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Plasma modelling & reactor design: 1) The "plasma dimension" for plasma deposition of μc-Si:H
Plasma modelling & reactor design: 1) The "plasma dimension" for plasma deposition of μc-Si:H
silane
hydrogen
black box
PECVD
SiH
PRF[W]
f [MHz]
2
hydrogen
Plasma Box,
Oerlikon
principle:
Jacques Schmitt
butterfly
valve
process
pumps
silane
vacuum chamber
SiH
RF connection
4
showerhead
RF electrode
gas flow
heating
grounded box
plasma box
side view
glass substrate
0.05
0
silane
hydrogen
plasma box
SiH
SiH4
total
< 5%
than silane"
to deposit c-Si:H
Selective etching
model
Chemical annealing
model
Surface diffusion
model
3
0.05
0
silane
hydrogen
f [MHz]
gap
tot
SiH
PRF[W]
area
p[mbar]
H
SiH
{molecules}
H2
SiH4
SiH4
polysilanes, dust
PRF[W]
H2
f [MHz]
{sec y reactions}
polysilanes, dust
SiHx
H, H2
H
SiH
{molecules}
H2
SiH4
H2
PRF[W]
f [MHz]
SiHx
H, H2
SiH4
H
SiH
{molecules}
H2
SiH4
H2
SiH4
"The plasma
composition
(and deposition)
is determined by
the partial
pressures of
SiH4 and H2
in the plasma"
load lock
gate valve
vacuum chamber
plasma box
heated
closed
showerhead
butterfly
valve
pumping line
process
pumps
1 m single pass
extended
pumping
line
p IR detector
H
SiH
0
0
pSiH
+
p
H2 = p
4
0
0
pSiH
+
p
H2 = p
4
Define
silane input concentration, c =
Note 0 c 1
0
pSiH
4
H
SiH
pSiH4 + pH2 = p
2
4
pSiH4 + pH2 = p
Define
silane concentration with plasma, cpl =
p
pSiH4
p
H
SiH
pSiH4 + pH2 = p
pSiH4 + pH2 = p
Define
silane fractional depletion, D =
Note 0 D 1
0
pSiH4
pSiH
4
0
pSiH
4
H
SiH
pSiH4 + pH2 = p
pSiH4 + pH2 = p
Therefore
2 parameters, c & D,
define the plasma
composition
concentration
pure silane
vanishingly weak plasma
c =1
D = 0.95
cpl = c (1 D ) = 0.05
(
0
c = 0.05
D = 0.1
)
IN THE
5% silane
95% hydrogen PLASMA
NO input dilution,
95% depletion
5% silane IN THE
95% hydrogen PLASMA
strong input dilution,
weak depletion
Constant plasma
composition, cpl, gives
constant film properties
transition
material
cpl = 0.5%
cpl = 1.2%
REGIME 2 "recent" :
Film crystallinity governed by
strong plasma depletion, even
for high silane concentration.
REGIME 1 "conventional" :
Film crystallinity governed by
hydrogen dilution of silane,
'independent' of plasma.
+
e
kH
e + H 2
2H + e
SiH 2 Si surf + H 2
S
H + H surf
H 2 + vacancy
H + vacancy
H surf
1
R
H
H2
2
+
+
+
+
SiH4
H2
= kne nSiH4
+ S nSiH2
{radical fluxes}
{surface reaction}
+ ( R 2 ) nH
S nSiH2
deposition
OUT
+ a nSiH4
= kHne nH2
+ a nH2
R nH
H+H
recombination
SiH2 + 2H + e
radical
flux ratio
H
RnH
=
=
SiH2 SnSiH2
kH nH2
2
k nSiH4
kH 1
1 + 2
+ 2 = 2
k
c
pl
tot
area
p[mbar]
analytical
model
a kne
D = 1+
(1 + c )
6 Tgas total
-1
SiH4
c = silane input concentration,
.
total
{ total, Tgas }
Almost a minute to
reach the plasma
composition suitable to
grow c-Si:H...
20
40
60
time (s)
c-Si:H
time (s)
pump
grid
Optical
Emission
Spectrometer
plasma emission
Emission from silane radicals, SiH*, falls as the silane becomes depleted
Emission from excited molecular and atomic hydrogen rises as its partial pressure rises
57 cm
Plasma zone
indirect pumping
t=0-100 s
direct
pumping
t=0-1 s
time to steady-state < 1 s !
409 nm
96 nm
<10 nm
su
bs
tra
te
Two Conclusions
1. Plasma composition and deposition depend on the silane concentration in the plasma,
cpl=c(1-D) , and not only on the silane concentration in the input flow, c.
Strong hydrogen dilution in the plasma, and c-Si:H deposition, can be obtained with high input
concentration of silane.
- monitored non-intrusively by FTIR in the pumping line.