Download as pdf or txt
Download as pdf or txt
You are on page 1of 46

Recent Advances in

900 V to 10 kV SiC MOSFET Technology

David Grider, Ph.D.


Wolfspeed, a Cree Company
Dave.Grider@Wolfspeed.com or 919-607-8185
D. Grider, J. Casady, V. Pala, E .Van Brunt, B. Hull, S-H. Ryu, G-Y. Wang, J .Richmond, S. Allen,
J. Palmour, P. Killeen, B. McPherson, K .Olejniczak, B. Passmore, D. Simco, T. McNutt

A CREE COMPANY
©
©2015
2015Cree,
Cree,Inc.
Inc. All
Allrights
rightsreserved.
reserved.
2

© 2015 Cree, Inc. All rights reserved.


OUTLINE 3

• Cree/Wolfspeed Gen 3 MOSFETs


– Specific RDSON of 900V-1700V MOSFETs
– Rel data for smaller (65mOhm) 900V MOSFETs
• 900V, 10mOhm SiC MOSFET chip characteristics
– Static, dynamic, short-circuit, reliability
• 1.2kV & 1.7kV Gen 3 SiC MOSFETs Power and RF Division

• 3.3kV & 6.5kV SiC MOSFETs


– DC over temperature (3.3kV)
– Dynamic characteristics at temperature (3.3kV)
• 10kV SiC MOSFETs
– DC over temperature
– Dynamic characteristics at temperature
• Summary

© 2015 Cree, Inc. All rights reserved.


Cree/Wolfspeed
Gen 3 SiC MOSFETs

A CREE COMPANY
©©2015
2015Cree,
Cree,Inc.
Inc. All
Allrights
rightsreserved.
reserved.
ǜǓǓȈǖȉ 
ǕǓǔǘǾ
ǔǓ(˂ 
 5

Reduced pitch

Optimized doping

Gen 2 DMOS Gen 3 DMOS

Commercially released in 2013 as “C2M” product family at 1.2-1.7kV


Commercially released in 2015 as “C3M” product 65ȐǕǛǓ(˂ /Ǔǻǜ&
Design and automotive qualify 32mm2 chip which has >2X lower RDSON than any commercial FET

© 2015 Cree, Inc. All rights reserved.


NEXT-GEN SiC DMOS LOWERS RON,SP DRAMATICALLY 6

•Gen 3 SiC DMOS has


15 kV
lowest RON,SP in market
(mcm2) at VG = 20 V

10 kV
100 •Gen 3 SiC DMOS has
lower RON,SP than
trench SiC MOSFET
6.5 kV

2011 release
(1200V)
RON,SP (m

10 3.3 kV
Gen 1, CMF Family
1.2 kV 2013 release
(1200V & 1700V)
Gen 2, C2M Family
1.2 kV

R&D 1.2 kV
Gen 3 C3M
2015 release
900V (900V)
1 Ǖǻǖ(˂Ȗ(2
100 1,000 10,000
Breakdown Voltage (V)
 2ǜǓǓ$- ' . $.Ǖǻǖ(˂Ȗ(2

© 2015 Cree, Inc. All rights reserved.


CREE SiC MOSFET PORTFOLIO SUMMARY 7

TO-220-3 TO-247-3 TO-263-7

© 2015 Cree, Inc. All rights reserved.


LIFETIME PROJECTIONS FOR C3M065090 (900V, 65mOhm) 8

1E+09

1E+08

1E+07
T1% (slope based on Gen 2)
Projected Lifetime (Hours)

1E+06

1E+05

1E+04

1E+03
First failure
1E+02 in avalanche

1E+01
500 600 700 800 900 1000 1100 1200 1300

Vd Stress (Volts)

• 900V rating results in 65 years before the first projected 1% of failures


• At 1kV continuous voltage, projected failure time for first 1% is 9 years
• Avalanche rated: zero fails in 1,000 hours at 50 μA, V > 1200V

© 2015 Cree, Inc. All rights reserved.


LIFETIME PROJECTIONS FOR C3M065090 GATE OXIDES 9

~600M hours
~10M hours

MTTF (T50%)

T=150°C
Tested to Failure
35 parts per step

• Extrapolated VGS lifetime of ~600M hours at +15V (DC recommended operating point)
• Passed AEC-Q101 qualification of 3 lots x 77 parts with Ø fails in 1,000 hrs at VGS=15V, 150C

© 2015 Cree, Inc. All rights reserved.


