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Computer Development in Park
Computer Development in Park
Computer Development in Park
HighSpeedComputerDevelopment
RunningHead:HIGHSPEEDCOMPUTERDEVELOPMENT
HIGHSPEEDCOMPUTERDEVELOPMENTINPARK: THEDELAYSOFA4GHZPROCESSOR
By DerekHildreth BYUIdaho English316C June27,2007
HighSpeedComputerDevelopment
ABSTRACT
Thisresearchfocusesonthereasonsbehindthefactthattherehasn'tbeenaprocessorreleasing tothepublicwithclockspeedsofover4GHz.Thecurrentfastestcommercialprocessoris3.8GHzand hasbeenthatwayfortwoyearsandcounting.Reasonsastowhythishasoccurredinthemarkettoday includeIntel'smarketingstrategies,electricalmigration(electromigration),andelectricalcurrentjumps (subthresholdvoltage).Asolutiontotheselimitationsincludesbuildingasmarterprocessor,rather thanonewithsheerstrength.ProcessorsliketherecentCoreDuoprocessorfromIntelincluding multiplecoreshassteppeduptothechallengeandhashadhugesuccess.Anotherwayofsmart computingisbytheuseofquantummechanics,usingthelawsofphysicstodesignanewtypeof processor.Thisresearchintendstoinvestigatethesefindings.
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TABLEOFCONTENTS
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1. Introduction MeasuringCPUs CPUConstruction DelayReasoning 2. IntelMarketing CompanyBackground NewProducts SalesFigures 3. ElectronicMigration Background Definition ElectromigrationDamage Solutions 4. ElectricalCurrentJumps Background IntegratedCircuits Nanotechnology HowSubthresholdLeakageOccurs Solutions 5. QuantumComputing 6. Conclusion ReviewofConcepts Solutions References Appendixes
1 1 1 2 2 23 3 3 34 5 5 5 5 6 67 7 78 8 9 10
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LISTOFFIGURESANDTABLES
Figure 1 2 ThevonNeumannarchitecture. TimelineofIntelCPUspeeds over7years(84months)from 2000to2007. Intelgrossmarginalsalesfrom 2001to2006. Theeffectsofelectromigration onaCPUsinnerwire. Adrawingofaninterconnect. Twocommoneffectsof electromigration. J.R.Black'sformulaforMMTF (meantimetofailure). Aschematicssymbol representinganANDgate. IntelProcessorsincomparison withMoore'sLaw. Avisualrepresentationofone typicalcircuitfoundonaCPU. Animageofqubits. Page 1 1
3 4 5 6 7 8 9 10 11 Table 1
2 3 4 4 5 5 6 6 7 Page
Comparisonofsynthetic benchmarkscores.
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HighSpeedComputerDevelopment INTRODUCTION
MEASURINGCPUS
Traditionally,computerperformancehasbeenmeasuredwithaunit calledHz(hertz)whichreportstheclockspeedofaCPU(centralprocessing unit)incyclespersecond.Forexample,acomputerwitha1GHzprocessor willcomplete1billioncyclespersecond.Thehighertheclockspeedofthe CPU,thefasteritcanprocesses,whichequatestolesswaittimewhenauser openstheirdocumentsandprograms.Suggestively,consumersusedthis measurementtohelpthemshopforaCPUwiththehighestclockspeedsthat Figure1:Thevon wouldhelpthemgetthingsontheircomputerdonefaster.
CPUCONSTRUCTION OneCPUismadeupofseveraldifferentpiecesthatallworktogetherincludingbuiltinmemory (storageforinstruction),acontrolunit(directsoperations),anALU(arithmeticlogicunitthatperforms basicarithmeticoperations),anaccumulator(accumulatesresultsofarithmeticoperations),andan inputandoutput(gatherscommandinputsandsendscommandoutputs).Thesepiecesformthebasis foratraditionalCPUdesigncalledthevonNeumannarchitecture(seeFigure1).Thespeedatwhich theseinteractwithoneanotherismeasuredbytheclockspeedasdiscussedpreviously.Therearetwo majorCPUmanufactures:IntelandAMD.Althoughitisimportantnottointroducebias,thisresearch topicwillfocusonIntel,astheyhaveexcellent Clock Speeds Over Time documentationoftheirprocessorsandmarketing. From2000to2005,Intelhadincreasedtheclock 3700 speedssteadilyfrom2GHzto3.8GHz(Intel, 3200 2006,p.16).However,clockspeedshavebeenat 2700 astandstillsince2005andhavenotbeenreleased 2200 intotheconsumermarketwithspeedsgreaterthan 1700 3.8GHz(seeFigure2).
