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Australian/NewZealandStandard™

Explosiveatmospheres

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 2

PREFACE

ThisStand
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 3
CONTENTS

Page
FOREWORD.. 8
Scope .
9
2 Normativer
efe
ren
ces .14
3 Termsandd
efi
nit
ios.
n .
.
..
..
.
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.・
・ -…
…・・
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...
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………
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.15 H

4 Groupingandc
las
sif
ica
tio
nofi
ntr
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llys
afeapparatusanda
ssoc
iate
dapparatus.
...
...
20
5 Levelso
fpr
ote
cti
onandi
gni
tio
ncompliancerequirementso
fel
ect
ric
ala
ppa
rat
us.
...
...
...
..2
1
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Gener
al.
.....・・・
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..
..
..
..
..
..
.
a.
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- 一 日 …
・田 ・・ ー 一-.
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.21
Levelofprotectio
n"ia
同
Levelofprotectio
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22
Levelofprotectio
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一一… ・・・-一ー…… . ...
.22 a H H

Sparkigniti
oncompliance. ..
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.. ー 一 ・・ ・・ ー ー 目
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..
..
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.・. ・..
.22 H a H

Thermali g
nitincompliance.
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.ー ー ・ ・・・ ー一 ・・ . ...
...
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22
5.
6 .
1 G e
neral
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.....
..・・ ..…ーー……....・ ・
H - 一.........・一一…・ . ..
....
2
a2
5.6.2 Temperaturef orsmallcomponentsf o
rGroup1andGroup1. ...
..
..
...
...
..
...
...
23
5.6.3 Wiringw ithi
ni ntr
ins
ical
lysafeapparatusforGroup1andGroup1..ー . ..
.23
5.6.4 Tracksonprintedc irc
uitboardsforGroup1andGroup1. ..
.. ー・
. 目
・ ・・ ..24 H H

5.6.5 I n
trins
ical
lys afeapparatusandcomponenttemperatureforGroup111.
..・・..25 H
(
官WMEacot言明uoo

5.7 Simpleappa
ratus
...・・ ー…・・ ・・ 一日・・・ 一一 a ・・
・ー .
...26
6 Apparatusc
ons
truct
ion..
...
.
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.
・ ・
.
...
..
.
..
..
.
..
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.
.・ ・・
-目
…一 一 一…… ー
ー …・・ ...27
﹄

H H H

6
.1 Enclosures…… ………… 一 ………・ ー・ u .
..
...
..
...
..
...
..
...
...
..
...
...
.27
6.
1.1 G ene
ral...・・- 一 ー・……
. ..
.... 一…… . .
...
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..
..
...
.
a.
..
...
..
...
..
...
..
...
..
...
...
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.27
“

1.2 Enclosuresf rGroup1apparatus・. ・ .

.
…・
・ ー
ー・….
E E国コ田村ot 弘u

6. orGroup1o ..
...
...
..27 H

6.1
.3 Enclosuresf orGroup11apparatus…
1 …
・ ..
..
..
..
.
...
..
.. 一 一 ・ー .
...28
6
.2 Fa
cilit
iesforconnectionofext
ernalcir
cuis.
t .
..
.
..
..
.
..
..
.
・ ・ .....一…...・ ・ .
...
...
...
...
.28 H H

6.2.
1 Terminals. .
..
..
...
..
..
...
..
...
..
..
..
..
...
..
..
. 一 . ……・ー ーー …・…… .28
cωとコO主@ EコUO

6.2.2 Plugsands ock

ets...・ ー ・・
・.. ..
... … ・・・…・.
.......・…. ..31
6.2.3 Determinationo fmaximume xtern
alinductancetoresi
stanc
er a
tio
(Lol
Rolforresistancei
Imitedpowersource ….
.
.・ ・..
..
... 一日 . ...
..31 H

6.2.4 Permanentlyconnectedcable. .
.. ー .
.
..
.
..
.
・ ・・・ -
ーー ・
.目 -
・...
...
...
...
...
...
32 a a
口)NFDN00

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6.2.5 Requirementsf orconnectionsandaccessoriesf o

rISapparatuswhen
locate
dint henon-hazardousarea ・ ・ ー一 ー . ..
..
…… ー -…・…… 32
6
.3 Separationdista
nces...
..
..
.
..
.・ ・ ..…一 一…・…・ ・・ ー ー ー・・ ・ ー ー ・ .33
ロド NCOω﹄コ官。﹀官官勺白Z﹂ω 訴戸EUUX寸haRuoωω000︿

6.3
.1 General… ・・ ー … ..
.
・ ・ .
.
..
..
..
..
..
..
..
..
・ ・ .
..
.
...
..
. 一 一 ...
...
...
...
...
...
33H H

6.3.2 Separationo fconductiveparts....

.・….
..…
....
....
...
...
....
...
....
・. ...
...
....
...
33
6
.3.3 Voltagebelweenc onductivepaはs. .
". ・
. ーー 一 . ..…
固い 一 ー …. ...
..37
6
.3.4 Clearance. ..
...
....
....
....
....
...
....
....
...
...
...
...
...
...
...
....
..….
..
.……
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・ ・ ...37 H

6
.3.5 Separationd istanc
esthroughc astingcompound. .
..
..
..
..
..
...
..
..
. ーー ...37
6
.3.6 Separationd istance
st hroughsoli
di ns
ulati
on…・"".. ーー・ ・ ・・ -
回目
白・ . .
..38 H H

6
.3.7 Composites ep
arations …..
..
..
...
...
..
..
…..
.・ ・..
..
..
..
..
.
..
..
..
..
・ ・・ .
.
.…. ..
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.38 H H H

6
.3.8 Creepaged istan
ce....
..
..
..
..
...
..
..
..
...
.. 一 …ー ・
田 ・ ..
....
.38
一

6
.3.9 Distanceunderc oat
ing...
..
.. … …...
....…ーー ・ . ・-回
目
・ 一 …・ . .
...
..40 H

6
.3.10 Requirementsforassembledp ri
ntedcirc
uitboards…・
・ 一 . .
..
..
..
...
..
..
..
..
...
40
6
.3.1
1 Separationbyearthedscreens. ..
.
. ....
....
.・ー一 - …… 一 ・ 一 ・・ .
41 u H H

6.
3.12I nt
erna
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42
H

6.
3.13D ie
lectr
icstrengthrequirement. ...........…-一…….......… 42
6.3.14 Relays. .
..
..
.. 一 一 ・ ・ 一 ・ 一 .
..
..
..
..
..
..
..
一 一…………・・…ー 一 42
6.
4 Protectionagainstpolarityreversal ・ 一 一 - ー一一 ・・ー....43
 4

Page

6
.5 Earthconductors，connectionsandterminals.
.
.
..
・ ・
… ー
ー …
ー…
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77
AnnexA (
nor
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fin
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 6

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AnnexB(
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6..
...
...
... .
...
...
...
...
...
116 …
F
igu
reE
.1-Example0
1te
stc
irc
uil
...
...
.…・
…ー .
・ ・
.
H.
..
..
..
..
..
..
. …."
.
・ ・・
a .
...
...
.11
9
F
igu
reE
.2-Example0
1ou
tpu
twavelorm… … …
... … ."
…・・ ー .
...
...
120
F
igu
reG
.1-T
ypi
calsystem 129
F
igu
reH
.1-Saletyl
act
orvsi
gni
tio
npr
oba
bli
ty.
.
...
.
..
...
.
..
...
.
...
.
..
...
.
..
...
.
...
..
..
...
...
...
...
...
…ー….
...
140
 7

Page

Table1-A
ppl
ica
bil
ity0
1sp
eci
licclauses0
1IEC6
007
9-0
...
...…
. ・ 一ー .
..
..
..
..
..
..
..
..
..
..
..
..
9
Table2-Temperaturecla
ssi
lic
ati
on0
1copperw
iri
ng(
inamaximumambient
temperature0140O
C).
.. 24
Table3-Temperaturec las
sil
ica
tio
n01t
rac
ksonp
rin
tedc
irc
uitboards (
inamaximum
ambienttemperature0140OC) ー 一 一 … ・ ・ ー ー 一 一 ・ ・・-ーー一一… 25
H H

Table4-Maximump
erm
itt
edpowerd
iss
ipa
tio
nwi
thi
nacomponentimmersedi
ndust.
...
...
...
26
Table5-Clearances，creepaged
ist
anc
esands
epa
rat
ios.
n .
..
..
..
..
..
.一 .
..
..
..
..
..
..
..
..
..
35
Table6-Minimuml
oi
lth
icknes
so rminimumw
irediameter0
1th
escreeni
nre
lat
iont
o
therat
edc
urre
nt01t
heluse.
.
...
..
...
.
..
.. 54
Table7-Compositions0
1ex
plo
siv
ete
stm
ixt
ure
sadequatel
or1，
0sa
let
yla
cto
r..
...
...
...
...
...
..6
2
Table8-Compositions0
1ex
plo
siv
ete
stm
ixt
ure
sadequatel
or1，
5sa
let
yla
cto
r.……・…… 63
Table10-Routinet
estv
olt
age
slo
rin
laJ
Jib
let
ran
slo
rme
rs.
.
..
..
.
..
..
・ ・...ー………・ .
H...
...
73
Table1
1-Textolwarningmarkings.. 75
TableA.1-Permilteds
hor
t-c
irc
uitc
urr
entcorresponding t
oth
evo
lta
geandt
he
EquipmentGroup 88
TableA.2-P
erm
itt
edcapacitancecorrespondingt
oth
evo
lta
geandt
heEquipment
Group 93
TableA.3-Permiltedr
edu
cti
on0
1elle
cti
vecapacitance whenp
rotec
tedbyas er
ies
resis
tanc
e..
...
.
..
...
..
..
.. ー ー ー ・…
・ 一 ……・ ・・ - 一 一 .
..・ ・.
..
..
..
..
..
..
..
..
..
..
.・ ・
・..
..9
9
SE﹄ (ち

H a H H

TableF.1-Clearances，creepagedist
ancesands e
parat
i o
nslorLev
el0
1P ro
tectin"
o 旧"
acozs宮富山EEEd四百Ehoz芭

and“ i
b"wheningre
ssp ro
tected，andspec旧 1c
ond
ition
s0 1mat
eria
landins
taJJ
ati
ona r
e
lu
lli
JJe
d..
. 123
TableF
.2-Clearances，creepaged
istance
sandsepar
ati
onslorLe
vel01Prot
ecti
on"
ic
"
wheningr
essi
sp r
otectedbyanenclosureorbys
pec
ialcond
iti
ons01in
sta
JJa
tion. 一 一 124
TableG.1-Assessment0
1maximumo
utp
utc
urr
entloruse wi
th'
ia
'and'ib
'FISCO
recta
ngul
ars
upplis......… …ーー...・ ・
e u .
...
.
..
H.
.
...
..
.
...
・・..
..
..
...一…....・ ・
a ...
...
...
126 a

TableG.2-Assessment0
1maximumo
utp
utc
urr
entl
oruse w
ith'
i
c'FISCOr
ect
ang
ula
r
﹄

suppl
ies. 126
コω官。言コ0

TableH
.1-Sequence0
1te
sts.
..
..
..
..
..
..
..
..
..
・ ・ . . 一 ・ “.
H ..
..
..
..
..
..
..
..
..
..
..
..
..
..
..
..
..
..
..
..
..
..
..
13
3
TableH.2-Saletyl
act
orprovidedbys
eve
rale
xpl
osi
vet
estm
ixt
ure
sth
atmaybeused
0白)NEN00

lo
rt h
etest
sinTableH.1 135
TableH.3-Example01aGroup1cir
cui
twithcha
racte
risticsdescribedbyCurve10 1
Figur
eH .
1-Thispassesth
etestsequence01TableH.1
...
...
...
.. …
..
.・ ・........… .136
a
ロド NEOE2cω ﹀吉百勺白ZJEtEu-uv-﹁hauωgouu︿

TableH.
4-Example01aGroup1cir
cuitw
ithcha
rac
teri
stic
sdescribedbyCurve1
1
101
Figur
eH.
1-Thisdoesnotpassthetes
tsequence01TableH1..ーー…“…ー
. ー … .138
 8

FOREWORD

Thes
ign
ifi
can
tchangesw
ithrespectt
oth
epreviouse
dit
iona
rel
ist
edbelow:

• I
ncl
usi
ono
fno
n-e
dit
ions
pec
ifi
creferencest
oIEC60079-0.
• Themergingo
fth
eapparatusrequirementsf
orFISCOfromIEC60079-27.
• Themergingo
fth
erequirementsf
orcombustibledustatmospheresfromIEC61241-11

• Cla
rif
ica
tio
no ftherequirementslo
raccessoriesconnectedt
oin
tri
nsi
cal
lys
aleapparatus;
suchaschargersanddatal ogge
rs
• A
ddi
tin0
o 1newt
estrequirementsl
oro
pto
-is
ola
tor
s.
• I
ntrod
u c
tin0
o 1Annex H about i
gni
tio
nte
sti
ng0
1 semiconductor l
imi
tin
g power supply
c
irc
uits.
(UBE﹄且E
ω ￡ pp司OOWCE価コ四百choEOとコO芭ωE2u。口)NEN00
ロド NEOE2cω﹀ 吉E 勺白ZJωEEG-uv宅、E 百ωωmouo︿
 9

AUSTRAL
lAN/NEWZEALANDSTANDARD

Explosiveatmospheres

P
art1
1:Equipmentp
rot
ect
ionbyi
ntr
ins
ics
afe
tyγ

1 Scope

This parto f1EC60079 s

pecifi
estheconstr
uct
ion and t
est
ingofi n
tri
nsic
all
ysafe apparatus
intendedf o
ruseinane xplos
iveatmosphereandf rassoc旧 t
o edapparatus，whichi
sintended
forconnectiontoi
ntr
ins
ica
llysafec
irc
uit
swhiche n
tersuchatmospheres

This type o
fprotect
ioni sapplica
bletoele
ctr
ical equipment i
n which t
hee l
ect
ric
alc i
rcu
its
themselvesareincapableofcausinganex
plosioni
nthesurroundinge xp
losiv
eatmospheres.

Thisstandardi
sa ls
oa p
plicab
let oe l
ectri
calequipmento rpar
tso fe l
ect
rica
lequipmentl ocat
ed
outsid
e the expl
osive atmosphere o rp rotect
ed by another Type o fP rote
ctionl iste
di n
IEC60079-0，wheret hei n
tri
nsics af
etyo ft h
ee le
ctr
icalcirc
uitsinthe e xpl
osive atmosphere
maydependuponthedesign andc onstruc
tiono fsuch el
ectr
ical equipmentorp artsofsuch
elec
tri
calequipment
.Theelectricalcirc
uitsexposedt otheexplos
iveatmosphereareevaluated
fo
rusei nsuchanatmospherebya p
plyingthisstanda
r d
.
(ち旦乙一﹄a

Therequirementsf
ori
ntr
ins
ica
llysafesystemsareprovidedi
nIEC60079-25
cω ￡ 書 官w

Thisstandardsupplementsandm odifiesthegeneralrequirementsofIEC60079-0，exceptas
indi
cate
di n Table 1
. Where a requirement o
ft hi
s standard c
onf
lic
tswi
th a requirement o
f
IEC60079-0，therequirementso
ft h
isstandards h
alltakeprecedence.
o-c
E何コ回v

I
f requirements int h
is standard are app
lic
abl
et o both intr
ins
ical
ly safe apparatus and
associatedapparatustheterm"apparatus"i
susedthroughoutthestandard
ozh
ozω ヒコω 官。E200口}NFDNoωロ

This standard i
sfo
rele
ctr
ical equipment on
ly;t
her
efo
re the term “
equipment" used i
n the
standardalwaysmeans“
elec
tric
alequipment".

I
f associated apparatus i
s placed i
n the ex
plo
sive atmosphere，i
tsh a
ll be protected by an
appropriateTypeo fProtec
tionlist
edinIEC60079-0，andthentherequirementso fthatmethod
ofp rotec
tiont oge
therw it
h the relev
ant paはs of 1EC60079-0 al
so applytot he associated
apparatus.
ド NCOE2Eω﹀ 吉δ

Table1-A
ppl
ica
bil
ityofspecificclausesofIEC60079・0

I
EC6
009・oc
7 lau
sea
ppl
ica
tio
ntoI
EC60079~11
C
lau
seo
rsu
bcl
aus
eofI
EC6
007
9-0 A
ssoci
ated
I
ntr
ins
ica
llys
afea
ppa
rat
us app
aratu
s
Ed
.5.0 E
d.6.0 C
lau
seISubclau
se
勺
OZJωEE2UX﹁hauωωωωoud

(20
07) (20
11) t
it
le G
rou
pIa
ndGroup1
1 G
rou
p11
(
inf
orma
tive
) (
inf
orma
tiv
e) (no
rmat
ive
)
1 1 S
cop
e A
ppl
ies A
ppl
ies A
ppl
ies
2 2 N
orm
ati
ver
efe
ren
ces A
ppl
ies A
ppl
ies A
ppl
ies
3 3 Termsa
ndd
efi
nit
ion
s A
ppl
ies A
ppl
ies A
ppl
ies
4 4 E
qui
pme
ntg
rou
pin
g A
ppl
ies A
ppl
ies A
ppl
ies
4
.1 4
.1 G
rou
pI A
ppl
ies E
xcl
ude
d A
ppl
ies
4
.2 4
.2 G
rou
p1I A
ppl
ies E
xcl
ude
d A
ppl
ies

COPYRIGHT
 10

IEC60079・ocJauseapplicationt
oIEC60079・11
ClauseorsubclauseofIEC60079-0 Associated
I
ntr
ins
ica
llysafeapparatus
apparatus

Ed.5.0 Ed.6.0 ClauseISubclause

(2007) (2011) t
itl
e GroupIandGroup1 Group1
1
1
(informative) (informative) (normative)

4
.3 4
.3 Group1
1
1 Excluded Applies Applies

4
.4 4.
4 Equipmentforap arti
cul
ar Applies Applies Applies
exp
losiveatrnosphere

5
.1 5
.1 Environmentali
nfl
uen
ces Applies Applies Applies

5
.1.
1 5
.1.
1 Ambienttemperature Applies Applies Applies

5
.1.
2 5
.1.
2 Ext
ernalsourceo
fhe
ati
ng Applies Applies Applies
o
rc oo
ling

5
.2 5
.2 Servicetemperature Applies Applies Applies

5
.3.
1 5
.3.
1 Determinationo
f Applies Applies Excluded
maximumsurface
temperature

5
.3.
2.1 5
.3.
2.1 GroupIe l
ect
ric
al Applies Excluded Excluded
equipment

5
.3.
2.2 5
.3.
2.2 GroupJ Ie
lec
tri
cal Applies Excluded Excluded
equipment

5
.3.
2.3 5
.3.
2.3 Group111el
ect
ric
al Excluded Applies Excluded
equipment
{勺旦
CEacoz言明M

5
.3.
3 5
.3.
3 Smallcomponent Applies Excluded Excluded
temperaturefo
rGroup1
orGroup1e l
ectr
ica
l
equipment
O

6
.1 6
.1 General Applies Applies Applies
O-
EEω

6
.2 6
.2 Mechanicals
tre
ngt
hof Excludedexcept Excludedexcept Excludedexcept
equipment when6 .1
.2.3a)i
s when6 .1.
3a)i s whe円 6.1
.2.3a)i
s
コ回︼

appli
ed app
lied. appl
ied
OC u

6
.3 6
.3 Openingtimes Excluded Excluded Excluded
弘to
ヒ 20芭ωEコυo白)NFDN00ロ ド 刊coE2co﹀MEO勺 白ZJmhgzo UX寸ha吉田ω

6
.4 6.
4 Circu
latingc
urrentsi
n Excluded Excluded Excluded
enclosures(
e.g.oflar
ge
ele
ctric
almachines)

6
.5 6
.5 Gasketr
ete
nti
on Excludedexcept Excludedexcept Excludedexcept
when6 .1
.2.3
a)is when6 .1
.3a)i s when6 .1
.2.3a)i
s
appli
ed appl
ied. appli
ed

6
.6 6
.6 Electromagneticand Applies Applies Excluded
ultr
asonicr a
diati
ng
equipment

7
.1.
1 7
.1.
1 A
ppl
ica
bil
ity Excludedexcept Excludedexcept Excludedexcept
when6 .1
.2.3a)i
s when6 .1.
3a)i s when6 .1
.2.3a)i
s
appli
ed appl
ied. appli
ed

7
.1.
2 7
.1.
2.1 S
pec
ifi
cat
iono
fma
ter
ial
s Excludedexcept Excludedexcept Excludedexcept
when6 .1
.2.3a)i
s when6 .1.
3a)i s when6 .1
.2.3a)i
s
appl
ied app
lied. appl
ied

7
.1.
3 7
.1.
2.2 P
las
ticm
ate
ria
ls Excludedexcept Excludedexcept Excludedexcept
when6 .1
.2.3a)i
s when6 .1.
3a )is when6 .1
.2.3a)i
s
appli
ed appl
ied. appli
ed
一

7
.1.
4 7
.1.
2.3 Elastomers Excludedexcept Excludedexcept Excludedexcept
when6 .1
.2.3a)i
s when6 .1.
3a)i s when6 .1
.2.3a)i
s
appl
ied app
lied. appl
ied

7
.2 7
.2 Thermalendurance Excludedexcept ExcJudedexcept ExcJudedexcept
when6 .1.
2.3a)i
s when6 .1.
3a )is when6 .1
.2.3a)i
s
oo

appli
ed appl
ied. appli
ed
o
JR

COPYRIGHT
 1
1

IEC60079・oclauseapplicationt
oIEC60079・11
ClauseorsubclauseofIEC60079・0 Associated
I
ntr
ins
ica
llysafeapparatus
apparatus

Ed.5.0 Ed.6.0 ClauseISubclause

(2007) (2011) t
itl
e GroupIandGroup1 Group1
1
1
(informative) (informative) (normative)

7
.3 7
.3 Resistancet
oli
ght Excluded2e
x.
3c
ae
)p
t
is Excludedexcept Excludedexcept
when6 .1
. when6 .1.
3a)i s when6 .1
.2.3a)i
s
appli
ed appl
ied. appl
ied

7.
4 7.
4 El
ectro
stati
cchargeson Applies Applies ExcJuded
e
xternalnon-m
eta
llic
r
nate
rials

NR 7
.5 Accessiblemetalp
art
s Applies Applies Excluded

7
.5 NR Threadedholes Excludedexcept Excludedexcept Excludedexcept
when6 .1
.2.3a
)is when6 .1.
3a)i s when6 .1
.2.3a)i
s
appl
ied app
lied. appl
ied

8
.1 8
.1 M
ate
ria
lcomposition Applies Applies Excluded

8
.1.
1 8
.2 Group1 Applies Excluded Excluded

8
.1.
2 8
.3 Group1 Applies Excluded Excluded

8
.1.
3 8.
4 Group1
1
1 Excluded Applies Excluded

8
.2 NR Threadedholes Excludedex
.3
ca
e)
pi
ts Excludedexcept Excludedexcept
when6 .1
.2 when6 .1.
3a)i s when6 .1
.2.3a)i
s
appli
ed app
lied. appli
ed
(
刀
2czaEO工、suωEEE伺コ四戸ochgtωと20言。E コ

9 9 Fasteners Excluded Excluded Excluded

10 10 I
nte
rlo
cki
ngdevices Excluded Excluded Excluded

1
1 1
1 Bushings Excluded Excluded Excluded

12 12 Mater
ialsusedf
or Excludedexcept Excludedexcept Excludedexcept
cementing when6 .1
.2.3a)i
s when6 .1.
3a)i s when6 .1
.2.3a)i
s
appl
ied app
lied. appl
ied

13 13 ExComponents Applies Applies Applies

14 14 Connectionfa
cil
iti
esand Excluded Excluded Excluded
term
inationcompa吋ments

15 15 Connectionfaci
lit
iesf
or Excluded Excluded Excluded
earthi
ngo rbonding
conductors
00口)NFDN00白 ド 刊 にOEEEω﹀芭-

16 16 E
ntr
iesi
ntoenclosures Excludedexcept Excludedexcept Excludedexcept
when6 .1
.2.3a
)is when6 .1.
3a)i s when6 .1
.2.3a)i
s
appl
ied app
lied. appl
ied

17 17 Supplementary Excluded Excluded Excluded

requirementsf
orr
ota
tin
g
machines

18 18 Supplementary Excluded ExcJuded Excluded

requirementsf
or
switchgear

19 19 Supplementary Excluded Excluded Excluded

o

requirementsf
orfuses
-，臼Z4 師、220一

20 20 Supplementary Excluded Excluded Excluded

requirementsfo
rplugs，
socketoutlet
sand
connectors
口V

2
1 21 Supplementary Excluded ExcJuded Excluded
L
-

requirementsf
or
Jh

luminair
es
a百出mouo︿

22 22 Supplementary M
odi
fie
d M
odi
fie
d ExcJuded
requirementsfo
rcapJ
ights
andh andligh
ts

2
3.1 2
3.1 General Applies Applies Applies

COPYRIGHT
 12

IEC60079・oclauseapplicationt
oIEC60079・1
1
ClauseorsubclauseofIEC60079-0 Associated
I
ntr
ins
ica
llysafeapparatus
apparatus

Ed.5.0 Ed.6.0 ClauseISubclause

(2007) (2011) t
itl
e GroupIandGroupJ
I Group1
1
1
(informative) (informative) (normative)

23.2 23.2 BaUeries Excluded Excluded Excluded

23.3 23.3 C
elltypes Applies Applies Applies

23.4 23.4 C
ell
sinabaUery Applies Applies Applies

23.5 23.5 Ratingso

fba
tte
rie
s Applies Applies Applies

23.6 23.6 J
nte
rch
angeab
ili
ty Applies Applies Applies

23.7 23.7 Chargingofprimary Applies Applies Applies

batt
eries

23.8 23.8 Leakage Applies Applies Applies

23.9 23.9 Connections Applies Applies Applies

23.10 2
3.1日 O
rie
nta
tio
n Applies Applies Applies

23.11 23.11 Replacemento

fce
llso
r Applies Applies Applies
baUeries

23.12 23.12 Replaceableb

att
erypack Applies Applies Applies

24 24 Documentation Applies Applies Applies

25 25 Complianceofp
rot
otype Applies Applies Applies
(
官。

orsamplewit
hdocuments
吉
-﹄acos雲 宮ω@

2
6.1 2
6.1 General Applies Applies Applies

26.2 26.2 Testc

onf
igu
rat
ion Applies Applies Applies

26.3 26.3 Testsi nex

plo
siv
ete
st Applies Applies Applies
吉岡﹄悶コ田村。乙 huco

mixtures

26.
4.1 26.
4.1 Ordero
fte
sts Excludedexcept Excludedexcept Excludedexcept
when6 .1
.2.3a
)is when6 .1.
3a)i s when6 .1
.2.3a)i
s
appJ
ied app
lied. appl
ied
26.
4.1
.1 26.
4.1
.1 Metal
licenclosures， Excludedexcept Excludedexcept Excludedexcept
ヒ20MEωEコ00口)NVDN00

metal
licpa吋S 01 when6 .1
.2.3a)i
s when6 .1.
3a)i s when6 .1
.2.3a)i
s
enclosuresandg las
s appl
ied appJ
ied. appl
ied
pa仕so fenclosures
2
6.4
.1.
2 2
6.4
.1.
2 Non-metall
icenclosures Excludedexcept Excludedexcept Excludedexcept
ornon-metall
icpartsof when6 .1
.2.3a
)is whe円 6.1.3a)is when6 .1
.2.3a)i
s
enclosures appJ
ied appl
ied. Jed
appi

26.
4.1
.2.
1 26.
4.1
.2.
1 Group1e l
ect
ric
al Excludedexcept Excluded Excludedexcept
equipment when6 .1
.2.3日)i
s when6 .1
.2.3a
)is
ロド NEOω﹂コ官。﹀ -E=o-

appl
ied appl
ied
26.
4.1
.2.
2 26.
4.1
.2.
2 Group1andGroup1 1
1 Excludedexcept Excludedexcept Excludedexcept
el
ect
ric
alequipment when6 .1.
2.3a
)is when6 .1.
3a)i s when6 .1
.2.3a)i
s
appJ
ied appl
ied. appli
ed

26.
4.2 26.
4.2 Resistancet
oimpact Excludedexcept Excludedexcept Excludedexcept
when6 .1
.2.3a)i
s when6 .1.
3a)i s when6 .1
.2.3a
)is
appl
ied app
lied. appl
ied
，oZJmhzwzo ov--

26.
4.3 26.
4.3 Dropt
est Applies Applies Excludedexcept
when6 .1.
2.3a)i
s
appli
ed
一

26.
4.4 26.
4.4 Acceptancec
rit
eri
a Excludedexcept Excludedexcept Excludedexcept
when6 .1
.2.3a)i
s when6 .1.
3a)i s when6 .1
.2.3a
)is
，hahuonwooO︿

appl
ied app
lied. appl
ied

26.
4.5 26.
4.5 Degreeofp ro
tec
tio
n(1P
) Applies Applies Applies
byenclosures

2
6.5
.1.
1 2
6.5
.1.
1 General Applies Applies ExcJuded

2
6.5
.1.
2 2
6.5
.1.
2 Servicetemperature M
odi
fie
d M
odi
fie
d M
odi
fie
d

COPYRIGHT
 13

IEC60079-0clauseapplicationt
oIEC60079-11
Clauseorsubclauseo
fIEC60079-0 Associated
I
ntr
ins
ica
llysafeapparatus
apparatus

Ed.5.0 Ed.6.0 ClauseISubclaus巴

(2007) (2011) t
itl
e GroupIandGroup1 Group1
1
1
(
informative) (informative) (normative)
2
6.5
.1.
3 2
6.5
.1.
3 Maximumsurface M
odi
fie
d M
odi
fie
d Modi日ed
temperature
2
6.5
.2 2
6.5
.2 Thermalshockt
e5t Excludedex
.3
ca
e)
pi
ts Excludedexcept Excludedexcept
when6 .1
.2 when6 .1.
3a)i s when6 .1
.2.3a)i
s
appl
ied app
lied. appli
ed
2
6.5
.3 2
6.5
.3 Smallcomponenti
gni
tio
n Applies Excluded Excluded
te
5t(GroupIandGroup
1
1)
26.6 26.6 Torquet
e5tf
orbushings Excluded Excluded Excluded
26.7 26.7 Non-metall
icenclosures ExcJudedexcept Excludedexcept Excludedexcept
ornon-metall
icpartsof when6 .1.
2.3a)i
s when6 .1.
3a)i s when6 .1.
2.3a)i
s
enclosures appli
ed app
lied. appli
ed
26.8 26.8 Thermalendurancet
o Excludedexcept Excludedexcept Excludedexcept
heat when6 .1
.2.3a
)is when6 .1.
3a)i s when6 .1
.2.3a)i
s
appl
ied app
lied. appli
ed
26.9 26.9 Thermalendurancet
o Excludedexcept Excludedexcept Excludedexcept
col
d when6 .1
.2.3a)i
s when6 .1.
3a)i s when6 .1
.2.3a)i
s
appli
ed app
lied. appl
ied
(32EEaEω 工 芸 司mwBZE句コ四百EhHEUKコO官。E200口)NVDNoωロ

26.10 26.10 Resistancet

oli
ght Excludedex
.3
ca
e)
pi
ts Excludedexcept Excludedexcept
when6 .1
.2 when6 .1.
3a)i s when6 .1
.2.3a)i
s
appli
ed app
lied. appl
ied
2
6.1
1 26.11 Resistancet
ochemical Excludedexcept Excluded Excluded
agentsforGroupI when6 .1
.2.3a
)is
ele
ctri
calequipment appl
ied
26.12 26.12 E
art
hco
nti
nui
ty Excluded Excluded Excluded
26.13 26.13 Surfaceresistancetes
tof Applies Applies Excluded
paはso fenclosuresof
non-met
allicmateria
ls
26.15 26.14 Measurementof Applies Applies Excluded
capacitance

NR 26.15 V
erif
icat
ionofrat
ing
sof Excluded Excluded Excluded
v
ent
ilat
ingfans

NR 26.16 Alterna
tivequ
ali
ficat
iono
f Excluded2e
x.
3c
ae
)p
it
s Excludedexcept Excludedexcept
elastomerics
ealin
g0- when6 .1
. when6 .1.
3a)i s when6 .1
.2.3a)i
s
rmgs appli
ed app
lied. appli
ed I
27 27 Routinet
est
s Applies Applies Applies
ド N Z 0 2コ官。﹀苫 E勺白Z﹂ω主主口一 UX寸hn判官出 mooo︿

28 28 Manufacturer's Applies Applies Applies

resp
onsibilit
y

29 29 Marking Applies Applies Applies

30 30 I
nst
ruc
tio
ns Applies Applies Applies
AnnexA AnnexA Supplementary Excluded Excluded Excluded
requirementsf
orcable
(Normative) (Normative) glands
AnnexB AnnexB Requirementsf
orEx Applies Applies Applies
Components
(Normative) (Normative)
AnnexC
(
Inf
orm
ati
ve)
AnnexC
(
Inf
orm
ati
ve)
Exampleo
res
istan
c
fr
et
igfor
oimpactt
est
Applies Applies
w
a
……￨
Ehen6
pp
lie
d
.1
.2.
3a)i
s

COPYRIGHT
 1
4

IEC60079-0clauseapplicationt
oIEC60079-11
CJauseorsubclauseofIEC60079-0 Associated
I
ntr
ins
ica
llysafeapparatus
apparatus

Ed.5.0 Ed.6.0 ClauseISubclause

(2007) (2011) t
itl
e GroupIandGroup1 Group1
1
1
(
infor
mative
) (
infor
mative
) (normative)
Annex0 NR Alter
nativer
isk Applies Applies Applies
assessmentmethod
(
Inf
orm
ati
ve) encompasslng
“equipmentpro
tec
tion
leve
ls"forExequipment
AnnexE Annex0 Motorssupp
lie
dby Excluded Excluded Excluded
conver
ter
s
(
Inf
orm
ati
ve) (
Jnf
orm
ati
ve)
NR AnnexE Temperaturerisete
sti
ng Excluded Excluded Excluded
ofelec
tricmachines
(
Inf
orm
ati
ve)
NR AnnexF GuidelIneflowc
hartfor Excludedexcept Excludedexcept Excludedexcept
test
so fnon-r
netall
ic when6 .1
.2.3a)i
s when6 .1.
3a)i s when6 .1
.2.3a)i
s
(
Inf
orm
ati
ve) enclosuresornon- appli
ed appl
ied. appli
ed
metal
licp a
rtso f
enclosures(26.4)
Applies-Thisrequiremento
fIEC60079-0i
sap
pli
edw
ith
outchange.
Excluded-Thisrequiremento
fIEC60079・odoesn
ota
ppl
y.
Excludedexcept-Thisrequiremento
fIEC60079-0doesn
otapplyexceptwhent
hec
ond
iti
onss
tat
eda
r .
t
eme
(UBEEacoZ3 刀

M
odi
fie
d-Thisrequiremento
fIEC60079-0i
smo
dif
iedasd
eta
ile
dint
hiss
tan
dar
d.
NR-Nor
equ
ire
men
ts.

