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Capacitance and Dissipation Factor Measurements
Capacitance and Dissipation Factor Measurements
Capacitance and Dissipation Factor Measurements
Factor Measurements
Rene Seeberger
theoretical0models our:purpose.
0 0 0 0 0 ;Iw00 Iw
tan- IC and cos4 =I
;0000:Rp=R
-RR1++tan22
: 0 Rp
T passing t hr, ough the insulation is For a parallel equivalent circuit, it follows:
cl and a
tan 6- 1 * .-Reactance
sm0 ;all
dep
active 0 :current Ic
c,wh ereas th e
w1aqCp Rp =Resistance =- ZimZre
;latterrepresents:all capacitor losses depending on The electrical energy converted into heat inside the
thetvoltage. The lossesocceur on the surface and in dielectricum is P =- V X Iw; iand after some
0the intei:or ofthedieletic.The resistance :and the calculations:
minductanceVof the lead (dotteddline in Fig. 1) are
Bridges Measure
Capacitance and Dissipation
Factor
General Considerations
Electric measuring bridges usually have two
fixed bridge arms containing the test object and
standard, as well as two adjustable bridge arms for
amplitude and phase balancing.
There are also measuring bridges for the com-
parison of inductances with capacitances or resis-
tances. Due to their frequency-dependence, their
application is somewhat limited.
In general, measuring bridges do not lend them-
selves to the comparison of impedances with large
phase angle differences; use of a vector voltmeter is
recommended in these cases. The read-out of the
measuring bridge depends on an adequate measur-
ing voltage. The maximum permissible measuring
voltage is determined by thermal load and electric
stress ofthe bridge components. If the measurement
sensitivity is insufficient, it can normally be im-
proved by stepping up the frequency.
The sensitivity of the measuring bridge is the
Call for Papers 1986 IEEE Conference on Electrical Insulation and Dielectric Phenomena
The 1986 Conference on Electrical Insulation and Dielectric quent publication elsewhere of completed work is encouraged. Ac-
Phenomena will take place November 2-6, 1986 at the Hilton Hotel, ceptance or rejection notices will be mailed out before May 1, 1986,
Claymont, DE. Copies of the program and registration informa- to authors of submitted abstracts. Detailed guidelines for the
tion will be available in August. preparation of manuscripts will be sent to authors of accepted
The Conference is organized into separate sessions devoted to abstracts.
a broad range of topics related to electrical insulation and dielec- As this is a participatory conference where interaction is
tric phenomena. The 1986 Whitehead Memorial Lecturer will be necessary, a paper will not be read or discussed if the author does
Prof. M. Ieda who will speak on "In pursuit of better electrically not attend the meeting. Authors who submit papers but fail to
insulating solid polymers: present status and future trends." register for the meeting will be charged a fee of U.S. $40.00 to
In 1986, the Conference will continue to emphasize studies which cover publication costs. Moreover, failure to attend the mneeting
link theoretical and experimental work. Papers on all traditional after submission of a paper may adversely affect future paper ac-
topics treated in past conferences are welcome. Recent session topics ceptance. In the event that more high-quality papers are received
include: breakdown phenomena in solid, liquid, gas, and vacuum; than can be accommodated, authors whose names appear on more
charge storage and transport; prebreakdown, partial discharge, and than one paper may be limited to presenting only one paper.
treeing; dielectric aging; polarization phenomena; and dielectric Manuscripts of accepted papers are unlikely to be published in the CEIDP
analysis and measurements. Papers on liquid-flow electrification, Annual Report (distributed at the meeting) if received after July 11, 1986.
and on the formation and properties of plasma-formed dielectric Papers should be restricted to six manuscript pages, includingfigures. A charge
films, will be particularly welcome. of U.S. $50/page will be incurred for pages in excess of this number.
Following successful experience of past conferences, one or more
topics will be organized into poster sessions where experimental 1986 CEIDP Conference
equipment can be demonstrated. Posters will be displayed for the Location: Hilton Hotel, Clayton, Delaware
duration of the Conference. For presented papers, 20 minutes are Dates: November 2-6, 1986
allotted to each paper (15 minutes presentation and 5 minutes Abstracts: <200 words due April 1, 1986
discussion). Notification of acceptance or rejection of Abstracts
You are invited to submit an abstract of not more than 200 words; will be mailed out by: May 1, 1986
the deadline for receipt is April 1, 1986. One copy of the title and
abstract, together with the corresponding author's name, affiliation, Send manu'scripts to:
telephone number, telex number, and mailing address should be sent to Mr. Roy E. Wooton (501-3W69)
Mr. R. E. Wootton, Program Chairman (address below). Westinghouse Research and Development Center
Conference policy requires that papers be limited to subject mat- 1310 Beulah Road
ter of scientific and technical interest. Contributors are encourag- Pittsburgh, PA 15235, USA
ed to report on their latest work, including work in progress. Subse- TELEX Number: 703669
Telephone Number: (412) 256-2108