G.8262 SyncE Umanual SC299625

G.
8262 SyncE Conformance Testing Applications User Guide
1. 2. 3. 4. 5. 6. 7. 8. 9.
Hardware and Software required .............................................................................................................. 2 Connecting an EEC to the Paragon-X ......................................................................................................... 3 How to Configure the Paragon-X for ALL G.8262 Tests ............................................................................. 5 Measuring Frequency Accuracy G.8262 Section 6.................................................................................. 8 Pull-in, Hold-in, and Pull-out ranges G.8262 Section 7 ......................................................................... 10 Wander (Noise) Generation G.8262 Section 8 ..................................................................................... 13 Jitter Generation G.8262 Section 8.3 .................................................................................................... 16 Wander (Noise) Tolerance G.8262 Section 9 ........................................................................................ 17 Jitter Tolerance G.8262 Section 9.2 ...................................................................................................... 22
10. Wander (Noise) Transfer G.8262 Section 10 ........................................................................................ 23 11. Phase Transient Response G.8262 Section 11 ...................................................................................... 31 12. Appendix 1 - G.8262 Testing; Practical interpretation guidance ............................................................. 36
Calnex Solutions Ltd Reg. SC299625
Page 1 of 40
1.
Hardware and Software required

Paragon-X o o o o o o Option 110 GbE electrical and Optical Option 111 10GbE interface (optional) Option 120 Delay and Header Capture Option 213 SyncE measurements Option 223 MTIE/TDEV internal wander generation Paragon- X Software X.10.14 or higher
Synchronisation (Reference) Frequency Source
Page 2 of 40
2.
Connecting an EEC to the Paragon-X
The front panel of the Paragon-X provides the following interfaces for testing: 1. 100MbE Electrical or Optical (SGMII SFP) 2. 1GbE Electrical or Optical (SFP) with option 110 fitted 3. 10GbE Optical (XFP or SFP+) with option 111 fitted
10GbE Port 1
10GbE Port 2 Status Display
100MbE/1GbE Port 1
100MbE/1GbE Port 2
PC Controller Port
Paragon-X Front Panel Connections
Page 3 of 40
The Paragon-X accepts the following reference clocks which should be applied to one of the Reference Inputs on the back panel: 1. 2.048MHz 2. 10MHz 3. E1 (2.048Mb/s) 4. DS1 (T1) (1.544Mb/s)
Fig. 1 Paragon-X Reference Inputs (Back Panel)
There are two reference inputs BNC with 75 impedance (the connector on the left in the figure). Bantam connector with 100 impedance. o o o 3 pole bantam jack 4.39mm Diameter Tip; Positive, Ring; Negative, Sleeve; Ground
Page 4 of 40
3.
How to Configure the Paragon-X for ALL G.8262 Tests
a) Verify your physical connections have been completed per section 2. b) Start the Paragon-X GUI c) Select the Operating Mode button.
d) Select Sync-E then select Close e) Click Setup Interface and then Physical Settings.
Page 5 of 40
f)
Verify that the SyncE Clock Rx > Tx is not checked
g) Select the reference clock source. h) Select the line rate and Electrical/Optical (100M/1GbE/10GbE). Note: If using SFPs, XFPs or SFP+s, BOTH Port 1 and Port 2 optical transceivers must be inserted into the Paragon-X. i) Select the Close button to close the Physical Settings window, and then select Close again to close the setup interface window. Note: once you have selected Sync-E mode, the Paragon-X GUI will display SYNCE LOCK as grey (This verifies that the SyncE Rx > Tx box is unchecked).
ESMC Generation
Ethernet Synchronisation Message Channel (ESMC) is a Point to Point Protocol in which each EEC generates and terminates an ESMC PDU. This ESMC PDU is normally transmitted once per second on the Slow Protocol Channel and contains the Quality Level (QL) TLV of the associated clock . The receiving EEC uses this QL to select the best quality clock. The EEC then regenerates the ESMC
Page 6 of 40
PDU with the appropriate QL TLV value to indicate the quality of the clock being transmitted to the next EEC. If the EEC supports ESMC, it is possible for the Paragon-X to use this functionality to indicate if an EEC switches clock reference or goes into holdover. The Paragon-X can generate ESMC messages on both Ports 1 and 2. For G.8262 conformance testing, ESMC messages are generated on Port 2 with a used defined Quality Level (QL) such as PRC.
a) Generate ESMC messages by selecting
button. The following window will open.
b) Check the box Enable TX+Rx Mode c) Select Port 2 tab (the output from the Paragon and input to EEC) d) Select SSM code QL-PRC, which tells the EEC that the clock from the Paragon-X is of PRC quality. e) Set rate to 1000mS. f) Click and then
g) The ESMC Generation button will go red to indicate the Paragon-X is generating ESMC packets. After any setup changes to the Paragon-X, please ensure the EEC has had time to settle before making any measurements
Page 7 of 40
4.
Measuring Frequency Accuracy G.8262 Section 6
Input Stimulus
EEC Option 1 Free run EEC Option 2 Hold over
Pass/Fail Criteria
+/- 4.6 ppm
Notes
Recommend to test for an hour, longer if close to limits Recommend to test for an hour, longer if close to limits
+/- 4.6 ppm
Measurement Setup
a) Connect the EEC to Paragon-X to EEC as shown above b) Set up the Paragon-X GUI as per Section 3.
Measurement Process
a) Select the Start Capture button to start measurement.
b) To stop the measurement after a pre-defined period for running the test, select Stop Capture button.
Page 8 of 40
c) Paragon-X will provide the ppm frequency accuracy at the bottom of the graph in red text (as shown in the screen shot at the top of the next page).
Page 9 of 40
5.
Pull-in, Hold-in, and Pull-out ranges G.8262 Section 7
Pullin Range (G.8262 Section 7.1)

