Professional Documents
Culture Documents
Mev Cm2/Mg (I.E., Mev/Cm Divided by Mg/Cm2)
Mev Cm2/Mg (I.E., Mev/Cm Divided by Mg/Cm2)
Mev Cm2/Mg (I.E., Mev/Cm Divided by Mg/Cm2)
SEU Single Event Upset: Storage element state change may affect a single bit or multiple bits.
LET is strictly defined in terms of energy divided by distance, e.g., MeV/cm, eV/nm, keV/nm.
However, since the energy lost is directly proportional to the density of the material
traversed, it is useful to divide the LET by the density of the material.
SET: Single Event Transient: A glitch caused by single event effect, which travels through
combinational logic and is captured into storage element.
SEU Single Event Upset: Storage element state change may affect a single bit or multiple bits.