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Vol. 20, No.

4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006

2007 NCSL International Workshop & Symposium


St. Paul RiverCentre, St. Paul, Minnesota
July 29 ~ August 2, 2007
(303) 440-3339

2007 Measurement Science Conference (MSC) DeWayne Byrle Sharp


Long Beach Convention Center, Long Beach, California
January 22 ~ 26, 2007 August 12, 1926 - October 31, 2006
(866) 672-6327 The Standard’s Founding Editor
The Standard TABLE OF CONTENTS
Vol 20, No. 4, December 2006 Letter’s to the Editor .......................................................................4
Chair’s Column...............................................................................5
Managing Editor and Publisher
Jay L. Bucher
Chair-Elect’s Column .....................................................................6
6700 Royal View Dr. Financial Report..............................................................................6
De Forest, WI 53532-2775 Demistifying Test Uncertainty Ratios ............................................7
Voice: 608-277-2522 CCT Exam Review Workshop........................................................8
Fax: 608-846-4269 The Learning Curve ......................................................................11
Email: yokota-69@charter.net
or jay.bucher@promega.com
Defining “A Professional” - A personal letter from Phil Painchaud
to Dr. Eugene Watson (1994) .................................................15
Advertising The Learning Curve ......................................................................22
Submit your draft copy to Jay Bucher, with a DeWayne Burle Sharp (Obituary) ................................................27
request for a quotation. Indicate size desired. Book Review.................................................................................31
Since The Standard is published ‘in-house’ NCSL International Workshop & Symposium 2007 info.............34
the requester must submit a photo or graphic
of their logo, if applicable. The following
MQD Officers and Committee Chairs ..........................................35
rates apply: MQD Regional Councilors …………………………………… ..36
Business card size ............................ $100 ASQ Southwest Conference: Seven Basic Quality Tools.............38
1/8 page .......................................... $150 New Books From ASQ Quality Press...........................................41
1/4 page ........................................... $200 MSC 2007 Brochure .....................................................................43
1/3 page ........................................... $250
½ page ............................................. $300
Full page ......................................... $550 FROM THE DESK OF THE EDITOR/PUBLISHER
Advertisements will be accepted on a ‘per
issue’ basis only; no long-term contracts will
On behalf of the officers and committee chairs of
be available at present. Advertising must be MQD, I’d like to express our condolences to the
clearly distinguished as an ad. Ads must be Sharp family. DeWayne, The Standard’s founding
related to measurement quality, quality of editor passed away on October 31st, 2006. Phil P.
measurement, or a related quality field. Ads has graciously provided an obituary in this edition.
must not imply endorsement by the Measure-
ment Quality Division or ASQ. In case all of our illustrious CCT recipients have not
gotten the word, additional CCT challenge coins can be purchased (a limit
Letters to the Editor of 2 extra coins) at a cost of $15.00 per coin. This can be accomplished by
The Standard welcomes letters from mem-
sending me (in the capacity of MQD Treasurer) your name, address, CCT
bers and subscribers. Letters should clearly
state whether the author is expressing opin- certification number, and the exact amount in the form of a check or money
ion or presenting facts with supporting infor- order made out to Measurement Quality Division. Please include your
mation. Commendation, encouragement, email address in case there are any questions.
constructive critique, suggestions, and alter-
native approaches are accepted. If the con- HAPPY HOLIDAYS
tent is more than 200 words, we may delete
portions to hold that limit. We reserve the The Standard is published quarterly by the Measurement Quality Division of
right to edit letters and papers. ASQ; deadlines are February 15, May 15, August 15 and November 15. Text infor-
mation intended for publication can be sent via electronic mail as an attachment in
Information for Authors MS Word format (Times New Roman, 11 pt). Use single spacing between sen-
The Standard publishes papers on the qual- tences. Graphics/illustrations must be sent as a separate attachment, in jpg format.
ity of measurements and the measurement of Photographs of MQD activities are always welcome. Publication of articles, prod-
quality at all levels ranging from relatively uct releases, advertisements or technical information does not imply endorsement
simple tutorial material to state-of-the-art. by MQD or ASQ. While The Standard makes every effort to ensure the accuracy
Papers published in The Standard are not
of articles, the publication disclaims responsibility for statements of fact or opinion
referred in the usual sense, except to ascer-
tain that facts are correctly stated and to as- made by the authors or other contributors. Material from The Standard may not be
sure that opinion and fact are clearly distin- reproduced without permission of ASQ. Copyrights in the United States and all
guished one from another. The Editor re- other countries are reserved. Website information: MQD’s homepage can be found
serves the right to edit any paper. at http://www.asq.org/measure. © 2006 ASQ, MQD. All rights reserved.
MQD Page 3

Why doesn’t anyone I’m getting tired


send in new ideas for of seeing the same
articles, or suggestions for stuff month after
topics of discussion? month, and year
after year.

I’ve got an idea —


why not ask the
readers for their
suggestions…
ain’t I smart?

You think you have it bad? I


have to live with these three.
How about helping all of us out
and submit your ideas for topics,
or articles that you have written,
or ones that you have read and
think our readers might enjoy.
We appreciate all the help we
can get. All you have to do is
send them as an attachment
to the editor. Thank you.

Drawings courtesy of
a.Yumi
Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 4

Letters to the Editor


The following letter was received after the Septem- Here’s my reply:
ber 2006 edition of The Standard:
Phil, I’ve copied Chris on your email, which I find
Mr. Bucher, both informative and very enlightening. Unfortu-
nately, my new book, The Quality Calibration
Chris Grachanen’s article on the Unwritten Cali- Handbook, Developing and Managing a Calibra-
bration Technique was exactly the same situation tion Program (http://qualitypress.asq.org/perl/
my company recently encountered. My research catalog.cgi?item=H1293) does not have enough of
into finding documentation of this technique also what you correctly refer to as GMetPs (me likie
ended with similar results. However, I did find the this acronym), and is now in book stores, so I can-
method clearly described in the operation of the not make updates to this edition. However, you’ve
step/jog function (page 4-8) in the Manual for the tweaked my enthusiasm for writing just such a
Ruska 7250 Pressure Controller, which is available book. Of course, I would have to ask for the com-
h t t p : / / w w w . g e s e n s i n g . c o m / p r o d u c t s / bined experience and training from my fellow pro-
hpdp_model7250xi.htm?bc=bc_ruska). fessionals to put together a comprehensive, and
accurate book.
This situation also highlighted the lack of docu-
mentation of the often reference to “Good Metrol- Thank you so much for letting us know your
ogy Practice”. Where can I get a copy of this thoughts and opinions. As the managing editor and
mythical book? I’ve been in the metrology for publisher of The Standard, I receive little or no
nearly 20 years, and as most other metrology pro- feedback from our readers, and I greatly appreciate
fessionals realize these GMetP’s is often just logi- your comments.
cal common sense. As in Mr. Grachanen’s and our
situations, “tribal knowledge”, GMetP, and com- BTW, congratulations on earning your CCT. We
mon accepted practice are not adequate answers for hope you enjoy the unique CCT challenge coin.
an auditor from Missouri. Perhaps it’s time for a
companion to the Metrology Handbook? Jay L. Bucher, ASQ Sr. Member, CCT
Managing Editor/Publisher of The Standard
Thank you for your time.

Kind Regards,

Philip Mistretta, CCT


Project Manager, Lab Operations
Transcat Inc.
Rochester, NY
Ph. 1-800-724-3541 x 255
Fax 585-352-4320
Mobil 585-615-2476
pmistret@transcat.com
http://www.transcat.com

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 5

CHAIR’S COLUMN
By Graeme C. Payne
It is with sadness that I note the recent passing of DeWayne Sharp, one of the
founding members of the Measurement Quality Division. Among other accom-
plishments, DeWayne was the Editor of this newsletter, The Standard, for the
first nine years of the Division. Be sure to see the article about DeWayne on
page 27.

The Division held its annual conference, jointly with Inspection Division, on
September 28 and 29. The conference was held at the Sinclair Community Col-
lege in downtown Dayton, Ohio. It was well attended in spite of limited advance
publicity. Current plans call for the 2007 conference to be held at the same loca-
tion. The Division conference is an ideal venue for presenting or hearing papers
that are more technical, or more focused on our profession, than are typically
accepted for ASQ's World Congress. You may do well to consider submitting something when the call
for papers comes out, especially if it is something that is of immediate practical use. If you don't want to
submit a paper, consider attending the conference when the announcement comes out next year. With
more papers relevant to our work, and lower cost for the conference, it's a good value.

The CCT recognition coins are being distributed. At this point, if you became Certified as a Calibration
Technician before June 2006 you should have already received your coin. Please let me know if you
have not.

In the past couple of months the Division participated as an exhibitor at two widely separated Section
events. On October 14, I had one of the Division's exhibit booths at the first ASQ Southwest Confer-
ence. That conference was a joint effort of Phoenix and Tucson Sections (0704 and 0707) in Arizona,
and the Nogales, Mexico Subsection that is sponsored by the Tucson Section. A few days later Jun
Bautista exhibited with the other display booth at the Division Night event held by Worcester, Massa-
chusetts Section (0110). The Division's presence was very well received in both places. If you are hav-
ing similar Section events, local or regional conferences, or other events where it may be beneficial for
the Division to “show the flag”, please let a member of the leadership team know. I can't promise we can
be present at every event, but they will be seriously considered.

Finally, just to highlight the uncertainties of the current job market, as I write this I am also looking for a
job again ...

Graeme C. Payne
2006-2007 Chairperson
Email: Graeme.ASQ@gksystems.biz

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 6

CHAIR-ELECT’S COLUMN FINANCIAL REPORT


By Rick Roberson By Jay Bucher

You’re fired. Two words no one The following are the current totals from the MQD
wants directed at them; but some- accounts:
times they need to be said. While
many of us are in a position not Checking account: $44,759.55
responsible for hiring and firing,
this article is for the people that Money market account: $75,564.24
are. I have a question for those
people: why aren’t you doing your During the period of January 1, 2006 to June 30,
job? I encounter people every day and wonder 2006, the division received royalties from the sale
“why do they keep this guy (or girl) working of The Metrology Handbook of $2,247.82.
here?” This question pops into my head at many
business’ that I go to (and sometimes where I For the life of the edition, 2,193 books have been
work). I’m not advocating firing people for a sim- sold.
ple mistake, but we have all worked with people
that have continued to perform below acceptable Respectfully,
levels even after months of chances. These are the
people I’m talking about. Some people just don’t Jay L. Bucher
have the skills to do the job they are in. If I was a MQD Treasurer
professional basketball player, I would think I
would be fired quickly. Could you imagine a NBA
team with a short out of shape no talent player that
they wouldn’t get rid of? There are also people that
no matter how much you try to motivate them, they
just don’t want to work. Your job as a manager is
to ensure the work gets done, so that the company
will make a profit. Not firing someone that de-
serves it can bring down the rest of the workers. If
someone slacking off doesn’t get fired, why should
I do my job? Not everyone will react this way,
some workers will do their best no matter what
happens around them; but some will react to the
situation. If people deserve to get fired, they
should. It may be a good thing for them. If no one
tells them this job isn’t for them, they will continue
to do a bad job. I understand that firing someone
isn’t easy, and most people don’t want to fire
someone, but if that is your job, you must do it.
Remember, your boss may be reading this article,
and realize you aren’t doing your job.

A wonderful subject this holiday season. Everyone


can send hate mail to:
richardroberson@sbcglobal.net

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 7

DEMISTIFYING TEST UNCERTAINTY RATIOS


Christopher L. Grachanen
Test uncertainty ratios (TURs) sometime referred to as Test accuracy
ratios (TARs) are probably the widest used method for reporting uncer-
tainty information about the calibration of a unit under test (UUT) rela-
tive to its calibration standards. Reporting TURs became a defacto cali-
bration practice with the release of MIL-STD-45662 “Calibration Sys-
tems Requirements” (June 1980), superseded by MIL-STD-45662A
(August 1988) and subsequently retired and replaced by ANSI/NCSL
Z540-1-1994, "American National Standards for Calibration - Cali-
bration Laboratories and Measuring and Test Equipment - General
Requirements". Note: ANSI/NCSL Z540-1-1994 was recently updated to ANSI/NCSL Z540-3-2006.

Pertinent to this discussion is ISO/IEC 17025:1999 “General Requirements for the Competence of Test-
ing and Calibration Laboratories” becoming an American national standard (ANSI/ ISO/IEC
17025:1999) in July of 2000 (ISO/IEC 17025:1999 replaced ISO/IEC Guide 25:1990 & EN
45001:1989). Note: ANSI/ISO/IEC 17025:1999 has since been updated to ANSI/ISO/IEC 17025:2005.

Now let’s talk TURs. MIL-STD-45662A Section 5.2, ‘Adequacy of Measurement Standards’ specified
the following:

‘Measurement standards used by the contractor for calibrating M&TE and other measurement stan-
dards shall be traceable and shall have the accuracy, stability, range and resolution required for the
intended use. Unless otherwise specified in the contract requirements, the collective uncertainty of the
measurement standards shall not exceed 25 percent of the acceptable tolerance for each characteristic
being calibrated. The contractor's calibration system description may include provisions for deviating
from the uncertainty requirements, provided the adequacy of the calibration is not degraded. All devia-
tions shall be documented.’

Simply stated this section says that a calibration standard’s uncertainty shall be at least four times
smaller than the UUT’s uncertainty e.g. 4:1 TUR, unless provisions are documented as to the deviation
from this requirement i.e. less than a 4:1 TUR, with the qualifier that the adequacy of calibration is not
degraded. So for calibration purposes a TUR is simply a ratio comparing a UUT tolerance span (for a
symmetrical tolerance) to a calibration standard’s uncertainty. Uncertainty is loosely given to include the
aggregate of all uncertainty components making up the measurement process used for calibration. The
upcoming new revision of the National Conference of Standards Laboratories International (NCSLI),
Recommended Practice 3 (RP-3) entitled ‘Calibration Procedures’ is slated to have an appendix ad-
dressing tolerance testing providing guidance for calculating TURs based on a 95% expanded uncer-
tainty of the measurement process used for calibration. Using a 95% expanded uncertainty measurement
process used for calibration, a TUR is calculated as:

UUT Tolerance span (for a symmetrical tolerance)


TUR = ___________________________________________________
2 time the 95% expanded uncertainty of the measurement process

(Continued on page 8)

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 8

(Continued from page 7)


ANSI/ISO/IEC 17025:2005, section 5.4.6 ‘Estimation uncertainty of measurement’, sub-section 2 Note
2, infers the legitimate use of TURs (a well-recognized test method) for denoting measurement uncer-
tainty:

‘In those cases where a well-recognized test method specifies limits to the values of the major sources of
uncertainty of measurement and specifies the form of presentation of calculated results, the laboratory is
considered to have satisfied this clause by following the test method and reporting instructions (see
5.10).’

Since the release of my freeware, Uncertainty Calculator, I am often asked questions regarding measure-
ment uncertainty and TURs. Two of the most asked questions are: 1) How do TURs relate to measure-
ment uncertainty and 2) Can I legitimately use TURs to denote measurement uncertainty for a calibra-
tion in my laboratory? The best explanations I have found for these questions come from two A2LA
News releases (the newsletter of the American Association for Laboratory Accreditation). The first one,
December-Number 83, relates the following regarding the legitimate use of TURs:

‘One of the most common decision rules involves ensuring that the measurement uncertainty is relatively
small compared to the specification. For example, when a specification describes an interval with an
upper and lower limit and if the ratio of the uncertainty of measurement to the specified interval is rea-
sonably small (e.g., 1:3 or 1:4), then a statement of compliance can be made if the measurement result
falls within the specification limits and a statement of noncompliance can be made if it falls outside of
the specification limit. If the measurement result falls on one of the specification limits, then neither
compliance nor noncompliance can be stated.

The simplest decision rule is "if the measurement result lies within the specification limits, then the
product meets the specification, otherwise it fails to meet the specification." Although this rule explicitly
ignores measurement uncertainty, seemingly in contradiction of ISO/IEC 17025 requirements (sections
5.10.3.1 and 5.10.4.2), it is allowed per ILAC-G8: “More often, the specification requires a compliance
statement in the certificate or report but makes no reference to taking into account the effect of uncer-
tainty on the assessment of compliance. In such cases it may be appropriate for the user to make a judg-
ment of compliance, based on whether the test result is within the specified limits with no account taken
of the uncertainty” ...

Accreditation bodies cannot dictate to accredited laboratories which decision rules must be used in a
specific situation since the basis for making statements of compliance is ultimately a matter to be de-
cided upon by the laboratory and customer. For that reason, it is vitally important that the laboratory
understand the needs of the customer and that the customer clearly state to the laboratory how compli-
ance decisions should be made.’

(Continued on page 9)

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 9

(Continued from page 8)


The second A2LA News, April-Number 84 relates TURs to measurement uncertainty:

‘Calibration certificates or reports can present measurement uncertainty either explicitly or implicitly.
Explicit statements are straight forward and are either applied to each data point or to the calibration
process across the range of the calibration. Implicit statements typically appear as either a ratio or as a
statement referencing a specification with defined uncertainties. The test uncertainty ratio (TUR) is
probably the most common statement of uncertainty and is defined as the ratio of the tolerance of the
unit under test (calibrated item) to the expanded uncertainty of the measurand or calibration process. If
one knows the tolerance of the unit under test (found primarily in manufacturer’s operating manuals
and/or method specifications) and the ratio is presented on the calibration certificate, one can algebrai-
cally determine the expanded uncertainty. However, the calibration laboratory still has to prove that it
meets the criteria, otherwise it cannot claim that ratio…’

Thus per the aforementioned A2LA News releases one can assert that TURs are a legitimate and viable
method for implicitly denoting the uncertainty measurement process used for calibration when agreed
upon with a customer. Best business practice is for a calibration laboratory to adequately document evi-
dence i.e. design of experiment results, successful completion of proficiency tests, etc., that it can
achieve a reported TUR. This is especially true in light of laboratory accreditation assessments.

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 10

CCT Exam Review Workshop


September 22 & 23, 2006
ASQ Headquarters, Milwaukee, WI

ASQ hosted another CCT exam review workshop September 22 and 23, 2006. Eleven CCTs were in
attendance, and worked on the next two exams to be given in December, 2006, and June, 2007. The
group was also efficient enough to add additional questions to the item pool on their second day of work.
We would like to thank Mary Rehm for again providing her expertise and bubbly personality to the
workshop.

On behalf of Chris Grachanen, the CCT subcommittee chair, and Graham Payne, our MQD chair, I’d
like to thank all of the attendees for taking the time out of their busy lives, both personal and profes-
sional, to help review and improve the upcoming CCT exams. Without their assistance and hard work,
we would be limited in the number of items available for each exam, and the quality of each item would
not be what it is today without their sacrifices and inputs. Congratulations also go out to the new CCT
recipients from the June 2006 exam who volunteered their time so quickly to become a part of the CCT
program. They truly are Subject Matter Experts, as are all the rest of the attendees. Pictured below are
the attendees, just prior to dispersing at the end of the workshop.

From left to right; Jay Bucher (Promega Corp.– MQD Treasurer), Sara Ethier (Haematologic Technolo-
gies), Jason Koehn (Boeing Co.), Mark Murray (Bionetics), Rob Schreur (Eaton-Aerospace), George S.
Rine (Metrology & Calibration Concepts, LLC), Mike Sumich (AFMETCAL), Emelia Beckley (Rogers
Corp.), Woody Niemann (AFMETCAL), Rick Roberson (Bionetics– MQD Chair-elect), and Albert Yau
(Hunjan Moulded Product).
Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 11

THE LEARNING CURVE EDUCATION IN MEASUREMENT SCIENCE


by
By Phil Painchaud Frederick R. Hume
This is the forty-seventh in an
Introduction
uninterrupted series of essays
charted to be on the general sub-
For some time there has been a quiet debate about
ject of Metrology Education.
education in measurement science. In reality it has
We are now in our fourteenth
been not so much of a debate as the expression of
year of writing these open let-
many views of a complex subject. These views were
ters to our esteemed Boss, the
explored during IMTC/90 in a panel session,
Editor-in-Chief of this some-
“Education in Emerging Measurement Technolo-
what periodic journal (the Man-
gies from the Viewpoint of the Executive Suite,”
aging Editor takes exception to
organized by Mr. Phillip A. Painchaud.
this remark…we have produced an edition quar-
terly, including this one, for the past two years.
The breadth of the subject was sufficiently great to
Maybe it is time for Phil to update his column in-
cause many of those at the session to wonder if
tro). As usual we shall attempt to remain close to
anything useful could come from the presentations
our charted topic which we sometimes cannot due
and subsequent discussion. While there was clearly
to the lack of current viable inputs on the subject.
a diversity of opinion, it is to the credit of the dis-
Dear Boss: tinguished panelists, and the audience, that what
This issue we are fortunate to be able to have a col- emerged, was a rather complete description of the
umn right smack on the chartered subject. I was underlying problems and a consensus that some-
making a half hearted attempt to go through one of thing should be done about it.
the many piles of old dusty papers taking up space
in what is sometimes laughingly referred to as my “The average graduating engineer or scientist
office. Out fell an old reprint from the IEEE knows little about measurement science.”
(Institute of Electrical and Electronics Engineers)
Instrumentation and Measurement Society News- Some industrial leaders believe that measurement
letter, dated FALL 1990! That’s two years before science is a necessary part of the education of
I started writing this column! It featured a ‘White every engineer and scientist and that a separate
Paper’ entitled “Education in Measurement Sci- curriculum and degree is unnecessary. There is
ence” written by an old friend, Mr. Fred Hume. evidence to support this view as many professional
Fred and I have been good friends with consider- engineers and scientists in a position where meas-
able mutual respect since he was a young engineer urement science is the end rather than the means
at the old North American Aviation Downey Facil- find themselves in their position by chance rather
ity Calibration Laboratory long before they became than by career planning. Others see a need for
Autonetics and moved to Anaheim. He later went educational programs developed specifically to
to Fluke in Washington and eventually became a produce professionals educate in measurement
Senior Vice-President. From there he went to science to fill positions in governmental and indus-
Keithley in Ohio and became Executive-Vice trial standards and calibration laboratories, and
President. He retired from there and is now Presi- there appears to be rationale for several levels of
dent/CEO of DATA I/O in Redmond, Washington. educational attainment in such a program.

The I&M Newsletter has been out of publication There appears to be a need for continuing educa-
for many years now so I wrote to Fred and asked tion programs for professionals already employed
his permission of quote from his ‘White Paper”. in positions where measurement science is an im-
His reply was so overwhelmingly enthusiastic that portant part of the job. The daily practice of meas-
I have decided to go a step further and used his (Continued on page 12)
‘White Paper’ intact—no changes.

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 12

(Continued from page 11) The Problem:


urement science may not ensure competence in
emerging technologies, nor does knowledge of After you have reviewed the complexity of the
emerging technologies guarantee good measure- problem as identified by the panelists, it is perhaps
ments. ludicrous for me to suggest a single statement to
comprehend it. There is some merit, however, to
There is a view that the need for education in put forth an all-encompassing statement as the
measurement science is far broader than that ex- starting point for developing a solution. In sum-
pressed in any of the above. Every educated person mary then, the problem is this:
needs understanding of measurement science, that
is the scientific approach to measurement and in- Measurement science is not recognized as an es-
terpretation of results, to be able to function in the sential element of the curricula in every scientific
information age that is upon us. History supports course, and instrument and measurement system
this view. Every educated individual, just a century design is not recognized as an essential engineer-
ago, was expected to read science, to be scientifi- ing discipline.
cally literate and numerate in a broad sense. De-
grees in natural philosophy at one time were Before proposing a solution, I would like you to
prevalent at educational institutions. The lay- consider some of the constraints that limit the num-
scientist of yesteryear has nearly disappeared. ber and scope of possible solutions.

