MINDANAO STATE UNIVERSITY- ILIGAN INSITUTE OF TECHNOLOGY

DEPARTMENT OF CHEMICAL ENGINEERING AND TECHNOLOGY

ChET 171
STATISTICAL PROCESS CONTROL

GIO ALBERT G. BESA

PROF. CATHERINE OTERO ACIBAR

DECEMBER 02, 2015

I.

Introduction
Statistical process control (SPC) is a method of quality control which uses statistical
methods. SPC is applied in order to monitor and control a process. Monitoring and
controlling the process ensures that it operates at its full potential. At its full potential, the
process can make as much conforming product as possible with a minimum (if not an
elimination) of waste (rework or scrap). SPC can be applied to any process where the
"conforming product" (product meeting specifications) output can be measured. Key
tools used in SPC include control charts; a focus on continuous improvement; and the
design of experiments. An example of a process where SPC is applied is manufacturing
lines.

II.

Overview
Objective analysis of variation
SPC must be practiced in 2 phases: The first phase is the initial establishment of the
process, and the second phase is the regular production use of the process. In the second
phase, a decision of the period to be examined must be made, depending upon the change
in 4 - M conditions (Man, Machine, Material, Method) and wear rate of parts used in the
manufacturing process (machine parts, jigs, and fixture)
Emphasis on early detection
An advantage of SPC over other methods of quality control, such as "inspection", is that
it emphasizes early detection and prevention of problems, rather than the correction of
problems after they have occurred.
Increasing rate of production
In addition to reducing waste, SPC can lead to a reduction in the time required to produce
the product. SPC makes it less likely the finished product will need to be reworked.

III.

Key Tools used in Statistical Process Control

1) ISHIKAWA DIAGRAMS
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are causal diagrams created by Kaoru Ishikawa (1968) that show the causes of a
specific event. Common uses of the Ishikawa diagram are product design and quality

defect prevention to identify potential factors causing an overall effect. Each cause or
reason for imperfection is a source of variation. Causes are usually grouped into
major categories to identify these sources of variation.

2) CONTROL CHARTS
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also known as Shewhart charts (after Walter A. Shewhart) or process-behavior charts,

in statistical process control are tools used to determine if a manufacturing or business
process is in a state of statistical control.

3) RUN CHART

is a graph that displays observed data in a time sequence. Often, the data displayed
represent some aspect of the output or performance of a manufacturing or other business
process.

4) PARETO CHART
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named after Vilfredo Pareto, is a type of chart that contains both bars and a line graph,
where individual values are represented in descending order by bars, and the cumulative
total is represented by the line.

5) SCATTER DIAGRAM
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is a type of mathematical diagram using Cartesian coordinates to display values for

typically two variables for a set of data. If the points are color-coded you can increase the
number of displayed variables to three.