The Pull-in range is defined as the largest offset between a slave clock's reference frequency and a specified nominal frequency, within which the slave clock will achieve locked mode.
Input Stimulus
EEC Option 1 and EEC Option 2 Apply a large Frequency offset ensuring EEC is in holdover. Reduce offset until EEC locks.
Pass/Fail Criteria
EEC starts unlocked with large offset applied EEC locks before offset reaches +/- 4.6ppm
Notes
Lock can also be monitored by using ESMC (if supported)
Holdin Range (G.8262 Section 7.2)

Hold-in range is defined as the largest offset between a slave clock's reference frequency and a specified nominal frequency, within which the slave clock maintains lock as the frequency varies arbitrarily slowly over the frequency range.
Input Stimulus
EEC Option 1 EEC Option 2 EEC is locked to the clock from the Paragon-X. The Frequency is then offset to +/-4.6ppm
Pass/Fail Criteria
Not Applicable
Notes
EEC should remained locked at an offset at +/-4.6ppm
Page 10 of 40
Pullout Range (G.8262 Section 7.3)

Pull-out range is defined as the offset between a slave clock's reference frequency and a specified nominal frequency, within which the slave clock stays in the locked mode and outside of which the slave clock cannot maintain locked mode, irrespective of the rate of the frequency change.
Input Stimulus
EEC Option 1 EEC is locked to the clock from the Paragon-X. The Frequency is then offset until the EEC unlocks
Pass/Fail Criteria
EEC should remain locked at an offset at +/-4.6ppm but lock should extend beyond this. Not Applicable
Notes
G.8262 states this is for further study
EEC Option 2
Measurement Setup
a) Connect the EEC to Paragon-X to EEC as shown in the diagram at the beginning of this section b) Set up the Paragon-X GUI as per Section 3, including setting up ESMC with QL=PRC if using ESMC to monitor which clock the EEC is locked to.
Measurement Process
a) select the Start Capture button to start measurement.
b) Select the Wander and Jitter Generation button. The Frequency Offset window will appear
Page 11 of 40
c) In the Frequency Offset window, add the Frequency Offset required and click the Apply Offset button
d) To remove the Frequency Offset and return it back to 0ppm click the Remove Offset button e) To stop the measurement after a pre-defined period for running the test, select Stop Capture button.
f) The Paragon-X TIE graph indicates if the EEC is in or out of lock as shown in the screenshot below
Page 12 of 40
6.
Wander (Noise) Generation G.8262 Section 8
Input Stimulus
EEC Option 1
(Constant Temp)
Pass/Fail Criteria
MTIE & TDEV Pass/Fail masks shown in G.8262 Section 8.1.1 MTIE Pass/Fail masks shown in G.8262 Section 8.1.2. MTIE & TDEV Pass/Fail masks shown in G.8262 Section 8.1.2
Notes (G.8262 masks)