Even the average graduating engineer of scientist The Constraints:


knows little about measurement science, and is
generally unschooled in its vocabulary as well as To the outside, measurement science is not per-
its substance. The graduate in the liberal arts and ceived to be glamorous work. If a graduating engi-
the social sciences is in a similar if not worse neer has an opportunity to choose between a posi-
situation. The scientific debates over such hot top- tion in design and a position in a measurement
ics as global warming and cold fusion attest to the laboratory, he or she will likely choose the design
need for more complete education in measurement position.
science including such elements as experiment de-
sign, error propagation and analysis, traceability, “There is a need to integrate simple statistics into
and data analysis and display. Even the skilled the assigned problems in undergraduate courses.”
practitioners of measurement science lack, or fail
to use, a rigorous grammar to describe results. Second, the most important measurements, those
that have the greatest impact on society, are made
From this brief summary of the positions presented by individuals who do not perceive themselves to
during the panel session, it is easily seen that the be specialists in measurement science. Any solution
complexity of the problem is great and will not to the broad scope of the problem must encompass
likely yield to simple solutions. It is not even clear more than the relatively small community of those
what elements of the problem can and should be who consider themselves metrologists.
addressed by the society and what elements of the
problem can and should be addressed by the Soci- Some of the problem is bound up with statistics.
ety and what elements of the problem should be Statistics taught at the upper division level in an
given to others. There is also the issue of the time engineering or science curriculum is often abstract
horizon of a particular solution. For example, it is and taught without relevance to real measurement
obvious that some of the solutions involve changes problems. There is a need to integrate simple sta-
in education. Those changes will take considerable tistics into the assigned problems in the under-
time to address, as anyone involved in higher edu- graduate science courses to prepare the student for
cation will affirm. the theoretical material that they will later be ex-
pected to master and most importantly give them
(Continued on page 13)

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 13

(Continued from page 12)


tools that they will use in all of their scientific en- Finally, the body of knowledge that we represent
deavors. Measurement science should be to the by the term measurement science is not fully codi-
engineer what a tape measure is to a carpenter. fied. Where it is, in the form of international stan-
dards, the rules are not followed. There is continu-
Fourth, students are not taught to measure ing disagreement, ignorance, and unwillingness to
“everything.” Too often they are allowed to meas- observe the few rules that do exist. For example,
ure what they can measure instead of being taught multiple sets of units are still in use, and multiple
to measure what they need to measure. They never sets of standards are used.
learn that to understand something they have to
measure it. The Questions:

Fifth, the four-year curriculum is so full that it is Several questions were raised during the panel
difficult to add another complete subject matter to discussion that are quite provocative and can be
the education of the engineer or scientist. This con- useful in making the problem real. Some of these
straint is a blessing. It means that measurement are:
science must be integrated with existing subject
rather than represent a separate course that the Should measurement science exist as a separate
student may elect, or more likely not, to take. discipline, a thing to itself? Certainly it does, to-
day. Should it exist as a discipline coequal with
The scope of measurement science is broad, en- mathematics, physics and chemistry?
compassing innumerable disciplines in physical
and chemical sciences and engineering each re- Can statistics professors become acquainted with
quiring special knowledge so any degree program real measurement problems and be persuaded to
would by definition be limited to a specific disci- incorporate them in their textbooks and class ex-
pline. The difficulty of creating a degree program amples?
in a specific discipline is immense; the thought of
developing a sufficient number of these is beyond Are many educational programs misguided in
reality. teaching technology instead of teaching engineer-
ing or science?
Measurement science is intensive, incorporating
many elements such as: design of experiments, er- Can measurement science as an educational ele-
ror analysis, parameter selection, data display, ment be pushed, or is it more likely to be incorpo-
data analysis, traceability, error propagation, rated in the curriculum by the pull forces of de-
noise, convolution of parameters, and sensitivity mand?
analysis. These are tools that should be applied to
a measurement problem in any discipline. Most Must we resort to subterfuge to get measurement
graduating engineers and scientists have a rudi- science integrated into the undergraduate curricu-
mentary knowledge of these tools at best. lum?

Industry forecasts of personnel needs are often How can professors maintain awareness of current
sketchy and incomplete, and are always subject to measurement needs and practice?
huge uncertainties, albeit not by evil intent as some
would suggest. Any attempt to forecast the future The Solution:
requirements for metrologists in the narrow defini-
tion of the word, i.e. individuals working in meas- The problem as stated is multi-dimensional. It cov-
urement laboratories, is likely to be subject to the ers every scientific discipline including the social
same uncertainties as any forecast and the conse- sciences. It covers education at every level from
quences may be worse than having no forecast at primary to post-graduate. The solution must begin
all. (Continued on page 14)

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 14

(Continued from page 13) due to the quality of the discussion that occurred
with a recognition that the problem exists, and that during the session.
problem is in education. No such formal recogni-
tion exists either in the Society or in education in- I thank the distinguished panelists, Peter Clifford
stitutions. Since the problem is in education, the of the City University of London, Carl Quinn of
solution is in education. Simco, Joe Simmons of the National Institute of
Standards and Technology, and Doug Strain of
The basic of measurement should be a part of each ESI, for contributing so much to this session. I
course in science. A general course in would like to thank, also, those who have been so
“measurements” will not be sufficiently focused on kind as to suggest improvements to this paper, spe-
the specific problems a given student will encoun- cifically, Steve Adam, Professor Nigel Hancock,
ter in their professional life. Institutions of higher Helmut Hellwig, Professor Mike Lucas, and Phil
education should actively seed the involvement of Painchaud. My sincere thanks to Phil for conceiv-
practitioners of measurement science during the ing so provocative and useful a session. I had the
development of curricula and, perhaps, even in the distinct honor to serve as moderator.
teaching of some course material.
There it is, word for word, exactly as it was pub-
It is clear, however, that no progress will be made lished in the IEEE I&M Newsletter. I intend to ex-
until the problem becomes apparent at the highest amine in depth and discuss in more detail several
levels of the educational systems. A piecemeal so- of the points that Fred made in this ‘White Paper’
lution at the lowest levels will not work, whether in my next column, Number 48. If any of you have
restricted geographically or in a degree program. particular points you might like explored, please
address your comments, opinions, and questions
A solution has to involve the institutions of higher directly to me. I shall be pleased to credit, publish,
education. The institutions must be convinced of and comment on them—I promise.
the importance of measurement science and make
it a part of the education of the academically in- Meanwhile I am at the same old stand:
clined students who will become the professors of
the future. This solution can be faulted in that it is PHIL PAINCHAUD
slow and the benefits will not be apparent for many 1110 West Dorothy Drive
years. One can’t help but wonder if there is some Brea, CA 92821-2017
easier, simpler method, one that will produce re- Phone: 714-529-6604
sults within four or five years. Perhaps a better FAX: 714-529-1109
solution will emerge during the review of this posi- e-mail: painchaud4@cs.com
tion paper – one that will achieve a consensus of e-mail: olepappy@juno.co
support and that will be enthusiastically endorsed
by the community of educators, engineers and sci-
entist active in the field.
PROLOGUE: A few days ago our Editor sent me a
Throughout this paper, I have used the term, meas- large quantity of data in digital form (back issues
urement science, instead of metrology to avoid the of The Standard). While searching my hard drive
usual restricted sense of the latter. By measure- for a place to store that macroscopic collection of
ment science I mean that body of knowledge one bit and bytes, I rediscovered a letter that I had writ-
should use in the practice of measurement that lies ten to Dr. Eugene Watson over twelve years ago.
outside of and is independent of the specific techni- As a lark I sent it on to Jay along with the confir-
cal discipline. It should be noted that some would mation of receipt of what he had sent to me. As a
argue whether such independence can exist. Where total surprise to me, he came back telling me that
mistakes are made in the restatement of various he wanted to print it and needed my permission!
positions and arguments, they are entirely mine. If While this was originally a very personal letter
some of the points strike a responsive chord it is (Continued on page 15)

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
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(Continued from page 14)


from me to Watson, through no doing on my part it was now in the public domain. Gene had printed it in
its entirety in his University Departmental Newsletter, “The Squawk Sheet”. I understood that over 5000
copies had been distributed on the campus and elsewhere by request. In addition, he had heard that three
professional societies had requested permission of the University to reprint it. I was also told that a visit-
ing delegation from Mainland China requested and was granted permission to translate it into Mandarin
and distribute it in their country.

In reading this, keep in mind that it was intended to be a very personal letter written by me to my good
friend, Dr. Watson at his specific request. In preparing it for Jay, I have done nothing to alter the text of
the theme except to correct some spelling and punctuation; and to remove a few spurious words and to
add a few connecting words to smooth out the rough spots.
PAP

February 13, 1994


Dr. Eugene Watson
11889 Menlo Avenue
Hawthorne, CA 90250

Dear Gene:

A few weeks ago, while we were sitting in the Cal State Dominguez Hills booth, at the Measurement
Science Conference, we happened to start discussing the current apparent deterioration of today's profes-
sional societies, specifically the Precision Measurements Association. You asked me if I could put some
of that discussion into writing as you wanted to use it as lecture material in your Masters in Quality pro-
gram; and I agreed to try — if you were not in too much of a hurry.

Well I have finally gotten “a round tuit", or at least to attempting to start it. This discourse will be nei-
ther brief, concise, nor organized. It will be in my usual wordy rambling style (although I am usually
somewhat organized). You should be familiar with it. I wrote a regular column for the “PMA NEWS-
NOTES", “RAMBLINGS FROM THE EXECUTIVE DIRECTOR", during the period while you were In-
ternational President of the Precision Measurements Association. And they did ramble!! But enough of
this bantering, let's get down to business.

As I recall our conversation started with a question from you, "Why (in my opinion, at least) has the
prestige of the PMA (and several other professional societies for that matter) degenerated so much in
recent years? I replied over simplistically, "Because they no longer have genuine professionals exclu-
sively holding office and ‘running' them." My "2X4-between-the-eyes" one liners often provoke discus-
sion; this one was no exception.

Let's start by trying to define a Professional (by this I mean ‘Professional’ as a stand-alone noun and
not as a descriptive adjective), and as we shall see, this can become a very complex problem. The great
late Quality Guru, Dr. W. Edwards Demming is reputed to have once said, “For every complex problem,
there is an obvious simple solution — always wrong!!!" I believe that defining Professionals and Pro-
fessionalism falls within that area. And, that a substantial part of this problem has been generated by
people attempting to generate simple definitions — usually for their own benefit — and "always
wrong".

(Continued on page 16)

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It is true that Professionalism is frequently attempted to be defined in terms of education, technical train-
ing, managerial stratum, pay scale, “manuality” (Hey, I think that I just invented a new word) of the
work performed, dress code, or you name it.

—To illustrate the absurdity of some of the criteria often used by many people to determine professional
status: Once, many years ago when I was a member of the committee to select the laureate recipient for
the "Andrew J. Woodington Award for Professionalism in Metrology", there had been a candidate pro-
posed whose sole ‘qualifications’ were suave European manners, impeccable dress, and a slight accent!!

His management at the large aerospace facility where he was employed had hired and classified him as a
Professional in their Metrology Organization solely on these factors alone. He had no education or train-
ing, nor had he any experience for that matter, in any pertinent technical discipline; yet he had been as-
signed to a responsible middle management position in their large, highly technical, and otherwise well
respected metrology organization.

He had eagerly volunteered his services to the Measurement Science Conference organization. He had
been assigned considerable Conference responsibility based upon his employment level, and he had
seemingly ardently embraced that assignment.

Awhile later, he came to those who were depending upon him and announced that he was quitting then
and there because his "employer had refused to pay him overtime for his volunteered MSC respon-
sibilities"!!

When asked for documentation on his efforts to date, as time was becoming critical, he answered, "I am
a manager and as such I do not perform tasks myself. I oversee those who do perform the work. I was
not assigned any staff to perform these tasks for me and, since I do not recruit personnel, naturally noth-
ing was done!" Despite this performance there were those in the Conference hierarchy who still believed
that he was a true Professional because of his very suave manners, his slight European accent, his impec-
cable dress, and because an employer had so classified him! (— Note: He was rejected for the Award!
— Shortly thereafter his employer eliminated him.)

True Professionalism is completely unrelated to any of those factors mentioned above. It has nothing to
do with achievement, or more precisely, with the level of achievement. There are Professionals at the
entry levels as well as at the highest possible summus. And, there are non-Professionals (and also, I am
sorry to say, un-Professionals) in those positions as well. It is also unrelated to compensation; there are
true Professionals among the homeless and destitute as well as among the most affluent. Some people
believe that by receiving money for performance of some service, that alone makes one a "Professional”
in that field. — No way! [e.g.; Professional prostitutes — Professional Bank Robbers — ?????] True
Professionalism is a very difficult (if not impossible) attribute to define. But let's try anyhow:

First, a true Professional must be totally committed and dedicated to whatever task or series of tasks in
which he has agreed to participate, without regard for compensation. And, he must be willing and able to
both obtain and to consummate these responsibilities without the solicitation of, or the intervention of,
outside individuals or organizations (i.e. personal agents or labor unions.) In fact the very concept of
Professionalism is the anathema of unionism; the two cannot co-exist in the same world. (A sort of mat-
ter vs. anti-matter situation.)

Once committed, the Professional completes the task irrespective of whatever obstacles develop. True,
(Continued on page 17)

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occasionally there are unforeseen developments that can make the task completion physically impossi-
ble. For example; in the case of our fine mannered friend described above, he could have been trans-
ferred by his employer to a wild outpost on Attu; which would have made his physical performance of
the agreed upon tasks impractical (but it would in no way have exculpated him from his failure to have
started the work himself with or without a staff.)

Over the years I have talked to many young people, often to Metrology Technicians, aspiring to become
Professional Metrologists in the upper strata. Frequently they have complained to me that they "cannot
do this or cannot do that” towards professional achievement, "because our Union won't let us"; or some-
times even "our manager (or management) won't let us", or "our company won't pay for it"!

Invariably I reply: — "What has that got to do with it?" “Why are you in a union in the first place if you
aspire to become a Professional?" Or "Why are you working for a manager (or management) who are so
un-professional themselves as to impede rather that enhance your Professional development?” Or,
"What do you mean the company won't pay for it? Your Professional development is YOUR responsi-
bility alone. It is not your employer’s responsibility to pay for any part of the costs of your professional
training, including tuition, Professional Organization dues, text books, seminars, and the like. It is your
sole and personal responsibility to withstand all of these costs. IF your employer wishes to compensate
you for expenditures you have made towards your Professional development WITHOUT STRINGS AT-
TACHED, then by all means accept it and cherish that employer as there are very few of them among
those MBA run organizations today that can look that far ahead — "

“It is true that jobs are scarce, but places at the top among the True Professionals are even more scarce.
You must decide early in your career development whether you are intending to become a drone with
artificial ‘security’ in a comfortable cocoon, or whether you truly aspire for the apogean position of the
True Professional; and then stick to it without deviation for the rest of your career. In other words, the
True Professional must be totally dedicated to becoming and remaining a True Professional for life. It is
not something that can be turned on or off as might suit the mood of the moment or as might comple-
ment the color of one's tie or scarf. There is no compromise, and like virginity, the decision is final for
life." — I have repeated those above statements many times.

Next, to be a True Professional, one must forever divorce oneself from pecuniary goals as being the pri-
mary or even a major objective. By this I most certainly do not mean that Professionals must take a mo-
nastic vow of poverty and live a penury lifestyle. Quite to the contrary! Gene, both of us know both from
experience and by observation that a True Professional, living rigidly by professional precepts, can in-
deed achieve a very comfortable lifestyle for himself and his family. (Remember, however that
‘comfortable' is in no way synonymous with `greed' and/or `avarice’, as many in the present generation
seem to believe.)

Let me illustrate this point: A few weeks ago, while driving through Seattle I got caught behind a city
bus. Staring me in the face I saw a sign on the back of that bus advertising an HMO. It said: —

"WHEN THE PROFIT MOTIVE IS REMOVED,


THE PHYSICIAN CAN BECOME THE TRUE HEALER".

Since I had already started this letter and it was on my mind, I became sensitive to the possibility of
paraphrasing it to the context of my theme. So I pondered; "Physicians are generally considered to be
Professionals, and we all know that few physicians, irrespective of whether they are in private practice
(Continued on page 18)

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or employed by an organization, are starving unless they choose to; therefore why can I not expand this
truism generically to include other Professionals?" Thus: —

WHEN THE PROFIT MOTIVE IS REMOVED, THE PRACTIONER


CAN BECOME THE TRUE PROFESSIONAL.

Those two attributes are important, but they are only the beginners, there are several more just as impor-
tant attributes; however there is one additional attribute which is so supremely vital that we will leave it
for last.

The next attribute I shall discuss is CLASS. If you think that Professionalism is difficult to define, wait
until you try this one. I was almost ready to give up, but as a Professional, I am not permitted the luxury
of quitting, as I gave you my word that this task would be consummated.

There is nothing at all amiss for a Professional seeking and using assistance, (provided that the assis-
tance is acknowledged freely and openly). I finally found a definition of “CLASS", much better than any
that I could write in an Ann Landers’ Column in The Los Angeles Times. (Sorry, I could not find the
publication date). It goes like this:-
—— CLASS ——

CLASS never runs scared. It is sure-footed and confident. It can handle whatever comes along.

CLASS has a sense of humor. It knows that a good laugh is the best lubricant for oiling the machin-
ery of human relations.

CLASS never makes excuses. It takes its lumps and learns from past mistakes.

CLASS knows that good manners are nothing more than a series of petty sacrifices.

CLASS bespeaks an aristocracy that has nothing to do with money. Some extremely wealthy peo-
ple have no class at all while others who are struggling to make ends meet are loaded with it.

CLASS is real. You can't fake it. The person with class makes everybody feel comfortable because
he is comfortable himself.

If you have CLASS you've got it made. If you don’t have CLASS, no matter what else you have,
it doesn't make any difference.
—ANN LANDERS—

I can't add much to that, except to reiterate that a Professional must have CLASS.

While I was searching for a satisfactory definition for Class, I also found a very good one for Maturity,
another essential attribute of a Professional. Again it is from Ann Landers, in the Los Angeles Times,
January 8, 1991. (Don't you believe for one minute that I am just a smitten Ann Landers buff; I also read
her sister Abbey's column faithfully. There is a lot of learning to be had from those two women.)

Next attribute; a Professional must be MATURE. And here I am not referring to physical maturity, but
rather psychological, emotional, and ethical maturity. Ann describes them far better than I can do: ---
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—— MATURITY ——
MATURITY is the ability to control anger and settle differences without violence or destruction.

MATURITY is patience. It is the willingness to pass up immediate pleasure in favor of long-term


gain.

MATURITY is perseverance, the ability to sweat out a project or other situation in spite of heavy
opposition and discouraging setbacks.

MATURITY is the capacity to face unpleasantness and frustration, discomfort and defeat, without
complaint or collapse.

MATURITY is humility. It is being big enough to say, "I was wrong." And, when right, the mature
person needs not experience the satisfaction of saying, "I told you so."

MATURITY is the ability to make a decision and follow through. The immature spend their lives
exploring endless possibilities and then doing nothing.

MATURITY means dependability, keeping one's word and coming through in a crisis. The imma-
ture are masters of the alibi. They are conflicted and disorganized. Their lives are a maze of broken
promises, former friends, unfinished business and good intentions that never materialize.

MATURITY is the art of living in peace with what we cannot change, the courage to change what
we know should be changed, and the wisdom to know the difference.
----------ANN LANDERS----------

All that I can add to that is, "A True Professional must have MATURITY"!

Gene, the way my ramblings are going, this letter could become a life-time career in itself. I have many
other things that I want to accomplish before I tread off this mortal soil, so we must bring it to a halt
soon despite the pleasure I am having writing it. Before we finish, let's examine just one more attribute
of the True Professional and one that I feel is the most vital of all: i.e., PERSONAL AND INTEL-
LECTUAL IINTEGRITY.

Most Professional attributes must naturally take a form or manifestation commensurate with the require-
ments of the specific profession of the Professional of interest. I am not a physician, I am not an attor-
ney, I am not a clergyman, and I am not even a nuclear physicist. I would like to believe that I am a
Metrologist, a Professional in Metrology; in the science of measurement. So I feel that in order to au-
thoritatively discuss this attribute of Professionalism, I must draw from my own field for illustration and
example.

I often lecture (`soapbox' might be a better term) to young aspirants to Metrology (or to anyone else who
listens, willing or not) on the topic of INTEGRITY. I usually start by saying something like this: "A
Metrologist's Integrity and his Ethics must be at all times absolute and unquestioned. And this applies
to his personal life as well as his public (or professional) life. Ethics and Integrity cannot ever be tog-
gled off and on. If switched off, even for a fleeting instant, confidence in that individual is lost for-
ever.—— "
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"Look at it this way", I have often explained, "The precise combination of factors effecting a specific
measurement exist only once; they probably will never again be precisely repeated throughout all eter-
nity. The Metrologist makes and reports the measurement knowing that all of these pertinent factors
have been accounted for and have been included in his algorithm. In doing so he attests that:

“He has, in the first place, measured the correct parameter(s) for the problem at hand, and not just
those ones which happened to be of interest to him personally, or were at that moment more politi-
cally correct, or just happened to fit his personal expertise or the resources available to him.

"He knows and has adhered to the correct measurement procedure;

"He has selected and used the proper measurement implement whose parameters are currently certi-
fied to valid and accredited measurement criteria;

"He has evaluated all knowable environmental factors and has suitably compensated for their effects
on the measurement of interest;

"He himself has the knowledge, the skills, and the abilities to perform the measurement, evaluate the
data, and report the results factually, irrespective of the consequences of the truth."

"And he must be able do all of this knowing that no one will ever be able to `check up on him by
repeating the measurement precisely as he performed it. —

`As the precise combination of those factors effecting that measurement will never again exist
through all eternity'!

Only when the Measurer can and always does perform in this manner can he truly be called a Metrolo-
gist. And a true Metrologist must be a True Professional.——"

As I said before I am not qualified to draw Integrity and Ethics illustrations for other disciplines, but I
believe that you can draw your own illustrations for other technologies patterned after my illustration
above. Just let me say that the True Professional must have unquestioned and unquestionable Ethics and
Integrity.

Well Gene, this is a long way from where we started, seven pages and seventy kilobytes from your ques-
tion about why the apparent decline of today's Professional organizations.

Now let me ask you a question. How many of the people you know, especially those who are heading
today’s Professional organizations, possess ALL of the attributes that I have discussed above? A True
Professional must possess and live all of them, all of the time.

Thanks Gene for your invitation to let me expound, I hope that I have explicated (or is that pontifi-
cated?) to your satisfaction.

Sincerely,

PHIL PAINCHAUD
(Continued on page 21)

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EPILOGUE: Now that you have read my personal letter to Dr. Watson that just happened to get pub-
lished, you could logically ask, “What happened next?” “Did you receive any responses?” The answer
is: ‘Directly No’. I received not a single direct response from the five thousand odd readers of the
Dominguez Hills Newsletter, or from the (estimated) 20-25 thousand Professional Society reprint read-
ers, and none from the however so many Mandarin translation readers.

I did receive a request from Dr. Don Drum at Butler County College to redo that letter into a full blown
lecture for presentation before that institution’s Metrology classes. That I did and over a span two years
it was repeated eight times including three special versions requested by the Administration. One was
for the general public of Butler County (that was covered by the local TV station and two local AM/FM
stations); a second for presentation before an invited audience consisting of students and faculties from
seven regional universities, and a specially revised version for presentation to the students of the Phi-
losophy curriculum there at Butler.

When Dr. Watson saw the video tapes of the Butler presentations, he asked me to again present the lec-
ture before several of his Masters in Quality classes, both on-campus and on-site. But that wasn’t the
end; when the Sigma Xi Scientific Research Honor Society decided to hold its National Honors Award
Meeting on the Dominguez Hills campus, Dr. Watson (who was Vice-President of the local chapter) was
tapped to produce a keynote speaker. “Phil, could you take that 2½ hour lecture and condense it into a
10 minute keynote?” “No way!” But I did manage to squeeze to 25 minutes.

When I thought it was all over, the Precision Measurement Society (the local group in the San Francisco
Bay Area, not to be confused with the international group the Precision Measurements Association
based in the Los Angeles Area) heard about it and asked me to come to San Jose and present it at a cou-
ple of their meetings. This I did. When the PMA heard about this of course I was compelled to present it
before their Orange County Section.

What did I gain from all of this? Monetarily speaking, I received “not a farthing” — had I accepted any
pecuniary remuneration I might have lost my amateur status. On the other hand the Professional gratifi-
cation I have received from these efforts is almost beyond comprehension. I find it difficult to describe
the satisfaction one can acquire when you have many apt listeners hanging onto your words, permeating
them inward, and attempting to comprehend them in terms of themselves.

I would not be wholly truthful, and hence not a true Professional, if I did not admit that there has been
some non-monetary compensation. In recognition of my work at Dominguez Hills, Dr. Watson knowing
my love for classic technical tomes, arraigned to have me presented with a set of the MIT Radiation
Laboratory Series, long out of print. I suppose that it was he who influenced the Sigma Xi Scientific Re-
search Honor Society to present me with a copy of ALTERNATING CURRENT BRIDGE METHODS by
B, HAUGE, ScD., a book that I have coveted since my college days. Butler, in a very public ceremony,
bestowed their unique DISTINGUSHED VISITING SCHOLAR AWARD and if that were not enough,
created a permanent VISITING CHAIR OF METROLOGY.

The moral of this story is that you can never predict what might result from a casual conversation be-
tween two old friends who just happen to sit in an empty booth at a Measurement Science Conference to
rest their weary feet.

Phil A. Painchaud

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 22

THE LEARNING CURVE 1,200 latent calories in the dessert, the net calorie
loss is approximately 5,000 calories. Obviously,
By Phil Painchaud the more cold dessert you eat, the better off you
are and the faster you will lose weight, if that is
This is the forty-eighth in a
your goal.
somewhat uninterrupted series
of essays originally charted to
This process works equally well when drinking
be on the general subject of Me-
very cold beer in frosted glasses. Each ounce of
trology Education. We are now
beer contains 16 latent calories, but extracts 1,036
in our fourteenth year of writing
calories (6,216 calories per 6 ounce portion) in
these open letters to our es-
the temperature normalizing process. Thus the
teemed Boss, the Editor-in-
net calories loss per ounce of beer is 1,020 calo-
Chief. As usual we shall attempt
ries. It doesn’t take a rocket scientist to calculate
to remain with our charted topic
that 12,240 calories (12 ounces x 1,020 calories/
which frequently we cannot due to the lack of cur-
ounce) are extracted from the body in the process
rent viable inputs on the subject. (Why is it that
of drinking a can of beer.
you folks from Butler, Ridgeway, and Dominguez
Hills and those other institutions professing to be
Frozen desserts such as ice cream, are even more
teaching Metrology are continually ‘hiding your
beneficial, since it takes 83 calories/gram to melt
light under a bushel’? Speak up of your accom-
them (i.e., raise them to 0 °C) and an additional
plishments and let us publicize them!).
37 calories/gram to raise them to body tempera-
ture. The results are remarkable, and beat run-
Dear Boss:
ning hands down.
We do not usually go in for much humor in this
Unfortunately for those who eat pizza as an ex-
column, however I think that this one is worth re-
cuse to drink beer, pizza (loaded with latent calo-
peating. I found it among a pile of old papers. I
ries and served above body temperature) induces
have no idea from whence it came or who sent it. It
an opposite effect. But, thankfully, as the astute
was on a sheet torn from some other publication
reader should have already reasoned, the obvious
with only the date showing—September 2002. It
solution is to drink a lot of beer with pizza and to
was titled ON THE LIGHTER SIDE.
follow up immediately with large bowels of ice
cream.
As we all know, it takes one calorie to heat one
gram of water one degree Celsius. Translated into
We could all be thin if we were to adhere relig-
meaningful terms, this means that if you eat a
iously to a pizza, beer, and ice cream diet.
very cold dessert (generally consisting of water in
large part), the natural processes that raise the
[AUTHOR’S NOTE AND DISCLAIMER:
consumed dessert to body temperature during the
SINCE I DO NOT KNOW NOT THE ORIGIN
digestive cycle literally sucks the calories out of
OR THE SOURCE OF THE ABOVE ADVICE,
the only available source, your body fat.
I AM UNABLE TO VOUCH FOR LEGITI-
MACY OR EFFICACY. THE READER
For example: A dessert served and eaten at near 0
MUST EXPERIMENT AT HIS/HER OWN
°C (32.2 °F) will in a short time be raised to the
RISK. —PAP]
normal body temperature of 37 °C (98.6 °F). For
each gram of dessert eaten, that process takes ap-
In our last issue (Column 47), we reprinted a
proximately 37 calories as stated above. The av-
“White Paper” written by an old friend, Mr. Fred
erage dessert portion is 6 ounces, or 168 grams.
Hume. I promised you that in subsequent issues I
Therefore, by operation of thermodynamic law
would discuss some of the points Mr. Hume raised.
6,216 calories (1 calorie/gram/degree x 37 °C x
168 grams) are extracted from body fat as the des- (Continued on page 23)
sert’s temperature is normalized. Allowing for the
Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 23

(Continued from page 22) not just co-equal with Mathematics and the sci-
He asked six questions: ences of Chemistry and Physics, it is fundamental
to them. In retrospect, it appears that Mathematics
1.-Should measurement science exist as a sepa- must have been developed as a tool to quantize
rate discipline, a thing to itself? Certainly it does, early man’s measurements (probably of his land
today. Should it exist as a discipline coequal with holdings as he transformed from hunter to agrar-
mathematics, physics and chemistry? ian). It was later, as man became interested in the
Matter and the Forces that had to deal with, that he
2.-Can statistics professors become acquainted began to need to quantize those matters of interest.
with real measurement problems and be per- Thus the quantizing tool of Mathematics became
suaded to incorporate them in their textbooks and involved and the sciences of Chemistry and Phys-
class examples? ics became created.

3.-Are many educational programs misguided in Second question: “Can statistics professors be-
teaching technology instead of teaching engineer- come acquainted with real measurement problems
ing or science? and be persuaded to incorporate them in their
textbooks and class examples?”
4.-Can measurement science as an educational
element be pushed, or is it more likely to be incor- Second answer: ‘Statistics Professors’ are, at least
porated in the curriculum by the pull forces of in my experience, simply Mathematics Professors
demand? who just happen to be teaching that branch of
mathematics we call Statistics. My personal experi-
5.-Must we resort to subterfuge to get measure- ences with Mathematics instructors in general may
ment science integrated into the undergraduate not have been typical, but with a single exception, I
curriculum? found them to be a very poor lot indeed—far re-
moved from reality and usually with poor teaching
6.-How can professors maintain awareness of abilities. Too bad that all of our mathematics/
current measurement needs and practices. statistics instructors cannot be modeled after Pro-
fessor Charlie Eppes of the TV Show
Now let us discuss those questions one at a time. ‘NUMB3RS’! I will not be a defeatist and say that
Of course this discussion will inevitably be biased it cannot be done, but it may require a long uphill
with my personal opinions. If you do not care for battle to persuade most of the teaching branch of
what I believe, challenge me, right here in this col- the Mathematics fraternity, Statistics or otherwise,
umn. to join the real world and include Metrology appli-
cations within their theoretical curricula.
First question: “Should measurement science exist
as a separate discipline, a thing unto itself? Cer- Third question: “Are many educational programs
tainly it does, today. Should it exist as a discipline misguided in teaching technology instead of
coequal with mathematics, physics and chemis- teaching engineering or science?”
try?”
Third answer: Here we could be caught in a seman-
First answer: Measurement Science (Metrology) tics trap. I know of no rigid incontrovertible defini-
does indeed exist as a separate science and always tion for the term Technology in respect to curricula.
has. The fact that this has not been so in the minds Everyone involved or interested seems to have gen-
of many otherwise knowledgeable people does not erated and applied their own definitions and ex-
make it non-existent. If it were not a distinct defin- pects the world understand their precise semantic
able discipline, and has not been so for millennia implications. If Mr. Hume in this White Paper was
past, how could the great Lord Kelvin have fin- equating Technology Education with Vocational
ished his immortal quotation: “----so therefore, Training, then the answer might be “Maybe yes
without Metrology there can be no science”. It is (Continued on page 24)

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 24

(Continued from page 23) Naturally we must have a few rules:


and maybe no”. It depends entirely on what are the
objectives of that Program at that institution. 1: I shall be the sole judge of the eligibility of
any winner and of the completeness and accu-
We must keep in mind that the Metrologist, the racy of their answer.
Metrology Engineer, and the Metrology Technolo-
gist (or Technician if you prefer) are three distinct 2: Only rank and file members of the Measure-
individuals; each with distinct but overlapping ment Quality Division in good standing (i.e.
backgrounds and job requirements; each with dif- dues paid up) will be eligible. All officers and
ferent educational/training requirements; and each coordinators, past and present and all staff
vitally essential to our overall Metrology practice. members are ineligible.
(We might here note that the Calibrator is a highly
trained specialist within the Metrology Technolo- 3: All answers must be in written form and sent
gist category.) The practice of the Science of Me- via U.S Mail. No phone calls, Faxes, e-mail,
trology is totally dependent upon these three dis- smoke signals, telegrams, or semaphores.
tinct specialists—the loss of any one makes the
existence of either of the other two virtually mean- 4: All answers must be in my hands (not just
ingless. postmarked) by January 2, 2007.

The purpose of this column for the past fourteen 5: No prize will be awarded if no answer, in my
years has to stress the need for increased education judgment, meets my criteria for accuracy and or
for Metrologists and to a lesser degree, Metrology completeness. In the unlikely case of duplicate
Engineers. We do not deliberately overlook the winners the prize will be split.
vocational training of the Metrology technologists,
as we agree that they are as vitally essential as are I am still at the same old stand:
the other two categories; however it appears that
training opportunities for Technologists do exist. PHIL PAINCHAUD
They may need recruiting assistance, but they do 1110 WEST DOROTHY DRIVE
exist. Some, such as the Military Schools, have BREA CA, 92821-2107
been doing a commendable job of producing supe- Phone: 1-714-529-6604
rior Calibrators and other Technologists. Fax: 1-714-529-1109
e-mail: painchaud4@cs.com or
Well Boss, I am starting to run out of space, but I olepappy@juno.com
do have a question—I wonder how many of our
rank and file members are reading The Standard
and this Column? So I am going to run a small con-
test to give me a clue. In Column 46 (remember all
of THE LEARNING CURVE columns are num-
bered) near the end I asked a question. I am not
going to repeat the question as I want you to go
back and look it up. I am offering a real prize for
the best and most complete answer. The prize: I
have in my pocket a nice crisp United States Treas-
ury Note, Serial Number AL95095590C in the sum
of $100. That item, or equivalent, will go to the
individual who furnishes me with what I consider
to be the best and most complete answer to that
question.

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 25

Participants from Phoenix, Tucson, and Nogales were on hand, October 14, 2006, to listen/participate in
our first annual Southwest Conference. Tom Pyzdek, one of the foremost authorities on Quality Engi-
neering/Six Sigma, gave a through overview on the seven quality tools. Our conference dealt with a ba-
sic concept in the quality ream – how to make sense of all that data. This was accomplished in a dy-
namic Quality Café demonstration of the seven quality tools. Everyone enjoyed the structure and the
hands on approach to the topic. Mark your calendar for the next years Southwest Conference.

I’d like to personally thank Michael Say (CCT#328) for volunteering to assist the MQD.

Elías Monreal
ASQ0707 Chair Elect

The following are photos taken during the conference.

Our illustrious Chair, Graeme Payne in front of the MQD traveling booth. Thanks, Graeme, for attend-
ing and representing our division.

On the following page are two more photos. The first, I assume (we all know what happens when we do
that…) is Tom Pyzdek giving his presentation. The second photo is another one of Graeme, but there
were no accompanying explanations given with the photos. Sorry. I could make a wild guess, or add
something cute, but I’m already in enough trouble with what I put under photos as it is.

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 26

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 27

DeWAYNE BURLE SHARP

AUGUST 12, 1926—OCTOBER 31, 2006

Wednesday, September 11, 1963 was a rainy day in Chicago. In a conference room of McCormick
Place, I had just finished delivering a requested paper on the pooling of measurement devices before an
audience of skeptics during the Annual Convention of the Instrument Society of America. Naturally
there were a number of individuals that wanted to question me afterwards concerning my paper. One, a
large tall fellow, seemed reticent and hung back until all of the rest had their say. When it was finally
down to just the two of us, he stepped up, introduced himself, and presented me with a card. But the card
was unusual—it did not conform to the norm for business cards—it was neatly hand printed! I must have
done a double take for he quickly explained, that although he was head of the Metrology functions for
the San Jose facility of IBM Corporation, his organization reported through the Manufacturing channels.
And, that current IBM Policy prohibited any Manufacturing personnel having printed business cards.
Here indeed was someone after my own heart—one who knew how to legally circumvent illogical pol-
icy in order to get a job done! There and then was bonded a friendship, closer than between many broth-
ers, one that lasted for forty-three years.

A half year later, by chance we were both attending a conference in Palo Alto; there our earlier acquaint-
anceship became renewed and, as circumstances proved, became greatly strengthened. DeWayne was a
Board Member of a local Bay Area professional group; I was President of another similar organization
in Southern California. Both he and I were endeavoring to merge the two and eliminate unnecessary ri-
valry. Somehow severe personal animosities had developed between members of the two groups. He
invited me to speak before his Board to try to quell the bitterness. When I arrived, both he and I were
(Continued on page 28)

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 28

(Continued from page 27)


very adamantly told that my presence was not welcome and, that if he persisted, severe repercussions
might surely occur to him. DeWayne, undaunted, then made a long pointed speech stressing open mind-
edness, fair play, good manners, and tolerance. I was then allowed to speak before very a non-receptive
audience—he in turn was immediately voted off of the Board, and was never again permitted to hold
office in that organization. A friendship was proven. However, he did eventually gain the top office in
that other organization.

Several years later, my employment took me from Southern California to Oakland—not that far from
San Jose. I still had that hand printed card with a telephone number on it. I called it and said, “If you
come up to Oakland, I’ll buy lunch”. That was the beginning of a close relationship and frequent visits
both ways and the many things that we did together.

During the remainder of our relationship he: Served on the “California Professional Metrology Commit-
tee”, an agency of the California Legislature charted to develop legislation for the licensing of practitio-
ners in the Measurement Sciences; was appointed by Governor Ronald Reagan to the “Governor’s Com-
mission for the Upgrading of the California Weights & Measures System”; was appointed an Official
United States Delegate to the International Electro-Technical Commission 31st General Assembly in
London and in Washington to the 33rd two years later; this official travel was on diplomatic passports
and took him not only to London where he was, with his wife, formally received at the Court of St,
James, but also to Paris, Einhoven, Berlin, Stuttgart, Sindlefigen, Mainz, Budapest, and Copenhagen. In
Budapest he presided at the formation meetings of Working Group 1, Technical Committee 66A (Pulse
Techniques and Apparatus) of the IEC, charged with the task of developing the International Standard in
Time Domain. In an allied capacity he was Vice-Chair of the IEEE Sub-Committee on Pulse Tech-
niques, the organization paralleling the IEC in the development of the United States version of the Stan-
dard.

Nevertheless, he also had a singular career well removed from the political area. He headed the premier
Metrology laboratory of the IBM Corporation and established within it the West Coast anchor of the
NBS “Round Robin” voltage certification program. He became Chairman of the IBM Corporate Metrol-
ogy Task Force, the organization responsible for unifying Metrology operations throughout the Corpora-
tion. DeWayne went on up within IBM to create a function dedicated to developing and selling applica-
tions of their products for unconventional uses.

He became active in the Instrument Society of America and was the principal contributor to their West
Coast journal; he held office in the local Silicon Valley Section. He served two two year terms as Direc-
tor of the ISA Metrology Division; he became a Regional Vice-President and was eventually made an
ISA Fellow.

After being voted off of the Board of the aforementioned Bay Area society, he joined the other organiza-
tion, the Precision Measurements Association, and helped found the San Francisco Bay Area Section,
where he eventually became a Director on the National Board and later International President.

He conceived the concept of and vigorously recommended the creation of the Measurement Science
Conference; he became active in it; and headed it during its most tumultuous year, 1978. There he
showed the sageness of a Supreme Court Justice in arbitrating a threatened suit of comprehensive mag-
nitude by a disgruntled exhibitor. He showed compassion and strength in his expedient handling of the
loss of a key staff member to a deranged murderer by recommending, in his memory, the creation of and
selling the concept of the Woodington Award, to become the highest possible recognition that the Me-
(Continued on page 29)

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 29

(Continued from page 28)


trology Community can bestow on one of its members.

He became the Founding Editor of this publication, THE STANDARD, the periodic journal of the
Measurement Quality Division of the American Society for Quality, and guided it through its early dec-
ade.

But these are all things that DeWayne accomplished professionally, what about him personally? During
our many years of close contact and traveling together, he told me many things about himself. I not cer-
tain that I have many of these bits and pieces in proper chronologic order, but I shall try.

Like most people, DeWayne was born, but unlike most people he was born by accident— in Canada.
You see DeWayne’s father had a new job out in one of the Western States and his mother was traveling
by train to join him. As you know some trains from Buffalo to Detroit travel through Ontario, Canada.
Mrs. Sharp went into labor while the train was in Ontario, the conductor had the train stopped and she
was taken to a nearby hospital to complete the delivery. Thus DeWayne was never eligible to become
President of the United States—he was foreign born—by accident!

Mr. Sharp eventually landed a longer term job building the Grand Coulee Dam in
Washington State. So DeWayne spent his early years and youth in the town of Grand Coulee, Washing-
ton. They later moved to Seattle where DeWayne went to Lincoln High School four years behind my
late wife, Arlene. They both suffered under the same martinet English teacher, the knowledge of which
endeared them when they met years later.

When World War II came along, DeWayne like most young men of his generation, went into a service;
he to the Navy. There he trained as an Electronic Technician and was eventually assigned to serve on a
hospital ship attached to the Seventh Fleet in the Southwest Pacific. Out of the service he, like so many
of us, went on to school; he to the University of Washington, where eventually he majored in Journal-
ism. That got him into small radio stations throughout the Mountain States reading the news, but he
found that he could also be a disk jockey at the same time— that paid a little more. Thus he became
known as “MONTANA SLIM” for some listeners and as “STAY UP STAN THE ALL NIGHT RE-
CORD MAN” to others.

With this country western experience behind him he got the news spot at a much larger station in Mount
Vernon, Washington. That station was building a TV outlet and needed an engineer, so with his Navy
electronics background he was able to quickly acquired a degree in Electronics and the necessary FCC
license, and got to run the station. But the wanderlust struck again and he headed for Alaska. There he
met Virginia and the result you should know, a family of three children, and I am not sure of how many
grandchildren.

Well, radio station disk jockeying in Alaska is not the most lucrative occupation to have when you are
trying to raise a family, so there was a move to Denver and a job at the Martin defense plant. That move
got him into Metrology. He was assigned to create the Metrology Organization from the ground up. IBM
heard of the things that he did there and lured him and his family to San Jose to do the same for them.
The rest is history as I have narrated in the beginning of this saga.

(Continued on page 30)

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 30

(Continued from page 29)


During my many years of life I have lost many kinfolk and friends, but none have struck at me more
deeply than the lost of DeWayne Sharp. Good bye old Friend and farewell.

I’ll close with the moniker you assigned to me several years ago in one of your numerous editorials:

YOUR RESIDENT PUNDENT, THE SAGE OF THE BREA HILLS


Phil Painchaud

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 31

BOOK REVIEW
Note: I generally do Book Reviews as an integral part of one of my columns; in this case however, our
Editor has requested it be done as a ‘stand alone’. Phil Painchaud

Title: The Quality Calibration Handbook

Sub-Title: Developing and Managing a Calibration Program

Author: Jay L. Bucher

Publisher: American Society for Quality, Quality Press, Milwaukee. 53203

Copywrite: © 2007 American Society for Quality

Library of Congress Number: 2006-027515

International Standard Book Number: ISBN—10:0-87389-704-8

Contents: 4 Parts consisting of 20 Chapters, 204 Pages, 24 Figures, 10 Tables

Price: Not Available (see the Editor’s note at the end of this review)

It is difficult enough to properly and unbiasedly analyze and review a published book, but this one pre-
sented certain unusual problems. First and foremost, the book has not as yet been printed and distributed,
thus it had to be analyzed from a downloaded copy of the final draft on a computer screen. (204 pages is
an unreasonable quantity to print on a computer printer) This indeed creates a difficult environment for
careful examination. A second item of concern, the author is our Editor; hence a certain degree of con-
servatism (not generally characteristic of us) must be maintained in order to not damage an otherwise
harmonious relationship.

Those of you who are regular readers of our column, THE LEARNING CURVE in the ASQ/QMD jour-
nal THE STANDARD should be familiar with the thesis we have presented many times: The practice of
Metrology is like a three legged stool, all three legs are equally important and necessary for its support
and stability. These three legs are the Metrologist, the Metrology Engineer, and the Metrology Tech-
nologist (The Calibrator being a highly trained specialist, a very special sub-set of the Metrology Tech-
nologist.). And that in the ideal Metrology organization, these three are under the direction of an Ad-
ministrative Metrologist, an individual who has an adequately acceptable and demonstrated compe-
tency in all of the functions and all of the technologies required of his subordinates, as well a mastery of
the arts of Administration and Leadership.

After studying this book we are not quite sure how it is aimed. First of all its title says that it is a
“HANDBOOK”. I beg to differ with the author, a “Handbook” is a document intended to be a refresher
or reference for someone already well versed in the subject of interest. This work is definitely not aimed
at the already practitioner of Calibration Management, but rather at the aspirant. Thus it more probably
should be classified and titled as a Text Book or even possibly as an Instruction Manual; thus following
the more traditional usage that a Text is a document intended to Educate the reader in the principles of
the topic or interest, both fundamental and advanced; and an Instruction Manual is a “how to do it”
document (e.g., the Instruction Manual that came with your VCR.) intended to Train an operative in the
use of certain devices or procedures.
(Continued on page 32)

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 32

(Continued from page 31)


The Author in his PREFACE touches upon the incompetence of certain Auditors; this brings to mind an
old New England adage we learned many years ago: “Thems that can, do; thems that can’t, teach”. This
could easily be revised to fit today’s environment as “Thems that can’t, audit”. We ourselves have ex-
perienced many instances of similar encounters. Too often such nonsense comes not just from the agents
of the Regulatory Agencies, but from within ones own organization. This is usually due to ignorance by
hierarchal administrative personnel as well as Auditors of the differences between a good calibration
procedure and a factory checkout procedure. In the case of a recently assembled measurement instru-
ment coming off the assembly line, a proper Factory Checkout Procedure assumes that everything is
wrong with it and indicates steps required to do everything necessary to adjust or otherwise correct it to
become within specifications. In the case of an measurement instrument having been in service and be-
ing returned for calibration, a proper Calibration Procedure assumes that everything is correct with it
and indicate steps required to try to prove otherwise without adjustment; and if proven otherwise, then to
adjust and record the necessary adjustment. Unfortunately however, at least in our experience, many
Auditors are ignorant of that nuance.

In his Chapter One, the Author’s “Great Train Wreck” analogy is a good example of the necessity for
adequate Calibrations, but with his avowed Air Force background we are curious why he did not use two
more recent and closer to home examples: the loss during the late 1940’s of an entire squadron of SAC
nuclear bombers due to improper frequency calibrations of their radio location gear; and infamous “Iraqi
Turkey Shoot” of the early 1990’s so well analyzed in the late Retired Master Chief Claude Forroux’s
famous “White Paper” to Congress. While the examples the Author uses are in no way bad, the use of
either or both of these could be more forceful examples for driving home his very valid point.

We are quite astonished that on Page 9, while repeating Kelvin’s famous pronouncement that the Author
left out the punch line; “So therefore, if Science is Measurement, then without Metrology there can be
no Science”. However we could go on “ad nausium” ‘nit picking’ seeming discrepancies both minor
and major, but such would serve no purpose, as the Author has produced an outstanding pioneer work,
and as we all know nothing is perfect. Many seeming discrepancies are opinional, and we should be
thankful that we live in a coterie where we can all have and can express differing opinions on the same
matters. Never-the-less we would like to point out two more discrepancies.

The Author makes constant use of the requirements laid down within ISO and FDA documents—there is
nothing wrong with that except that many organizations are under the jurisdiction of other regulatory
agencies that have their own requirements and must therefore conform to MIL STNDS, MIL SPECS,
FAA REGS, etc., or non-public agency documents imposed by various customers. The existence and
importance of these should have been noted.

In Chapter 20 the Author mentioned six organizations concerned with Metrology operations in some
manner or another. There are at least eight more, several of these are even more important than some
mentioned by the Author:
1: American Association for Laboratory Accreditation (AALA)
2: American National Standards Institute (ANSI)
3: American Society of Mechanical Engineers (ASME)
4: American Society for the Testing of Materials (ASTM)
5: International Electro-Technical Commission (IEC)
6: International Standardizing Organization (ISO)
7: International Society for Weighing and Measurement (ISWM)
8: National Conference on Weights and Measures (NCWM)
(Continued on page 33)

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 33

(Continued from page 32)


Now for the big question: Do we recommend the acquisition of this document by those individuals de-
siring to further themselves in the Metrology field? By all means, YES! But keep in mind it is not a
Handbook as its title suggests. It is not a training manual for Calibrators as one could assume. It is more
of text book for the education of the Administrative Metrologist who is destined to be over a broader set
of Metrology related functions than just Calibration alone. We believe that the words “CALIBRATION”
and “HANDBOOK” should be removed from the title as they diminish the true value of this pioneering
effort.

Next question: Do we intend to acquire this document for our own personal library when it becomes
available? By all means, YES! And we say this without knowing what the price will be asked by the
publisher.

Phil A. Painchaud

EDITOR’S NOTE: On Quality Press: http://qualitypress.asq.org/perl/catalog.cgi?item=H1293


Member Price: $48.00 List/Forum-Division Price: $80.00
On Amazon: http://www.amazon.com/o/ASIN/0873897048/ref=pd_rvi_gw_1/002-6401306-8733629
Price: $50.40— See the Quality Press flyer at the end of this edition for a discount notice and coupon.

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 34

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 35

MEASUREMENT QUALITY DIVISION OFFICERS AND COMMITTEE CHAIRS


Chair Joe Simmons Scholarship
Graeme C. Payne Norm Belecki
GK Systems, Inc. 7413 Mill Run Dr
4440 Weston Drive SW, Suite B Derwood, MD 20855-1156
Lilburn, GA 30047 USA Voice (301) 869-4520
Voice: (770) 931-4004 / Fax (866) 887-9344 E-mail: n.belecki@ieee.org
E-mail: Graeme@gksystems.biz

Standards Committee Representative


Chair-Elect Robert M. Graham
Richard D. Roberson Primary AC Standards Lab
10301 Clinkenbeard Rd NE Sandia National Laboratories
Norman, OK 73026 P.O. Box 5800, M.S. 0665
Voice (405) 321-8580 Albuquerque, NM 87185-0665
E-mail: richardroberson@sbcglobal.net Phone: (505) 845-0434
Fax: (505) 844-6096
E-mail: rmgraha@sandia.gov
Secretary, Certification Chair, Website
Manager, NCSL International Representative
Christopher L. Grachanen Examining Chair
Manager, Houston Metrology Group Hewlett- Duane Allen
Packard U. S. Navy
P. O. Box 692000 MS070110 P.O. Box 5000, Code MS11
Houston, TX 77269-2000 Corona, CA 92878-5000
Voice (281) 518-8486 / Fax (281) 518-7275 Voice (909) 273-4783 / Fax (909) 273-4599
E-mail: Chris.Grachanen@hp.com E-mail: duane.allen@navy.mil

Treasurer, Publication Chair, Newsletter Historian


Editor/Publisher, Share Point Administrator Keela Sniadach
Jay L. Bucher Promega Corp.
Bucherview Metrology Services 5445 East Cheryl Parkway
6700 Royal View Dr. Madison, WI 53711
De Forest, WI 53532-2775 Voice (608) 298-4681 / Fax (608) 277-2516
Voice (608) 277-2522 / Fax (608) 846-4269 E-mail: keela.sniadach@promega.com
E-mail: yokota-69@charter.net
jay.bucher@promega.com
ASQ Division Administrator
Ms. Jennifer Admussen, CQIA
Immediate Past Chair, Nominating Chair Voice (800) 248-1946, x7736
Program Chair E-mail: jadmussen@asq.org
Dilip A. Shah
E = mc3 Solutions
197 Great Oaks Trail #130
Wadsworth, Ohio 44281-8215
Voice (330) 328-4400 / Fax (330) 336-3974
E-mail: emc3solu@aol.com, dashah@aol.com

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 36

ASQ MEASUREMENT QUALITY DIVISION REGIONAL COUNCILORS

Regional Councilors represent the Division to members and Sections in their


geographic areas. Regional Councilors are appointed for renewable two-year
terms, and are advisory members of the Division leadership team.
Region 1 (CT, MA, ME, NH, RI, VT) Region 9 (IN, KY, OH)
Mr. Jun Bautista Mr. Ryan Fischer, ASQ CCT
Genzyme Laboratory Accreditation Bureau
Cambridge, MA 02142 New Haven, IN 46774
E-mail: Jun.Bautista@genzyme.com E-mail: rfischer@l-a-b.com

Region 2 (NJ, NY, PA) Region 10 (OH, MI)


Volunteer Opportunity! Volunteer Opportunity!

Region 3 (CT, NJ, NY) Region 11 (NC, SC, TN, VA)


Mr. Eduardo M. Heidelberg Volunteer Opportunity!
Pfizer
Parlin, NJ 08859 Region 12 (IL, MN, ND, SD, WI)
E-mail: eheidelb@yahoo.com
Dr. Donald S. Ermer
Region 4 (Canada) ASQ Fellow; Eugene L. Grant Medal (2001)
University of Wisconsin—Madison
Mr. Alexander T. C. Lau Madison, WI 53706
ExxonMobil E-mail: Ermer@engr.wisc.edu
Whitby, ON L1R 1R1
E-mail: alex.t.lau@exxonmobil.com
Region 13 (CO, IA, KS, MO, NE, SD, WY)
Region 5 (DC, DE, MD, PA, VA) Volunteer Opportunity!
Mr. Richard A. Litts
Litts Quality Technologies Region 14 (AR, LA, NM, OK, TX, part of
Downington, PA 19335 Mexico)
E-mail: info@littsquality.com Mr. R. Keith Bennett
TRANSCAT
Region 6 (AK, CA, HI, ID, MT, OR, UT, WA, Kingwood, TX 77339
WY) E-mail: kbennett@transcat.com
Volunteer Opportunity!
Region 15 (AL, FL, GA, LA, MS, Puerto Rico)
Region 7 (AZ, CA, NV, part of Mexico)
Mr. E. Bryan Miller
Mr. Randy D. Farmer ASQ Fellow
Metrology Solutions Bryan Miller Consulting
Chula Vista, CA 91913 Florence, AL 35633
E-mail: farmerrd2@cox.net E-mail: milleb@mindspring.com
Region 25 (all other countries)
Region 8 (OH, PA) Volunteer Opportunity!
Dilip A. Shah
E = mc3 Solutions
Wadsworth, Ohio 44281-8215E-mail: em-
c3solu@aol.com, dashah@aol.com

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
MQD Page 37

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006
ASQ Southwest Conference
October 14, 2006
Seven Basic Quality Tools: Quality Café Output

Cause and Effect Diagram


9 Use 5 why’s with fishbone (root cause
method)
9 Use “because” instead of “why”
9 Works well with small groups (5-10)
9 Color code branches
9 Use multi-voting and pareto to show results
9 Use “ringer” in team to ask “stupid questions”
9 POEM-People, Organization, Equipment, Manufacturing
9 Gemba-Walk the process
9 Don’t confuse solutions with causes
9 Keeping team focused on the effect of interest
9 Separate controllable from un-controllable
9 Use it for identifying good causes, not just defects or problems
9 Just Do It

Check Sheets
9 Use for data collection
9 Supports the other tools
9 As a Checklist
o To be sure everything is done
o Keep sequence of process – flow chart
o Memory aid
o Audits: ISO9000
9 As a Graphical Checklist
o Give information very quickly
o For small sample sizes
o Visually represents information
9 As a Data Collection Chart
o Very easy to do
o Need to be clear about what you need to collect
o Does not take a lot of training
o Operator or data collector gets distracted-need to be specific

1 of 2
Control Charts
9 People take data personally
o This is a process tool
9 Control limits are calculated
o Based on data
o Not specification limits
9 Used extensively for repeatable processes
9 If process changes, then change control limits by recalculating
9 Identify variation in the process
9 Cycle time tracking
o X-MR
9 Validates a process
9 Visual Tool

Flow Charts
9 Purpose
o Document, simplicity, communication, outlining, decision
making, clarification, gap analysis, team building, continuous
improvement, brainstorming
9 Techniques
o SIPOC, value stream, flow charting symbols, relationship
diagrams, spaghetti diagrams, Post It notes, color coordination,
swim lane, deployment, detailed, process map
9 Tips and Tricks
o Get the right people, food, walk the process, pre-work, pictures,
standardized tool
9 Tools
o Visio, I-graphics, Lean View, EVSM, Pathmaker
9 Benefits
o Team building, standardization, eliminate waste, exposes the hidden
factory, forces you to think, helps understand complexity, creates common
understanding, paints a picture

2 of 2
Histograms
9 Best to use when sequence of x-axis cannot be changed
o Usually numerical
9 Used in combination with others
o Helps show the big picture
9 Sample size is important
9 Defining bin size and number is important
o This impacts the distribution
9 It is a “snap shot”
9 Can be used to compare to customer requirements
9 Data does not need to be normally distributed

Pareto
9 Quick and visual
o Less intimidating
9 It helps organize the data
o 80/20
o Highest to lowest
9 Communication tool
9 De-personalizes data
9 “Slice and dice” many ways
9 Obvious is not always correct
9 Helps focus the problem
9 Good management reporting tool

Scatter Plots
9 Looks for correlation, not cause and effect
9 With lots of variables, find correlation quickly
9 Make sure you plot the right “stuff”
o Don’t plot ice cream sales v. shark attacks
9 Helps you see patterns that don’t show up with other tools
9 Identify outliers, they can “mess things up”
9 Limitations, only 2 variables
9 Practical, graphical, and analytical
9 Used best with regression analysis

3 of 2
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MSC 2007-Facing Pages:MSC 2007-Facing Pages.qxd 11/2/2006 3:35 PM Page 1
BACK FRONT

Apply Metrology...
Rule the World

2007

January 22 ~ 26, 2007


MEASUREMENT
SCIENCE
CONFERENCE
SYMPOSIUM AND WORKSHOP
NIST Seminars on January 22-23
Tutorial Workshops on January 23-24
Technical Program on January 25 - 26

LONG BEACH CONVENTION CENTER


Long Beach, California
http://www.msc-conf.com
MSC 2007-Facing Pages:MSC 2007-Facing Pages.qxd 11/2/2006 3:35 PM Page 2

MSC 2007 PRESIDENT’S MESSAGE 2007 CONFERENCE TIMELINE


In a global economy, it is more important than ever to ensure that a volt measured in
Cairo is the same as a volt measured in Chicago, or that a meter in Berlin is the same as a Monday, January 22, 2007
meter in Brussels. To that end, the theme for the 2007 Measurement Science Conference 7:00 AM - 8:00 AM Continental Breakfast
is: "Apply Metrology…Rule the World". In keeping with the theme, the conference will
7:00 AM - 5:00 PM Registration & Guest Program Ticket Sales
focus on how measurements are made, how they are managed, and how they are audited in
order to support product quality, product maintenance, product safety, and interstate and
8:00 AM - 5:00 PM NIST Seminars
international trade. 10:00 AM - 10:30 AM Morning Break
12:00 PM - 1:00 PM Lunch
Some changes await the attendees of the 2007 MSC. Most notably, after years at the 3:00 PM - 3:30 PM Afternoon Break
Disneyland Hotel, the conference is moving to the Long Beach Convention Center. Unlike 6:00 PM - 7:30 PM NIST Reception
previous years, the Exhibit Hall will open early on Wednesday to give the attendees more
time to browse the booths and talk to our knowledgeable exhibitors about metrology
Tuesday, January 23, 2007
products, services, and technology.
7:00 AM - 8:00 AM Continental Breakfast
So…you ask…why Long Beach? There are a host of fine restaurants, activities, shops, 7:00 AM - 5:00 PM Registration & Guest Program Ticket Sales
and attractions within walking distance. You won't want to miss the Queen Mary…and 8:00 AM - 5:00 PM NIST Seminars
Catalina excursions depart right from Long Beach Harbor. In addition, it is conveniently 8:00 AM - 5:00 PM Tutorial Workshops
located near beaches, amusement parks, museums, and more. Getting to Long Beach is 10:00 AM - 10:30 AM Morning Break
easy, too. LAX, John Wayne, and Long Beach airports are each within a few miles. The 12:00 PM - 1:00 PM Lunch
new venue will provide attendees and their guests with new scenery, new faces, and the
3:00 PM - 3:30 PM Afternoon Break
same standard of quality technical program and quality exhibits that you've come to expect
from MSC.
Wednesday, January 24, 2007
I hope to see you in Long Beach to take part in what may well be 7:00 AM - 8:00 AM Continental Breakfast
the "Greatest Conference in the History of the World!"…the 2007 7:00 AM - 5:30 PM Registration & Guest Program Ticket Sales
Measurement Science Conference. 7:00 AM - 8:00 AM Tutorial Speakers Breakfast
Bob Fritzsche 8:00 AM - 5:00 PM Tutorial Workshops
10:00 AM - 10:30 AM Morning Break
President, MSC 2007 12:00 PM - 8:00 PM Exhibits Open
12:00 PM - 1:00 PM Lunch in Exhibit Hall
WHAT IS MSC? 12:00 PM - 7:00 PM Registration & Guest Program Ticket Sales
3:00 PM - 3:30 PM Afternoon Break in Exhibit Hall
The Measurement Science Conference was founded in 1970 to promote 5:30 PM - 8:00 PM Exhibitors Reception
education and professionalism in measurement science and related disciplines. The
Conference has grown and matured to meet the needs of dynamic measurement Thursday, January 25, 2007
technologies as well as to address pertinent national and global measurement 7:00 AM - 5:00 PM Registration & Guest Program Ticket Sales
issues. Based in California, the MSC has attracted experts from around the world 7:00 AM - 8:00 AM Guest Program Continental Breakfast
as speakers, exhibitors and attendees. 7:00 AM - 8:00 AM Speakers Breakfast
8:00 AM - 9:00 AM Continental Breakfast
MSC 2008 Preview
9:00 AM - 10:00 AM General Session - Keynote Speaker
The 2008 MSC conference will welcome Kara Harmon, Geotest-Marvin 10:00 AM - 5:00 PM Exhibit Hall Open
Test Systems, Inc. as our new president. It will be held at the Disneyland Hotel 10:00 AM - 10:45 AM Morning Break/Continental Breakfast Continued
Convention Center in Anaheim, California from March 10 to 14 2008. 10:45 AM - 12:15 PM Technical Session 1
12:15 PM - 1:50 PM Luncheon / Speaker
2:00 PM - 3:30 PM Technical Session 2
3:30 PM - 4:00 PM Afternoon Break
4:00 PM - 5:30 PM Technical Session 3
8:00 PM - 10:00 PM Presidents Reception
MSC SCHOLARSHIPS
The Measurement Science Conference has an established fund to award scholarships to students
in an Engineering, Science or Quality Assurance degree program. The scholarship program places Friday, January 26, 2007
emphasis on papers or projects that discuss the advancement of measurement science technology.
These scholarships will be awarded to the students at the luncheon on Friday, January 26, 2007.
8:00 AM - 3:00 PM Registration
7:00 AM - 8:00 AM Guest Program Continental Breakfast
Students from participating schools must submit scholarship applications on or before Friday 7:00 AM - 8:00 AM Speakers Breakfast
November 17, 2006 to be eligible for the 2007 MSC Scholarship Awards. An MSC sub-committee
8:00 AM - 8:45 AM Continental Breakfast
evaluates all applications and provides a list of finalists to the MSC Board of Directors. The Board selects
the scholarship recipients from this list of finalists. 9:00 AM - 12:30 PM Exhibit Hall Open
8:30 AM -10:00 AM Technical Session 4
MSC Scholarship Award recipients recognized during the 2006 MSC Conference were from the 10:00 AM - 10:45 AM Morning Break
California State Polytechnic University, Pomona; CSU Long Beach; UC Irvine, CSU Los Angeles,
University of Michigan and CSU Chico. 10:45 AM -12:15 PM Technical Session 5
12:15 PM - 1:50 PM Luncheon / Speaker
If you are interested in more information regarding the MSC Scholarship Program, please contact 2:00 PM - 3:30 PM Technical Session 6
Miguel Cerezo at 805-447-1128 or mcerezo@amgen.com
4:00 PM - 5:00 PM Door Prizes

2 Measurement Science Conference 2007 47


MSC 2007-Facing Pages:MSC 2007-Facing Pages.qxd 11/2/2006 3:35 PM Page 3

Exhibitor Booth Website EXCITING GUESTS PROGRAM


NIST/NVLAP 314 www.nist.gov/nvlap
Northrop Grumman Corporation 109 www.ngc.com INVITE FRIENDS AND FAMILY!

Norvada LLC 515 www.norvadallc.com


NSWC Corona Measurement Science Dept 401 www.corona.navy.mil Long Beach is a happening city! And the convention center is conveniently located
in the heart of downtown. With the free Passport shuttle you can easily explore the
NSWC Corona Product Engineering Dept 403 www.corona.navy.mil
area on your own without a car. To top it off our two custom MSC tours will give your
NSWC Metbench 400 www.corona.navy.mil friends and family an extra special California experience.
Ohm-Labs, Inc. 203 www.ohm-labs.com
Thursday, January 25 9:00 a.m. – 5:00 p.m.
On Time Support, Inc 225 www.ontimesupport.com
One Red X Software, Inc 108 www.1redx.com The spectacular Getty Center Los Angeles is a must see for all ages. The Getty’s
Opto-Cal, Inc 309 www.optocal.com collection of Western art from the Middle Ages to the present is only part of its appeal.
Paroscientific, Inc 215 www.paroscientific.com You can also explore a gorgeous garden descending a stream and climaxing in a flowered
maze. Or take an architectural tour of Richard Meier’s modernist complex. And from
Pond Engineering Laboratories 245 www.pondengineering.com
every corner you can enjoy breathtaking views of Los Angeles and the Pacific Ocean.
Pratt & Whitney 223 www.prattandwhitney.com Then rest with an espresso in one of the elegant patios. It’s like spending a day in an
Primary Standards North America, Inc 140 www.primarystandards.com Italian hilltop town.
RH Systems 344 www.rhsystems.net
Friday, January 26 9:00 a.m. – 1:00 p.m.
Rigol Technologies 533 www.rigolna.com
Rohde & Schwarz Inc. 402 www.rohde-schwarz.com/usa Long Beach has two star attractions and we will see both: The world-class
SanSueB 110 www.sansueb.com
Aquarium of the Pacific and the majestic Queen Mary ocean liner. At the Aquarium we
will take a private “Overview” tour highlighting the marine life of Southern
Sartorius Corporation 230 www.sartorius.com
California/Baja, the Tropical Pacific, and the Northern Pacific. On the Queen Mary we
SIMCO Electronics 436 www.simco.com will take a private “Behind the Scenes” tour focusing on the ship’s luxurious staterooms
Standard Calibration, Inc. 135 www.standardcal.com and Art Deco public salons. Plan on this one for sure!
TAC/Control Systems 415 www.tac-americas.com
Tours are $50.00 per person. A discount of $10 is offered for advance
Technology Resource Center 308 www.trcinc.net
reservations. Contact Pamela Thames at pythames@aol.com or (714) 897-3442.
TEGAM 525 www.tegam.com
Tektronix 435 www.tektronix.com
TestEquity 437 www.testequity.com HOTEL INFORMATION
Thunder Scientific 137 www.thunderscientific.com
The Measurement Science Conference and the management and staff of the Hyatt Regency
Tovey Engineering 505 www.toveyengineering.com
Hotel are pleased to invite you to the 2007 MSC Conference.
Transcat 322 www.transcat.com
The room rates are: Single/Double . . . . . . . . . .$165.00
Troemner 328 www.troemner.com
Triple Occupancy. . . . . . . . $190.00
Universal Label 521 www.ultcalibration.com
The Government Rate is: Single Occupancy. . . . .$110
Vaisala Inc 501 www.vaisala.com
Double Occupancy . . . $135
Veriteq Instruments 335 www.veriteq.com
Triple Occupancy. . . . . $160
Western Environmental 324 www.westernenvironmental.com
WIKA Instrument Company 114 www.wika.com Registration: Phone: (800) 233-1234 (Group reservation)

Wilmington Instrument Company 231 www.calcert.com Hyatt Regency Long Beach


Workplace Training 117 www.wptraining.com 200 South Pine Avenue

Yokogawa Corporation of America 428 www.yokogawa.com Long Beach, CA 90802

SPONSORS Please mention the Hyatt in Long beach and the Measurement Science Conference
American Society for Quality (ASQ) when registering.
ASQ - Measurement Quality Division
A2LA
California State University Dominguez Hills (CSUDH)
Government Industry Data Exchange Program (GIDEP)
IEEE Instrumentation and Measurement Society
International Accreditation Service, Inc.
Instrument Society of America (ISA)
International Society for Weighing and Measuring (ISWM)
International Metrology Organization (IMEKO)
National Association For Proficiency Testing (NAPT)
National Institute of Standards and Technology (NIST)
U.S. Naval Observatory Time Service Dept.
PTTI (Precision Time & Time Interval)
Califomia State University Long Beach (CSULB)
National Conference of Standards Laboratories (NCSL)
San Diego Biometrology Society
Community College of Aurora
National Cooperation for Laboratory Accreditation (NACLA)
Navy Metrology and Calibration Program
Air Force Metrology and Calibration Program
Army Primary Standard Laboratory
Association of Measurement Professionals(AMP)

46 3
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2007 NIST SEMINARS Photography Services Available During 2007 MSC


MONDAY-TUESDAY, JANUARY 22-23, 2007 The Official Photographer of the 2007 Measurement Science Conference, Ms Marie Roberts, will be
available during the conference to take custom photos of exhibitors, individuals, families, business groups,
N02 - NIST Pressure and Vacuum Measurement etc. in addition to her regular duties of photographing the conference.
The photos will be digital and will be delivered during the conference in the form of a picture CD.

Instructors: Jay H. Hendricks and Patrick J. Abbott Photos of exhibitors booths and exhibitors personnel ( Business Photos) will cost $65 for up to 5
images on the CD.
NIST Pressure and Vacuum Group
Photos of individuals, small groups, families etc. (Personal Photos) will cost $20 for up to 3 images on
the CD.
Making good pressure measurements from ultra-high vacuum to All picture CD’s will be delivered during the conference.
atmospheric pressure requires the correct use of many kinds of gauges. Please contact Marie during the conference or make advanced arrangements by e-mail at
Among the most widely used are ionization gauges, spinning rotor gauges, marie@marieroberts.com or phone at 714 505 2277
thermal conductivity gauges, capacitance diaphragm gauges, quartz bourdon
MSC 2007 EXHIBITORS
tube gauges, and resonant silicon gauges. However, the incorrect use of any
of these gauges can result in bad measurements that cost time and money. Exhibitor Booth Website
Accu Cal Incorporated 406 www.accucal.com
This two-day course will cover the fundamentals of pressure Accurate Instrument Repair 320 www.air-cal.com
measurements from 10-8 Pa to 10+5 Pa (10-10 to 10+3 torr), focusing on the
Advanced Test Equipment 306 www.atecorp.com
selection and proper use of appropriate gauging technology for a given
Agilent Technologies 313 www.agilent.com
application. A survey of calibration techniques will be presented along with
recommendations for obtaining best performance. A small vacuum system A.K.O. 116 www.akotorque.com
will be set up for a live demonstration of some of the gauges discussed in the Ametek, Inc. 447 www.ametek.com
course. Attendees are invited to share their own pressure measurement Andeen - Hagerling, Inc. 514 www.andeen-hagerling.com
problems for in-class discussion. ARTEL 331 www.artel-usa.com

For further information, contact Jay Hendricks at (301) 975-4836, Ashcroft, Inc 228 www.ashcroftinc.com
jay.hendricks@nist.gov or Patrick Abbott at (301) 975-4838, AssetSmart 307 www.assetsmart.com
Patrick.abbott@nist.gov. Bios International Corporation 208 www.biosint.com
Colorado Engineering 234 www.ceesi.com
Condec 221 www.4condec.com
N03 - NIST Fluid Flow Measurement
Crystal Engineering 440 www.crystalengineering.net
CSC 413 www.csc.com
Instructor:G. E. Mattingly, NIST Senior Scientist Data Proof 216 www.dataproof.com
for Fluid Flow Measurement (Retired) Davis Inotek Instruments LLC 303 www.davis.com
T. Kegel, Senior Staff Engineer, CEESI, Nunn, CO DH Instruments 144 www.dhinstruments.com
Edison 213 www.edisonmudcats.com
Flow Dynamics 212 www.flow-dynamics.com
This seminar will present the basic concepts of flow measurement for
Fluke Corporation 319 www.calibration.fluke.com
liquids and gases. The focus will be on practical metering aspects with
emphasis on how to make satisfactory fluid quantity and flow rate Gauge Repair Services 129 www.gaugerepairservice.com
measurements. It will cover flow measurement terminology and standards, GE Infrastructure Sensor 337 www.ge.com
basic metering principles and descriptions, and practical examples and GIDEP 409 www.gidep.org
applications. Wide ranges of fluid conditions and flow metering situations Guildline Instruments Limited 429 www.guildlineUSA.com
and techniques will be described and discussed with results of specific Gulf Calibration Services Inc. 412 www.gcscalibration.com
applications. Special emphasis is made for meters installed where flow meter Hart Scientific 319 www.hartscientific.com
installation conditions are "non-ideal". Additionally, flow meter calibration IET Labs Inc. 329 www.ietlabs.com
concepts and techniques - especially the practical aspects - will be presented
Indy Soft 302 www.indysoft.com
so that flow meter users are informed and knowledgeable about how to
Insco 229 www.insco.us
establish and maintain satisfactory systems for fluid quantity and flow rate
measurement. The flow laboratory accreditation process and procedures Interface Inc 210 www.interfaceforce.com
will also be presented so that the advantages of this important aspect of flow International Radiation Detectors, Inc. 431 www.ird-inc.com
measurement are understood, with the many benefits as well as the Isotech North America 434 www.isotechna.com
associated efforts and costs. Kaymont Consolidated Industries 408 www.optonline.net
For further information, contact G. E. Mattingly at 301.975.5939, King Nutronics Corporation 209 www.kingnutronics.com
gmattingly@nist.gov, or T. Kegel at Lambda Americas 230 www.lambda-emi.com

970.897.2711, tkegel@CEESI.com. Lockheed Martin Technical Operations 207 www.lockheed.com


Masy Systems, Inc. 201 www.masy.com
Measurement International, Inc 219 www.mintl.com
Mensor Corporation 112 www.mensor.com
Mettler Toledo 301 www.mt.com
Navy Primary Standards Lab 407 www.navy.mil

4 See Hall Layout Map in Back of Centerfold 45


Measurement Science Conference 2007
MSC 2007-Facing Pages:MSC 2007-Facing Pages.qxd 11/2/2006 3:35 PM Page 5

MSC 2007 ORGANIZATION


N04 - Hands-on Workshop on Estimating and Reporting
BOARD OF DIRECTORS Measurement Uncertainty
Chairman of the Board Board Secretary
John Fishell John Schulz
NSWC Corona Division Consultant Instructors: Will Guthrie, Hung-kung Liu
john.fishell@navy.mil jcsgunner@aol.com
NIST Statistical Engineering Division
President Director This workshop on uncertainty estimation will describe the statistical
Bob Fritzsche John Bowman
framework and methods needed to develop uncertainty statements based
NSWC Corona Division Fluke Corporation
robert.fritzsche@navy.mil john.bowman@fluke.com on the “ISO Guide to the Expression of Uncertainty in Measurement”.
Methods for uncertainty estimation will be illustrated with many practical
Executive VP Director examples from different metrological areas. The workshop will also
Kara Harmon Miguel Cerezo
include hands-on examples to be analyzed by the participants. The hands-
Geotest-Marvin Test Systems Inc. Amgen
karah@geotestinc.com mcerezo@amgen.com on examples will be done using propagation of uncertainty formulas, the
Kragten spreadsheet, an easy-to-use computational tool for propagation
Board Treasurer Director, Alternate of uncertainty, and other open-source uncertainty calculators.
Alan Ho Nidal Kerdiya
The Boeing Company eDoc Publish, Inc. Pre-requisites:
alan.f.ho@boeing.com nidalk@dvd17.com
1. Laptop computers with Microsoft Excel are required to do the
CONFERENCE COMMITTEE hands-on exercises. Participants who have access to a laptop should bring
Publications Registration NIST Liaison one. Some extra laptops are also available for those who cannot bring
Robert Johnson Cindy Becker Georgia Harris their own. Please contact the instructors in advance if you will need a
NSWC Corona Division NSWC Corona Division NIST laptop.
robert.t.johnson@navy.mil cynthia.becker1@navy.mil gharris@nist.gov
2. Participants should have some experience with the use of Microsoft
Public Relations Programs Exhibits Assistant Excel for the analysis of data. As part of the hands-on exercises, it will be
Troy Clarke Mark Kaufman Tony Ambrose
CSC NSWC Corona Division Tektronix
necessary for participants to be able to copy and paste spreadsheet
tclarke@cscnorco.com mark.kaufman@navy.mil tony.ambrose@tek.com contents and to enter simple formulas. Advanced knowledge of Excel is
not required.
Secretary Door Prizes Logistics
Chris Contreras Larry Yates Rey Cheesman For additional technical information, contact
NSWC Corona Division Acumen Strategies NSWC Corona Divison
christopher.contreras@navy.mil larryy2002@aol.com rey.cheesman@navy.mil
Will Guthrie at (301) 975-2854, willguthrie@nist.gov.

Tutorials/NIST Seminars Awards Program Assistant


Arman Hovakemian Nidal Kerdiya Patricia Leyva
NSWC Corona Division eDoc Publish, Inc. NAVAIR North Island
arman.hovakemian@navy.mil nidalk@dvd17.com patricia.leyva@navy.mil

Speakers Committee Support Marketing


Bob Everly Doug Sugg Tim Mason
CSC NSWC Corona Division Edison
beverly@cscnorco.com douglas.sugg@navy.mil tim.mason@sce.com

Arrangements Evaluation NIST Liaison


Frank Mendoza Chet Franklin Val Miller
The Boeing Company CSC NIST
frank.g.mendoza@boeing.com cfranklin@cscnorco.com val.miller@nist.gov

Exhibits Scholarships/NCSLi Liaison Site Selection


Kara Harmon Miguel Cerezo Chet Crane
Geotest-Marvin Test Systems Inc. Amgen eDOC Publish Inc
karah@geotestinc.com mcerezo@amgen.com chetc@dvd17.com

Finance e-Commerce, Intranet Committee Administrator


Alan Ho Richard Schumacher Diana Poulton
The Boeing Company NSWC Corona Division NSWC Corona Division
alan.f.ho@boeing.com richard.schumacher@navy.mil diana.poulton@navy.mil

Publicity Guest Programs Education


John Schulz Pamela Thames Jeff Sedor
Consultant Consultant B Braun Medical
jcsgunner@aol.com pythames@aol.com jeffrey.sedor@bbraun.com

Registration A/V, Meetings, Special Sponsors


John Bowman Events John Fishell
Fluke Corporation Karen Jackson NSWC Corona Division
john.bowman@fluke.com GIDEP john.fishell@navy.mil
kjackson@gidep.org

44 5
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MSC 2007 TUTORIAL WORKSHOPS


The upper and lower dynamic control limit, µ ± 2 , were calculated from the
The 2007 MSC will host the following Tutorial Workshops. Tutorial Workshops are updated mean and standard deviation, µ and , based on the repeat measurements of
either full day or half day, offered same day in the morning and afternoon or only in the a check standard, and were compared with the fixed control limit, y ± CL (Control
morning. Tutorial Workshops will begin on Tuesday, January 23, 2007 and end on Limit), calculated from the uncertainty budget of the check standard. If the dynamic
Wednesday, January 24, 2007. control limit is close to the fixed control limit, then, the reproducibility tests of the
check standard support the estimated uncertainty of measurement. Otherwise, the
TUESDAY, JANUARY 23rd TUTORIAL WORKSHOPS uncertainty of measurement might be either over- or under-estimated, and might
need to be revised.
WORKSHOP P (AM Only):
Optical Detectors and Laser Measurements
Instructors: Marla Dowell and John Lehman Uncertainty II
Courtesy of NIST Optoelectronics Division
10:45 – Friday, January 26
Abstract: Optical detectors constantly evolve with the implementation Session Developer: Sharon N. Nicholas, NSWC Corona,
of new materials and fabrication techniques that are intended to enhance the sharon.nicholas@navy.mil
performance and reduce the cost of existing detector types. Optical detectors
Merits and Limitations of ISO-GUM and Draft GUM Supplement 1 Using
are often written about and explained with jargon that obstructs a Simple Linear Calibration for Illustration
comprehensive understanding of the many and varied detector types. For
Raghu Kacker, NIST
example, a detector is often informally referred to be the material from which
it is made, such as a "germanium detector", or the principal upon which it We will discuss the merits and limitations of the International Organization for
operates, such as a "photodiode", or the primary use, such as an "IR detector" Standardization (ISO) Guide to the Expression of Uncertainty in Measurement
(GUM) and the draft GUM Supplement 1 for evaluating and expressing uncertainty in
or "fast pulse detector". Despite the obviously different meanings of each of
measurement. We use a measurement equation for simple linear calibration as an
these detector types, the names may simply refer to the same physical device. illustration. It includes both Type A and Type B input variables. We consider three
In this workshop, we will present an introduction to optical detectors, discuss scenarios: (i) the measurement equation is linear with one Type B input variable
calibration of optical detectors for laser measurements, and describe national having a normal distribution, (ii) the measurement equation is non-linear with two
traceability for calibration of optical detectors for laser power and energy Type B input variables each having a normal distribution, and (iii) the measurement
measurements. equation is non-linear with two Type B input variables each having a rectangular
distribution. We consider both small and large uncertainties for the Type B input
Tutorial Objectives:
variables. In each case, we use Bayesian statistics for the Type A evaluations. This
1.Introduction to optical detectors for laser measurements discussion is based on a recent paper, Comparison of ISO-GUM, draft GUM
2.Describe calibration of optical detectors for laser measurements Supplement 1, and Bayesian statistics using simple linear calibration, published in
3.Describe national traceability for calibration of optical detectors Metrologia, (2006).

for laser measurements The Student’s t-Distribution Uncovered


4.Describe basic detector properties and operation James Jenkins, QUAMETEC
5.Provide a short informal quiz Today computers have allowed us to do things our predecessors could only dream
For more information, contact Marla Dowell 303.497.7455, about. When W.S. Gosset published the derivation of the t-distribution in 1908, he
marla.dowell@nist.gov, or John Lehman 303.497.3654, john.lehman@nist.gov. did not have the luxury of testing his theories with a computer. Gosset specialized in
developing an approach for estimating sigma when using small sample sets. Today in
measurement science with the requirement of measurement uncertainty estimation,
WORKSHOP Q (Full-Day):
we too are seeking sigma with small sample sets. This paper examines the results of
Accreditation: Challenges and Solutions estimating sigma using the normal distribution and the Student’s t-distribution as per
IInstructor: Hershal Brewer ISO GUM Method. Analysis data is based on results obtained using Monte Carlo
Courtesy of International Accreditation Service (IAS) experiments involving large populations of data, in which the population distribution
Abstract: Accreditation for laboratories is on the increase, and understanding the is qualified as “normal” and the sigma and mean values are reliably known.
challenges and standard involved in accreditation is crucial. This workshop will address Experimental standard deviations are computed thousands of times using various
common issues encountered by laboratories seeking accreditation. These issues include: methods. The results from these trials are considered surprising as least. The
supporting Excel workbook contains calculations involving over 100,000 open
The scope of accreditation
functions and formulas that will be made available to all interested parties for review.
Measurement uncertainties Author recommends a 3GHZ processor or better be used to run macros.
Traceability
Balancing Risk to Minimize Testing Costs
Proficiency testing for laboratories
Mark Kuster, Pantex Metrology
Management review and internal audit
Product quality and safety testing costs money. Costs include purchasing and
Personnel qualification
maintaining test equipment (TE), rejecting good product, accepting bad product, and
Records resolving OOT notifications from calibration laboratories. Given the trade-offs
Computer systems and software between TE accuracy and its life cycle costs and the costs of bad test decisions, what
is the best way to apply limited resources? What are the risks, what uncertainties are
Sub-contracting and purchasing
required, and what is the optimum reliability target and calibration interval? Which is
Customer complaints and corrective action more cost effective: Higher reliability targets or more accurate equipment? What
Reporting calibration results are the relative impacts on safety and quality of errors in the cal lab and the
Marketing the accredited laboratory
production floor? This paper applies basic risk, uncertainty, and interval analysis to
help address these questions.
General criteria for selecting the accrediting body (AB)

For more information, contact Hershal C. Brewer at


(562) 699-0541 ext. 3309 or hbrewer@iasonline.org

6 Measurement Science Conference 2007 43


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Lean Manufacturing is a systematic approach to identifying and eliminating waste. WORKSHOP R (Full Day):
Normally associated with manufacturing processes, the concepts lend themselves
Analytical Chemistry for Metrologists
well to service based processes as well, including calibration.
Instructor: Jerry D. Messman
Implementing the lean manufacturing approach will improve the overall
performance of a calibration laboratory. Overall performance includes the turn Courtesy of Stranaska LLC
around time, quality of work, and profitability.

Uncertainty I Abstract: Designed as an introductory tutorial on selected topics of


analytical chemistry, this workshop is intended for metrologists and
8:30 – Friday, January 26 calibration specialists who have no formal background or educational training
Session Developer: Don Felt, Amgen in analytical chemistry. It is not a tutorial per se on the calibration and
Consumer Risk-Based Attribute Gage Design and Build qualification of analytical instruments.
Ricardo Nicholas, Boeing Analytical measuring instruments (e.g., spectrometers,
chromatographs, electrochemical analyzers, etc), and the analytical
Measurement uncertainty is predominantly evaluated for bilateral or unilateral techniques and methodologies for which they are used, are based on
measurements. One example might be the measurement of an internal thread ring
appropriate fundamental principles of analytical chemistry and applied
pitch diameter based on variables data. There is also a need to evaluate the
measurement uncertainty of pitch diameter Go Gages and Not Go Gages, based on physics. Building scientific defensibility, confidence, and credibility into the
attribute data. These types of gages will here be referred to as Attribute Gages. science-based calibration and performance evaluation of these instruments,
There are two application categories for risk-based attribute gaging. One is intended relative to the analytical methods for which they are used, requires a
to optimize the design of the gage to achieve the target consumer risk, and the other working knowledge of analytical chemistry.
is to evaluate a preexisting design to verify that the target consumer risk has not been Although it is taught from an academic perspective, this tutorial
exceeded. These two categories will be referred to as Attribute Gage as Designed
workshop includes practical ramifications of the theory and concepts
and Attribute Gage as Built. The respective uncertainty evaluations are not
equivalent.
relevant to many of the analytical measurement techniques which
metrologists may encounter in their workplace. The instructive goal here is
Included are two determinations of the acceptability of a product’s internal thread, to empower the metrologist with an awareness and sufficient insight into the
for each of the two application categories, when each pitch diameter measurement is basics of analytical chemistry. The intended workshop outcome will
to be made with a Go Thread Plug Gage.
facilitate an efficient and cost-effective approach to analytical calibration
k=3.9… Why Not? projects through an improvement in scientific communications and technical
Howard Zion, Transcat, Inc. interactions with analytical laboratory managers, scientists, technicians, and
instrument operators.
This paper will begin with an elementary review of the differences between TAR
and TUR, underscoring the reasons for ISO-17025 and the GUM. In the discussion Workshop participants will acquire a basic introduction to the
on TUR, a demonstration of the application of k=2 will be presented with respect to terminology, simplified theory (minimum of equations and math), and
the UUT’s tolerance. concepts of selected topics in analytical chemistry. Such knowledge forms
Previous Metrology papers discussing ‘Indeterminate’ calibration results will be the backbone of the underlying principles and distinctions for scientific
addressed and quantified, illustrating the probability that a reading may indeed be out approaches to sample and standard preparation, sample presentation,
of tolerance (OOT). When attempting to determine this probability using k=2 for analysis, and calibration/qualification in analytical measurement techniques.
the reporting of a TUR, a problem arises if the entire area under the Normal Interactive class exercises include problem-solving examples of analytical
Probability Density Function is not considered. The result is a misrepresentation of chemistry in practice.Selected workshop topics include:
the OOT probability.
Analytical data reporting – decimal places, significant figures
This will lead to the concept that, although k=2 is a good reporting format for the
Mole concept – Avogadro’s Number, SI traceability
uncertainty of a measurement, TURs should be standardized using k=3.9. It is the
author’s hope that this will spark discussion that will take the Metrology industry to Solution concentration units (e.g., molarity, normality, etc)
the next step in tackling this ‘Indeterminate’ area. Chemical nomenclature, laws, equations, balancing rules
Verifying Measurement Uncertainty Using a Control Chart with Dynamic Atomic structure - isotopes, oxidation (valence) states, ionization
Control Limit
Energy Levels – Electronic, vibrational
John Song, NIST
Atomic and molecular weights, gravimetric factors
Reporting uncertainty of measurement is usually the last, but not least, step in a
Chemical bonding - covalent, ionic, hydrogen
measurement procedure. It is a time consuming process, and mistakes leading to
either over- or under-estimated uncertainties might happen. A control chart with a Acid-base theory - equilibria, dissociation, solubility, buffers, pH
dynamic control limit can be used for promoting the process of developing an Redox potentials
uncertainty budget, and verifying the developed measurement uncertainties. In the
Surface and Microform Metrology Group of the Precision Engineering Division at Isomerization, polarization, chirality, speciation
NIST, a standardized procedure was developed in the early of 1990s for reporting Analytical measurement techniques
uncertainty of measurements for NIST surface roughness and step height
Optical spectroscopy – atomic, molecular
calibrations. A set of check standards covering a range of step heights from 0.02937
µm to 22.90 µm and a range of roughness from 0.3 µm to 3 µm Ra was repeatedly Separations – chromatography (gas, liquid, ion)
measured for measurement quality control. These historical measurement data Electrochemistry
included control limits established by various measurements and model calculations.
As an alternative approach, we have recently developed a control chart with a Mass Spectrometry
dynamic control limit and analyzed the historical measurement data using the
dynamic control limit. The results of this new analysis support the uncertainty For additional information on this tutorial workshop, please contact
procedure and provide useful information for future revision of the uncertainty
Jerry Messman
procedure.
at (970) 282-3840 or Jerrym@stranaska.com

42 Measurement Science Conference 2007 7


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WORKSHOP S (AM Only): Session 3F: Lean/Six Sigma

Improving your organization through Proficiency Testing 4:00 – Thursday, January 25


Instructor: Jeff C. Gust Session Developer: Ed Corpuz, NSWC Corona, eduardo.corpuz@navy.mil
Courtesy of Quametec Proficiency Testing Services Applying the Theory of Constraints in a Production Calibration Environment
Dean S. Williams, Duke Energy Corporation
Proficiency testing is an objective means of determining laboratory The Theory of Constraints (TOC) as developed and presented by Dr. Eliyahu
competency. Employing a sound proficiency test program for your Goldratt in his best selling book, “The Goal”, has direct applicability to production
laboratory is a proactive means to improve all aspects of laboratory activities in calibration laboratories, metrology support organizations, and measuring
activities. This tutorial will cover topics such as understanding the quality and test equipment manufacturing environments.
requirements associated with proficiency testing; philosophy of proficiency TOC is based on focusing on production from an overall system approach rather
test design; establishing a reference value for a proficiency test; estimating than local optimization of individual aspects of the production environment. Starting
uncertainty for a proficiency test; analyzing results and interpreting the with the development and clear statement of the organization’s goal, the principles of
proficiency test report from a user prospective. Real (anonymous) data will TOC can be applied to quickly and systematically removing barriers that keep an
be presented for analysis by the workshop participants in order to organization from fully achieving its potential.
understand common laboratory errors that were discovered through Using the example of a chain of many links (the production system), TOC focuses
proficiency testing. on identifying and strengthening the weakest link as the optimum method for
For more information, contact Jeff Gust, (260) 244-7450 or improving the productivity of the overall system. Through a 5-step process, the
weakest link (or constraint, or bottleneck in production) is addressed in a way that
gust@quametec-pt.com
optimizes the overall effectiveness of the system.
The Duke Energy Standards Lab, which is an internal corporate calibration facility,
WORKSHOP T:
is tasked with providing its customers with calibrated measuring and test equipment
Temperature and metrology services to support plant maintenance and testing activities. With
dozens of customer groups and over 12,000 calibrations to perform each year through
Presenters: Ron Ainsworth / Tom Wiandt 10 lab areas, the Standards Lab often faced production challenges as evidenced by
periodic backlogs and less than optimum turn times. To better meet its goal of
ensuring that the right measurement resource was in the right place at the right time,
Abstract: This presentation is a review of the fundamentals of
the Standards Lab applied TOC to the production calibration laboratory
temperature calibration. Topics include calibration equipment, calibration environment.
techniques, curve fitting issues, and the mathematics important to
thermometry. Types of thermometers covered include platinum resistance This paper presents the step by step process the Standards Lab went through to
identify and eliminate constraints and improve its overall support of its customers.
thermometers, thermistors, thermocouples, and combined
The Standards Lab started by clearly defining its overall goal and worked to obtain
thermometer/readout systems. This segment is intended for those who are
buy in from internal and external stakeholders. With the goal established, it used
new to temperature calibration, those who need to validate what they techniques of TOC to identify the weakest link in its production process and took
already know, or those who just have some nagging questions that need to steps to eliminate that constraint. This resulted in a reduction of backlog,
be answered. improvement of turn times and an overall reduction in the stress and frustration levels
within various functions in the organization.
WORKSHOP U: As part of implementing TOC the Standards Lab was able to identify, in addition
to the limiting constraint, other processes and activities, which when viewed from an
Power Quality overall production system perspective had been locally optimized instead of being
aligned to best meet the system objectives. By addressing these misalignments the
Standards Lab made additional gains in meeting its goal.
WEDNESDAY, JANUARY 24th TUTORIAL WORKSHOPS
Finally, the paper presents lessons learned from applying TOC to a calibration
production environment as well as a valuable lesson on the affects of multi-tasking
WORKSHOP A: learned from critical chain project management, an outgrowth of the logical thinking
processes originally defined in TOC.
Gas Flow Calibration and Uncertainties Using molbloc/molbox
Implementing Measurement Uncertainty and Reliability Into Your Business
Instructors: Larry Renda and Greg Secord
William B. Miller, Lockheed Martin
Courtesy of: DH Instruments, Inc.
A process improvement team was established to research measurement reliability
requirements, review past lessons learned, and suggest possible options in order to
Abstract: This tutorial covers the principles and operation of the DHI implement the best suggestion for a long term, measurement assurance solution to
molbloc/molbox system. The focus is on the practical application of uncertainty analysis and reliability. Technical vendor audits, internal evaluations,
increased outsourcing, and ISO standards in place of Military standards have given
molbloc/molbox to perform a variety of typical calibration and measurement rise to a universal concern to improve the measurement assurance processes. Topics
tasks and the determination of the associated uncertainties. Participants will include measurement assurance process flow, cost, timelines, training,
learn techniques for test setup, execution, and data collection, supported by documentation, implementation results, and uncertainty analysis. The results of the
example calibration setups with actual measurement hardware. The course research, implementation results and future plans will be presented.
also includes a review of the fundamentals of mass flow measurement, the Calibration on a Diet: Implementing Lean Manufacturing in a Calibration
operating theory of molbloc/molbox, the determination of uncertainty Laboratory
budgets, and DHI's calibration methods. Timothy Francis, GE Sensing
As management of a service operation, we are always looking for ways to reduce
the turn-a-round time for the customer, increase profitability for the organization, and
For additional information on this Tutorial Workshop, please contact maintain a high quality level in our service. This paper deals with using a
Larry Renda at LRenda@dhinstruments.com. manufacturing tool for identifying and eliminating waste in the Calibration
Laboratory.
8 Measurement Science Conference 2007 41
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Transformation of a Military Calibration Organization to a Modern and WORKSHOP C:


Economic Service Provider
LtCol Gerhard Mihm, German Armed Forces Calibration Service Stopwatch and Timer Calibrations
IInstructor: Robert Graham
With the current cost cuts taking place in the military and the resulting need for
cooperation in military operations, calibration requirements need to be considered Courtesy of: Sandia National Laboratories
too. With the increasing number of measurement equipment and its requirements on Abstract: This course will cover the basics of calibrating
one side, and all the present cost cuts and reduction of personnel on the other side, a
new modern and somehow independent system had to be created. stopwatches and timers, using NIST Special Publication 960-12,
Stopwatch and Timer Calibrations, as a reference (copies of which will be
This presentation identifies the situation - starting with a classic organization
running about 20 laboratories nation-wide in Germany, in the continental U.S., and a provided to the students). Topics to be covered include:
number of mobile labs - and its development in a transformation process to a modern Introduction to stopwatch and timer calibrations
and economic organization. It shows which tools were used to identify a large
companies’ calibration needs, and how and where the centralizing of calibration Descriptions of the timing devices that need calibration and why
abilities and capabilities can be helpful and effective - and where they are not. Interpreting manufacturer’s specifications
This presentation will give hints for especially large organizations’ or companies’
calibration systems to become more effective providing adequate services on a more
Various calibration methods and the standards required
economic/affordable scale. Practice sessions in the different methods
Managing the Changing Corporation Determining uncertainty budgets and the calculations needed for
Chet Franklin, CSC, cfranklin@cscnorco.com each method
One of our biggest challenges for any manager is dealing with change. It happens
to all of us, the only difference being in the magnitude of the change. As a manager
you have two choices: 1) You can react to the changes as they happen – sometimes Questions about this class can be directed to Robert Graham at
called “Fire Fighting”, or “Dodging the Bullet”; or 2) You can manage the responses rmgraha@sandia.gov.
to the change and affect the impact on your organization.
You can manage the change or let it manage you! Some of the influence factors WORKSHOP D:
to consider are: Organizational Culture; Tradition; Status Quo; Tribal Knowledge;
and Values; to name a few. Many people consider changes to be threatening and they Humidity Measurement Tutorial
often resist. Some people resist changes more vigorously than others. The manager
must recognize and deal with both active and passive resistance to change. Instructor: Ken Soleyn
Courtesy of: GE Infrastructure Sensing
Business Processes
2:00 – Thursday, January 25 Abstract:The Humidity Measurement Tutorial provides
Building the Business Case for a True Enterprise Calibration Management metrologist, engineers and technicians as well as those specifying and
Application operating metrology, process, and building automation instruments and
Brian E. Thompson, AssetSmart controls with an overview of humidity measurement and instrumentation
The term “enterprise” has many connotations, especially when defining an fundamentals. Humidity control is a very important parameter for
“enterprise” calibration management software application. Today it is common to energy management, process control, product testing and process
learn of “Common System” metrology committees embarking on evaluating validation of various parameters such as heat transfer, dimensional
enterprise solutions for their organizations. The reason is because most organizations
are now able to cost effectively deploy an enterprise system using a web-based user stability, emissions control and power management, yet the science of
interface for all laboratory sites and divisions as it allows easy access from anywhere humidity measurement is often very difficult to understand. The
in the world as long as the user has access to a standard web browser. It is important emphasis is placed on providing insight into the design and calibration of
to not be fooled by “pseudo enterprise” systems that may only offer “stale” reports
that have been posted to a website possibly weeks ago or offer limited web
humidity and trace moisture instrumentation. The workshop includes
functionality like only being able to change the location or custodian of an asset. A discussions of various humidity measurement technologies. A CD-Rom
true enterprise calibration solution will offer ALL functionality via the web in real- with humidity parameter conversion software and technical papers on the
time, ensuring authorized persons will always have access to CURRENT information subject is provided subject.
at all times. Below are other characteristics and the value a “true enterprise”
calibration software application offers in building the business case to evaluate current For additional information on this workshop, please contact Ken
technology: Soleyn at (978) 437-1000 Ext. 1924, or ken.soleyn@ge.com.
• ONE single software installation for total metrology visibility
• Eliminate fragmented “silo” systems
• Improvements to Business and Operational Processes
• Compliance Assurance
• Standard Connectivity to Other Applications
• Internal IT Cost Savings
• Savings Associated with Eliminating Legacy Systems
Six Thinking Hats
Anthony Griffin, Teamworks
Participants will be introduced to the specific Parallel Thinking skills and tools of
Dr. Edward de Bono's Six Thinking Hats®, how Parallel Thinking differs from
traditional thinking, and how it (i.e., Six Thinking Hats) can be immediately applied to
measurement problems, team decision-making, change management issues, problem-
solving, and meeting management.

40 9
Measurement Science Conference 2007
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WORKSHOP E: There are many low-cost solutions to these problems. Powering EMO circuits
from 24 V d.c. instead of 24 V a.c.; de-rating power supplies or choosing SEMI F47
Very Low Pressure Calibration certified power supplies; inserting time delays; or just a small software changes might
Instructors: Mike Bair and Karl Kurtz help to solve a problem. Yet another common equipment failure mechanism involves
Courtesy of: DH Instruments, Inc. some obscure sequence of events. For example, a voltage sag is applied to the
equipment and its main contactor opens with a bang. But further investigation
Abstract: This workshop focuses on the special challenges of very reveals that a small relay connected in series with the main contactor coil actually
low gauge and differential pressure calibration. Though specific to low opened because it received an open relay contact from a stray water sensor. That
sensor, in turn, opened because its small 24 Vd.c. supply output dropped to 18V
pressure, topics range from the fundamental concepts of pressure during the voltage sag. (In this case, the solution is an inexpensive bulk capacitor
measurements to the practical issues encountered in hardware setups, across the 24 Vdc supply.)
data acquisition, and the measurement process, and can be applied to
SEMI F47-0200 is going at the moment through its 5-year revision and update
many other types of pressure measurements. The measurement cycle and will be harmonized with IEC 61000-4-34, which is the respective
influences and uncertainties that dominate at very low pressure are international Voltage Sag Immunity standard.
analyzed. Participants experience hands-on measurement exercises
illustrating the points discussed.
Committee for Equipment Specifications (A panel discussion)

For additional information on this workshop, please contact: 10:45 – Thursday, January 25

Karl Kurtz at (602) 431-9100 Ext, 203, kkurz@dhinstruments.com, Panel Moderator: Charlie Motzko, C.A. Motzko & Associates

or Michael Bair,at ( 602).431-9400 Ext. 234,


NSCLI RP-12 Determining and Reporting Measurement Uncertainties (A panel
mbair@dhinstruments.com. discussion)

WORKSHOP F: 2:00 – Thursday, January 25


Panel Moderator: Suzanne Castrup, Integrated Sciences Group
Elements of a Quality Laboratory
Instructor: Suzi Wesch
Courtesy of: Suzi Wesch RP-1 Calibration Intervals (A panel discussion)
Abstract:This course discusses issues in creating a balance between 4:00 – Thursday, January 25
science and quality for organizations. In today’s competitive business
environment, meeting requirements of regulations and statutory is Panel Moderator: Donald W. Wyatt, Diversified Data Systems, Inc.
difficult.
Test Equipment Management, Business Solutions for Efficient M&TE
This course presents basic concepts of quality based on compliance
Management (A panel discussion)
and voluntary activities that can improve management of the laboratory.
The course is designed for individuals, such as laboratory supervisors, 8:30 – Friday, January 26
group leaders, and project leaders who want to have a better Panel Moderator: James E. Smith, Boeing
understanding of the basics for balancing science and quality in a
laboratory.
ANSI Z540.3 Handbook (A panel discussion)
For additional information, please contact Suzi Wesch at
10:45 – Friday, January 26
swesch@verizon.net.
Panel Moderator: Chet Franklin, CSC, cfranklin@cscnorco.com
WORKSHOP G:
Education (A panel discussion)
Microwave Power Calibation
2:00 – Friday, January 26
Instructors: Andy Brush, CEO, TEGAM Inc.
Panel Moderator:
Mike Eckart, Senior Applications Engineer, TEGAM Inc.
Managing Change
Robert Kilgore, Chief Metrologist, Northrop Grumman SureCAL
10:45 – Thursday, January 25
Courtesy of Tegam Inc., Northrop Grumman
Session Developer: Chet Franklin, CSC, cfranklin@cscnorco.com

Abstract:The Microwave Power Calibration Workshop will present Anticipating and Embracing Change
practical topics relating to effective transfer of calibration in microwave Dr. Carroll Brickenkamp, The Pi Group, Inc.
power sensors. The construction and characterization of microwave We might be more comfortable with change if we could anticipate it rather than
standards will be covered, with a brief on the sources of error in typical react to it. But how is this possible, since no one can know the future? We will
primary standards. The methodologies for transferring between explore one process that has proven its worth many times, called scenario planning.
This process will provide not just directions of change, but best- and worse-case
standards, with discussion of sources of error will be presented in depth, scenarios against which an organization can evaluate its abilities to cope if the future
with examples. Different types of power sensors and methods for leans towards any combination of the scenarios. We will provide an outline for this
calibrating them, including associated uncertainty, will be discussed. process and, using some examples from metrology technology trends, show how it
can enhance our ability to deal with change and reduce our fear of the unknown. If
Calculations and required measurement for reducing error by correcting we incorporate this methodology as a continuous process in our organization (and for
for port mismatch will be covered with examples. The Workshop will our individual selves), we will be acknowledging the inevitability of change, and learn
conclude with a presentation on issues related to automating the to embrace it and its inevitability.
calibration process using software.
10 Measurement Science Conference 2007 39
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AC Power Measurements WORKSHOP H:


10:45 – Friday, January 26 ISO/IEC 17025 Laboratory Accreditation – Who’s Who and What’s What?
Stricter Enforcement of SEMI F47 Throughout Metrology Tools in 2006 Instructor: Roxanne Robinson
Andreas Eberhard, Power Standards Lab Courtesy of: A2LA
Every modern test and measurement instrument can be sensitive to brief
disturbances on the AC power mains. Electrical systems are subject to a wide variety Abstract: This tutorial will explain the conformity assessment and laboratory
of power quality problems, which can interrupt production processes, affect sensitive accreditation hierarchy at both the international and national levels and explain how
equipment, and cause downtime, scrap, and capacity losses. The most common accreditation bodies receive international recognition and use the mutual recognition
disturbance, by far, is a brief reduction in voltage, lasting for a few hundred arrangements to the benefit of the accredited laboratories. We’ll cover in some
milliseconds. These 'voltage sags' (in American English) or 'voltage dips' (in British detail the ISO/IEC 17011 requirements that are placed on accreditation bodies and
English) are the most common power problem encountered in semiconductor Fabs would affect the accredited laboratory and then spend time on a review of the
around the world. ISO/IEC 17025 requirements.
Why SEMI F47 Voltage Sag requirements? Some years ago, the solution to For additional information on this Tutorial Workshop, please contact Roxanne
voltage sags was to use vast UPS or battery systems. But with more and more Robinson at (301) 644-3208, rrobinson@a2la.org.
300mm Fabs in operation, maintenance and regular replacement of such costly
devices is a burden to every manufacturing facility. UPS and battery systems shall not WORKSHOP I (*AM only):
be used in any tools (exception: FAB UPS for data systems).
Balance and Scale: Calibration and Use
Due to the extreme automation in new 300mm semiconductor Fabs and only a
few people inside the Fab, end-users want to have tools that are able to continue to Instructors: Val Miller/NIST
run even after a voltage sag occurred. This continued operation is the Pass-Fail Mark Ruefenacht/Heusser Neweigh
criteria outlined in SEMI F47-0200: "Equipment must continue to operate without Courtesy of Heusser Neweigh, NIST
interrupt during conditions identified in the area above the defined line".
The SEMI F47 standard introduced a well thought out voltage-to-time curve that
*Note: This Tutorial Workshop will be offered once in the morning only. It is
most semiconductor processing, metrology, and automated test equipment will be
intended to be taken in conjunction with Workshop J.
exposed to during normal operation.
What are the requirements?
Abstract: Weighing processes are a significant part of many manufacturing
•SEMI F47 requires that tools tolerate the following voltage sags and analytical processes. This workshop will present an overview of the calibration
and use of weighing devices in the analytical environment. It will focus on the use of
50% remaining voltage, 50% missing voltage, for 200 milliseconds weighing techniques, correct procedures, eliminating and minimizing sources of
70% remaining voltage, 30% missing voltage, for 500 milliseconds errors, and compliance with the weighing requirements of the USP, FDA and ASTM.
Classification schemes and calibration procedures for balances and scales will be
80% remaining voltage, 20% missing voltage for 1 second covered. The approach will discuss the selection and use of standards, artifacts,
procedures, facilities, equipment, measurement assurance, and software to
•In addition, SEMI F47 recommends, but does not require, that tools tolerate determine how each contributes to the quality of mass measurements, the impact on
the overall laboratory capability, and the effect on the production environment.
0% remaining voltage, 100% missing voltage, for 1 cycle

80% remaining voltage, 20% missing voltage, for 10 seconds For additional information, contact Val Miller at (301) 975-3602
Standard SEMI F47 voltage sag ride-through curve that is used in the process val.miller@nist.gov.
industry
Who enforces SEMI F47? Like any other SEMI standards, SEMI F47 is not a legal WORKSHOP J (**PM only):
requirement, but required by most semiconductor manufacturers such as Intel, TI,
Balance and Scale, and Weighing Process Uncertainties
IBM, Samsung, etc., around the world. Every new semiconductor manufacturing
Instructors: Val Miller/NIST
tool that enters a SEMI Fab has to comply with the SEMI F47 Voltage Sag
requirements. It is used both for semiconductor equipment and for components and Mark Ruefenact/Heusser Neweigh
subsystems within semiconductor equipment. Enforcement is entirely customer- Courtesy of: NIST, Heusser Neweigh
driven; the procurement agents of semiconductor equipment know the economic
consequences of sag-induced failures and generally refuse to pay for new equipment **Note: This Tutorial Workshop will be offered once in the afternoon only. It
that fails the SEMI F47 immunity requirement. More and more tool manufacturers is intended to be taken in conjunction with Workshop I.
require the same from their component suppliers (power supplies, vacuum pumps, One requirement of traceability of measurement results is calculating the
HF generators, etc.). SEMI F47 Testing and Certification is usually an essential part associated measurement uncertainty. This tutorial will present concepts and
of any tool purchase specification. methods for calculating and evaluating the uncertainty of balance and scale
What are common responses to voltage sags, and how to address these problems? calibrations. Weighing processes in the industrial and analytical environments will
• Emergency Off (EMO) circuitry also be discussed. Attention will be focused on the sources of errors in weighing
• Instrument and controller power supplies operations, methodologies for estimating the magnitude of errors, and computation
and reporting of the measurement uncertainty associated with reported weighing
• Motion control drives
measurement results. This approach is based on the content of NIST IR6919,
• Voltage monitoring relays Recommended Guide for Determining and Reporting Uncertainties for Balances and
• Circuit breakers open due to increased current on phases without dip Scales.
• Sensor faults or errors
• Robot failure For additional information, contact Val Miller at (301) 975-3602,
• Internal communication errors val.miller@nist.gov.
• Computer re-boots
• Graceful restoration using power quality sensors
(http://www.powerstandards.com/pqrelay.htm)
38 11
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WORKSHOP K/L (Full Day): A new facility for spectral power, irradiance, and radiance responsivity calibrations
using uniform sources (SIRCUS) has been developed at NIST. In the facility, high-
Calibration and Testing 101 – Back to Basics, power tunable lasers replace conventional lamp-monochromator systems. With up
Practical Applications of Measurement Standard Requirements to six orders of magnitude more power, these lasers are coupled into integrating
spheres with an exit port to produce either uniform irradiance at a reference plane or
Instructors: Jesse Morse, Fluke uniform radiance within the sphere exit port at high radiant flux levels. Test detectors
are calibrated directly against standard irradiance detectors. Because of the high
Tim Mason, Edison ESI power and wavelength stability of the source, calibrations can be made with
Jim (Smitty) Smith, Boeing IDS uncertainties as low as, or better than, the best optical power measurements. In
John Bowman, Fluke more advanced applications, large aperture instruments, e.g. telescopes, and detector
array-based imaging systems, requiring tests in uniform, monochromatic fields, have
Courtesy of Fluke, Edison ESI, and Boeing IDS been characterized. SIRCUS has been used for the detector-based realization of the
radiance temperature scale and a new realization of the candela.
Abstract: This tutorial will present and examine a number of elements relating
to the functions, features and concerns of a working calibration/testing lab & its Lasers ultimately determine the spectral coverage available on SIRCUS while the
personnel. The selection of topics is not traditionally covered in a Metrology training uncertainties achievable are determined by the quality of the standard irradiance
seminar. Design of the presentation covers items more of interest to individuals who detectors. SIRCUS can perform system-level spectral irradiance and radiance
are working in new disciplines, their Managers, Leads, Trainers or those whose responsivity calibrations of electro-optical sensors, radiometers, and spectrometers.
formal calibration/testing experience has been limited to “On-the-Job Training” There are two separate SIRCUS facilities: the UV-Vis-NIR SIRCUS and the IR
(OJT). SIRCUS. The UV-Vis-NIR SIRCUS covers the spectral range from 200 nm to 1000
nm. Continuous spectral coverage is provided in the IR SIRCUS from 700 nm to 5.3
Emphasis has been made to combine a series of short overviews that will nm. SIRCUS supports programs with other government agencies, among them
provide a broad spectrum of information with reference material to lead the student to NASA, NOAA, and USGS, as well as programs NIST has established with defense
further pursue those topics of priority or interest. This holistic approach builds upon and environmental space-based remote sensing companies.
elements of the measurement quality program, its impact on performance and specific
Emissivity: The Crux of Accurate Radiometric Measurement
skill sets both technical and standard compliance. This information is presented in a
casual and relaxed atmosphere. Frank Liebmann, Fluke Corporation – Hart Scientific Division
Key Areas: While many attributes contribute to a successful Infrared (IR) radiometry is a very useful form of temperature measurement. Its
calibration program this tutorial will cover: advantages over contact thermometry are that it has quick response times and it does
not have to come in contact with the area being measured. One of its major
· History & growth of dependence on reliable measurements
drawbacks is that it not as accurate as contact thermometry. One of the major
· An intro to uncertainty, requirements, needs and basics w/ demo sources of this uncertainty is the emissivity of the surface being measured. This is
true for calibration of these devices as well. The best way to calibrate an IR
· Surviving an audit, compliance what, how & when to run thermometer is by use of a near perfect blackbody. However, a near perfect
blackbody is not always a practical option for calibration. Flat plates are needed for
· Dimensional basics, uses & applications calibration of some IR thermometers. Emissivity is not always well behaved.
Emissivity can vary with time, meaning that a flat plate’s surface coating needs to
· IEC safety code impact on technicians & users
have a burn in time established. Emissivity can also vary with wavelength and
· Technician qualities & skill sets-what makes a good measurement temperature. This paper discusses the sources of error for flat plate emissivity.
Knowledge of these sources leads to a more accurate calibration of IR thermometers.
· Training program features & elements of a calibration cert
Characterization of Integrating Spheres for Ultraviolet Radiation
· Customer/Supplier relations as it relates to a calibration/ test lab function. Ping-Shine Shaw, NIST
· ANSI Z540 changes and focus Integrating spheres play an indispensable role when it comes to diffusing and
depolarizing radiation. They are widely used in radiometric applications because of
Who Should Attend? their superior performance in transforming radiation to a nearly ideal Lambertian
distribution despite variations in the conditions of the incident radiation. In the visible,
Calibration Managers & related staff, Instrument, Test & Quality engineers
polytetrafluoroethylene (PTFE) has proven to be the best material for integrating
wanting to augment or reinforce current skills; Companies & Programs looking into
spheres because of high reflectivity and chemical inertness. For UV application down
creating or extending their calibration/testing functions; Current “Program”
to 200 nm, however, it was known for a long time that PTFE material fluoresces
representatives interested in enhancing their understanding of the measurement field;
under UV irradiation and such effect must be accounted for in analyzing
and Metrology/Calibration/ Test technicians who are looking to expand their skill set
measurement results. We have studied the performance of integrating spheres in the
with a broader knowledge of the application of measurement science.
UV region with wavelengths as short as 200 nm. Two techniques were used for this
For more information, please contact Tim Mason, tim.mason@sce.com; study; first, the spectral throughput of an integrating sphere irradiated by a deuterium
lamp was analyzed by a spectrometer. Second, a laser beam was directed into an
James Smith, james.e.smith4@boeing.com; Jesse Morse, jesse.morse@fluke.com integrating sphere and spectrally dispersed Laser Induced Fluorescence (LIF) was
or John Bowman, john.bowman@fluke.com studied. Significant absorption and fluorescence features occur in the UV from an
integrating sphere and are attributed to the contamination of the integrating sphere.
WORKSHOP M (Full Day): The implication for using integrating spheres for UV measurement is discussed.
Advanced Uncertainty: Analysis Using Excel
Where Does Monte Carlo Simulation Fit In?
Instructors: Alan Steele and Rob Douglas
Courtesy of Institute for National Measurement Standards/National Research
Council Canada

This is a hands-on tutorial: you must bring your own Windows notebook computer,
pre-loaded with Excel (97 or later, and to have downloaded Borland's C compiler if you wish
to participate in parts of the tutorial dealing with writing DLLs in C to be called from Excel
macros.

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Flow II The first Supplement to the ISO Guide to the Expression of


Uncertainty in Measurement, even in its 2004 draft, defines a standard
2:00 – Thursday, January 25 procedure for evaluating uncertainties in difficult circumstances and for
Session Developer: Tom Kegel, Colorado Engineering Experiment Station, Inc. validating uncertainty methods. It proposes “Monte Carlo simulation” as
Test Program to Establish Direct NIST Traceability to a High Pressure, a standard method. In this tutorial you will learn to use and to modify
High Flow Rate Natural Gas Facility Excel macros that perform the Monte Carlo simulations proposed in the
Tom Kegel, Colorado Engineering Experiment Station, Inc. ISO Guide’s draft Supplement One.
New NIST/CEESI Natural Gas Flow Standard The tutorial will cover the basics of Monte Carlo simulation by
programming in Visual Basic for Applications (VBA), Excel’s
Aaron Johnson, NIST
programming language for macros. You will need to be comfortable
Automated Calibration of Primary Flow Provers programming in some variety of BASIC, since you will be modifying the
Harvey Padden, Bios International Corporation inner loop (of tens to hundreds of lines of code) of our Monte Carlo
routines to simulate the system or systems chosen from your workplace.
Dissemination of quality calibrations has always been of critical importance. For
Although VBA suffices for many simulations, some others require
many types of calibrations, proper application of instruments is the most important access to special programs written in C or FORTRAN, which are
factor in maintaining the quality of field calibrations. This is particularly true in the impractical to rewrite and revalidate in VBA. Some applications require
case of gas flow calibration. Shippable primary standards exist, but proper application the faster execution offered by a fully compiled language (more that 10x
is still an important issue. faster than VBA). Knowing how to harness C or FORTRAN will give
Interestingly, we, the makers of precision primary gas flow calibrators, face the you the confidence to tackle more complex problems – although you may
same problem as our users. If we include our less expensive primary provers, we have be delighted to find how powerful VBA can be even without invoking C
the problem of assuring quality control of thousands of calibrations per year on a or FORTRAN routines.
production basis. So, to paraphrase the ancients, who will prove the provers?
The tutorial will address how to interface routines from higher-level
This is a problem that will become more common as other primary and high- languages: for hands-on work it will use examples from C together with
accuracy devices are migrated from the lab to field use. While relatively simple for
the freely-available Borland C compiler. If you want to participate in C-
such artifacts as gauge blocks or voltage standards, it is a very complex problem for
primary flow provers. language hands-on examples, you should also pre-load your computer
with this compiler (details are at http://inms-ienm.nrc-
How, then, to automate measurement of piston leakage tare, as well as high-
cnrc.gc.ca/qde/montecarlo/choosedownloads.html#paragraph02).
accuracy flow comparisons with master devices at a variety of flow rates on an
automated basis, assuring maintenance of calibration quality? In the afternoon we will discuss how Monte Carlo simulation can be
We have designed a system for our internal use that valves various flows to used for measurement science beyond simple uncertainty analysis. We
devices under test while keeping inventory volume to the low, required value, along will show how to invoke powerful tests of measurement science, by
with the control circuitry to interface all the devices to master DryCal provers. We aggregating normalized errors (En) as a mean-square chi-squared-like
will discuss the process, mechanical and electrical designs in detail. We will also statistic. We will use Monte Carlo simulation to evaluate rigorously the
describe the software used to control the process, including the preparation of appropriate probabilities, which can depart significantly from analytic chi-
complete calibration certificates. squared functions. The tutorial’s last focus will be on how to make
toolkits and document them so that they are suitable for use by others,
and on documenting a procedure’s validation for your quality system.
Flow III

