Focusing with Phased Array
The aim of this article is to provide a brief introduction to focusing
used during Phased Array inspections in general industry (Weld and
Plate Inspection).
AUTHOR: PAUL GROSSER - DIRECTOR, NDT ATTAR
(One of the numerous advantages of Phased Array (PA) over
conventional Ultrasonics (UT) is the ability to focus the
beam to increase sensitivity and resolution over a range
of thicknesses.
Natural Beam Profile (Unfocused)
‘The shape of the unfocused beam Is controlled by those
factors that control the Near Zone. In Phased Array these
are:
= Wavelength, determined by velocity and frequency
+ Probe Element Pitch, distance between centre of
elements
+ Aperture Active Elements, number of elements
electronically fired to form a single array.
Conventional Focusing (Mechanical)
«= Has the capability to converge the acoustic energy
into a small focal spot
* Inn unfocused conventional probe, the Focal point
is the end of the Near Zone
* Focusing cannot occur beyond the Near Zone
+ The increase in sensitivity is a function of the reduction
of the beam width when the beam is focused
* Focusing decreases the depth of field (DoF), the distance
between the nearest and farthest reflectors in a beam
that provide acceptable sensitivity for detection
+ Focusing generally done mechanically, ata fixed
distance.
Phased Array Focusing (Electronic)
= Has the capability to converge the acoustic energy
Into a small focal spot
+ Allows for focusing at several depths, using a single
probe
= Can only perform in the steering plane, when using a
ID-array
+ Focusing decreases the depth of field (DoF), the distance
between the nearest and farthest reflectors in a beam
that provide acceptable sensitivity for detection
+ Focusing cannot occur beyond the Near Zone
+ Active Aperture = element pitch x number active
elements
+ Focusing performed electronically
Figure 1: Showing effect of aperture size on Near Zone and beam profile
Figure 2: Depth Comparison:
+ Probe | is unfocused at 48.6mm (NZ depth). Probe 2 s focused
e25mm depth
+ 25mm: Probe 2 increased sensitivity as compared to Probe |
175i: Probe 2 lower sensitivity as compared to Probe |
(reduction in DOF
Industrial Eye May/June 2016Determination of Beam Diameter
Focusing the beam within the Near Zone results in
reduction in the diameter of the beam at the focal point.
This reduction in beam diameter increases overall
sensitivity at this point due to the increase in sound energy
power unit area.
‘The formula for calculation of beam diameter within the
near zone is:
BD = 0.88 Fe/tA
Where:
BD = Beam diameter (rm)
F ocal Depth (mm)
c peed of sound (km/s)
f = Frequency (MHz)
A = Aperture size (mim)
In Figure 3, you can see that the beam diameter reduced
from 4.2mm at the Near Zone unfocused depth, to 1.6mm
at the focal depth of 30mm. This results in an increase of
sound intensity by a factor of 6.9.
lis econ aes Maximum depth of focusing with
focused at 30mm depth Phased Array
+ 30mm Aperture 2 Increased sensitivity as compared to Prabe The following tables show the maximum denth of focusing
+ 13mm: Aperre 2 owe sensi 25 compare Aperture for a range of typical PA setups
Table 1: Zero Degree, Contact - No Wedge
‘The formula for calculation of near zone is: Frequency | Pitch | Active | Aperture | Velocity | Max
aka are) [rm | Elemeces | size |’) | Foca
Where: nm)
NZ = Near Zone (mm) 5 06 [16 96 59 [195
A= Aperture size (mm) 5 06 [32 1925.9 | 781
= Wavelength (mm) 5 0.75 |16 12 5.9 [305
5 0.75 [32 24 5.9 [122.0
5 1 ie [16 5.9 [542
5 1 [se [32 59 [2169
‘Table 2: Zero Degree, Perspex Wedge 20mm Thick
Frequency | Pitch | Active Aperture Wedge Near Material | Max
(MHz) (mm) Elements Size Velocity Zone In | Velocity | Focal
| (nm) | (km/s). Wedge’ | (km/s). | Depth in
| (mm) Material
| um)
Ee CS 96 [27/200 _|59 [104
5 0.6 [32 192 [27 (200 (5.9 168.9
5 0.75 [16 12 27200 [5.9 [20a
5 075 [sz (2a 27200 (5.9 | 129
5 ieee 16 27 [200 (39 [45.1
5 1 (se fae [too so aor
Industrial Eye May/iune 2016 B‘Table 3: Angle Scan - 45 Degrees, Assumed Element Height in Wedge 10mm
Frequency | Pitch [Active | Aperture | Wedge Material [Refracted |Max |
(sttiz) | (mm) | Elements | Size Velocity |()in Wedlge Velocity | () in Focal
(mm) (km/s) | Wedge (mm) | (km/s) | Material | Depth in
Material
LL (mm) |
5 6 je 9s lar pee [as [a2 [4s 16.2
5 06/32 19.2 27, 36.6 [125 (3.2 45 92.6
5 0.7516 2 27 (366 [125 (3.2 45 30.5
5 0.75_|32 [za 27 [366 [125 [3.2 45 149.8
5 1 ite 16 27 [366 [125 [3.2 45 a4 |
5 1 [32 32 27 [366 (i2s ‘| 32 45 273.6
‘Table 4: Angle Scan - 70 Degrees, Assumed Element Height in Wedge 10mm
Frequency | Pitch | Active | Aperture | Wedge | Incident | NZ Material | Refracted | Max
(MHz) | (mm) | Elements | Size Velocity |()in | Wedge Velocity |) in Focal
(mm) (m/s) | Wedge (mm) (km/s) _| Material Depth in
Material
(um)
5 o6 [16 96 2752s [lea | 32 70 45
5 06 [32 19.2 27 [sas lea (3.2 70 ALS
5 075 [16 12 27 525 [164 3.2 70 ns
5 0.75 [32 24 27 525 [164 [32 70 2 |
5 16 16 27825 [16a (3.2 70 264
5 1 [32 32 27525 ‘(164 [3.2 70 129.0
Discussion Conclusion
From the above tables the following observations are clear:
+ Probe Pitch and Number of Active Elements have major
affect on the maximum depth of focusing.
= Wedge size and starting element will have a pronounced
affect on maximum depth of focusing.
+ Inspections at increasing angles will have a pronounced
affect on maximum depth of focusing.
‘As the large majority of Phased Array units sold to date
(over 80%) have a Maximum Active Aperture of 16 elements,
the restriction is generally in the phasing unit rather than
probe parameters.
“The above tables show the parameters of the most
commonly used phased array probes.
Recent developments in probes designed with large element
pitches have significantly increased the possible available
active aperture. These include the Olympus NDT probe
range A3 & A4 that use element pitches between 1.2mm,
and 2.8mm.
34
Focusing with phased array provides significant
improvements in inspection sensitivity and resolution
at the cost of depth of field,
Note: Options such as Dynamic Depth Focusing (ODF)
can be used to increase depth of field.
‘Maximum Depth of focusing is much less that most
inspectors expect and is limited by probe selection
and phasing hardware.
“An understanding of the physics
behind the focusing allows inspectors
to use suitable configurations to
maximise the inspection capability.”
Industrial Eye May/lune 2016,