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Microwave Diodes
Microwave Diodes
OBJECTIVE : BASICS
SEMICONDUCTOR DEVICES USED IN MICROWAVE SYSTEMS ALSO UTILISE CARRIER
TRANSIT TIME (LIKE IN VACUUM TUBES)
POWER HANDLING CAPACITIES ARE LIMITED BUT ARE IMPROVING & SOME TUBES HAVE
BEEN REPLACED WITH THESE DEVICES
ACCURATE THICKNESS & CONCENTRATION OF DOPING TAILORS THE TRANSIT TIME &
DECIDES & OF OPERATION
VARACTOR DIODES ARE USED FOR PARAMETRIC AMPLIFICATION
TUNNEL DIODE
OBJECTIVE : BASICS
HIGH CONCENTRATION / OF CARRIERS IN A OTHERWISE NORMAL DIODE
DECREASES WIDTH OF THE DEPLETION REGION
CONDUCTION BY QUANTUM MECHANICAL TUNNELLING OF
TUNNEL DIODES HAVE ve RESISTANCE REGION & CONDUCT AS HIGH VALUE RESISTANCES
IN REVERSE BIAS
LOW COST, LOW NOISE, HIGH SPEED, HIGH PEAK TO VALLEY CURRENT RATIO etc MADE
DIODE VERY POPULAR FOR RF APPLICATIONS
THE NEGATIVE RESISTANCE REGION CAN BE USED TO OPERATE THE TUNNEL DIODE AS AN
OSCILLATOR OR AS AN AMPLIFIER
TUNNEL DIODES WERE POPULAR DUE TO LOW COST, DEEP ve RESISTANCE REGION &
SPEED OF OPERATION (ON/OFF TIME ~1nS)
OBJECTIVE : BASICS
P
FORBIDDEN
BAND
TUNNEL DIODE
N
CONDUCTION
BAND
EMPTY STATE
FILLED STATE
VALENCE
BAND
FORBIDDEN
BAND
EMPTY STATE
CONDUCTION BAND
ON n SIDE ALIGNED
TO VALENCE BAND OF p
SIDE CAUSING
TUNNELLING
CONDUCTION
BAND
FILLED STATE
VALENCE
BAND
@ < < CONDUCTION BAND OF n SIDE & VALENCE BAND OF p SIDE GET ALIGNED
CROSS OVER FROM n TO p SIDE REGISTERING CURRENT. THIS IS DUE TO QUANTUM
MECHANICAL TUNNELLING & NOT DUE TO CURRENT OVER POTENTIAL BARRIER
AS > THE BANDS CROSS EACH OTHER & CURRENT STARTS TO DROP UNTIL THEY
CROSS EACH OTHER COMPLETELY
@ > POTENTIAL BARRIER IS OVERCOME & FREE CONTRIBUTE TO CURRENT
OBJECTIVE : BASICS
P
FORBIDDEN
BAND
TUNNEL DIODE
N
CONDUCTION
BAND
EMPTY STATE
FILLED STATE
VALENCE
BAND
FORBIDDEN
BAND
EMPTY STATE
CONDUCTION BAND
ON n SIDE ALIGNED
TO VALENCE BAND OF p
SIDE CAUSING
TUNNELLING
CONDUCTION
BAND
FILLED STATE
VALENCE
BAND
THERE EXISTS A PROBABILITY THAT CARRIERS WILL CROSS THE BARRIER DUE TO
QUANTUM MECHANICAL EFFECTS AND IS WHERE & ARE
BARRIER ENERGY AND BARRIER WIDTH
FERMI LEVELS ARE NOT IN FORBIDDEN BAND DUE TO HIGH DOPING & TUNNELLING OF
WILL HAPPEN DUE @ < < ACROSS TO p TYPE TO FILL EMPTY VALENCE BAND
STATES @ SAME ENERGY LEVELS. INCREASES
@ FORWARD BIAS OF > TUNNELLING CURRENT STARTS TO DROP TILL >
TUNNEL DIODE
OBJECTIVE : VI CHARACTERISTICS
HIGH CONCENTRATION OF CARRIERS IN A OTHERWISE NORMAL DIODE
THIS DECREASES WIDTH OF THE DEPLETION REGION
TUNNEL DIODES HAVE ve RESISTANCE REGION & CONDUCT AS HIGH VALUE RESISTANCES
IN REVERSE BIAS
REVERSING OF CURRENT IS VERY FAST AND HENCE LENDS ITSELF TO RF APPLICATIONS
TUNNEL DIODE
OBJECTIVE : USE OF ve RESISTANCE REGION FOR OSCILLATIONS
d
R
a
SCHOTTKY DIODE
pn JUNCTION DIODE
SCHOTTKY DIODE
OBJECTIVE : BASICS
@ HIGHER FREQUENCIES, THE DIODE BIAS IS SWITCHED FROM FORWARD BIAS TO
REVERSE BIAS VERY FAST
DUE TO FINITE REVERSE RECOVERY TIME & THE PRESENCE OF DEPLETION LAYER,
NORMAL pn DIODE IS INCAPABLE OF SWITCHING OFF & PASSES APPRECIABLE CURRENT
IN THE ve RF CYCLE
SCHOTTKY DIODE IS A METAL-SEMI CONDUCTOR (n-TYPE) JUNCTION DIODE
MAJORITY CARRIERS IN BOTH METAL & n-TYPE MATERIAL ARE . HENCE NO
DEPLETION LAYER IS FORMED
ADDITIONALLY, THE CARRIERS ARE ALL & THERE IS NO RECOMBINATION.
HENCE, THE DIODE SWITCHES TO ON STATE AT VOLTAGES MUCH LESSER THAN THE
CONVENTIONAL pn DIODE
THERE IS ALSO NO CONDUCTION SEEN IN ve RF CYCLE (REVERSE BIAS) DUE TO NO
DEPLETION LAYER/STORED CHARGE. THIS ALLOWS FASTER OPERATION
SCHOTTKY DIODE
OBJECTIVE : BASICS
SCHOTTKY DIODES HAVE SMALLER DUE TO ABUNDANCE OF MAJORITY CARRIERS
THIS ENSURES LESSER DROP ACROSS DIODE AND MUCH LESSER HEATING AND LOWER
DEPENDENCE ON TEMP EFFECTS
SCHOTTKY DIODES ARE USED AS RECTIFIERS @ HIGH FREQUENCIES DUE TO THEIR FAST
SWITCHING
THEY ARE ALSO USED EXTENSIVELY AS DETECTORS AND MIXERS IN THE RF DOMAIN
THERE IS A PROBLEM OF FINITE REVERSE CURRENT
SCHOTTKY DIODE
OBJECTIVE : EXAMPLE OF APPLICATION AS DETECTOR
AT < , CHARACTERISTICS OF FWD BIASED DIODE IS APPROX PARABOLIC
HENCE, WHERE THE MICROWAVE SIGNAL IS = ()
CONSTANT
=
= = .
= +
+
CONDUCTING
PORTION
ENVELOPE OF AMPLITUDE
MODULATED RF SIGNAL
DETECTED o/p
TO CRO
MODULATED RF
IN WAVEGUIDE
SHORTED END
PHYSICAL MOUNT IN
WAVEGUIDE FOR DIODE
SCHOTTKY DIODE
OBJECTIVE : PRACTICAL ASPECTS IN APPLICATION AS DETECTOR
AT > , CHARACTERISTICS OF FWD BIASED DIODE DOES NOT FOLLOW SQUARE
LAW AND IS REQUIRED TO BE APPROPRIATELY ATTENUATED
NOTE THAT THERE IS NO BIASING CIRCUIT & THE DIODE IS JUST MOUNTED IN THE
WAVEGUIDE (REMEMBER REFLEX KLYSTRON EXPERIMENT IN THE LAB)
THE DIODE IS MOUNTED ON A STRUCTURE & REST OF THE WAVEGUIDE CONTAINS
MATCHING ELEMENTS TO KEEP < .
PIN DIODE
OBJECTIVE : EXTREMELY VERSATILE DIODE USED IN MICROWAVE & FIBER OPTICS
+
PIN DIODE HAS A LARGE INTRINSIC REGION ENCLOSED WITHIN HIGHLY DOPED p & n
REGIONS
IN pn JUNCTION DIODES, CHARGE IS STORED IN THE DEPLETION REGION WHICH
RECOMBINE DURING REVERSE BIAS CONDITIONS
DURING THE RECOMBINATION (REVERSE RECOVERY TIME) THE DIODE CONDUCTS
IN pn DIODES, THE REVERSE RECOVERY TIME IS OF THE ORDER OF , BUT IN PIN DIODES,
IT IS SEVERAL MAGNITUDES MORE
REMEMBER REVERSE RECOVERY TIME FROM DIODE THEORY WHICH IS A MEASURE OF THE
TIME IT TAKES TO REVERSE THE CARRIER CONCENTRATION IN THE DEPLETION REGION
SINUSOIDS ACROSS A DIODE ALTERNATELY FORWARD & REVERSE BIAS THE DIODE CAUSING
ALTERNATE CONDUCTION & NO CONDUCTION STATES
PIN DIODE
OBJECTIVE : EXTREMELY VERSATILE DIODE USED IN MICROWAVE & FIBER OPTICS
+
PIN DIODE
OBJECTIVE : PIN AS AN ATTENUATOR
UNDER FORWARD BIAS, CARRIERS ARE INJECTED ACROSS JUNCTIONS TO I REGION BUT DO
NOT RECOMBINE IMMEDIATELY (LOW RECOMBINATION TIME )
THIS RESULTS IN A STORED CHARGE
=
=
PIN DIODE
OBJECTIVE : RECAP
+
THE DIODE HAS A LARGE INTRINSIC REGION WITH HIGHLY DOPED p & n REGIONS
DUE TO THE LARGE INTRINSIC REGION IT PERFORMS POORLY AS A RECTIFIER BUT THERE
ARE OTHER APPLICATIONS
LARGE DEPLETION REGIONS UNDER FORWARD BIAS STARTS CONDUCTION VERY EARLY
(COMPARED TO OTHER DIODES) & IS THUS SUITABLE FOR HIGH FREQUENCY OPERATIONS
AT LOW FREQUENCIES, DEPLETION REGION CARRIERS GET NEUTRALISED; BUT @ RF, THERE
ISNT ENOUGH TIME FOR REMOVAL OF CHARGES (BUCKET ANALOGY).
REMEMBER REVERSE RECOVERY TIME FROM DIODE THEORY. HENCE, IT CONDUCTS
DURING THE ENTIRE RF CYCLE
HIGH FREQUENCY RESISTANCE IS INVERSELY PROPORTIONAL TO THE dc BIAS & VARYING
THE dc BIAS CAN CHANGE THE RESISTANCE. HENCE, THE PIN DIODE CAN BE USED AS A
VARIABLE ATTENUATOR
RF in
RF out
THE DIODE REMAINS IN OFF STATE OR ON DUE TO dc BIAS & ALLOW THE RF THROUGH IN
OFF STATE AND SHORT THE RF TO GROUND IN ON STATE
PIN DIODE
OBJECTIVE : PIN DIODE AS AN TR / ATR SWITCH
dc bias
A
TXR
c
/4
RXR
B
WHEN TXR IS TRANSMITTING AND RXR IS OFF
dc BIAS MAKES A & B FORWARD BIASED
/4 (QUARTER WAVE TRANSFORMER) INVERSES IMPEDANCE OF POINT d @ POINT c
THUS, POINT c LOOKS LIKE OPEN
ALL TRANSMIT POWER GOES TO THE ANTENNA & NONE TO THE RXR
AVALANCHE EFFECT
OBJECTIVE : HISTORY
READ PROPOSED THE READ DIODE (THEORETICAL) IN 1958
CONSISTS OF n+ p i p+ SEMICONDUCTOR DEVICE
DIODE OPERATED IN REVERSE BIAS CONDITION AT NEAR BREAKDOWN VOLTAGE
READ DIODE
AVALANCHE REGION
n+
INACTIVE REGION
p+
i (or v)
E
+
+
+
DOPING
LEVELS
1020
5 x 1016
1013
0.5
READ DIODE
OBJECTIVE : MECHANISM OF BREAKDOWN
DIODE IS REVERSE BIASED NEAR THE BREAKDOWN VOLTAGE
DIODE IS MOUNTED IN A RESONANT CAVITY
CAVITY IMPEDANCE IS MAINLY INDUCTIVE AND IS MATCHED TO THE CAPACITIVE DIODE
p REGION IS THIN COMPARED TO THE REST OF THE REGIONS. THIS IS THE HIGH FIELD OR
AVALANCHE REGION
THE i REGION IS CALLED THE DRIFT SPACE & i + p REGION IS SPACE CHARGE REGION
DURING AVALANCHE BREAKDOWN, HIGHEST FIELD OCCURS @ n+- p JUNCTION
THIS DROPS QUICKLY & REMAINS CONSTANT THROUGH THE i REGION WELL BELOW THE
BREAKDOWN VOLTAGE
CARRIERS (HOLES) IN THE HIGH FIELD REGION HAVE ENOUGH ENERGY TO KNOCK OUT
ELECTRONS TO THE CONDUCTION BAND CREATING ELECTRON HOLE PAIRS
MOVE TO THE n+ REGION AND HOLES DRIFT TO THE p+ REGION
READ DIODE
AVALANCHE REGION
INACTIVE REGION
RF
n+
p+
i (or v)
- +
- +
- +
DOPING
LEVELS
+
0 /2
3/2
EXTERNAL CURRENT
HOLE
CURRENT
/2 /2
READ DIODE
OBJECTIVE : MECHANISM OF BREAKDOWN
DURING +ve RF CYCLE, WHEN + > A VERY HIGH FIELD IS CREATED @ +
JUNCTION
READ DIODE
OBJECTIVE : MECHANISM OF BREAKDOWN
THE AVALANCHE MULTIPLICATION PROCESS STARTS @ = & REACHES A PEAK @
= /
BEYOND / , THE CURRENT DECAYS RAPIDLY.
THE CURRENT PULSE COMMENCES @ MAX RF CYCLE & REACHES ITS PEAK @ =
READ DIODE
OBJECTIVE : SUMMARY
DRIFT VELOCITY IS APPROXIMATELY 107 cm/s AND FIELD IS ABOUT 5 kV/cm
AVALANCHE MULTIPLICATION FACTOR =
= .
WHEN INCREASES, ENERGY OF OSCILLATION INCREASES FASTER THAN POWER
DELIVERED PER CYCLE AND OSCILLATOR OPERATES IN THE STABLE REGION
IMPATT DIODE
OBJECTIVE : POWER OUTPUT & EFFICIENCY
MAX VOLTAGE THAT CAN BE APPLIED ACROSS DIODE IS =
MAX CURRENT OF THE DIODE IS = = =
@ HIGHER
DUE TO AVALANCHE EFFECT IMPATT DIODES ARE NOISY ; GaAs BEING BETTER THAN Si
TRAPPATT ARE p+- n - n+ DIODES IN WHICH A PLASMA OF TRAPPED CHARGES ARE CREATED
THEY HAVE HIGHER EFFICIENCY, LOWER POWER AND LOWER FREQUENCY OF OPERATION
IMPATT DIODE
OBJECTIVE : PRACTICAL ASPECTS
MOST POWERFUL OSCILLATORS IN THE MICROWAVE DOMAIN UPTO kW
BREAKDOWN VOLTAGES OF THE ORDER OF 70 v REQUIRED & THIS MAY RESTRICT USAGE
TO APPLICATIONS THAT DO NOT HAVE WEIGHT / SPACE CONSTRAINTS
WHILE POWER IS HIGH, THERE IS A LOT OF PHASE NOISE AND IS LIKELY TO BE USED ONLY
IN TRANSMITTER SECTIONS RATHER THAN AS AN LO IN THE RECEIVER
IMPATT DIODE
OBJECTIVE : RECAP
BASED ON THREORETICAL READ DIODE
AVALANCHE BREAKDOWN OCCURS VERY NEAR THE p REGION
ELECTRIC FIELD AT p-n JUNCTION IS VERY HIGH AND CAUSES ACCELERATION OF CARRIERS
ACCELERATED CARRIERS COLLIDE WITH LATTICE STRUCTURE FREEING UP MORE CARRIERS
AND THE PROCESS CONTINUES EXPONENTIALLY AS LONG AS REVERSE BIAS IS ABOVE VB
dc BIAS IS VERY CLOSE TO VB & RF NOISE IN THE FREQUENCY OF INTEREST TAKES THE
DIODE ABOVE VB OR BELOW
THIS CAUSES CURRENT PULSES TO BE LAGGING VOLTAGE BY 180
DUE TO _ve RESISTANCE REGION, THE IMPATT MOUNTED IN A CAVITY CAN BE USED AS
AN OSCILLATOR (WITH TUNING OF CAVITY REACTANCE AT ZERO)
INPUT RF CAN ALSO BE AMPLIFIED USING AN IMPATT DIODE