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L21 ECEN5827 Notes
L21 ECEN5827 Notes
Random mismatches
Sources of random mismatch include:
Edge effects (rough edges)
Material imperfections
Variations in mobility
Device mismatch parameters:
MOSFET
Threshold voltage Vt,
Conductance parameter K = (Cox/2)(W/L) = /2
Body effect parameter
Resistors
(resistivity)
Capacitors
Oxide thickness variation
Thethresholdvoltagesamongagroupoftransistors
hasaGaussianprofileaboutamean.Experimentally,
ithasbeenshownthatthedifferenceinthreshold
voltagesbetween2identicallysizedtransistors behavesas:
V
t
AVt
WL
Notethattoreducethemismatchbytakes4timesthearea
AfabwillcreateteststructuresandmeasureVt multipletimesperwaferforvarious
sizesoftransistorsandcollectongoingstatisticstomonitortheprocessovertime
ECEN4827/5827 Analog IC Design
Themismatchconstant,AVT,variesroughlylinearlywithprocesssize.Forpsubstrates,thePMOShas
AVT ~1.5*AVT NMOS.
ECEN4827/5827 Analog IC Design
WL
Typical A = 2%m
M4
M6
M1
M2
M8
M5
M7
-VSS
ECEN4827/5827 Analog IC Design
M4
M1
M2
-VSS
ECEN4827/5827 Analog IC Design
M4
M1
M2
-VSS
ECEN4827/5827 Analog IC Design
Current-Mirror Mismatch
+VDD
M3
M4
M1
M2
-VSS
ECEN4827/5827 Analog IC Design
Current-Mirror Mismatch
+VDD
M3
M4
M1
M2
-VSS
ECEN4827/5827 Analog IC Design
10
M4
M1
M2
-VSS
ECEN4827/5827 Analog IC Design
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M8
W=10u
L=2u
M5
M7
W=50u
W=250u
L=2u
L=2u
3.3V
VSG1 - |Vtp| = 2.37-1.65-0.62 = 0.1 Vs
M1
I1
.lib 5827_035.lib
W=50u
L=1u
M2
W=50u
1.65
L=1u
AC 1
1A
.op
out
Vp
C1
1
1pF
M3
W=10u
L=2u
M4
M6
W=10u
L=2u
W=100u
L=2u
V
t
AVt
WL
A
K
K
WL
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13
Normal distribution
ECEN4827/5827 Analog IC Design
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15
DC operating point
16
I D
VT 2
Vgs
gm
2
V
t
AVt
WL
16mVm
5.06mV
20 m * 0.5m
I D
.02m
2.5A
*
.28mV
A
gm
20m * 0.5m 55.8
V
Vgs
.28mV 2 5.06mV 2
5.07mV
17
.02 m
g m
VT
ID
2 m * 4 m
2
7.32 A
2.5A
23mVm
.025
2 m * 4 m
I D
* I D / g mN .025 * 2.5A / 55.8 A 1.12mV
V
ID
18
5.07mV 2 1.12mV 2
input pair
5.19mV
current mirror
Given a choice to add area to current mirrors or input pair, in this example,
more to be gained by using the area for the input pair.
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*in LTSpice, Monte Carlo simulations can be done using mc(x,y) function, which generates a random number
between x*(1+y) and x*(1-y) with uniform distribution
Models available for the 0.35u process do not include statistical parameters
ECEN4827/5827 Analog IC Design
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Normal distribution
ECEN4827/5827 Analog IC Design
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