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BRUKER
BRUKER
BRUKER
XRD
: 13426305642
email: tong.wang@bruker-axs.cn
XRD
: 13681303518
email: chongzhi.he@bruker-axs.cn
XRD
: 13811952478
email: ning.yang@bruker-axs.cn
AXS
11
5201:100081
:010-68486946, 68486947
:800-810-9066
: 010-88417855
Beijing Application Lab
1.
2. Evaluation-
3. Dquant-
1.
1.1 X
1.2
1.1 X
()
(,,S.G,
)
,,.
ODF,
,,
1.2
---DIFFRAC Package
1. Diffrac Measurement Suite
2. Diffrac EVA ;
3. Diffrac Dquant(EVA)
4. Diffrac TOPAS 4:
a. :
b.
c. PawleyLe Bail:,
d. (,
)
e. Rietveld:,
5. Diffrac Plus TOPAS BBQ
b. Diffrac LEPTOS R
c. Diffrac LEPTOS S
8. Diffrac Nanofit
9.
2. Evaluation(EVA)-
2.1. EVA
2.2. EVA
2.3.
2.4. Eva
raw
XPC:\Program Files\Bruker AXS\DIFFPLUS\Tutorial
Win7C:\ProgramData\Bruker AXS\Tutorials\EVA
Beijing Application Lab
2.1. EVA
Evaluation
(PDF) SQPIPVIP
*.BRML *.RAW *.EVA
EVA :
Scan, Pattern,Peak,Area Level
Scan (.raw.brml)
Pattern (DIFd-I )
Peak
Area
Level
1. Title bar
2. Menu bar
3. Toolbar
4. Data command panel
()
Beijing Application Lab
10
11
EVA
(Scan)
File>Import Scan
12
EVA
File>Save As
File>Open
EVA
13
14
Y
Beijing Application Lab
15
2.2 EVA
2.2.1
2.2.2
2.2.3
2.2.4 Pattern
16
2.2.1
SiO2
SiO
, SiO
(
)d-I
17
DIFd/I ;
:;
PDF)
;
Beijing Application Lab
18
(
);
-;
();
;
,
;
(<1%wt) ;
;
,
19
PDF, ;
d/I
d I I
;
m ,
500 nm;
;
PDFd/I
K
K1K2;
20
2.2.2 PDF
21
PDF2004
22
2004PDF21-55 ,70-89,
16.3835; 2009PDF429.1440. PDF9
(SS-VVV-PPPP): .
a) (SS=00);
b) (SS=99);
c)
(ICSD,SS=01);
(CSD,SS=02);
ICDD-NIST (SS=03).
PDF 9 (SS-VVV-PPPP):
SS 99;
VVV ,,046;
PPPP ,SiO21416.
23
2.2.3 Search/Match
24
1.
25
2.
1). Data tree>>Tool>Search / Match (scan)
The Search / Match (scan)
26
-;
-;
-;
-;
27
3) Database Filter
28
4) Candidate List>Match,
,,
+ ;
! Select candidates ,
Pattern List
2 theta
Range
29
Low precision :
30
Scan,
:
(Dolomite)
( Calcite )
( Quartz )
Select candidates ,
Pattern List :
Dolomite (* 00-036-0426),
Calcite (*01-89-1304) ,
Quartz (01-046-1045)
Beijing Application Lab
31
4.
Selected Candidates tab / Search/Match (scan) ,
Residue,
, (), Apply
button
32
2)
1)
Residue
4) Apply button ,
()
3)
33
34
5. match
6. : (Clinochlore
35
7.
EVA
36
1>
Tool>Search by Number
2
insert
37
1)Candidate List
Search by Name
2)Name
Quartz
SiO2
38
(4)
(2)
(1)
(3)
39
40
2.3.4 Pattern
Pattern
YY-Scale
d
Tune Cell
41
Pattern
1.PatternDolomite
2.>Create>DB View(Database View)
42
3. Bragg
43
YY-Scale
1.
2. Stick
Stick
Ctrl
44
d
1. C:\Documents and Settings\All User\Application data\Bruker
AXS\Tutorial\Csand.raw
2.
45
3. 27-32Pattern Scan
Mg Ca d 1
Pattern Scan
Beijing Application Lab
46
4.d x by,
6.AppendRepalce
47
1. C:\Documents and Settings\All User\Application data\Bruker
AXS\Tutorial\Francolite.raw
2. PDF 00-031-0267 and PDF 00-021- 0141
48
3.
Data tree PDF 00-021-0141 ; pattern property table
>Scalings>Scan WL> Wavelength
, WL1
49
4.
50
Tune Cell
, , Francolite
Hex.a c hkl, Tune Cell
;
:
a= b= 5.01254.99269
c= 3.98384.0539
51
Tune Cell
52
3.PDF>Tool>Tune Cellah00
(300)
c (100)
4. Append Replace
53
2.3.5
Semi-Quantitative Analysis
1. C:\Documents and Settings\All User\Application data\Bruker
AXS\Tutorial\BX100.raw
2.,
54
2. PatternY-ScalePattern
55
S-Q
56
6.
