs