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The Resolution in The Electron Micros
The Resolution in The Electron Micros
2
r
r
+
= (5)
The advantage of using electrons rather than photons to study materials is clear due to the increase in spatial resolution at
high energies. The use of electrons however presents challenges in understanding their interaction with material. For
instance electrons can be scattered by gas molecules, thus the environment in which the electron beam is created must be
evacuated [3]. Table 1 shows several electron wavelengths at some acceleration voltages used in TEM [4].
Table 1: shows several electron wavelengths at some acceleration voltages used in TEM
Accelerating
Voltage (kv)
Nonrelativistic
Wavelength (nm)
Relativistic
Wavelength (nm)
Mass
(x m
o
)
Velocity
(x10
8
m/s)
100 0.00386 0.00370 1.196 1.644
120 0.00352 0.00335 1.235 1.759
200 0.00273 0.00251 1.391 2.086
300 0.00223 0.00197 1.587 2.330
400 0.00193 0.00164 1.783 2.484
1000 0.00122 0.00087 2.957 2.823
The resolution of a microscope is defined as the distance between two details just separable from one another. It can be
calculated using the Abbe's theory of images formation for optic systems. For incoherent light or electron beam, in fact,
resolution distance , or what sometimes called by critical distance, may be expressed by the following relation according
to Rayleigh criterion, and called lateral resolution [5].
nsin
0.61
= (6)
Where is the wavelength of the light n is the medium refractive index, and is the maximum angle between incident
and deflected beam in the limit of the lens aberrations, and also is called the axial resolution [6].
2
) (nsin
2n
o
= (7)
For optical microscopy, the resolution is therefore limited by the wavelength of light (410-660 nm). The X or rays have
lower wavelength, but unfortunately, high-performance lenses necessary to focus the beam to form an image do not exist
yet (however, X-rays can reveal structural information of materials by diffraction techniques). A first image with TEM
was obtained by Ernst Ruska and Max Knoll . In a TEM, the electrons are accelerated at light voltage (100-1000 kV) to a
velocity approaching the speed of light (0.6-0.9c) they must therefore be considered as relativistic particles. The
associated wavelength is five orders of magnitude smaller than the light wavelength (0.04-0.008 ). Nevertheless, the
magnetic lens aberrations limit the convergence angle of the electron beam to 0.5
o
(instead of 70
o
for the glass lens used in
optics), and reduce the TEM resolution to the order. This resolution enables material imaging and structure
determination at the atomic level. They are somewhat different form the coherent conditions, as seen in Table 2 [7].
International Journal of Application or Innovation in Engineering& Management (IJAIEM)
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Volume 3, Issue 2, February 2014 ISSN 2319 - 4847
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Table 2: Optimum values of resolution and semi-angle aperture
Resolution Limit equations Optimum aperture Type of imaging
formation
4 1 3
66 0
/
s
) C ( . = o
4 1
51 1
/
s
op
)
C
( .
= o
Coherent
4 1 3
61 0
/
s
) C ( . = o
4 1
41 1
/
s
op
)
C
( .
= o
Incoherent
4 1 3
43 0
/
s
) C ( . = o
For the incoherent image formation, the two points are easily resolved (minimum). In the case of the coherent image
formation, both points can no longer be separated [8].
For a lens with aperture angle , the minimum blur is given by [9]-[10].
2
C
3
s
min
= (8)
For a rough estimate of the optimum aperture size, convolve blurring terms, if the point spreads were Gaussian, we could
add in quadrature [9].
2
2
2
s 2 2
min
2
T
0.61
2
C
|
.
|
\
|
+
|
|
.
|
\
|
= + ~ (9)
3. DEPTH OF FIELD AND DEPTH OF FOUCS
The object points O
1
and O
2
objects are separated by the resolution limit of the lens. Rays from these points cross the
axis at A and B equally. Hence, points between A and B will look equally sharp, and AB is the depth of field D
o
of the
lens for a semi-angular , and depth of field varies with magnification, see figure 1 [9].
tan
D
o
= (10)
We also need to consider the depth of focus (vertical resolution). This is the ability to produce a sharp image from a non-
flat surface.
o
=
nsin
D
of
(11)
Depth of focus is increased by inserting the objective aperture (just in iris that cuts down on light entering the objective
lens). However, this decreases resolution.
Figure 1 The depth of field
4. THE MATHEMATICAL MODELS
To calculate the axial magnetic field distribution B
z
, two different mathematical models have been a adopted to be an
objective functions for this work, which are respectively,
1) The Fourth Exponent Model [11].
]
w
2z
[1
B
B
4
max
z
|
.
|
\
|
+
= (12)
2) The Grivet -Lenz Model [12].
|
.
|
\
|
=
w
2.634z
secant B (z) B
max z
(13)
International Journal of Application or Innovation in Engineering& Management (IJAIEM)
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Volume 3, Issue 2, February 2014 ISSN 2319 - 4847
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It is seen that the two above expressions are formulated such that B
z
distributions may assign in terms of a same
optimization parameters. That are the maximum flux density B
max
, field half-width w and lens length L=z
2
-z
1
, where z
1
and z
2
are the axial field terminal coordinates respectively.
In the present work to calculate all requirment results we have been writen in Fortran power station 90 language
program. Therefore, figure 2 representing a block diagram for this work [13].
