Sample requirements for VSM measurement

Measurement

M-H

M-T

Room temperature
measurement

Low temperature
measurement

High temperature
measurement

Temperature Range:
300K

Temperature Range:
20K to 300K

Temperature Range:
300K to 1000K

Applied Field Range:

+15000 Oe to
-15000 Oe

Applied Field Range:

+15000 Oe to
-15000 Oe

Applied Field Range:

+15000 Oe to
-15000 Oe

Temperature Range
(ZFC/FC):
20K to 300K

Temperature Range
(only FC):
300K to 1000K

Applied Field Range:

0 to 5000 Oe

Applied Field Range:

0 to 5000 Oe

Not applicable

Only Powder, Metal, Pellet, Thin film samples can be done, no liquid samples can be done.
Either Low temp (20K to 300K) or High temperature (300K to 1000K) can be done within the
given range, no measurement can be done in a single stretch starting from 20K to 1000K.
For Powder sample minimum sample required is 100 milligram.
In case of thin film samples, please send the Empty Substrate for background correction along
with the samples. Thin film sample dimension must be 10 mm x 4 mm (length x breath)..
For High temperature measurements only Pellet form samples can be done, Powder samples
must be pelletized. No powder samples can be done for High temperature.

SOPHISTICATED ANALYTICAL INSTRUMENT FACILITY

INDIAN INSTITUTE OF TECHNOLOGY, MADRAS
CHENNAI - 600 036.
Requisition for VSM measurements at SAIF (Maximum 5 samples) Date:
Name of the Applicant

Name of the Guide

Address for communication

Bill Claim Address

Phone No:

Email:

DD. NO. .., Date ...., Amount ...., Bank. ..

Nature of the
Sample
S.N Sample
code

Powder/Pellet/
Metal/Thin Film

Expected
Property
Melting
point

Diamagnetic/
Paramagnetic/
Ferromagnetic

Measurement Required
M-H at Room Temperature
M-H at Low/High Temperature
(Mention Temperature)
M-T at LT / HT (Mention field)

1.
2.
3.
4.
5.
Purpose for which the measurement is requested (In brief):
Broad Research Area/Topic :
This is to certify that the user is a bonafide student under my supervision.

Signature of the Research Supervisor

Seal

Signature of the Applicant

NB: VSM measurement in person on an appointment basis is feasible.

Charges for the measurement should be sent through an advance demand draft drawn in favor of The
Registrar, I.I.T. Madras along with the samples, to the Head, SAIF, IIT Madras, Chennai-60036.
As per the guide lines of the Department of Science and Technology (DST), in all publications of Research
work, where in the analytical services of the SAIF have been made use of, the DST and the SAIF shall be duly
acknowledged. Kindly send us the publication reference (Journal name / volume Number / names of the authors /
date of issue of the publication etc) to us.
(Office Use) Ref. No:

VSM

20