4:00 – Thursday, January 25


This workshop is advancing the usage of Excel features for Monte
Session Developer: Tom Kegel, Colorado Engineering Experiment Station, Inc. Carlo method described in the GUM’s draft Supplement One for
Interlaboratory Flow Comparison of Two NIST Primary Flow Standards measurement uncertainty calculations. Modifying the Excel macros to
Using Critical Flow Venturis in Series perform the Monte Carlo simulations will be presented.
Aaron Johnson, NIST

For additional technical information, contact Alan Steele,


Optical Radiation Metrology
Alan.Steele@nrc-cnrc.gc.ca,
8:30 – Friday, January 26
or Robert Douglas, Robert.Douglas@nrc.cnrc.gc.ca.
Session Developer: Dr. Uwe Arp, NIST
Detector Spectral Power, Irradiance, and Radiance Responsivity WORKSHOP N (Full Day):
Calibrations Using Uniform Sources From 210 nm to 5,000 nm
Measurement Uncertainty: Fundamental Applications/Considerations
George P. Eppeldauer, NIST
Instructor: Dilip Shah
Detectors are traditionally calibrated for spectral radiant power responsivity using
lamp-monochromator systems to tune the wavelength of the excitation source. Courtesy of: E=mc3 Solutions
Silicon detectors can be calibrated in the visible spectral region with combined
standard uncertainties at the 0.1% level. In many applications, the amount of light This is a beginner to intermediate level workshop targeted toward metrologists,
falling on a surface (irradiance) or the amount of light emitted from a source technicians, and engineers. This workshop will also be useful for procurers of
(radiance) are to be known and an instrument’s irradiance or radiance responsivity calibration services. This workshop covers the measurement uncertainty
must be measured. Because of the low flux in lamp-monochromator systems, fundamentals for metrology professionals new to the subject. Statistical concepts
instruments cannot be directly calibrated for irradiance or radiance responsivities. relevant to metrology and measurement uncertainty are introduced, explained, and
Also, primarily because of the low radiant flux in lamp-monochromator systems, the demonstrated. Topics from the U.S. Guide to the Expression of Uncertainty in
uncertainty in radiant power responsivity calibrations increases dramatically in both Measurement (ANSI/NCSL Z540-2-1997) are covered.
the UV and the IR spectral regions.
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Building on the fundamentals, the workshop proceeds to cover practical and OILM point out the importance of traceability and the mutual recognition of all
examples encountered in metrology using a hands-on approach for corresponding MRAs. That includes the full acceptance of CIPM-Key comparison
determining measurement uncertainty. This workshop breaks down the reference values in all member states of CIPM, ILAC, and OIML.
measurement uncertainty determination into a 7-step process. As each At last, the paper gives a view toward the so-called Harmonized European
step is covered, a computer spreadsheet template is developed to calculate Reference Value for the Natural Gas Cubic Meter, which is being disseminated all
and document the uncertainty data. Examples and techniques related to over Europe since 4 May 2004. In the meantime, it has also been accepted on other
metrology and measurement; including Test Uncertainty Ratios (TURs), continents as the national reference, e.g. Canada via NRC-TCC.
control charting applications in metrology, and data validation are discussed It turns out that this Harmonized European Reference Value is exactly the same
during the workshop to ensure that participants leave the session with as the above mentioned CIPM/BIPM Key Comparison Reference Value for natural
practical and timesaving techniques that can be utilized in their profession. gas. The metrological consequences and benefits of such a Key Comparison
Reference Value for international trade will be discussed. This Harmonized
Reference Value has already been accepted in nearly all Eastern and Western
European countries as well as in Canada. It turns out that there are significant
For further information on this workshop, contact Dilip A. Shah, (330) differences between the U.S., Europe, and Asia in their view to metrology and their
328-4400, or emc3solu@aol.com. way how to disseminate reference values.
A Similarity Theory for the Thermal Mass Flow Sensor and Its Gas
Conversion Factor
WORKSHOP O (Full Day):
Dr. Chiun Wang, Celerity, Inc.
Understanding Meter Calibration for Dimensional Calibration Technicians
This paper proposes a similarity theory for the capillary thermal mass flow sensor.
The theory expresses the sensor output, divided by the gas thermal conductivity, as
Instructor: Mitch Johnson a function of the Péclet number, i.e. (RePr), of the flow inside of the sensor tube. The
Courtesy of:Donaldson Company, Inc. theory compares favorably with experimental data collected for a wide range of gases
over a wide range of flow rate. The similarity model is useful because it not only
describes the sensor output as a function of the flow rate, but also provides a method
This workshop presents, in a practical set-up, the calibration of to scale the sensor output characteritic curve from gas to gas by using the thermal-
voltmeters, current meters, ohmmeters, and multimeters using a physical properties alone. The similarity model is applicable in both the linear and the
multifunction meter calibrator. It includes the theory and working nonlinear range of the sensor. In the linear range, the model condenses into the
principles of different types of meters. conventional gas conversion factors widely in use by the thermal mass flow controller
industry.
A Multi-Functional Thermistor for Simultaneous Measurement of
For further information on this Tutorial Workshop, contact Mitch Temperature and Wind Velocity
Johnson at( 952) 703-4703
Akihiko Shimoyama, Saga University
or mijohnso@mail.donaldson.com
Originally, the various sensors are devices to detect some single physical quantity,
excluding the physical quantity that is not necessary by the collection or calibration.
However, we think that the physical quantity in the natural world does not show an
independent change and generally conglomerated change. Then, we propose the
concept of a multi-functional measurement, which makes from conglomerate
information to individual information. Here, we report that information on the
temperature and the wind velocity as the physical quantities were obtained by using
a multi-functional measurement of a thermistor.
The thermistor has the different characteristics and the information except the
temperature so as the humidity and the wind velocity, when the current of the
thermistor increases. Therefore, the thermistor current of 2.5 mA and 5 mA are
used. The database and the orignal processing are used for the purpose of making
from conglomerate information to individual information. The database is made at a
temperature from 25°C to 35°C (1°C step) and at a wind velocity from 1 m/s to 4 m/s
(1 m/s step) in the condition with a fixed humidity of 30% ± 10%. We use the method
of signal processing using approximate expression of the least square method.
The measurement is carried out at 28.7°C in temperature and 1.5, 2.5, and 3.5
m/s in wind velocity by using a multi-functional measurement in the point except the
database. As a result, it was agreed to the value of standard sensors by about 0.1°C
for the temperature and about 0.1 m/s for the wind velocity.
It was found to be able to measure the temperature and the wind velocity by using
a multi-functional measurement in the range from 25°C to 35°C and from 1 m/s to 4
m/s using the thermistor current of 2.5mA and 5 mA.

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paper will focus on how such smart sensors could be capitalized on in the Navy’s SPEAKERS
Network Centric vision to vastly reduce ship and Fleet calibration workloads and Keynote Speaker: Thursday, January 25, 2007 9:00 AM
increase ship readiness via remote shore based monitoring and distance support.
Currently, the Navy’s Integrated Condition Assessment System (ICAS) receives Speaker: PROFESSOR ANDREW WALLARD
both monitoring and control systems parameter information (temperature, pressure,
rpm, vibration, etc.) from analog based sensors and manually logged data (via PDA
type devices). These analog sensor channels are periodically (nominally every two Professor Andrew Wallard has been the Director of the
years) calibrated manually. During these biannual manual calibrations, most of these Bureau International des Poids et Mesures in Sèvres, France
sensors are found to still be within acceptable bounds. With digital ‘plug & play’ since January 2004. Professor. Wallard was awarded a first
smart sensors with BIT capability, not only could the sensor parameter information class honours degree in physics from St. Andrews University,
be continually captured by ICAS, but the sensor heath information, last calibration Scotland in 1968, and a PhD in 1972. He worked as a laser physicist at the UK's
date, sensor serial/model number, application/location, and calibration constants
information could also be available within the smart sensor and continually made
National Physical Laboratory (NPL) until 1978. He then spent 12 years in
available to the ICAS database as well. Additionally, smart sensors lend themselves various central Government positions, including the Prime Minister's Cabinet
well to computer controlled calibration; hence when sensor calibration procedures Office, and the Department of Trade and Industry where he was a special
are conducted, a calibration controller computer could automatically capture advisor to various Ministers. He has broad experience of science and
calibration data. technology policy and also managed several industrial programs or research
Utilizing and leveraging the same ship to shore means described in the paper support, which were operated by the UK Government and the European
“Revolutionizing Maintenance through Remote Monitoring via ICAS & Distance Community. He specialized in University/industry collaboration.
Support” (reference 2), all this shipboard smart sensor calibration data could be
remotely monitored and captured into the Navy’s shore based Metrology and Professor Wallard returned to the NPL in 1990 as Deputy Director and,
Calibration (METCAL) databases. This data could then be continually analyzed by
subsequently, the NPL's Chief Metrologist. From 2005, he was a member of
shore side metrology experts to optimally tailor calibration periodicities and
significantly pare down and schedule any near term ship sensors calibration “to do” the International Committee for Weights and Measures (CIPM) and President
lists. In most instances, sensor calibration condition change (i.e., drift) is a slow of the Consultative Committees for Photometry and Radiometry (CCPR) and
progression. Thus, with the above infrastructure, by anticipating (via shore based for Acoustics, Ultrasonics, and Vibration (CCAUV).
METCAL statistical analysis experts), only necessary calibrations can be scheduled
and conducted before the sensor calibration condition might affect proper ship system Professor Wallard was subsequently elected as the Director of the
operation. In the occasional cases when an individual smart sensor’s health goes from International Bureau of Weights and Measures (BIPM). The BIPM
a stable condition to a rapidly disintegrating condition, the shore based experts would
be able to catch it as it is happening and potentially remotely troubleshoot the sensor
coordinates world metrology and is an Inter-Governmental body under the
while a ship is underway, hence minimizing equipment down-time and increasing Treaty of the Metre, supported by over 60 countries.
mission readiness. This could all occur with little or no ship’s force intervention.
Professor Wallard was a Vice President of the UK's Institute of Physics
until 2005, is a Professor at the University of Wales, and has been awarded
Flow I several national and international honours for his contribution to measurement
science and technology.
10:45 – Thursday, January 25
Professor Wallard is a member of the Board of the National Conference of
Session Developer: Tom Kegel, Colorado Engineering Experiment Station, Inc.
Standards Laboratories International (NCSLI); the Scientific Academy of
The World Reference Value for High Pressure Natural Gas Flow as Turin; the UK's Physical Society; a Fellow of the Institute of Physics; a
Approved by CIPM Key Comparisons Chartered Physicist, Engineer, and Scientist; and a life Fellow of the Royal
Dietrich Dopheide, Physikalisch-Technische Bundesastalt (PTB) Society of Arts, Manufactures, and Science.

Key Comparisons (KCs) have been conducted to get international reference Professor Wallard has published some forty refereed papers, generally on
values for all quantities of interest under the auspices of the BIPM (International
laser physics and metrology, numerous conference proceedings, and has
Bureau for Weight and Measures) as well as the CIPM (International Conference for
Weight and Measures), which is the highest metrological authority worldwide. contributed to various books on metrology.
Among these KCs, the flow area is of economic importance and Key Comparisons for
Thursday, January 25, 2007 Luncheon Speaker
natural gas flow at high pressure and larger flow rates as well as for compressed air
have been conducted successfully among all interested National Metrology Institutes. Speaker: Richard Y. Chang
The outcome of such a KC is the international Key Comparisons Reference Value
(KCRV), which is then considered to be the worldwide best available realization of
Natural Gas Flow at high pressure. (World Reference Value). Richard Chang has always been driven by his passion for
These KCs have been conducted among the National Primary Standards of all personal and organizational excellence. In his youth, he mastered
nations worldwide, represented by their National Metrology Institutes (NMIs), and three musical instruments and excelled at a variety of sports,
were finalized in December 2004 for natural gas. The Key Comparison Reference including roller skating, tennis, swimming, water polo, volleyball,
Value was approved by the BIPM in April 2005, has been published at the BIPM web- and bowling. As a freshman at UCLA, he won the National
site in January 2006, and is open for the public. Collegiate Singles Championship in bowling, was named amateur
The paper describes the procedures, the participating high-pressure gas facilities, bowler of the year for Southern California, and joined the professional tour.
the outcome, and important conclusions for international as well as national gas
trade. An internationally accepted reference value for the gas cubic meter will be Chang is now CEO of Richard Chang Associates, Inc., a diversified
more and more important in a liberalized gas market. For the international pipeline performance-improving consulting, training, and publishing firm headquartered in
grid in Europe, which covers among others Spain, France, Benelux, Germany, and all Lake Forest, California. He is internationally recognized for his strategic planning,
transit countries towards Russia, a common and international recommended performance measurement, quality improvement, organizational development,
reference value will help to lower technical barriers in international trade. It is The product realization, change management, and human resource development
CIPM-MRA and the ILAC-MRA as well as the recent common
expertise. As an internal business practitioner, he held management and senior
statement/declaration dated January 2006 between CIPM, ILAC,
34 Measurement Science Conference 2007 15
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Temperature
leadership positions in four organizations. He has served as an external consultant to
a wide variety of domestic and international organizations, including Toshiba, 10:45 – Friday, January 26
Citibank, McDonald’s, Universal Studios, Fidelity Investments, Nortel Networks,
Sesion Depeloper: Michel F. Holleron, NPSL
and Nabisco. Chang has also served as the 1999 chair of the board of the American
Society for Training and Development and as a judge for the prestigious Malcolm Study of a New Fixed-Point System for Calibration Short Secondary Platinum
Baldrige National Quality Award. Resistance Thermometer
Rong Ding, Fluke Corporation – Hart Scientific Division
Chang is the best-selling author or co-author of more than twenty-five books on
business and personal development and is the award-winning author of over ten
A new fixed-point system was developed to calibrate short (8 – 12 inches)
training videotapes, including his most recent release, The Passion Plan. A sought-
secondary platinum resistance thermometer (PRT) and industrial platinum resistance
after resource, he has made numerous presentations to organizations around the
thermometer (IPRT). The system includes a modified metal-cased fixed-point cell
world and has been featured by CNNfn, Making It!, Investor’s Business Daily, based on the existing metal-cased fixed-point cell, which was recently developed to
Entrepreneur Magazine, Gannett News Service, Reader’s Digest, Knight-Ridder, i- calibrate secondary PRT (12 inches), and a maintenance furnace with three-zone
village.com (AOL), and ka-ching.com (Oxygen). controller that provides excellent vertical temperature uniformity. The design and
structure of the new fixed-point system is described in the paper. The system was
tested with tin and zinc freezing-point cells. The testing results, including the inter-
comparison with primary cells, are presented and the freezing plateaus are fully
evaluated and discussed in the paper.
Methods for Evaluating the Condition of Platinum Resistance Thermometers
Mingjian Zhao, Fluke Corporation – Hart Scientific Division
TECHNICAL PROGRAM SUMMARY
Standard platinum resistance thermometers (SPRTs) and secondary platinum
Thursday, 25 January
resistance thermometers (PRTs) are widely used as standard or reference
thermometers to calibrate other thermometers and to measure temperature precisely
Track A in temperature laboratories. These applications require the PRTs or SPRTs to be
sufficiently accurate and operating properly. Using thermometers that have unstable
1. United States Measurement System or uncharacteristic resistances produces unsatisfactory or invalid results, with
possibly very costly consequences. PRTs are fragile and are often inadvertently
2. Metrology History
damaged by severe conditions or even routine use. Unless there is a system in place
3. Advances in Standards for frequently evaluating the condition of PRTs, loss of accuracy, when it occurs, may
be unrecognized. It is important for quality assurance that all thermometers be tested
regularly. There are convenient methods available for this. When a thermometer has
Track B been found to be damaged or inaccurate it is also important to be able to
discern the cause so it can be avoided in the future, since it is expensive to
1. Calibration Issues in FDA Regulated Environments replace and recalibrate PRTs, especially SPRTs. Knowing what kind of
2. Public Safety damaged has occurred, it might even be possible to restore the thermometer to
a nearly normal condition. Useful methods of evaluation tell when a PRT or
SPRT has lost accuracy, indicate what kind of damage it has received, what the
Track C likely causes of the damage are, and what actions should be taken. In this paper
such methods for evaluating PRTS and SPRTS are presented, which involve a
1. DC – Low Frequency few simple measurements and analyses of these in comparison with previous
2. RF & Microwave measurements. Research and testing from which these methods originate will
be explained. Interpretations of possible measurement results are discussed
3. Calibration Technology for Dynamic Parameters and recommended actions based on the results are proposed. These methods
are useful not only in the evaluation of SPRTs and PRTs, but may also be
applied to industrial platinum resistance thermometers (IPRTs).
Track D
1. Flow I
Sensors (A panel discussion)
2. Flow II
2:00 – Friday, January 26
3. Flow III
Transformation of Shipboard Sensors Calibration via Smart BIT/BIC
Track E Enabled Sensors, Remote Monitoring, and Distance
1. Committee for Equipment Specifications Randy Rupnow, NSWC Corona, randall.rupnow@navy.mil
2. NSCLI RP-12 Determining and Reporting Measurement
Uncertainties This paper discusses a proposed new approach for calibration support of large
numbers of future shipboard installed hull, mechanical, and electrical (HM&E)
3. RP-1 Calibration Intervals sensors. Rather than calibrating sensors on a fixed schedule as is the current norm,
ships outfitted with digitally intelligent sensors, which have means built in to assess
their own health [via robust built-in test (BIT), with the most robust possibly being
built-in calibration (BIC)] could be used to automatically indicate when calibration is
necessary. These sensor attributes are discussed in depth in the paper “New
Calibration Strategies to Support Reduced Crew Sizes” (reference 1). Hence, this

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stress wave transmission. In order to eliminate reflected wave effect, the Track F
measurement data are truncated and, as a result, some error is introduced. A method
for compensating the sensor response characteristics is presented using the truncated 1. Managing Change
data. An example shows the application of quasi- function calibration for high- 2. Business Processes
pressure sensors.
3. Lean/Six Sigma

Physical/Mechanical Friday, 26 January

8:30 – Friday, January 26


Track A
The In-House Capability of an Optical CMM Calibration for any Company 1. Equipment Practices and Processes
Shawn Mason, Boston Scientific
2.UID and RFID
3.Accreditation
This paper will present the in-house development and implementation of a
calibration process for calibrating an Optical CMM.
Topics covered: Track B
• Issues and problems encountered during the development 1. Metrology Education from a Quality Perspective
• Uncertainty components and an uncertainty budget 2. Applying Measurement Quality
• Calibration process
• Future improvements
Track C
• Conclusion
1. Physical/Mechanical
DIN ISO 6789 – European Norm for Torque Wrench Calibration
Capt. Peter Jaeger, German Armed Forces Calibration Service
2. Temperature

With the relatively new European norm for Torque Wrenche Calibration DIN ISO 3. Sensors
6789, released in October 2003, the German Armed Forces - and all civil companies
using torque wrenches too - had to reconsider the purpose of these tools to be
advanved from just tools to measurement equipment. Track D
Torque wrenches the German Airforce uses have always been checked and 1.Optical Radiation Metrology
monitored - frequently and/or prior to use – as a request for aircraft safety. But since
the European norm DIN ISO 6789 was released, perfomance testing of torque 2. AC Power Measurements
wrenches is not enough anymore - a full calibration has to be done - according to a
standardized procedure, including evaluation of uncertainty and calibration
certificate. Track E
Theoretical thoughts in a calibraton laboratory and every day use requirements 1. Test Equipment Management, Business Solutions for
met. This presentation will:
Efficient M&TE Management
• Give an introduction into the european norm DIN ISO 6789
2. ANSI Z540.3 Handbook
• Point out its basic requirements
3. Education
• Show the problems that occured while calibration
• Give a short preview of usuable equipment including adapting U.S.-made
equipment Track F
• Document calibration experiences of a big company holding several 10.000
1. Uncertainty I
torque wrenches
• Give hints for using the norm
2. Uncertainty II

This presentation tries to point out general and basic demands and show
experiences, problems and known solutions.
A Review of Shock and Vibration Calibration Methods of Accelerometers
Marco Peres, Modal Shop
Shock and vibration phenomena are present around us in everything that moves.
The accelerometer, either alone or with other electrical components, produces an
electrical output signal related to the applied motion. Accurate accelerometer
calibration is a way to provide physical meaning to this electrical output and it is a
prerequisite for quality measurements. Methods, systems, and standards on
accelerometer calibration are discussed, providing an overview on current technology
available for calibrating and testing accelerometer performance characteristics.

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ABSTRACTS Four waveform patterns are available with the MG3700A:

United States Measurement System (A panel discussion) - The standard built-in waveform pattern.
- Various optional waveform patterns
10:45 – Thursday, January 25
- Optional IQ-producer waveform generation software
Panel Moderator: Steve Doty, NSWC Corona, stephen.doty@navy.mil
- Data created by general signal generation software changed into waveform
patterns.
Metrology History The IQ-producer waveform generation software conforms to various
communication systems. IQ sample data files (in ASCII format) generated by
2:00 – Thursday, January 25 common EDA (Electronic Design Automation) tools can be converted to waveform
Session Developer: Miguel Cerezo, Amgen, mcerezo@amgen.com pattern files.
The Problem(s) with Microwave Power Measurements
Ancient Chinese Volumetric Standards Ronald Ginley, NIST
Miguel Cerezo, Amgen, mcerezo@amgen.com
Microwave power measurements are used to support almost every segment of
20 C – A Short History of the Standard Reference Temperature for Length the microwave electronics industry. It is very important for these measurements to
be as accurate as possible. Recently we have found several different problems that
Theodore D. Doiron, NIST affect microwave power measurements. This paper will explore these problems,
While most dimensional metrologists know that the reference temperature for which include rf leakage, common-mode, and other noise signals, ground loops, and
dimensional measurement is 20°C, very few know how or why that temperature was compensation beads. Data related to these problems will be presented.
chosen. Many people have thought it was, in some sense, arbitrary. In actuality, the
decision was the result of 20 years of thought, discussion, and negotiations that
resulted in the International Committee of Weights and Measures (CIPM) Calibration Technology for Dynamic Parameters
unanimous adoption of 20°C as the reference temperature on 17 April 1931. Of
particular interest is a personal letter from C. E. Johansson, the inventor of gauge 4:00 – Thursday, January 25
blocks, that discusses his studies and efforts to satisfy a worldwide market in the face Session Developer: Jing Zu, North University of China
of wide spread variations in the reference temperature for length measurements.
Measurement Uncertainty: A History
Uncertainty Analysis of Frequency Response of Pressure Transducer
Dr. Dennis Jackson, NSWC Corona, dennis.h.jackson@navy.mil
Dr. Zhijie Zhang, North University of China
The methodologies used to estimate the uncertainty in measurements have gone
Frequency response is the major specification in dynamic measurement systems.
through a very interesting evolution. Initial methodologies based in classical statistical
Furthermore, the differences of estimated frequency response will add to dynamic
methods suffered because observed data taken during a measurement session does
uncertainty. Uncertainty analysis on frequency response of transducers has been an
not adequately represent all the error sources inherent in a measurement. It was also
important job in evaluating measurement systems and the results.
exceptionally difficult to estimate the uncertainty of complex measurement equations
using standard probabilty theory. In this paper, uncertainty of frequency response is defined as statistic result, which
is based on experimental data of multiple dynamic calibrations. Uncertainty of
The most recent version of the GUM allowed for the incorporation of these
frequency response is derived from the average amplitude response and the phase
unrepresented error sources using knowledge based methods. These knowledge
response, which reflect their biasing in a certain probability level.
based methods are reminiscent of (though not exactly implementations of) Bayesian
statistical methods. In addition, the uncertainty of measurement equations was dealt The paper describes three kinds of typical dynamic calibration methods, which are
with using a Taylor Series Expansion method, which could be applied in a cookbook respectively used by Quasi- pressure signal generator. Sine-wave pressure signal
fashion. The acceptance of the GUM has not provided a universally understood generator, step pressure signal generator, and modeling methods of transducers or
methodology, but it has provided a solid foundation for measurement uncertainty measurement system using dynamic calibration results. Some mathematic models
estimation practices. are used, such as regression model, time-sequence model, neural network, and so on.
The paper also analyzes effect of model arithmetic on frequency response.
Much of the current thinking in future directions for uncertainty analysis involves
the use of more formal Bayesian methods supported by Monte Carlo computation. Traceable Dynamic Calibration for High Temperature Sensors
The Bayesian methods satisfy the need for a more formal foundation for the use of
Hanchang Zhou, National Key Laboratory for Electronic Measurement
knowledge based methods, while Monte Carlo computation deals with the dramatic
Technology, North University of China
increase in complexity introduced by the Bayesian methods. In addition, Monte Carlo
methods provide for more exact estimation of the uncertainty measurement The first dynamic calibration results for temperature sensors at 2,000°C using
equations than is provided for by the GUM Taylor Series Expansion method. CO2 laser as excitation sources are reported. The short optical pulse rise and fall
time of the high power laser makes it possible to heat up the sensing surface of the
Other important directions for uncertainty analysis involve the development of
sensor being calibrated to a high temperature transiently. It is considered the true
observed data methods to estimate the uncertainty of error sources currently handled
temperature vs. time relation during dynamic calibration can be received by the fast
using knowledge based methods. This lifts some parts of uncertainty analysis from
response infrared detector. The traceability is accomplished successfully through
the shadowy realm of knowledge assumption, to the more firm foundation of data
unbroken chain of comparisons with appropriate standard at the same calibration
analysis. These estimation methods use experimental design and statistical analysis
system.
of variance to estimate the uncertainty of error components.
Keywords: Dynamic Calibration, Temperature Sensors, Laser, and traceability.
In addition, there is an active interest in estimating uncertainty as a function of
time. Without a time component, a mesurement uncertainty expression is only valid Quasi- Function Calibration of Dynamic Characteristic of High-
at the time of the measurement. For manufacturers interested in describing the Pressure Transducer
uncertainty associated with a measurement instrument, the need to predict Jing Zu, North University of China
uncertainty over a period of time is very relevant. Some manufacturers are already
doing a pretty good job of this. After defining dynamic characteristic calibration of high-pressure (over 100MPa)
sensors, the paper presents the principle of quasi- function calibration, an approach
to implement quasi- function calibration by use of a Hopkinson bar and liquid oil for