Figure 2 The block diagram for the present work
5. RESULTS AND DISCUSSION
The magnetic flux density distributions for the considered the two models are shown in figures 3. These B
z
distributions
have been computed for B
max
=0.2Tesla, the half-width of the field w=1 millimeter and lens length L=20 millimeter. It is
seen that each of these models has its own characteristic extend along the optical axis and vanishes after the lens end.
0
0.02
0.04
0.06
0.08
0.1
0.12
0.14
0.16
0.18
0.2
0.22
-10 -8 -6 -4 -2 0 2 4 6 8 10
Z(mm)
B
z
(
T
e
s
l
a
)
TheFourthExponent Model
TheGrivet-Lenz Model
Figure3 Axial flux density distributions B
z
for the two models at B
max
=0.2T, w=1mm and L=20 mm
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Volume 3, Issue 2, February 2014 ISSN 2319 - 4847
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In order to reveal the influence of varying the half-width of an imaging formation on its resolution at coherent and
incoherent imaging formation all relations in Table 2 have been used respectively. Therefore, five values of w have been
chooses namely (1, 2, 3, 4 and 5 ) in unit of millimeter. However, at fixed values of (NI/V
r
)
1/2
=20, B
max
=0.2T and
L=20mm the resolution limit for each considered model are plotted as a function of w in figure 4, for coherent case, and
figure 5a,b, for incoherent case. It is seen that the resolution get enhanced as along as the field half-width increases.
Furthermore, the field of a wide extension along the optical axis has a better value of .
0
2
4
6
8
10
12
14
16
18
20
0 1 2 3 4 5 6
Thehalf-widthw(mm)
T
h
e
R
e
s
o
l
u
t
i
o
n
L
i
m
i
t
(
n
m
)
TheFourthExponent Model
TheGrivet-Lenz Model
=0.66(C
s
3
)
1/4
Figure 4 The Variation of the resolution limit as a function of the half-width w for the two models for coherent case
Figure 5 The Variation of the resolution limit as a function of the half-width w for the two models for incoherent case
Such a result, however, can be understood easily by plotting each of V
r
, and C
s
as a function of the chosen values of w
as shown in figures 6, 7 and 8 respectively. Figure 6 shows clearly that increases of lens half-width leads to increases of
accelerating potential required to obtain NI/V
r
1/2
= 20. So, the associated electron wavelength must be decreases
consequently as indicated in figure 7. Now, one may easy realize that the values of spherical aberration C
s
increasing
linearly with increasing the halfwidth w, as shown in figure 8.
International Journal of Application or Innovation in Engineering& Management (IJAIEM)
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Volume 3, Issue 2, February 2014 ISSN 2319 - 4847
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0
0.02
0.04
0.06
0.08
0.1
0.12
0.14
0.16
0.18
0.2
0.22
0.24
0 1 2 3 4 5 6
Thehalf-widthw(mm)
T
h
e
A
c
c
e
l
a
r
e
t
e
d
V
o
l
t
a
g
e
V
r x
1
0
-4
(
V
o
l
t
)
TheFourthExponentModel
TheGrivet-Lenz Model
Figure 6 The variation of the relativistically accelerating voltage V
r
as a function of the half-width w for the two models
0
0.2
0.4
0.6
0.8
1
1.2
1.4
1.6
0 1 2 3 4 5 6
Thehalf-widthw(mm)
T
h
e
W
a
v
e
l
e
n
g
t
h
(
n
m
)
TheFourthExponent Model
TheGrivet-Lenz Model
Figure 7 The variation of the associated electron wavelength with the half-width w for the two models
0
0.2
0.4
0.6
0.8
1
1.2
0 1 2 3 4 5 6
Thehalf-widthw(mm)
T
h
e
S
p
h
e
r
i
c
a
l
A
b
e
r
r
a
t
i
o
n
C
s
(
m
m
)
TheFourthExponentModel
TheGrivet-Lenz Model
Figure 8 The variation of spherical aberration C
s
versus the half-width w for the two models
International Journal of Application or Innovation in Engineering& Management (IJAIEM)
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Volume 3, Issue 2, February 2014 ISSN 2319 - 4847
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According to equation 9, figure 9a,b, illustrates the relationship between the square resolution limit
2
, as a function of
the half-width w for the two models for coherent and incoherent case at optimum aperture. It can be noted that
2
increases with increasing the half-width w, while according to equations 10 and 11, figure 10a,b represents the depth of
field D
o
at optimum aperture, figure10a, and figure 10b, for the coherent, and incoherent cases respectively, it will be
seen that the depth of field increasing in two cases when the half-width increasing as well as the depth of focus at
optimum aperture see figure 11a,b.
(a) (b)
Figure 9 The Variation of square resolution limit
2
as a function of the half-width w for the two models
(a) (b)
Figure 10 The Variation of the depth of field D
o
as a function of the half-width w for the two models
(a) (b)
Figure 11 The Variation of the depth of focus D
of
as a function of the half-width w for the two models
International Journal of Application or Innovation in Engineering& Management (IJAIEM)
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Volume 3, Issue 2, February 2014 ISSN 2319 - 4847
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6. CONCLUSSIONS
Through the results extracted can be seen some important results of the resolution limits for both proposed lenses, we find
more convergence in the results at high values of the half-width, while, depth of field and depth of focus are increasing.
References
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