NOTE Theclausenumbersi ntheabovet a

bleareshownfo rinfo
rmati
ono nl
y.Thea pplic
ablerequirementsofIEC60079-
oa rei dent
ifi
ed by the clause t
it
le which isnorm
ative. This tab
le was writte
na gainstt hespecif
ic requirements of
剣wozEEd

IEC60079・0，e d.6.0.Theclausenumbersf ortheprevi

ouse dit
ionareshownf ori nf
ormationonl
y.Thisi st oenablet h
e
GeneralrequirementsIEC60079-0，e d.5 .0，tobeusedwherenecessaryw itht h
isp a
rto fIEC60079.Wheret he
rewereno
requirements，indica
ted by NR，o rt herei sac onf
lict between requirements，t hel at
ere d
ition requirements t
ake
precedence.
白百Ehocoヒ
コυzoE200

2 Normative references

Thelollowingrelerenceddocumentsareindispensablelortheapplicalion01Ihisdocument .For
daled relerences，only Ihe edilion ciled applies. For undaled relerences，Ihe lalesl edilion 01
口)NV口N00

Ihereferenceddocumenl(includinganyamendmenls)applies

IEC60079-0，Ex
plo
siv
ealmospheres-P
arl0:Equipmenl-Generalrequiremenls
ロド NZOEコ官。﹀吉一。﹃，白ZJmh

IEC60079-7，Explosivealmospheres-P
art7:Equipmenlp
rol
ecl
ionbyincreaseds
afe
ly"
e"

IEC60079-25，Explosivealmospheres-P
arl25:I
nlr
ins
ica
llysafee
lec
lri
calsyslems

IEC60085，E
lec
lri
cali
nsu
lat
ion-Thermale
val
ual
ionandd
esi
gna
lio
n

IEC60112，MelhodforIhed
ele
rmi
nal
iono
fIh
eproofandI
hecomparaliveI
rac
kin
gin
dic
eso
f
￡z

so
lidi
nsul
alin
gmaler
ia/s
υ 一OX﹁ha百苫 ωouu︿

IEC60127(
allparls)，Mi
nia
lur
efuses

IEC60317-3，Sp
ecif
icali
onsf
orp
arl
icu
larI
ype
sofwindingw
ire
s-P
art3:P
oly
esl
erenamelled
roundcopperw
ire，cla
ss155

COPYRIGHT
 1
5

IEC60317・7，S
pec
ifi
calio
nsforp
arl
icu
larIypeso
fwindingwires-P
arl7
:Polyimideenamelled
roundcopperw
ir，class220
e

IEC60317-8，S pe
cific
ali
onsf orpar
licula
r Iypes o
fwinding wires - P
arl8
:Po
lye
sle
rim
ide
enamelledroundcopperwindingw
ire，class180

IEC60317-13，Specific
alio
nsf o
rpa げicularIypes ofw inding wires - Parl13:Polyesler or
pol
yesl
erimideovercoaledwil
hpolyamide-imideenamelledroundcopperw ire，c
las200
s

IEC60529，Degreeso
fpr
ole
cli
onprovidedbyenclosures(
IPCode)

IEC60664-1:2007，I n
sula
lio
ncoor
din
ali
onf
orequipmenlw
ilh
inl
ow-
vol
lag
esyslems-Pa
rl1
Pri
nci
ples，requiremenlsandle
sls

IEC60664-3:2003，Ins
ula
lio
nc oor
dinal
ionforequipmenlwi
lhi
nl ow
-vo
lla
gesyslems- P
arl3
:
Useofcoaling，po
lli
ngormouldingわ rpro
lec
lionagains
lpo
llul
ion

IEC61158-2，Ind
usl
ria
lcomrr山 n
icali
onnelworks- F
iel
dbu
ssp
eci
fic
ali
ons-P
arl2
:Physical
lay
erspe
cific
ali
onands e
rvi
ced ef
ini
lion

IEC62013-1，C a
pligh
lsforusei
nminess
usc
eplibl
e1 0firedamp-P arl1:General
requiremenls-Con
slruc
lionandle
sli
ngi
nrel
ali
on1 0Ih
er iskofexplosion

ANSI/UL248-1，Low-VollageFuses-P
arl1
:GeneralRequiremenls
(
刀Ez=acωSB宮山旦CEEd回戸othoEE

3 Termsanddefinitions

Forthe purposes o
fth
is document，theterms and d
efi
nit
ion n IEC60079-0，andthe
s given i
fol
low
inga pp
ly.

3.1
general
﹄コOZωEコ

3.1.1
intrinsicsafety“j"
type o fp rotec
tio
n based on the r e
strict
iono fe lect
rica
l energy w
ithin equipment and of
υ。

interconnectingwiri
ng exposedto the explosive atmosphere t
oal evel belowthatwhich can
口)NF。N

causei gnitionbyeithe
rsparkingo
rheatinge ffec
ts
Oω 口 hNcoEECO

3.1.2
associatedapparatus
ele
ctric
al equipmentwhich contains both in
tri
nsi
call
y safe c
ircu
its and n
on-
intrin
sic
ally safe
ci
rcuit
sandi sconstructedsot h
att henon-i
ntrin
sica
llysafecircu
itscannotadverselyaff
ectthe
in
trins
ical
lysafecirc
uits
﹀吉一。﹁臼ZJωh

NOTE A
sso
cia
teda
ppa
rat
usmayb
eei
the
r

a
)elec
tri
calequ
ipmen
tw h
ichh
asa
not
hert
ypeo
fpr
ote
cti
onl
is
te
dinI
EC6
007
9-0f
oru
sei
nth
eap
pro
pri
ate
e
xplo
sivea
tmosp
here，o
r
主zo-uv宅、ADUOωωω00︿

b
)eJec
tri
caJe qu
ipmentnot 50 p
rot
ect
eda ndwhich，the
ref
ore，i
sn otnorm
allyusedw it
hina ne xp
losi
ve
at
mosphere，fo
re xa
mpl
e ar ec
ord
erw h
ichisno
ti t
se
lfinane x
plo
siv
ea tmo
spher
e，b u
t旧 c onnec
tedtoa
t
hermoco
uplesitu
ate
dwi
thi
na nexp
los
iveatm
osp
herewhereonlyt
herec
ord
erinpu
tci
rcu
itisin
tri
nsi
cal
lysaf
e

3
.1.3
in
trins
ical
lysafeapparatus
e
lect
rica
lequipmenti
nwhicha l
lth
eci
rcu
itsarei
ntr
ins
ica
llysafec
irc
uit
s

COPYRIGHT
 1
6

3
.1.4
i
ntrin
sica
llysafecirc
uit
c
irc
uilinwhich anysparko ranyI he
rmaleffe
clproducedi
nI h
ec on
dilio
nssp
eci
liedi nIh
is
s
landard，which in
clude normal op
erali
on and s
pec
iliedfa
ullcon
dilio
ns，isn
ol capable 0
1
cau
singign
il旧 n0
1ag ivene xp
losi
vealmosphere

3.1
.5
simpleapparatus
el
eclr
ica
l componenl o
rcombina
lio
n0 1componenls 0
1s impl
ec on
slr
ucl
ionwithwel
l-d
efi
ned
el
eclr
ica
lp a
ramelersandwhichi
scomp
ali
blew i
lhI h
einlr
ins
icsal
ely01Ihec
irc
uili
nwhichi
lis
used

3.2
coating
ins
ulali
ngm
ale
ria
lsucha
sva
rni
sho
rdr
yli
lml
aidonI
hes
url
aceo
llh
eassembly

NOTE Co
atinga
ndb
asem
ate
ria
lofap
rin
tedb
oar
dfo
rma
nin
sul
ati
ngs
yst
emt
ha
tmayh
avep
rop
ert
iess
im
il
art
o
s
oli
din
sul
ati
on
[
Del
ini
lio
n3.
501I
EC6
066
4-3
]

3.3
conformalcoating
el
eclr
icalin
sula
lingmaler
ialappl
iedasacoal
ing1
0loadedpr
inle
dci
rcu
ilboards10producea
Ih
inl a
yerconformi
ng1 0Ihesu
rlaceino
rde
r10pro
vid
eap ro
lecl
iveb
arri
eragain
sldelel
eriou
s
elf
eclsfromenvironm
enlalco
ndilio
ns
{匂旦
CEacoz主力ωBEmw﹄伺ヨ回︼ozhoto

[
Def
ini
lio
n2.
1ofIEC6
108
6-1
]

3
.4
c
ontroldrawing
d
rawingo rolhe
rdocumenlI ha
lispreparedbyI hem an
ufac
lurerlo
rI heinl
rin
sic
all
ysaf
eor
a
ssocial
eda ppa
ralus，d
ela
ili
ngI h
eel
eclri
calparamelers10all
owfo
ri n
lerc
onnecli
ons10o
lhe
r
c
irc
uil
so rapp
aralu
s

3.5
と30ZωEコ

diodes afe
tyb ar
rier
assembliesi n
corpor
alin
gs hu
nld iod
esordio
dechains( in
clu
din
gZenerdiod
es)pro
lecl
edby
fuseso rresi
slor
so racombinal旧 noft
hes
e，manufacluredasanindiv
idu
alappa
ralusral
her
uo口)NFDNOω

Ihanasp ar
lo fal a
rgerapp
aralu
s

3.
6
ent
ityconcept
ロ
ド NC02コ芭ω﹀MEO勺OZJmhpM￡o-uv弓ha百目的ωωo︿

melhod used 10del

erminea
ccepla
blecombina
lion
so fi
ntri
nsic
all
ys alea p
paral
us and
assoc
ialedapp
aral
usI h
rou
ghIheuse01i
nlr
ins
ica
llysaf
eparamelersassigned10c
onnec
lion
la
cil
ili
es

3
.7
f
aul
ts
3.
7.1
countablefau
lt
la
ull which occu
rs in p a
rls o
fel
ecl
ric
al a
ppa
ral
us c
onl
orm
ing1
0Ih
e c
ons
lru
cli
ona
l
requir
emenlsofIEC60079-11

COPYRIGHT
 1
7

3.7.2
fault
anyd efe
clofanycomponenl，separalion，i
nsu
lal
io r conneclion belween componenls，nol
no
definedasi
nfa川b
lebyIEC60079-11，uponwhichlheinl
rin
sics a
felyo facirc
uildepends

3.7.3
non-counlablef a
ult
fa
ull which occurs i
np arlsofe
lec
lri
cal apparalus n
ol conforming 1
0lec
h o
nsl
ruc
lio
nal
requiremenlsofIEC60079-11

3.8
fuser ating
ln
currenlr alin
go f a fuse as s
pec
ifi
e n IEC60127 senes，ANSIIUL 248-1 o
di r m lhe
manufaclurer'ss
peci
ficali
on

3.
9
FISCO
abbr
evi
ali
ono
fFieldbusI
nlr
ins
ica
llySafeConcepl

3.10
inf
all
ibi
lit
y
3.
10.1
in
fall
ibleco町lponent
(
司旦 CEazoz言句 mwBCE句コ団担OEhucokコO芭 ω吾 300口)NF口N00

in
fall
ibleassemblyofcomponents
componenlorassemblyofcomponenlsl
hali
sconsideredasnols
ubj
ecl1
0ce
rla
inf
aul
lmodes
asspeci
fiedinIEC60079-11

NOTE Thepr
oba
bil
ityo
fsuchf
au
ltmodeso
ccu
rri
ngi
nse
rvi
ceo
rst
ora
gei
sco
nsi
der
edt
obe50 l
owt
hatt
heya
re
no
ttob
et a
kenin
toacco
unt

3.10.2
infall
ibleconnection
conneclions，i nclud
ingjoinls and i
nlerc
onnecli
ngwiri
ng and pr
inle
dcirc
uilboardt
rac
ks，lh
al
are n ol considered according 10 IEC60079-11 as becoming o
pen-
circu
iledinservi
ceor
slorage

NOTE Thepr
oba
bil
ityo
fsuchf
au
ltmodesQ
ccu
rri
ngi
nse
rvi
ceo
rst
ora
gei
sco
nsi
der
edt
obe50 [OWt
hatt
heya
re
no
ttob
et a
kenin
toacco
unt

3.10.3
infall
ibleseparation
ロド

infall
ibleinsulation
N C 0 2コ官。﹀吉田 O 勺 白Z﹂ ωhFZZUUX勺ha官出 ωωuo︿

separalionori nsul
alionbelweene
lec
lric
allyconduclivep
arl
slh
ali
sconsideredasnolsubjecl
10s h
orlc i
rcu
ilsass p
ecif
iedinIEC60079-11

NOTE Thepro
ba削 l
i
tyo
fsuchf
au
ltmodeso
ccu
rri
ng!
ns町 内c
eors
tor
agei
sco
nsi
der
edt
obe50 l
owt
hatt
heya
re
no
ttob
et a
kenin
toacco
unt

3.1
1
inter
nalwiring
w
iringande le
clr
ica
lconneclionsl
halaremadew
ilh
inl
heapparalusbyi
lsmanufaclurer
一

3.12
livemaintenance
mainlenanceacl
ivi
liesc a
rri
edoulw
hielheassocialedapparalus，i
l nlr
ins
ica
llysafeapparalus
andc i
rcu
ilsareenergized

COPYRIGHT
 1
8

3
.13
e
lec
tri
calparameters
3
.13
.1
maximuminputvoltage
Uj
maximum voltage (peak a
.c.ord .c
.)that can be applied t
o the connection f
aci
lit
ies of
apparatuswithouti
nva
lid
ati
ngthetypeofp
rotecti
on

3
.13
.2
maximuminputcurrent
j
I
maximum c urre
nt (peak a
.c.ord.c
.)that can be applied t
oth
e connection f
aci
lit
ieso
f
apparatuswithouti
nvalid
ati
ngth
etypeofp
rotecti
on

3
.13
.3
maximuminputpower
Pj
maximum power th
at can be a
ppl
iedt
oth
e connection f
aci
lit
ieso
f apparatus without
in
val
ida
tin
gthetypeofpro
tec
tio
n

3
.13
.4
maximumi
nte
rna
lcapacitance
Cj
maximum equivalenti
ntern
al capacitance o
fth
e apparatuswhich i
s considered as appearing
{匂

acrosst
heconnectionfac
ili
tie
s
BE
邑 ZOL ﹀﹀RUOOMgE

3
.13
.5
maximumi
nte
rna
linductance
L
j
maximumequivalenti nt
ern
alinductanceo
ftheapparatuswhich i
sconsideredasappearing a
t
理由 MOEhU

theconnectionf
aci
lit
ies

3
.13
.6
己@ヒコ U官。E コ00

、 aximumi
町 nte
rna
linductancetoresistancer
ati
o
Ll
;Rj
maximum value ofr
atioofinductanceto resistancewhich i
s considered as appearing a
tthe
ex
ter
nalconnectionfa
cil
iti
esofthee l
ect
ric
a lapparatus
口)NFDN00

3
.13
.7
maximumoutputvoltage
Uo
口 hNE022cO

maximum voltage (peak a

.c.o rd.
c.)t h
at can appear a
tth
e connection f
aci
lit
ieso
f the
apparatusa
tanya p
p li
edvoltageupt
ot h
emaximumvoltage

3
.13
.8
maximumoutputcurrent
﹀ 吉 -O

I
o
方自Z﹂ ωEEG-uvL寸ha旬

maximum cur
rent (peak a
.c.o
rd.
c.)i
n apparatus t
hat can be taken from the connection
f
aci
lit
ieso
ftheapparatus

3
.13
.9
maximumoutputpower
p
o
maximume
lec
tric
alpowert
hatcanbetakenfromtheapparatus
。 ωmooo︿

COPYRIGHT
 19

3
.13
.10
maximumexternalcapacitance
。
c
maximum capacitance t
hat can be connected t
oth
e connection l
aci
lit
ies0
1the apparatus
wi
thou
tinv
alidatigthetype0
n 1protection

3
.13
.11
maximumexternalinductance
L。
maximum value 0
1 inductance t
hat can be connected t
oth
e connection f
aci
lit
ies0
1 the
apparatusw
ith
outinv
ali
datingthetype01protection

3
.13
.12
maximumexternalinductancetoresistancer
ati
o
。
。
L/R
maximum value 0 1r
ato0
i 1inductance t
or es
istan
cetha
t can be connectedtothe e
xte
rna
l
connectionl
aci
lit
ies0
1thee
lec
tri
calapparatuswit
houti
nvali
dat
ingin
t r
ins
ics a
let
y

3
.13
.13
maximumr .
m.s.a.c.ord.c
.voltage
Um
maximum v oltaget ha
t can be ap
pliedto the non intr
insica
lly sale connection l
aci
lit
ies0
1
associatedapparatuswit
houtinv
alida
tigthetype0
n 1protection

NOTE1 Thi
sa d
dit
ion副 I
yapp
liest
othemaximumvoJ
tageth
atc
anbeappl
iedt
onon-
int
rin
sic
all
ysaf
ec o
nne
ctio
n
(
唱。
“EEacoz書官富山口E伺コ四百EECω ヒ

f
aci
li
ti
eso
fintr
in
sic
al
lys afeapp
ara
tus(f
orexamp
le，cha
rgi
ngcon
nec
tio
nso nb
att
eryoper
atedapp
arat
us，whe
re
ch
argi
ngI
sonl
yd on
ei ntheno
田nhaz
ardo
usare
a)
NOTE2 Theva
lueo
fUmmayb
edi
ffe
ren
tatd
iff
ere
nts
etso
fco
nne
cti
onf
ac
il
it
ie
s，a
ndmayb
edi
ffe
ren
tfo
ra.
c
an
dd.c
.vo
lta
ges

3
.14
overvoltagecategory
numeraldelin
ingat ra
nsi
entovervoltagec
ond
iti
on

[
Del
ini
tin1
o .
3.1
0ollEC6
066
4-1
]
コ Q吉ω昼コ

NOTE O
ver
vol
tag
eca
teg
ori
es1
，1
1，1
1andI
Var
eus
ed，s
ee2
.2
.2
.1o
fIC6
E 0
664
-1

3
.15
00
口

pollut
iondegree
)NENooロ

numeralch
aract
eriz
ingtheexpectedp
oll
uti
on0
1themicro-environment

[
Del
ini
tin1
o .
3.1
3ollEC6
066
4-1
]
ド NEOEコ官。﹀吉百勺臼Z﹂ωhszo-uuL勺ha旬。目。

NOTE P
oll
uti
ond
egr
ees1
，2，3a
nd4a
reu
sed

3
.16
protectiveextra-Iowvoltage
PELV
extra-Iowvolta
ge system which i
s note
lec
tri
cal
lyseparated Irom e
art
h butwhich otherwise
sat
isliestherequirementslo
rSELV

NOTE A5
0Vc
ent
re-
tap
pede
art
hsy
ste
misaPELVs
yst
em

3
.17
ratedinsulationvoltage
r.m.
s.withstandvoltagevalueassignedbyt hemanulacturertotheequipmento
rtoap
art0
1it
.
charac
terizi
ngthes pe
cilied(Io
ng-term)withstandc
apabi
lity01it
sins
ulati
on
0 0︿

[
Del
ini
tin1
o .
3.9
.10
1IEC6
066
4-1
]

COPYRIGHT
 20

NOTE Therat
edins
ula
tio
nvolt
agei
sno
tne
ces
sar
ilye
qua
ltot
her
ate
dvo
Jta
geo
feq
uip
men
twh
ichi
spr
ima
ril
y
re
lat
edt
ofun
cti
ona
lperfor
man
ce

3
.18
recurringpeakvoltage
maximumpeakvalueofp eri
odi
cexcursionsofthevoltagewaveformre
sul
tin
gfromd
ist
ort
ion
s
ofana .c.voltageo
rfroma
.c.componentssuperimposedonad .c.vo
lta
ge

NOTE Random o
ver
vol
tag
es，f
ore
xam
pled
uet
ooc
cas
ion
als
wit
chi
ng，a
ren
otc
ons
ide
reda
sre
cur
rin
gpe
ak
vo
lta
ges

3
.19
safetyextra-Iowvoltage
SELV
extra-Iow voltage system (
i.e
. normally not exceeding 50V a.c
.o r1 20V ripple-free d
.c.
)
elec
trical
ly separated from eart
h and from other systems i
n such a wayt
hata s inglefaul
t
cannotg iver i
setoane l
ect
ricshock

NOTE A5
0Ve
art
hfr
ees
yst
emi
saSELVs
yst
em

3
.20
encapsulation
encapsulate
processofapplyingacompoundt
oencloseo
rpl
aci
ngi
norasi
finacapsule

3
.21
(
司旦Eazω

casting
processofpouringal
iqu
idcompounda
tnormalambientpressurei
ntoacast
工主力

3
.22
muscEmコ

moulding
process ofp lacin
g an objec
tin at oo
lw it
h a shaping c
avi
ty andwit
hp la
sticmateri
al being
introduced aroundthe inser
!ed componentwit
h pressure app
liedt
oe it
her par
!ia
llyortotal
ly
回 MEEtωヒ

encapsulatethei nse
rte
dcomponent

NOTE T
hisp
roc
essmaya
l50b
ere
fer
redt
oasi
nje
cti
onm
oul
dig，o
n ver
-mo
uld
ingo
rin
ser
tmo
uld
ing
コOZωE200口)

3
.23
galvanicisolat
ion
arrangementwithi
n an apparatuswhich permitsthetra
nsferofs
ign
alo
rpower between two
ci
rcui
tswithoutanydir
ecte l
ectri
calconnectionbetweenthetwo
NFD
No

NOTE G
alv
ani
cis
ola
tio
nfr
equ
ent
lyu
ti
li
ze
sei
the
rma
gne
tic(
tra
nsf
orm
ero
rre
lay
)oro
pto
cou
ple
deJ
eme
nts
ωロ
ド NZ022Eω﹀

4 Groupingandclassificationofintrinsicallysafeapparatusandassociated
apparatus

Int
rins
ical
lysafeandassociatedapparatuswhichhasatypeo fpro
tect
ionliste
dinIEC6 0079-0
王 O勺白Z﹂

for use in the appropriate explosive atmosphere. s h

all be grouped in accordance with
equipment grouping requirements o f IEC6 0079-0 and s hal
l have a maximum surface
temperatureortemperature cl assassignedi n accordancewith thetemperaturerequirements
旦 ZHZo-uu弓 hauoωZOO︿

ofIEC6 0079-0

Associated apparatus which has no such type ofp r

ote
cti
ons h
all only be grouped m
accordancewit fIEC6
htheequipmentgroupingrequirementso 0
0 7
9-0
.

COPYRIGHT
 2
1

5 Levelsofprotectionandignitioncompliancerequirementsofelectrical
apparatus

5
.1 General

I
nlr
ins
ica
llys
aleapparalusandinl
rins
ica
llys
alepaはs0
1associaledapparaluss
hal
lbeplaced
i
nLevelsofPro
tec
tion"i"，"
a ib r“
"o i
c"

Therequiremenlso llhisslandardsha
llapply1 0al
llevels01prote
ctionunlessolherwisestated
Inl hed e
termina
lion0 1leve
l0 1prolecl
ion“ i"，"
a i
b"o r“ i
c"，laI
iure0 1 components and
conneclions shal
I be considered in accordance wi
th7 .6. FaI
iur
e0 1 separalions between
conductivepartss h
all beconsideredin accordancewilh6.3.Thed eterminalionshal
li nclu
de
opening，s ho
r l
ing and e arth
ing0 1l hee x
terna
li nlri
nsi
cal
lys ale connection lacI
ii
lie
si n
accordancewi l
h6 .2

Theinlri
nsi
cal
lysaleparamelerslorlhein
lri
nsi
cal
lys a
leapparatusandassocialedapparatus
sh
allbedelerminedlakinginloaccounll
herequiremenlsl
orsparki g
nit
ioncompliance0 15.5
andlhermalign
ili
oncompliance015.6

For ci
rcui
ls0 1associaled apparaluswhich a reconnecled1 0s a
l e
l yextr
al ow-vol
tagec irc
uil
s
(SELV)o rp r
olectiveexlral ow-voll
agec i
rcui
ls (PELV)c irc
uils，Um s ha
llo nlybea ppliedasa
common mode'v
‘ ollae，w
g ithl henominal operalingvollage app i
Iedlorl hedif
feren
lial mode
sig
nal between l hecirc
uit conduclors. (T
ypical examples ar e RS-232，RS-485 o r 4-20 mA
ci
rcui
ls)
. The c er
tili
cat
e numberl o
rassocialed apparalus relying on SELVo r PELV c irc
uit
s
sh
alli nclu
del he" X"sull
ixi n accordancew i
lhl he markingrequiremenls0 1IEC60079-0and
(UBc=ac@￡ 書 官wo-cE国コ田副ozhocω とコOZωE2uo口)NFONOω 口 hNZOEECO﹀吉一。﹁白Z4ωhzEOU

lhespeci
licc on
dilions01usel istedonl hecert
ilic
aleshalldela
ill heprecaulionsnecessary.

Wherel i
ve mainlenanceprocedures a
res pe
cif
iedbylh
e manulaclurerinlhedocumenlalion
provided，lh
ee ffecl
s0 1lh
isiIvemainlenancesha
llno
linvi
aIdaleinl
rins
icsa
lelyandl h
iss h
all
beconsideredd uringlheles
lingandassessment.

NOTE1 Ap
par
atusmayb
esp
eci
fie
dwi
thm
oret
hano
nel
ev
elo
fpr
ote
cti
on，a
ndmayh
aved
iff
ere
ntp
ara
met
ersf
or
ea
chle
ve
lofpr
ote
cti
on
NOTE2 Fo
rth
eappl
ica
tio
nofUm，U i
nth
efo
l
jlo
win
gcl
aus
es，a
nyv
olt
ageu
ptot
hemaximumv
olt
agemayb
e
ap
pli
edf
ort
hea
sse
ssment

5
.2 Levelofprotection"旧"

Wilh Um and U
ja p
pli
ed，lhei n
tri
nsi
call
y sale c
irc
uil
si nele
clri
cal apparalus 0
1l evel01
prol
ect
ion"旧"sh
alln
olbecapable01causingign
ili
onineach0
1t helol
lowingcircumslances

a
)in normal o
per
alion andw
ilhl
hea
ppl
ica
lio
nofthosenon-counlablef
aul
lswhichg
ivet
he
moslonerouscon
dition
;
b
)innormalope
ralio
nandw il
hl h i
eappIc
ationofonecountablef
aul
lpl
uslhosenon-counlable
f
aul
lswhichgiv
et hemoslonerousc
ondil
ion;
c
)i n normal ope
ralion and w
ilhl h
ea pp
lical
iono flwo counlable f
aul
lsp
lus lhose non-
counlablefa
ullswhichgivethemoslonerouscon
dili
on

Thenon-counlablel
aul
lsa
ppl
iedmayd
iff
eri
neach0
1lh
eabovecircumslances.

Inlest
ingor assessing l
hec i
rcu
ilsf
or spark i
gni
lin，l
o hel
oll
owi
ngs
afe
lyf
act
orss
hal
l be
i
appIedinaccordancewilh10
.1.4.2
一 VL可hDU@ωmouo︿

f
orbolha ) 1，
)andb 5
f
orc
) 1，
0

The sa
letyfa
clo i
r appIed 1
0v olla
geo
rcu
rre
nlf
or delerminalion o
fsu
rla
ce lemperalure
cl
ass
ifi
cal
ions
halbe1，
l 0inallcases

COPYRIGHT
 2
2

I
fo nlyonecountablef au
ltcanoccur，therequirementso fa)andb )s
hallbeconsideredtogive
al e
velofp r
otectionof"ia
"ift hete
strequirementsfo
r"ia"canthenbesati
sfi
ed.Ifnocountable
fau
ltscanoccurt herequirementsofa)shallbeconsideredtogivealev
elofprotec
tionof"旧 "i
f
thetestrequirementsfor"ia"canthenbes ati
sfied
.

5
.3 Levelofprotection"
ib"

With Um and Uj a
ppli
ed，the in
tri
nsi
call
ys a
fec i
rcu
itsinel
ect
ric
al apparatus ofl ev
elo f
prot
ect
ion"i
b"sh
allnotbecapableofcausingi
gni
tio
nineacho
fthefoll
owingcircumstances:

a
)in normaloper
ation andw
itht
hea
ppl
ica
tio
nofthosenon-countablef
aul
tswhichg
ivethe
mostonerouscon
dition
;
b
)i nnormalo perationandwit
ht h
eappl
icati
onofonecountablefau
ltp
lust
hea
ppl
ica
tio
nof
thosenon-countablefa
ult
swhichgi
vet h
emostonerouscond
itio
n.

Thenon-countablef
aul
tsa
ppl
iedmayd
iff
eri
neacho
ftheabovecircumstances

Intestingo rassessingthec i
rcui
tsf o
rsparkign
itin，as
o a
fel
yf ac
toro f1，
5sha
llbea p
pliedin
accordance w ith 10.1.
4.2
. The s a
fetyfact
ora ppliedtot h
ev ol
tageo rcur
ren
tf o
r the
determinationofsurfacetemperaturecla
ssi
fic
atio
ns ha
llbe1，0inal
lcases

I
fno countablefa
ultcan occurthe requirementsofa
)shal
l be consideredt
ogi
ve al
eve
lof
p
rot
ectionof" i
b"i
fthete
strequirementsf o
r" i
b"canbesa
tis
fie
d

5
.4 Levelofprotection"
ic"
(可。吉﹃﹄acop-BhEOMCEEd白-

With Um and Uj ap
p l
ied，the i n
tri
nsi
cal
ly safe cir
cuit
sine lect
ric
al apparatus o
fl e
velof
prot
ectio
n" i
c"sha
ll not be capable o
f causing i
gniti
onin normal op
eration and underthe
condit
ionss
peci
fiedi
nt hi
sstandard

Intestingo rassessingthecircui
tsforsparkign
itin，as
o a
fel
yf ac
torof1，0s
hal
lbea p
pliedin
accordance w ith 10.1.
4.2
. The safety fact
ora ppliedto the vo
ltag
eo rc ur
ren
tf o
r the
determinationofsurfacetemperaturecl
assi
fic
atio
ns ha
llbe1，0
ochozωヒ20MEωE300口)NVDN00

NOTE The con

ceptofc o
unta
blefa
ult
sd oesn
ota
ppl
ytothi
sl e
ve
lo fp
rot
ect
ion
.I n
fa
ll
ibl
ec om
pon
ent
sa n
d
as
sembl
ies，a
sinC la
use8 ，a
renota
ppli
cab
le.F
orl
ev
elofp
rot
ect
io "，t
n“i
c het e
rm'in
fa
ll
ib
le
's h
ouldb
ereada
s
'm
eet
ingthere
quir
ement
sof7.1
'

5
.5 Sparki
gni
tio
ncompliance

The c
irc
uits
hal
l beassessedand/ortest
edf o
rt hesuccessful l
imi
tat
ionofthesparkenergy
th
atmaybecapableo fcausingig
nit
ionofthee xpl
osiveatmosphere，a teachpo
intwherean
ロ

in
ter
rupt
ionorint
erc
onne
ctionmayoccur，inaccordancewith1 0
.1.
ド NCOEEEO﹀耐と一。﹃，白ZJω 2

For Group 1
1
1，th
e spark i
gni
tio
nte
stst
oth fGroup 1
e requirements o 18s
hal
l be a
ppl
iedt
o
cir
cui
tsexposedtodust

5
.6 Thermali
gni
tio
ncompliance

5
.6.
1 General
、
2

AI
Isurfaceso fcomponents，enclosures，w iri
ngandt h
et racksonp rintedcircu
itboardswhich
υ

may come i nc onta

ctw i
the x
plosive atmospheres sha
ll be assessed a nd/ort e
stedf or the
一
OX﹁ha 刀ωωωouu︿

maximumtemperature.Themaximumtemperaturea llowabl
ea f
terthea pplicat
iono ffaul
ts，as
provided in5.2，5.3 and 5.
4
， s h
all be in accordancew i
th the temperature requirements of
IEC6 0079-0.Tests，whenr e
quired，ares p
ecifiedin10.2

NOTE1 Thereq
uir
eme
ntsoft
hi
sclau
sear
en o
tapp
lic
abl
etoass
oci
ate
dap
par
atu
spr
ote
cte
dbya
not
hert
ypeo
f
pr
ote
cti
onl
is
te
dinJEC60
079
-0orlo
cat
edo
utsi
deth
eh a
zard
ousa
rea

COPYRIGHT
 23

NOTE2 C ar
es hou
ldb etak
eninth
es el
ecti
onofm a
teri
alstobeusedadja
centtoc om
ponentstha
tcoul
de x
hib
it
ex
cess
ivetemper
aturessuchasce
l15，bat
ter
ies，orcomponentsth
atcou
ldd 'l
ssi
pat
ep owergre
atert
han 1，
3W，
un
derthefa
ul
tc on
diti
onsdef
ine
dinClause5，topreve
ntthesecon
daryig
nit
ionoftheexpl
osiv
ea tm
osp
herebyfor
exa
mp[e，h
eati
ngorb u
rnin
gofthep
rint
edcir
cui
tb o
ards，coa
tin
gsorcomp
onentp ack
aging

5
.6.
2 TemperatureforsmallcomponentsforGroupIandGroup1

Requirementsf ortemperaturesofsmallcomponentsusedi nGroup1o rGroup1equipmentare

provided i
nt he small componenttemperature fo
r Group 1o r Group 1 el
ect
rica
l equipment
requirements o
fIEC60079-0 andthet e
strequirements a
re providedinthesmall component
ign
itiontestofIEC60079-0.

The5K and10K margino fsafe

tyr eq
uiredbythemaximumsurfacetemperaturerequirements
ofIEC60079-0 does notapplyto the maximum surfacetemperaturevalues，200oC，275 oC
and 950 oCshown i
nthet ablefortheassessmento ftemperature c
las
sif
icat
ionaccording t
o
componentsizeat40OCambienttemperatureinIEC60079-0.

NOTE Whereac
ata
lyt
ico
rot
herc
hem
ica
lre
act旧 nc
anr
es叫ts
pec
ial
ista
dvi
ces
hou
ldb
eso
ugh
t

5
.6.
3 Wiringwithini
ntr
ins
ica
llysafeapparatusforGroupIandGroup1

Themaximumpermissiblec urrentcorrespondingtothemaximumwiretemperatureduetoself-
heating s
hal
le ithe
r be taken from Table 2 fr copperwires，o
o r can be c
alc
ulate
d from the

r
followi
ngequationformetalsingeneral

明
B E﹄ (
ち

t
=
t{
acoz き ちmwOMEEEd四日ochGCOヒ

where

a i 1
sthetemperaturecoe
ffi
cie
nto
fre
sis
tan
ceo
fthewirem
ate
ria
l(0，
004284 K- frcopper，
o
004201 K
0， -
'f orgo
ld)
;
i
sthemaximumpermissiblec
urr
entr
.m.s.，i
namperes;
コu-Eω=コ00口)NEN00

i
sthe cu
rre
nta
twhichthewire melts a
tthe maximum s
pec
ifi
ed ambienttemperature，i
n
a町l
per
es;
T i
sth
eme
lti
ng temperature o
fthe w
irem
ate
ria
lin degrees Celsius (
1 083 oCf
orcopper，
1064oCf
org
old
);
sthethresholdtemperature，i
t i n degreesCelsius，ofthea
ppl
icabl
etemperaturec
las
s.The
ft
valueo ist hewiretemperatureduet oself
-heatin
gandambienttemperature
ロド NEO@﹄コ官。﹀吉百勺臼 Z﹂ωEEu一口出勺 ha-umwωωωuo︿

Example:f
inecopperw
ire(Temperaturec
las=T4)
s

004284K-1
a=0，
I
f=1，
6A (determinedexperimentallyo
rsp
eci
fie
dbythew
iremanufacturer)
T=1083 C0

f
or14(
sma
llcomponent，t壬 275 C
0
)

Applyingt
heequation

1= 1，
3A (Thi
si sthemaximumnormalo rfau
ltc
urr
entwhichmaybeallowedt
ofl
owt
oprevent
th
ewiretemperaturefromexceeding275o
C.)

