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Unit 4: Basic Circuit Concepts
Unit 4: Basic Circuit Concepts
4/21/12
Sheet resistance Rs
The concept of sheet resistance is being used to know the resistive behavior of the layers that go into formation of the MOS device. Let us consider a uniform slab of conducting material of the following characteristics . ResistivityWidth Thickness W t
4/21/12
4/21/12
Consider the resistance RAB between two opposite faces. RAB = ( L)/A ohm where A= cross sectional area RAB = ( L)/(tW) ohm
Consider the case in which L=W i.e a square of resistive material, then RAB = / t = Rs (ohm per square)
It is to be noted that Rs is independent of the area of the slab. Hence 4/21/12 we can conclude that a 1um per side
layers
metal Difffusion (n) Silicide Polysilicon N- txr channel p- txr channel
5m
0.03 10 50 2 4 15100 104 2.5 x 104
Orbit 2m
0.04 20 45 _ 15 30 2 x 104 4.5 x 104
Orbit 1.2m
0.04 20 45 _ 15 30 2 x 104 4.5 x 104
L= 2 & W= 2 The channel is square and the channel resistance R = 1square x Rs = 1 X 104 4/21/12 ohms
L = 8 & W = 2 Z = ( L/W) = 4 R= ZRS = 4 x 104 ohms This channel can be reguarded as four 2 x 2 squares in series
Lp.u : e.g 8 : Wp.u 2 4 : 1 Zp.u = 4. Ron = 4. Rsn = 40K Lp.d : e.g 2 : Wp.d 2 1 : 1 Zp.u = 1. Ron =1. Rsn = 10K
4/21/12
Lp.d : Wp.d 1 :
The ratio rule does not apply and there is no static resistance from VDD to VSS
4/21/12
Silicides
As the line width becomes smaller, the sheet resistance contribution to RC delay increases. Polysilicon sheet resistance ranges from 15 to 100 ohms Silicide has a resistance of 2 to 4 ohms Silicide is the refractory material formed by depositing metal on polysilicon and then sintering. This is used as interconnecting medium. Sputtering or evaporation
4/21/12