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    Scanning Electron Microscope (Sem) : Make Model Magnification Specimen Size Accelerating Voltage Resolution Attachments

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    Pavan Kumar Narendra
    The scanning electron microscope has a magnification range of 30x to 300,000x, can accommodate sample diameters up to 150mm, and operates with an accelerating voltage between 0.3-30kV. It has a resolution of 3.5nm at 25kV and includes energy-dispersive X-ray spectroscopy and backscattered electron detector attachments. The microscope also features an image management system, network connectivity, and is used to study surface morphology and crystallographic orientation of samples.

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    Scanning Electron Microscope (Sem) : Make Model Magnification Specimen Size Accelerating Voltage Resolution Attachments

    Uploaded by

    Pavan Kumar Narendra
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    The scanning electron microscope has a magnification range of 30x to 300,000x, can accommodate sample diameters up to 150mm, and operates with an accelerating voltage between 0.3-30kV. It has a resolution of 3.5nm at 25kV and includes energy-dispersive X-ray spectroscopy and backscattered electron detector attachments. The microscope also features an image management system, network connectivity, and is used to study surface morphology and crystallographic orientation of samples.

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    Sem

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    The scanning electron microscope has a magnification range of 30x to 300,000x, can accommodate sample diameters up to 150mm, and operates with an accelerating voltage between 0.3-30kV. It has a resolution of 3.5nm at 25kV and includes energy-dispersive X-ray spectroscopy and backscattered electron detector attachments. The microscope also features an image management system, network connectivity, and is used to study surface morphology and crystallographic orientation of samples.

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    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Flag for inappropriate content
    Download as pdf or txt
    5 views1 page

    Scanning Electron Microscope (Sem) : Make Model Magnification Specimen Size Accelerating Voltage Resolution Attachments

    Uploaded by

    Pavan Kumar Narendra
    The scanning electron microscope has a magnification range of 30x to 300,000x, can accommodate sample diameters up to 150mm, and operates with an accelerating voltage between 0.3-30kV. It has a resolution of 3.5nm at 25kV and includes energy-dispersive X-ray spectroscopy and backscattered electron detector attachments. The microscope also features an image management system, network connectivity, and is used to study surface morphology and crystallographic orientation of samples.

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    © All Rights Reserved
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    SCANNING ELECTRON MICROSCOPE(SEM)

    Make : TESCAN
    Model : VEGA3
    Magnification: x 30 – x 3, 00,000
    Specimen size: Max. 150 mm diameter
    Accelerating voltage: 0.3 – 30 kV
    Resolution : 3.5 nm @ 25kV high vacuum mode
    Attachments : Energy-dispersive X-ray. Spectroscopy (EDS) &
    Backscattered Electron Detector (BSED)

    True Windows NT environment:


    - Image management system for image processing, searching and archiving
    - Network capability to transfer SEM images and data to external PCs and servers

    Applications:
    - To study surface morphology of samples
    - Evaluation of crystallographic orientation

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