COPYRIGHT
 24

Table2-Temperatureclassificationofcopperwiring
(
inamaximumambienttemperatureof40OC)

Di
amete
r C
ros
s-sec
tio
nalar
ea Maximump
erm
issib
lecurr
entfo
rte
mpe
rat
ure
(
seeNo
te4 ) (s
eeNot
e4) c
lass
ifi
cat
ion
A

m昨3 mm' T
1t oT4and T5 T6
GroupI
。0
， 3
5 0，
000962 0，53 0，
48 0，
43
。0
， 5 0
0，0196 1，
04 0，
93 84
0，
0，
1 。00785
， 2，
1 1，
9 1，
7
0，
2 0，
0314 7
3， 3，
3 3
日，
0，
35 0，
0962 6，
4 5，
6 5，
0
5
0， 0，
196 7，
7 6，
9 7
6，
NOTE1 Thev
alu
egi
venf
ormaximump
erm
iss
ibl
ecu
rre
nt，i
namperes，i
sth
er.
m.s
.8.
C.o
rd.
c.v
a[u
e.

NOTE2 Fors
tra
nde
dco
ndu
cto
rs，t
hec
ros
s-s
ect
ion
ala
reaI
sta
kena
sth
eto
ta
lar
eao
fal
lst
ran
dso
fth
e
co
ndu
ctor
.

NOTE3 Theta
bleal
50app
liest
ofJ
exi
blef
la
tco
ndu
cto
rs，s
ucha
sinr
ibb
onc
ab!
e，b
utn
ott
opr
int
edc
ir
cu
it
co
ndu
cto
rsfo
rwhic
hsee5
.6.
4.

NOTE4 D
iam
ete
ran
dcr
oss
-se
cti
ona
lar
eaa
ret
hen
omi
nald
ime
nsi
onss
pec
ifi
edb
yth
ewi
rem
anu
fac
tur
er.

NOTE5 Where t he maximum powerd oesnotexc

eed 1，
3W t h
ew iri
ngc anb eassi
gned atemp
eratu
re
c
lass
ifi
cat
ionofT4andisa cce
ptabl
ef o
rGroup.
1ForGro
upI whered
ustisexc
luded，amaximumpowe
rof3，3W
(
句。uczazωε33mω2cE

i
sp erm
iUedfo
ra mb
ientt em
peratu
reso fu
pt o40o
C.Refert
oJ EC6007
9-0，Tab
le3 a)a
nd3 b
)whereder
ati
ngis
re
quir
edforam
b i
enttemper
aturesgrea
tert
han40oC
.

5
.6.
4 Tracksonprintedc
irc
uitboardsforGroup1andGroup1

The temperature c
las
sific
ati
on oftracks o
fpr
int
edc
irc
uit boards s
hal
l be determined using
句
コ回

av
ailabledataorbya ctu
almeasurement
目 ochuzωヒ

fcopper，
Wherethetracksaremadeo thetemperaturec
las
sif
ica
tio
nmaybedeterminedusing
Table3
コ O 官。E200

Forexample，on p rin
tedc i
rcu
itboardsofa tleas t0，5m mthickness，havingaconductingtrack
of atleast 33μm thickness on one o r both sides，by applying f
actor n Table 3，a
s given i
口)NFDNO@

temperature c
lassi
fic
ati
on ofT4orGroup 1s hall begivent othep rin
tedtracksiftheyhave a
minimumwidth o f0，3m m andthecontinuous currenti nthetracksdoesnotexceed0， 444A
Simil
arly，for minimum track widths of 0，5m m，1， 0m m and 2， 0m m，T4 s h
all be given f
or
correspondingmaximumcurrentsof0， 648A，1， 092A and1， 833A respecti
vely
ロド NZOEEEω﹀ 吉5

f10m mo
Tracklengthso rle
sss
hal
lbedisregardedf
ortemperaturec
las
sif
ica
tio
npurposes

Wheretemperaturec l
ass
ifi
cat
ionofat
rac
ki o beexperimentallydetermined，themaximum
st
continuouscurrents
hallbeused，
勺白
ZJmhzvzo-UX勺 弘D 台。ωω@60︿

Manufacturingtolerancessh
allnotreducethevaluesstatedi
nth
is clausebymorethan 10%
or1m m， whicheveristhesmaller

I
ntheabsence ofte
sting，wherethe maximum powerdoesnotexceed 1，
3W ，thetracksare
s
uit
abl
eforatemperatureclas
sif
ica
tionofT4orGroup1

In the absence oftes

ting，where dusti
s excluded andthe maximum powerdoesnotexceed
3，3W ， thetracksaresui
t a
bleforGroup1

COPYRIGHT
 25

Relertothe assessment01temperature classilication l

or componentsurlace areas 亙 20m m2
table i
n IEC60079-0. Variation i
n maximum power dissipation with ambient temperature i
n
IEC60079-0wherea deratingi srequiredl
orambienttemperaturesgreaterthan40oC.

Table3-Temperatureclassificationoftrackson printedcircuitboards
(i
n a maximumambienttemperatureof40OC)

Minimumt
rac
kwidth Maximumpermissiblecurrentf
ortemperaturec
las
sif
ica
tio
n
T1t
oT4andGroupI T5 T6
mm A A A
0，075 0，8 0，6 0，5
，
。1 1，0 0，
8 0，7
，
。125 1，2 1，
0 ，
。8
0，15 1，4 1，1 1，0
0，2 1，8 1，4 1，2
0，3 2，4 1，
9 1，7
0，4 3，0 2，4 2，1
0，5 3，5 2，8 2，5
，
。7 4，6 3，5 3，2
1，0 5，9 4，
8 4，1
1，5 8，0 6，
4 5，6
2，0 9，9 7，
9 6，9
2，5 11，6 9，
3 8，1
(EuzECEBUS-zE230zhoEEZEEコ

3，0 13，3 10，7 9，3

4，0 16，4 13，2 11，4
5，0 19，3 15，5 13，5
6，0 22，0 17，7 15，4
NOTE Thev
alu
egi
venf
ormaximump
erm
iss
ibl
ecu
rre
nt，i
namperes，i
sth
er.
m.s
.a.
c.o
rd.
c.v
alu
e.

T
hist
abl
eap
pli
est
opr
int
edboards1，
6m mo
rth
ick
erw
ithas
ing
lel
aye
rofcoppero
f33μmt
hic
kne
ss
Forboardsw
ithat
hic
kne
ssbetween0，
5m mand1，
6mm，d
ivi
det
hemaximumc
urr
ents
pec
ifi
edby1，
2.
Forboardsw
ithc
ond
uct
ingt
rac
ksonb
oths
ids，d
e ivi
det
hemaximumc
urr
ents
pec
ifi
e y1，
db 5
F
orm
ult
ila
yerboards，f
ort
het
rac
kla
yerunderc
ons
ide
rat
ion，d
ivi
det
hemaximumc
urr
ents
pec
ifi
edb
y2.
uo 白)

F
or18μmcoppert
hic
kne
ss，d
ivi
det
hemaximumc
urr
entby1，
5.
N

F
or70~tm coppert
hic
kne
ss，m
ult
ipl
yth
emaximumc
urr
entby1，
3.
FO
NO

Fortra
ckspassingundercomponentsdi
ssi
pat
ing0，
25W o
rmoree
ith
ern
orm
all
yorunderf
aul
tco
ndi
tio
ns，d
ivi
de
@ロ

themaximumc ur
ren
ts pe
cif
iedby1，5.
ドNCOE2E﹀EO可申ZJE

Attermi
nat
ionso f components d
issi
patig 0，
n 25 W or more e
ith
ernormal
lyo r under fa
ultcondit
ions，and fo
r
1，
00m malongt heconductor，e
ithermul
tipJyt
het r
ackwidthby3o rd
ivid
et hemaximumc urr
entspecif
iedby2.If
th
et r
ackgoes undert ecomponent，a
h pplythefacto
rspecif
iedfo
rtrac
ks passing undercomponentsd i
ssi
pat
ing
O.25Wormore.
o60oC，d
Forambienttemperatureupt ivi
det
hemaximumc
urr
entby1，
2.
o80oC，d
Forambienttemperatureupt ivi
det
hemaximumc
urr
entby1，
3.
主旦

5，6，5 Intrinsicallysafeapparatusand componenttemperatureforGroup1

11
UX

Fordeterminationofmaximumsurfacetemperaturefori nt
rinsic
allysafeapparatus01Group1 1，
1
三230EEZ

referto IEC60079-0，temperature measurement .Inparticularthemeasurementshallbemade

usingthespeciliedvalues ofUjand ' jf
orthei ntrin
sic
alysafeapparatuswithouta 10% safety
l
factor. Thetemperatureshall bethat01thesurface ofthe i nt
rinsi
callysale apparatusthati
si n
contactwiththedus l.Forexample，forintrinsicallysale apparatus protectedbyenclosureofat
leastIP5X， thesurfacetemperatureoftheenclosureshallbemeasured

COPYRIGHT
 26

AI
!erna!
ivelyin!ri
nsica
llysaleappara!uss hallbeconsideredsui!a
blelo
r!o !
alimmersion，oran
unco
n!rolled dus!l ayr!hickness，i
e l!he ma!ched power d i
ssipa!
ionin any componen! i
sin
accordancew i!h Table4，and! he con!inuous s
hor
!-c
ircui
!c ur
ren!isless!han 250 mA. The
in
!rin
sica
llysaleappara!uss ha
llbemarkedT135oC

Table4-Maximumpermittedpowerdissipationwithinacomponentimmersedi
ndust

Maximumamb
ient 40 70 1
00
temp
era
ture
P
erm
itt
edpower 7
50 650 5
50

5
.7 Simpleapparatus

Thel
oll
owi
ngs
hal
lbeconsidered!
obesimpleappara!us:

) passive componen!s， l
a or example swi!ches， j
unc
!in boxes， r
o esi
sto
rs and simple
semiconduc!ord
evices
;
b
) sources 01s !
ored energy co
nsis!
ing01s in
gle componen!s i
n simple c
ircu
i!swi!
h wel卜
delinedparameters，lo
rexamplec apa
ci!or
so rinduc
!ors，whosevaluesshallbeconsidered
whende!ermining!heo ve
ral
ls al
e!y01!hesys!em;
c 1genera!ed energy，l
) sources 0 or example !hermocouples and p
ho!
oce
lls，which do no!
genera!emore!han1， ∞
5V，1 mAand25mW.

Simpleappara!ussha
llconlorm! oal
lre
levan!requiremen!s01!hi
ss!andardw i!h!heexcep!ion
{
官

01 Clause 12. The manufac!urer orin!

rin
sic
ally safe sys!em designer sh
all demons!ra!e
。u
Ea

compliancewi!
h! h
isclause，includi
ngma
!erialda!ashee!sand! es!repor!s，i
lappl
icable
.
﹄zωZ主唱。OMEE伺コ四百亡、 A4亡

Thef
oll
owi
ngaspec!ss
hal
lalwaysbeconsidered
• simpleappara!uss h
allno!achieves
ale
!yby!hei
ncl
usi
on0
1vo
l!a
geand/orc
urr
en!
-li
mi!
ing
and/orsuppressiondevi
ces;
• simpleappara!uss
hal
lno!con
!ainanymeans0
1in
cre
asi
ng!
hea
vai
lab
lev
ol!
ageo
rcu
rre
n!，
lo
rexampleDC-DCc onv
er!
ers;
• wherei
!isnecessary!ha!!hesimpleapparatusmain!
ains!hei n!
egri!y01!hei
sol
a!i
onIrom
0ω

ear!
h01!hei n
!rin
sic
all
ysalec i
rcu
i!，i
!shallbecapable0 1wi!hs!anding!he!e
s!vol!a
geto
ヒ
コO官。E コ0 口

ear!
hinaccordancewi!h6.
3.13
.I !
s!ermina
lss h
allconlorm!o6.2.1;
• non-
me!a
lli c enclosures and enclosures con!ainin
gl i
ght metals when l ocatedin the
exp
losive a!mospheres ha
llconlormt othe elec
trostat
iccharges on exte
rn aln o
n-metall
ic
0)

mat
eria
ls requirements and me
tallic enclosures and paはs0 1enclosures requirements 01
NFONOωロ

IEC60079-0;
• when simple apparatus isloca!edin the explosive atmosphere，the maximum surlace
ド NCOE2cω ﹀吉一O勺 白Z﹂ω為

temperatureshallbeassessed.Whenusedi nani n
trin
sical
lysafec i
rcu
itwit
hinthe
irnormal
ra!i
ng and at a maximum ambienttemperature 0 140 oC，switches，plugs，sockets and
termin
alsw i
ll have a maximum surlacetemperature 0 1lessthan 85 oC，sotheycan be
alloca
teda丁 目 temperaturecla
ssifi
cati
onlorGroup1a pplica
tionsandarea ls
os ui
tab
lelor
Group 1and Group 1 1
1a ppl
icati
ons. For other!ypes 01simple apparatus th
e maximum
temperatureshallbeassessedinaccordancew i
th5.601t hisstandard

Where simple apparatus lorms p

art01an apparatus c
on!ai
ningoth
erel
ect
ric
alc
irc
uis，the
!
wholes
h a
llbeassessedaccordingt ot
herequirementsolth
iss t
and
ard.
五 zo-uv-勺 ﹀a百出ωωou︿

NOTE1 Sens
orswhi
chuti
li
zeca
tal
yti
cr e
act
ionorot
herele
ctr
o-c
hem
ica
lme
cha
nis
msa
ren
otn
orm
all
ysi
mpl
e
ap
par
atu
s.S
pec
ial
ista
dvi
ceonth
eirap
pli
cat
ionsho
uldbeso
ught
NOTE2 J
tisnotareq
uir
eme
ntoft h
iss
tan
dar
dth
att
hec
onf
orm
ityo
fth
ern
anu
fac
tur
er'
ssp
eci
fic
ati
ono
fth
e
si
mpl
eap
par
atu
sn e
edst
obeve
rif
ied

COPYRIGHT
 27

6 Apparatusconstruction

NOTE Thereq
uir
ement
sg i
veninth
iscla
useap
ply，unl
essoth
e附 is
estat
edinthere
lev
ants
ubc
lau
ses，on
lyto
th
osef
eatu
reso
fin
tri
ns
ica
ll
ysafeap
para
tusandas
soci
atedap
parat
uswhi
chc o
ntr
ibu
tet
othi
sty
peofp
rot
ect
ion

F
ore xa
mple，th
er e
qui
rem
ent
sfo
ren
cap
sul
ati
onw
ithc
ast
ingcompounda
ppl
yon
lyi
fen
cap
sul
ati
ngi
sre
qui
redt
o
s
ati
sfy6.3
.5or6.
6

6
.1 Enclosures

6
.1.
1 General

Where i nt
rin
sicsale
ty can be impaired by ingress 01 moisture o
r dust o
r by access to
conductingpars，l
t orexampleilthec ir
cui
tscontaini n
lal
lib
lecreepagedistances，anenclosure
1
5necessary

The degree 0
1p ro
tec
tionr eq
uiredwil
l vary according t
othe intended u
se;lor example，a
degree 01prote
cti
on0 1 IP54 i
n accordance with IEC60529 may be r equ
ire
dl o
r GroupI
apparatus

The"enclosure"neednotbep h
ysi
cal
lythesamelo
rpr
ote
cti
onagainstcontactw
ithl
ivep
art
s
andtheingress01sol
idlor
eig
nbodiesandli
qui
ds

The designation 0
1the surlaces which lorm the boundaries 0
1the enclosure sh
all be the
resp
ons
ibility0 1the manulacturer and shal
l be recorded i n the d
efi
nit
ive documentation
宕B

(seeClause1 3)
Eacω 戸白書E2EE国コ田制OEECOヒコO官。E200白)NENO@口hNZOE2E﹀主一。﹃，白 Z 4

6
.1.
2 EnclosureslorGroupIorGroup1apparatus

6
.1.
2.1 General

I
ntrin
sic
allysale andassociatedapparatuswhich re
lyont hespacingsi
n Table5 o
rAnnexF
s
hall be provided wi
th an enclosure meeting the requirements 016
.1.2.2or6 .1
.2.
3 as
app
licable

6
.1.
2.2 ApparatuscomplyingwithTable5

Apparatusmeetingtheseparationrequirements0
1Table5shal
lbeprovidedwi
thanenclosure
meetingthe requirements 0
1IP20 i
n accordancewi
th IEC60529 o
rgreate
raccording t
othe
intendeduseandenvironmentalcondi
tions.

The enclosure does not need t

o be subjected t
o the t
est
sl or enclosures i
n IEC60079-0;
howeverlorp o
rtableapparatus，thedroptest01IEC60079-0s t
il
lapplies.

6
.1.
2.3 ApparatuscomplyingwithAnnexF

Apparatus meeting the separation requirements 0

1Tables F
.1o
r F.2 s
hal
l be providedw
ith
prote
ctiontoachievep ol
l ut
iondegree2 .Thiscanbeachievedbyone01thel o
llo
wing:

) an enclosure meeting t
a he requirements 0
1I P54 o
rg re
ater according t
othe intended use
and environmental condit
ionsi n accordance wit
h IEC60529. For such enclosures the
旦
玉

clauses01IEC60079-0i dent
ilie
di nTable1a ddi
tiona
llyap
ply.
ち
一 UV宅
F

) an enclosure meeting the requirements 0

b 1IP20 orgreate
raccordingtot h
e intended use
and environmentalc ond
itionsin accordancewith IEC60529providedthatseparationsare
、EEE000︿

obtainedbyusingc oa
tingtype1o rtype2o rcas
tingcompoundo rthroughsoli
di nsula
tio
n
The enclosure doesnotneedt o besubjectedtothet e
stslo
renclosuresin IEC60079-0;
howeverl orportableapparatus， thedroptest0
1IEC60079-0stil
la p
plies
c
) anenclosure meetingtherequirements0 1IP20andbyr est
rictedinst
allation，providedt h
at
the r
est
ricte
di nsta
lla
tion requirements s
hall be spe
cilie
d as Specilic Conditions 0 1Use
and the c
erti
licat
e number s halli ncl
ude the "X" s
uff
ixi n accordance w itht he marking

COPYRIGHT
 28

requirements 0
1IEC60079-0 andtheS pe
cil
i 1Usei
cConditions0 Isted ont
hec
ert
ifi
cat
e
sha
lld e
tailtheins
tal
lat
ionrequirements

6
.1.
3 EnclosuresforGroup1
1
1apparatus

Wherethei nt
rins
ics ale
ty01int
rins
ica
llysaleapparatuscanbeimpairedbyingres
s01dusto r
byaccesst oconductingpa
rts，lo
rexamplei lthecir
cuit
scont
ainin
la川b ecreepagedistances，
l
anenclosurei
snecessarybyone0 1theloll
owing
:

) Wheres
a ep
ara
tioni saccomplishedbymeetingt h
erequirementslorclearanceorcreepage
distances01Table5 orAnnexF，t heenclosureshallp r
ovi
dea degree0 1p r
ote
ction01at
leastIP5X，accordingto IEC60529. Forsuch enclosuresthe6.
1.2.3a)s halladd
itio
nal
ly
apply
) Where s
b eparat
ioni s accomplished by meeting the requirements lor distances under
coa
ting，cast
ing compoundo rseparat
ion distancesthroughs oli
dinsula
tion0 1Table5 o r
AnnexF，theenclosures h
allprovideadegree0 1protectio
n0 1atleastIP2X，accordingt o
IEC60529. The enclosure does notneedt o be subjectedt othetestslor enclosures i
n
IEC60079-0;howeverl orportab
leapparatus，thedropt est0 1IEC60079-0sti
lla p
plies

Enclosuresl
orGroup1
1
1associatedapparatuss
hal
lmeettherequirements016.1.2

6
.2 F
aci
lit
iesforconnectionofexternalc
irc
uit
s

6
.2.
1 Terminals

Inadditio
ntos
ati
sfyigtherequirements016.3，t
n e
rminalsl
orin
tri
nsi
cal
lysaleci
rc山 t
ssha
llbe
(
百
2zzazω ￡書官。旦c E悶コ四百chucωヒコロ官。E200

separated什omterm
inalsl
ornon-
intrin
sica
llysalecir
cui
tsbyoneormore0 1themethodsgiven
ina)orb)

Thesemethods0 1separationsha
lla l
sobea p
pliedwherein
tri
nsi
cs al
etycanbeimpairedby
ext
erna
lw i
ringwhich，i
ldisconnectedIromt
het e
rmin
al，cancomei n
toc o
nta
ctw
ithconductors
orcomponents

NOTE1 Tem、
in
alsfo
rc o
nne
ctiono
fex
ter
nalc
irc
ui
tstointr
in
si
ca
llysa
feappa
ratu
sa n
das
soc
iat
eda
ppa
rat
us
sh
oul
dbe50a
rra
ngedth
atcompo
nent
swi
lln
otbedamagedwhenmak
ingthec
onne
ctio
ns
a
) Whenseparationi
saccomplishedbydi
stan
cethentheclearancebetweenbareconducting
pa
rts0
1terminalss
hal
lbea tl e
ast50mm.
NOTE2 C
ares h
ouJ
db eexe
rci
sedi
nt hela
you
tofterm
ina
lsa
ndi
nth
ewi
rin
gme
tho
dus
ed5
0th
atc
ont
act
be
twe
enc
irc
uit
sisun
lik
elyi
fawi
rebecomesdis
lod
ged
口)NFDN00

b
) When separation i
s accomplished by l
ocatingte
rmi
nalslo
ri n
trins
ica
lly sale and non-
in
tri
nsi
call
ysalec i
rcui
tsinseparateenclosuresorbyuse01e
ith
erani n
sula
t i
ngpartit
ionor
anearthedmetalparti
tio
nbetweent erm
inalsw i
thacommoncover，thelollo
w in
ga pp
lies・
口 hNCOEEEO

1
)p ar
tit旧 ns used t
o separatetermin
alsshal
l extendtowithn 1，
i 5m m 01the enclosure
walls，ora lter
nat
ivel
ys hallprov
ide a minimum dis
tance0150m m between the bare
conductingp ar
ts01terminalswhenmeasuredi nanydir
ecti
onaroundthepa
rti
t旧n;
2
) metalparti
tionssha
llbeearthedands h
allhavesuff
ici
ents t
rengt
handr igid
ilytoensure
﹀吉一。勺 OZJmhZMLu-uv﹃ ha ちωωω@00︿

thttheyare noti
a Ike
lyt obedamagedd ur
ingfi
eldwirin
g. Such par
titi
onss ha
ll be at
least0，45m mt hic
ko rshal
lconlormt o1 0.6
.3i
l0 1less
ert hi
cknes
s.I naddition，metal
par
titi
onss h
allhaves uf
ficie
ntcurr
ent-car
ryingc
apacitytopreventburn-througho rloss
01earthconnectionunderlaultc
ondit
ions;
3
)n on
-metal
l i
ci nsul
atingpart
iti
onsshal
lhaveanappropr 旧teCTI，suff
ici
entthicknessand
s
hall be so supported t
hatthey cannotre
adi
ly be delormed i
n a mannert hatwould
delea
ttheirpurpose.Suchp a
rti
tion
ss ha
llbeatleat0，
s 9m mt h
ick，orsha
llconlormt o
10.
6.3il01l e
sserthickness

The clearances and creepage dista

nces between the bare conducting parts0 1term
inals01
separate i
ntri
nsi
call
ysale c i
rcu
its andto ea仕hed o rpotent
ial-Iree conducting p
art
ss ha
ll be
equaltoorexceedt hevaluesgiveninTable5

COPYRIGHT
 29

Whereseparateintr
ins
ica
llysaf
ec i
rcuit
sa rebeingconsidered，t
heclearancedis
tan
cebetween
bareconductingp
artsofexte
rnalconnectionfa
cili
tie
sshallmeett h
efollow
ing:

a
tle
ast6m mbetweent
heseparatei
ntr
ins
ica
llysafec
irc
uit
s;
a
tleas
t3m mfromearthedp
ars，i
t fconnectiont
oea
rthhasn
otbeenconsideredi
nth
e
s
afe
tya n
aly
sis

See Fi
gur
e 1 when measuring di
stanc
es around sol
idi n
sula
tin
gw all
so rpart
itio
ns. Any
po
ssi
blemovementofmeta
llicpar
tst h
atarenotrig
idl
yfixe
ds h
allbetakenin
toaccount
.
BE (司
こacoz ﹀﹀UOOZEEd町村ochucoヒ
コOM
Eω雇コ00口}刊 FDN00口hNE02コ官。﹀芭百可白 Z﹂ωhzEo-u￥
﹃
， ha宮古川刷。00︿

COPYRIGHT
 30

DimensionsI
nmI
lli
met
res
{
ち
2EZacωZ書官富山C E伺コ四百 ξ、
Au
--
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I
EC1
380
106

Key

1 Conductivecover

TDistancesi
naccordancew
ith6.3

d Clearancedistancea
tex
ter
nalconnectionf
aci
lit
ieso
fte
rmi
nal
sinaccordancew
ith6
.2.
1

NOTE Thedimensionsshownaret
hecreepageandclearancedistancesaroundt
hei
nsu
Jat
ionasi
ndi
cat
edabove，
no
tth
ethick
nessoft h
einsu
lat
ion

Figure1a-Distancerequirementsforterminals
carryingseparatei
ntr
ins
ic lys
aJ afecircuits
。
旬
ωωω50︿

COPYRIGHT
 3
1

IEC 1381/06

Key

1C
ove
r:n
on-
con
duc
tie，o
v rco
ndu
cti
vea
nde
art
hed
2P
art
iti
oni
nac
cor
dan
cew
ith6
.2.
1b)
;int
hi
sex
amp
[e，t
i5h
allb
ehomogeneousw
itht
heb
aseo
rce
men
tedt
oti
T D
ist
anc
esi
nac
cor
dan
cew
ith6
.3
1 ミ 3mm;w
d henc
ove
risc
ond
uct
ivea
nde
art
hed
，
2 と 6mm
d
d3 ~ 5
0mmo
rd4:
;15mm
，

NOTE The d
ime
nsion
sshowna
ret
hec
lea
ran
ced
ist
anc
esa
rou
ndt
hei
nsu
lat
ion，a
sin
dic
ate
dab
ove，n
ott
he
th
ick
nes
s01thei
nsu
lat
ion
(
万里CEacoz書官。BZE同コ四日OEhu升otコO芭ωEコ00口)NV口N00

F
igu
re1
b-Example0
1se
par
ati
on0 1i
ntr
ins
ica
llys
afeandno
n-i
ntr
ins
ica
llys
afet
erm
ina
ls
th
roughuse01apar
tit
ion

Figure1-Separationofi
ntr
ins
ica
llysafeandnon-intrinsicallysafeterminals

6
.2.
2 Plugsandsockets

Plugs andsockels usedforconneclion o

fe x
lerna
li n
lri
nsi
call
ysafe c
ircui
lss
hal
l beseparale
fromandnon-inlerchangeablew
ilhIhosef ornon
-in
lri
nsic
allysafec
irc
uils
.

Wherei n
lrin
s i
callysafeorassocialed apparalusi sf i
lle
dw il
h moreIhan onep lug andsocket
forexlernal conneclions and inlerchange could adverselyaffec
lIhetype ofp r
otectin，such
o
plugsandsockelss ha
lle il
herbearranged，f rexamplebykeying，soI
o hatinterchangeisnot
possibe，o
l r maling plugs and sockels shall be iden
lilied，lo
r example by marking orcolour
coding，10makeinlerchangingobvious
ロド NZ02コ官。﹀芭百可白Z﹂ωhazo-uv﹃ hahuωωωωuu︿

Where a plug or a sockel i

sn olprefabr
icaledw ilhils wires，Ihe connecling l
aci
lil
iess
hall
conlorm1 06.2
.1.11，however，IheconneclionsrequireIheuse01aspeciallool，f orexampleby
crimping，such Ihal Ihere is no p
oss
ibili
ty0 1a s l
rando f wire becoming f r
ee，then Ihe
conneclionf
acil
iti
esneedo n
lyconlorm1 0Table5

Where a conneclor c
arries earlhed c
irc
uil
s and IheIype o
fp ro
lec
lion depends on Ihe e
art
h
conneclionIhenIheconneclors hal
lbeconslrucledinaccordancewilh6
.5.

6
.2.
3 Determinalionofmaximumexlernalinduclance10resislancer
alo(LolRolfor
i
resislancelim
iledpowersource

The maximum e x
le r
nal induclance to resislance r
alo(
i Lo
lRolwhich maybe connecled10a
resisla
ncelimi
led powersources ha
ll bec alcula
ledusingI h
efollo
winglor
mul
a.Thislormula
lakesaccount01a1， 5faclorofs al
elyonc urrentands ha
llnolbeusedwhereCsf orIheoulpul
lermi
nals01Iheapparalusexceeds1% 0 1Co.

COPYRIGHT
 32

LO BeRs+(
64e
'R'-
s 7
2Uo'
eLs
)，
y
HIn
RO 4，
5Uo'

where

e i
s!h
eminimums
par
k-!
es!appara!usi
gni
!io
nenergyi
njo
uls，andi
e sfo
r
Group1appara!us: 525μJ
GroupI
IAappara!us: 320μJ
Group1
18appara!us: 160μJ
GroupI
ICappara!us: 40μJ
Rsi
s!h
eminimumou!pu!r
esi
s!a
nc f!hepowersource，i
eo nohms;
Uoi
s!h
emaximumopenc
irc
ui!v
ol!
age，i
nvo
l!s
;
L
sis!
hemaximuminduc!ancepresen!a
!!hepowersource!
erm
ina
ls，i
nhenries
Csi
s!h
emaximumcapaci!ancepresen!a
!!h
epowersource!
erm
ina
ls，i
nfarads

fL
I s=0

L
o 32e日
!hen 一一=一一一一三 H/Q
Ro 9Uo'
{EVEaEZBBOWCEE四百EEtωヒ

Whereas
afe
!yf
ac!
o f1i
ro sre
qui
red，!
hisvaluef
orL
olR
oshallbemul!ipliedby2，
25.

NOTE1 Then
orm
aJapp
lic
ati
ono
ftheLjRorat
ioisf
ordis
tri
but
edp a
rame
ter
s，f
ore
xam
plec
abJ
es.I
t
5us
efo
r
Ju
mpedv
alu
esf
ori
ndu
cta
nceandr
esi
sta
ncer
equ
ire
sspe
cia
lconsi
dera
tion
NOTE2 LclRomayb edetermi
nede x
per
iment
allyfo
rn o
n-li
n e
arpowerso
urcesbytes
tin
gt h
ec i
rc
ui
twithsevera
J
di
scre
tev a
Jue
so fLoandR ousin
gt hesp
arktest
sin1 0.
1.T hevalu
esofRou s
edshouldrang
ef ro
mprac
tic副 I
ya
sho同 c
ir
cui
t(maximum10) t
oprac
tic
all
yopenc i
rc
uit(
10 ne
arl
yz er
o)a n
dat r
endest
abli
shedtha
te n
sur
est ha
tt h
e
LJRowil
lnotres
ulti
nfai
lureofth
es pa
rktes
t

6
.2.
4 Permanentlyconnectedcable
ヨuwEEコ

Appara!us which i s cons!ruc!ed w

i!h an i n
!egr
al cable fore x!e
rnal connec!ions s h
all be
subjec!ed !o! hep u
ll! es!in1 0
.9 on !he cable i
f breakage of! he !ermina!ions i
nside !he
appara!us could res
ul!i nin!ri
nsicsaf
e!ybeing i nv
alida!
ed，for examplewhere! h
ereis more
00口)刊呂刊0

!han one i ntr

insi
cally safe circ
ui!in! he cable and breakage could lead t o an unsafe
intercon
nec!ion.
0口hNEOEコ官。﹀王O勺白Z

6
.2.
5 Requirementsforconnectionsandaccessoriesfor1
5apparatuswhenlocatedi
n
thenonhazardousarea
司

In
!rin
sica
llysafeapparatusmaybeprovidedw i!hconnec!ionf a
cili
!ie
s! ha!areres!ric!ed!ouse
i
n a non-hazardous area e .. da!a downloading and bat
g !ery charging connections. Such
fa
cil
i!i
ess h
allbeprovidedw i!
hp ro!e
c!iont
oensure! hera!ingso f!hesafetycomponen!sw i!hin
!hein!ri
nsic
all
y safe equipment complywi!h7 .1
. The use ofa fuse pro!ec!ed shun!Zener
assembly complying w
ith7 .3 and 7.5
.2shall be considered suffic
ien!p r
o!ectionfor vol!age
﹂旦 szo-U出勺主EB80︿

li
mi!a
!ion

Where!heseconnec!ionsareprovidedf
or!
h fbat
econnec!iono !er
ychargerseea
lso7.
4.9

Pro!e
c!ioncirc
ui!r
yandcomponen!smayr es
ideei!herinthein!r
insi
cal
lysafeappara!usor!he
non-hazardous area equipmen!. I
f any p
artof!he p ro!
ectio
nc ir
cui!isloca!e
di n !he non-
hazardousareaaccessory，i !sha
llbeassessedi n accordancewi!h!hi
sstandardand!henon-
hazardousareaaccessorys hallbes !a
!edin!hedocumen!a!ion

COPYRIGHT
 3
3

Themaximumv ol
tageU mt hatcanbea pp
lie
dtothesenon一hazardousareaconnectionssh
all
bes tatedinthedocumentation，andmarkedontheintr
ins
ica
llysaleapparatus.TheUm atthe
connectionla
cil
iti
ess h
allbeassumedt obethenormalmainssupplyv oltagee..250V a
g .c
unlessmarkedotherwise

NOTE I
fUmi
sle
sst
han2
50Va
.c
.，t
hi
ssh
oul
dno
tbed
eri
vedf
romu
nas
ses
sede
qui
pme
nt

Addit
iona
lly，the c
irc
uit01the i
ntri
nsi
cally sale apparatus s
hal
l be provided wit
h means to
preventthe de
live
ry0 1i
gniti
on-ca
pable energyt othese sale area connectionswhen i
n the
hazardousarea.