MTIE Table 1/ Figure 1 TDEV Table 3/ Figure 2 MTIE Table 1/ Figure 1 TDEV G.8262 states for further study MTIE Table 4/ Figure 3 TDEV Table 5/ Figure 4
- Locked Mode - Wander Free reference - Constant temperature
EEC Option 1
(Temp effects)
- Locked Mode - Wander Free reference - Temperature effects
EEC Option 2
(Constant Temp)
G.8261 Section 8.2 also mentions measurements in Non-locked mode and refers to section 11.2 Long-term phase transient response (Holdover) and will not be covered in this section.
Measurement Setup
a) Connect the EEC to Paragon-X to EEC as shown in the diagram at the beginning of this section g) Set up the Paragon-X as described in section 3, including setting up ESMC with QL=PRC if using ESMC to monitor which clock the EEC is locked to.
Measurement Process
a) Select the Start Capture button to start measurement.
Page 13 of 40
b) To stop the measurement, select Stop Capture. should run for approx 3,000 seconds
. It is suggested that the test
c) The graph will show the captured TIE
d) To display the MTIE and TDEV graphs click
on the bottom right hand side of the
graph and then MTIE/TDEV Analysis from the displayed menu.
e) A separate window will open showing the TIE in graphical form at the top, with an MTIE/TDEV graph at the bottom.
Page 14 of 40
f)
The MTIE/ TDEV analysis can be carried out against the G.8262 masks for Wander Generation which can be selected from the measurement mask pull down selection in the left hand window.
g) Pass/Fail indication against the masks is shown also in this left hand window and will have a green background for Mask Pass and a red background for Mask Fail
Page 15 of 40
7.
Jitter Generation G.8262 Section 8.3
Testing Jitter generation is planned for a future Paragon-X release
Page 16 of 40
8.
Wander (Noise) Tolerance G.8262 Section 9
Input Stimulus
EEC Option 1 MTIE Wander Table 7/Figure 5 TDEV Wander Table 8/Figure 6 Sinusoidal Wander Table 9/Figure 7
Pass/Fail Criteria
The EEC is; i. Maintaining the clock within performance limits. ii. Not causing any alarms. iii. Not causing the clock to switch reference. iv. Not causing the clock to go into holdover. The EEC is;.
Notes
To Check whether the EEC is switching references or going into holdover, the Paragon can measure the wander and/or ESMC QL of the EEC output. To Check whether the EEC is switching references or going into holdover, the Paragon can measure the wander and/or ESMC QL of the EEC output.
EEC Option 2
TDEV Wander Table 10/Figure 8
i. Maintaining the clock within performance limits ii. Not causing any alarms. iii. Not causing the clock to switch reference. iv. Not causing the clock to go into holdover.
Measurement Setup
a) Connect the EEC to Paragon-X to EEC as shown in the diagram at the beginning of this section b) Set up the Paragon-X as described in section 3, including setting up ESMC with QL=PRC if using ESMC to monitor if the EEC is switching clock references or going into holdover.
Page 17 of 40
Measurement Process
a) Select the Wander and Jitter Generation button on the Paragon-X GUI.
b) The Following window will now be open.
c) Select the Wander Tolerance Tab and the following window will open
d) There are three methods of generating wander into the EEC: i. ii. iii. MTIE/TDEV modes Fastest and most effective way to evaluate EEC Table (Sine) Wander Can be used for finding Maximum Tolerable Wander Single (Sine) Wander Can be used for troubleshooting
Page 18 of 40
e)
MTIE/TDEV Wander The Paragon-X generates MTIE and TDEV wander as defined in G.8262.
i. Select the wander mask required from the drop down list. The mask and the maximum running time will be shown on the right hand side of the window. G.8262 Option 1 MTIE - Running Time is 1000s G.8262 Option 1 TDEV - Running Time is 12000s G.8262 Option 2 TDEV - Running Time is 12000s ii. Click Generate Wander to start the test. The elapsed time will be displayed on the bottom right hand side of the window. iii. The test will stop after the max Running time has reached, the test can also be stopped manually by clicking Stop Wander. f) Table (Sinusoidal) Can be used to test Maximum Tolerable Wander
Page 19 of 40
The user can enter up to 10 different wander parameter sets in the table. The Paragon-X will then automatically add each of the specified wander sets in turn giving full indication of progress in the Status column. Switching between the different sets is always done at a zero crossing to prevent phase steps. i. Enter the frequency, amplitude, and dwell time (number of cycles the frequency/amplitude pair will be run) for each wander test point. The same frequency with different amplitudes can be entered to find maximum tolerable wander The Restore Defaults button when checked will restore the values to that defined in table 9 in G.8262. Only rows that have the enable check box ticked will be executed in the test. To skip over a selection, un-tick the enable box for that selection. ii. iii. iv. v. Click Generate Wander to start the test Click Stop Wander to stop the test. The test will terminate at the next zero crossing A pop up box stating how long to the next zero crossing is displayed, click the Stop Immediate button if it is desired to stop the test instantly.
g) Single Sinusoidal Wander Can be used for troubleshooting issues at a specific frequency
i. Enter the frequency and amplitude of the desired wander ii. Click Generate Wander to start the test iii. Click Stop Wander to stop the test. The test will terminate at the next zero cros sing of the wander frequency A pop up box stating how long to the next zero crossing is displayed.
Page 20 of 40
h)
G.8262 states that with the wander applied that the EEC should i. Maintain the clock within the prescribed performance limits (the exact performance limits are for further study) ii. Not cause any alarms iii. Not cause the clock to switch references iv. Not cause the clock to go into holdover For further insight, use the Paragon-X ESMC generation/capture capability and TIE graph to check whether the EEC is switching clock reference or going into holdover.
i)
Ensure the Paragon-X has been set up to Generate ESMC messages with QL=PRC as described in section 3 of this document.
j) k)
Select the Start Capture
button to start the measurement. and then Show 2

