This document discusses techniques for combinational test pattern generation, including:
1. Test generation methods such as using truth tables, Boolean equations, Boolean differences, and circuit structure. The most common techniques are based on algorithms that use the circuit structure.
2. Automatic test pattern generation (ATPG) aims to automatically generate test patterns to detect faults in circuits.
3. Structural ATPG algorithms like D-algorithm use concepts of fault activation, propagation, and line justification to generate tests by making decisions at gates in the D-frontier and J-frontier and performing implications.
4. The D-algorithm is demonstrated on an example circuit where it takes multiple rounds of backtracking after incorrect decisions before
This document discusses techniques for combinational test pattern generation, including:
1. Test generation methods such as using truth tables, Boolean equations, Boolean differences, and circuit structure. The most common techniques are based on algorithms that use the circuit structure.
2. Automatic test pattern generation (ATPG) aims to automatically generate test patterns to detect faults in circuits.
3. Structural ATPG algorithms like D-algorithm use concepts of fault activation, propagation, and line justification to generate tests by making decisions at gates in the D-frontier and J-frontier and performing implications.
4. The D-algorithm is demonstrated on an example circuit where it takes multiple rounds of backtracking after incorrect decisions before
This document discusses techniques for combinational test pattern generation, including:
1. Test generation methods such as using truth tables, Boolean equations, Boolean differences, and circuit structure. The most common techniques are based on algorithms that use the circuit structure.
2. Automatic test pattern generation (ATPG) aims to automatically generate test patterns to detect faults in circuits.
3. Structural ATPG algorithms like D-algorithm use concepts of fault activation, propagation, and line justification to generate tests by making decisions at gates in the D-frontier and J-frontier and performing implications.
4. The D-algorithm is demonstrated on an example circuit where it takes multiple rounds of backtracking after incorrect decisions before
This document discusses techniques for combinational test pattern generation, including:
1. Test generation methods such as using truth tables, Boolean equations, Boolean differences, and circuit structure. The most common techniques are based on algorithms that use the circuit structure.
2. Automatic test pattern generation (ATPG) aims to automatically generate test patterns to detect faults in circuits.
3. Structural ATPG algorithms like D-algorithm use concepts of fault activation, propagation, and line justification to generate tests by making decisions at gates in the D-frontier and J-frontier and performing implications.
4. The D-algorithm is demonstrated on an example circuit where it takes multiple rounds of backtracking after incorrect decisions before