NOTE Thes
er eq
uir
eme
ntsd
ono
tap
plyt
oth
eus
eofc
onn
ect
ion
sbyt
hem
anu
fac
tur
erd
uri
ngp
rod
uct
ion，t
e5t，
re
pai
roro
verha
uJ

6
.3 Separationdistances

6
.3.
1 General

Requirementsl o
rseparat旧 ndistancesaregivenin6
.3.2t
o6.
3.1
4.Ana
lte
rna
tiv
emethodf
or
thedimensioningofsepar
at i
ondistancesisgiveni
nAnnexF

6
.3.
2 Separationofconductiveparts

Separationo
fconductivep
art
sbelween

i
ntr
ins
ica
llysafeandn
on-
int
rin
sic
all
ysafec
irc
uis，o
t r
(
刀
2ccacoZ3300MgEEJ四百Ehotωヒ

d
ilf
ere
nti
ntr
ins
ica
llysafec
irc
uis，o
t r
ac
irc
uitandearthedo
ris
ola
tedmetalpaはs，

s
hal
lconformt
oth
efo
llo
win
gift
hetype0
1pr
ote
cti
ondependsonthes
epa
rat
ion

Separation distances s
hal
l be measured or assessed takingi n
to account any poss
ible
movement0 1theconductorsorconductivep
arts
.Manufacturingtolerancess
hallnotreducethe
distancesbymorethan1 0% or1m m，whicheveri
sthes maller

Separationdistancest
hatcomplyw
it fTable5o
hthevalueso rAnnexFunderthec
ond
iti
onso
f
コ O官。在コ 00白}NFDN00

6
.1.
2.2，6
.1.
2.3o
r6.
1.3s
hal
lnotbes
ubj
ectt
oaf
aul
t

Thel
aul
tmodeo
fla
ilu
reo
fsegregations
hal
lon
lybeas
hor
t-c
irc
uit

Separat旧 nr equirementss h
alln otapplywhereearthedmetal，f o
rexamplet racks01aprinted
cir
cuitboardo ra parti
tion，separatesani n
trins
ica
llysalec i
rcuitfromo thercircu
its，provided
ロ

thatbreakdownt oe arthdoesnotadverselya f
fectthetypeo fp ro
tectionandt hattheearthed
ド NEOE2co﹀吉E﹁OZ﹂ωh

conductive part can c arry the maximum c urrentthat would flow under l au
ltc onditio
n s
Creepage d istance requirements sha
ll not applywhere earthed p r
intedc ir
cui
t board tracks
separate conductive tracksr equir
ing separation，but clearance requirements shal
ls ti
ll be
appli
ed.Clearancerequirementss hallnotapplywhereanearthedm etal
licp a
rtit
ion01s u
ffici
ent
heightdoesnota llowadischargebetweencomponentsr equiringseparatio
n.

NOTE1 F orexamp
le，th
ety
peo
fpr
ote
cti
ondo
esd
ependont h
esepa
rat
iont
oearth
edoriso
lat
edmet
all
icpar
ts
i
fac u
rre
nt-
lim
iti
ngres
ist
orc
anbebyp
assedb
ysh
ort
-ci
rcu
itsbet
weenthec
irc
ui
ta ndth
ee ar
the
do riso
lat
ed
me
tal
licpa
rt
￡zo-uv﹃ hahuomω000︿

Anearthedmetalp ar
titio
ns h
allhaves tr
engthandr i
gidi
tysot ha
titisunlikel
yt obedamaged
ands ha
llbeo fsuf
ficien
tthicknessando fsuf
fic
ientcurrent-ca
rryingcapacit
yt opreventburn-
throughorl os0
s 1earthunderf a
ultc o
nditio
ns.A pa
rti
tione it
hers h
allbea tleast0，45m mthick
and attachedtoar i
gid，earthed metal p
ortio
no fthe device，o rsha
ll conformt o10.6.
3ifo f
lesserthick
ness.

COPYRIGHT
 34

Wherean on-
metallici
nsula
tin
gp a
rti
tionhavingat hick
nessanda ppr
opriateCTIi naccordance
wi
thTable5i splacedbe!weent heconductivepars，t
t heclearances，creepaged ista
ncesand
othe
rs ep
aratio
nd i
stanc
ess h
all be measured around thepartit
ion provided t
hateithe
rthe
pa
rti
t旧 nhasat hi
cknes
so fatlea
st0，9m m，o rconformst o10.6.3i
fo flesserthickn
ess.

NOTE2 M
eth
odso
fas
ses
sme
nta
reg
ive
ninA
nne
xC

6
.3.
2.1 DistancesaccordingtoTable5

For Levels01Prote
ction“旧" and“i"，s
b mal
lerseparati
ond i
stances，which a
rel essthanthe
values spe
cil
iedin Table 5 butgreat
er than o
r equal toone-t
hird0 1tht value，s
a hal
l be
consideredassub
jecttocountables
hort-c
ircui
tfau
ltsi
ft h
isimpa
irsi n
tri
nsi
cs a
fety

For Levels o
fP rote
ction“ia
" and“ibぺifsepara
tiondist
ancesar
elessthan o ne
-th
irdo fthe
valuess pe
cifie
di nTable5，theyshallbeconsideredassub
jectt
onon-countablesho
rt-
circ
uit
fau
ltsifthisimpai
rsintr
ins
icsafe
ty.

For Le
velo fProt
ect
ion“ICぺifsepa
rationdista
ncesareles
s than th
e values s
pec
ifi
edi
n
Table5，theys
hal
lbeconsideredassho
rt-
cir
cui
tsift
hisi
mpa
irsint
rin
sicsaf
ety.

6
.3.
2.2 DistancesaccordingtoAnnexF

ForLevelso
fP r
otec
tin“旧"and“
o i"，i
b fsepar
ationdistan
cesarel
essthanthevaluessp
ecifi
ed
inAnnexF，theysh
allbeconsideredtofa
ultasprovidedi
nF.3
.1ifth
isimpa
irsint
rins
icsaf
ety
.
(UECEacoz言方自ωBCE伺コ回 MOZEto

For L
eve
lo fProtec
tio
n“ICぺi fsep
arati
ond ist
a n
c e
sa r
el es
s than the values s
pec
ifi
edi
n
AnnexF，theys
hal
lbeconsideredasshoは-c
irc
uitsifthi
si mp
airsi
ntri
nsi
cs afety
.
一 ヒコO芭ωE2uo白)NENoω ロ ド 刊 C022EO﹀ωEO勺臼Z﹂ωEEO UV﹃、230
目 ω00︿

COPYRIGHT
 AccessedbyJKCl
chl
hysLNGJ
oin
tVentureon27Dec2012(Documentc
urr
enc
yno
tguaranteedwhenp
rin
led
)

creepagedistancesand separations
Table5-Clearances，

1 2 3 4 5 6 7
Vo1tage Clearance Separationdistance Separationdistance Creepagedistance Distance Comparativetracking
(peak through throughsoi 1d undercoating index(CT
I)吋
value) castingcompound insulation
V m町、 町
m可 mm mm mm
Levelof i b
a，i I
C i b
a，i i
c i b
a，i i
c i b
a，i I
C i b
a，i I
C i
a i c
b，i
protection

10 5
1， 4
0， 5
0， 2
0， 5
0， 2
0， 5
1， 0
1， 5
0， 3
0，
30 0
2， 8
0， 7
0， 2
0， 5
0， 2
0， 0
2， 3
1， 7
0， ，
。3 100 100

60 0
3， 8
0， 0
1， 3
0， 5
0， 3
0， 0
3， 9
1， 0
1， 6
0， 100 100

90 0
4， 8
0， 3
1， 3
0， 7
0， 3
0， 0
4， 1
2， 3
1， 6
0， 100 100
19日 0
5， 5
1， 7
1， 6
0， 8
0， ，
。6 0
8， 5
2， 6
2， 1
1， 175 175

375 0
6， 5
2， 0
2， 6
0， 0
1， ，
。6 0
10， 0
4， 3
3， 7
1， 175 175
550 0
7， 0
4， 4
2， 8
0， 2
1， 8
0， 0
15， 3
6， 0
5， 2，
4 275 175

明
750 0
8， 0
5， 7
2， 9
0， 4
1， 9
0， 0
18， 0
10， 0
6， 9
2， 275 175
む3
1000 0
10， 0
7， 3
3， 1
1， 7
1， 1
1， 0
25， 5
12， 3
8， 0
4， 275 175 01

口O U︿耳一白工↓
1300 0
14， 0
8， 6
4， 7
1， 3
2， 7
1， 0
36， 0
13， 0
12， 8
5， 275 175
1575 0
16， 0
10， 3
5， 7
2， 0
49， 0
15， 3
16， 275 175
3k
3， 0
18， 0
9， 5
4， 0
32，
4，
7k 0
22， 0
12， 0
6， 0
50，
5k
9， 0
45， 0
20， 0
10， 0
100，
6k
15， 0
70， 0
33， 5
16， 0
150，

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IEC 1382
Key
1) Chassis
2) Load
3
) Non-
intrins
icall
ys af
ec ir
cuitdefine
dbyUm
4
) Pa吋 ofi n
trin
sic
all
ysafec ircu
itnoti t
sel
firi
fri
nsic
aJlysafe
5
) Int
rinsi
call
ys afeci
rcui
t
6
) Dimensionst owhichTable5o rAnnexFa reapplicab
le
7
) Dimensionst owhichgenerali nd
ustri
alstandardsarea ppli
cabJe
8
) Dimensionst o7.3
9) Dimensionst o6.2.
1f oroutputterminalsbetweenseparateI nt
rin
sic
all
ysafec
irc
uit
sandbetweenI
ntr
ins
ica
llys
afet
ononi
ntr
ins
ica
llys
afe
cir
cuits
1
0) Protec
tivecomponentsasa p
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th8 .9
Figure2 - Exampleofseparationofconducting parts
 37

6
.3.
3 Voltagebetweenconductivepaはs

Thev ol
tagewhichi staken i n
toaccountwhen usin
gTable5o rAnnexF s ha
llbet hev
olta
ge
between any two conductive part
sl o
r which t
hes e
para
tion has an effe
ct on t
hetype0 1
pro
tecti
on0 1thec ir
cuit under co
nsid
eratin，t
o hatislorexample (see F
igure2)t hev
olta
ge
betweenani n
trin
sic
allysalec ir
cui
tand

p
art0
1th
esamec
irc
uitwhichi
sno
tin
tri
nsi
cal
lysale，o
r
n
on-
int
rin
sic
all
ysa
lec
irc
uis，o
t r
o
the
rin
tri
nsi
cal
lysalec
irc
uit
s.

Thev
ale0
u 1voltaget
obeconsidereds
hal
lbee
ith
er0
1thel
oll
owi
ng，asa
ppl
ica
ble

a
) Forcir
cuitswhich ar
egal
vanica
llyseparatedwit
hint heapparatus，t
hevalue01voltageto
beconsideredbetweenth
ec ir
cuis，s
t hallbet hehighe
stvoltaget h
atcanappearacrossth
e
sep
arationwhent hetwoc
irc
uitsareconnectedtoge
theratanyonep o
int，d
erive
dIrom
t
her
ate
dvo
lta
ges0
1th
eci
rcu
its，o
r
th
emaximumv o
lta
gess
pec
ili
edbyt
hemanulacturerwhichmays
ale
lybes
upp
lie
dto
t
heci
rcu
its，o
r
anyv
olt
age
sgeneratedw
ith
int
hesameapparatus
Whereone0 1thevoltag
esisl e
ssthan20% 01theother，itshallbei gnored.Mainssupply
vol
tagessh
all be taken w
ithouttheaddi
tion0 1 standard mains tolerances. For such
si
nuso
idalvolt
ages，peakvolt
agesha
llbeconsideredtobet hel o
llo
wing
(
U

.
J2xr
S

.m.s.value01theratedvoltage
E
-昆 cE

b
) Be臥l
eenp a
rts01ac irc
uil
:themaximumpeakvalue0 1thev
oltag
et h
atcanoccuri neith
er
pa
rt01tha
tc i
rcu
il.Thismaybet hesum0 1thevoltages01dif
fer
entsourcesconnectedto
ョEECEMUコ田副OEEtE304EEコuo口)NFDNoω 口hNCOE25

t
hatc
irc
u .One0
il 1thevoltagesmaybeignoredi
li
tisl esthan20% 0
s 1theother
I
nal
lcasesv
oltag
eswhichar
ised
uri
ngt
hel
aul
tco
ndi
tio
ns0
1Clause5s
hal，wherea
l ppl
ica
ble，
beusedt
oderi
vethemaximum

Anye xter
nalvoltagesha
llbeassumedt ohavethevalueUm o rU jdeclaredlortheconnection
la
cili
tie
sthroughwhich itente
rs.Transientvoltag
es such as mightexistbelorea prote
ctive
device，lorexamplealuse，thatopenst hecir
cui
ts ha
llnotbeconsideredwhene v
aluat
ingt he
creepaged i
stance，bu
ts h
allbeconsideredwhene valu
atin
gclearances

6
.3.
4 Clearance

I
nsu
lat
ingpartit
ionsthat do no
t meet t
he requirements 0
16.
3.2s
hal be ignored，o
l the
r
i
nsu
lat
ingpa仕 ssha
llconlormtocolumn401Table5.

Forv ol
tag
esh i
gherthan 1 575 V peak，an i
nter
posin
gi ns
ula
tingpar
tit
iono
r earthed metal
par
tit
ionsh
allbeused.Inei
th rcase，
e t
hepar
tit
ionsha
llconlormto6.
3.2

6
.3.
5 Separationdistancesthroughcastingcompound
﹀主 40ZJE

Casting compound s h
all meet t he requirements 016 .6. For those p arl
st h
atr equi
re
encapsulation，th
e minimums ep
arationd istancebetween encapsulated conductivepartsand
components，andt heI re
esurlace 01thec asting compounds hall be a
tl easth a
llthevalues
n column 30 1Table5，w h a minimum 0 11mm.When thecasting compound i
長

shown i i
t sin
官一 UX﹁EEωEOO︿

dire
ctc ontactwith and adheres to an enclosure 01sol
idi nsul
ationm ateri
al conlorming t
o
column40 1Table5，nootherseparationisr equire
d(seeF igureD.1)

Thei
nsu
lat
ion0
1th
eencapsulatedc
irc
uits
hal o6
lconlormt .
3.1
3

COPYRIGHT
 3
8

The f a
ilur
eo f a component which is encapsulated o
rh ermet
icaly sealed，f
l or example a
semiconductor，which is used i
n accordance with7.1 and i
n which i
nter
nal clearances and
distancesthroughencapsulantarenotdefined，istobeconsideredasas inglecountablefault

NOTE F
urt
herg
uid
anc
eisg
ive
ninA
nne
x0

6
.3.
6 Separationdistanceslhroughs
oli
dinsulation

Solidinsu
lat
ionisi ns
ulatio
n which i
s extruded o
r moulded but not poured. I
tsh
all have a
die
lectr
icstren
gththatconformst o6.3.13whentheseparationdistancei sinaccordancewith
Table5 orAnnexF .The maximum c urrentinthei n
sula
tedw i
rings h
all notexceedther at
ing
speci
fiedbythemanufacturerofthewire
.

NOTE1 l
fthein
sul
ato
risfa
bri
cate
dfro
mtwoormorepi
eceso
feJ
ect
ric
aJi
nsu
lat
ingm
ate
ria
lwh
icha
res
oli
dly
bon
dedt
oge
thr，t
e henthec
omp
ositemaybec
ons
ide
redass
oli
d

NOTE2 Forth
ep ur
pos
eo ft
hiss
tan
dard，s
ol
idi
nsu
lat
ioni
sco
nsi
der
edt
obep
ref
abr
ica
ted，f
ore
xam
ples
hee
tor
s[
eev
ingo
rela
stom
erici
nsu
lat
iono
nwiri
ng

NOTE3 V
arn
isha
nds
imi
larc
oat
ing
sar
eno
tco
nsi
der
edt
obes
oli
din
sul
ati
on

NOTE4 Sepa
rati
onb e
tweenad
jacen
ttrac
kso ni
nte
rme
dia
tel
aye
rso
fpr
int
edc
ir
cu
itb
oar
dss
hou
Jdb
eco
nsi
der
ed
asse
par
ati
ondis
tanc
est h
rou
ghsol
idins
ula
tio
n

6
.3.
7 Compositeseparations
(32EEEZ言EBCE伺コ四回OCECOヒコovcωE200白)

WhereseparationscomplyingwithTable5arecomposite，f o
rexamplethrough acombination
ofa i
r and insu
lat
ion，thetot
al separation s
hal
l be c
alc
ulated on the basis o
fre
fer
ringa l
l
separationst
oonecolumno fTable5 .Forexampleat60V :

clearance(column2
)=6xseparationthroughs
oli
din
sul
ati
on(column4
);
clearance(column2
)=3xseparationthroughc
ast
ingcompound(column3
);
equivalent clearance = ac
tual clearance + ( 3 x any ad
ditio
nal separation through
encapsulant)+( 6xanya d
ditio
nalseparationthroughs
olidi
nsula
tion) ー

ForLevelsofProte
ction“ia"and“ bぺf
i ortheseparationt
obei
nfa
lli
ble，theabover
esu
lts
hal
l
benotlessthantheclearancevaluesp
ecil
iedinTable5

Anyclearanceorseparationwhichi
sbelowo n
e-t
hir
d01t
her
ele
van
tvalues
pec
ifi
edi
nTable5
sh
allbeignoredlo
rt hepurpose0 1c
alc
ula
tio
n.
NFD
NU

For L
evelofP ro
tecti
on"
icヘ t
he above r
esu
ltss
hal
lno
t be l
ess than t
he clearance value
ωロ

spe
cifie
dinTable5.
ド NC02コ主O

6
.3.
8 Creepagedislance

For the creepage distances s

pecif
iedi n column 5 ofTable 5，the insu
latin
gm at
erialsha
l l
﹀王 O可臼Z﹂旦￡舌一u

conlorm to column 7 o fTable 5 or AnnexF where a pp

lica
ble，which spe
cifythe minimum
comparative trac
king index (CTI
) measured i n accordance wi
th IEC60112. The method 01
measuringo rassessingthesedistancess h
allbei naccordancew it
hFigure3

Whereaj oi
ntis cemented，thecements
hal
l havei
nsu
lat
ionp
rop
ert
iesequivalentt
othoseo
f
teadjacentmateria.
h l
u弓EEEgu︿

Wheret he creepagedistancei s madeupfromthea ddi

tionofs h
o r
terdistances，lorexample
where a conductive p
artis interposed，distances 01lessthan on
e-thirdthe relev
antvalue i
n
column5o fTable5s hal
lnotbetakeni noaccount
t .Forvoltageshigherthan1575Vpeak，an
inte
rposi
n gi n
sulati
ngp a
rti
tiono r earthed m
etalli
cp ar
titio
ns h
all be used. I
ne i
ther case，t
he
pa
rtiti
onshallconlormt o6.3.2

COPYRIGHT
 39

く3 ;
'3

ムボ一一
bo ，、ムム
。ろろろろ1 ιr シろろろ'/-乙<
v
I

M
B
E (
ち
E﹄aco￡き官富山C E何コ白山ochむZωヒ20-coEコuo

;
'3
ロ)NFDN00口 hNCOω﹄コ官。﹀吉百可臼之﹂

f=d1+d2

Dimensionsi
nmi
lli
met
res
ω民主工o-uv-勺ha旬

Key

f Creepaged
ist
anc
e 1 Cementedj
oin
t
M M
eta
l 2 Thec
ent悶 Imetali
sno
tel
ect
ric
all
yconnected
。ωωω00︿

I
nsu
lat
ingm
ate
ria
l 3 Uncementedj
oin.
tExposedheightofpartition>D

Figure3 - Determination ofcreepagedistances

COPYRIGHT
 40

6
.3.
9 Distanceundercoating

A conformalc oa
tings halls ealthepathbetweentheconductorsinquest
iona g
ain
stt h
ei ngr
ess
ofmoistureand p~ lI ution ， ands h
allgiveane ffecti
vela
stin
gunbrokensea.lI
tshal
ladheret o
the conductivepartsandt ot heinsu
lat
in lI
g materia. fth
ec oa
tin
gisa ppl
iedbyspraying，two
separatecoatss ha
llbea p plie
d

As oldermaskalonei snotconsideredasaconformalc oatig，butcanbeacceptedasoneo

n f
the two coats when an additiona
l coat i
sa pplid，provided t
e h
at no damage occurs du
ring
solde
ring. Other methods o fa ppli
cati
onr equireonly one coat，for example d
ipc oating，
brushing，o rvacuum impregnating.A s o
lder maskt h
atmeetsthe requirements ofa Type 1
coatinginaccordancewithIEC60664-3i sconsideredasaconformalc oatingandana dd
ition
a l
coatingisn o
tr e
quir
ed.The manufacturer s hal
lp rovid
e evidence o
fcompliancew it
h these
requirements.

NOTE1 t
Iisn
otarequire
men
toft
hi
sSt
and
ardt
hatt
hec
onf
orm
ityo
fth
ema
nuf
act
ure
r'ss
pec
ifi
cat
iono
fth
e
co
ati
ngn
eed
stobev
eri
fie
d

Themethodusedf orcoatingtheboards h
allbes pe
cifie
di nthedocumentationaccordingtothe
documentation requirements of IEC60079-0. Where thec oat
ingis considered adequate t
o
preventconductivep ars，f
t o
rexamplesolderedj oin
ts and componentleads，from p ro
trud
ing
throughthec oatig，t
n h
iss ha
llbes tat
edint h
edocumentationandconfirmedbyexamination
Thedistancesw i
thinthec oatin
gs hal
lbei naccordancew i
thcolumn6o fTable5.

Wherebareconductorso
rconductivepa
rtsemergefromt
hec
oat
ingthecomparativetra
ckin
g
index(CTりincolumn7 ofTable5o rcolumn7ofTableF
.2o
rmate
ria
lgroupass pec
ifiedi
n
{司
BEacoz

F.3.
1shal
lapplytobothi
nsul
atio
nandc oat
ing
.

NOTE2 T h
ec on
ceptofdis
tan
ceu nd
ercoat
ingwasdevel
opedforf
l
atsurf
ace
s，forexa
mplenon~ f[ exible p
rin
ted
﹀﹀右富山

c
irc
ui
tb o
ard
s.F l
exi
blepr
int
edcirc
ui
tb oa
rdsshou
ldh a
ves u
ita
bleel
ast
iccoa
fln
gt h
atd o
esnotc rack.R adi
cal
di
ffe
ren
cesfro
mthi
sf o
rma
trequ
irespe
cia
lc o
nsi
der
ati
on
ZEE 四日otESとコowzoEコ

6
.3.
10 Requirementsforassembledprintedc
irc
uitboards

Where creepage and clearance distances aff

ectt hein
tri
nsi
csa
fet
yoft
he apparatus，the
pr
inte
dc i
rcu
itsha
llconformt ot h
ef ollowing(seeFigure4
)

a
) when a p ri
nted ci
rcu
iti s covered by a conformal c
oat
ing according t
o6.39， the
.
requirementsof6.3.4 and6.3.8shal
lapplyonlytoanyconductivepartswhichl
ieout
side
ωo口)NEN00口hNEOE2cO

thecoating，inc
ludi
ng，forexample
• t
rac
kswhichemergefromthec
oat
ing
;
• t
hef
reesurfaceo
fap
rin
tedc
irc
uitwhichi
scoatedonones
ideo
nly
;
• barep
art
sofcomponentsa
blet
opr
otr
udethrought
hec
oat
ing
;
b
) the requirements o
f6.3.9sha
ll apply t
oc i
rcuit
sorp arts of c
irc
uit
s and t
hei
rf ixed
componentswhenthec o
atin
gcoverstheconnectingp
ins，solderjo
int
sandt h
econductive
par
tso fanycomponents;
﹀王弓臼

c
) wherea componenti smountedovero radjacenttotracksonthep r
intedc i
rcu
itboards，a
non-countable f
aul
ts ha
ll be considered t
o occur between the conductive pa
rto f the
componentandthet r
ackunle
ss;
Z﹂ωEEo-uxza宮田80︿

1
) thes ep
arat
ion i
si n accordance w
ith6
.3.
2 between t
he conductive p
arto
f the
componentandthet
rack，or
) f
2 ail
urer
esu
ltsi
nal
essonerousc
ond
iti
on

COPYRIGHT
 4
1

IEC 1384
/06

F
igu
re4
a-P
art
ial
lyc
oat
edb
oar
d

a
b
(UEczaco￡宝刀剣WOVEEmコ

IEC 1385
/06

F
igu
re4b-Boardw
iths
old
ere
dle
adsp
rot
rud
ing
回4

a
0zhucωヒコO官。E コ

b
ωo口)刊FON00口 hNEOE2co

c IEC 1386
/06

F
igu
re4c-Boardw
iths
old
ere
dle
adsf
old
edo
rcropped

NOTE Thet
hic
kne
sso
fth
eco
ati
ngi
sno
tdr
awnt
osc
aJe

Key
﹀吉一。勺白ZJの

aA
ppl
ycJ
ear
anc
edi
sta
ncer
equ
ire
men
tso
f6.
3.4
bA
ppJ
ycr
eep
aged
ist
anc
ere
qui
rem
ent
sof6
.3.
8
cA
ppl
ydi
sta
nceu
nde
rco
ati
ngr
equ
ire
men
tso
f6.
3.9
h￡ζω-OX

Figure4-Creepagedistancesandclearancesonprintedc
irc
uitboards
42 宮古RWOO︿

6
.3.
11 Separationbyearthedscreens
﹃

Where separation between ci

rcu
its or p
arlso fcircui
lsi s provided by an earlhed m
ela
lli
c
screen，Ihescreen，asw el
lasanyconneclion1 l，s
0i h
allbecapableofc a
r r
yingIhe maximum
possiblecurrenllowhichi
lcouldbeconlinuouslysubjecledinaccordancewithClause5

COPYRIGHT
 42

Where t h s made through a connector，t

e connection i he connectors
hal
l be constructed i
n
accordancewith6 .
5

6
.3.
12 I
nte
rna
lwiring

I
nsula
tin，exceptf
o o
rvarn
ish andsimi
larc
oatin
gs，c
ove
rin
gth
econductorso
fin
ter
nalw
iri
ng
s
hal
lbeconsideredass
olidi
nsula
tio
n(see6.3
.6)

Thes epar
ationofconductorsshal
lbedeterminedbyaddingtog
eth
ert herad
ialthicknessesof
extrudedins
ulat
iononw ireswhichar
eIyin
gs idebysideeit
herasseparatewir
eso rinac a
ble
formo ri
nacable

Thedistanc
ebetweent heconductorsofanycoreofanintri
nsi
call
ysafeci
rcu
itandt h
ato
fany
coreofan on
-in
trin
sicall
ys afecircu
itsh
allbeinaccordancewithcolumn4o fTable5，t
aki
ng
int
oaccounttherequirementsof6 .
3.7exceptwhenoneoft h
ef ol
lowi
ngap
ply:

th
ecoreso feitherthei
ntr
ins
ica
llys
afeo
rth
eno
n-i
ntr
ins
ica
llys
afec
irc
uita
reenclosedi
n
anearlhedscreen，o
r
i
nL evelsofP ro
tecti
on"i
b"and“ic
"ele
ctr
icl apparatus，t
a heins
ula
tio
noftheint
rin
sica
lly
safecoresiscapableofwit
hst
and
inganr.m.s
.a .
c.t es
tv o
ltag
eo f2000V whenteste
di n
accordancewi
th1 0.
3

NOTE Oneme
tho
dofa
chi
evi
ngi
nsu
lat
ionc
apa
bleo
fwi
ths
tan
din
gth
ist
es
tvo
lta
gei
stoa
dda
nin
sul
ati
ngs
lee
ve
ov
erth
ecor
e
(
刀2c=aEO￡ 書 官ωECE何コ回 vothuzE﹄

6
.3.
13 D
iel
ect
ricstrengthrequirement

Thei nsu
lati
onbetweenani ntr
insi
call
ys af
ec ir
cui
tandt heframeo fthee l
ectri
calequipmento r
partswhichmaybeeartheds hallbecapableo fcomplyingw iththet e
stdescribedin1 0.3atan
r.m.
s.a .c
.t es
tv oltag
eo ft wi
cet hev olta
geo ft h
ei ntri
nsic
all
ysafe c ir
cui
to r 500 V r
.m.s.，
whicheverist hegreater
.Wherethe c irc
uitdoes n otsatis
fyt h
is requirementthe apparatus
sha
ll be marked w i
tht he symbol “X" and the documentation sha
lli ndica
tet he necessary
inform
ationregard
ingt hecorre
cti n
stal
lat
ion.

Thei nsu
latio
nbetween ani nt
rins
ica
llysafecir
cui
tandan on
-in
tri
nsi
call
ys afecir
cui
tsha
llbe
コ020Eコ

capableofw i
thstand
inganr .
m.s.a.c.tes
tvolta
geo f2U + 1000V，withaminimumo f1500V
r
.m.s.，where U isthesum oft her.m.
s.valuesoft h
evoltagesoftheintr
ins
ica
llysafeci
rcu
it
andt henon
-intr
ins
icall
ysafecirc
uit
00口)NFDNOω

Where breakdown between separate int

rins
ica
llys a
fec ir
cui
ts could produce an unsafe
con
diti
on，theinsu
latio
nbetweenthesec ircui
tsshallbecapableofwithst
a n
dinganr .
m.s
.test
vo
ltageof2U，w ithaminimumo f500V r .m.s.，whereU i
st hesumo fther .
m.s.valuesofthe
ロ
ド NZ00﹄コ官。﹀“50﹁白ZJmhzwzo-UXdha ℃ωωω000︿

volt
agesoftheci
rcui
tsunderconside
rati
on.

6.3.14 Relays

Wheret hec o
ilofa rela
yi s connectedt o an in
trin
sica
llysafec i
rcu
it，thec on
tactsi nnormal
operati
o ns h
allnot exceed thei
r manufacturer's rati
ng and sha
lln otswitch more than the
nominal value o
f5 A r .m
.s.o r250 V r .m.s. or 100 VA. When t hevalues switched bythe
contacts exceedthesevalues b ut do n
o texceed 10A o r 500VA，t he values fo
r creepage
distanceandclearancefromTable5f orther elevan
tv olta
ges h
allbedoubled

For higher values，intri

nsic
all
ys afec i
rcui
ts and n on-i
ntri
n s
icall
ys a
fec ir
cuit
ss h
all be
connected tothe same r el
ayo nl
yi fthey are separated by an earthed metal bar
rieror an
﹃

ins
ulati
ngb ar
rierconformingto6 .
3.2.Thedimensionso fsuchani nsu
latingbarri
ers h
alltake
in
to accountt h
ei on
izatio
na ris
ing from ope
rationo fther ela
ywhichwouldg enerallyrequ
ire
creepaged i
stancesandclearancesg rea
terthanthosegiveni nTable5 .

COPYRIGHT
 43

Wherear elayhasc ontact

si nintr
insi
call
ys afecir
cuit
sando thercontactsinnon-
intri
nsica
lly
safecircu
its，theintr
insi
cal
lys a
feandn on-
intr
ins
icall
ys afecontactsshal
lbeseparatedbyan
ins
ulatin
go rearthedmetalb a
rrierconformingto6.3.2inadditi
ont oTable5.Ther ela
ys ha
llbe
designedsucht hatbroken ordamagedc ont
actarrangementscannotbecomedislodged and
impairthei nte
grityo fthes epara
tion between intri
nsi
call
ys a
le and n o
n-in
tri
nsica
lly sale
ci
rcui
ts

Alt
ernativ
ely，segregat旧 n01r elay
s maybe assessed by a ppli
cationofAnnexF，t aki
ngi nt
o
accountambientc onditions and app
licab
le overvoltage c
at egorie
s as g
iveni n AnnexF. The
requirementslorearthedmetalo rinsul
atingbarri
ersaboves hal
la lsobeappliedinthiscase.If
thei ns
ulatin
go rearthed metal bar
rierisembedded i n a closedr e
layenclosurethen 10.6.
3
sha
llbea pplie
dtot heclosedr e
layenclosureandn ottothei nsula
tingorearthedmetalb ar
rier
it
sell

6
.4 Protectionagainstp
ola
rit
yreversal

Prote
ctionshall be providedw it
hini n
tri
nsic
all
ysafe apparatusto preventinvali
datio
n0 1the
type0 1pro
tection as a resul
t0 1r e
versa
lo ft hep
ola
r i
ty0 1s u
ppl
ie stot hatintr
ins
icall
ysale
apparatus orat connect 旧n s between cel
lso fa batter
y where this could occur
. For t
his
purpose，as i
nglediodes hallbeacceptable

6
.5 Eaはhconductors，
connectionsandterminals

Where earthing，for example 01enclosures，conductors，metal screens，t r

acks on a pri
nte
d
ci
rcutboard，segregationc
i onta
cts0 1plug-i
nconnectorsanddiodes ale
tyb a
rries，i
r srequire
d
tomaint
aint het yp
eo fp ro
tec
tion，thec ross-
sectionalarea0 1anyconductors，connectorsand
{
ち
BEazozzmuoECEmコ

term
inalsusedf orthi
spurposes hal
lbesucht h
attheya rerate
dtoc ar
ryt hemaximump o
ssible
﹄

、curre
ntt o which they could be continuously subjected under t
hec on
ditio
nss pecil
iedin
Clause5.Componentss hallalsoconformt oClause7 .

Whereaconnectorc arrie
searthedc i
rcui
tsandthetype0 1prote
ctiondependsont heearthed
ci
rcut，t
i he connectorshall comprise atlea
stthreeindependentconnecting elementsfor" i
a"
白v

ci
rcui
tsanda tl easttwolor" ib
"c ir
cui
ts(seeFigure5)
.Theseelementss h
allbeconnectedi n
othuzoヒ

par
all .Wheret
el heconnectorcanberemoveda tanangle，oneconnections h
allbepresenta t，
ornearto，eachend0 1thec onnecto
r.
コω吉ω

Terminalss hall bef i

xedi nt h
eir mountingsw ithoutpos
sibil
ity01s ell-Ioos
ening andshall be
ιコ

constructedsot h a
tt heconductorscannots li
po utfromt h
eirintendedl oc
ation.Properc ont
act
shal
lbeassuredw ithoutdeterior
ationo ftheconductors，eveni lmulti-stran
dedcoresa reused
0
0白)NENOω ロ

int erminal
s which a re intended ford i
rect clamping 01thec ores. The c on
tact made by a
terminals hal
ln ot be a ppreciably impaired by temperature changes i n normal s ervice
Terminalswhicha r
eintendedl o
rclampingstrandedcoress ha
lli ncluderesil
ien
ti nter
m e
diate
part
.Terminals f o
r conductors 01c ross-sect
ions upt o 4m m2s hal
la lso be suitab
lef orthe
ドNEOEコ主ω﹀ 吉E 勺由ZJEzvzo-uv﹃hD百出ω

effec
tive connection 01conductors having a smaller cross-se
ction. Terminals which comply
withtherequirements0 1IEC6 0079-7areconsideredt oconformt otheserequirements
000︿

COPYRIGHT
 4
4

コ
ーー
一一

川
己 I
EC1
387
106

F
igu
re5
a-Exampleo
fth
reei
nde
pen
den
tco
nne
cti
nge
lem
ent
s
(
ちECEHcoz三
宮wECEω コ四百Ehoco

IEC 1
388
/06

F
igu
re5
b-Exampleo
fth
reec
onn
ect
inge
lem
ent
swh
icha
ren
oti
nde
pen
den
t

Figure5-Examplesofindependentandnon-independentconnectingelements
とコ O芭ω Eコ00

Thef
oll
owi
ngs
hal
lnotbeused

a
)te
rmi
nal
swi
thsharpedgeswhichcoulddamaget
heconductors;
口}NFDN00口 hNCOEコ官。﹀芭5 寸臼Z﹂ωhzvzo-ux勺ha

b
)te
rmi
nal
swhichmayt
urn，bel
wis
tedo
rpermanentlydeformedbynormalt
igh
ten
ing
;
c
)in
sul
ati
ngm
ate
ria
lswhicht
ran
smi
tco
nta
ctpressurei
nte
rmi
nal
s

6
.6 Encapsulation

6
.6.
1 General

For int
rinsi
cal
ly safe apparatus，al
lc i
rcui
ts connectedtothe encapsulated conductive par
ts
andlorcomponentsandlorbarep art
sp ro
trudingfromthecompounds hal
lbei nt
rinsi
call
ysafe
Faultconditionswithi
nt he compound sha
ll be assessed b
utthe possi
bili
tyo fsparki gn
itio
n
insid
es ha
lln otbeconsidered

Forassociatedapparatus，f
aul
tco
ndi
tio
nsw
ith
inthecompounds
hal
lbeassessed

I
fc irc
uits connected tothe encapsulated conductive p
arts andlor components andlor bare
part
sp r
otruding from the compound are n oti nt
rins
ica
lly safe，they sha
ll be protect
ed by
刀剣山
ωω@00︿

anothertypeo fprotec
tionlist
edinIEC60079-0

Encapsulationmaybea
ppl
iedbyc
ast
ing，mouldingo
rpo
uri
ng.