nd
To show both the TIE and ESMC graph at the same time click Graph and then select ON
l)
To change what a graph is displaying, i. click one of the graphs (the selected graph will be non-Grey ii. Click and then Graph Display Mode, finally select the graph to display
Time Interval Error (TIE) vs Nominal ESMC Rx Quality vs Time: (Port 1 Rx)
The screenshot above shows an EEC that has switched references or gone into holdover (top graph is ESMC, bottom graph shows the difference in Frequency between the reference and the recovered clock from the EEC) m) To stop the measurement, select Stop Capture.
Page 21 of 40
9.
Jitter Tolerance G.8262 Section 9.2
Testing Jitter tolerance is planned for a future Paragon-X release
Page 22 of 40
10.
Wander (Noise) Transfer G.8262 Section 10
Input Stimulus
Pass/Fail Criteria
Notes
There is no definition of the input stimulus to be used in G.8262. Without further guidance from the Standards, it is suggested that the amplitude and frequency values associated with mask points labelled f1, f2 & f3 on G.8262 Section 9.1.1, Table 9 & Figure 7 are used.
EEC Option 1
Not defined
The phase gain of the EEC should be smaller than 0.2 dB (2.3%).
EEC Option 2
Measure EEC output against TDEV Pass/Fail masks shown in G.8262 Section 10..2 Table 13/Figure 11
Measurement Setup
a) Connect the EEC to Paragon-X to EEC as shown in the diagram at the beginning of this section b) Set up the Paragon-X as described in section 3, including setting up ESMC with QL=PRC if using ESMC to monitor which clock the EEC is locked to.
Page 23 of 40
Measurement Process
a) Select the Wander and Jitter Generation
button on the Paragon-X GUI.
b) The Following window will now be open.
c) Select the Wander Transfer Tab and the following window will open
Page 24 of 40
G.8262 Option 1 Wander Transfer Test: Paragon-X automated testing

