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S e N S o R S & T R A N S D U C e R S
S e N S o R S & T R A N S D U C e R S
S e N S o R S & T R A N S D U C e R S
162-169
Abstract: A new fault diagnosis method is proposed in this paper to overcome the shortcomings of the
traditional methods for insulated gate bipolar transistor (IGBT) open-circuit fault diagnosis such as long time
need and sensitive to load change. An experiment platform of the 660 V H-bridge static synchronous
compensator (STATCOM) is built to test the proposed method. For the H-bridge structure is easy to realize the
capacitor voltage balance, the average value of the three phase capacitor voltage is selected as the original signal
to avoid the misdiagnosis of load change. The features of the original signal are extracted by using the theory of
wavelet packet transform. Dimensionality reduction method based on kernel principal component analysis
(KPCA) is chosen to improve the diagnosis speed. Finally, the fault classifier is constructed via the least squares
support vector machine (LS-SVM). The test results show that the method has good accuracy and real-time
performance. Copyright 2013 IFSA.