COPYRIGHT
 45

Whereencapsulationi
sused，i
tsh
allconlormtothel
oll
owi
ngandwherea ppr
opria
tei
tap
pli
es
als
otoanypo 甘ingboxo rp
art
s01anenclosureusedi
ntheencapsulationp
roces
s:

a
) haveatemperaturer ati
ng，s
pecifi
ed byt
h e manulacturer01t h
e compoundo rapparatus，
which isatl e
astequal t
othe maximum temperature achieved byany componentunder
encapsulatedcon
dit
ions
;
b
)a lter
nativ
elytemperatures high
erthan t he compound's ratin
gs ha
ll be acceptedprovided
thattheydon otcausedamaget othecompound.Whent h
etemperature0 1t hecompound
exceedsi tscontinuousopera
tingtemperature(COT)，nov isib
ledamage0 1t hecompound
thatcouldi mpa
irt hetype01p rot
ectio
ns hal
lbee vident，suchascracksi nthecompound，
exposure0 1encapsulatedpaはs，I la
king，impermissibleshrinkage，sw
elling，decomposition，
ors oft
ening.Inadditin，t
o hecompounds halln otshowevidence0 1overheatingthatwould
adverselyalle
ctt heprot
ect
ion;
c
) haveati t
sI rees
urlac
eaCTIvalue01a
tl ea
sttha
tsp
eci
lie
dinTable5o
rAnnexFi
lany
bareconductivepar
tspro
tru
deIromt
hecompound;
d
)o nlym aterial
s passing t
het e
stin10.
6.1 sha
ll have i
tsI
ree surlace exposed and
unprotected，thu
slormingpar
t01th
een
closu
re;
e
) be adherenttoal
l conductive p
ars，components and s
t ubs
tra
tes exceptwhen they are
to
tal
lyenclosedbythecompound;
η t
hecompounds h
allbeI re
e0 1v ois，exceptt
d hatencapsulation0
1componentsc
ont
ain
ing
I
reespace(
tra
nsist
ors，r
elays，luseset
c)isallowed
g
) be s
peci
lie
d byi
t
sge
ner
icnameandt
yped
esi
gna
tio
ngi
ven byt
he manulacturer0
1th
e
compound
B E﹄(
刀

NOTE F
urt
herg
uid
anc
eisg
ive
ninA
nne
x0
acω 玉 吉 宮w

6
.6.
2 Encapsulationusedfortheexclusionofexplosiveatmospheres

Wherec a
stingisusedtoexcludeanex
plo
siv
eatmosphereIromcomponentsandi
ntr
ins
ica
lly
o

salec
irc
uits，i
tsh
allconlormt
o6 .
3.5
コ田“othozE﹄ -z
Eω

Wheremouldingi
susedtoexcludeanex
plo
siveatmosphereIromcomponentsandi
ntr
insi
cal
ly
saf
ecirc
uis，t
t heminimumthic
knesst
othefre
esurlaceshal
lcomplywithcolumn401Table5，
seeFig
uresD.3aandD.3b.
コO官

Inint
rin
sic
all
ysaleapparatuswhereacompoundi susedt oreducetheignit
ionca
pabili
ty01hot
。E200口)

components，lo
r example diodes and r
esis
tors，t
he volume andthickness 01the compound
sha
llreducethemaximums urlac
etemperature01thecompoundt othedesiredval
ue.
NFDNoω 口hNCOOL2c@﹀︼E

NOTE Exampleso ft
hea
ppl
ica
tio
no f6.6.2 a
re;fus
es，pi
ezo
-el
ect
ricd e
vic
esw
itht
hei
rsu
ppr
ess
ion
componentsande
nerg
yst
ora
gedevic
eswiththeirs
uppre
ssi
oncomponents

7 Componentsonwhichintrinsicsafetydepends

7
.1 Ratingofcomponents

ForL ev
elo fProtection“ia
"and“ ib
"inb othnormaloperati
onanda fte
rapplic
ationofthel au
lt
o-

condi
tionsg ivenin Clause 5，any remaining components on which thet ypeofp ro
tection
3臼Z﹂ω

depends，s ha
lln ot operate at more than t
wo-t
hirds01t h
eir maximum curr
ent，voltage and
powerr ela
tedt other ati
ngo fthedevice，t h
emountingc ondi
tionsandthetemperaturerange
泊五zo-ox

spe
cified.ForL evel0 1Protect
ion“ i
c"，innormal o
perati
on，componentsonwhicht hetype0 1
prot
ectiondependss h
alln otoperatea tmorethant h
eirmaximumc u
rren
tandv o
ltageandno
more than t w
o-thir
ds0 1t h
eir power. These maximum rated values sh
all be th
e normal
，
﹃

commercialr a
ting
ss pecilie
dbyt h
emanufacturer01thecomponent.
ha吉田凶000︿

For Levels 0
1P r
otectio
n" ヘ
“
ia i b “
" and ic" translormers，fuses，thermal t
ris，r
p e
las，o
y p
to-
couplers and switches ar
e allowed to operate att he
ir normal r
atingsino rde
rt ol u
nct
ion
cor
rectly

COPYRIGHT
 46

Thee ffects01mounting conditions，ambienttemperatureandotherenvironmentalinlluences 守

andt hes ervietemperature requirements 0

c 1IEC60079-0s hal
l betaken i
nto accountwhen
determiningcomponentr ating.
_Forexample，inasemiconductort h
epowerdissipati
ons h
alln ot
exceed t wo-
thirs0
d 1the power which i sr equ
iredt o reach t
he maximum allowed junctio
n
temperatureundertheparticularmountingc on
dition
s

Ther a
ting01componentss hallbeasabovewhenconnectedt oanyo the
rapparatususedi n
the non-hazardous area， e
.g.d ur
ing charging， ro
uti
ne maintenance， da
ta downloading
oper
ations，incl
udin
gt heap
plicat
ion01requiredla
ult
sinthein
trin
sica
llysaleapparatus

I
n-c
irc
uitprogrammingconnectorsthata r
en ota
cce
ssi
blebyteuser，andwhicha
h r
eonlyused
tmanulacture，d
a u
ringrepa
iro roverhaul，ar
eexemptIromt
herequirements0
1th
iscla
use.

Where a r
esis
tor and c
apa
citorare connected i
ns er
iestopr
otectthe discharge Irom t
h5'
capa
cit
or，theres
istormaybeconsideredtod i
ssip
atepoweri
nwattsnu
mericallyequalt oCU ヘ
whereCiscapacitancei
nlara
ds，Ui svolta
geinvolts

Detailedtest
ingo rana
lyss0
i 1components and assemblies 01componentst o determinethe
parameters，lorexamplevoltageandc ur
ret，t
n owhicht hesaletylac
tor
sa rea ppl
ieds ha
lln ot
beperlormeds i
ncethelacto
rs0 1salety015.2and5 .
3obviatetheneedl ordetailedtesti
ngo r
analy
sis. Forexample，aZenerdiodes t
ate
dbyi t
s manulacturertobe 10V + 10% s hallbe
taken to be 11 V maximum withoutthe needto take i
nto accounteff
ects such as volta
ge
elevat
ionduet or i
sei
ntemperature

7
.2 Connectorsf
ori
nte
rnlconnections，
a plu
g-i
ncardsandcomponents
{匂
OWE-a

These connectors s
hal
l be designed i
n such a manner tha
t an i nc
orr
ect connection or
﹄coz主力 MUSEE伺コ四百choto

int
erc
hangeabi
litywit
ho th
erconnectorsi
nthesamee lec
tri
calapparatusisnotp
o ssibleunless
i
tdoesn otresulti
nanunsalec o
ndit
ionorth
econnectorsareident
iliedi
nsuchamannert hat
inc
orr
ectconnectionisobvious

Where t hetype0
1 protection depends on a connection，the l
ail
uret
o open c
irc
uit0
1a
connections
hal
lbeacountablel aul
tinaccordancew i
thClause5

1
I a connector carr
ies earlhed ci
rcu
its and thetype01 protection depends on the earth
と 30芭 ω Eコ

connection，thent
heconnectors h
allbeconstructedi
naccordancew ith6.5.

7
.3 Fuses
υ o口)NFON0ロ

Where luses a re used t op rot

ecto t
her components， 1， 7Ins ha
ll be assumed t oI low
continuo
usly. The coldr esistance01thelusea ttheminimums pecifiedambienttemperature
maybetakenasani n
lall
ibl
er esistanc
ecomplyingw i
th8 .5lorcurrentlimi
tingpurposes.(I
nt he
0
ド NCOEECO﹀MEO寸 臼Z﹂ ω討幸吉一

absence0 1availableinlormation，thi
smaybetakenast heminimumr es
i s
t a
nceatt heminimum
specil
iedambienttemperaturewhen measuredon 1 0samplesasrequiredi n10.4.
)Theluse
time-curr
entc ha
racterist
icss ha
llensuret h
att hetransie
ntr a
tings01protectedcomponentsare
not exceeded. Where t he luse t ime-cur
r e
ntc ha
racter
istic is n ot availa
ble Irom t he
manulacturer's data，a t ypet estshall be carriedo utin accordance w ith10.4 on atleast
10samples.Thist e
stshowst hecapabi
lity0 1thesamplet owithstand 1，5timesanytransient
whichcanoccurwhenUmi sa pp
liedthroughal use
.

FuseslorLevels01Protection“
ia"and“i"，whichmayc
b arr
ycu
rre
ntwhenl
oca
tedi
nex
plo
siv
e
atmospheres，s
hal
lbeencapsulatedi naccordancew
ith6
.6
u
v
h ha宮 古ωω00︿

The ruptue0
r 1 luses l
orL
evl0
e 1 Protection ・
i"，i
c sno
t considered l
or thermal i
gni
tio
n
寸

purposes

Where luses are encapsulated， t

he compound s
hal
ln otente
rt he fuse i
nte
rior
. This
requirements
hal
lbes a
tistie
dbyt est
ingsamplesi
naccordancew
ith10
.6.2o rbyadeclar
ation

COPYRIGHT
 47

fromthefusemanufacturerco
nfirminga c
cepta
bil
ityo
fth
efusef
ore
nca
psu
lat
ion
.Al
ter
nat
ive
ly，
thefusesh
allbesealedp ri
ortoencapsulation

Fuses used top rotect components shal

l be replaceable on
ly by opening the apparatus
enclo
sure. For replaceable fuses the type de
signation and t
h e fuse ra
tingI n， or the
cha
racte
rist
icsimportanttoi n
tri
nsicsafe
tys h
allbemarkedadjacenttothefuses

Fuses s h
all have a rat
edv olta
g eo fatl ea
s t Um ( rU
o iini nt
rins
icall
y safe apparatus and
cir
cuits
)althoughtheydonothavet oconformt oTable5 .Generali nd
ustri
alstandardsf orthe
construct
iono ffusesandfuseholderss ha
llbea ppliedandt h
eirmethodo fmountingi nc
luding
the connecting w
iringshal
ln ot reduce the clearances，creepage distances and separations
affordedbyt hefuseandi tsholder
.Whererequiredf orint
rin
sics a
fety，thedistancest oother
partsoft hecir
cui
ts h
allcomplywith6 .3

NOTE1 M
icr
ofu
sesc
onf
orm
ingt
oIE
C60
127s
eri
esa
rea
cce
pta
ble

A fuses hal
l havea breakingc a
paci
tynotl es
sthant h
e maximum prospect
ivec u
rrentofthe
cir
cuitinwhichitisins
tall
ed.Formainselec
tric
itysupplysystemsnotexceeding250V a.c.，the
prospectivecurre
nts h
allnormallybeconsideredtobe 1500A a .c.Thebreakingc a
pa c
i t
yo f
thefusei sdeterminedaccordingtoIEC60127s eri
eso rANSI/UL248-1 ands h
allbestatedby
themanufacturero fthefuses

NOTE2 H
igh
erp
ros
pec
tiv
ecu
rre
ntsmayb
epr
ese
nti
nsomei
ns
t副同 t
ion
s，f
ore
xam
pJea
thi
ghe
rvo
lta
ges

I
fa c u
rre
nt-li
mit
ingdeviceisnecessarytol i
mitthepros
pec
tivecu
rrenttoavaluenotgreater
(E-ccacoz主EECEEJ 回MOEESEコ

thanther a
tedbreakingcapaci
tyo fthefuse，thi
sdevicesh
allbeinf
all
ibl
einaccordancewith
Clause8andther atedvaluessha
llbea tleas
t

c
urr
entr
ati
ng1，
5x1，
7x'
n;
v
olt
ager
ati
ngUm o
rUi
;
powerr
ati
ng1， 1，
5x( 7xI
n)2xmaximumresistanceo
fli
mit
ingdevice

Creepageandclearancedistancesacrossthecurrentlimi
tin
gres
istorandi t
sconnectingtrac
ks
sh
all bec a
lcu
lated usingthevoltageof1，7xI nxmaximum resistanceo fthec ur
rentlim
itin
g
re
sist
or.Thet ra
nsientv o
ltag
es ha
lln otbeconsidered.Theseparationdistancesbetweenthe
res
istorandothe
rp artsofthecir
cuitsh
allcomplyw i
th6 .
3
O官。Eコ

7.4 Primaryandsecondaryc
ell
sandb
att
eri
es
00口)NFDN00

7
.4.
1 General

Contrarytotheba
tteri
esrequirementso fIEC60079-0，c e
llsandb atl
eri
esarepermi壮edtobe
ロドNCOE22ω ﹀Eo-，臼Z4mE20

connected i
np a
rall
eli nintri
nsic
ally safe apparatus provided t
hati n
tri
nsi
csafetyis not
impaired
.

NOTE1 Th
ep a
ral
lelba
tte
ryreq
uire
men
to fb
aUe
riesofIE
C6 0
079-0doesno
ta p
plyt
oce
ll
sa n
dba
tte
rie
sin
as
soc
iat
edap
par
atusun
lessth
eyar
eprot
ect
edbyoneo
fthet
ype
so fp
rot
ect
ionl
is
te
dinIE
C6007
9-0

Some types o fc e
lls and batl
eries，for example some lithium types，may explode i fshort-
circ
uitedo rsubjected to reverse cha
rging. Where such an expl osio
n could adverselyaffect
int
rinsi
cs afety，theuseo fsuchc ellsandb atle
riesshal
lbeconfirmedbyt h
eirmanufactureras
being safe f o
r use i n any p a
rticu
lar intri
nsi
cal
ly safe o r associated apparatus. The
documentation and，i fp r
acticabe，the marking f
l orthe apparatuss hall drawatlentionto the
一UVL勺haEEBO︿

safetyprecautionst obeobserved

NOTE2 C副 I
sth
atcom
plywi
thther
equ
ire
men
tso
fUL
164
2orI
EC6
213
3oro
the
rre
lev
ants
afe
tys
tan
dar
dsa
re
co
nsi
der
edt
om ee
tth
isreq
uir
eme
nt

Whereb a
tle
rie
sar obereplacedbytheuser，theapparatuss
eintendedt hal
lbemarkedw
itha
warningl
abe
lassp
eci
fiedinit
ema
)o f12.3

COPYRIGHT
 48

NOTE3 At
ten
tio
nisd
raw
ntot
hef
ac
tth
att
hec
el
lorb
att
erym
anu
fac
tur
ero
fte
nsp
eci
fie
spr
eca
uti
onsf
ort
he
sa
fet
yofp
erso
nne
l

1
II hecel
lso rbat
!er
ieshave1 0berechargedinhazardousareas，Ihechargingc
ircui
lssha
llbe
lu
llyspecil
iedas parl01Iheapparalus.Thecharging syslem s
hal
lbesuchI hal，evenwhen
la
ullsinaccordancewil
h5 .2，5.
3o r5.4areapplied1
0Ihechargingsyslem，Ihechargervo
lla
ge
andc u
rrenldonolexceedIhel imi
lsspec
ilie
dbyIhemanulaclurer

NOTE4 Ift
hec
har
geri
ts
el
fisu
sedi
nth
eha
zar
dou
sar
e ts
ai h
oul
dal
50u
ti
li
set
ype
sofp
rot
ect
ions
uit
abl
efo
rth
e
ar
eaofu
se

7
.4.
2 Batteryconstruction

Thesparki gn
ilio
nc ap
abi
lityandsurlacelemperalure0 1cel
lsandbat
!er
iesusedinin
lrins
ica
lly
sale apparalus sha
ll be l
esledor assessed in accordancewil
h1 0
.5.
3. The c
ellor bat
!ery
cons
truclions h
allbeone0 1thelo
llowingIype
s:

a
) sealed(
gas
-ti
ght
)ce
ll rbat
so !er
ies
;
b
) sealed(
val
ve-
reg
ula
ted
)ce
ll rbat
so !er
ies
;
c
)cell
so rbat
!er
ieswhich a
reintended1
0 besealedi
na s
imi
larmannert
oitemsa
)andb
)
a
partIromapressurer
eli
eld
evice.

Such c
ell
so rbat
!eri
essh
all notrequireadditi
on0 1ele
clrol
yteduri
ngI
hei
rli
le ands
hal
l
haveasealedme
tall
icorpla
sticenclosureconlormingt
ot h
el ol
low
ing
:
(司@︼c=aco￡宝刀剣WEEE62回Mothocoヒ

1
)w ithoutseams orj s，l
o川 t orexamplesolid-drawn，spun o rmoulded，j o
ined bylu
sion，
eutec
tic melhods，welding o
r adhesives sealed w
ith elastomeric o
rp la
sti
cssealing
devicesretai
nedbythes tr
uctur
e0 1theenclosureandheldpermanentlyincompression，
lo
rexamplewashersand" 0"rings
;
) swaged，crimped，shrunkon o
2 rl
oldedconslr
uct
ion01part
s0 1theenclosurewhichdo
notconlormwiththe above o
rpart
s using m
ate
ria
lswhich arepermeablet ogas，l
or
examplepaperbasedm al
eri
als，s
hal
lnolbeconsideredt
obes e
ale
d;
3
) seals around t
erminalss h
all be e
ithe
r conslrucled as above o
r be poured seals 0
1
thermoset!i
ngorthermoplasliccompound;
コω-zoEコ00

d
)c e
llsor bat
!er
ies encapsulated i
n a compound sp
eci
fie
d by Ihe manulacturer 0
1 the
compoundasbeingsuitablelorusewi
ththeelec
tro
lyl
econcernedandconlorming106.6.

Adeclar
ation01conlormancetoa)orb)shallbeoblainedIromthemanulacturer01thecello
r
口)

bat
!er
y. Conlormance10c)o rd)sha
ll be delermined byp
hys
ica
l examination 01the c
ello
r
NFDNOωロ

bat
!eryandwherenecessaryit
scons
truc
t i
onaldrawings
ド Ncoω﹄コ官。﹀ -

NOTE t
Ii
snotarequ
ire
men
toft
hi
sst
and
ardt
hatt
hec
onf
orm
ityo
fth
ece
llo
rba
tte
rym
anu
fac
tur
er'
ssp
eci
fic
ati
on
ne
edst
obeve
rif
ied

7
.4.
3 E
lec
tro
lyt
eleakageandv
ent
ila
tio
n

Celsandbat
l !er
iesshal
le i
therbe0 1atypeIromwhicht h
erecanbenos pilla
ge0 1ele
ctroly
leor
z一

Iheys h
all be enclosed t
o prevent damage bythe e l
eclro
lytetothe componentupon which
O oZJωhzEu-ox ha 右W
，
﹃

salety depends. Cel

ls and bat!er
iess ha
ll be tesl
edi n accordance wi
th1 0.
5.2，o rwri世en
conlirm
a li
ons hal
lbeobtainedIromthec ell
/bat
!erymanulacturerthattheproductconlorms1 0
10.5
.2.1 Icels andbat
l !erieswhich lea
ke lec
lrol
yteareencapsulaledi n accordancew i
lh6 6，
.
theyshallbel estedi
naccordancew ith10.5.2aft
erencapsulal
ion.
，

Where t he apparatus containscellsor bat

!eriesthat are charged wi
thin them，the bat
!ery
﹃

manulaclurers h
all demonstratet h
atthec oncent
ration0 1hydrogen inIheI re
evolume ollhe
前ω

bat
!eryc ontai
nercannolexceed2% byvolume，o rthedegassinga p
erlures01allce
llssha
llbe
ω@

so arranged thatt he escaping gases a

r e notvented inl
o any enclosure 01I h
e apparatus
u
u︿

contai
ning e l
ectri
cal ore lec
lro
n i
c components o r conneclions. Alter
native
ly，where t he

COPYRIGHT
 49

apparatusmeetstherequirementsforle
velofprote
ction“ia
"o r“
ib"andEquipmentGroupIIC，
therequiremento
fdegassingaperturesorli
mit
ati
ono fhydrogenconc
ent
rati
ondoesnota p
ply
.

NOTE1 t
Iisnotareq
uir
eme
ntoft
hi
ss t
anda
rdt h
att
hec
onf
orm
ityo
fth
eba
tte
ryr
nan
ufa
ctu
rer
'ss
pec
ifi
cat
iono
f
t
heco
nce
ntr
ati
onofh
ydrog
ennee
dst
ob eve
rif
ied

Forrechargeableornon-rechargeablesc
ell
sth
epressureaboveatmospherici
nsi
detheb
atler
y
con
tainershallnotexceed3 0kPa( 0，3b
ar)
.Batt
erycont
aine
rsthataresealedsha
llbetes
ted
i
naccordancew i
th10.5.
4

NOTE2 T
hismayb
eac
hie
vedb
yav
ent

NOTE3 In“ s
eal
ed"c
el
ls，ahig
herp
ress
urei
spe
rmi
ssib
le，bu
teac
hce
lls
hou
ldt
henbep
rovi
dedw
ithapre
ssu
re
r
el
iefdev
iceormeanstolim
itthepr
essu
ret
oav alu
et h
atcanbec
ont
ain
edb
yt h
ece
ll，assp
eci
fie
dbythe
ma
nufa
cture
r

7
.4.
4 C
ellvoltages

Forthepurposeofe valu
ationandt est，thecellvoltag
es hal
lbet h
atspec
ifiedintheprimary
ce
llt a
bleandsecondarycellstab
leo fIEC6 0079-0.Whenac el
lisnotl
iste
di nthesetab
les，i
t
sha
llbet e
stedinaccordancewith10.4t odeterminethemaximumopenc ir
cuitvoltae，andthe
g
nominalvolt
agesh
allbet hatsp
ecifi
edbyt h
ec e
llmanufacturer

7
.4.
5 I
nte
rna
lresistanceofc
ellorbat
!ery

Wherereq
uir
ed，t
hei
nte
rna
lre
sis
tan
ceo
fac
ello
rba
tle
rys
hal
lbedeterminedi
naccordance
(EMCECOZ主302zEE回目oc音量E20芭ωEコ

wi
th10.
5.3

7
.4.
6 Bat
!er
iesi
nequipmentprotectedbyothertypesofprotection

NOTE 1 T h
isc Ja
usere
fer
st oequi
pmenttha
tispr
otec
tedbyflame
pro
of(
oro
the
rte
chn
iqu
e)，b
utc o
nta
insa
ba
tte叩 andassoc
iate
dcirc
ui
tstha
trequi
reint
ri
ns
ics
afe
typro
tec
tio
nwhenth
emain
ssu
ppl
yisremov
eda ndth
e
en
closur
eiso p
enedinth
ee x
plo
siv
ea t
mosph
ere

The batle
ryhousing o
r means o fatlachmentto equipmentshal
l be constructed so t
hatthe
batle
ry can be i
nst
all
ed and replacedwithou
t adversely a
ffe
ctin
g the in
trins
ics afe
tyo fthe
eqUlp町l
ent

Wherea curre
ntli
miti
ngr es
ist
orisusedt olim
itthecurren
tt hatmaybewithdrawn fromthe
ba
tley，i
r tistoberatedinaccordancewi
th7 .1
.Currentlim
itin
gr esi
sto
rsi nser
ieswithc
ellsor
00口)NSN00

ba吐e
riessh
allberate
da tthemaximumv olt
ageUm unlessotherwiseprot
ecte
d.I nth
isinst
anc
e
pr
otec
tioncanbeachievedbyuseo fasin
gleZenerdioderatedinaccordancew ih7
t .1

NOTE2 Whereacurrent~limiting devi

ceisnec
essa叩 toens
ureth
es a
fet
yoft
heb
att
eryo
utp
ut，t
her
eisn
o
ロド NZO巴コ言。﹀吉-

re
qui
rem
entf
ort
hecurrent~limiting d
evi
cetobea
ni n
teg
ralpa
rto
ftheb
att
ery

7
.4.
7 Ba
t!eriesusedandreplacedi
nexplosiveatmospheres

Whereab atl
eryr e
quirescurr
ent-l
imili
ngdevicestoensurethesaf
elyoftheb at
leryits
elfandis
intendedt obeusedandt obereplacedi nane xp
losi
veatmosphere，i
tshallformacompletely
o﹁臼ZJωEEG-uv﹃トBEgouu︿

replaceableu n
itwithitscur
rent-
limit
ingd ev
ices
.Theu nitsh
allbeencapsulatedorenclosedso
thatonlyt heinlr
insi
cal
lysafeo utp
utt erm
inalsandsuita
blyprot
ectedi
ntri
nsic
allysafetermin
als
forchargingpurposes( ifp
rovided)areexposed

Theu n
itshall besubjectedtot hedropt es
to fIEC60079-0exceptthattheprio
rimpactt e
st
sha
llbeo mi
tled.Thec o
nstruc
tiono ftheunitsha
llbeconsideredadequatei
fthetes
tdoesnot
res
ultinIhee jec
tionorseparationo fthec e
llsfromtheunitand/orcurr
ent
-li
mit
ingdevicein
suchawayast oi n
val
idatetheintr
insi
cs a
fetyoftheun
it

COPYRIGHT
 50

7
.4.
8 B
atl
eri
esusedbulnolreplacedi
nexplosivealmospheres

1
II hece
llo rbatle
ry，re
q ui
ringc u
rrenl-i
Imi
lingdevices10ensureIhesal
ely01Iheba世eryils
ell，
i
sn ol inlended 1
0 be replaced i
nI hee xpl
osive almosphere，i
lsha
lle i
lhe
r be p
rolecledin
accordancew il
h7 .4
.7ora ller
naliv
elyilmaybehousedi nacompa吋menlsecuredw il
hspec旧 l
lasl
eners，lorexampleIhoses pecilie
di nIEC60079-0.1Ishal
lals
oconlorm10Iheloll
owin
g

a
)l hece
llorba
tle
ryhousing o
r means 01atlachmenlsha
ll be arrangedsolha
llhec el
lo r
ba吐e
rycanbeinst
all
edandreplacedw
ithoutreducingI
heintr
insicsalet
y01t
heapparatus;
b
) handheld apparatus o
r apparatus ca
rried on the person，ready lor use，such as radio
rece
iversandt ran
sceive
rsshallbesubjectedt ot hedropt est01IEC60079-0exceptt hat
Iheprio
rimpactt estsh
allbeo mit
led.Thec onstr
uction0 1theapparatusshallbeconsidered
adequateilthet e
stdoesn otresulti
nt h
ee jec
tionors eparati
on0 1theb a
tleryorce
llsIrom
theapparatusinsuchawayast oinv
alida
tethei nt
rins
ics a
lety01t heapparatusorbat
lery;
)t
c h
eapparatuss
hal
lbemarkedw
ithawarningl
abe
lass
pec
ili
edi
nit
emb
)ord
)011
2.3

7
.4.
9 Exlernalconlaclsf
orchargingb
atl
eri
es

Cellor ba
甘e r
yassemblieswithe xte
rna
l charging c
ontactsshall be provided wi
th means to
preventsh
ort-c
ircui
tin
gorto preventthec e
lls and ba
tle
ries Irom d
el i
veringi g
niti
on-ca
pable
energytothec on
tactswhenanyp air01thec onta
ctsisaccide
n ta
llyshort-circ
uite
d.T h
iss h
all
beaccomplishedinoneofthefollow
ingways:

)i
a Im
iti
ngt
heoutputi
naccordancew
itht
hisstandard，o
r;
b
)f orGroup"i n
trin
sic
alysafeapparatus，adegreeo
l fprot
ectionbyenclosureofatl e
astIP30
(
刀ωωEEacω53-uω@

shal
l be provided f
ort hesui
tablyprotect
ed charging ci
rcui
tand shall be marked w
itha
warninglabelass pe
cifiedi
ni temc)of12.3(oritemb )ofthel ex
tofwarningmarkingst a
ble
ofIEC60079-0).Theseparat 旧 ndistan
cesbelweent hechargingco
ntactsshallcomplywith
6.3c o
nsi
d erin
gt heopen
-cir
cuitvolta
geo fthebattery
吉

7
.5 Semiconduclors
岡﹄ Ed白HOEhoco

7
.5.
1 Transienle
ffe
cls

nassociatedapparatus，semiconductordevicess
I h
allbecapableofw
ithst
andin
gI hepeako
f
t
hea.
c.v olta
geandt hemaximumd .c.vol
taged i
vid
edbyanyinfa川b
leser
iesre
sista
nce
ヒコ υ-zoE300

I
nani ntri
nsic
all
ys aeapparatus，anyt
f ran
sie
nte
ffe
ctsgeneratedw
ith
int
heapparalusandi
ts
powersourcesshal
lbeignored.
口)NVDN00

7
.5.
2 Shunlvollagel
imi
ler
s
ロ

Semiconductorsmaybeusedasshuntv o
ltagelimi
tin
gdevicesprovidedthattheyconformt o
ド N z。。﹄コ芭 ω﹀“5 0﹁ 白ZJω為

thef o
llowing requiremenls and provided t
hatr e
levanttra
nsien
tc onditi
onsa re taken i
nlo
accoun.
tForexample，theinclusionofasinglefuseandZenerdioderatedi naccordancewith
7.
1i s considered as an adequate means ofiIm
itingtran
sient
sf orcirc
uit
s connected a
tt he
Zenerdiode

Semiconductorss h
allbecapableofcarryi
ng， w
ith
outopen-
circu
iting，t
hecurrenlwhichwould
flowa tt h
eir place ofins
tal
lat
ionifIhey f
aile
dint h
es hort
-cir
cut mode，m
i ul
tipl
ied by t
he
appropriates afetyf ac
tor
. Int he fol
lowig cases， t
n hiss ha
ll be confirmed from thei
r
五 F-o-ux﹁ha 刀剣出ω@00︿

manufacturer'sdataby:

) diodes，diode connected t
a rans
isto
rs，t hy
ris
tors and equ
ival
ent semiconductor devices
having aforward c
urrentratin
go fa tleat 1，
s 5 timest
he maximum possibleshor
t-circ
uit
curren
tforLevelofP rot
ectio
n“ ia
"or“ i
b"，and1，0timesthemaximump o
ssiblesho
rt-circ
uit
currentf
orLevelofP r
otect
ion"ic"
;
) Zenerd
b iodesbeingr
ate
d:

COPYRIGHT
 5
1

1
)inI he Zener d
ire
cli
o l 1，
na 5 limes I
he powerI
halwould be d
iss
ipa
ledi
n Ihe Zener
町lOde，and
2
)inIhelorwarddire
clio
na l1βlimesIhemaximumc u
rrenlIhalwouldI
lowi
lIheywere
s
horl
-circ
uil
edlorLevel 0
1Prole
clion“i
a"o
r“i"，and 1，
b 0limesIhemaximum c
urre
nl
I
halwouldIlowi
lIheyweresho
rl-ci
rcu
ite
dlo
rLevel0
1P ro
tecli
on"ic
".

ForL ev
el01P rot
eclion“i
a"，Ihea p
plic
alion01co
nlrol
lablesemiconductorcomponentsasshunl
volla
gel i
milig devices，l
n or example I
rans
ist
ors，thyris
tos，v
r ol
tage/cur
rentr egu
lal
ors，et
c.，
maybep erm
iltedilbolhI hei n
putando ulp
ulcirc
uitsarei n
tri
nsic
allysalec i
rcu
itsorwhereil
can beshownt hattheycannolbesubjectedt otransi
enls骨 omt hepowersupplynelwork. In
cir
cuit
scomplyingw i
ththeabove，臥10 devicesareconsideredtobeani n
lall
ibl
eassembly.

ForLeve
l0 1Pr
ote
ction“laヘthreeindependenta c
livevoll
ageli
mit
ati
onsemiconductorc
irc
uit
s
maybeusedinassocialedapparatusprovidedthet r
ans
ienlc
ond
ition
s017.5.1areme t
.These
ci
rcu
itssha
lla
lsobel es
tedinaccordancew ith10.1.
5.3

7
.5.
3 Seriescurrentl
imi
ter
s

The use 01thre

es eri
esb locki
ng diodes i
nc ir
cui
ts0 1L eve
l0 1P rot
ect
ion“i
a"is permi壮ed，
however，oth
ersemiconduclorsandc on
troll
ablesemiconductordevicessha
llbeusedass erie
s
cur
renl
-lim
itin
gdevicesonlyinLeve
l0 1P r
otect
ion“ib"or“ic
"apparalus.

