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A 0.52/1 V Fast Lock-In ADPLL For Supporting Dynamic Voltage and Frequency Scaling
A 0.52/1 V Fast Lock-In ADPLL For Supporting Dynamic Voltage and Frequency Scaling
A 0.52/1 V Fast Lock-In ADPLL For Supporting Dynamic Voltage and Frequency Scaling
1, JANUARY 2016
Fig. 4. Proposed cyclic-TDC-embedded DCO. procedure within four clock cycles, the Enable_DCO signal is pulled
up for one half of the REF_CLK period. As a result, the output
cycle, the state is changed to PIPE_2 and the initial code of the DCO of the cyclic TDC should be multiplied by 2 and then denoted
(init_code) is calculated using (4). as TDC_code[16:0].
Fig. 4 shows the Rmin calculation in the case when the half period
of the reference clock (REF_CLK) is less than the delay time of
III. C IRCUIT I MPLEMENTATION
the full coarse-tuning delay line. When both Enable_TDC signal and
Fig. 4 shows the circuit diagram of the proposed cyclic Enable_DCO signal are pulled up at the negative edge of REF_CLK,
TDC-embedded DCO, which is composed of a coarse-tuning stage, the DCO begins to oscillate, and the 1 on the OUT_CLK node is
a fine-tuning stage [18], and an embedded cyclic TDC for computing propagated to the NAND gate delay chain. After the half cycle of
the period ratios (Rmax and Rmin ). The coarse-tuning stage of the REF_CLK, the node voltage values of the CDCs are sampled by
DCO consists of 64 coarse-tuning delay cells (CDCs), and the the pulse-latch DFFs as LAT_code[63:0]. The TDC_Encoder encodes
coarse-tuning step is the delay time of two NAND gates. The cyclic the number of 1s in the LAT_code[63:0] as a 7-bit TDC fractional
TDC is composed of 65 pulse-latch DFFs [19] at the output node number (TDC_Frac[6:0]).
of the NAND gates, a cyclic counter, and a TDC encoder. The As shown in Fig. 3, when the state of the ADPLL controller
TDC resolution is equal to the delay time of two NAND gates is changed to R_MAX, the DCO control code is set to 2047 for
or the coarse-tuning resolution of the DCO. The DCO_Decoder calculating the value of Rmax . Therefore, all the CDCs are disabled
decodes the binary 11-bit DCO_code[10:0] into the coarse-tuning and OUT_CLK triggers the cyclic counter to obtain a 9-bit TDC
and fine-tuning thermometer codes. The TDC_Encoder encodes the integer number (TDC_Int[8:0]). At the positive edge of TDC_CLK,
65-bit thermometer code sampled by the pulse-latch DFFs into a the TDC_code[16:0] = {TDC_Int[8:0], 7h0, 1b0} is outputted as
7-bit TDC fractional number (TDC_Frac[6:0]) and the cyclic counter the period ratio Rmax .
outputs a 9-bit TDC integer number (TDC_Int[8:0]). The frequency finder, the digital loop filter, and the ADPLL
The fine-tuning stage of the DCO [18] is composed of two controller are designed with hardware description language. After
parallelly connected tristate buffer arrays operating as an interpolator. logic synthesis, these circuits are mapped to logic gates, and the
By adjusting the number of turned- ON tristate buffers in the arrays, other blocks are also implemented with standard cells. In addition,
the resolution of the fine-tuning stage can be enhanced to 1/32 that pulse-latch DFFs [19] are employed in the frequency divider and the
of the coarse-tuning step. The fine-tuning stage can maintain a PFD design. In the proposed PFD [12], the dead zone of the PFD is
monotonic response between the DCO control code and the output reduced from 107 to 26 ps at 0.52 V.
frequency under PVT variations. In addition, the simulated maximum
differential nonlinearity is 0.42 least significant bit.
IV. E XPERIMENTAL R ESULTS
The proposed ADPLL uses a cyclic TDC-embedded DCO to
compute the fixed-point values of Rmax and Rmin for calculating the The proposed ADPLL is implemented using a standard perfor-
target DCO control code (init_code). As shown in Figs. 3 and 4, mance 90-nm CMOS process. The micrograph of the test chip is
at the initial state, the state of the ADPLL controller is RESET shown in Fig. 5. The active area is 250 250 m2 and the chip
and both Enable_TDC signal and Enable_DCO signal are set to area including the I/O pads is 864 864 m2 . The output frequency
zero to gate the TDC_CLK signal; further, and all the CDCs are ranges from 60 to 600 MHz at 1 V, and from 30 to 120 MHz at 0.52 V.
enabled and initialized. In the next REF_CLK cycle, the state of The power consumption of the proposed ADPLL is 0.92 mW at
the ADPLL controller is changed to R_MIN and both Enable_TDC (1 V, 600 MHz) and 37 W at (0.52 V, 120 MHz).
signal and Enable_DCO signal are pulled up at the negative edge Fig. 6 shows the measured jitter histogram of the output clock
of the REF_CLK. The Enable_DCO signal is pulled up for one at (0.52 V, 120 MHz). The peak-to-peak (PK PK ) jitter is 155 ps,
half of the REF_CLK period. In the next positive edge of the and the root mean square (rms) jitter is 26.8 ps. Due to the speed
REF_CLK, the node voltage values of the CDCs are sampled by limitations of the I/O pad, the output clock is divided by 2 before
the pulse-latch DFFs. Then, the Enable_DCO signal is set to zero it is outputted to the I/O pad. The PK PK jitter at (1 V, 600 MHz)
again to initialize all the CDCs for the subsequent Rmax calculation. is 102 ps, and the rms jitter is 13.7 ps. At low supply voltages,
As shown in (1), the period ratio between the reference the DCO resolution and the PFD dead zone worsen, and, therefore,
clock (REF_CLK) and the maximum output period of the output the jitter performance of the ADPLL at 0.52 V is worse than that
clock (OUT_CLK) is Rmin . To pipeline the initial code calculation at 1 V. Moreover, the maximum output frequency of the ADPLL
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, VOL. 24, NO. 1, JANUARY 2016 411
TABLE I
P ERFORMANCE C OMPARISONS
V. C ONCLUSION
In this brief, a fast lock-in ADPLL for smart sensing applica-
tions employing DVFS power management has been proposed. The
proposed frequency estimation algorithm can use the period ratios
calculated by the cyclic TDC to compute the initial DCO control
code for achieving a fast setting time within four clock cycles.
Fig. 7. Measured lock-in process of the proposed ADPLL.
In addition, the interpolator-based fine-tuning stage can maintain a
monotonic response of the DCO either at 1 or 0.52 V. Pulse-latch
also reduces at 0.52 V. Fig. 7 shows the measured lock-in process DFFs are applied to the design of the frequency divider and
of the proposed ADPLL at 1 V. The reference clock is 3 MHz, PFD to improve the performance of the ADPLL at low supply
the frequency multiplication ratio (M) is 32, and thus, the output voltages. Furthermore, the proposed ADPLL has good portability
412 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, VOL. 24, NO. 1, JANUARY 2016
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