SIMPLIFY DC FAST CHARGERS: 10
FB LLC RESONANT CONVERTER

Resonant Tank
Three-level (3L)

Two-level (2L) Resonant Tank


Silicon (overcome HV):
600V MOS to get >800V DC Link Silicon Carbide:
Three-level LLC Full bridge 900V SiC MOS (reliable up to 1kV)
Two-level FB ZVS LLC resonant
Typical switch 100 kHz – 200 kHz
Si to SiC Target switch >200 kHz – 400 kHz
 Complicated topology and control
 Additional clamp diodes  Reduce BOM cost by 20% & ˈ efficiency
 Simplify the converter design
 Reduce resonant tank size

© 2015 Cree, Inc. All rights reserved.


COST COMPARISON BETWEEN SILICON, SiC, AND GaN 11

Voltage Rating & Part # On-resistance & Distribution price


Technology Current at Tc = 100C per 100
900V IPW90R120C3 120 mohm $11.50
Silicon 23 A
900V C3M0065090J 65 mohm $9.62
Silicon Carbide 23 A
650V GS66508P-E05-TY 50 mohm $27.07
GaN 23 A

For High Speed Switches, SiC is currently the least expensive at 900V

© 2015 Cree, Inc. All rights reserved.


900V, 10mOhm SiC MOSFET
Die Characteristics

A CREE COMPANY
©©2015
2015Cree,
Cree,Inc.
Inc. All
Allrights
rightsreserved.
reserved.
ǜǓǓǔǓ(˂ $ 

 13

• Comparing 900V SiC MOSFET to 650V Si


• Lower positive temperature coefficient than Si superjunction MOSFET
– ǔǓ(˂ /Ǖǘʋ$)- . ./*ʸǔǗ(˂ /ǔǘǓʋ!*-900V SiC MOSFET
– ǔǚ(˂ /Ǖǘʋ$)- . ./*ʸǗǔ(˂ /ǔǘǓʋ!*-650V Si MOSFET
• No knee voltage as found in IGBT
45 120
40

Source Current
100
)
ON Resistance (m

35
30 80

Drain-Source
25
60
20
15 40
10
20
5
0 0
25 50 75 100 125 150 175 0 0.5 1 1.5 2 2.5
Temperature (C) Drain-Source Voltage

)!$) *)ǙǘǓǼǔǜ(˂Ǽ+-/)0( -
ǙǘǓǔǜǚǼ#//+ǽȟȟ222ǻ$)!$) *)ǻ*(ȟ"'ȟ
)!$) *)Ȑ
ǙǘǓǔǜǚȐȐ1ǓǕȘǓǓȐ )ǻ+!ǻ
Infineon 650V 100 A IGBT, Part No. IGZ100N65H5, http://www.infineon.com/dgdl/Infineon-IGZ100N65H5-DS-v02_01-EN.pdf.

© 2015 Cree, Inc. All rights reserved.


ǜǓǓǔǓ(˂ $
 

 14

• The 900V 10 m SiC MOSFET chip is capable of extremely fast transitions.


• In TO-247-3, LS in the gate driver loop will limit the switching speed.
TO-247-3 package and TO-247-4 package evaluated.
• TO-247-4 has a separate source return pin for the gate driver equivalent
circuit. VG,KS is not affected by the voltage drop in the source inductance LS2
introduced by the di/dt of the drain-source current.

TO-247-4
D

KS
S TO-247-3

© 2015 Cree, Inc. All rights reserved.


