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Raman Line-Shape Analysis of Nano-Structural Evolution in Cation-Ordered Zrtio - Based Dielectrics
Raman Line-Shape Analysis of Nano-Structural Evolution in Cation-Ordered Zrtio - Based Dielectrics
Raman Line-Shape Analysis of Nano-Structural Evolution in Cation-Ordered Zrtio - Based Dielectrics
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Abstract
It is known that the microwave dielectric characteristics of ZrTiO4 are greatly influenced by processing conditions such as the
degree of Sn-modification and the cooling rate after sintering. The effects of these processing variables on the nano-structural
characteristics of ZrTiO4-based dielectrics were studied by analyzing the Raman line-shape parameters using the phononconfinement model. It was shown that the nano-structural shape of the cation-ordered domains underwent a sequential change
from thin-slab form to platelet shape, and finally to spherical shape with increasing Sn-content or cooling rate.
q 2003 Elsevier Ltd. All rights reserved.
PACS: 78.30.Ly; 77.84.Dy; 64.70.Rh; 64.60.Cn
Keywords: A. Nanostructure; A. Oxides; C. Raman spectroscopy; D. Phonons
1. Introduction
Dielectric resonator now becomes the key element in
modern microwave integrated devices. Dielectric materials
for the resonator should possess high dielectric permittivity
1r ; small temperature coefficient of resonant frequency
tcf ; and low dielectric loss tan d [1]. Zirconium titanate
(ZrTiO4)-based dielectrics meet all of these requirements
(1r < 35; tcf < 2 ppm=8C; tan d < 1:0 1024 ) and have
been widely used as dielectric filters, oscillators, and MIC
substrates [2]. The microwave dielectric properties of
ZrTiO4-based materials are very susceptible to processing
conditions. Among these processing variables, the degree of
Sn-modification and the cooling rate are known to be the
most important parameters [3]. Accordingly, extensive
efforts have been made to establish processing-structureproperty relationships [3 9].
It is known that the high-temperature phase of ZrTiO4
polymorphs has the orthorhombic a-PbO2 structure (space
* Corresponding author. Tel.: 82-54-279-2138; fax: 82-54279-2399.
E-mail address: hmjang@postech.ac.kr (H.M. Jang).
0038-1098/03/$ - see front matter q 2003 Elsevier Ltd. All rights reserved.
doi:10.1016/S0038-1098(03)00463-0
434
Y.K. Kim, H.M. Jang / Solid State Communications 127 (2003) 433437
2. Experimental section
ZrTiO4 (ZTO) and Zr12xSnxTiO4 (ZST) polycrystalline
ceramic specimens used in this study were prepared
employing a high-purity sol gel processing route [3]. The
pressed pellets were sintered at 1500 8C for 4 h, and the
sintered specimens were cooled with an initial cooling rate
of 300 8C/h down to 1250 8C. Various cooling rates were
then employed for the subsequent cooling of ZTO for the
temperature range between 1250 and 1000 8C. This was
done to critically assess the effect of the cooling rate on the
degree of short-range ordering associated with the transition
to the IC phase. Except for one particular pellet that was
directly quenched by immersing it into water at 1250 8C, all
other ZTO specimens were then air-quenched immediately
after they had reached 1000 8C to isolate the IC phase that
was not thermodynamically stable at room temperature. In
case of the sintered ZST, the cooling rate between 1250 and
1000 8C was fixed at 3 8C/h.
Analysis of local composition, as examined using a FESEM/EDS, did not indicate any non-stoichiometric compositional deviation (, 1 at.%) for both interior grain and
grain-boundary regions. ICP (inductively coupled plasma)
analysis indicated that the total impurity level of ceramic
specimens was less than 0.5 at.%.
To obtain information on the mode symmetry of Raman
peaks, especially for the peak at near 810 cm21, we
separately prepared an incommensurately ordered singlecrystal of ZTO. It was grown by slowly cooling (1 8C/h) the
solution containing a Li2MoO4 MoO3 flux from 1300 to
900 8C after the mixing process at 1300 8C for 24 h. The
single-crystal of ZTO had well defined (001) and (110)
planes, and the crystallinity of the single crystal was
assessed by examining its XRD u-rocking curve. The
measured XRD line was very narrow with the FWHM value
less than 0.118, indicating a high degree of the crystallinity.
Raman spectra of various ZrTiO4-based ceramics and a
single crystal were obtained using a NRS2100 Raman
spectrometer (JASCO, Japan) equipped with a triple-grating
monochromator and a Coherent Innova 90C Ar-laser
operating at 514.5 nm with the power of 300 mW. It has a
spectral resolution of 1 cm21. The measurement was
performed with a micro-Raman option using a backscattering configuration. For the polarized scattering of the singlecrystal ZrTiO4, we employed ZYYZ and ZYXZ scattering
geometries, where X; Y; and Z are parallel to [100], [010],
and [001] directions, respectively.
Y.K. Kim, H.M. Jang / Solid State Communications 127 (2003) 433437
435
namely:
Iv
BZ
lCq0 0; ql2 dq
with
v 2 v0 q2 G0 =22
1
0
L =4
2 2
f qe2q
dq
v 2 v0 q G0 =2 2
2
436
Y.K. Kim, H.M. Jang / Solid State Communications 127 (2003) 433437
v0 q A B cosqp
4. Conclusions
Fig. 4. Theoretical correlations of the Raman shift for the Ag band
with its line width (FWHM) for the two distinctive models of the
phonon confinement. The line-shape parameters of ZST (open
circles) and ZTO (filled triangles) prepared with various processing
conditions are also plotted for the purpose of comparison.
Y.K. Kim, H.M. Jang / Solid State Communications 127 (2003) 433437
437
References
Acknowledgements
This work was supported by the KISTEP of Korea
through the NRL program.