Clock Speeds
1200
Neumannarchitecture.
DELAYREASONING 700 0 5 10 15 20 25 30 35 40 45 50 55 60 65 70 75 80 85 Thisstandstillhasthesethreestrong Months reasonstoblame:(1)Intel'smarketingstrategies,Figure2:TimelineofIntelCPUspeedsover7years(84 whichconcentratesonsmarterdesignratherthan months)from2000to2007. sheerclockspeedbrawn,(2)electronicmigration, causedbytheheatgeneratedfromfasterCPUsandsmallerwires,and(3)electriccurrentjumpscaused byevershrinkingCPUcomponents.Itisimportanttounderstandthesebecausetheyhavechangedthe wayconsumersshopforcomputers.Allthreeofthesereasonsmaycollectivelybecontributingtothe standstillofclockspeedsandthisresearchwillmoredeeplyexplainthesecausesaswellastouchupon theresearchbeingdoneinquantumcomputing.
HighSpeedComputerDevelopment INTELMARKETING
COMPANYBACKGROUND
IntelisbasedoutofSantaClara,CaliforniaintheheartofSiliconValleywherethemajor materialofcomputercomponents,Silicon,isfound.InAprilof2007,theywereproducing80.5%of CPUsinthecomputerindustry(Krazit,2007,para.1).Aswithanycompany,themoremarketshare youhavethebetterofftheyareandIntel'smarketingstrategieshaveprovedtobesufficientatdoingso. NEWPRODUCTS In2005,IntelhadreleasedanewCPUtechnologythatutilizedradicallydifferentdesignthan thatofatraditionalprocessorcalledthedualcoreprocessor(Intel,2006,p.4).Theseprocessorshave twomainprocessingunitsratherthanthesingleoneinthevonNeumannarchitecture.Withthisnew design,CPUscanoutperformasinglecoredesignwithahigherclockspeedbecausetheyarenowable toexecutemorethanonecommandatatimewhereas before,onlyonecommandcouldbeexecuted.Lookingat Processor Clock Speed Score anexamplecomparisonbetweenanoldersinglecoreIntel Core 2 Duo E6400 2.1GHz 1892 Pentium 4 570 3.8GHz 1162 processor(Pentium4570)andanewerdualcoreprocessor (Core2DuoE6400)asshowninTable1,onecanclearly Table1:Comparisonofsyntheticbenchmark seethebenefitsofhavingtwocores(Toms,2006).Forthis scoresbetweenasinglecoreanddualcore processorwithasmallerclockspeed. reason,Intelsimplygavethedesignofamultiplecore processormoreattentionthanbreakingclockspeedrecords.Thishasallowedthemtoproduceamore costeffectiveCPUthatoutperformsolderdesignsthatrequiredhighermanufacturingexpensesto achievethesameperformance.
SALESFIGURES
ThechangetodualcoreCPUdesignhasalso madereflectionsinthemarketsalesandsharesinthe Intel Sales 25000 industry.Marketshareisessentiallythepercentageof 22500 salesinaspecificbusinessnichethatacompanyhas. 20000 17500 AMD,Intelsbusinessrival,hashadacompetitiveedge Dual Core 15000 Introduced onIntelbysteadilytakingmarketsharepercentfromIntel 12500 10000 (Spooner,2002,para.2).Itwasn'tuntil2007,when 7500 5000 Intel'sdualcoreprocessorsstartedtobecome 2500 mainstream,thattheywereabletoregainthemarket 0 2001 2002 2003 2004 2005 2006 sharesthatAMDhadtakenfromthem.Also,lookingat Year pastlevelsofgrossmargin(orgrossprofit)from2001to Figure3:Intelgrossmarginalsalesfrom2001to 2006,Intelhadthegreatestchangewhenthedualcore 2006. processorswereintroducedin2005,asshowninFigure3 (Collantes,2007,p.1).Naturally,whensalesincrease,companieslikeIntelwillkeepsellingtheitem thatwillbringthemmoreprofits.Thisevidencesupportstheconclusionthatthereasona4GHz
Gross Margin
BACKGROUND
Indesigningaprocessor,thereareafewdifferentmethodsusedtohelpincreaseclockspeeds. OneofthemistogivetheCPUahighervoltagefromapowersupply.Thisallowstheelectricalcurrent toflowmorefreely,givingtheCPUahigherclockspeed.BycloselymonitoringthevoltageonaCPU throughthemaincontrolboardofacomputer,enthusiastshavebeenabletotakeaCPUfromfactory andchangethesettingsforcingtheclockspeedtoincrease.Usershavereportedlybeenabletoboost theirclockspeedsupto8Ghz(Andreas,2007).Atfirst,itsoundslikeatotallyviablesolutionto breakingthe4GHzbarrierandcompanieslikeIntelshouldjustreleasetheseoverclockedCPUstothe public.Theproblemis,thesespeedboostscomeatthecostofanexpensivecoolingsystemandheavy modificationstothecomputersystem,creatingexpensesthattheconsumerisn'twillingtopay.Oneof theprimaryreasonsfornotreleasingCPUsliketheseisbecausewithoutthepropercooling(below 80C),theyaresubjectedtoelectronicmigration,aphenomenonalsoknownaselectromigration.
