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Poster SIL
Poster SIL
RISK
to the gained improvement. (yrs) =1/MTBF (yrs) = DU/2 PFDavg
(Risk is undertaken only if As the risk is reduced, the less
proportionately, it is necessary to spend
SIL 3 10-4 and < 10-3 10000 to 1000 10-8 and < 10-7 Tx 102 0.00980 125 0.00800 0.0010 0.00080 0.000400 8% 2500 91.8 % SIL 2
a benefit is desired)
to reduce it further, to satisfy ALARP.
Barrier 314 0.00318 629 0.00159 0.0014 0.00019 0.000095 1.9 % 10526 94.0 % SIL 3
The concept of diminishing proportion is
shown by the triangle.
SIL 2 10-3 and < 10-2 1000 to 100 10-7 and < 10-6
PLC 685 0.00146 741 0.00135 0.0001 0.00001 0.000005 0.1 % 200000 99.3 % SIL 3
Broadly Acceptable Region It is necessary to maintain assurance
that risk remains at this level.
SIL 1 10-2 and < 10-1 100 to 10 10-6 and < 10-5
Valve 30 0.03330 60 0.01660 0.0083 0.00830 0.004100 83 % 244 73.8 % SIL 2
(No need for detailed working
Power
to demonstrate ALARP)
RISK IS
AVERAGE PROBABILITY OF FAILURE ON DEMAND Supply
167 0.00600 189 0.00530 0.0000 0.00070 0.000350 7% 2857 88.3 % SIL 3
1,3E-02
Residual Tolerable Without common causes With common causes (Beta factor) PFD PFDavg
EUC Risk SIL 1
Risk Risk
TI 1,0E-02
1oo1 DU not applicable
2
INCREASING RISK
2 7,5E-03
Boiling Liquid Expanding 1oo2 TI2 1- DU TI DU TI
Necessary risk reduction DU1 DU2
PFD
Vapor Explosion (BLEVE) +
1oo2D 3 3 2 SIL 2
Actual risk reduction 5,0E-03
3
Partial risk covered TI3 1- DU TI DU TI
by other technology Partial risk covered Partial risk covered 1oo3 DU1 DU2 DU3 + 2,5E-03
safety-related by E/E/PE by external risk 4 4 2
safety-related system reduction facilities
systems
DU TI SIL 3
DU + DU TI 0
Risk reduction achieved by all safety-related systems
2oo2 1- DU TI + 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
1 2
2 2 TI = 1 yr; Et = 100% TIME (years)
and external risk reduction systems
DU DU + DU DU
TI2
2 DU TI Note: The average probability of failure is strictly related to test interval (TI); increasing time
1- DU TI +
1 2 1 3
2oo3 between tests directly leads to higher probability of failures and therefore lower SIL levels.
SAFETY INTEGRITY LEVEL CALCULATION (IEC 61508-5 Annex D) +
DU2 DU3
3
2
1
MTBM (failure) 1oo1 1,0E-02
= S
MTBM + MSD 1oo1 1oo2 7,5E-03
SIL 2
Unavailability = 1- Availability = 1 5,0E-03
1oo2
RELIABILITY 2 S 2,5E-03
Acronyms: AVAILABILITY A V
MTBF: Mean Time Between Failures A o 0 SIL 3
MTTF: Mean Time To Failure
1 t 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
UNRELIABILITY 2oo2 B
i TIME (years)
MTTR: Mean Time To Repair UNAVAILABILITY 2 S 2 MTTR B TI = 1 yr; Et = 70%
MTBM: Mean Time Between Maintenance n
Success Failure C g When dealing with SIFs, safety engineers should pay special attention to the selection of the
MSD: Expected Mean System Downtime 1
: Failure rate MTTF sub-systems, the time interval between periodic tests and the system architecture.
2oo3
: Repair rate
MTTR 6 S 2 MTTR 2oo2 2oo3 A wise choice of these three key elements is what it takes to achieve the required SIL level.
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