However，lor poweriIm
ita
tin purposes，L
o ev
el0 1Pro
tecl
io n“ia
" apparatus may use s
eri
es
cur
rentli
mil
ersc on
sis
ting01con
lro
llableandnon
-con
trol
lablesemiconduclordevices
(
刀OWC=acozB刀mwECE

NOTE Theu seo fsemicon

ducto
rsa ndcontr
oll
abl
es emicon
ducto
rd ev
icesascurr
ent
-li
mit
ingdevi
cesforspark
i
gni
tio
nl i
mit
ati
onisnotp er
miUedforLeve
lo fPro
tect
ion"jぜ ap
parat
usb e
causeofthe
irtoss
ibl
eu seinareasin
wh
ichac onti
nuousorf r
eque
ntp r
esenceofa nexp
losi
vea tmos
pheremayc oi
nci
dewiththepos
sib
ili
tyofab ri
ef
t
rans
ien
tw h
ichcouldcauseign
it
ion
.Thema別 mumc ur
renttha
tmayb edeli
ver
edmayh aveabri
eftra
nsie
ntbutwi
ll
no
tb et a
kena s'0， b
ecausethec ompl
iancewiththes parkign
it
ionte5
tof1 0
.1w ouldhavee s
tabl
ish
edt he
su
cces
sfu
llimi
tati
onofthee n
ergyinth
Istran
sie
nt
哩品百己

7
.6 Failure01components，
connectionsandseparations

ForLevels01Pro
te c
ti o
n“旧"and“ i"，whereacomponenti
b sr at
edinaccordancewi
th7.1，i
ts
hoco

la
ilur
es ha
llbea countablefau. ForL
ll evel0 1Pr
otect
ion“
ic"，wherea componentisr
atedin
ヒコ O主ω E

accordancew
ilh7.1，itsha
llnotbeconsideredtof
ail

Thea
ppl
ica
lio
nof5
.2and5
.3s
hal
lin
clu
dethef
oll
owi
ng
コ00口)NF口N00

a
) whereacomponenti
snolrate
di naccordancew i
th7.1，i
ls1
剖 l
ureshal
lbeanoncountable 四

fa
ull
.Wherea componenli
sr al
edin accordancewi
th7 1，i
. t
sl a
ilu
res h
allbeacountable
fa
ull
;
口 hNEOω﹄コME@﹀ -EO勺由Z﹂ω

) where a f
b aul
tcan leadto a subsequentlaulto
rla
uls，thent
t he primaryandsubsequent
fa
ult
sshallbeconsideredt
obeas inglela
ult
;
c
)t h
elailu
re01re
sisto
rstoanyvalueofr
esi
sta
ncebelweenopenc
irc
uitands
hor
tci
rcu
its
hal
l
betakenin
toaccount(
butsee8.5)
Forthermal assessment，f
ilmorwirewoundr
esi
sto
r o 100% 0
soperatedupt 1th
eirr
ate
d
powershallnotbeconsideredt
ofai
l;
、

d
) semiconductordevicessh
allbeconsideredtof
ailtosho
rtc i
rcui
tortoopenc
irc
uilandt
o
EEo-uv

Ihestatetowhichtheycanbedri
venbyl ail
ureo
fo t
hercomponents;
fo
rsurfacetemperaturec lass
ili
catin，f
o ai
lureofanysemiconductordevicet oac on
dit
ion
弓 ha 刀剣出品uooo︿

where itd issip

ales maximum power s h
all be taken i
nto accounl. However，diodes
(inc
luding LED'sandZenerd iode
s)operatedw ith
intherequirementso f7 .
1s hal
lonly
be considered forIhe powertheys ha
lld i
ssipa
tei nthe lorward conducting mode，or
Zenermode，i fapp
lica
ble;

COPYRIGHT
 5
2

integra
tedc irc
uit
scanl a
ilsot ha
tanycombination0 1shortandopenc ir
cuit
scane xis
t
belweent h e
ire x
ter
nalc on
nect
ions.Although anycombination can beassumed，once
thatlault has been app
lied，i
t cannot be changed，lo
r example by a p
plicat
ion01a
secondl ault
.Undert h
islaul
tsitua
tio
nanycapacitanceandinductanceconnectedt othe
devices h
allbeconsideredi nthei
rmostonerousconnectionasar esu
lt0 1theappl
ied
la
ult;
whenc ons
ideringt h
ev oltagea va
ilableont hee x
ternalp ins01ani ntegr
atedcir
cui
tt ha
t
inclu
desv ol
tagec onverters( I
orexample f orv o
ltage increase orvoltageinve
rsionin
EEPROMS)，t h eintern
alv oltages need n ot be considered，provided th
atin normal
operat
iont he enhanced v o
lt a
gei sn ot present at any exte
rnalp i
n and no exter
nal
components li
kec apacito
rso ri nductor
sa reusedl orthec onve
rsion.1It heenhanced
vol
tageisa v
ailableatanye xte
rnalp n，thent
i heenhancedv olta
ges ha
llbeassumedt o
bepresentona l
le xte
rnalp ins01t h
ei ntegr
atedcirc
uit;

NOTE I
tisn
otareq
uire
men
toft
hi
sst
and
ardt
ha
tth
ema
nuf
act
ure
r'ss
pec
ifi
cat
ionf
ort
hei
nte
gra
ted
c
ir
cui
tne
edst
obev
er
ifi
ed
e
) connectionsshallbeconsideredt
of a
iltoo p
en-ci
rcu
itand，i
lfre
etomove，mayconnectto
anyp artofthec i
rcui
twit
hintherangeo fmovement.Thein
it
ia
lbreaki
sonecountablel
aul
t
andt hereconnectionisasecondcountablelau
lt(btsee88
u ); 目

η clearances，creepageands
epa
rat
iond
ist
anc
ess
hal
lbetakeni
ntoaccounti
naccordance
wih6
t .3;
g
)lail
ureofc apa
cito
rstoo pe
n-c
ircut，s
i hor
t-c
ircu
it and anyvalue l
ess than t
he maximum
s
pecil
iedvaluesh
allbetakenint
oaccount(butsee8.6
);
(EMCEzoz5

h
)lail
ureofinduct
orstoo pen-ci
rcuitand anyvalue belween nominal r
esis
tan
ce and s
hor
t-
c
irc
uitbutonl
yt oinductancetoresistanc
er a
tio
slowerthant hatd e
rived什omtheinduct
or
s
pecif
ica
tio
nss h
allbetakeni ntoaccount(btsee8.
u 4.
2);
open-
circui
tlai
lur
e0 1anyw ireorprin
tedcir
cui
tt ra
ck，i
ncl
udi
ngi
tsconnections，s
hal
lbe
、302cEω コ四百cECOヒ

consideredasasing
lecountablel
aul
t( btsee8
u .8)
.

I
nse
rti
on01t hesparkt
estapparatustoef
fec
tanin
ter
rup
tin，s
o ho
rt-ci
rcu
ito
rea
rthl
aul
tsh
all
n
otbeconsideredasacountablela
ultb
utasate
sti
nnormalop
erati
on.

In
la川 b
leconnectionsi
naccordancewi
th8 .
8andseparationsinaccordancew
ith6.3s
hal
lnot
beconsideredasproducingalau
ltandthesparkte
stapparatussha
lln o
tbei ns
ert
edi
nseri
es
コ G主ωEEo白)NEN00ロドNEOEZE

wi
thsuchconnectionsoracrosssuchsep
arati
ons

Wherei nl
alli
bleconnectionsaren otpro
tec
tedbyanenclosurew i
th ar
ati
ngofatl
eastIP20
when exposing connectionfa
cil
iti
es，t
hesparkte
stapparatus maybe i
nser
tedi
nseri
eswith
suchconnections.

Wherei nl
a川 b
leseparationsarenotencapsulatedorcoveredbyac o
atingi
naccordancew
ith
Clause6 .3oraren o
tp rote
cte
dbyanenclosurew i
thar atin
g0 1atleas
tIP20whenexposing
connectionfac
ili
tis，t
e h
esparktes
tapparatusmaybei n
sertedacrosssuchseparations

7
.7 P
iez
o-e
lec
tri
cdevices
﹀
吉一O勺OZ

P
iez
o-e
lec
tri
cdevicess
hal
lbet
est
edi
naccordancew
ith1
0.7
﹂旦五舌一 UV弓EEE80︿

7
.8 Electrochemicalcellsforthedetectionofgases
Electrochemical ce
lls used f
ord e
tectio
n0 1gases sha
ll be considered lo
rt he
ira
ddit
iont o
voltagesandc ur
rentswhich maya lle
ctsparkign
it旧 nassessmentandt e
stin.However，they
g
needn otbeconsideredl orthei
ra d
ditio
ntot h
epowerl o
rthermali gni
tio
nassessment0 1the
apparatus.

COPYRIGHT
 53

8 Infa川 blecomponents，i
nfa川 bleassembliesofcomponentsandi
nfa
lli
ble
connectionsonwhichintrinsicsafetydepends

8
.1 LevelofProtection“i
c"

Therequirementso
f8.
2to8
.9don
otapplyt
oLevelo
fPr
ote
cti
on“
ic"

8
.2 Mainstransformers

8
.2.
1 General

Inf
alli
ble mainstransformers s
hall be considered as no
tb eing capable o
ff ai
lin
gt o ashort
-
cir
cuitbetweenanywindings uppl
yin gani nt
rinsi
cal
lys af
ecircui
tandanyo therw i
nding.Short
cir
cuitsw it
hin windings and open c i
rcu
itso f windings s
hall be considered to occur
. The
combinationo ffaul
tswhichwouldr esu
ltinanincreasedo utp
utv oltageorc u
rrentshallnotbe
considered.

8
.2.
2 Protectivemeasures

Theinp
utcir
cui
to fi
nfa
lli
blemainstransformersintendedf
ors
upply
ingint
rin
sic
allysaf
ecirc
uit
s
sh
allbepr
otectedei
therbyafuseconformingt o7.3o rbyasu
ita
blyrat
edc i
rcuit
-br
eaker
.

I
fthei n
put and o
utputwindings are separated by an earthed metal screen (seetype 2b)
c
ons
tructio
ni n8.2.)，each non-earthed i
3 nputlines h
all be protecte
d by a fuse orc i
rcu
it-
b
reake
r.
{司
2zzacoZ2302zE何時 四百己﹄OEE20HEωEコ00口)NFDN00

Where，ina d
dit
iont
ot hefuseorcir
cui
t-br
eaker，anembeddedthermalfus
eo ro the
rthermal
deviceisusedforp
rot
ectionag
ain
stoverheatingoftetransformer，as
h ingledevicesh
allbe
suf
fici
ent

Fuses，fuseholders，ci
rcu
it-
bre
ake
rs and thermal devices s
hal
l conform t
o an a
ppr
opr
iat
e
recognizeds
tandard.
d

NOTE Itisnotare
quire
men
to fth
issta
nda
rdth
att h
ema
nuf
act
ure
r'ss
pec
ifi
cat
ionf
ort
hef
use
s，f
use
hol
der
s，
ci
rcu
it-
bre
ake
rsan
dther
maldevi
cesnee
dstobev
eri
fie
d

8
.2.
3 Transformerconstruction

A
IIwindingsforsup
plyingi
ntr
insi
cal
lysafec
irc
uit
ssh
allbeseparatedfroma
llo
the
rwindingsby
oneofthef o
llow
ingtypeso
fc on
struc
tio
n.

Fort
ype1c
ons
tru
cti
on，t
hewindingss
hal
lbeplacede
ith
er
ロド NEOEコ芭@﹀主5勺臼之﹂ ωEEo一日出勺 ha空白ω000︿

a
) ononel
ego
ftecore，s
h idebys
ide，o
r
) ond
b iff
ere
ntl
egso
fth
ecore

Thewindingss
hal
lbeseparatedi
naccordancew
ithTable5
.

Fort
ype2c
ons
tru
cti
on，t
hewindingss
hal
lbewoundoneoveranotherw
ithe
ith
er

• s
oli
din
sul
ati
oni
naccordancew
ithTable5betweent
hewindings，o
r
• anearthedscreen(madeofcopperfo
il
)betweenth
ewindingsoranequiva
len
twirewinding
(wi
rescreen
).Thethicknessoft h
ecopperfo
ilorthewirescreen，s
hal
lbei naccordance
wi
thTable6.
NOTE Thi
se ns
ure
st h
at，i
ntheeve
ntofas h
ort
-ci
rcu
itbet
weenanywin
dingandthescre
en，t
hes
cre
enw
il
l
w
iths
tan
d，wit
hou
tbrea
kdown，t
hec
urr
entw
hic
hf l
owsun
ti
lth
ef u
seorc
irc
uit
-br
eak
erfu
nct
ion
s

COPYRIGHT
 54

Manulacturer'stole
r a
ncesshallnotreducet
h nTable6 bymorethan 10% o
evaluesgiveni r
0，1m m， whicheveristhesmaller

Table6-Minimumf
oilthicknessorminimumwirediameterofthescreen
i
nrel
ationtotheratedcurrentofthefuse

R
ati
ngo
fth
efu
se A

M
ini
mumt
hic
kne
sso
fth
efo
i
lsc
ree
n 灯
、
灯、

M
ini
mumd
iam
ete
roft
hew
ireo
fth
esc
ree
n mm

Thelo
ilscreenshal
lbeprovidedw ihれNOmechanicallyseparateleadst
t othee a
rthconnection，
each01which israte
dt oc ar
rythe maximumcontinuousc urre
ntwhichcouldIlowbelorethe
luseo
rcircuit
-bre
akeroperates，l
o 7I
rexample1， nloraluse

A wirescreensha
llconsist01a tleasttwoele
ctr
ical
lyindependentla
yersolwire，eacholwhich
i
s providedwith an e
arth connection ra
tedtoc arrythe maximum continuous c
urre
ntwhich
couldIlowbeloretheluseo rc ircuit-
bre
ake
ro per
ates.Theo n
lyrequirement01thei ns
ula
tio
n
betweenthel aye
rsist h
atits h
allbecapable0 1withstandinga500V t estinaccordancewit
h
10.3

Thecores0 1al
lmainssupplytranslormerss h
a llbeprovidedw ithane a
rthconnection，except
wheree arthin
gi snotr equiredlorthet ye0
p 1p rot
ection，lorexamplewhentranslormersw i
th
insula
ted cores are used. Fortranslormers using le
rrie cores，t
t h
erei s no requirementlor
(
刀

groundingthecore，butt h
el er
rit
es ha
llbeconsideredasconductivel rsegregationpurposes，
o
旦ロ=aco戸 書 官 出MCE伺コ四 -

unlessadequatei nlormati
oni savai
labletoprovet hatthecorem at
eri
alisi n
s u
latin
g.

Windingssupplyingseparatein
tri
nsi
cal
lysalec
irc
uit
ssh
allbeseparatedIromeacho
the
rand
al
lo t
herwindingsinaccordancetoTable5

Thetranslormerwindingss
halbeconsolidated，l
l orexamplebyimpregnationo
ren
cap
sul
ati
on.
ozh

NOTE Useo
fim
pre
gna
tio
ntoc
ons
oli
dat
eth
ewi
ndi
ngsmayn
otm
eett
her
equ
ire
men
tsf
ors
epa
rat
ion
uzωヒ
コωMCOE300口)NVDN00

8
.2.
4 Transformertypetests

The translormer toge

therw ithits associated devices，lor example luses，circut breakers，
i
thermal devices and re
sisto
rs connected to thewindingt er
minatio
ns，s h
all maintain a sale
elec
tric
ali sol
ati
onbetweent hepowersupplyandthei nt
rins
ical
lysalecirc
uiteveni lanyone0 1
the outputwindings iss h
ort-ci
rcuited and al
lo ther outputwindings are subjected t
ot h
eir
maximumr at
ede le
ctr
icalloa
d.
ロド NZOEEEω ﹀古語﹃， oZ﹂ω 弘工Euov-﹁ha刀ωωωouo︿

Whereas e
ri e
sr esi
storise i
therinco
rporatedwit
hinthetranslormer，o rencapsulatedw iththe
translormer so tha
tt hereis no bare l
ivepartbetween the translormer andthe r e剖 s
tor，or
mountedsoast op rov
idecreepaged istanc
esandclearancesconlormingt oTable5，andi lthe
resis
torremainsi nc i
rcui
ta f
tertheappli
cation01Clause5，thentheoutputwindings hallnotbe
consideredass u
bjecttos h
ort-c
irc
uitexceptthroughthere
sistor

Translormerss
hal
lbet
est
edi
naccordancew
ith1
0.1
0.
一

8
.2.
5 Routinet
estofmainstransformers

Eachmainstranslormers
hal
lbet
est
edi
naccordancew
ith11.2

8
.3 Transformersotherthanmainstransformers

Thei
nla
lli
bil
ityandl
ail
uremodes0
1thesetranslormerss
hal
lconlormt
o8.
2

COPYRIGHT
 55

NOTE The
set r
ans
for
mer
scanbec
oupl
ingt
rans
for
mer
ssu
cha st
hos
eus
edi
nsi
gna
lci
rc
ui
tso
rtr
ans
for
mer
sfo
r
ot
herp
urp
oses，f
orexa
mplet
hos
eusedfo
rin
ver
ters
upp
lyu
nit
s

Thec onstr
u ct
ionandt e s
ting01thesetranslormerss h
allconlormt o8 .2exceptthaltheyshall
bet estedatt hel o
adl hatgives maximum powerd is
sipati
oni nt h
etranslormerw i
thoutopen
circ
uitin
gl he windings，t o ensure t
hatt hei nsu
lationisr at
edc orre
ctly
. Where iti s not
practic
abletooperatet hetranslormerundera lt
ernati
ngc urre
ntc ondi
lions，eachwindingshall
besubjectedt oad irec
tc urrent011，7Inint h
et ypet e
st018 .2.4
.However，ther ou
tinetes
ti n
accordancew ith11.2shalluseareducedv o
ltagebelweent heinputando ulptwindings012U
u
+10 00V r.m.s.or15 00V，whicheverist hegreater，U beingt hehighestratedv
oltage01any
windingundert es
t

1
Isuchtranslormersa
reconnecledon bothsidest
ointr
insi
cal
lysalec i
rc山ts，thenareduced
v
oltae01500V belweent
g heprimarywindingandthesecondarywindingsha
llbea pp
lie
dl o
ra
r
out
inete
st，asg ive n1
ni 1.
2

When such translormers are connectedton on

-intr
insic
all
ys afec i
rcu
itsderivedfrom mains
volt
ags，thene
e itherprotectiv
emeasuresi naccordancew i
th8 .
2.2o ral us
eandZenerdiode
sh
allbe inc
l ude
da tt hesupplyconnection in accordancewith8 .
9sol h
atu n
specili
edpower
sh
allnotimp
a irthei n
lal
lib
ili
ty01thetranslormercreepagedislancesandclearances.Therated
in
putvolt
age0 18.2.4shallbet hat01theZenerdiode.

Whensuchtranslormersa
reconnectedtoint
rin
sic
all
ysaleci
rcu
itsandaluseisnotpresenl，
then eachwindings
hal
lbesubjectedt
ot h
emaximum c ur
rentlha
tcan f
lowunderth
el ault
s
spec
ifiedinClause5
.
{
旬。uEa

8
.4 I
nfa
lli
blewindings
﹄ zoz主目unEMEEE

8
.4.
1 Dampingwindings

Dampingwindingsusedass ho
rt-ci
rcuitedtur
nstominimizet heef
fecs0
t 1inductancesha
llbe
considered nott o be su
bjecttoo pen-c
ircu
itf au
ltsil they are0 1relia
ble mechanical
constr
uction，lo rwindings0
rexampleseamless metaltubes o 1barewirecontinuouslysho
rt-
晶 vochozoヒ

cir
cuitedbys o
lder
ing

8
.4.
2 Inductorsmadebyinsulatedconductors
コOM
E

Ind
uclor
smadeIromi nsul
atedconductorssh
allnotbeconsideredtol
ai
ltoalowerr e
sist
ance
ω雇コ00口)刊ENoo

o
rh ig
herinductancethanlhe
irratedvalues(ta
kin
gint
oaccountt heto
lera
nce
s)iltheycomply
w
iththel o
llo
wing

t
henominalconductordiameter0
1wiresusedl
ori
ndu
cto
rwi
rin
gsh
allbea
tle
ast0，
05mm;
t
heconductorshal
l be coveredw ithatleastlwo l
aye
rs01i nsu
lati
on，o ras in
glelay
er01
ロド NEOEコ官。﹀吉百勺 OZJmhp台工o-ov-勺hD30ωω@00︿

s
oli
dinsul
atin0
o 1thicknessgreaterlhan0，5m mbelweenadjacentconduclors，orbemade
0
1enamelledroundwirei naccordancewith
) grade1oflEC6
a 0317-3，IEC60317-7，IEC60317-8o
rIEC60317-13
Theres
hal
lbenol
ail
urew
ithl
heminimumvalueso
fbreakdownv
olt
agel
ist
edl
orgrade
2 and when tested in accordance w
ilh Clause 14o
f IEC60317-3，IEC603177 田

IEC60317-8orIEC6 0317-13，thereshal
lbenomorelhans i
xlaulsper30m 0
t 1wire
irr
esp
ectie0
v 1diameter，or
) grade20
b 1IEC60317-3，IEC60317-7，IEC60317-8o
rIEC6
031
7-1
3.
Themanulacturers
hal
lpr
ovi
deevidence0
1conlormancewiththeaboverequirements.
NOTE t
Iisno
tareq
uir
eme
ntoft
hi
ss t
and
ardt
hatthec
onf
orm
ityo
fth
ema
nuf
act
ure
r'ss
pec
ifi
cat
iono
f
t
hein
sul
ati
ont
oGr
ade1orGra
de2nee
dstobev
eri
fie
d
windingsa ft
erhavingbeenlastenedorwrappeds ha
llbed riedtoremovemoisturebelore
impregnation wi
thas u
itabl
e substance by dip
ping，tri
ckl
ingo r vacuum impregnation
Coalingbyp ain
tingorspra
yingisnotrecognizedasimpr
egnation
;

COPYRIGHT
 56

the impregnation s
hal
l be carr
iedoutin compliancew itht h
es peci
fici n
str
ucti
ons01t he
manulacturer0 1ther el
evanttype01impregnating substance and i
n such awayt h
att he
spacesbetweent heconductorsaref
ill
edascompletelyasp ossibl
eandt hatgoodcohesion
betweent heconductorsisa c
hieve
d;
i
l impregnating substances co
ntain
ings ol
ven
tsa
re used，t
he impregnation and d
ryi
ng
processshallbec arri
edo uta
tl ea
sttwi
ce.

8
.5 Current-limitingr
esi
sto
rs

C
urr
ent
-li
mit
ingr
esi
sto
rss
hal
lbeone0
1th
elo
llo
win
gty
pes
:
)
aLDC

l
ilmt
ype
;
))

w
irewoundt
ypew
ithp
rot
ect
iont
opreventunwinding0
1th
ewi
rei
nth
eevent0
1breakage;
pr
intedr
esist
ors as used i
nhybri
d and s
imi
larc
irc
uit
s covered bya c
oat
ing conlorming
t
o6 .
3.9orencapsulatedi
naccordancew
ith6.6

An i
nla川b
lec ur
renti
-Im
iti
ngr e剖 s
tors
hal
l be considered as l
ail
ingo
nlyt
o an o
pen
'ci
rcu
it
co
ndi
tionwhichsha
llbeconsideredasonecountablelalt
u .

A c ur
rent
-limit
ingr es
istors h
all be ratedin accordance w i
tht he requirements 0 17.1，to
withstand a
tl eat 1，
s 5 times the maximum v oltag
e and tod issipa
tea tl east 1，5 times t
he
maximum powert hatcana r
isein normal o
pe r
ation andundert h
el aultconditionsd efin
edin
Clause5 .F au
lts betweent urns01c or
rec
tlyr ate
dw irewound r esis
torsw ith coatedwindings
shal
ln otbetakeni ntoaccount.Thecoating0 1thewindingshallbeassumedt ocomplyw it
hthe
(

requiredCTIvaluei naccordancewi t
hTable5a tit
smanulacturer'svoltager a
ting.
刀
2zzaEω 工言司自由主E

Coldr esis
tance(attheminimumambienttemperature)ollusesandfilamen
ts0 1thebulbsmay
be considered as i
nla
lli
blecur
rentiIm
itin
gresist
orswheretheya reusedw i
thinthei
rnormal
operatin
gc o
ndi
t i
ons. The l
ilame
nt0 1thebulbiso nlypermit
tedto be assessed as curr
ent
i
Imiti
ngcomponentl orhandiIg
htsandcapi I
ghts
.I ntheabsence01av a
ilableinlo
rmation，th
is
M

maybetakenast heminimumr esis

tanceatth
eminimumambienttemperaturewhenmeasured
Wコ四戸ochoEE﹄コu-zoE200白)NEN00

asr eq
uiredin10. 4

NOTE T
heb
uJbn
eed
stob
epr
ote
cte
dbyat
ypeo
fpr
ote
cti
ono
the
rth
ani
nt
ri
ns
ics
afe
ty

8
.6 Capacitors

8
.6.
1 Blockingcapacitors

日t he
r0 1thetwos e
riescapac
itorsinaninl
a川 b
learrangement0
1blockingc apa
citor
sshal
lbe
consideredasbeingcapable01la
ili
ngtosh
ortoropencirc
uit
.Thecapacitance01theassembly
sha
llbetakenast hemostonerousvalue01ei
therc
apacito
randas al
elyl act
or0 11，5s
hal
lbe
ロド NCOE2co﹀吉一O﹁ 臼ZJω、

usedina l
lappl
icati
ons01theassembly.

Blo
ckingcapacito
rss ha
ll be01a h
ighr el
iab
ili
tysoli
ddiel
ectr
ict y
pe.Electr
oly
ticortantalum
cap
acito
rss h
alln otbeused.Theexte
rnalconnections01eachc apac
itorand0 1th
eassembly
s
hallcomplyw i
th6 .3buttheses
eparati
onrequirementssha
lln o
tbea p
p l
iedtotheint
erior01
t
heb l
ockin
gc apacito
rs

Thei nsul
ation0 1eachc apaci
t o
rs hallconlormtot hed i
elec
trics trengt
hrequirements016.3.13
appliedbetweeni tselectrodesanda ls
obetweeneache le
ctrodeande xternlconductingpaはs
a .
220一UVL﹁hD宮古ω

Whereb loc
kingc apacito
rsa reusedbetweeni ntri
nsic
allysalecir c
uitsandn on-
intr
ins
ical
lysale
cir
cuis，t
t heb lockin
g capa引c比
t
ぬr
。
l 悶ss hal
l be assessed as a capa凹 cit
ivecou凶pingbetween these
引I
cr
印cu
山it
s
蛤.Theenergyt ransmitledshallbec alculatedusing Um andt he mostonerousvalue0 1
eit
herc apacito
r ands h
all be in accordancew i
tht hep ermis
s i
b lei gn
itio
n energy011 0.
7.A I
I
possibletransi
entss ha
llbetakeni ntoaccount，andt hee ff
ect0 1t hehighestnominaloperat
ing
Irequency( a
st hatsuppliedbyt hemanulacturer)int h
atp a
rt0 1th ecirc
uitsha
llbeconsidered
ωωO︿

COPYRIGHT
 57

Where such an assemblyal

soconformst
o89，i
. tsh
allbe considered as p
rov
idi
ngi
nfa
lli
ble
gal
van
ici so
lati
onf o
rdirec
tcurr
ent

8
.6.
2 F
ilt
ercapacitors

Capaci!orsconnec!edbe!weent heframeoft heappara!usandani n!r

insi
call
ys afecir
cui!shall
conformt o6.3.13
.Wheret h
eirfail
ureby-passesacomponentonwhich! h
ei nt
rins
ics afe
tyo f
!he circu
it depends， they shal
l a ls
o maintain infa川bl
es epara!ion or conform t o !he
requirements f
orb l o
cki
ngc a
paci!orsin8.6.1
.A c ap
a c
itor mee!ing !hei n
fal
lib
le separation
requirements o
f6 . 3，bo!hex!
ernal
ly and in
tern
allys ha
ll be considered !oprovidei nfa
llib
le
separa!ionando nlyoneisrequir
ed

NOTE Thenor
malpurp
oseo
fcapac
ito
rsconne
cte
dbe
twe
ent
hef
ram
ean
dth
eci
rc
ui
tist
her
eje
cti
ono
fhi
gh
fr
equ
enc
iesf
orexa
mpl
ef e
edt
hro
ughcap
aci
tor
s

8
.7 Shuntsafetyassemblies

8
.7.
1 General

Anassemblyofcomponen!sshal
lbeconsideredasashun!s afe!yassemblywheni
tensures
th
ein!
rin
sicsa
fet
yo facirc
uitby!heu
!il
iza
!io
nofshun!components.

Wherediodeso rZenerdiodesa reusedast heshuntcomponentsi nani n

fal
lib
leshun!s afet
y
assembly，theysha
llforma !leas
ttwop ara
lle
lpathso fdio
des.InL eve
lofP ro
tec!io
n“旧"shunt
safeyassemblies，o
! nly!hefai
lureofonediodes h
allbe!akenintoaccoun!inthea p
plica!io
no f
Clause 5. Diodes s
hall be r
atedt oc a
rryt h
ec u
rren
t which would fl
owa tt h
eir place of
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2EzaEOZ書 官wBCEMVコ四百 chutωとヨ U言 。 Eコ00

ins
talla
tio
niftheyfai
ledintheshort-
cir
cuitmode

NOTE1 Top
rev
ents
par
kig
ni
ti
onwhenac
onn
ect
ionb
rea
ks，e
nca
psu
lat
ioni
nac
cor
dan
cew
ith6.3.5mayb
e
re
qui
red
NOTE2 T
hes
hun
tco
mpo
nen
tsu
sedi
nth
eseassembJ
iesmayc
ond
ucti
nno
rma
lop
era
tio
n

Whereshunts afetyassembliesa r
esubjected! opowerf a
ult
ss pecifi
edo n
lybyavalueo fUm，
thecomponen!s o fwhichtheya reformeds hallber ate
di n accordancewith7.1
.Wherethe
components arep r
otec!ed by a fuse，the fuse sh
all be in accordance with7 .
3 and !he
componentss h
allbeassumedt oc arryacontinuousc urr
entof1， 7Ino ft
hef u
se.Thea bil
ityof
theshuntcomponentst owi!hs!andt ra
nsi
entss h
alleitherbet es!edinaccordancewith1 0.8or
be de!ermined by comparison of! hefuse-
c urre
nt time charac
teris
!ico fthef use and !h
e
performancechara
c!eris
ticsofthed evi
ce.
口)NFDN00ロ ド 刊 にO Eコ官 ω﹀吉一。﹁白 Z 4 師、2 2 0UV弓﹄ D官目的 ωQO︿

Whereashuntsafetyassemblyi
smanufacturedasani ndi
vid
ualapparatusr
a!herthanaspar!
ofala
rgrapparatus，
e thentheco
ns!
ructi
ono ftheassemblysh
allbeinaccordancewith9.
1.2
.

When con
sider
ing!heuti
liz
ati
ono
fa shunts
afe
ty assembly as an i
nfa
lli
ble assembly，the
fo
llo
win
gs h
allbeco
nsid
ered:

a
)th
eshun!s
afe
tyassemblys
hal
lno
tbeconsideredt
ofa
ilt
oano
pen
-ci
rcu
itc
ond
iti
on;
b
)th
evo
l!a
geo
fth
eassemblys
hal
lbet
hato
fth
ehi
ghe
stv
olt
ageshuntp
a!h
;
c
)th
efa
ilu
reo
fei
the
rshuntp
atht
osh
ort
-ci
rcu
its
hal
lbeconsideredasonef
aul
t;
d
)ci
rcu
i!su
sin
gshuntt
hyr
ist
orss
hal
lbet
est
edi
naccordancew
ith1
0.1
.5.
3.
一

8
.7.
2 Safetyshunts

A shunt safety assembly s

hall be considered as a sa
fet
y shunt when i
t ensures !
ha!! he
e
lec!
rical parame!ers ofa s p
ecified componen! orp ar!of an i
n!ri
nsi
cal
ly safe c
irc
ui! are
c
on!roll
ed! ovalueswhichdon o!i n
valida!
ei n!
rin
sicsaf
e!y

COPYRIGHT
 58

Safetyshuntssh
allbesubjectedt
othere
quiredanal
ysiso
ft ra
nsi
entswhentheya
reconnected
10powers upp
liesdefinedo
nlybyUm i
naccordancewil
h8.7.
1，exceptwhenusedasfoll
ows

a
)forIhelim
ila
lio
no fIhe discharge from energys
lor
ing devices，f
or example i
ndu
clo
rso
r
p
iez
o-e
lec
lricdevi
ces
;
)f
b o
rIhel
imi
lal
iono
fvo
lla
ge1
0energys
lor
ingdevices，f
orexamplecapacilors

An assembly o
fsu
ila
blyr
ate
d bridge-connecled diodes s
hal
l be considered as an i
nfa
lli
ble
sa
fetyshunt

8
.7.
3 ShuntvoltageI
imiters

A shunls af
elyassemblys
hal
lbeconsideredasashunlv o
lla
gei
Imi
lerwheni
lensuresI
hata
definedvollagel
eve
lisapp
liedt
oaninlri
nsic
all
ysafec
irc
uil
.