DEFINITION
Electromigrationisofficiallydefinedasthemovementofatomswithinacrystal. (electromigration,2000)Thisdefinitionisveryvagueandseemsincomplete.Polkowski(2007),a journalistforTomsHardware,describedelectromigrationinthisway: Electromigrationoccursasaresultofmetalatomsbeingmovedviathemomentumof electrons.Picturethisasasandblasterwherethesand,athighvelocity,iserodingthewalls ofthegun.Inthecaseofelectromigration,theelectronsaremovingthemetalatomsaway fromoneanother.Thiscancauseacircuittofailbytwomeans:eithertheatomsaremoved apartbreakingthecircuit,ortheyaremovedcloser,so thecircuittouchesanothercausingashort.Eitherway, itisbadnewsforthecomponents.(para.2)
ELECTROMIGRATIONDAMAGE
Agraphicalrepresentationofthisoccurrenceis showninFigure4wherethehorizontalpipeinthecenteris thewallofthegunthathasbeenbadlydamageddueto electromigration.Noticethatitlookssimilartoabadly damagedwaterhosewithwallsthatareweakfromwearand tear.Whenwaterispushedthroughthishose,hardlyanyof Figure4:Theeffectsofelectromigrationona CPUsinnerwire. itisgoingtomakeittotheotherside.Thisisasimilar situationfortheinterconnects,orinnerwireconnections,
HighSpeedComputerDevelopment insideaCPU.Theelectricalcurrent(comparetothewaterinahose)istryingtoflowthrougha damagedwireandwillnotsucceed,thusrenderingtheCPUasnonfunctional.Theprocessinwhich thisoccursishighlytechnicalandinvolvescomplexscientificlawsofphysicsandchemistry.In Failureisnotanoption,Lienig(2006)summarizeshowthisphenomenonoccurs: Thecopperoraluminuminterconnectsofanelectroniccircuitarepolycrystalline,thatis, theyconsistofgrainscontainingcrystallatticesofidenticalconstructionbutdifferent orientation.Ascurrentflowsthroughsuchawire,thereisinteractionbetweenthemoving electronsasortofelectronwindandthemetalionsintheselatticestructures.Atoms atthegrainboundariesespeciallywillfallvictimtotheelectronwind,thatis,theywillbe forcedtomoveinthedirectionoftheflowofelectrons.(p.39) Inotherwords,thestructuralpropertiesofthewireitselfareshapedinsuchawaythattheylook similartoabeehivehoneycomb,onlynotasuniform,asshownin Figure5.Aselectricitypassesthroughthisstructuredwire,the honeycombhasatendencytomovewithit.Compareittoafast flowingriverwithlooserockonthebottom.Theriveristhe Figure5:Adrawingofan electricityandthelooserockaretheatomsofthewire.Therockswill interconnect.Theredarrowisthe move,ormigrate,withthecurrentoftheriver.Thisisalsoknownas flowofelectricityand(a)represents grainboundarydiffusion(seeFigure5).Lieningcontinueswithan grainboundarydiffusion. explanationofwhatgrainboundarydiffusionwilldooveraperiodof time: Thus,intime,copperoraluminumatomswillaccumulateatindividualgrainboundaries, formingsocalledhillocksinthedirectionof thecurrent.Atthesametime,socalledvoids canappearatthegrainboundaries[Figure6]. Whilethehillockscanshortconnectadjacent interconnects,thevoidsreducethecurrentflowin particularlocationsuntilthepointofinterconnect failure.(p.39) Toparaphrase,therearetwocommonsideeffectsof electromigration:1)Hillockswhichareformedbyan Figure6:Twocommoneffectsofelectromigration. accumulationofatomsinthewire,and2)voids,ordeadspots,whichoccurwhenaclusterofatoms havemigratedawayfromtheiroriginalgrainboundaries,muchlikeadeltaattheendofariver.As suspected,thesecommonoccurrenceswilleventuallyleadtohardwarefailure.