ǜǓǓǔǓ(˂ $
 șǙǓǓǼǔǓǓȚ 15

• LEFT: Comparison of Turn-OFF for 900V, 10 m SiC MOSFET in


TO-247-3 and TO-247-4 packages (RGʰǘ˂ǼGS=-4V/+15V)
• RIGHT: Comparison of Turn-ON for 900V, 10 m SiC MOSFET in
TO-247-3 and TO-247-4 packages (RGʰǘ ˂ǼGS=-4V/+15V)
Turn-OFF Turn-ON
800 160 800 160
RG = 5 Ohms RG = 5 Ohms
VDS TJ = TAmb = 25 °C TJ = TAmb = 25 °C
TO-247-4
600 TO-247-3 120 600 120

Drain-Source Current (A)

Drain-Source Current (A)


Drain-Source Voltage (V)

Drain-Source Voltage (V)


400 80 400 IDS 80
TO-247-4
IDS
TO-247-3
TO-247-4 VDS
TO-247-3
200 40 200 TO-247-4 40
TO-247-3

0 0 0 0

-200 -40 -200 -40


0 50 100 150 200 250 300 1200 1250 1300 1350 1400 1450 1500
Time(ns) Time(ns)

© 2015 Cree, Inc. All rights reserved.


ǜǓǓǔǓ(˂$


 16

~3.5X lower switching energy with Kelvin Source contact

• LEFT: Switching Energy losses at 25 C for 900V, 10 m SiC MOSFET in TO-247-3


package (RGʰǘ˂ǼGS=-4V/+15V, VDD=600V)

• RIGHT: Switching Energy losses at 25 C for 900V, 10 m SiC MOSFET in TO-247-4


package (RGʰǘ˂ǼGS=-4V/+15V, VDD=600V)
8 8
RG=5  RG=5 
7 TJ = Tamb = 25 C 7 TJ = Tamb = 25 C

Switching Energy Loss (mJ)


Switching Energy Loss (mJ)

6 6
ESW
5
TO-247-3L EON
5
TO-247-4L
4 4
3 3
TO-247-3 ESW
2 2 TO-247-4
EOFF
EON
1 1
EOFF
0 0
10 20 30 40 50 60 70 80 90 100 10 20 30 40 50 60 70 80 90 100
Drain-Source Current Drain-Source Current

© 2015 Cree, Inc. All rights reserved.


900V SIC MOSFET
BODY DIODE PERFORMANCE

A CREE COMPANY
©©2015
2015Cree,
Cree,Inc.
Inc. All
Allrights
rightsreserved.
reserved.
Third Quadrant Operation – Maximizing Efficiency
CMF20120D MOSFET at 25C
40

30

20

10
ID(A)

-10 0V
5V
-20
10V
15V
-30
20V
-40
-5 -2.5 0 2.5 5
VDS (V)

• SiC MOSFETs Have Built-In Body Diode That Can Be Exploited


In Applications Requiring Antiparallel Conduction
• Third Quadrant IV Characteristics are Parallel Combination of SiC MOSFET and PN diode
• Applying Positive Gate Bias Turns the SiC MOSFET Fully On
• Conduction is Symmetric for Positive and Negative VDS – Synchronous Rectification

© 2015 Cree, Inc. All rights reserved.


ǜǓǓǔǓ(˂ $
 

 19

• LEFT: 3rd Quadrant characteristics of the 900V, 10 m MOSFET at 175C


• RIGHT: Reverse recovery waveforms of the 900V, 10 m MOSFET at 25C
and 150C
• Body diode with 3rd quadrant an excellent option for bidirectional flow
• Reverse recovery time is only 56 ns.
-6 -5 -4 -3 -2 -1 0 100

TJ=175 C
0
80
QRR is 510 nC

Drain-Source Current (A)


VR=600V
-20
VGS=-4 V 60
IF=90A
Drain-Source Current

VGS=15V
VGS=0V
-40 40 di/dt=1200A/us
20
-60
0 25 C
-80
-20
-100 150 C
-40
1000 1025 1050 1075 1100 1125 1150 1175 1200
-120
Drain-Source Voltage Time (ns)

© 2015 Cree, Inc. All rights reserved.


SHORT-CIRCUIT TESTING OF 900V, 10mOHM SiC MOSFET IN TO-247-3L 20

• Tested 4us with VGS = 19V


• IDS was not captured on scope, but was >406A
• At VDS = 500V, peak voltage was 645V, and device survived
• At VDS = 600V, peak voltage was 755V, and device failed
• Consistent with or above typical commercial SiC MOSFETs capability

IDS off scope (>406A) IDS off scope (>406A)

Device survived
Device failed

VDS=500V; tSC=4us; VGS=+19V VDS=600V; tSC=4us; VGS=+19V


Test results courtesy of:

© 2015 Cree, Inc. All rights reserved.


