Professional Documents
Culture Documents
The Need For Functional Testing in True System-On-Chip: Ian Phillips FIEE Strategic Technologist ARM Ltd. Cambridge, UK
The Need For Functional Testing in True System-On-Chip: Ian Phillips FIEE Strategic Technologist ARM Ltd. Cambridge, UK
,1129$7,21
1
Ian.phillips@arm.com
17may00
(1$%/,1*
,1129$7,21
• ~ 400k gates
© ARM Ltd., 2000.
2
17may00
(1$%/,1*
,1129$7,21
• ARM9TDMI Harvard
Architecture, CPU Core 4KB D Cache
ARM940T Control
• 2x4KB Harvard Cache
with lock-down
Attribute ... Ian.Phillips@arm.com
ARM9TDMI
• AMBA on-chip-bus interface
4KB I Cache
• ~240MIP at 200MHz
• Memory protection unit
• ARM/Thumb instruction set
• EmbeddedICE debug support
© ARM Ltd., 2000.
~ 8 mm2 on 0.25u …
3
17may00
(1$%/,1*
,1129$7,21
… x 16 Functional Capacity !
… This is x2/year !
• Will be implemented out of
Components and Sub-Systems. GSM Base-Band
Processor V.C.
• Not the sole domain of hardware,
but a Functional alloys of HW & SW.
ARM940T V.C.
• Will be an incredible design
© ARM Ltd., 2000.
4
17may00
… Lead players are facing System-Level design today!
(1$%/,1*
,1129$7,21
Virtual Extraction
• The need for isolated access to hw & sw VCs ...
• To analyse its environment
• To investigate details Memory
of its operation
• To act as a simulation
Attribute ... Ian.Phillips@arm.com
accelerator
• To validate its functionality Black-Box
VC
Black-Box VC
Black-Box VC
Black-Box
© ARM Ltd., 2000.
5
17may00
(1$%/,1*
,1129$7,21
Functional Analysis
• Exercise the VC from simulation environment ...
• To gain better understanding of
the VC operation.
• To enable the simulation of
larger data-sets (acceleration).
Memory
Attribute ... Ian.Phillips@arm.com
Black-Box VC
© ARM Ltd., 2000.
Black-Box VC
Black-Box
VC
6
17may00
(1$%/,1*
,1129$7,21
Environment Analysis
• To investigate the real interface effects ...
• Emulation modelling of the
VC on a simulation engine...
• … Drive real outputs
• … Respond to real inputs Memory
Attribute ... Ian.Phillips@arm.com
Functional Test
• To establish that the Target VC, works as
Simulated, and as Required, within the context of
the assembled physical System.
Attribute ... Ian.Phillips@arm.com
• Requires ...
• The ability to access the Target VC at its pins …
• Without ‘Breaking’ the Target VC Functionality
• Without ‘Breaking’ its Environment Functionality
• Supports At-Speed and IO-Timing verification.
© ARM Ltd., 2000.
8
17may00
(1$%/,1*
,1129$7,21
Implementation
• Access ... (Ah-La P1500)
• Standard Physical Interface Port
• Supplementary non-functional / multiplexed pins
Attribute ... Ian.Phillips@arm.com
• Features …
• VC Peripheral Scan-Chain
• Sampling behind Input Registers
• BIST-able for at-speed and random functional test
© ARM Ltd., 2000.
Conclusion
• P1500 supports the Structural test needs of the most
complex SoC Manufacturing.
• But … Component Based SoC Product Introduction
needs Functional Test support to get through the
Attribute ... Ian.Phillips@arm.com
(1$%/,1*
,1129$7,21
© ARM Ltd., 2000.
Ian.phillips@arm.com
11
17may00