HighSpeedComputerDevelopment
SOLUTIONS
Inthe1960's,physicistJ.R.Blackderivedamathematicalequationthat willfindtheaveragelifespanofaCPU,takingelectromigrationintoeffect(see Figure1).Withoutgoingintotoomuchdetailabouttheformula,akeen Figure7:J.R.Black's observationwillseethatthetemperature(T)stronglyeffectsthelifespanasitisinformulaforMMTF (meantimetofailure). theexponentoftheformula.Simply,inordertoavoidCPUfailure,adequate coolingisrequiredasdiscussedearlierinthissection.Thestrongerthevoltage, themoresusceptibletheatomsoftheinnerconnectionswillbetoelectromigrationwhichwillleadto CPUfailure. ELECTRICALCURRENTJUMPS
BACKGROUND
INTEGRATEDCIRCUITS
Anintegratedcircuitisatinyelectroniccircuitthatislocatedonablockofmaterialthatcan carryanelectriccurrent.Theyareprimarilymadeupofcomponentsthathelpregulatetheelectric current.Thesecomponentsareconnectedtogetherbysmalllinesofmetalcalledinterconnects(as discussedearlierinelectromigration).Thesecircuitscanbearrangedtoperformavarietyofspecific functionsthatacomputerprogramcanuse(Integrated,2002). Theseintegratedcircuitsaremostcommonlyusedtocreate what'scalledalogicgate.Alogicgateissimplyagatethateitherallow ordisallowacurrentfromflowingthroughit.Thisisthefoundationfor whyacomputerrunsononesandzeros(onandoff).Anexampleofa Figure8:Aschematicssymbol logicgateiswhat'scalledanANDgate(seeFigure7).Ifthereisan representinganANDgate. electriccurrentflowingonbothlineA'AND'B,thenthegatewillallow thecurrenttoflowthroughit.However,ifthereisonlycurrentflowingonlineAandNOTB,thenthe gatewillnotallowanycurrenttoflowthroughit.So,theoutputiseitheronoroff(oneorzero).Itis herewhereelectricalcurrentjumpsoccur,butstillareviewofnanotechnologyisinorder.
NANOTECHNOLOGY
HighSpeedComputerDevelopment onebillionthofameter.Themostrecentnanotechnology beingusedbyInteltobuildprocessorstodayis45nm.Toput thisintoperspective,thewidthofahumanhairisabout 80,000nanometers(National,n.d.).Understandably,the amountofintegratedcircuitsandlogicgatesresidingonone single2.5squareisimpressive.Itisdesirabletomake smallerintegratedcircuitsbecausethemoreamanufacture canfitintoaCPU,themorepowerfulitwillbe.And, accordingtoMoore'sLaw,thenumberofintegratedcircuits Figure9:IntelProcessorsincomparisonwith onaCPUwilldoubleabouteverytwoyears(seeFigure8). Moore'sLaw. ThetroublesthatmanufactureslikeIntelarefacingare increasedcoststoproducethesecircuits,andthephysicalproblemsthatappearlikeelectricalcurrent jumps.
HOWSUBTHRESHOLDLEAKAGEOCCURS
Electricalcurrentjumps(a.k.a.subthreshold leakage)occurwhenanelectriccurrentliterally jumpsdirectlyfromaninlettoanoutletofalogic gatebecausethedistancebetweenthetwoareso small(Subthreshold,2007).Ineverycircuitthereis acurrentsource,alogicgatetopassthrough,anda currentdrain(seeFigure9).Normally,thecurrent willflowfromthesourceintothelogicgate,whereit willeitherbeallowedbythelogicgatetopass throughtothedrainornot.Subthresholdleakage Figure10:Avisualrepresentationofonetypicalcircuit occurswhenthecurrentflowsdirectlyunderneath foundonaCPU. thelogicgatetothedrain.Thiseliminatesthe logicalsetofinstructionsthattheprocessorneedsandleavesadirectcurrentflowingthroughitallof thetime.Instructionsorcommandsarebeingexecutedincorrectlyandessentiallybecomesthe equivalenttopushinggasolinethroughanengineblockwithnopistons,sparkplugs,orsensorstomake thecarmove.However,inacomputer,itdoesnotrendertheCPUcompletelyuseless.TheCPUwill continuetoworkandexecutecommands,butthedownsideisthatsubthresholdleakagemayaccountfor upto50%oftotalpowerconsumptionwhichispreciousinsuchapowerhungrydevice.