900V SiC MOSFET
Half-Bridge Module
Characteristics

A CREE COMPANY
©©2015
2015Cree,
Cree,Inc.
Inc. All
Allrights
rightsreserved.
reserved.
900V, 400-800A, SiC HALF-BRIDGE POWER MODULES 22

• .. (' ǜǓǓǼǔǓ(˂ $


chips in ½ - bridge module
– Ǘ#$+.ȟ.2$/#+*.ǻȒ Ǖǻǘ(˂ (*0'
– Ǜ#$+.ȟ.2$/#+*.ǻȒ ǔǻǕǘ(˂ (*0'

• HTRB (150°C) completed


– 6 modules (48 MOSFETs)
– 1000 hrs; Zero failures
• HTRB (175°C) completed
– 5 modules (same modules
.ǔǘǓ˯/ ./Ț
– 850 hrs; Zero failures

© 2015 Cree, Inc. All rights reserved.


BENCHMARK 900V SiC & 650V Si POWER MODULES 23

• 900V SiC XAB350M09HM3 compared with


650 V EconoDUAL3 Si IGBT
• 250 V higher blocking voltage
• 10-20x lower body diode recovery, gate
charge, and reverse transfer capacitance.
• Symmetrical 3rd quadrant conduction
• Lower on-state losses

Parameter Wolfspeed XAB350M09HM3 silicon FF450R07ME4_B11


Package HT-3000 (custom) EconoDUAL3ȫ
Blocking voltage (V) 900 650
TJ,MAX (°C) 175 150
RDS, ON ș(˂ȚșǕǘʋȟǔǘǓʋȚ 2.5 / 3.6 N/A
IDS @ 150°C (A) 405 430
QG (nC) 648 4800
QR @ 150°C (µC) 2.02 (0.504 x 4) 35.5
Input capacitance, Ciss / Cies (nF) 15.7 (3.93 x 4) 27.5
Rev. transfer cap, Crss / Cres (pF) 72 (18pF x 4) 820

© 2015 Cree, Inc. All rights reserved.


900V, HALF-BRIDGE – 4 DIE/SWITCH; SWITCHING ENERGY 24

900 V, 10 mΩ Half-Bridge Module (XAB700M09HM3)


(Vbus = 600 V, RG,ext = 5 Ω, L = 16 uH)
20 • 900V SiC
Total Switching Energy XAB350M09HM3
Switching Energy (mJ)

15 • 4 MOSFETs /
switch
10 Turn-on Energy • Switching 600V
• ET =5mJ @ 100A
5
• ET =10mJ @ 200A
Turn-off Energy
0
0 50 100 150 200 250 300 350 400
Drain-Source Current (A)

Switching energies 4-7X lower than comparable Si IGBT modules

© 2015 Cree, Inc. All rights reserved.


IMPACT OF 900V SiC IN EV 25

Compared with Si inverter, SiC reduces inverter losses ~67%


in combined EPA drive cycle

•Assume Ford Focus EV equipped with 90kW IPM motor


•C-Max 90kW Si IGBT inverter or Wolfspeed 88kW SiC inverter
as the traction drive
•Synchronous rectification of SiC devices; no diodes in
parallel with SiC MOSFETs

Simulation data courtesy of


Ford Motor Company,
based on measured results
of Wolfspeed 900V, C3M
10mOhm SiC MOSFETs

© 2015 Cree, Inc. All rights reserved.


1200V and 1700V SiC MOSFET data

A CREE COMPANY
©©2015
2015Cree,
Cree,Inc.
Inc. All
Allrights
rightsreserved.
reserved.
1.2kV & 1.7kV GEN 3 SiC MOSFETs 27

1.2kV SiC MOSFET 1.7kV SiC MOSFET

Spec RDSON 2.7m˂Ȗcm2

• Nominally a 75A SiC MOSFET • Nominally a 67A SiC MOSFET


• RDSONmax at room temp ~ǔǙ(˂ • RDSONmax at room temp ʸǕǓ(˂
• RDSONmax /ǜǓ˯ʸǕǔ(˂ • RDSONmax /ǜǓ˯ʸǕǛ(˂

© 2015 Cree, Inc. All rights reserved.


