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15205-Piu Common Utrm B
15205-Piu Common Utrm B
Rev.
2005-06-16
Document ID
15205-891586
Prepared by
Approved by
BGA
OS
CONFIDENTIAL
1.
1.1
1.2
1.3
1.4
INTRODUCTION.............................................................................................................. 2
Purpose and scope........................................................................................................... 2
References....................................................................................................................... 2
Terminology and abbreviations.........................................................................................2
Open issues...................................................................................................................... 3
2.
UNIT DESCRIPTION........................................................................................................4
3.
3.1
3.2
3.2.1
3.2.2
3.3
3.3.1
3.3.2
3.3.3
3.3.4
3.3.5
3.4
3.4.1
4.
4.1
4.2
4.2.1
4.2.2
4.3
4.3.1
4.4
4.4.1
4.4.2
4.4.3
4.5
4.5.1
4.5.2
4.5.3
4.5.4
4.5.5
4.5.6
4.5.7
4.5.8
OPERATIONAL TESTS....................................................................................................7
Test overview.................................................................................................................... 7
Initial Process Tests.......................................................................................................... 8
Automatic Optical Inspection (AOI)...................................................................................8
In-Circuit Testing (ICT) (Flying Probe Test (FPT) / Bed of Nails).......................................8
Power-On Tests................................................................................................................ 8
Current Limit Test.............................................................................................................. 8
Boundary Scan Test.......................................................................................................... 9
Infrastructure Test............................................................................................................. 9
Interconnect Test.............................................................................................................. 9
Adapter Test...................................................................................................................... 9
Functional Tests.............................................................................................................. 10
Current Consumption......................................................................................................10
SBC Software download.................................................................................................10
SBC Address Detection..................................................................................................10
Front LED Test................................................................................................................ 11
Hot Swap Test (3.3v).......................................................................................................11
FPGA Software download...............................................................................................11
Inventory......................................................................................................................... 12
Secondary Voltages........................................................................................................12
Confidential
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Document ID
Rev.
B
15205-891586
Rev Date
2005-06-16
Common Tests for Plug In Units for IFU
Next Generation
Confidential
Change Record
Rev
Date
A
B
2005-03-09
2005-06-16
Pages
affected
All
1,7,12
12
3
1.
INTRODUCTION
1.1
Changes
Initial issue
Confidential stamp added in header and footer.
25MHz detection test removed.
Altered revision format and serial no format in table 4-2.
Reduced no. of open issues
This Unit Test Requirement for Manufacturing describes the common tests for all the Plug-In Units (PIU) to
the IFU.
The purpose of this document is to:
Define test requirements for the PIU.
Describe (in some detail) how the tests shall be performed.
Describe necessary equipment, instruments and software to perform the tests.
Be a reference and input for test development and documentation (Test Instructions/-Results, etc.).
1.2
References
Nera specifications
Ref. No. / Document code
[1] NGP\00106
[2] In e-Matrix, various objects
[3] Test Board (PIUT) schematics and drawings
[4] NG-IFU\BASIC\00053
[5] NG-IFU\BASIC\00060
[6] NG-IFU\BASIC\00061
Title / description
IFU-System Design Specification
Board schematics and drawings
\\Nera64\Next_Generation_Prod\Detail Design
Phase\IFU\PIUT-PlugInUnitTest
IFU Software Download
Functional Test Station Description PIU
PIUT Board and FPGA Design Specification
1.3
Abbreviations
ADC
AOI
BGA
BIST
CMI
CMOS
Descriptions
Analogue to Digital Converter
Automatic Optical Inspection
Ball Grid Array
Built-in Self Test (Test performed without instruments)
Codec Mark Invertion
Complementary Metal Oxide Semiconductor
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Rev Date
2005-06-16
Rev.
B
Document ID
15205-891586
Confidential
DAC
DXC
EMC
FET
FP
FPGA
ICT
IEEE
IF
IFU
I/O
JTAG
LIU
MDS
MODEM
MSOH
NROP
OHC Bus
PCB
PIU
PIUT
POD
PSU
QAM
RCVR
RIU
RPS
RSOH
SBC
SDH
SOH
SU
TCK
TDI
TDO
TMS
TRST
UBN
UUT
XCVR
XPIC
1.4
Open issues
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Document ID
Rev.
B
15205-891586
2005-06-16
Common Tests for Plug In Units for IFU
Next Generation
Confidential
2.
Rev Date
UNIT DESCRIPTION
The PIU interfaces the motherboard with user interface or radio equipment.
3.
3.1
Figure 3 -1: Test Station overview shows a general setup of a test-jig for a Plug-In Unit. The various units
might have minor changes to this setup. The boundary scan part of the test might be performed on a separate
test station. In such a station, the Ethernet and RS232 communication is not needed.