a) Select the G.8262 Option 1 tab and then the Table tab.
b) Enter the frequency, amplitude, and dwell time (number of cycles the frequency/amplitude pair will be run) for each wander test point. i. The Restore Defaults button when checked will restore the values to that defined in table 9 in G.8262. ii. Only rows that have the enable check box ticked will be executed in the test. To skip over a selection, un-tick the enable box for that selection.
c) To calibrate the Paragon-X, connect a short Ethernet cable between Port 1 and Port 2 and click the button.
Page 25 of 40
d) When the calibration is finished the Status window will show
e) Remove the short Ethernet cable between Port 1 and Port 2 and connect the EEC under test as shown in the setup diagram at the start of this section.
f)
Click the Generate Wander
button to start the test.
g) The Paragon-X will show the status of the test, the measured Gain (dB) value and also a Pass/Fail indication on the right hand side of the window.
Page 26 of 40
G.8262 Option 1 Wander Transfer Test: Paragon-X single frequency test This capability can be used for fault finding issues at specific frequencies
a) Select the G.8262 Option 1 tab and then the Single tab.
b) Enter the frequency and amplitude of the wander to be generated
c) To calibrate the Paragon-X, connect a short Ethernet cable between Port 1 and Port 2 and click the button.
d) When the calibration is finished the Status window will show
e) Remove the short Ethernet cable between Port 1 and Port 2 and replace with the EEC under test.
Page 27 of 40
f)
Click the Generate Wander
g) The GUI will show the estimated completion time at the bottom of the screen. The measured Gain (dB) value and also a Pass/Fail indication (Green/Red background) will be displayed.
Page 28 of 40
G.8262 Option 2 Wander Transfer Test:

a) Select the G.8262 Option 2 tab.
b) Press Generate Wander
c) The amount of the time until completion of the test is shown at the bottom right hand side of the screen.
d) At any time during the test, it is possible to view an updated output TDEV graph by clicking the TDEV Results button. The TDEV graph will then be displayed.
Page 29 of 40
e) At the end of the test the Paragon-X will automatically show the final MTIE graph and show Pass/Fail against the MTIE mask.
Page 30 of 40
11.
Phase Transient Response G.8262 Section 11
Input Stimulus
EEC input reference is lost for 15 seconds and a 2nd reference input signal, traceable to the same reference clock, is available simultaneously EEC input reference is lost for 15 seconds and a 2nd reference input signal, traceable to the same reference clock, is available simultaneously
Pass/Fail Criteria
Notes
To emulate the loss of the link either Change ESMC QL=DNU Remove the cable between port 2 and EEC
EEC Option 1
Maximum phase transient at the output due to reference switching to meet mask in G.8262 Figure 12
To emulate the loss of the link either: EEC output should meet MTIE mask defined by table 15/ Figure 14 in section 11.4.2 of G.8262 Change ESMC QL=DNU Remove the cable between port 2 and EEC
EEC Option 2
Measurement Setup
a) Connect the EEC to Paragon-X to EEC as shown in the diagram at the beginning of this section b) Set up the Paragon-X as described in section 3 (including ESMC generation if using the ESMC method of switching clock references, ensuring SSM code is set to PRC) c) Select Configure Capture , select 10mSecs sample period and then close.
Page 31 of 40
Measurement Process
a) There are two methods for determining Phase Transient Response with the Paragon-X; i. Use ESMC Generation (if supported by the DUT). ii. Remove the link between Port 2 on the paragon-X and the EEC input port.
b) Select the Start Capture
button to start measurement.
c) If using the Ethernet cable removal method. d) If using ESMC method i. Select button. The following window will open
ii. Ensure SSM code is set to QL PRC iii. In the SSM Code drop down menu select QL DNU/DUS and then click .
e) To stop the measurement click Stop Capture.
Page 32 of 40
Measuring Results
The switching transient will be seen on the Paragon-X TIE graph. The Paragon-X graphs can show the TIE and also the ESMC QL for each port In the screenshot bellow the ESMC graph shows the time and QL change of the ESMC transition on Port 2 Tx of the Paragon-X. This can then be compared in time to the TIE graph showing the Transient.
Method of evaluating the capture for phase transient response is dependent upon whether EEC Option 1 or Option 2 is being evaluated.
EEC Option 1 a) To view the output TIE for EEC Option 1, closely monitor the output TIE graph on Paragon-X for the duration (15s) of the test. While the slave clock is acquiring the new reference, the output phase transient should be within the limits of figure 12 of G.8262 (provided below)
Page 33 of 40
EEC Option 2 a) To view the output MTIE mask for EEC Option 2 ONLY, perform the following: b) To display the MTIE and TDEV graphs click on the bottom right hand side of the TIE
graph and then MTIE/TDEV Analysis from the displayed menu.
c) A separate window will open showing the TIE in graphical form at the top, with an MTIE/TDEV graph at the bottom.
d) The MTIE analysis can be carried out against the G.8262 masks for Wander Transient which can be selected from the measurement mask pull down selection in the left hand window.
Page 34 of 40
e) Pass/Fail indication against the masks is shown also in this left hand window and will have a green background for Mask Pass and a red background for Mask Fail
Page 35 of 40
12.
Appendix 1 - G.8262; Practical interpretation guidance
Frequency Accuracy G.8262 Section 6 Input Stimulus

