Professional Documents
Culture Documents
Contador
Contador
1. General description
The HEF4040B is a 12-stage binary ripple counter with a clock input (CP), an overriding
asynchronous master reset input (MR) and twelve fully buffered outputs (Q0 to Q11). The
counter advances on the HIGH-to-LOW transition of CP. A HIGH on MR clears all counter
stages and forces all outputs LOW, independent of CP. Each counter stage is a static
toggle flip-flop. The clock input is highly tolerant of slow rise and fall times due to its
Schmitt trigger action.
It operates over a recommended VDD power supply range of 3 V to 15 V referenced to VSS
(usually ground). Unused inputs must be connected to VDD, VSS, or another input.
3. Applications
Frequency dividing circuits
Time delay circuits
Control counters
4. Ordering information
Table 1.
Ordering information
All types operate from 40 C to +85 C.
Type number
Package
Name
Description
Version
HEF4040BP
DIP16
SOT38-4
HEF4040BT
SO16
SOT109-1
HEF4040B
NXP Semiconductors
5. Functional diagram
CP
MR
10
T
12-STAGE COUNTER
11
CD
9
13
12
14
15
Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7 Q8 Q9 Q10 Q11
001aad589
Fig 1.
Functional diagram
FF 1
Q
CP
FF 2
Q
FF 12
Q
T
Q
CD
T
Q
CD
CD
MR
Q0
Q1
Q11
001aae615
Fig 2.
Logic diagram
16
32
64
128
256
CP input
MR input
Q0
Q1
Q2
Q3
Q4
Q5
Q6
Q7
Q8
Q9
Q10
Q11
001aad587
Fig 3.
Timing diagram
HEF4040B
2 of 14
HEF4040B
NXP Semiconductors
6. Pinning information
6.1 Pinning
HEF4040B
Q11
16 VDD
Q5
15 Q10
Q4
14 Q9
Q6
13 Q7
Q3
12 Q8
Q2
11 MR
Q1
10 CP
VSS
Q0
001aae614
Fig 4.
Pin configuration
Pin description
Symbol
Pin
Description
VSS
Q0 to Q11
parallel output
CP
10
MR
11
VDD
16
supply voltage
HEF4040B
3 of 14
HEF4040B
NXP Semiconductors
7. Limiting values
Table 3.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol
Parameter
Conditions
VDD
supply voltage
IIK
VI
input voltage
IOK
II/O
input/output current
Min
Max
Unit
0.5
+18
10
mA
0.5
VDD + 0.5
10
mA
10
mA
IDD
supply current
50
mA
Tstg
storage temperature
65
+150
Tamb
ambient temperature
total power dissipation
Ptot
P
power dissipation
40
+85
DIP16 package
[1]
750
mW
SO16 package
[2]
500
mW
100
mW
per output
[1]
[2]
Symbol
Parameter
Conditions
Min
VDD
supply voltage
VI
input voltage
Tamb
ambient temperature
in free air
40
t/V
VDD = 5 V
Typ
Max
Unit
15
VDD
+85
3.75
ms/V
VDD = 10 V
0.5
ms/V
VDD = 15 V
0.08
ms/V
9. Static characteristics
Table 5.
Static characteristics
VSS = 0 V; VI = VSS or VDD; unless otherwise specified.
Symbol Parameter
VIH
VIL
HEF4040B
Conditions
IO < 1 A
IO < 1 A
VDD
Tamb = 40 C
Tamb = 25 C
Tamb = 85 C
Min
Max
Min
Max
Min
Max
Unit
5V
3.5
3.5
3.5
10 V
7.0
7.0
7.0
15 V
11.0
11.0
11.0
5V
1.5
1.5
1.5
10 V
3.0
3.0
3.0
15 V
4.0
4.0
4.0
4 of 14
HEF4040B
NXP Semiconductors
Table 5.
Static characteristics continued
VSS = 0 V; VI = VSS or VDD; unless otherwise specified.