SOLUTIONS
HighSpeedComputerDevelopment
CPUtooperate).Whenthesupplypowerisdecreased,anothervoltage,knownasthethresholdvoltage, mustalsobedecreasedinthesameproportion.Thresholdvoltageistheamountofvoltagenecessary foralogicgatetodetectasignal(Threshold,2003,para.2).Subthresholdleakageisexponentially dependentuponthethresholdvoltage.Thesmallerthethresholdvoltage,thehigherthechancefor leakagetooccur(Dimitrios,2002,p.20).Subthresholdleakageisalsodependentuponthedistance betweenthesourceanddrainofthelogicgate,butnotasdrasticallyasthethresholdvoltage.AsCPUs getsmaller,faster,andmorepowerefficient,theriskofrunningintosubthresholdvoltageincreasesand themoreinefficientCPUsbecome. QUANTUMCOMPUTING Onepossiblesolutiontocomputerprocessorlimitationsisbystudyingandimplementingthe lawsofquantumphysicswithinacomputer.AccordingtoMoore'slaw,sometimebetween2010and 2020,thecomponentsthatareusedtoconstructtheCPUwillbesosmallthattheywouldonlyconsist ofafewatomseach.Whenthecomponentsbecomethissmall,theywillstopfunctioningreliably accordingtothelawsofquantumphysics(Computer,2007a,para.2).So,inordertodesignand produceaprocessorcapableofrunningathigherspeedsinasmallerpackage,thelawsofquantum physicsmustbeapplied. Acomputerprocessoronlyrequiredtwobitsofinformation:onoroff. Andaccordingtoquantummechanics,anelectronalsosharesthispropertyof havinganonandanoffvalue(Inthequantummechanicsworld,thisisknown asaspin).Asystemoftheseparticlesarecalledquantumbitsorqubits,as seeninFigure10.Thissuggeststhatbuildingacomputerbasedonelectrons andtheirpropertiesispossible(Computer,2007b,para.1).Thiswouldallow engineerstobuildapersonalcomputerinthefuturethatwillbefasterthanany supercomputerinexistencetoday. CONCLUSION
Figure11:Animageof qubits.
REVIEWOFCONCEPTS
HighSpeedComputerDevelopment
heatandfaststreamofvoltagegoingacrosstheinterconnectionsoftheprocessorisforcingtheatoms tomovewithit,causingdamagetotheline.Onceenoughdamagehasbeendone,theprocessorwillbe rendereduselessand,dependingonthevoltagestrength,canreachthatpointinaslittleasafew months.Withonlyafewmonthsexpectedtimetolive,marketingandsellingtheseCPUsisworthless. Electricalcurrentjumps,orsubthresholdleakage,isalsoarisingconcernasthecomponents (integratedcircuits)tomanufactureCPUsaregrowingsmalleratarateof1:2everytwoyears. Betweenshrinkingtheintegratedcircuitsanddesigningmoreenergyefficientprocessorsthetenancy fortheelectriccurrenttojumpfromaninlettoanoutletandskippingthelogicrises.Thisoccurs frequentlyinprocessorsrunningabove3.8GHzandleadstowastedenergyandincreaseddamage controldonebytheCPU,thuswastingprecioustime.
