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The Principal of Built
The Principal of Built
complex, mixed-signal electronic systems, such as integrated circuits (IC s) and multifractional
instrumentation [1]. A system with BIT is characterized by its ability to identify its operation condition
by itself, through the testing and diagnosis capabilities built into its in structure. To ensure reliable
performance, testability needs to be incorporated into the early stage of system and product design.
Various techniques have been developed over the past decades to implement the BIT technique. In the
semiconductor, the objective of applying BIT is to improve the yield of chip fabrication, enable robust
and efficient chip testing and better scope with the increasing circuit complexity and integration
density. This has been achieved by having an IC chip generate its own test stimuli and measure the
corresponding responses from the various elements within the chip to determine its condition. In
recent years, BIT has seen increasing applications in other branches of industry, eg. manufacturing,
aerospace and transportation and for the purposes of system condition monitoring. In manufacturing
systems, BIT facilitates automatic detection of toolwear and breakage and assists in corrective actions
to ensure part quality and reduce machine downtime.
2. BIT TECHNIQUES
BIT techniques are classified:
a. on-line BIT
b. off-line BIT
On-line BIT:
It includes concurrent and nonconcurrent techniques. Testing occurs during normal functional
operation.
Concurrent on-line BIST - Testing occurs simultaneously with normal operation mode, usually coding
techniques or duplication and comparison are used. [3]
Nonconcurrent on-line BIST - testing is carried out while a system is in an idle state, often by executing
diagnostic software or firmware routines
Off-line BIT:
System is not in its normal working mode it usually uses onchip test generators and output response
analysers or micro diagnostic routines. Functional off-line BIT is based on a functional description of
the Component Under Test (CUT) and uses functional high-level fault models.
Structural off-line BIT is based on the structure of the CUT and uses structural fault models.