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MFM
MFM
TN00031, R1
Preliminary steps
This technical note is an guide to MFM imaging with the EasyScan 2 and
Mobile S AFM systems.
Requirements
Equipment
EasyScan 2 with extension and dynamic modules, or Mobile S AFM
Software version 1.5 or higher
Magnetic Probe: Nanoworld MFMR or Applied Nanotech MAGT
Strong permanent magnets
Knowledge
Dynamic mode AFM
Theoretical Background
The aim of Magnetic force microscopy (MFM) is to image a spatial distri-
bution of a magnetic field. Usual samples for MFM can be magnetic tapes,
hard disks and magneto-optical disks.
FT = n ( n FM )
FT
n Cantilever
FM
Sample
magnetic
FM field lines
Sample
Contrast
The magnetic filed influences the spring constant of the cantilever probe in
the following way:
k o = k F T'
where k is the original spring constant. Therefore a force gradient pointing
away from the tip decreases the spring constant and a force gradient point-
ing towards the tip increases the spring constant. Like in dynamic mode,
this can be related to a decrease in topography for the lower spring constant
and an increase in height for a higher spring constant.he effect of the mag-
netic force on the amplitude and phase signal are also comparable to the
dynamic mode topography imaging. For the amplitude the change of the
spring constant induces a shift of the resonance peak and the difference in
f0' f0
f0' f0
shift
shift
Amplitude
phase shift
attenution
Phase
frequency
frequency bla
Amplitude and Phase Shift: Left: The magnetic tip sample interaction influences the spring
constant of the cantilever probe ant provokes a shift in the resonance frequency. The resonance
shift can be detected in the amplitude signal. Right: The magnetic tip sample interaction
influences the spring constant of the cantilever probe and provokes a shift in the resonance
frequency. This shift is related to the phase shift.
Technical Implementation
The most important change compared to the standard dynamic mode is
that the probe needs to be scanned at a defined distance above the surface.
This has been implemented in the following way:
As shown in figure Implementation (p.4) at every line start (forward and
backward scan) a spectroscopy is performed. Based on that the distance at
which the probe will be scanned is calibrated. The probe is then lifted at the
chosen height and linearly scanned over the sample surface. The feedback
is switched off.
x
linear line scan
displacement
from sample
z
sample
Caution
Like in spectroscopy, the distance is always seen from the tip, i.e. a negative
value means a displacement upwards as the tip is then moving away (back-
wards) from he surface. Entering a positive value could crash the tip into
the sample.
Usually new MFM cantilevers are not magnetised. Thus we need to mag-
netise the tip with a strong permanent magnet as show in figure Magnetisa-
tion of the Tip (p.5):
Auto Start: Stopping the auto. start scanning in the positioning window.
Clear the check box Enable Constant Height mode as shown in figure
Constant Height Mode (p.7), i.e. that the constant height mode is
switched off. Otherwise the feedback is disabled and the tip could be
harmed.
Approach the surface.
Caution
Only scan a few topography lines to correct the tilt. Scanning to long in
contact might harm the magnetic layer and demagnetize the tip.
Attention
A negative value means a displacement away from the surface. A positive
value will crash the tip into the sample.
Activate the constant height mode by checking the box Enable Constant
Height Mode shown in figure Constant Height Mode (p.7).
Decrease the distance manually until you reach the optimum contrast, an
example is given in the chapter Example Measurement and Hints (p.10).
Vibration Amplitude: Left: This image was recorded with 30nm (150mV) vibration amplitude
and shows a higher resolution and a lower contrast compared to the image on the right. Right:
This image was recorded with 80nm (400mV) vibration amplitude and shows a lower resolution
but a higher contrast compared to the image on the left.
Scanning Distance: Top Left: Magnetic contrast increased when the distance to the sample was
decreased. Top Right: When the surface topography gets visible in the phase scan, you are probably
scanning to near. Bottom Left: Here the topography and some dirt particles are visible in the phase
scan. Also here the distance was to small. Bottom Right: Topography of the HD sample.
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2006 NANOSURF AG, SWITZERLAND, TN00031, R1 PAGE 11 OF 11