Fault Modeling and Fault Simulation

Luis Alejandro Corts, Daniel Karlsson

Embedded Systems Laboratory Department of Computer and Information Science Linkping University

Outline
s

Fault Modeling
t t t t

Logical Fault Models Fault Detection Single Stuck-Fault Model Multiple Stuck-Fault Model Serial Fault Simulation Parallel, Deductive, and Concurrent Fault Simulation Critical Path Tracing
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Fault Simulation
t t t

Basic Denitions
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Error : An instance of an incorrect operation of the CUT

Design Errors Physical Faults Fabrication Errors Fabrication Defects Physical Failures

Error Testing: Are there faults introduced during manufacturing or operation?

A fault is detected by observing an error caused by it

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Logical Fault Models

s s

Fault models are needed to analyze the result of the test Logical Fault : Representation of the effect of the physical faults on the operation of the system
t

Only the logic function is usually considered (not timing)

Logical faults allow a mathematical treatment of testing and diagnosis Assumptions are considered to make the analysis feasible
t

E.g. single-fault assumption

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Logical Fault Models (contd)

1 0

Stuck-at-1
b a.b AND a a.b

Stuck-at-0
a+b OR a+b

AND-bridging
0

OR-bridging

Stuck-at-0
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Fault Detection (Combinational Circuits)

x C
faulty

Z(x)

Cf x
s s

Zf(x)

A test vector t detects a fault f iff Zf(t)=Z(t) A fault f is detectable if there exists a test t that detects f
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Detectable Faults
x y x
OR

z
0

f is undetectable

y x
OR

t=00 is the only test that detects g t=00 does NOT detect g in the presence of f

g
0

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Fault Detection (Sequential Circuits)

X S
faulty

R(q,X)

Sf X
s

Rf(qf,X)

A test sequence T detects a fault f iff, for every pair of initial states q and qf, the output sequences R(q,T) and Rf(qf,T) are different for some ti in T
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Single Stuck-Fault (SSF) Model

s s s

May represent different physical faults Technology independent Test sets used to detect SSFs can detect other faults not explicitly considered The number of SSFs in a circuit is small, compared to other fault models

 Successful model

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SSF Model (contd)

s

2n possible SSFs (n = no. lines in which a SSF may occur)

m=4 n=6 s1 s2 s3 s4

n =

( 1 + f i qi )
i=1

m = signal sources f i = fanout count of signal s i 1 if f i = 1 qi = 0 if f i > 1 f = average fanout count q = fraction of signals with single fanout G = no. gates I = no. primary inputs

n = (G + I )(1 + f q)

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Fault Equivalence
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The number of SSFs can be reduced based on equivalence fault relations

A B C D

B s-a-1, C s-a-0, and D s-a-1, are functionally equivalent

s

Determining whether two arbitrary faults are functionally equivalent is an NP-complete problem (compute and show the two faulty functions are identical)
t

Relation analysis based on structural equivalence

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Multiple Stuck-Fault (MSF) Model

s

n = no. possible SSF sites

t t

2n SSFs
i=1 n

n 2 i = 3 n 1 i

MSFs

If we consider k faults occurring simultaneously

t

i=1

n 2 i i

MSFs

Example: n=5000, k=2

50.000.000 MSFs (double faults) 10.000 SSFs

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