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Advances in Standards
Computer-Controlled Nuclear Magnetic Resonance Magnetometer for
Magnetic Field Standard 4:00 – Thursday, January 25
Dr. Terumitsu Shirai, Calibration Lab, Japan Electric Meters Inspection
Study of Procedure of Primary Standard Pressure Balance Characterization
Corporation
In order to establish the magnetic field standard up to approximately 3 T, Nuclear Dr. Alaa Eldin, A. El-Tawil, NIST
Magnetic Resonance (NMR) is widely used. In Japan Electric Meters Inspection A primary pressure standard that can be metrologically characterized in a
Corporation (JEMIC), we have also established the standards from 2.5 T to 30 mT complete and an independent way with reference only to the basic units of the S.I.
by using a commercially available NMR magnetometer. However, it is necessary to system, is defined as force per unit area (pressure balance) or the height of a liquid
evaluate some factors of the measurement uncertainty. Therefore, we have column (liquid manometer). Pressure balances are excellent primary standards for
investigated the detection resolution of the NMR magnetometer with the measuring pressure with high resolution and high accuracy. Characterization of
“superimposed small magnetic field method” and an extremely stable magnetic field primary standard pressure balance (controlled clearance) will be presented in this
generator. work. Study of the metrological characteristics of a controlled clearance pressure
In this paper, a high-resolution computer-controlled NMR magnetometer was balance, PG-67, has been carried out according to Heydemann and Welch model
investigated. The developed NMR magnetometer consists of a sine-wave generator, using diethyl-hexyl-sebacate as a working fluid, is presented through this work. To
a phase-sensitive demodulator, and a digital voltmeter. Its resolution is evaluated attain this, experiment for determination of the short term pressure stability at all
using a permanent type magnetic field generator in a magnetic field of 299.2 mT. applicable jacket pressure and pressure points was carried out. The effects of jacket
pressures on the pressure stability as well as the optimum jacket pressure that could
As a result of discussion, it was shown that the resolution of our NMR is more be used to provide the lowest pressure scattering at each pressure point were
than approximately 0.3 µT. determined. On the other hand, to improve the pressure stability a pressure balance
was used to generate, control, and measure the jacket pressure instead of pressure
sensor. A procedure to determine the coefficient “d” in Heydemann and Welch
RF & Microwave model was proposed and implemented. With little modifications, it was used to
measure the zero pressure effective area for NIS 200 PCA. The procedure is faster
2:00 – Thursday, January 25, 2007 than the normal cross floating procedure and it does not suffer from the personal error
Session Developer: James C. Wheeler, NPSL since the balancing point is determined through pressure sensor and computer
The Challenges of Precision Analog Modulation Measurement program. Comparing its results with the normal procedure shows the advantage of
the new procedure in eliminating the drift and reducing the instability of the oil
Paul Roberts, Fluke Corporation temperatures comes from the long operating time, besides saving the timing of the
In today’s digital world, many established analog techniques are being replaced by experimental work.
modern digital alternatives. Digital modulation is now commonplace, particularly in Calculations of the generated pressure using the characterized primary standard
mobile communications, but traditional analog amplitude and frequency modulation was carried out with proposed uncertainty budget for the generated pressures.
are still in widespread use. Laboratories performing RF calibration report that analog
modulation meters and analyzers are a part of their workload that cannot be ignored. Uncertainty Examination Obtained in Calibration of (1… 10) Kg Set By
When a new RF calibration source was designed, precision analog modulation was Using Subdivision Method or Multiplication Method
included to address this workload. This paper describes the digital signal processing Adriana Valcu, National Institute of Metrology
based techniques used to measure its modulated outputs, and explores the challenges
in assessing modulation measurement uncertainties and validating the results The realization, maintenance, and dissemination of the IS base unit “kilogram” is
obtained. one of the tasks of the NMI’s mass laboratories and is assured by means of reference
standards, which are traceable to the International Kilogram Prototype through the
Calibration Issues and Considerations for Digital Modulations-Error mass of the National Prototypes.
Vector Magnitude (EVM) Performance Test
This paper describes the dissemination of mass scale from 1 kg reference standard
Dr. Brian Lee, Anritsu Company to weights of E1 class between (1...10) kg using one of two methods of calibration:
Mobile communication systems are evolving to higher speed and increased subdivision or multiplication. The paper compares type A uncertainty obtained by
wideband modulation. Cellular phones and WLANs are handling more information. both methods.
Broadcast and information service systems are moving toward digitization. The subdivision method presented deals with a link of standards where the
Converting from analog modulation to digital modulation advances information measurements start downwards from 10 kg to 1 kg (using Romanovski model). The
services and provides more effective frequency utilization. New wireless multiplication method is the one usually used in many calibration laboratories and
communication systems increase user mobility. starts from 1 kg to 10 kg.
Measuring digital signals is not as straightforward as the procedure in measuring The objective in the search for better design is obtaining a minimum value of the
their analog counterparts. Error Vector Magnitude (EVM), a measure of signal diagonals elements in the inversion matrices. The paper also presents an example of
quality, provides both a simple, quantitative figure-of-merit for a digitally modulated calibration and uncertainty calculation.
signal and for uncovering the underlying causes of signal impairments and distortion.
The error vector is the vector difference at a given time between the ideal reference Equipment Practices and Processes
signal and the measured signal. Expressed another way, it is the residual noise and
distortion remaining after an ideal version of the signal has been stripped away. EVM 8:30 – Friday, January 26
is the root-mean-square (RMS) value of the error vector over time at the instants of
the symbol clock transitions. The paper describes the error vector magnitude and
related measurements, and discusses how the accuracy of a vector signal analyzer is An Integrated Certification Strategy for Modular Instrumentation Test
determined. This paper will also discuss the performance test procedure for making Platforms
an EVM measurement and its calibration requirement. We will use a vector signal David Manor, Geotest – Marvin Test Systems, Inc.
generator (MG3700A) and a signal analyzer (MS 2781A) for the demonstration. The
MG3700A Vector Signal Generator supports digital modulation of signals for all major
wireless communication systems. It is a 160 MHz high-speed arbitrary waveform During the past 15 years, the deployment of modular test systems for
baseband generator including wide vector modulation bandwidth and large capacity manufacturing test applications has proliferated. Starting with VXI in the early 1990s,
ARB memory. By choosing an arbitrary waveform pattern, a modulation signal can be card modular architectures have become an integral part of ATE systems. Today, the
output that meets the requirement of various communication systems. primary card modular architecture is based on the PXI standard with thousands of

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PXI-based systems in use today, and with current market growth exceeding 35% Metrology Education from a Quality Perspective
CAGR. The flexibility and configurability associated with today's modular
architectures also creates new challenges for the calibration and certification of these 8:30 – Friday, January 26
systems. Unlike "box" instruments, which are stand-alone entities and can be easily Session Developer: Duane Allen, NSWC Corona, duane.allen@navy.mil
removed and recertified, card modular instruments like PXI require system
"infrastructure" - i.e., a backplane and system software in order to function. And Measurement Science Training Assurance
while an ATE system may include a system level accuracy verification or certification Emil Hazarian, NSWC Corona, emil.hazarian@navy.mil
process, some type of process or methodology is still required to recertify those
This paper will discuss the development of a training program for the
modules requiring periodic recertification or calibration. Historically, the process for
Measurement Science Department at NSWC Corona, aimed at satisfying the
recertification of modular instruments has been to remove and return the modules to
technical rigors and other U.S. Navy requirements. The paper describes the
the OEM or a third party test house, resulting in system down time. However, a
adaptation of the training program to the quality assurance principles and format,
preferred method is to a recertify the modules within the host test system. This
through redundancy elimination and providing training uniformity and continuity,
paper discusses how the development and inclusion of a standards module as part of
both vertical and horizontal.
the modular test system can help create an integrated certification strategy for
modular instrumentation test platforms. By judicious selection and use of frequency,
resistance and voltage standards, in conjunction with test software, a certification
strategy can be developed that supports the certification of measurement and source Applying Measurement Quality
instrumentation resources within the test system – minimizing system down time and
10:45 – Friday, January 26
offering test managers added flexibility for supporting in-house certification of
modular test system components. Session Developer: Dilip Shah, E=MC3 Solutions

An Application of Accelerated Lifetime Design (Design Makes a Difference!)


Dr. Adriana Hornikova, NIST DC – Low Frequency

The durability and lifetime of storage media, such as CDs and DVDs, was 10:45 – Thursday, January 25
investigated utilizing an accelerated testing experiment. An optimally designed
experiment was determined to minimize the bias and uncertainty of the predicted
median lifetime at ambient conditions. This approach will apply for different CD and Calibration System for Inductive Voltage Divider in Japan Electric
DVD manufactures and types. Meters Inspection Corporation
The ISO 18 927 and ANSI standards specify five different stress conditions in Akihiko Shimoyama, Japan Electric Meters Inspection Corporation
conjunction with the Eyring model, for predicting the ambient life expectancy of CDs Japan Electric Meters Inspection Corporation (JEMIC) has been performing the
and DVDs. For variance stabilization we used the logarithm of the failure times for calibration of the inductive voltage divider (IVD) for approximately thirty years. A
the least squares regression fit to predict failure at ambient conditions. A simulation national standard of IVD, as the voltage ratio standard in the field of alternating
was carried out to determine the optimal accelerated testing design for this study, and current (AC), was established in the National Metrology Institute of Japan, National
to determine the lifetime estimates (and uncertainty) at ambient. Institute of Advanced Industrial Science and Technology (NMIJ/AIST) in 2005.
Therefore, an IVD calibration system with high accuracy to extend the calibration
Measurement of Solderability and Printability of Solder Pastes Using AC
range was reconstructed in JEMIC.
Impedance Methods
This paper describes the principle of new IVD calibration system developed by the
Dr. Mohammad Amin, National University
cooperation of NMIJ and the calibration method of IVD. A secondary standard for
The solderability and the printability of soldering depend upon both the quality of the voltage ratio standard maintained in JEMIC is an IVD with five dials using the
the flux in a solder paste and the surface condition of the substrate of a printed circuit principle of a two-stage transformer. The first dial of a secondary standard IVD is
board. The values of these attributes of a solder paste degrade with time and calibrated by NMIJ at 10 Vrms and 1 kHz. The standard of IVD is extended using an
exposure to an atmosphere with high humidity and temperature. This paper briefly IVD calibration system at ratios up to 1 in 104, at voltages up to 150 Vrms, and at
discusses how AC Impedance methods can be used to evaluate the solderability and frequencies from 50 Hz to 10 kHz. The unit under test of IVD is calibrated by
the printability of a solder paste under different conditions. In this study, a number of comparing with the standard IVD at a 1:1 ratio.
good and bad solder pastes were evaluated and their circuit parameters were
Furthermore, the calibration work is efficiently executed, and consequently, the
determined. These values were found to be significantly different for good samples
calibration of one dial (ten points) of an IVD can usually be accomplished in about 15
and bad samples. It was observed that the AC electrical impedance data were
minutes. The best measurement capabilities (BMCs) are 0.2 ppm (k = 2) for in-phase
correlated with the physical and chemical changes occurring within solder pastes.
and 4 ppm (k = 2) for quadrature at 10 Vrms and 1 kHz.
The outcome of this research helped to design a Statistical Process Control tool
(IS4000) that assists manufacturers in rapidly determining solder paste production Recent Improvements in AC-DC Difference Calibration Service for
life, providing accurate and quick incoming inspection information for new solder Thermal Transfer Standards at NIS, Egypt
paste, and more tightly controlling changes in the solder paste during manufacturing.
Mamdouh M. Halawa, Electrical Metrology Department, National Institute
Keywords: Solder Paste, Flux, Activator, Substrate, Rheology, Activation Energy, for Standards (NIS)
SPC, Impedance, and Relaxation Time Constant.
This paper gives a brief summary of the AC-DC difference calibration
UID and RFID (A panel discussion) service for thermal transfer standards at the National Institute for Standards
(NIS), Egypt. Related subjects discussed include automated calibration
10:45 – Friday, January 26
system, bi-lateral intercomparison (with NPL, UK), the efficiency test, a new
Panel Moderator: Craig Macdougall, NSWC Corona, current shunt for thermal current converters, and recent research into thermal
craig.macdougall@navy.mil transfer standard.

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To check pipettes for good or bad conditions, the Medical Technologist must Accreditation
calibrate the pipette, use the calibration results to calculate uncertainty, and then
compare uncertainty results against the specification of the Standard Operating 2:00 – Friday, January 26
Procedure (SOP). This comparison method will help to determine the accuracy of Session Developer: Patty Leyva, NPSL, NPSL, patricia.leyva@navy.mil
the pipettes. From the Navy to NVLAP and Back Again – A Tale of Two Programs
This paper will demonstrate and provide examples on the role of Uncertainty Steve Doty, NSWC Corona, stephen.doty@navy.mil
Analysis for pipettes after their calibrations were performed in Medical Laboratories.
Bringing Calibration Maintenance Together: Asset Management for
Regulated Life Science Companies In 1981, a young man left a small town in Illinois to join the Navy and see the
world. He became involved in the Navy Metrology and Calibration Program as an
Bryce Johannes, Blue Mountain Quality Resources Instrumentman. Upon leaving the Navy after eight years, he went to work at the
Under regulatory and business pressures, life science companies are increasingly National Institute of Standards and Technology (NIST) as a member of the Pressure
looking for a single system to handle calibration and maintenance management. and Vacuum Group. Eight years later, he became a staff member of NIST’s National
Regulated life science companies are leading the way on this harmonization because Voluntary Laboratory Accreditation Program (NVLAP). In 2005 and not quite as
of the unique collaboration required in order to keep equipment, instruments, and young, he finds himself as the Program Manager for the Joint Naval Audit
processes in the validated state. In this context, information sharing, automatic Certification Program (JNAC). These are his stories. This paper examines the
notifications, and change control approval routing are all key areas of collaboration requirements, processes, similarities, and differences of the two programs. This paper
made easier under a single system. will also discuss recent accomplishments and future plans of the Joint Naval Audit
Certification Program.
In some cases, because of the volume of calibrations and strict compliance
requirements, calibration personnel have been able to convince management to use Managing Change in an ISO/IEC 17025 Environment
their best-in-class calibration system for maintenance management as well. For Kelly Huckabone, Fisher Scientific Canada
maintenance, however, this has meant giving up work orders and integrated inventory
management. Just as commonly, the maintenance personnel, because of their The word “change” has many different definitions. Some as elegant as “becoming
typically larger budgets and impact on productivity, have been able to push their different in essence” or as rigid as “a deviation from a currently established baseline”.
system on calibration. For calibration personnel, this usually means using a work Whatever the definition, the word “change” can evoke fear in people if the change is
order system that adds several minutes to each calibration and giving up richness and not clearly communicated and implemented in a planned and systematic fashion. In
usability in such key areas as measurement data collection and reverse standards an ISO/IEC 17025 environment, “change” can create havoc and jeopardize the
traceability. integrity of the Management System if not implemented correctly. A mature 17025
Management System can support change much more effectively than a system in the
This presentation will provide an overview of the driving forces behind this early stages of development (recent accreditation).
harmonization and the latest solutions for bringing calibration, maintenance, and
validation personnel into a single software system without requiring anyone to Walk Like an Egyptian – Get Accredited
compromise on their productivity or compliance. Bill Thompson, NSWC Corona, william.e.thompson@navy.mil
For many years the United States government has shared a successful foreign
relationship with the Egyptian government. Part of that relationship has been
Public Safety between the United States Militaries and the Egyptian Militaries for procurement and
2:00 – Thursday, January 25 support of military air and sea platforms and hardware. In particular, the United
States Navy has played a vital role in establishing a metrology program with the
Session Developer: Hershal Brewer, International Egyptian Air Force.
Accreditation Service (IAS) The Ancient Egyptian Measurement system has been noted as one of the
Verification of Electrical Safety Testers: A Better Approach foundations for today’s measurement system. The system is identified as one of the
earliest uniform systems of weights and measures. Most metrology engineers and
Dale Beard, Fluke Corporation
technicians are familiar with the ancient Egyptian Royal Cubit as the standard used
Instrumentation to test the safety of electricity installations, appliances, machines, to measure length during the rule of the Pharaohs. Little did anyone know that the
and electrical/electronic devices is becoming more prevalent, driven by new regulatory measurement system that was used to build the pyramids would be carried to
standards designed to protect users from electrocution and fire hazards. Examples of establish, what is today, the largest U.S. recognized ISO/IEC 17025 Accredited
mandatory, annual testing standards are the UK EN 61557 and the German equivalent, Egyptian Primary Standards Laboratory in the Middle East.
VDE 0100. Both are to ensure safety compliance in commercial and residential electrical
installations. Other standards, like EN 60601/60335/60950/61010 and VDE 0700, are How big is the lab? What were some of the hurdles to get over to establish a
designed to ensure the safety of electrical appliances and machines. Other types of laboratory of this magnitude and capability in the middle of the desert? What are the
safety compliance testing are done in the final stages of electronic device manufacturing measurement parameters of the lab? What are the accuracies of the measurement
to ensure product safety and robustness, to comply with standards like CE. As these parameters? What did it take to get an ISO/IEC 17025 Certificate of Accreditation?
standards have become mandatory in numerous countries throughout the world, Where do we go from here? All of these questions, and more, will be answered in
electrical safety tests are becoming commonplace as test specialists, technicians, and this paper and presentation as we learn to Walk Like An Egyptian - Get Accredited.
production engineers need to demonstrate that installations, appliances, and devices
conform to strict government or test body standards. The instrumentation used to
make these tests fall into a number of categories: Insulation testers, Installation testers, Calibration Issues in FDA Regulated Environments
Portable Appliance Testers, Earth Resistance Testers, Ground Bond Testers, HiPot
testers, and Electrical Safety Analyzers. They are used in a variety of applications and 10:45 – Thursday, January 25
industries, from electrical appliance manufacturers, to electricians, contractors, hotels, Session Developer: Raul Troncoso, Amgen
hospitals, aerospace companies, plant maintenance, and so on.
Uncertainty Analysis for Pipettes in Medical Laboratories
In the past, it has been a challenge for metrologists to properly verify electrical
testers’ performance, especially for those testers with high voltages, high currents, and Sharon N. Nicholas, NSWC Corona, sharon.nicholas@navy.mil
extreme resistance measurement capability. This paper describes the functionality of Pipettes are the best tools, which are applied in Medical laboratories, for
the electrical testers and discusses requirements to verify their performance. It will also
transferring or liquoring the exact amount of sample volume in patient’s tests.
cover an improved method of verifying many of these devices and the challenges the
Therefore, pipettes require calibration at least every six months to check for accuracy
design engineers faced when building these techniques into a new calibrator.
and reproductivity.

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MEASUREMENT SCIENCE CONFERENCE


1280 BISON AVE., SUITE B9-530
NEWPORTBEACH, CA 92660
MSC 2007-Facing Pages:MSC 2007-Facing Pages.qxd 11/2/2006 3:36 PM Page 24

CONFERENCE REGISTRATION
2007 MEASUREMENT SCIENCE CONFERENCE SYMPOSIUM & WORKSHOP
NAME . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . CONFERENCE REGISTRATION INCLUDES:
COMPANY . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . REFRESHMENTS, LUNCHES, ONE COPY OF PROCEEDINGS,ONE DOOR
PRIZE TICKET, PRESIDENT’S RECEPTION
TITLE/DEPT. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

TOTAL CONFERENCE FEES: $______________


MAILING ADDRESS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CITY . . . . . . . . . . . . . . . . . . . . . .STATE . . . . . . . . . . .ZIP . . . . . . . . . . Measurement Science Conference
CREDIT CARD . . . . . . . . . . . . . . . . . . . . . . .EXP. DATE . . . . . . . . . . . . 1280 Bison Avenue Suite B9-530

MC VISA AMER.EXP Newport Beach, CA 92660

TELEPHONE ( ) . . . . . . . . . . . . . . .E-MAIL . . . . . . . . . . . . . . . . . . .
(REQUIRED FOR E-MAIL CONFIRMATION OF REGISTRATION) MAIL THIS FORM TO THE ADDRESS SHOWN ABOVE. WE WILL ACCEPT
VISA, MASTER CARD, AND AMERICAN EXPRESS
PLEASE INDICATE IF YOU:

HAVE ADA REQUIREMENTS HAVE SPECIAL MEAL REQUIREMENTS FOR PAYMENT: PLEASE MAKE CHECKS PAYABLE TO:
MEASUREMENT SCIENCE CONFERENCE.

NIST SEMINARS (2-Day Courses): JANUARY 22-23, 2007 (Monday-Tuesday) FOR REGISTRATION INFORMATION: CALL 1-866-672-6327
$725 ON OR BEFORE DECEMBER 15, 2006 $825 AFTER DECEMBER 15, 2006 OR E-MAIL TO 2007registration@msc-conf.com.

Select One:
N02 SEMINAR N03 SEMINAR N04 SEMINAR CANCELLATION POLICY:
IF WRITTEN NOTIFICATION OF CANCELLATION IS RECEIVED
MSC TUTORIAL WORKSHOPS: JANUARY 23-24, 2007 (Tuesday-Wednesday) BEFORE DECEMBER 15, 2006,
Please select ½-day Workshops or select full-day Workshops:
ALL REGISTRATION FEES (LESS $25.00) WILL BE REFUNDED.
2 Days $595 ON OR BEFORE DECEMBER 15, 2006
$695 AFTER DECEMBER 15, 2006
1 Day $495 ON OR BEFORE DECEMBER 15, 2006 Or Register Using the Internet at:
$595 AFTER DECEMBER 15, 2006
Tuesday January 23 – Tutorial Workshops
http://www.msc-conf.com

WORKSHOP P (AM only) WORKSHOP R (Full-day) WORKSHOP T


WORKSHOP Q (Full-day) WORKSHOP S (AM only) WORKSHOP U

Wednesday January 24 – Tutorial Workshops

WORKSHOP A WORKSHOP F WORKSHOP K/L (Full-day)


WORKSHOP C WORKSHOP G WORKSHOP M (Full-day)
WORKSHOP D WORKSHOP H WORKSHOP N (Full-day)
WORKSHOP E WORKSHOP O (Full-day)
WORKSHOP I (AM only; In conjunction w/Workshop J)
WORKSHOP J (PM only; In conjunction w/ Workshop I)

MEASUREMENT SCIENCE CONFERENCE:

JANUARY 25-26, 2007 (Thursday-Friday)

MSC (2 DAYS) $625 ON OR BEFORE DECEMBER 15, 2006


$725 AFTER DECEMBER 15, 2006
MSC (1 DAY) $525 ON OR BEFORE DECEMBER 15, 2006
$625 AFTER DECEMBER 15, 2006

THURSDAY ONLY FRIDAY ONLY

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