Symbol Parameter
VOH
VOL
IOH
IOL
IDD
supply current
Tamb = 40 C
VDD
Tamb = 25 C
Tamb = 85 C
Unit
Min
Max
Min
Max
Min
Max
4.95
4.95
4.95
10 V
9.95
9.95
9.95
15 V
14.95
14.95
14.95
5V
0.05
0.05
0.05
10 V
0.05
0.05
0.05
ILI
CI
Conditions
5V
IO < 1 A
15 V
0.05
0.05
0.05
VO = 2.5 V
5V
1.7
1.4
1.1
mA
VO = 4.6 V
5V
0.52
0.44
0.36
mA
VO = 9.5 V
10 V
1.3
1.1
0.9
mA
VO = 13.5 V
15 V
3.6
3.0
2.4
mA
VO = 0.4 V
5V
0.52
0.44
0.36
mA
VO = 0.5 V
10 V
1.3
1.1
0.9
mA
VO = 1.5 V
15 V
3.6
3.0
2.4
mA
15 V
0.3
0.3
1.0
5V
20
20
150
10 V
40
40
300
15 V
80
80
600
7.5
pF
IO = 0 A
input capacitance
Parameter
Conditions
tPHL
HIGH to LOW
propagation delay
CP Q0
see Figure 5
Extrapolation formula[1]
Min
Typ
Max
Unit
5V
78 ns + (0.55 ns/pF)CL
105
210
ns
10 V
34 ns + (0.23 ns/pF)CL
45
90
ns
VDD
27 ns + (0.16 ns/pF)CL
35
70
ns
5V
[2]
(0.55 ns/pF)CL
35
70
ns
10 V
[2]
(0.23 ns/pF)CL
15
30
ns
15 V
[2]
(0.16 ns/pF)CL
10
20
ns
15 V
Qn Qn + 1
MR Qn
see Figure 5
tPLH
LOW to HIGH
propagation delay
CP Q0
see Figure 5
Qn Qn + 1
HEF4040B
5V
63 ns + (0.55 ns/pF)CL
90
180
ns
10 V
29 ns + (0.23 ns/pF)CL
40
80
ns
15 V
22 ns + (0.16 ns/pF)CL
30
60
ns
5V
58 ns + (0.55 ns/pF)CL
85
170
ns
10 V
29 ns + (0.23 ns/pF)CL
40
80
ns
15 V
22 ns + (0.16 ns/pF)CL
30
60
ns
5V
[2]
(0.55 ns/pF)CL
35
70
ns
10 V
[2]
(0.23 ns/pF)CL
15
30
ns
15 V
[2]
(0.16 ns/pF)CL
10
20
ns
5 of 14
HEF4040B
NXP Semiconductors
Table 6.
Dynamic characteristics continued
VSS = 0 V; Tamb = 25 C; unless otherwise specified; for test circuit see Figure 6.
Symbol
tt
Parameter
transition time
pulse width
tW
recovery time
trec
maximum
frequency
fmax
Conditions
Extrapolation formula[1]
Min
Typ
Max
Unit
10 ns + (1.00 ns/pF)CL
60
120
ns
10 V
9 ns + (0.42 ns/pF)CL
30
60
ns
15 V
6 ns + (0.28 ns/pF)CL
VDD
see Figure 5
5V
[3]
20
40
ns
CP input HIGH;
minimum width;
see Figure 5
5V
50
25
ns
10 V
30
15
ns
15 V
20
10
ns
MR input HIGH;
minimum width;
see Figure 5
5V
40
20
ns
10 V
30
15
ns
15 V
20
10
ns
5V
40
20
ns
10 V
30
15
ns
15 V
20
10
ns
5V
10
20
MHz
10 V
15
30
MHz
15 V
25
50
MHz
MR input;
see Figure 5
CP input;
see Figure 5
[1]
The typical values of the propagation delay and transition times are calculated from the extrapolation formulas shown (CL in pF).
[2]
For loads other than 50 pF at the nth output, use the slope given.
[3]
Table 7.
Dynamic power dissipation PD
PD can be calculated from the formulas shown. VSS = 0 V; tr = tf 20 ns; Tamb = 25 C.