Shunlv ol
lageiImiterssha
ll besubjecled1 0Iher eq
uiredanalysi
sofIr
ansie
nlswhentheyare
connecled 1
0 powers u
pplies defined o
nly by Um i
n accordancewi
lh8.7
.1，exceplwhen Ihe
assemblyisfedfromoneo fIh
ef ollow
ing:
)a )

ani
nfa
lli
bleIransformeri
naccordancew
ilh8
.2;
ιunuAU

adiodes
afe
tyb
arr
ieri
naccordancew
ilhClause9
;
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ab
alt
eryi
naccordancew
ilh7.
4;
ani
nfa
lli
bleshunls
afe
lyassemblyi
naccordancew
ilh8
.7
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8，8 Wiring，
printedc
irc
uitboardtracks，
andconnections
﹄

Wiring，p
rin
ledcirc
uilboardIrac
ks，in
clud
ingi
lsconneclionswhichformsparlofIheapparalus，
sha
llbeconsideredasi n
fal
lib
leaga
inslopenc
irc
uilfailur
einIhefollo
wingcases:

a
)fo
rwires
) where卸v
1 owiresarei
npa
ral
lel，o
r
2
) whereasin
glewirehasadiamelero falleal0，
s 5m mandhasanunsupporledleng
lho
f
ch

les
sIhan50m mo ri
smechanicallysecuredadjacenlt
oit
spo
in fconneclion，o
lo r
o
toヒコO芭ωEコω

3
) where a si
ngl
ew i
reiso fslranded o
rf le
xib
ler ibbon Iype conslrucl旧 nhas a c
ros
s-
secl
ion
alareao fall
eal0，
s 125m m2 (0，
4m m diameler)，isnolf lexedinserv
iceandis
eil
herles
sIhan50m ml ongorissecuredadjacenl10il
sp o
inlofconneclion;
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b
)fo
rpr
inl
edc
irc
uilboardI
rac
ks:
1
) wheretwoI
rac
ksofa
lle
ast 1m mwidlharei
npa
ral
lel，o
r
2
) whereas i
ngl
eIr
acki
sall
eas
l2m mwideo
rhasaw
idl
hof1% o
fil
sle
ngh，whichever
l
isgre
ale
r
I
n bolhIhe abovecases，I
hep
rin
ledc
irc
uilboardI
rac
ksh
allcomplyw
ilhe
ilh
ero
fIhe
f
ollowi
ng
each I
rac
kisformed什omcopperc
lad
din
g having a nominalthickness o
fno
lle
ss
Ihan33μm;or
Ihecurrenlc
arryi
ngc a
pac
ilyo
fas
ing
leI
rac
koracombinaliono
fIr
ack
sisl
esl
edi
n
accordancewil
h1 0.
12;
3
) whereI racks on d
iff
eren
tl aye
rs are connecled bye
ithera s in
gleviaofatl e
ast2m m
circumference o
rtwo paral
lelv i
aso fall easl1m m circumference，andIhesevia
s are
join
ed1 0eacho lherinaccordancewilh8 .8b
)1 )or8.
8 b
)2 )
Thev旧 ss
hal
lcomplyw
ilhe
ilh
ero
fthef
oll
owi
ng
noll
essIhan33μmp
lal
ingI
hic
kne
ss;o
r
I
hec
urr
enlc
arr
yin
gca
pac
ilyo
fas
ing
lev旧 i
sle
sle
dinaccordancew
ilh1
0.1
2;
)f
c o
rconneclions(
exc
lud
inge
xle
rnlplugs，
a sockelsandt
erm
ina
ls)

COPYRIGHT
 59

1
) wheretherearetwoconnectionsi
npa
ral
lel
;or
2
) where there i
sas ingle soldered j
oin
ti n which the wire passes through the board
(inc
ludi
ng through-plated holes) and is soldered o
r has a crimped connection o ris
brazedorwelded;o r
3
) whereth
ereis asolderedjointofasurface mountcomponentmountedi
n accordance
wit
hthecomponentmanufacturer'srecommendations;o
r
4
) wheretherei
sas
ing
leconnectionwhichconformst
oIEC60079-7;o
r

5
) where there i
s an i
nte
rna
l connector w
ith
int
he enclosure，and the connection i
s
comprised o
fatl e
astt hr
eeindependentconnecting elementsf o
r“ ia" and a
tlea
sttwo
fr“
o i
b"，wi
ththeseelementsconnectedi npar
allel(seeFigure5 ).Wheretheconnector
maybe removed atan angle，oneconnection elements hall be presentat，o o，
rneart
eachendo ftheconnector

NOTE Whent
hec
onn
ect
ori
sco
mpl
ete
lyd
isc
onn
ect
ed，t
hec
irc
uit
ssh
oul
dre
mai
nin
tri
nsi
cal
lys
afe

8
.9 Galvanicallyseparatingcomponents

8
.9.
1 General

An inf
all
ibl
eisolat
ingcomponentconformingt
othef oll
owings ha
llbeconsideredasnotbeing
capableoffai
lin
gt oasho
rt-c
irc
uitacrossthei
nfa
lli
bleseparation

8
.9.
2 Iso
latin
gcomponentsbetweeni
ntr
ins
ica
llysafeandnon-intrinsicallysafe
c
ircui
ts
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I
sol
ati
ngcomponentss
hal
lcomplyw
iththef
oll
owi
ng.

a
) Therequirementso fTable5s hal
la ls
oapplytotheisol
atin
gelementexceptt
hatfo
ri ns
ide
sealed devices，e
.g. opto-couplers，column 5，6 and 7 s
hal
l not a
ppl
y.IfTable F
.1i s
applid，column2s
e hallnotapply
b
) The n on-
intrin
sically safe c
irc
uit connections sha
ll be provided w it
hp r
ot e
ctiont o ensure
thatther atingsofthe devicesi naccordancew ith7 .1 arenotexceeded. Forexample，the
inclus
iono fas i
ngleshuntZenerdiodeprotectedbyas uitablyra tedfuseaccordingt o7 .3，
orathermal device，s ha
llbe consideredass uffi
cientp rotecti
on. Fort hispurposeTable5
shal
lnotbea ppliedtothefuseandZenerd io
de.TheZenerdiodepowerr atingshallbea t
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least1， 7'ntimesthe diode maximumZenerv oltage. General i ndus

tri
a l standards forthe
constructiono f fuses and fuseholders s ha
ll be a pplied and t heir method o f mounting
includi
n gthe connectingw irings h
alln otreduce t he clearances，creepage distances and
υo口)NENOωロ

separations afforded bythefuseandi sholder

t .Insome a pp
licationst hei nt
rinsi
callysafe
cir
cuit connections may r equi
ret hea p
plicatio
no fs imilarp rotective techniques to avoid
exceedingther atingo ftheisola
tingcomponent .Alternativelyopticalisolatorsshallcomply
withthet estrequirementso f10.11
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NOTE1 T
het
esti
n10
.11i
son
lyi
nte
nde
dtoa
ppl
ytod
evi
cest
hata
rec
los
e-c
oup
leds
ing
lep
ack
age
dde
vic
es
) The componentss
c hall complywiththed iel
ectricstren
gth requirementsin accordancew ith
6.3.
13 between the n on-i
ntri
nsica
lly safe c i
rcu
it terminals and the i n
trins
ical
ly safe
te
rminal
s. The manufacturer's i
nsula
tiont es
t voltage for the i
nfa
lli
ble separation ofthe
componentshallbenotl essthanthet es
tvoltager equire
dby6 .3.13

G
alvan
icall
y separating r
ela
yss
hall conform t
o 6.3.14 and anywinding s
hal
l be capable of
d
iss
ipati
ngt h
emaximumpowert owhichitisconnected

NOTE2 D
era
tin
goft
her
ela
ywi
ndi
ngi
nac
cor
dan
cew
ith7
.1i
sno
tre
qui
red

8
.9.
3 I
sol
ati
ngcomponentsbetweenseparatei
ntr
ins
ica
llysafec
irc
uit
s

I
sola
ting components s
hal
l be considered t
o provide in
fal
lib
le separation o
f separate
i
ntr
insi
cal
lysafecir
cui
tsi
fthef
oll
owingcondit
ion
sares at
isf
ied

COPYRIGHT
 60

a
)I herati
ngo fIhedeviceshal
lbeaccordingto7.
1( wi
lhI heexceplionsgiveninI ha
lclause
st
il
lbeinga pp
lica
ble)unlessilcanbeshownthalIhecirc
uisconnecled1
l 0Iheseterminals
cannoti n
vali
dat
eI heinfa
lli
bl 旧 no
eseparal fthed evic
es.P ro
tectivelechniques (such as
thoseindicat
edin8 .
9.2)maybenecessary1 0avoidexceedingther ati
ngo fI h
ei sola
ling
component;
b
)I hedevices h
allcomplyw ilhIhedie
lec
lricslr
engt
hrequirementsinaccordancewith6.3.
13.
The manufaclurer's i
nsu
lationle
stv oll
ageforIhei n
fal
lib
les e
paral
iono fthe component
underlestshallben ollessIhanIhele
slv o
llagereq
uiredby6.3.13
.

9 Supplementaryrequirementsforspecificapparatus

9
.1 Diodesafetyb
arr
ier
s

9
.1.
1 General

Thediodesw i
thinadiodesafetybar
rierlim
itIhevolt
agea ppl
iedtoani n
lrin
sica
llysaf
ec i
rcu
it
and a fo
llowi
ngi n
fa川blecur
rent-
limi
lingresi
storlim
itst h
ec urre
ntwhich can flowint
ot he
ci
rcit
u.Theseassembliesareintendedf oruseasi nt
erface
sbelweeni n
trin
sica
llysa
fec i
rcui
ls
andnon-
intr
insic
all
ys a
feci
rcuis，ands
t h
allbes u
bje
ct1 0therout
inete
stof1 1.
1.

The a
bil
ilyo
fIh
esa
fet
yba
rri
ert
o wilhstand t
ran
sie
ntf
aul
tss
hal
l be t
est
edi
n accordance
wi
th10.8.

Safelybarri
ersco
nla
iningonlyIwodiodeso rdiodechainsandusedf orL evelofPro
tecti
on“i
a"
(
E

shal
lbeacceptableasi n
fall
ibl
eassembliesinaccordancew i
th8 .7，providedIhediodeshave
VE
-aEZBESEEE四百EE亡

been subjectedt
other ou
tinet e
slsspeci
fiedin1 11.
目2.InIhis case，Ihef ai
lur
eo fonlyone
﹄

diodeshal
lbetakenint
oaccounti nIh
ea ppli
catio
nofClause5

I
nLevelofP r
ote
clio i
n“c"safet
ybarr
iers，Ihe minimum requirementi
s as
ing
le diode and a
c
urr
entli
mil
ingres
ist
ori
foperatedw
ithinIherequiremenlsof7.1

9
.1.
2 Construction

9
.1.
2.1 Mounting
ωヒ22EEコ

The cons
lru
ctionsh
all be such I
hal，when groups o
fb arr
iersare mounted l
ogel
her，any
in
corre
c sobvious，f
tmounlingi o
rexamplebybeingasymmetricali
nshapeo rcolou
rinrel
ati
on
t
oI h
emounling
00白)
NF

9
.1.
2.2 F
aci
lit
iesforconnectiontoea同h
D
NOωロ

Inadd
ilion10anycirc
uilconnectionf a
cil
ilywhich maybea teart
hp ote
ntil，I
a hebar
riers h
all
ドNZOEコ芭@﹀王O勺 白Z﹂旦￡古一

have a
tl ea
stone more connection f
aci
lit
yo rshal
l befit
tedwi
th an insu
late
dw i
re having a
cro
ss-sec
liona
lareaofatleast4m m2f o
rI headd
ition
ale
arlhconneclion

9
.1.
2.3 Protectionofcomponents

Theassemblys hallbep rol

ect e
da gainstaccess，inordert oprevenlrepa
iro rreplacemento f
anycomponentsonwhichs afelydependse ith
erbyencapsulalioninaccordancewilh6.6o rby
an enclosurewhich forms a non-recoverable u
nit
.The enlire assemblyshal
l form a sing
le
en
lity
UX勺

9
.2 FISCOapparatus
EEB80︿

ApparalusIha
lhasbeenconstrucledi naccordancew i
lhAnnexG andi sintendedtobeused
wit
hinaFISCOsystem，s hal
lbea d
ditio
nal
lymarkedas'FISCO'f o
llowe
dbyani nd
ica
tio
nofit
s
func
lion，.
ie
.powersupply，fi
elddeviceorterminator
.(SeeClause12)

COPYRIGHT
 6
1

9
.3 Handlightsandcaplights

C
apl
igh
tsf
orGroup1s
hal
lcomplyw
ilhIEC60079-35-1.

Handligh
ls and c
apl
igh
lsf
or Groups 1 and 1
1
1sh
all comply w
ilhI
he requiremenls o
fIh
is
slandard

10 Typeverificationsandtypetests

1
0.1 Sparki
gni
tio
nte
st

1
0.1
.1 General

AI
Ic irc
uil
sr eq
uiringsparkig
nil
iontest
ingsha
ll betestedtoshowIh
atIheya reincapableo
f
causing ign
iti
on under thecondi
lio
nss pe
cifie
di n Clause 5 f
orIhe appropr旧tel eve
lof
prote
ctionofapparatus

Normalandf aultcondit
ionsshal
lbesimulaledd ur
ingI hetesls
.Safetyf a
ctorssha
llbetaken
int
oaccountasdescribedi nAnnexA .Thesparkl eslapparalusshal
lbei nsertedi
nI hec i
rcu
it
underl e
stateachp oinlwhereitisconsideredIhatani nler
ruptin，s
o hortcir
cul，o
i re arl
hf au
lt
may o cc
ur.A circ
uit maybe exempted from aIypet es
tw ilht hespa
rk-teslapparatus i
fits
slruc
lureandilselec
lrica
lparamelersar esuff
ici
enllywe
lld efinedfori
lssafetytobededuced
fromI ereferencecurves，F
h ig
uresA.l1 0A.6o rTablesA.landA.2，byI hemethodsdescribed
inAnnexA .
(U2ccacoz言宮山SEEMMコ四百chgtωと

Wherevol
tag
esandc
urr
ent
sar
esp
eci
fie
dwi
tho
uls
pec
ifi
cto
ler
anc
es，al
ole
ran
ceo
f01% i
1
0 s10
beused

NOTE A ci
rc
uitas
ses
sedu si
ngth
ere
fer
enc
ec u刊 e
sa n
dta
ble
smayca
Useig
ni
tio
nwhentes
tedus
ingthes
par
k
t
estap
par
atus.These
nsi
tiv
ityoft
hes
par
ktestap p
ara
tusv
ari
es，a
ndt
hecu
rvesandta
ble
sa r
ederi
vedfr
oma
la
rgen
umberofsuc
htes
ts

1
0.1
.2 Sparkt
estapparatus

Thesparkt e
slapparaluss h
allbeI ha
tdescribedi nAnnex8 exceplwhereAnnex8 i ndic
ale
s
nIhesecircumstances，
コ O芭ωEコ00口}NFDN00

Ih
alitmaynolbes uita
ble.I analt
ern
ali
vel es
tapparatusofequiv
alent
se
nsil
ivi
lyshallbeusedandj us
lifi
cal
ionforitsuses h
allbeinclude
di nI
hed efi
nil
ivel
esland
assessmenldocumenlalion

For LevelofP ro
lecli
on“ia
" and "
ib"，Ih
e use ofIhe sparklesl apparalus t
o produce s
horl
cir
cuis，i
l n
terr
uplio
ns and ea
rlhfaull
ss ha
ll be a l
esto f normal operali
on and is a non-
counlablefa
ult
ロド NE022co﹀吉一。﹁臼ZJω、

a
tconnectionf
aci
lil
ies，
a
linter
nalconneclionso
racrossin
ternalcreepagedis
lancs，clearances，d
e i
stanc
esIhrough
c
astin
g compound and d i
stanc
es Ihrough s
olidin
sulal
ionnot conforming t
o6 .1
.2.
2.o r
6
.1.
2.3

Thesparkt
estapparaluss
hal
lno
tbeused

acrossi
nfa
lli
bleseparalions，o
rins
eri
esw
ilhi
nfa
lli
bleconneclions，
EEG-uvL勺hD旬

acrosscreepagedislances，clearances，distancesIhroughc
ast
ingcompoundandd
ist
anc
es
Ihroughs
olidins
ulati
onconforming1 0Table5o rAnnexF，
w
ilh
inassocialedapparaluso
lhe
rthana
til
sin
tri
nsi
cal
lysafec
irc
uitt
erm
ina
ls，
- belween t er
min
also
fseparale c
irc
uil
s conforming t
o6.
2.1，a
par
t from I
he exceplions
。ω

describedi
n7.
6i)
ω
ωυυ︽

COPYRIGHT
 62

For L
evelo
fPr
ote
cti
on“
ic"，t
he spark t
est apparatus s
hal
l be considered f
ort
hef
oll
owi
ng
sit
uat
ion
s

a
tconnectionf
aci
lit
ies，
acrossseparationsl
essthanthevaluess
pec
ifi
edi
nTable5o
rAnnexF
;
in place o f normally sparking contacts such as plugs/sockets，switches，pushbuttons，
potentiometers;
i
nplaceo
fcomponentst
hatarenots
uit
abl
yra
tedundernormalo
per
ati
ngc
ond
iti
ons

1
0.1
.3 Testgasmixturesandsparkt
estapparatusc
ali
bra
tio
ncurrent

1
0.1
.3.
1 Explosivet estmixturessuitablefortestswithasafetyfactorof1，
0and
calibrationcurrentofthesparkt estapparatus

The explosive t
est mixtures as givenin Table 7 sh
all be used，according t
ot hest
ated
EquipmentGroupwhichi sbeingt est
ed.Theexplosivemixturesspec
ifiedinthi
sclausedonot
cont
ain as afe
tyf a
cto
r.I fas afe
tyf act
orof1，5isr eq
uired，theele
ctri
calvalues oft
heci
rcu
it
sh
allbeincreasedaccordingt o1 01.
. 4.2a)

Thes ensi
tivi
tyofthesparkt es
tapparatuss hallbecheckedbeforeeacht estseriesiscarri
ed
outinaccordancew it
h1 0
.1.5.Fort h
ispurpose，thet e
stapparatusshallbeoperatedi na24V
d.c
.c ir
cuitconta
ininga95( t5
: )mHa ir-cor
edc oi.
lThecurrentint hi
sc i
rcu
its h
allbes etatthe
value given i
n Table 7 fo
rthe a pp
ropriate group. The s
ensi
tivit
ys ha
ll be considered t
o be
satis
factoryi
fani g
niti
onofthee xplosi
vet es
tmixtureoccursw ithin440r evo
lutionsofthewire
(
℃O

holderwiththew ir
eholdera tposi
tivepola
rity
WEEacωZ

Table7-Compositionsofexplosivet
estmixturesadequatefor1，
0safetyfactor
ヨ
司 02zEEd

Group C
omp
osi
tio
ns01exp
los
ivet
e5t Curr
entinthe
mix
tur
es c
ali
bra
tionci
rcu
it
V
o[.% i
nai
r mA
四百Ehuco

(
8，3土 0，
3)% m
eth
ane 1
10t
o11
1
I
IA (
5，2
5 土 0，
25)% p
rop
ane 1
00t
o10
1
ヒコ ω官。 E200口)NFDN00

I
IB (
7，8土 0，
5)% e
thy
len
e 6
5to6
6
I
IC (
21 土2
)% h
ydr
oge
n 3
0to3
0，5

In spec
旧 1cases，apparatuswhich i
sto betest
ed and markedforuse i
nap a
rtic
ula
rgas o
r
vapoursha
llbet es
tedinthemostea剖 Iyign
ite
dconcentrationo
fth
atgaso rvapourinai
r.
ロド NZOE2EO﹀吉一。勺 O Z﹂ωhzHZo-ov有、230ωωω00︿

NOTE Thep u
rit
y01com
merc
iall
ya va
ila
blegasesandv ap
oursisnorm
allyadeq
uateforthes
et e
5t5，butt
hose01
p
urit
yl e
sst
han95% sh
ouJdnotbeused
.T heeff
ectofnorm
alvaria
tio
nsinlab
orat
orytemp
eratu
rea ndai
rpres
sur
e
andoftheh
umid
ilyoft
heai
rintheexplo
siv
et e
5tmixtu
reisal5
0l i
ke
lytobesmal.
lAnys i
gni
fic
anteffe
ctso
fthes
e
va
riat
ion
swHIbecomea
ppare
ntduri
ngtherout
inecal
ibr
ati
on01thespar
ktestapp
aratu
s

1
0.1
.3.
2 Explosivet estmixluressuitablefortestswithasafetyfactorof1，
5and
calibrationcurrentofthesparkt estapparatus

The p re
ferr e
dt es
t mixtures arethoses pe
cifiedin10.1.
3.1w ith as afe
tyf actorappliedbyan
increaseo fvoltageo rc u
rrentasa p
plica
ble.Wheret hisisnotp ra
cticalandamoreseveret est
mixturei s used to achieve a f
acto
ro fsafety，a saf
etyf a
ctoro f1，5i s considered as having
been a ppliedfor the purpose o fthi
s standard when the composition shall be as given in
Table8

COPYRIGHT
 63

Table8-Composilionsofexplosiveleslmixluresadequalefor1，
5safelyfaclor

C
omposi
tionso
fexplos
ivet
e5tmixtures C
urrentinthe
Group Volume活 ca
libr
atio
n
Oxyg
en-
hydro
gen-ai
rmix
ture Oxygen-hydrogenm ix
ture c
irc
uit
mA
Hydrogen A
ir Oxygen Hydrogen Oxygen
5
2土 0，5 4
8土 0，
5 8
5土 0，5 5土日， 5
1 731074
I
IA 8土 0，5
4 5
2土 0，
5 8
1土日， 5 1
9土 0，
5 661067
1
18 8土 0，5
3 2土日， 5
6 7
5土日， 5 2
5土 0，
5 431044
I
IC 0土日， 5
3 5
3土 0，
5 1
7土 0，
5 6
0土 0，
5 4
0土 0，5 201021

1
0.1
.4 TeslswilhIhesparkleslapparalus

1
0.1
.4.
1 Circuillesl

Thec irc
uil1
0betestedsh
allbebasedon!h
emos!incendiveci
rcu
i!!
hatcanari
se，!oleranced
inaccordancew
i!hClause7and!akin
gin
!oaccoun!between0and110% ofthemainssupply
voltage

The spark! es!apparatus sha

ll be insertedi n the c
irc
uitunder! esta t each poin!where itis
considered th
a! an in!erru
pti
ono r in!erconnection may occur. Tests shall be made with !he
cir
cui!in normal operation，and alsow ith one o r 臥10f au
l!s，as appropria!e !o !he leve
lo f
protec
tiono fapparatus in accordance w ih Clause 5，and w
! i!
h! he maximum values o f!he
(
刀BEzacozB 刀剣W

ex!ern
al capacitance (Co)and induc!ance ( Lo)o r induc!ance tor es
is! an
cer a!i
o (LoIRo) f
or
whichtheapparatusi sdesigned.

Each印 刷 i
tsh
allbetestedf
orthel
oll
owi
ngnumber0
1削 o
lu!
io眠 w
i!hat
ole
剛 ceo
f十 f % o f
OVC
E

!
hewireholderi
n!h
esparkt
estapparatus
ω コ田副OEhutω

)au)

f
ord
.c.c
irc
uis，
! 400r
evo
lut
ion
s(5min)，200r
evo
lu!
ion
sateachp
ola
ri!
y;
'hunu

f
ora
.c.c
irc
uis，1000r
! evo
lut
ios(12，
n 5mi
n);
)
ヒ 20官。E コ00口)NFDNO@口 hNZOEECO﹀吉一o-，臼Z4ωhzz一

lorcapacit
ivec ircu
its，400r evolu!ions(5min)，200r evol
u!i
onsa teachp ol
ari!y
.Cares h
all
be!aken ! o ensure !ha
!! he capacitorhas suff
icie
nttime!o recharge (
a!l e
as!!hreetime
constan
!s). The normaltime l orrecharge is about20 ms andwhere! h
isis inadequa!e i
t
sha
llbeincreasedbyremovingoneo rmoreo f!hewiresorbyslowingthespeedo frota
!ion
of!hespark! estappara!us.Whenwiresare removed，thenumber0 1revolu!io
nsshall be
increasedtomain!ain!hesamenumbero fsparks

Aftereacht es
ti naccordancew i
!ha }，b}orc}，cal
ibrat
ionof!hesparktes
!apparatussha
llbe
repea!ed. 1
Ithe ca
libr
a!ion does n
o! conform t
o1 0.
1.3，the i
gni
!io
nt e
s!on !h
ec irc
uitunder
inves!
iga!i
ons h
allbeconsideredi n
valid

NOTE Bentandfr
aye
dtu
ngs
tenw
ire
soft
hes
par
kte
sta
ppa
rat
usc
anc
han
gei
t
sse
nsi
tiv
ity
.Th
ismayc
aus
e
in
val
idt
e5
tres
ult
s

10，1
.4，
2 Safelyfaclors

NOTE Thep urp

oseoftheappl
icat
ionofasafe
tyfac
tori
stoe nsur
eei
the
rthatatypete5
tora s
sessmentiscar
rie
d
Q
utwithacir
cui
tw h
ichisdemonst
rablymorelik
e[
ytoc au
sei gn
iti
ont
hantheori
gin
al，ortha
ttheorigi
na!ci
rc
uiti
s
oUX司E

t
est
edinamorer ead
ilyign
ite
dg asmixt
ure
.I ngene
ral，t
iisn otpo
ssi
bletoo b
tainexactequi
valencebetwee
n
d
iff
ere
ntm et
hodso fa ch
ievi
ng as pec
ifi
edf ac
torofs af
ety，butthefollo
win
gm e
t h
odsp rovi
dea cce
ptabl
e
a
lte
rnat
ive
s
官 的 、
ω

Whereas
afe
tyl
ac!
o 11，
r0 5isrequiredi
tsh
allbeob!ainedbyone0
1thef
oll
owi
ngmethods:
。ωω︿

COPYRIGHT
 64

a
) increasethemains( e
lec
tri
calsupplysystem)voltageto110% oft henominalvaluetoallow
for mains va
ria
tions，ors etother voltages，f
or example b
atter
ies，power s u
ppli
es and
voltagelim
iti
ngdevicesatthemaximumvaluei naccordancewihClause7，
t th
en:
1
)f orinduct
iveandresi
sti
vecir
cuits，increasethecurr
entto 1，
5timesthefaul
tc urr
entby
decreasingth
evaluesofli
mitin
gr esistance，i
fthe1，5fa
ctorcannotbeobtained，fur
the
r
increasethevol
tag
e;
2
)f orcapaci
tivec i
rcu
its，increase t
hev o
ltagetoo bta
in 1，5 times t
hef a
ultvoltage.
Alt
ern
ativelywhenani n
fal
libl
ec u
rre
nt-lim
iti
ngr e
sist
orisusedwithac apa
cit
or，consider
thecapa
citorasaba 社eryandt hecirc
uitasresi
stiv
e
When usingt
he curvesi
n FiguresA
.1t
oA.6 o
rTablesA
.1 andA.2f
orassessment，t
his
samemethodsha
llbeused.
b
) usethemoree
asi
lyi
gni
tedexplosivet
estmixturesi
naccordancew
ithTable8

Whereas
afe
tyf
act
o f1，
ro 0isr
equ
ire
dthet
estmixtures
pec
ifi
edi
nTable7s
hal
lbeused.

1
0.1
.5 Testingconsiderations

1
0.15
.1
司 General

Spark ignitio
nt estss h
all be ca
rrie
d outwitht hecir
cuitarrangedt og iv
et he mostincendive
conditio
ns. Forsimplec irc
uitsofthetypesforwhicht hecurvesin FiguresA.1 toA.6apply，a
short
-circui
tt esti sthe mostonerous. For more complex ci
rcui
ts，the c ondi
tions vary and a
short
-circui
tt estmaynotbethemostonerous， forexample，forconstantv olt
agecurr e
nt-limit
ed
powers upplies，the mostonerousc on
d i
tionusuall
yoccurswhen ar esistorisplacedi ns e
ries
(
司

with the output ofth e powersupply and li

mit
s the cu
rrentto the maximum which can f l
ow
旦czazoz書官muECE 伺2四百zhot@

withoutanyr e
d uc
tioninv olta
ge.

Non-linear powers
uppl
iesr e
quirespe
cialc o
nsiderat
ion. SeeAnnex H f
ori nfo
rmati
on on an
alter
nativemethodforthei
gnit
ionte
stingofsemiconductorlim
iti
ngpowersupplycir
cui
ts

1
0.1
.5.
2 C
irc
uit
swithbothinductanceandcapacitance

Where ac i
rcu
itc ontai
nsenergystoredi nb o
thcapacitance andinductance，i
tmaybed iff
icu
lt
to assess such a c ir
cui
t from the curves i
n Figures A
.1t o A.6，for example，where the
ヒ

capacitiv
estoredenergymayr einfo
rcethepowersourcefeedingani nductor
.Wherethet ot
al
コO芭ωEコ

inductance，orcapacitanceassessedagainsttherequirementso fClause5，i slesthan1% o

s f
thevalueallowablebyusingthei gnit
ioncurvesortablesgiveninAnnexA，thent hemaximum
allowablecapacitance，orinductance，res
pectiv
ely，maybetakenast hatallowedbythecurves
ωo白)NFONoω

ortables.

Thec
irc
uits
hal
lbeassessedf
orcompliancew
ithe
ith
ero
fth
efo
llo
win
gmethods:
ロ ド 刊COE2zo﹀M

a
) testedw
it fcapacitanceandinductance，o
hthecombinationo r
b
) wherel
ine
ar(
res
ist
ivec
urr
entl
imi
tin
g)c
irc
uit
sar
ebeingconsidered
1 fL
) thevalues o oand Codeterminedbythei
gni
tio
n curvesandt
abl
egiveni
nAnnexA
areallowedfo
r;
EO勺臼Z﹂ω弘幸吉一 UV﹃hA宮古泉目。︿

d
ist
rib
ute
dinductanceandcapacitancee
.g.asi r，
nacableo
i
fth
eto
talL
;oftheexternalc
irc
uit(
exc
lud
ingt
hec
abl
e s<1% oftheL
)i ovalueo
r，
i
fthet
ota
lC;o
fthee
xte
rna
lci
rcu
it(
exc
lud
ingt
hec
abl
e s<1% o
)i fth
eCovalue
2 fL
) thevalues o oand Codeterminedbytheigni
tio
n curves andta
blegiveni
nAnnexA
sha
l o50% i
lbereducedt fbotho fthef
ollo
win
gc ondi
tionsaremet;
thet
otlL
a ;oftheexternalc
irc
uit(
exc
lud
ingt
hec
abl
e ftheL
)迂 1% o ovalueand
t
het
ota
lC;o
fthee
xte
rna
lci
rcu
it(
exc
lud
ingt
hec
abl
e)主 1% o
fth
eCovalue
The reduced capacitance o
fthe e
xte
rna
lci
rcu
it(inc
lud
ingca
ble
)sh
all notbe g
rea
ter
than1μFf orGroups1 ，IA，and1
I 1
8and600nFforGroupII
C

COPYRIGHT
 65

Thevalues01LoandCodeterminedbythi
smethodsh
alln
otbeexceededbytesum0
h 1al0
l 1
theLjpluscab
le inductancesi
nth
ecir
cui
tandt esum 0
h 1a
ll0
1Cjpluscablecapacitances
res
pect
ivel
y.

1
0.1
.5.
3 C
irc
uit
susingshunts
hor
t-c
irc
uit(crowbar)protection

Aftertheo ut
putvoltag
ehass tabilized，thec i
rcui
ts h
allbeincapable01causingignitio
nlorthe
appropri
atel ev
el0 1pr
otect
ion01apparatusi nthec on
dit
ions01Clause5 .Additi
o nal
ly，where
thet y
pe0 1protec
tionrel
iesono perat in0
o 1thecrowbarcausedbyotherc ir
cui
tl aul
ts，thele
t
through energy01the crowbar during operation s
hallnotexceedt h
el ollo
wing value l
orthe
appropri
ategroup

GroupI
ICapparatus 20μJ
Group1
18andGroup1
1
1apparatus 80μJ
GroupI
IAapparatus 160μJ
Group1apparatus 260μJ

Asi gni
tio
nt est
switht
hesparkte
s tapparatusaren otapprop
ria
telortest
ingt h
ecrowbarlet
-
through energy，t
hislet
-th
rou
gh energy sha
ll be assessed，lo
r example Irom o
sci
llosc
ope
町leasurements

NOTE Am
eth
odo
fpe
rfo
rmi
ngt
hi
ste
sti
sav
ail
ab[
einA
nne
xE

1
0.1
.5.
4 Results0
1sparktests
(32Ezac@ZB 司mwouzEEJ回目othdO亡ωヒ

Noi
gni
tio
nsh
alloccuri
nanyt
ests
eri
e tany0
sa 1thechosent
estp
oin
ts.

1
0.2 Temperaturetests

AI
I temperature data s
hall be reler
redt o a relerence ambienttemperature 0
140 oc o rthe
maximum ambienttemperature marked ont h eapparatus.Testst o bebasedon a relerence
ambienttemperatures hal
l beconducteda tanyambienttemperaturebetween20ocandt he
relerenceambienttemperature.Thed i汗erencebetweent h
eambienttemperatureatwhichthe
test was conducted and t he relerence ambient temperature sha
ll then be added tot he
temperaturemeasuredunlesst hethermalc haracteris
tics0 1thecomponentarenon-linear，l
or
コ ω吉ω Eコ00口}NFDNO@

exampleba! te
ries

Temperaturesshallbemeasuredbyanyconvenientmeans.Themeasuringelements
hal
lno
t
sub
stant
iallylowerth
emeasuredtemperature

Anacceptablemethod0
1determiningther
is ntemperature0
ei 1awindingi
sasl
oll
ows
:
ロド NZOEコ芭ω﹀吉一。﹁白Z4 師、220UV弓﹄︽判官。ωωω00︿

measuret
hewindingr
esi
sta
ncew
itht
hewindinga
tarecordedambienttemperature;
applythetes
tc urr
entorc urr
entsandmeasurethemaximumr e
sis
tan
ce0
1thewinding，and
recordt
h eambienttemperatureattetime0
h 1measurement;
c
alc
ula
tet
her
isei
ntemperatureIromt
hel
oll
owi
nge
qua
tio
n:

t=主 ( 1ト (
k+1 k+1
2)
where
一

t i
sth
etemperaturer
ise，i
nke
lvi
ns;
r i
sth
ere
sis
tan
ce0
1thewindinga
tteambienttemperature1
h 1，i
nohms;
R i
sth
emaximumr
esi
sta
nce0
1thewindingunderthet
estc
urr
entc
ond
iti
ons，i
nohms;
1 i
steambienttemperature，i
h ndegreesC
elsis，
u whenri
smeasured;
2 i
1 steambienttemperature，i
h ndegreesCel
sis，whenRi
u smeasured;

COPYRIGHT
 66

k i
sIh
ein
ver
se0
1Ih
ele
mpe
ral
urec
oel
lic
ien
l01r
esi
sla
nce0
1Ih
ewi
ndi
nga
l0'
CandhasI
he
v
alu
e01234，
5Kl
orcopper

1
0.3 D
iel
ect
rics
tre
ngt
hte
sts

D
iel
ecl
rics
tre
ngl
hle
slss
hal
lbei
naccordancew
ilhI
hea
ppr
opr
ial
eIECs
lan
dar
d.

WhereI her
eisnosuchs la
ndard，Ih
el oll
owi
ngles
lmelhods ha
llbeu s
ed.Thel es
lsh
allbe
perlor
mede il
herwilh anal
ler
nali
ngv ol
lage01sub
slanl
ial
lysinu
soi
dalwavelorm a
lapower
Ireq
uencybelween48Hzand62Hzo rwil
had .
c.v o
llageha
vingnomoreI han3% pe
ak-t
o-
peakripp
lealal e
vel1，4li
mesIhespeci日eda.
c.vol
lage

Thesupp
lys
hal
lhavesu
lli
cie
nlvol
l-a
mpereca
pac
ity1
0ma
inl
aint
hel
eslv
olt
age，l
aki
ngi
nto
acc
oun
lanyleaka
gec
urr
enlwhic
hmayo c
cur

Thevol
lag
eshal
lbeincr
easedstea
dil
y10I
hes
pec
i日edv
alu
einap
eri
od0
1no
lle
ssI
han1
0s
andI
henmain
taine
dlo
ralleasl60s

Theappl
iedvol
tag
esh
allrem
a i
nc o
nslan
ldu
rin
gIh
ele
st
.Thec
urr
entI
low
ingd
uri
ngI
hel
esl
sh
alln
olexceed5mAr.m
.s.alanylim
e

1
0.4 Determination0
1parameters0
1lo
ose
lys
pec
ifi
edcomponents

Tenunusedsampleso fthecomponenlshallbeo blain

edf romanys ou
rceo rsou
rceso fs
upply
and Ih
eirrele
vanlp a
rameterss h
all be measured. Tes
lss h
allnormal
lyb ec ar
riedoutal，
(302zaEω 工言官wECEMWコ

orrel
erre
d1 0，Ihespeci
lied maximum ambientt e
mperalure，lorexample 40'C，b u
lwhere
neces
sary，lem
perat
ure-se
nsiliv
ecomponents，s hallbet es
leda tlo
werl em
p e
ralurestoob
lai
n
Ih
eirmoslonerouscon
dilio
ns.