57
S-Q
I/Icor
I/Icor PDF, I/Icor
I/Icor
S-Q :
I/Icor
58
2.3
2.3.1 Background
2.3.6 Y
2.3.7 (Aberrant)
2.3.8
2.3.4 (Smoothing)
2.3.5 X 2.3.10Crystallinity
59
2.3.1 Background
1. Bchips.raw
2.Data tree>>Tool>Background
60
4. Background subtracted
5. EVA
61
1. Csand.raw
2.Tool>Peak Search
62
3.:thresholdWidth
63
4. Append to list
Data Tree
5. EVA
64
Caption
1) Data TreePeak
List>Select Children
3Caption
65
4
5Caption
66
(1): Peak List>Create>Peak Column View; (2)>
Column ChooserColumn Chooser
(2)
(1)
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68
3. 38-48
69
5. ReplaceAppendK2
6. EVA
70
2.3.4 (Smooth)
--SmoothFourier Smooth
1. Quartz.raw
2.Tool>Smooth
71
3. 67-69
72
5. ReplaceAppend
6. EVA
73
7. SmoothFourier Smooth
8. ReplaceAppend
74
2.3.5 X
--X-OffsetDisplacement
1. Bchips.raw
2.Tool>X-Offset
75
3.
76
4.Displacement
77
4. ReplaceAppend
5. EVA
78
79
2.3.6 Y
--- Y-scale factorY-offset
1. Bchips.raw
2.Tool>Y-scale factor
3. Y
80
Tool>Y-offset
81
2.3.7 (Aberrant)
1. Spikes.raw
2.Tool>Abberant
82
5. ReplaceAppend
6. EVA
83
2.3.8
1. ET20.rawET50.raw
2.Data TreeTool>AddSubtract
84
3.Add/Subtract
4. EVA
85
Merge
1. Corundum-1.rawCorundum-2.raw
2.>Tool>Merge
86
2.3.9
Create Area
1. ET20.raw
2.Tool>Create Area
87
3.Select an Area,
88
Obs.Max:
FWHM
Gravity:
Raw Area
Net Area
89
1.>Tool>Create Area
2. Append this Area
90
91
2.3.10Crystallinity
92
1. m2.raw
2.Tool>Background
93
94
2.4. Eva
2.4.1 Peak
2.4.2
2.4.3
95
2.4.1Peak
1. Csand.raw
2.Create Peak at 2Theta
96
3.Peak List>Tool>Search/Match
97
2.4.2
EVAscan pattern
98
2.4.3
99
3. Dquant-
Dquant
Dquant
XRD
100
,
:
X
1/ NN
101
()
, n,j Vj
n
Wj
I j CK j V j / W j mj
j 1
n
I j CK jW j / j W j mj
j 1
(Alexander)
3
1
e4
1
C
Io
32r
2
m2c 4
1 2
1 k cos 2 2 2 M
K j 2 Fhkl Phkl
e
2
0
sin coa
2
hkl
f
i 1
,Vj Wj
mIjVj Wj
,
102
Ijm
Rietveld
m
Ij
I js
CK W
( j j
W
j 1
mj
) (CK j W js s mjs )
W
m
j 1
m
aijj
W j I j mj
js
C 'W j
C'
Wj
W js 1
mj I j ( mj mi )
mi , mj Ij Ijsj
wj mj mi : I j I js ~ W j
bjI jjI js
Wj b)
103
n ,mj Ws
Al2O3, ZnO, KCl, LiF, CaF2, MgO, SiO2 , CaCO3 , NaCl ,
NiO
i
I s CK sW s
I i CK iWi
'
n 1
i W j mj
j 1
n 1
s W j mj
j 1
i Wi Si
Wi ' (1 Ws )Wi
iS
I i I s K iWi ' s K s iWs K iWi (1 Ws ) s K s iWs KWi
i si s 2(hkl)
I i
I s ~ Wi
K
Wi
Ws Wi
104
K Chung F.H.;1974
1974F. H. Chung
K KK
I j I s [CK jW
'
j
n 1
n 1
j 1
j 1
j W j mj ] [CK sWs s W j mj ]
'
K j s W j'
W
j
K sj
K s j Ws
Ws
Ws I j
W j
Ks Is
'
j
K sj
j SK
K j s
Ks j
j S j s 2)
Wj,
W j' 1 Ws
105
K K f (s. j.. )
s j K
Al2O3 () Sj
KPDF2 I I ?
cor
K Al2O3 113
Ws50 j
K j Ks =
K j Ps
K
K s Pj
j
s
50% I j
I j Is
50% I s
K P
K R s
K s PR
R
s
K sj K sR
K j PR
K Rj
K R Pj
106
K,
K
K sj K
Ij Is
Wj Wj
K
1.
K;
2.
K
;
3. ;
4. j;
5. S
107
(Chung F.H.;1975)
nK
ji,hkl i=1.2jn, K
Wi I i
W
Ki I 1
j
j
n
i 1
i 1
Wi 1 n
Wj
Ii
i
i 1 K j
i 1
j2Ij
Wj I j
Ii
i
i 1 K j
Wj
Ii W j Ii
W
i
i
i
Ij Kj Kj
Ij
Ii
i
i 1 K j
Ii K Wi
1.
2.
3.
4. K
Beijing Application Lab
108
109
Dquant
110
a) BCTUTO
111
c) m3
I Wj
I
Wi i i ii
Ij Kj Kj
Ii
i
i 1 K j
Add Mode
Import *.raw (unknown phase)
112
d.
Dquant
() :
,
113
()
,
,
,
,
114
()
(TiO2NOx
,
, <4%
115
XRD
TOPAS DQUANT,
(,K
),
, ,
, NIOSH JIS
116
XRD
XRD,
()
,
,
117
7/18/2012
18.Copyright
118
118