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    4.6.2.2.6.2. Scanning Electron Microscope (SEM) : Identification of Microorganisms

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    The document describes the operation of a scanning electron microscope (SEM). It explains that the SEM forms images using electrons emitted from the surface of a specimen, rather than transmitted electrons like other electron microscopes. A diagram shows the primary electron beam sweeping across the specimen, knocking loose secondary electrons from its surface. These secondary electrons are detected and used to form magnified images with resolutions as small as 7 nm, allowing for detailed examination of microbial surfaces.

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    4.6.2.2.6.2. Scanning Electron Microscope (SEM) : Identification of Microorganisms

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    The document describes the operation of a scanning electron microscope (SEM). It explains that the SEM forms images using electrons emitted from the surface of a specimen, rather than transmitted electrons like other electron microscopes. A diagram shows the primary electron beam sweeping across the specimen, knocking loose secondary electrons from its surface. These secondary electrons are detected and used to form magnified images with resolutions as small as 7 nm, allowing for detailed examination of microbial surfaces.

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    The document describes the operation of a scanning electron microscope (SEM). It explains that the SEM forms images using electrons emitted from the surface of a specimen, rather than transmitted electrons like other electron microscopes. A diagram shows the primary electron beam sweeping across the specimen, knocking loose secondary electrons from its surface. These secondary electrons are detected and used to form magnified images with resolutions as small as 7 nm, allowing for detailed examination of microbial surfaces.

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    12 views1 page

    4.6.2.2.6.2. Scanning Electron Microscope (SEM) : Identification of Microorganisms

    Uploaded by

    weileng_weileng
    The document describes the operation of a scanning electron microscope (SEM). It explains that the SEM forms images using electrons emitted from the surface of a specimen, rather than transmitted electrons like other electron microscopes. A diagram shows the primary electron beam sweeping across the specimen, knocking loose secondary electrons from its surface. These secondary electrons are detected and used to form magnified images with resolutions as small as 7 nm, allowing for detailed examination of microbial surfaces.

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    IDENTIFICATION OF MICROORGANISMS 143

    (4) The specimen causes the scattering of electrons that are eventually gaining an entry through it.
    (5) The electron beam thus emerged is adequately focused by the aid of Electromagnetic
    Projector Lenses strategically positioned which ultimately forms an enlarged and distinctly visible
    image of the specimen upon a Fluorescent Screen (or Photographic Plate).
    (6) Specifically the appearance of a relatively denser region in the specimen helps to scatter
    much more electrons ; and, hence, may be viewed as darker zones in the image because only fewer
    electrons happen to touch that particular zone of the fluorescent screen (or photographic plate).
    (7) Finally, in a particular contrast situation, the electron-transparent zones are definitely
    brighter always. The screen may be removed and the image may be captured onto a photographic
    plate to obtain a permanent impression as a record.

    4.6.2.2.6.2. Scanning Electron Microscope (SEM)

    As it has been discussed under TEM that an image can be obtained from such radiation which
    has duly transmitted through a specimen. In a most recent technological advancement the Scanning
    Electron Microscope (SEM) has been developed whereby detailed in-depth examination of the sur-
    faces of various microorganisms can be accomplished with excellent ease and efficiency. In reality,
    the SEM markedly differs from several other electron microscopes wherein the image is duly obtained
    right from the electrons that are strategically emitted by the surface of an object in comparison to the
    transmitted electrons. Thus, there are quite a few SEMs which distinctly exhibit a resolution of 7 nm
    or even less.
    Fig. 4.10. duly depicts the diagramatic sketch fo a Scanning Electron Microscope (SEM) that
    vividly shows the primary electrons sweeping across the particular investigative specimen together
    with the knock electrons emerging from its surface. In actual practice, these secondary electrons (or

    Electron gun Primary electron beam

    Electromagnetic lenses
    Viewing
    screen

    Electron
    collector

    Secondary
    electrons

    Specimen

    Amplifier

    Fig. 4.10. Diagramatic Sketch of a Scanning Electron Microscope (SEM) : Depicting the
    Pathways of Electron Beams Utilized to form Images of the Investigative Specimens.

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