Symbol
PD
Parameter
dynamic power
dissipation
VDD
5V
10 V
15 V
where:
2
HEF4040B
6 of 14
HEF4040B
NXP Semiconductors
11. Waveforms
VI
VM
MR input
VSS
1/fmax
tW
trec
VI
VM
CP input
VSS
tPHL
VOH
Q0 or Qn
output
VOL
tPLH
tW
tPHL
VM
tTLH
tPLH
tPHL
tTHL
VOH
VM
Qn + 1 output
VOL
001aaj763
Logic levels: VOL and VOH are typical output voltage levels that occur with the output load.
Transition times: transition time (tt) = HIGH LOW (tTHL) or LOW HIGH (tTLH) transition times.
Measurement points are given in Table 8, test circuit in Figure 6 and test data in Table 9
Fig 5.
Waveforms showing propagation delays for MR to Qn and CP to Q0, minimum MR and CP pulse widths
Table 8.
Measurement points
Supply voltage
Input
VDD
VI
VM
VM
5 V to 15 V
VDD or VSS
0.5VDD
0.5VDD
HEF4040B
Output
7 of 14
HEF4040B
NXP Semiconductors
tW
VI
90 %
90 %
negative
pulse
VM
VM
10 %
0V
VI
10 %
tf
tr
tr
tf
90 %
positive
pulse
90 %
VM
VM
10 %
0V
10 %
tW
001aaj781
a. Input waveforms
VDD
VI
VO
DUT
CL
RT
001aag182
b. Test circuit
Test data is given in Table 9.
Definitions test circuit:
DUT = Device Under Test;
CL = load capacitance, including the jig and probe capacitance;
RL = load resistance, which should be equal to the output impedance of the pulse generator.
Fig 6.
Table 9.
Test data
Supply voltage
Input
VDD
VI
tr, tf
CL
5 V to 15 V
VSS or VDD
20 ns
50 pF
HEF4040B
Load
8 of 14
HEF4040B
NXP Semiconductors
SOT38-4
ME
seating plane
A2
A1
c
e
w M
b1
(e 1)
b2
MH
16
pin 1 index
E
10 mm
scale
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
UNIT
A
max.
A1
min.
A2
max.
b1
b2
D (1)
E (1)
e1
ME
MH
Z (1)
max.
mm
4.2
0.51
3.2
1.73
1.30
0.53
0.38
1.25
0.85
0.36
0.23
19.50
18.55
6.48
6.20
2.54
7.62
3.60
3.05
8.25
7.80
10.0
8.3
0.254
0.76
inches
0.17
0.02
0.13
0.068
0.051
0.021
0.015
0.049
0.033
0.014
0.009
0.77
0.73
0.26
0.24
0.1
0.3
0.14
0.12
0.32
0.31
0.39
0.33
0.01
0.03
Note
1. Plastic or metal protrusions of 0.25 mm (0.01 inch) maximum per side are not included.
OUTLINE
VERSION
REFERENCES
IEC
JEDEC
JEITA
ISSUE DATE
95-01-14
03-02-13
SOT38-4
Fig 7.
EUROPEAN
PROJECTION
HEF4040B
9 of 14
HEF4040B
NXP Semiconductors
SOT109-1
A
X
c
y
HE
v M A
Z
16
Q
A2
(A 3)
A1
pin 1 index
Lp
1
detail X
w M
bp
2.5
5 mm
scale
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
UNIT
A
max.
A1
A2
A3
bp
D (1)
E (1)
HE
Lp
Z (1)
mm
1.75
0.25
0.10
1.45
1.25
0.25
0.49
0.36
0.25
0.19
10.0
9.8
4.0
3.8
1.27
6.2
5.8
1.05
1.0
0.4
0.7
0.6
0.25
0.25
0.1
0.7
0.3
0.01
0.039
0.016
0.028
0.020
inches
0.010 0.057
0.069
0.004 0.049
0.16
0.15
0.05
0.244
0.041
0.228
0.01
0.01
0.028
0.004
0.012
8o
o
0
Note
1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included.