+ 3.3V (4)
P4
2-Pin D-Sub
48V Connector
48V Valid
-48V
GPIB
P2
3M
20-Pin
3M
20-Pin
P8
SYNC(3)
PIU
P5B
Ethernet
PIU (UUT)
P5A
Ethernet
PIUT
JTAG (6)
SU Bus
10/100 Ethernet A (4)
SU Bus
1G Ethernet (4) NC
P6
9-Pin D-Sub
DIAG-RS232PIU (UUT)
P11
9-Pin D-Sub
DIAG-RS232PIUT
P9
3M
20-Pin
Debug PIUT
P3
3M
20-Pin
Debug UUT
P10
USB-PIU
Type B
P12
USB-PIU
Type A
PIUT
ET5157A
SU Bus
10/100 Ethernet B (4) NC
HSWAP
J1
95-Pin
GND (22)
J1
95-Pin
UUT
P1
3M
10-Pin
3M
10-Pin
P7
TAP1 (UUT)
JTAG POD
JT2137/12
TAP2 (PIUT)
Ethernet 1
Ethernet 2
JTAG Cable
RS232
Switch
Boundary Scan
Controller
JT3727/PCI
JT3710/USB
JT3727/USB
Office
LAN
J2
55-Pin
Test Jig
ET5157A
Windows XP/2000 PC
Two LAN + GPIB
Barcode reader
Confidential
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Rev Date
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B
2005-06-16
Document ID
15205-891586
Confidential
3.2
Test Jig
The UUT will be placed in a Test Jig (Fixture) for the tests. The Test Jig will consist of a dedicated Test
Board named Plug-In-Unit-Test (PIUT) and a mechanical enclosure.
3.3
3.3.2 Instruments
48V Power Supply, GPIB Controllable.
GPIB Interface for PC
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Document ID
Rev.
B
15205-891586
Rev Date
2005-06-16
Common Tests for Plug In Units for IFU
Next Generation
Confidential
3.3.3
JTAG Equipment
3.3.5 Cables
3.4
The following programs are needed to test and program the IFU PIU.
Test Type
Boundary scan
Functional test
Program type
JTAG test SW from JTAG
Technologies BV
Ethernet Server
TCL platform
TFTP server
TCL script
Name
PCA2176
PM3790
Bootp Server
ActiveTCL
(wish84.exe)
TFTPD32
xxx.tcl
TclDriver
UdpTclDriver.dll
LPC Code
FPGA code
sbcFlash.hex
fpga<xxx>.nff
Used for
Production package
Boundary Scan Diagnostics
Sets up the TCP/IP connection
Sending configuration
commands to UUT.
Server for software download
Various TCL script made
specifically for the tests.
TCL driver with basic TCL
commands.
Programming the LPC.
Programming the FPGA.
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Rev Date
Rev.
B
2005-06-16
Document ID
15205-891586
Confidential
4.
OPERATIONAL TESTS
This chapter shall define the performance parameters which are required to be tested in the manufacturing
test, and specify parameter values with sufficient margins to guaranteed values.
The test software used for the operational tests should record test results with at least article code, serial
number, test date, test point, and test results.
Boundary scan tests should work on the UUT regardless if the software is downloaded or not.
The UUT should be visually inspected before the tests are performed to eliminate obvious faults such as heat
sink not mounted correctly.
4.1
Test overview
Table 4 -4 below shows an overview of the tests to be done. Further description of the tests is given in the
chapters to follow.
Test
no.
Tests / operations
Purpose / Comments
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Document ID
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Confidential
4.2
Rev.
B
Rev Date
2005-06-16
Common Tests for Plug In Units for IFU
Next Generation
These tests are performed before the UUT is inserted in the Test Station.
4.2.2 In-Circuit Testing (ICT) (Flying Probe Test (FPT) / Bed of Nails)
Perform an ICT to at least test components not covered by boundary scan or functional tests.
The power circuits should be included in the test.
4.3
Power-On Tests
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Rev Date
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2005-06-16
Document ID
15205-891586
Confidential
4.4
Confidential
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4.5
Rev.
B
Rev Date
2005-06-16
Common Tests for Plug In Units for IFU
Next Generation
Functional Tests
The following describes functional tests to be performed on each produced UUT. Some of the tests can be
performed in any order, but we suggest using the same order as the chapters in this document. To minimize
the test time, simultaneous testing of several test points should be used if possible.
Set up the test station as shown in Figure 3 -1.
Verify that the UUT reads the address sat in the PIUT.
Alter the slot address in PIUT to 110.1110 (6.14) and verify that the address is detected in the UUT.
Alter the slot address in PIUT to 001.0001 (1.1) and verify that the address is detected in the UUT.
Return 0 if the test succeeds, and an error code if the test fails.
Check the return value from the TCL script to determine pass/fail status of the test.
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B
2005-06-16
Document ID
15205-891586
Confidential
4.5.4 Front LED Test
The purpose of this test is to verify that the front LED is working. The LED is controlled from the SBC.
The LED can be set in different modes:
Green LED ON indicates no alarms on unit.
Red LED ON indicates critical alarms on unit.
Set the green LED to ON and verify by visual inspection that the green LED is green.
Set the red LED on and verify by visual inspection that the red LED is red.
Since this test requires interaction with the test engineer, the test should be put towards the beginning (after
SBC download) or end of the test sequence for the UUT.
On PIUT releases until M1A you have to remove the jumper from P306 (or set the jumper to 2-4) before running the
script.
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Document ID
15205-891586
Rev.
B
Rev Date
2005-06-16
Common Tests for Plug In Units for IFU
Next Generation
Confidential
4.5.7 Inventory
Set the inventory data according to Table 4 -5. Check that the inventory is stored correctly.
Data to be set
Product code
Revision
Serial number
Manufacturing date
Value
[Product code]
[Current revision]
[Current serial number]
[Current date in format yyyy-mm-dd]
Example
FDM5559A
R1A
80130015
2005-05-25
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