3300V and 6500V SiC MOSFET data

A CREE COMPANY
©©2015
2015Cree,
Cree,Inc.
Inc. All
Allrights
rightsreserved.
reserved.
3.3kV & 6.5kV GEN 3 SiC MOSFETs 29

3.3kV SiC MOSFET 6.5kV SiC MOSFET

Spec RDSON 11m˂Ȗcm2

• Nominally a 40A SiC MOSFET • Nominally a 20-30A SiC MOSFET


• RDSONmax at room temp ʸǗǔ(˂ • RDSONmax at room temp ʸǔǓǓ(˂
• RDSONmax /ǜǓ˯ʸǜǛ(˂ • RDSONmax /ǜǓ˯ʸǔǚǔ(˂

© 2015 Cree, Inc. All rights reserved.


ǖǻǖ&ǼǗǘ(˂$
DSON vs T and IDS 30

3 120 150°C
TJ = 150 C
2.5 100
On Resistance, RDS ON (p. u.)

On Resistance, RDS ON (m)


2 80 100°C
T = 100 C
J

1.5 60
25°C
T = 25 C
J

1 I = 50A
IDS = 50 A
VDS
GS = 20 V
40
tp < 50 μs VGS = 20 V
0.5 VGS=20V 20
tp < 50 μs

tp < 50µs
0 0
25 50 75 100 125 150 0 10 20 30 40 50
Junction Temperature, TJ (C) Drain-Source Current, I DS (A)

Normalized On-Resistance vs. Temperature On-Resistance vs. Drain Current

• 2.5X increase in RDSON from 25°C to 150°C


• Positive temperature coefficient
• Devices can be readily paralleled

© 2015 Cree, Inc. All rights reserved.


GEN3 3.3kV 45m SIC MOSFET-INITIAL HTRB DATA 31

• Accelerated HTRB Testing (3.3kV – at 150°C ) of


 )ǖǖǻǖ&ȟǗǘ(˂ $
• No Accelerated HTRB Failures Observed Up To 660 Hours
1000

100
IDSS (μA)

10

0.1
0 100 200 300 400 500 600 700
Time (h)
© 2015 Cree, Inc. All rights reserved.
ǖǻǖ&ǼǗǘ(˂$

 32

• SiC body diode can eliminate external anti-parallel SiC diode


• Elimination of external anti-parallel diode saves cost and space
• Third quadrant operation of MOSFET possible for additional savings

© 2015 Cree, Inc. All rights reserved.


GEN3 3.3KV SIC MOSFET
33
ǕǘǓȟǕǻǕ 


 ȐʰǕǻǘ˂

VDS = 0V/+2.2kV

IDS = 0A/+250A

Switching Speed <150ns; Minimum Overvoltage (No Snubber)


© 2015 Cree, Inc. All rights reserved.
3.3kV SIC MOSFET SWITCHING LOSS PERFORMANCE @ 25°C 34
Double Pulse Test
'$)& ʰǕǻǕ&Ǽ"Ș 3/ ʰǕǻǘ˂ Vlink = 2.2 kV, Ids = 250 A

• At 2.2kV, 180A switching event, 45mJ total switching energy


• 3.3kV SiC MOSFETs switching losses are 10-15x lower than 3.3kV Si IGBTs

© 2015 Cree, Inc. All rights reserved.


SiC XHPȫ STYLE MODULE - INDUSTRY STANDARD HOUSING 35

• Engineering Sample
sales
• Up to 12 MOSFETs/
switch available
• Ultra-Fast Switching,
Low Inductance (<20
nH V+ to V-)
• Companion gate
driver
• Desaturation protection,
temperature sensing,
programmable UVLO
with hysteresis, galvanic
signal isolation, & on-
board isolated power
supplies.

© 2015 Cree, Inc. All rights reserved.


