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Parameter Identification Techniques Applied To Dynamic MOSA Models
Parameter Identification Techniques Applied To Dynamic MOSA Models
Parameter Identification Techniques Applied To Dynamic MOSA Models
Abstract: The metal-oxide surge arresters (MOSA) are filter has a low impedance and the nonlinear resistances AO and
equipment used in power systems protection against several kinds A1 are essentially in parallel. However, for fast-front surges the
of surges. They decisively contribute for the increase of the R-L filter has a high impedance. Consequently, the current is
reliability, economy and continuity of the system operation, which
forced to pass through the non-linear resistance AO more
they protect. Due to the importance of the MOSA for the electrical
intensely than through the non-linear resistance A1. Because
systems, several models have been proposed to represent the
MOSA behavior under overvoltages. The majority of the existing
AO has a higher voltage characteristic than Al (as shown in
models employ empirical adjustment procedures for Fig. 2), the result is that the model generates a higher voltage
determination of models' parameters. So, a comparative study for fast transients. This characteristic generates the dynamic
about numerical techniques applied to parameter identification of effect of the model. The inductance LO is the inductance
metal-oxide surge arrester models is presented. These techniques associated with magnetic fields nearby the surge arrester, the
are based on the fitting of the residual voltages measured and capacitance CO simulates the capacitive effect of the surge
obtained from the surge arrester models, from the 10 kA lightning arrester and resistance RO is used to avoid numerical instability
current impulse (wave shape 8/20 Jls). Optimization algorithms
during the model simulation.
with characteristics of global convergence were evaluated. The
To determine models parameters values, the initial guess are
employed procedures have provided good results, showing that it
is more accurate to apply optimization algorithms to identify the
suggested [1]:
MOSA models parameters than empirical procedures, thus L1 lSdjn;
= (1)
increasing the reliability of the modeling process. R1 6Sdjn;
= (2)
LO O.2djn;
= (3)
I. INTRODUCTION
RO 100djn;
= (4)
The metal oxide surge arresters (MOSA) are equipment used CO 100njd;
= (5)
to protect power systems, especially against switching and
where d is the estimated height of the arrester in meters n is the
lightning surges. Therefore, MOSA are indispensable because
number of parallel columns of the arrester.
they prevent damage at other equipment, such as transformers,
and thus helping to avoid the discontinuity of the system A. Numerical Solution a/the IEEE MOSA Model
servIce. Before applying the parameter identification techniques
Due to the impossibility to test the arrester in real operating presented in this paper it is necessary to solve the IEEE model
conditions, since a power system may not have its operation circuit and thus obtain the voltage Vl(tJ for the 10 kA lighting
interrupted and major equipment could be damaged, there is an impulse current i(t). The circuit shown in Fig. 1 was solved by
enormous necessity of establishing the electric models that the discretization of the differential equations of the elements,
represent the MOSA behavior. Therefore, events that happen in using the trapezoidal rule, as presented in [2].
reality can be simulated and thus it can get an idea of how the The nonlinear resistances were represented by the piecewise
arrester behavior. linear approximation method. This method consists in to
Several models can be found in the literature and each one approximate the characteristic curve of a non-linear resistance
has a special procedure for the estimation of its parameters, but
most procedures is based on experimentation, i.e., no
mathematical formalization is performed. Thus, in this paper
selected effective techniques for identifying parameters of
MOSA models are presented.
the equivalent discrete circuit. is the vector of residual voltages measured and V1 is the
To solve the circuit in Fig. 3, the node voltages method was residual voltage signal obtained from IEEE model and
used and it was obtained the following equation system, as calculated according to the method shown in Section II-A .
shown in [2, 3]: To minimize the function [(x), the shuffled complex method
[4] was used, which will be discussed in the next section.
(6)
where: A. Shujjled Complex Evolution Method [4]
G is the nodal conductance matrix (p -l) x (p -l) (p is the The shuffled complex evolution method is a global
number of nodes of the circuit), whose elements Gii are equal to optimization strategy based on four concepts: (1) combination
the sum of the incident conductances in the node i, while the of probabilistic and deterministic approaches; (2) clustering; (3)
elements Gij correspond to the negative of the equivalent systematic evolution of a complex of points; (4) competitive
conductance between the nodes i and}; evolution. The method flowchart is shown in Fig. 4.
vet) is the vector of the unknown nodal voltages, with The method's philosophy is compared to the process of
dimension (P-l); natural evolution. Firstly, a population of points is randomly
ic(t) is the vector of dimension (p -l) , whose elements are generated in the feasible space and the function value at each
equal to the algebraic sum of the known current sources point is calculated. Then, the points are sorted in order of
connected to each node; increasing function value. The next step is to partition the
Ih(t-dt) is the vector of dimension (p -l) , whose elements are population into complexes (communities) and each one is
equal to the algebraic sum of the "historical" current sources evolved independently by an algorithm called competitive
connected to each node. complex evolution (CCE) that is based on the NeIder and Mead
For the circuit in Fig. 3, these terms are given as follows. simplex method [5]. Each community can generate offspring
(new points) from a subcomplex selected according to a
G=
probability distribution that favors the best points. The new
1 1 1 1
+- - - o offspring replaces the worst point of the subcomplex. After
Ro RLO RO RLO
- - -
(7)
(8)
w
C)
[i
=
ic(t) 1 (t) ] IRAO , (9)
>
1
[
-ho(t-M)
I RA
(13)
m
where VI and vm were defined in the last paragraph;
Ec - Em
Een = X 100% (IS)
Em
J
Figure 6. Measured and calculated residual voltages for the first estimate. Figure 8. Measured and calculated residual voltages for the third estimate.
V. CONCLUSIONS