Fig 8.
REFERENCES
OUTLINE
VERSION
IEC
JEDEC
SOT109-1
076E07
MS-012
JEITA
EUROPEAN
PROJECTION
ISSUE DATE
99-12-27
03-02-19
HEF4040B
10 of 14
HEF4040B
NXP Semiconductors
Revision history
Document ID
Release date
Change notice
Supersedes
HEF4040B v.8
20111117
HEF4040B v.7
Modifications:
HEF4040B v.7
20111010
HEF4040B v.6
HEF4040B v.6
20091125
HEF4040B v.5
HEF4040B v.5
20090709
HEF4040B v.4
HEF4040B v.4
20090304
HEF4040B_CNV v.3
HEF4040B_CNV v.3
19950101
Product specification
HEF4040B_CNV v.2
HEF4040B_CNV v.2
19950101
Product specification
HEF4040B
11 of 14
HEF4040B
NXP Semiconductors
Product status[3]
Definition
Development
This document contains data from the objective specification for product development.
Qualification
Production
[1]
Please consult the most recently issued document before initiating or completing a design.
[2]
[3]
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
14.2 Definitions
Draft The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences of
use of such information.
Short data sheet A short data sheet is an extract from a full data sheet
with the same product type number(s) and title. A short data sheet is intended
for quick reference only and should not be relied upon to contain detailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semiconductors sales
office. In case of any inconsistency or conflict with the short data sheet, the
full data sheet shall prevail.
Product specification The information and data provided in a Product
data sheet shall define the specification of the product as agreed between
NXP Semiconductors and its customer, unless NXP Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the NXP Semiconductors product is
deemed to offer functions and qualities beyond those described in the
Product data sheet.
14.3 Disclaimers
Limited warranty and liability Information in this document is believed to
be accurate and reliable. However, NXP Semiconductors does not give any
representations or warranties, expressed or implied, as to the accuracy or
completeness of such information and shall have no liability for the
consequences of use of such information.
In no event shall NXP Semiconductors be liable for any indirect, incidental,
punitive, special or consequential damages (including - without limitation - lost
profits, lost savings, business interruption, costs related to the removal or
replacement of any products or rework charges) whether or not such
damages are based on tort (including negligence), warranty, breach of
contract or any other legal theory.
Notwithstanding any damages that customer might incur for any reason
whatsoever, NXP Semiconductors aggregate and cumulative liability towards
customer for the products described herein shall be limited in accordance
with the Terms and conditions of commercial sale of NXP Semiconductors.
HEF4040B
12 of 14
HEF4040B
NXP Semiconductors
In the event that customer uses the product for design-in and use in
automotive applications to automotive specifications and standards, customer
(a) shall use the product without NXP Semiconductors warranty of the
product for such automotive applications, use and specifications, and (b)
whenever customer uses the product for automotive applications beyond
14.4 Trademarks
Notice: All referenced brands, product names, service names and trademarks
are the property of their respective owners.
HEF4040B
13 of 14
HEF4040B
NXP Semiconductors
16. Contents
1
2
3
4
5
6
6.1
6.2
7
8
9
10
11
12
13
14
14.1
14.2
14.3
14.4
15
16
General description . . . . . . . . . . . . . . . . . . . . . . 1
Features and benefits . . . . . . . . . . . . . . . . . . . . 1
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Ordering information . . . . . . . . . . . . . . . . . . . . . 1
Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2
Pinning information . . . . . . . . . . . . . . . . . . . . . . 3
Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 3
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 4
Recommended operating conditions. . . . . . . . 4
Static characteristics. . . . . . . . . . . . . . . . . . . . . 4
Dynamic characteristics . . . . . . . . . . . . . . . . . . 5
Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 9
Revision history . . . . . . . . . . . . . . . . . . . . . . . . 11
Legal information. . . . . . . . . . . . . . . . . . . . . . . 12
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 12
Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Contact information. . . . . . . . . . . . . . . . . . . . . 13
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section Legal information.