EEC Option 1 Free run EEC Option 2 Hold over +/- 4.6 ppm +/- 4.6 ppm
Pass/Fail Criteria
Notes
Recommend to test for an hour, longer if close to limits Recommend to test for an hour, longer if close to limits
Pullin Range (G.8262 Section 7.1) Input Stimulus

EEC Option 1 and EEC Option 2 Apply a large Frequency offset ensuring EEC is in holdover. Reduce offset until EEC locks.
Pass/Fail Criteria
EEC starts unlocked with large offset applied EEC locks before offset reaches +/- 4.6ppm
Notes
Holdin Range (G.8262 Section 7.2) Input Stimulus

EEC Option 1 EEC Option 2 EEC is locked to the clock from the Paragon-X. The Frequency is then offset to +/-4.6ppm
Pass/Fail Criteria
Not Applicable EEC should remained locked at an offset at +/-4.6ppm
Notes
Page 36 of 40
Pull out Range (G.8262 Section 7.3)
Input Stimulus
EEC Option 1 EEC is locked to the clock from the Paragon-X. The Frequency is then offset until the EEC unlocks.
Pass/Fail Criteria
EEC should remain locked at an offset at +/-4.6ppm but lock should extend beyond this. Not Applicable
Notes
G.8262 states this is for further study
EEC Option 2
Wander Generation (G.8262 Section 8)
Input Stimulus
EEC Option 1
(Constant Temp)
Pass/Fail Criteria
MTIE & TDEV Pass/Fail masks shown in G.8262 Section 8.1.1 MTIE Pass/Fail masks shown in G.8262 Section 8.1.2. MTIE & TDEV Pass/Fail masks shown in G.8262 Section 8.1.2
Notes
MTIE Table 1/ Figure 1 TDEV Table 3/ Figure 2 MTIE Table 1/ Figure 1 TDEV G.8262 states for further study MTIE Table 4/ Figure 3 TDEV Table 5/ Figure 4
EEC Option 1
(Temp effects)
- Locked Mode - Wander Free reference - Temperature effects
EEC Option 2
(Constant Temp)
Page 37 of 40
Wander Tolerance (G.8262 Section 9)
Input Stimulus
EEC Option 1 MTIE Wander Table 7/Figure 5 TDEV Wander Table 8/Figure 6 Sinusoidal Wander Table 9/Figure 7
Pass/Fail Criteria
The EEC is; v. Maintaining the clock within performance limits. vi. Not causing any alarms. vii. Not causing the clock to switch reference. viii. Not causing the clock to go into holdover. The EEC is;.
Notes
To Check whether the EEC is switching references or going into holdover, the Paragon can measure the wander and/or ESMC QL of the EEC output. To Check whether the EEC is switching references or going into holdover, the Paragon can measure the wander and/or ESMC QL of the EEC output.
EEC Option 2
v. Maintaining the clock within performance limits vi. Not causing any alarms. vii. Not causing the clock to switch reference. viii. Not causing the clock to go into holdover.
Wander Transfer (G.8262 Section 10) Input Stimulus Pass/Fail Criteria Notes
There is no definition of the input stimulus to be used in G.8262. Without further guidance from the Standards, it is suggested that the amplitude and frequency values associated with mask points labelled f1, f2 & f3 on G.8262 Section 9.1.1, Table 9 & Figure 7 are used.
EEC Option 1
Not defined
The phase gain of the EEC should be smaller than 0.2 dB (2.3%).
EEC Option 2
Measure EEC output against TDEV Pass/Fail masks shown in G.8262 Section 10..2 Table 13/Figure 11
Page 38 of 40
Transient Response (G.8262 Section 11) Input Stimulus