10kV SiC MOSFETs

A CREE COMPANY
©©2015
2015Cree,
Cree,Inc.
Inc. All
Allrights
rightsreserved.
reserved.
Measured I-V Characteristics at 150C of Enhanced Short Circuit
Capability and Baseline Gen3 10 kV/350 mOhm SiC MOSFETs 37

• Very Small Difference in On-Resistance (RDS,on) at 150 C

• Enhanced Short Circuit 10 kV SiC MOSFET has Higher Threshold Voltage

Enhanced Short Circuit Gen3 Baseline Gen3 10kV/350mOhm


10kV/350mOhm SiC MOSFET SiC MOSFET

20 20
8.1 mm

18 18
16 16 5, 10,15,20 V

8.1 mm
14 15, 20 V 14
12 12

IDS (A)
IDS (A)

10 10
8 10 V 8
6 6
4 4
2 0,5 V 2 0V

0 0
0 2 4 6 8 10 12 14 0 2 4 6 8 10 12 14
VDS (V) VDS(V)

© 2015 Cree, Inc. All rights reserved.


Short Circuit Simulation/Test of Gen 3 10 kV/350 mOhm
SiC MOSFETs With Enhanced Short Circuit Capability 38

• Demonstrated Gen3
10 kV/350 mOhm SiC MOSFETs
Capable of Sustaining
Short Circuit Current
For > 13 µsec at 5000V
• Measurement and Simulation
Courtesy of Al Hefner at NIST

© 2015 Cree, Inc. All rights reserved.


10 kV SIC MOSFET BODY DIODE STATIC CHARACTERISTICS 39

• 10 kV body diode is bipolar – lower resistance than a 10 kV JBS diode at high


temperatures
• Reverse conducting antiparallel SiC JBS diode can be eliminated

25 C 150 C
20 20
18 18
16 16
14 14
Amperes (A)

Amperes (A)
12 12
10 10
8 8
6 6
4 4
2 2
0 0
0 5 10 15 0 5 10 15
VF (V) VF (V)

© 2015 Cree, Inc. All rights reserved.


Gen3 10kV/350mOhm SiC MOSFET Body Diode Switching - 40
Body Diode Has Low Reverse Recovery Loss
• Body Diode Has Excellent Dynamic Characteristics  Low Reverse Recovery

© 2015 Cree, Inc. All rights reserved.


Gen3 10kV/350mOhm SiC MOSFET Body Diodes
41
Exhibit Stable Performance Under Constant Bias Stress
12
Body Diode VF (V)

10
8
6 10 kV SiC MOSFET
4
2
0
0 100 200 300 400 500 600
Hours
12
MOSFET VDS,ON at IDS = 20 A

51.8 mm2 devices


10
8
6
4 65.6 mm2 devices

2
0
0 100 200 300 400 500 600
Stress Time (Hrs)

© 2015 Cree, Inc. All rights reserved.


½ BRIDGE CONFIGURED MEASURED SWITCHING ENERGIES AND WAVEFORMS42

ETS measured
10-33mJ

ETS =21mJ
at 7kV, 15A,
ǕǓǻǙ˂ G

½ bridge configuration used for switching


( .0- ( )/.*!ǔǓ&ǼǖǗǘ(˂$
in both the high position and low positions.

© 2015 Cree, Inc. All rights reserved.


SUMMARY 900V TO 10kV GEN 3 SiC MOSFETS 43

900-1700V low-
• SiC MOSFETs released in 2011 profile 62mm

• > 20 SiC MOSFET discretes in market


• Gen 3 SiC MOSFETs entering market 900-1700 V low
profile
VDSmax(V) Chip RDSON Comments
ș(˂Ț
900 10 65m˂ released 2015
Engineering samples
1200 16 Engineering samples
1700 20 Engineering samples
3.3-6.5 kV
3300 41 Engineering samples Half-Bridge
6500 100 Engineering samples
10000 350 Engineering samples 10kV XHV-6
Half-bridge
© 2015 Cree, Inc. All rights reserved.
44

© 2015 Cree, Inc. All rights reserved.


Questions or Discussion?
ACKNOWLEDGMENT
The information, data, or work presented herein
was funded in part by DOE-EERE (DE-EE0006920),
DoD-ONR (N00014-D-0145), and DoD-ARL (W911NF-12-2-0064)

EV drive cycle data analysis based on measured 900V SiC MOSFET data
provided by Dr. Chingchi Chen and Dr. Ming Su, Ford Motor Company

A CREE COMPANY
©©2015
2015Cree,
Cree,Inc.
Inc. All
Allrights
rightsreserved.
reserved.
A CREE COMPANY
©
© 2015
2015 Cree,
Cree, Inc.
Inc. All
All rights
rights reserved.
reserved.

You might also like