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LteEnode An NSD TM Ae
LteEnode An NSD TM Ae
Maximum
Spatial Downlink
Maximum
Uplink
Downlink Data
Multiplexing
Uplink Data
64QAM
(Mbps) (Mbps)
Category 1
Category 2
Category 3
Category 4
Category 5
10.296
51.024
102.048
150.752
299.552
1
2
2
2
4
5.160
25.456
51.024
51.024
75.376
No
No
No
No
Yes
1.4
6
72
1.08
3
15
180
2.7
5
25
300
4.5
WEBSITE: www.jdsu.com/test
10
50
600
9
15
75
900
13.5
20
100
1,200
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Modulation Schemes
Test Configuration
The following procedure configures the instrument to properly test the transmitted LTE signals
directly connected into eNodeB. For the external offset, consider the actual offset of the port plus the
test cable loss. The following example considers a 40 dB loss for simplicity. The procedure uses LTE
Band 13 channel 5230 (751 MHz) but the same process applies to any other channel assignment.
JD740 Procedure for eNodeB Test
LTE Signal Analysis Mode for eNodeB Transmission
Saving Results
Follow this procedure to save results on a USB memory device connected into the USB Host port of the base
station analyzer.
JD740 Procedure for Saving Results
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Note: In the screen shot for Channel Power Results, the Channel Power is 32.38 dBm, but it may be higher. A 2 dB
value should be prescribed for the operating mode of the eNodeB.
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Note: The TX2 test requires changing the antenna port setting. Enter the Cell ID registered on TX1 test if the eNodeB is not transmitting P-SCH
and S-SCH signals.
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Frames Test
Definition of Frames
The frame measurement provides the EVM expressed in percentage, power (dB or dBm) and modulation type
of each control channel, such as P-SCH, S-SCH, PBCH, PCFICH, PHICH, PDCCH, RS, and data channel,
such as PDSCH-QPSK, PDSCH-16QAM, PDSCH-64QAM, on a complete LTE frame.
Requirements for Frames
For all bandwidths, the EVM measurement must be performed over all allocated resource blocks and
subframes within a frame. The EVM for different modulation schemes on PDSCH must be lower than
these limits:
PDSCH-QPSK: 17.5 percent
PDSCH-16QAM: 12.5 percent
PDSCH-64QAM: 8 percent
JD740 Procedure for Frames
Note: Register the Cell ID value that is auto-discovered; manual entry may be required for TX2 testing if the
eNodeB does not transmit P-SCH and S-SCH on TX2.
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Subframe Test
Definition of Subframes
The subframe measurement provides the EVM expressed in percentage, the power (dB or dBm) and
modulation quality of each control channel, such as P-SCH, S-SCH, PBCH, PCFICH, PHICH, PDCCH, RS,
and data channels, such as PDSCH-QPSK, PDSCH-16QAM, PDSCH-64QAM, on an LTE subframe.
Requirements for Subframes
The modulated carrier frequency of the Base Station must be accurate to within 0.05 ppm observed over a
period of one subframe (1 ms).
JD740 Procedure for Subframes
Note: Performing transmission tests are required for TX1 and TX2 ports on each sector (Alpha, Beta, and Gamma).
Addendum 1 provides a Generic eNodeB Commissioning Test Check List.
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ID Scanner Test
Definition of ID Scanner Test
LTE mobiles must receive signals on the same channel from multiple cell sites at the edge of each cell to ensure
seamless handovers between cells, making it critical to characterize the signal dominance of adjacent cell sites
measuring the primary and secondary sync channels.
The ID Scanner identifies the six strongest cell sites indicating their corresponding physical cell identity in
terms of Cell ID, Group ID, and Sector ID. It measures dominance and power of the primary and secondary
sync channels (P-SCH and S-SCH) for each cell site.
JD740 Procedure for ID Scanner Test
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Datagram Test
Definition of Datagram Test
The datagram test measures the power variation over time for all the resource blocks contained on the LTE
channel indicating data utilization over time. The datagram indicates traffic demand to prevent channel
saturation and bandwidth performance ensuring the availability of all data channels.
JD740 Procedure for Datagram Test
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eNodeB Reception
Use the following procedure to configure the instrument to properly test the receiving noise floor for LTE
signals on the eNodeB.
JD740 Procedure for Spectrum Analysis Mode
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Noise Floor
Definition of Noise Floor
Noise Floor measures the reference sensitivity level as the minimum mean power received that must meet a
throughput requirement for a specified reference measurement channel.
Requirements for Noise Floor
The throughput must be 95 percent of the maximum throughput for the reference measurement channel
with a reference sensitivity power level of 101.5 dBm.
JD740 Procedure for Noise Floor
Test
Criteria
Cell ID
Group ID
Sector ID
Channel Power
__ x dBm __
Occupied
Bandwidth
Pass/Fail
SEM
Pass/Fail
ACLR
Pass/Fail
P-SCH Power
__ x dBm __
P-SCH Power
__ x dBm __
PCFICH Power
__ x dBm __
PBCH Power
__ x dBm __
EVM
0 x %< 5
Frequency
error
Alpha TX1
Alpha TX2
Beta TX1
Beta TX2
Gamma
Gamma
TX1
TX1
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JD740 Procedure for Setting RF Test Limits for Spectrum Emissions Mask, ACLR, and
Spurious Emissions
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Setting Modulation Test Limits for EVM RMS and EVM Peak
Select the test parameter and enable the test limit
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Define result storage location (Internal or USB) and screen results to be saved (All or Fail)
The instrument will perform all of the selected measurements and upon completion will display the Auto
Measure Settings screen.
To view the summary results
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LATIN AMERICA
ASIA PACIFIC
EMEA
Product specifications and descriptions in this document subject to change without notice. 2011 JDS Uniphase Corporation
WEBSITE: www.jdsu.com/test
LTE eNODEB.AN.NSD.TM.AE
September 2011