SOLUTIONS
Technologywillcontinuetobecomemoreadvancedandassistinmakingtheintegratedcircuits onaprocessorsmaller.Thesmallertheybecome,themorewillfitintoaCPU,givingitevenmore processingpower.Eventually,however,theywillbecomesosmallthattheyareonlyacoupleatoms thick,makingitimpossibletomountalogicgateoranyothercomponentontoit.Thishasintroduceda newkindoftechnologycalledquantumcomputing,whichisstillunderresearch.Quantumcomputers willtakeadvantageofthelawsofquantumphysicsandprovideawaytomakeanatombehaveina mannerthattheCPUwillunderstandazeroandaone. Therearesomeproblemsintheworldthatcanbesolvedbylookingintothepast,butthe problemsandlimitationsthatsurroundthecomputingworldwillonlybesolvedbylookingaheadinto thefuture.Thefutureincludessmarterprocessorswithfouroreveneightyprocessingcoresbuiltin, eachhelpingdistributetheload,andquantumcomputingallowingincrediblyfastsupercomputer strengthinapersonalcomputerinsomebody'soffice.Thesecomputerswillbefasterandbetterthan processorsrunningbeyond4GHz,onlyhavingaclockspeedhalfthesize,whileavoidingthecurrent problemsthatsinglecoreprocessorsfacetodayincludingelectromigrationandsubthresholdleakage. Thesearethereasonsastowhytherehasbeenaflatlineonthetimelineofprocessingspeedsformore thantwoyearssince2005.
HighSpeedComputerDevelopment
REFERENCES
Andreas,G.(2007,January22).OCTeamItalysetsanewworldrecordat8GHz!RetrievedJuly1,2007from http://www.nordichardware.com/news,5505.html Collantes,K.(2007,March2).SelectedFinancialDataFiveYearsEndedDecember30,2006.RetrievedJuly1,2007,from IntelCorporation:http://media.corporateir.net/media_files/irol/10/101302/06financials3_07.pdf Computer.(2007a).InEncyclopdiaBritannica.RetrieveJuly3,2007,fromEncyclopdiaBritannicaOnline: http://search.eb.com/eb/article235895 Computer.(2007b).InEncyclopdiaBritannica.RetrievedJuly3,2007,fromEncyclopdiaBritannicaOnline: http://search.eb.com/eb/article235908 DimitriosSoudris,ChristianPiguet,andCostasGoutis(2002).DesigningCmosCircuitsforLowPower.Berlin,Germany: Springer. Electromigration.(2000).InCollinsDictionaryofComputing.RetrievedJuly1,2007,from http://www.credoreference.com/entry/1252826 IntelCorporation.(2006,August1).IntelHighPerformanceConsumerDesktopMicroprocessorTimeline.RetrievedJune 28,2007,fromwww.intel.com/pressroom/kits/core2duo/pdf/microprocessor_timeline.pdf IntegratedCircuit.(2002).InFunk&WagnallsNewWorldEncyclopedia.RetrievedJuly2,2007,from http://search.ebscohost.com/login.aspx?direct=true&db=funk&AN=IN028100&site=ehostlive Krazit,T.(2007,April24).Intel'smarketsharerisesonAMD'sproblems.CnetNewsOnline.RetrievedJuly1,2007,from http://news.com.com/Intels+market+share+rises+on+AMDs+problems/21001006_36178921.html Lienig,J.(2006).Failureisnotanoption:Introductiontoelectromigrationawarephysicaldesign.Proceedingsofthe2006 internationalsymposiumonPhysicaldesignISPD'06;ACMPress, Nanotechnology.(2003).InTheAmericanHeritageDictionaryoftheEnglishLanguage.RetrievedJuly02,2007,from http://www.credoreference.com/entry/4111488 NationalNanotechnologyInitiative.(n.d.).NanotechFactsFAQ.RetrievedJuly2,2007,from http://www.nano.gov/html/facts/faqs.html Polkowski,D.(2007,February12).ExtremeOverclocking.RetrievedJuly1,2007from http://www.tomshardware.com/2007/02/12/extreme_overclocking/page3.html Spooner,J.(2002,January4).AMDScoresPointsAgainstIntelin2001.CnetNewsOnline.RetrievedJuly1,2007,from http://news.com.com/21001001822642.html Subthresholdleakage.(2007,June20).InWikipedia,TheFreeEncyclopedia.RetrievedJuly2,2007,from http://en.wikipedia.org/w/index.php?title=Subthreshold_leakage&oldid=139483538 Thresholdvoltage.(2003).InMcGrawHillDictionaryofScientificandTechnicalTerms.RetrievedJuly03,2007,from http://www.credoreference.com/entry/5648822 TomsHardware.(2006).CPUCharts.RetrievedJuly1,2007,from www23.tomshardware.com/cpu.html?modelx=33&model1=439&model2=433&chart=174
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APPENDIXES
A) B) C) D) E) F) Proposal AnnotatedBibliography ProgressReport ResearchBreadcrumbTrail HandwrittenNotes DraftingOutline