EEC input reference is lost for 15 seconds and a 2nd reference input signal, traceable to the same reference clock, is available simultaneously EEC input reference is lost for 15 seconds and a 2nd reference input signal, traceable to the same reference clock, is available simultaneously
Pass/Fail Criteria
Notes
To emulate the loss of the link either Change ESMC QL=DNU Remove the cable between port 2 and EEC
EEC Option 1
Maximum phase transient at the output due to reference switching to meet mask in G.8262 Figure 12
To emulate the loss of the link either: EEC output should meet MTIE mask defined by table 15/ Figure 14 in section 11.4.2 of G.8262 Change ESMC QL=DNU Remove the cable between port 2 and EEC
EEC Option 2
Page 39 of 40
For more information on the Calnex Paragon-X and to take advantage of Calnexs extensive experience in sync and packet testing technologies, please contact Calnex Solutions on +44 (0) 1506 671 416 or email: info@calnexsol.com
Calnex Solutions Ltd Herkimer House Mill Road Enterprise Park Linlithgow West Lothian EH49 7SF United Kingdom Tel: +44 (0) 1506 671 416 Email: info@calnexsol.com
www.calnexsol.com
This information is subject to change without notice
Calnex Solutions Ltd, 2010

G.8262 SyncE Umanual SC299625

Uploaded by

Document Information

Copyright

Available Formats

Share this document

Share or Embed Document

Sharing Options

Did you find this document useful?

Is this content inappropriate?

Copyright:

Available Formats

G.8262 SyncE Umanual SC299625

Uploaded by

Copyright:

Available Formats

G.

8262 SyncE Conformance Testing Applications User Guide

Calnex Solutions Ltd Reg. SC299625

Hardware and Software required

Synchronisation (Reference) Frequency Source

Calnex Solutions Ltd Reg. SC299625

Connecting an EEC to the Paragon-X

10GbE Port 2 Status Display

Paragon-X Front Panel Connections

Calnex Solutions Ltd Reg. SC299625

Fig. 1 Paragon-X Reference Inputs (Back Panel)

Calnex Solutions Ltd Reg. SC299625

How to Configure the Paragon-X for ALL G.8262 Tests

Calnex Solutions Ltd Reg. SC299625

Verify that the SyncE Clock Rx > Tx is not checked

Calnex Solutions Ltd Reg. SC299625

a) Generate ESMC messages by selecting

button. The following window will open.

Calnex Solutions Ltd Reg. SC299625

Measuring Frequency Accuracy G.8262 Section 6

+/- 4.6 ppm

Calnex Solutions Ltd Reg. SC299625

Calnex Solutions Ltd Reg. SC299625

Pull-in, Hold-in, and Pull-out ranges G.8262 Section 7

Pullin Range (G.8262 Section 7.1)

Holdin Range (G.8262 Section 7.2)

EEC should remained locked at an offset at +/-4.6ppm

Lock can also be monitored by using ESMC (if supported)

Calnex Solutions Ltd Reg. SC299625

Pullout Range (G.8262 Section 7.3)

Calnex Solutions Ltd Reg. SC299625

Calnex Solutions Ltd Reg. SC299625

Wander (Noise) Generation G.8262 Section 8

Notes (G.8262 masks)

- Locked Mode - Wander Free reference - Constant temperature

- Locked Mode - Wander Free reference - Temperature effects

- Locked Mode - Wander Free reference - Constant temperature

Calnex Solutions Ltd Reg. SC299625

. It is suggested that the test

c) The graph will show the captured TIE

d) To display the MTIE and TDEV graphs click

on the bottom right hand side of the

graph and then MTIE/TDEV Analysis from the displayed menu.

Calnex Solutions Ltd Reg. SC299625

Calnex Solutions Ltd Reg. SC299625

Jitter Generation G.8262 Section 8.3

Testing Jitter generation is planned for a future Paragon-X release

Calnex Solutions Ltd Reg. SC299625

Wander (Noise) Tolerance G.8262 Section 9

TDEV Wander Table 10/Figure 8

Calnex Solutions Ltd Reg. SC299625

b) The Following window will now be open.

Calnex Solutions Ltd Reg. SC299625

Calnex Solutions Ltd Reg. SC299625

Calnex Solutions Ltd Reg. SC299625

Select the Start Capture

button to start the measurement. and then Show 2

Calnex Solutions Ltd Reg. SC299625

Jitter Tolerance G.8262 Section 9.2

Testing Jitter tolerance is planned for a future Paragon-X release

Calnex Solutions Ltd Reg. SC299625

Wander (Noise) Transfer G.8262 Section 10

TDEV Wander Table 10/Figure 8

Calnex Solutions Ltd Reg. SC299625