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MosfetSiC, Info, Grider-Wolfspeed-Cree - Grider
MosfetSiC, Info, Grider-Wolfspeed-Cree - Grider
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2
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5
Reduced pitch
Optimized doping
10 kV
100 •Gen 3 SiC DMOS has
lower RON,SP than
trench SiC MOSFET
6.5 kV
2011 release
(1200V)
RON,SP (m
10 3.3 kV
Gen 1, CMF Family
1.2 kV 2013 release
(1200V & 1700V)
Gen 2, C2M Family
1.2 kV
R&D 1.2 kV
Gen 3 C3M
2015 release
900V (900V)
1 Ǖǻǖ(˂Ȗ(2
100 1,000 10,000
Breakdown Voltage (V)
2ǜǓǓ$- ' . $.Ǖǻǖ(˂Ȗ(2
1E+09
1E+08
1E+07
T1% (slope based on Gen 2)
Projected Lifetime (Hours)
1E+06
1E+05
1E+04
1E+03
First failure
1E+02 in avalanche
1E+01
500 600 700 800 900 1000 1100 1200 1300
Vd Stress (Volts)
~600M hours
~10M hours
MTTF (T50%)
T=150°C
Tested to Failure
35 parts per step
• Extrapolated VGS lifetime of ~600M hours at +15V (DC recommended operating point)
• Passed AEC-Q101 qualification of 3 lots x 77 parts with Ø fails in 1,000 hrs at VGS=15V, 150C
Resonant Tank
Three-level (3L)
For High Speed Switches, SiC is currently the least expensive at 900V
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ǜǓǓǔǓ(˂ $
13
Source Current
100
)
ON Resistance (m
35
30 80
Drain-Source
25
60
20
15 40
10
20
5
0 0
25 50 75 100 125 150 175 0 0.5 1 1.5 2 2.5
Temperature (C) Drain-Source Voltage
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Infineon 650V 100 A IGBT, Part No. IGZ100N65H5, http://www.infineon.com/dgdl/Infineon-IGZ100N65H5-DS-v02_01-EN.pdf.
TO-247-4
D
KS
S TO-247-3
0 0 0 0
6 6
ESW
5
TO-247-3L EON
5
TO-247-4L
4 4
3 3
TO-247-3 ESW
2 2 TO-247-4
EOFF
EON
1 1
EOFF
0 0
10 20 30 40 50 60 70 80 90 100 10 20 30 40 50 60 70 80 90 100
Drain-Source Current Drain-Source Current
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Third Quadrant Operation – Maximizing Efficiency
CMF20120D MOSFET at 25C
40
30
20
10
ID(A)
-10 0V
5V
-20
10V
15V
-30
20V
-40
-5 -2.5 0 2.5 5
VDS (V)
TJ=175 C
0
80
QRR is 510 nC
VGS=15V
VGS=0V
-40 40 di/dt=1200A/us
20
-60
0 25 C
-80
-20
-100 150 C
-40
1000 1025 1050 1075 1100 1125 1150 1175 1200
-120
Drain-Source Voltage Time (ns)
Device survived
Device failed
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900V, 400-800A, SiC HALF-BRIDGE POWER MODULES 22
15 • 4 MOSFETs /
switch
10 Turn-on Energy • Switching 600V
• ET =5mJ @ 100A
5
• ET =10mJ @ 200A
Turn-off Energy
0
0 50 100 150 200 250 300 350 400
Drain-Source Current (A)
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1.2kV & 1.7kV GEN 3 SiC MOSFETs 27
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3.3kV & 6.5kV GEN 3 SiC MOSFETs 29
3 120 150°C
TJ = 150 C
2.5 100
On Resistance, RDS ON (p. u.)
1.5 60
25°C
T = 25 C
J
1 I = 50A
IDS = 50 A
VDS
GS = 20 V
40
tp < 50 μs VGS = 20 V
0.5 VGS=20V 20
tp < 50 μs
tp < 50µs
0 0
25 50 75 100 125 150 0 10 20 30 40 50
Junction Temperature, TJ (C) Drain-Source Current, I DS (A)
100
IDSS (μA)
10
0.1
0 100 200 300 400 500 600 700
Time (h)
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ǖǻǖ&ǼǗǘ(˂$
32
VDS = 0V/+2.2kV
IDS = 0A/+250A
• Engineering Sample
sales
• Up to 12 MOSFETs/
switch available
• Ultra-Fast Switching,
Low Inductance (<20
nH V+ to V-)
• Companion gate
driver
• Desaturation protection,
temperature sensing,
programmable UVLO
with hysteresis, galvanic
signal isolation, & on-
board isolated power
supplies.
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Measured I-V Characteristics at 150C of Enhanced Short Circuit
Capability and Baseline Gen3 10 kV/350 mOhm SiC MOSFETs 37
20 20
8.1 mm
18 18
16 16 5, 10,15,20 V
8.1 mm
14 15, 20 V 14
12 12
IDS (A)
IDS (A)
10 10
8 10 V 8
6 6
4 4
2 0,5 V 2 0V
0 0
0 2 4 6 8 10 12 14 0 2 4 6 8 10 12 14
VDS (V) VDS(V)
• Demonstrated Gen3
10 kV/350 mOhm SiC MOSFETs
Capable of Sustaining
Short Circuit Current
For > 13 µsec at 5000V
• Measurement and Simulation
Courtesy of Al Hefner at NIST
25 C 150 C
20 20
18 18
16 16
14 14
Amperes (A)
Amperes (A)
12 12
10 10
8 8
6 6
4 4
2 2
0 0
0 5 10 15 0 5 10 15
VF (V) VF (V)
10
8
6 10 kV SiC MOSFET
4
2
0
0 100 200 300 400 500 600
Hours
12
MOSFET VDS,ON at IDS = 20 A
2
0
0 100 200 300 400 500 600
Stress Time (Hrs)
ETS measured
10-33mJ
ETS =21mJ
at 7kV, 15A,
ǕǓǻǙ˂ G
900-1700V low-
• SiC MOSFETs released in 2011 profile 62mm
EV drive cycle data analysis based on measured 900V SiC MOSFET data
provided by Dr. Chingchi Chen and Dr. Ming Su, Ford Motor Company
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A CREE COMPANY
©
© 2015
2015 Cree,
Cree, Inc.
Inc. All
All rights
rights reserved.
reserved.