The mostone
rousvalu
eslo
rIheparamel
ers，nolnec
ess
ari
lylakenIromIh
esamesample，
obl
ainedIr
omthele
slsonI
he10samplessha
llbela
kenasrepr
ese
nlal
iveofth
ecomponenl
.
田 wOEhocωヒ

1
0.5 Testsf
orc
ell
sandb
att
eri
es

1
0.5
.1 General
コ ovcωEコυo

Rechargeablecel
lsorb a
tler
iessha
llbelu
ll
ychargedandt he
nd isc
hargedatlea
sll
wiceb e
lore
anyt e
slsa r
ec a
rrie
do ut
.OnI h
eseconddischa
rge，orIhesubsequenlonea snec
e s
sary，Ihe
capa
cily0 1Ihec
ellorba白erysha
llbeconli
rmedasbeingwilh
inilsmanu
laclur
er'ss
pecil
ical
ion
口)NFDNOω口 hNC00

1
0e n
sureI halte
slscan bec arr
iedou
lo n alu
llychargedcel
lo rbatle
rywhichiswith
inits
manufac
lurer'sspe
cili
catio
n

When a sh
orl
-ci
rcui
li sre
quiredlo
rl e
sl purposes th
er esis
lance01Iheshor
l-c
irc
uilli
nk，
ex
cludi
ngconnec
tions10i
l，eit
hersh
allnotexceed3mQo rhaveav ol
lagedro
pa cro
ssiln
ot
exce
eding200mVo r15% 01thece
lle.m
.l.Thes h
orl
-cir
cui
ts h
allbeapp
lie
da sclose10I
he
﹄コ官。﹀吉一o

c
el
lo rba壮e
rylermi
nalsaspra
clic
abl
e.

1
0.5
.2 E
lec
tro
lyt
eleakaget
estf
orc
ell
sandbaUeries
-J臼Z4 仰、EEG-UVL-Jha司

Tenl
eslsampless
hal
lbes
ubj
ecl
ed1
0Ih
emostonerous0
1Ih
efo
llo
win
g:
a
)sh
orlc
irc
uilu
nt
ild
isc
har
ged(
nola
ppl
ica
blel
orL
eve
l01P
rol
ect
ion'
ic
')
;
b
)ap
pli
cal
iono
fin
pulo
rch
arg
ingc
urr
enl
swi
thi
nIh
ema
nul
act
ure
r'srecommendalions;
c
)char
gingab a
tler
yw il
hinIhem an
ufacl
urer
's recommendalions w
ith one c
el
llu
ll
y
d
isch
arge
dors
uff
erin
gIromp
ola
rit
yreve
rsal
自由ω000︿

The condi
lio
ns above s
hal
li n
clud
e anyreve
rsechar
ging due1
0c o
ndili
onsaris
ingI ro
mI he
app
lical
ion015.2and5 .3
.Theys h
allnoli
nclud
etheuse01a ne
xle
rnalchar
gingcirc
uilwhi
ch
exceedsIhecha
r gi
ngratesrecommendedbyIhema
nulac
lurerol
lhecel
lorball
ery.

COPYRIGHT
 67

The !es! samples sh

all be placed wi
!h any case disco
n!inui
!ies，lor example s eals，lacing
downward o rin! h
eo rien!
a!io
ns pecil
iedby! he manulac!urer 01!he device，overa piece 0 1
blot
!ingpaperl o
rap e
riod0 1a!lea!1
s 2ha fter!heapplica
!ion0 1!heabove! e
s!s.Theres h
all
benov i
siblesign0 1elec!
roly
1eon!heb lot
!ingpapero ron! heex!er
n alsurlaces 01!he! es!
samples.Wheree ncapsu
la!ionhasbeena p
p l
ied!oachieveconlormance! o7 .4.2，examina!ion
01!hec e
lla !!heendo f!he! e
s!shallshownodamagewhichwouldi nvalid
a!econformance
wih7.
! 4.
2

1
0.5
.3 Sparki
gni
tio
nandsurfacetemperatureofc
ell
sandba
t!e
rie
s

1
Ia bat!ery comprises a number o fd isc
re!ec e
llso rsmall
erba!!eri
es combined in aw e
ll-
delin
edc ons
! r
uc!ion conlorming!o! hesegrega!ion and o
!herrequiremen!s 0
1! h
iss!andard，
!heneachd iscre
!eelemen!s ha
llbeconsideredasani n
dividu
alcomponen!f or!hepurposeo f
!es
!in
g. Excep!l orspeciall
y cons!ruc!ed bat
!eri
eswhere i!can beshown ! h
a!s h
or!-c
ircu
i!s
betweencelscanno!occur，!
l helailu
re0 1eachelemen!shallbeconsideredasas in
glelault
.In
lesswel
l-delinedcircums!ances，!hebat !erysh
allbeconsidered!ohaveas h
or!-
circu
i!failu
re
betweeni!
se x!erna
l! ermi
nals.

C
ell
sandbat
!er
iess
hal
lbe!
es!
edo
rassessedasl
oll
ows
.

a
) Spark igni
!io
n assessmen! o
r! es!in
gs hall be carrie
do u!a!!hecel
lor bat!e
ryex!e
rnal
!ermin
als，excep!wherea c urr
en!-l
imi!in
gdevice i si ncl
ude
dandt heci
rcu!be臥l
i een! h
is
device and!hec e
llorb a!
!eryis encapsula!ed according!o6.
6. The!es
!o rassessmen!
sha
ll!heni nclu
de!hecurr
en!-
limi!
ingdevice
Where! h
eappara!uscontain
scell
s!ha!sh
allno!bechangedin!h
ee xplo
sivea!mosphere，
(
ち

!hesparki g
ni!
iondischargea!!he!er
mina
lsofas in
glecel
ldoesn o
!r e
quir
e!obe! e
s!ed，
且E a

provided!ha
!!hes i
ngl
ec el
ldeli
versapeakope
n-ci
rcui!v
ol!ae0
g 1less!han4βV
﹄cω ￡書官富山CE句コ四百己 h

When ! hein!e
rnalresis!
ance0 1a c e
llo rbat!e
ryis! o be i
nclud
edi nthe assessmen!o f
in
!rin
sics af
e!y，i!s minimum r esis!
ance value sh
all be spec
ified
.A I!e
rna!iv
ely，il! he
ce
ll/bat
!er
ymanulac!urerisunable! oc o
nlirm!heminimumvalue0 1in!
ern
alr esis!
ance，!h
e
mos!onerous value 01shor
!-cir
cui!c urr
en!from at e!0
s 110samples o f! h
ec ell/
bat
!ery
toge
!h e
rwi!h!hepeako pen-
circui!voltageinaccordancewi!h7.4.401!hecell/b
at!er
yshal
l
beusedt ode!ermine!heinter
nalr e
sis!ance
.
NOTE 1 Somecel
lt yp
es，fo
re xa
mp[en
ick
el cadmium，may e
xhi
bitamaximum s
hor
t-c
irc
uitc
urr
enta
t
uzωヒ

te
mpe
ratu
reslo
wertha
nn or
malam
bient
コo-c

b
)C ellss h
all be !es
!eda t any!emperature between l a
bora
toryambien! and t hespecil
ied
ωι コuo口)NFDNoωロ

maximumambien!! h
a!g i
v es!hemos!onerousc ond
i!ionsand! hevaluesob!ainedsha
llbe
usedd ire
c!l
yi n!hetempera!urec l
assassessment .Thec el
lsshallbearrangedi nawayas
!osimula!e! he!hermal e
f f
ec!s01t h
eirintended posi
tionin!hecomple!e appara!us.The
!empera!ureshallbede!erminedon! hehot!es
ts urlace01!hec e
llt h
a!maybeexposedt o
!hee x
plosivea!mosphereandt hemaximumf ig
uret ak
en.Ifane x!e
rnalsheathisfit
!ed!hen
!hetempera!ures h
allbemeasureda t! hein!erl
aceo f!heshea!hand! h
eme!alsurfaceo f
ド NC02コ官。﹀吉百勺 OZ﹂ωhszu-UX勺ha官出ω@00︿

thecellorbat!er
y.
Themaximumsurlace!empera!ures
hal
lbede!erminedasf
oll
ows
For‘ ， and '
旧 ib
'a l
lc urren
!-limi!
ing devices e x
ternal! o! hecello rbat!erys h
all bes hor!
circ
ui!edf o
r! he! st
e.The!es!s h
allbec arriedou!bo!hw i!hin!erna
lc urren!
-limi
!ingdevices
incircu
i !andw i!h! hedevicesshor !-circu
i!edusing1 0c ell
si neachc ase.The1 0samples
having ! hei n!e
rnalc urrent
-limi!
ing devices s hor!-
circui!e
ds h
all be ob!ained Irom ! h
e
cell
/bat!erymanufac!urer! oge!herwi!hanys pecialins!ru
ctionsorprecau!ionsnecessaryf or
safeuseand! esting01!hesamples.1 I!hei n!
ernalcurren!l i
mi!i
ngdevicesp rote
cta gainst
in!e
rnalshor !s!hen!hesedevicesneedn o!beremoved.However，suchdevicess ha
llo nly
beconsideredf orLevelo fPro!ec!ion‘ib
'
NOTE 2 J fJeakag
eo felec
trol
yteoccursd u
ringthi
st e
5t，thenther eq
uirem
entso f7.4.
3s h
oulda l
sob e
con
sidered
NOTE3 W hiledete
rmini
ngthemaximums urf
acetempera
tureofab at
ter
yc om
prisingmorethanonec e
l[in
se
riesconnec
tion，pro
videdth
atthecell
sa readequa
telysegr
egatedfromeacho t
her，on
lyonecellshou
ldbe
sho
rteda to net i
met od e
terminethi
sr naxim
ums urf
acet em
perat
ure.( T
hisisb a
sedo nt heextreme
un
likel
ihoodofmorethanoneceJ
ls h
o耐 ngato neti
me.
)

COPYRIGHT
 68

c
) For ‘
ic
'! h
e maximum s
urla
ce !empera!ure s
hal
l be de!ermined by !
es!
ingi
n normal
ope
ra!ingcon
di!
ion
swi
!hal
lpro!
ec!i
ondevicesinplace

1
0.5
.4 Batterycontainerpressuretests

Fivesamples 0
1!hebat !e
ryc on!
ainersh
all besubjec!ed!o apressure!es
!!o de!ermine!h
e
v
en!ingpress
ure.Pressureshal
lbea p
pli
ed!o! h
ei nsi
de0 1!hec
on!ainer
.Thepressurei s!
obe
gr
aduall
yincreasedun
!ilven!
ingo cc
urs.Themaximumv en!
ingpressuresh
allberecordedand
s
hallno!exceed30kPa.

Themaximumrecordedve
n!i
ngpressuresh
allbea ppl
ied!oasample0 1!hebat
!er
yc on
!ainer
lo
rap eri
od01a!l
eas!60s.Aft
er!es
!ing!h
esamples hallbesubjec!ed!oavisu
ali n
spec!
ion
.
Theres
hallbenov
isibl
edamageorpermanen!delorma!旧n

I
fs ep
ara!io
nd is!an
cesw i
!hi
n! hebat!erycon
!ain
era rebasedonTable 5，!hen! h
epressure
!e
s!needn otbec arrie
do u!on asample! ha!has beensubmit
!ed! o!he!hermalendurance
!e
s!so fIEC60079-0. I
fsepara
!iondi s
!anc
eonan assembledp r
in!edcirc
ui!boardwi
!hin!he
bat
!erycon!ai
nerisbasedonAnnexF!hen! hepressure!e
s!sha
llbec a
rriedou!onasample
!h
a!hasbeensubmit !ed!o!he!hermalendurance!es!sandadd
ition
ally，i
fp o
r!ab
leappara!us，
!hedrop!es
!o fIEC60079-0.

1
0.6 Mechanicalt
est
s

1
0.6
.1 Castingcompound
(32czazo sumwSEEmvコ

Afor
ceo f30 N s h
all beappl
iedperpen
dic
ula
r!o!heexposedsurfaceofcas
!ing compound
w
i!ha6m mdiame!erf la
!endedme!alrodf
or10s
.Nodamage! oorpermanen!deforma!iono
f
!
heencapsula!iono
rmovemen!g rea!e
r!han1m msh
alloccur
.
、
工

Whereaf r
eesurfaceofcas
!ingcompoundoccursandformsp ar!of!heenclosure，i
no rd
er!
o
ensure!ha!!hecompoundi srig
idbu!n o!br
it e，
!l !
heimpac!! es!ssh
allbec arrie
dou!on! h
e
surlaceof!hecas!
ing compoundin accordancewi!h IEC60079-0using!hedroph eig
h!h i
n
回 Mochu亡ω

rowa )of!he!
es!
sf orr
e s
is!an
ce!oimpac!!ableofIEC60079-0.

1
0.6
.2 Determinationofthea
cce
pta
bil
ityoffusesrequiringencapsulation
ヒ
コO言。E200口)NENoω

Wherefusesa rer equ

ired!obeencapsula!ed，and!heencapsula!ioncoulde
n!er!
hein!
eri
orof
!h
efuseanda ffec!safe
ty，!helo
llowi
ng! es
!is! obeperformedonf i
vesamplesofeachfuse
befo
reencapsula!ionisappl
ied

Wi!h!he!es
!samplesa !anin
i!
ial!empera!ureof(25:
t2 )oC，!heys
hallbeimmersedsuddenly
inwa!era!a!empera!ureof(50:t2)oC! oadep!ho fn o!le
ss!han25m mf ora!le
as!1min
Thedevicesar
econsidered!obes a
!isfac!
oryifnobubblesemergefrom!hesampledur
ing!his
ロ ド 刊C022co﹀ω

!es
!

AI!e
rna!ively，a t
es!can be a
ppl
iedwhere f
ive samples of!he fuse a
re examined a
fte
r!h
e
encapsula!ion!oensure!
ha!!hecompoundhasno !en!eredth
ein!erio
r
EO勺白Z﹂ω

1
0.6
.3 P
art
iti
ons

Par!
i!io
nssha
llwi!hs!anda minimumf o
rceof30N a pp
liedbya(6:t0.2) m mdiame!erso
lid
hz

!es
!r o
d.Thef o
rceshallbea p
pl i
edto!heapproxima!ecen
!reof!hepa
r!i!i
onfora!leas!10s.
一 H
Z uUV有、230E000︿

Thereshal
lbenodeformationo fthep
art
iti
onthatwouldmakeitun
suitabl
ef ori
tspurpose
日

1
0.7 Testsfori
ntr
ins
ica
llysafeapparatuscontainingp
iez
oel
ect
ricdevices

Measureb o!
h! hecapacitanceof! h
edeviceanda ls
o! hevol!a
geappearingacrossitwhenany
pa!0
r 1 !he in
!ri
nsi
cal
ly safe appara!us which i
sa ccess
iblei ns er
viceis impac! !
es!
edi n
accordance w
i!h! he“high" column ofTes!s forr es
is!anc
e! o impac!!a
blei n IEC60079-0

COPYRIGHT
 69

c
arr
iedoulal(20土 10)ocusingIheleslapparalusi
n IEC60079-0.ForI
hevalue0
1vo
lla
ge，
I
hehigh
er打gureollheIwol
eslsonI h
esamesamples h
allbeused

WhenI h
einlr
ins
ical
lysale apparalus c
onl
ainingIhepi
ezo
elecl
ricdevicei n
cludesa guard1
0
prevenladi
reclphysic
alimpacl，I h
eimpaclleslsh
allbecarr
iedoulonI h
eguardw ilhbolhIh
e
guardandtheinlr
insi
call
ysaleapparalusmounledasi n
lendedbythemanulacturer

The maximum energy s

tore
d by th
e capacitance 0
1Ih
ecr
yst
ala
lth
e maximum measured
vo
ltagesh
alln
otexceedt helol
low
ing:

l
orGroup1apparatus: 1500μJ
l
orGroupI
IAa
ppa
rat
us: 950μJ
l
orGroupI
IBa
ppa
rat
us: 250μJ
l
orGroupI
ICapparatus 50μJ

Wheret hee l
ect
ric
alo u
lput01thepiez
oelecl
ricdevicei
sli
mit
edbyprote
ctiv
ecomponenlso
r
guards，thesecomponentsorguardsshal
ln otbedamagedbyI h
eimpactinsuchawayasto
allowthetype01prot
ectio
ntobeinva
lidale
d

Wherei tisnecessaryt oprotectthei n

trin
sic
allysaleapparatusIrome xt
ernalphysica
limpact
ino rdert o prevent the impact energy exceeding thes pe
cilid values， d
e e
tails0 1t he
requirementsshal
lbes pe
ciliedass pecialc o
nditio
nslors aleuseandt hecer
tif
icat
enumber
sha
lli ncludethe“X"s u
lfi
xi n accordancew i
ththeMarkingrequirements0 1IEC60079-0and
Ihespecili
cc o
ndition
s0 1usel i
stedont hecert
ific
atesh
alldela
ilt h
ei ns
l副la甘onrequirements
(匂
2ccacozguoscE句コ四百chO亡。ヒコ02ωEコ

1
0.8 Typetestsf
ordiodesafetyb
arr
ier
sandsafetyshunts

The l oll
owi
ngt e
stsare used t
o demonslrate t
hatt
hes
ale
lyb
arr
iero
rsa
let
y shunt can
withstandthee
ffecl
s01tr
a n
sie
nts

Ina川b
l l
yratedre
sis
tor
ss h
allbeconsideredt
obecapable0
1withstandinganyt
ran
sie
nlt
obe
expecledIromI
hespeci
liedsupply

Thediodessha
llbeshown1 0becapable0 1withstandingthepeakUm divi
dedbyt hevalue(at
theminimumambienttemperature)0
1t heluser e
sistanceandanyin
lal
lib
ler e
sistan
ceinseri
es
wi
ththeluse，剖 I
herbythediodemanulacturer'sspe
cificat
ionorbyt
hel o
llowingl
est
.
00口)NVDNoo

Subjecteacht ype01diodei nt hed i

recl
ion0 1uti
liz
ati
on( I
orZenerdiodes，th eZenerd irec
tion)
toliver ec
tangularcurr
entpulseseach0 150μsd uratio
nrepeateda l20msi nter
vals，witha
pulseamplitude0 1thepeak0 1theUm d ivid
edbyt he“ c
old"r e
sistan
cevalue0 1thelusea tI he
minimum ambienttemperature( plusanyi n
lall
ibl
es er
iesr esi
slancewhichisi ncir
cuit
).Where
ロド NZ022zo﹀芭5

Ihemanulacturer'sdatashowsap re
-arci
nglimeg reaterthan50μsa tthisc ur
rent，thepulse
widlhs h
all be changed to representthea clualpre-arcin
gt ime
. Where Ih ep re
-arcing time
cannotbeobtainedIromI hea vailab
lemanulacturer'sdata，10lusess hal
lbesubjected1 0t he
calcula
ledc ur
rent，andt h
eirp re-ar
cingtimemeasured.Thisvalue，i lgrealerthan50I s，s
l h
all
beused
-J臼 Z﹂ωhF-Eo-ux 勺h

Thediodev oltagesh
allbemeasuredallhesamec ur
rentb e
loreanda f
lerIhistest
.Thetest
currents ha
ll be typi
call
yI hats pecil
ied by the component manulacturer. The measured
voltagess h
alln otdiff
er by more than 5% ( Ihe 5% i nc
ludest heuncertai
nties01thet e
st
apparatus
).Theh ighes
tv ollag
ee leva
tionobservedd uri
ngt hetestsh
allbeusedast hepeak
value0 1as erie
s0 1pulsest obea ppliedin asi
milarmannerasabove1 0anysemiconductor
curre
nt-li
milin
gd evi
ces.A fl
erl es
ting，Ihesedevicesshallagain becheckedl o
rc on
lor
milyto
thecomponentmanulacturer'ss peci
ficati
on
auo
ωωω 。。︿

Fromagenericrangemanulacturedbyapar
lic
ulrmanulacturer，i
a tisnecessarytot
esto
nlya
repre
sen
tat
ivesample 01ap art
icul
arvo
lta
get odemonstratetheacce
plab
ilily01Ih
egeneric
range

COPYRIGHT
 70

10.9 Cablep
ullt
est

Thec
abl
epu
llt
ests
hal
lbec
arr
iedo
utasf
oll
ows
:

apply ate
nsil
ef orceofminimum value 30 N on t
hec
abl
eint
hed
ire
cti
ono
fth
e cable
entrancei
ntotheapparatusf
ort
hed ur
ationofatleas
t1h
;
although t
he cable sheath may be d
isp
lac
ed，no v
isi
ble displacement o
fth
eca
ble
terminat
ionss
hallbeobserved;
th
ist
ests
hal
ln otbeappli
edt
oin
div
idu
alconductorswhicha
repermanentlyconnectedand
dono
tformpar
to facable

10.10 Transformertests

Therequirementf orsafee l
ect
rica
lisol
ationiss a
tisf
iedifthetransformerpassest her o
utine
test，thetyp
et es
tdescribedbelowandsubsequentlywithstandsatestvoltage(see10.3)of2U
+ 1 000 V o r 1500 V，whichever istheg reater，between any winding
(s) used to supply
int
r i
nsi
cal
ly safe c
irc
uit
s and alloth
er windings，U being t h
eh i
ghestr atedvoltage of any
windingundert e
st

The i
npu
tvo
lta
gei
sse
ttot
her
ate
dvo
lta
geo
ftetransformer
h .The inputcurrentshall be
7I
o1，
adjustedupt n +1O~ ofthefuseo
rtot
hemaximumcontim
刷 sc
urr
entwhicht
hec
irc
uit
breakerwi
llc a
rryw it
houto per
ati
ngbyi ncrea
singthel o
adont hesecondarywi
ndings
.Where
theincreaseofl oadisiImitedbyreachingas ho
rtc i
rcu
iton a
l
lsecondarywindings，thetest
sha
ll proceed usin
gt h
er atedinpu
tv olta
ge and t
he maximum inpu
tc urre
ntreached under
(
ち

thesecondit
ions.
2zzazωZE官富山C E

Thetes
tshal
lc ontin
uef o
ratleas
t6ho ru
nti
lthenon-
res
ettingthermaltr
ipoper
ates
.Whena
se
lf-
res
ett
ingthermaltr
ipisused，th
ete
stper
iodsh
allbeextendedtoa tl
east12h.

Forty
pe1andt y
pe2a)transformers，thetransformerwindingtemperatures
hal
lno
texceedthe
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per
missi
blevaluefo
rt h
ec la
sso finsul
ationgiveni nIEC60085.Thewindingtemperatures
hal
l
d

bemeasuredinaccordancewith1 0.
2

Fort y
pe2 b
)transformerswhereinsulat
ionfrome a
rtho fthewindingsusedi nthein
trin
sical
ly
safe c
irc
uitisreq
uired，thent h
e requirementsha
l l be as above. However，i
fin
sul
ation from
earthisnotreq
uired，thent h
etransformers h
all beaccepted p rov
i d
ingthati
tdoesn o
tb urst
int
oflames

1
0.1 Opticali
1 sol
ato
rstests

1
0.1
1.1 General

Thef o
llow
ingt e
stssha
llbeperformedi fopti
caliso
lator
sa reusedtop
rov
i deisolat
ionbetween
in
tri
nsic
all
ysafe cir
cuits and n
on-in
trin
sic
allysafe c
irc
uit
s and ar
enot adequatelyprote
cted
agai
nstoverloadbyexternalprote
ctioncomponents(see8.9.2
).

Thesampless
hal
lsu
cce
ssf
ull
ycomplyw
ithb
otht
het
est
ssp
eci
fie
din1
0.1
1.2and1
0.1
1.3

1
0.1
1.2 Thermalconditioning，
die
lec
tri
candcarbonisationt
est

Themaximumtemperaturemeasureda ttherec
eivers
ideanda tthetransm
itte
rs idesh
allbe
determinedbyo verl
oadi
ngt hed
evic
es.Theseshal
lthenbesubjectedtothermalc o
ndi
tioni
ng
and dielec
tri
cs treng
tht e
sts
.A c arb
oni
sati
ont e
stshal
l then be conducted t
o check fo
r
formati
ono fint
ern
alcreepagepat
hs.

1
0.1
1.2
.1 Overloadt
esta
tthereceiverside

Thist
ests
hal
lbeconductedonf
ivesamples

COPYRIGHT
 7
1

TheI
ran
smi
tle
rsi
de0
1Ih
eop
lic
ali
sol
alo
rsh
allbeo
per
ale
dwi
lhI
her
ale
dlo
adv
alu
es(
e.g 目

r
l='N)'
Ther e
ceive
rs id
esh
allb
eo p
eraledw i
lhaspe
cil
icpower(e
.g.belweenco
llec
lorandemi
tler)，
whichsha
lln o
ldamageIhecomponenls.T
hisvalu
eshal
lbed elerm
inedeil
herbypre
limin
ar y
les
lsorlakenI r
omIh
edalashe
el

A
flerI he
rmalequili
bri
um has been reached，Ihe power s
hal
l be incr
eased
.A f
lerIher
mal
e
quili
briumhasbeenreachedagain，Ihepowers h
allbeincreas
edlurl
herinsleps，unl
ill
her
mal
eq
uilib
rium，and s
o on，unl
ilIher ece
iverse m
iconduclori
s damaged. Thi
sw i
lll er
min
aleor
d
rasl
ical
lyreduceIhepowerdi
ssipal
ion.

Themaximumsur
lacel e
mpera
lureoll
herece
ive
rsidej u
slbe
lor
eI hedamage0
1Ih
ere
cei
ver
sh
allber
ecor
dedloreachsamplelo
gelh
erw
ilhIheambientl
empera
lure

1
0.1
1.2
.2 Overloadt
esta
tthet
ran
s町、 i
tte
rsi
de

T
hist
esls
hal
lbec
ond
ucl
edo
nli
vesamples

Thereceive
rs i
deollheo
pli
cali
sol
ato
riso
per
ale
dalt
her
ale
dva
lue
s01v
olt
ageandc
urr
ent
(e
.g.VC_E''c
)

The Irans
mitl
ersid
es h
all be o
pera
tedwil
h aspe
cil
ic power，which s
hal
ln o
ldamage I
he
components.Thi
svalu
es h
alleilh
erbede
lermi
nedbyp r
elim
inar
yt es
tsorlake
nI r
omIh
edala
sheel
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A
fle
rI herma
le qu
ili
brim has been reached，t
u he power s
hal
l be i
ncre
ased
.A f
lerIher
mal
e
quil
ibriu
mhasbeenreachedagain，th
epowers h
allbeincreas
edlu
rlhe
rinstep
s，unl
ill
her
mal
e
quil
ibrim，ands
u oon，unl
ill
heI ra
nsmi
tlers e
miconduclo
risdamaged.Thiswi
llter
min
aleor
d
ras
tica
llyredu
ceIhepowerdis
sipal
ion

The maximum s
url
acetemp
eralu
re0 1theIran
smi
tle
rs id
ej u
stb el
oreI he damage 0
1Ih
e
tra
nsmi仕e
rsha
llberec
ord
edl o
reachsamplel
ogelh
erwil
hI h
eambienllemperature

1
0.1
1.2
.3 Thermalc
ond
iti
oni
ngandd
iel
ect
rics
tre
ngt
hte
st

A
II10samplesusedin10.
11.
2.1 and10
.11
.2.
2s h
allbepl
acedi
nanovenlr6 叫~ ha
o lIh
e
maximumsurl
acetem
per
alurerecord
edIro
m1 0
.11.
2.1or1
0.1
1.2
.2i
ncre
ase
db ya
llea
sl10K
bu
lalmosl15K.

Af
lerIheoplic
ali s
ola
lor
shaveco
ole
ddownto( )o
5土 2
2 ctheyshallbesubjecled10diel
ecl
ric
slr
eng
lhl estwil
hav oltag
e0 5kV(
11， a
.c.48Hz1062Hz
)a pp
lie dbelweeninlr
ins
ica
llysale
andnon-
in
川t
吐
1刷

a
ppl
iedl
or(
65士 5
)s

Dur
ingIhi
stel，I
s he
res h
allbenobreakdownollheins
ula
lio
n belweenI
her
ece
ive
randI
he
I
ransm
itl
erandIh
el ea
kagecur
ren
lsh
allnolexceed5r
rnA

1
0.1
1.2
.4 Carbonisationt
est

1
0.1
1.2
.4.
1 Receivers
ide
Us
ingIheliv
esamples0 11
0.11.
2.1，ad.c
.v oll
a g
e0 1"J
i75+
¥0
:'Vshallbeappliedlor30 +~ min
a
crossIh
el er
min
als(e.g
.coll
eclo
rande m
itte
r)0 1Ihei
f<i
i le
drecei
versemiconduclor，1
0l es
llhe
l
orma
tio
n0 1aninle
rna
lcreepagepalhcausedb yIhet曙 ale
dp l
asl
icmale
rial( c
arboni
sati
on)

D
uri
ngt
hel
ast5m
in0
1Ih
isl
esl，I
hec
urr
enls
hal
lno
l臨 ceed5mA.

COPYRIGHT
 72

1
0.1
1.2
.4.
2 Transmi!
terside

Usingt
hef
ivesamples0
110
.11
.2.
2，ad
.c.v
olt
age01375+
10
;'V s
hal
lbea
ppl
iedl
or30+
; min
。
acrosstheterm
inals01thelai
ledtra
nsmit
ter(e
.g.diod
e)，totes
tthel
orm
ati
on0
1ani
nte
rna
l
creepagepathcausedbytheheatedpl
ast
icmat
erial(
carbo
nisa
tion) ー

Duringthel
ast5min0
1th
ist
estt
hec
urr
ents
hal
lnotexceed5mA

1
0.1
1.3 Dielectricandshort-circuittest

1
0.1
1.3
.1 General

O
ptic
ali sol
ato
rss ha
ll be subjected t
oad ie
lect
ricstr
engthtet，l
s o
llow
ed by a sh
ort-
cir
cuit
cu
rrenttes
tandi lapplic
ablet ot hecurr
entli
miteds
horl
-ci
rcu
itc u
rrentte
stdescribedbelow，
l
ollowedbyad i
ele
ctricst
rengtht est
.

1
0.1
1.3
.2 Pre-testdielectric

Threenewsampless
hal
lbeusedl
ort
hist
est，w
ith ana
ddi
tio
nalt
hre l1
esamplesi 0
.11
.3.
4
appl
ies

P
rio
rtothes
hor
t-c
irc
uitc
urr
entt
ess，thesamples0
t 1theo
pti
cali
sol
ato
rsh
allbecapable0
1
withstandingw
ith
outbreakdowna d
iel
ect
rics
tre
ngt
hte
st014+
，
:
'kVrmsappliedbelweenthe
i
ntr
ins
ica
llysales
ideandt
hen
on-
int
rin
sic
all
ysales
ide0
1theo
pti
cali
sol
ato
r
(
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1
0.1
1.3
.3 Short.circuitcurrenttest

Threesamples0 1theo pt
icali s
ola
torshallbesubjectedtoas ho
rt-cir
cuitcurre
ntt e
st.Theopen
cir
cui
tv oltaα
:
;
:1
.e
.
.
. 0
.，
.
.1thete
~......st..
.
c"
i
rcut.
i .
.
s.
.
.
.
h
a.
.
.
l.
.
l.
~........~ .
.
.
b.
eU.
.
._
.
.
m.Thea v
........，~ai
labl
einstantaneouss hort
-cir
cuitcur
rent
capac
i y0
t 1thet e
stc i
rcui
ts hal
l bea tleast200A.Thet estcircu
its h
allbeconnectedt othe
opt
icalisolato rsot h
atthet estcur
rentIlowsthroughthenon-i
ntrin
sicall
ysales ide01theoptic
al
iso
lator
. Protective components or assembliesthatlorm paは 0 1the c i
rcu
ita rep er
mit
tedt o
remainconnectedl o
rt hetest
.

1
0.1
1.3
.4 Currentlimitedshort-circuitcurrenttest

Where o p
tic
al isolat
ors have prot
ectiv
es eri
es luses orc u
rre
nt-l
imiti
ngr e
sis
tos，t
r hree
add
itio
nalsamples0 1theo pt
icalisol
ato
rs hal
lbesubjectedt o1 7timesthenominalcurrent
，
ra
ting01theluse o r1 5timesthecalculateds
， ho
rt-
circ
uitcu
rrentthroughth
er es
ist
orunder
la
ultcond
itions，u
nti
ltemperaturesreachequilibri
um

1
0.1
1.3
.5 Dielectricstrengthtest

Eachsamples h
allwithstandwithoutbreakdowna d i
ele
ctr
ics t
rengt
ht e
st012U +1000V o r
1500V rms，whicheveri sgreatr，a
e pp
lied belweenthei n
tri
nsi
call
ysale s
ide andthe non-
in
tri
nsi
cal
lysalesie0
d 1theo p
tic
ali so
lat
orlor(65土 5)s.
Eo

During these t
eststheoptic
ali s
ola
tor
sshall notexplode o
rcatchfi
re throughoutthe s
hort-
-，臼Z4mhz-zo-uv弓h

ci
rcuitcurren
tt e
sts，andthecur
rentsha
llnotexceed1mAd uri
ngth
ediel
e c
tricstreng
thtests

1
0.1
2 Currentcarryingcapacityofi
nfa
lli
bleprintedc
irc
uitboardconnections
Thec ur
rentc ar
ryin
gcapacity01theconnectionsha
llbet est
edloratleast1hw it
hac ur
rent01
1，5timest hemaximumcontinuousc u
rrentwhichcanf lowintheconnectionundernormaland
la
ultconditi
on. Theappl
icatin0
o 1th
ist es
tc urr
entshould notcausethe connectiont
ol a
ilt
o
ahu

open
-circu
ito rtobeseparatedIromit
ss ubstr
ateatanyp o
int
oω的ω
00︿

COPYRIGHT
 73

11 Routineverificationsandtests

1
1.1 Routinetestsfordiodesafetybarriers

1
1.1
.1 Completedbarriers

Arouli
nele
slshal
lbec arriedouloneachcompleledb arrie
rt ocheckc o
r re
cloperaliono
feach
b
arri
ercomponenlandIher es
isla
nceo fanyfuse
.Theuseo fremovableiInks10allowIhi
sle
sl
s
hal
lbeacceplableprovidedIhalin
lri
nsicsa
fet
yi smainlainedwiththei
I nksremoved

1
1.1
.2 Diodesfor2-diode“
ia"barriers

ThevoltageacrossI h
ediodessha
llbemeasuredass
pec
ifi
edbyI
hei
rmanufacturera
lambienl
lemperalurebeforeanda
flerthefol
low
ingl
esls

) subjecleachdiodet
a oalemperalureo
f150'Cf
or2h
;
) subjecteachdiode1
b 0Ihepulsecurrenllesti
naccordancew
ilh10.8

11.2 Routinetestsfori
nfa
lli
bletransformers

For roul
inel e
sts，the vollages a
pplied1 0i n
fal
lib
le Iransformers s
hal
l conform t
o the values
n Table 10，where U i
given i sIhe highest r
atedvollage ofanywinding underl est
.Thelest
vollagesha
llbeappliedf oraperiodo fall e
asl60s
(

A
ltern
ativ
ely，Ihe l
est may be c
arr
iedo
uta
t 1，
2 times I
het
est vollage，bul w
ilh reduced
刀旦 CEazoz主 ℃OBCEω コ回 ωochrutωヒ30言。Eコ00口}NFDN00

dur
alionofallea
sl1s

Theappliedvollages ha
ll remain constantd uri
ngIhel e st
.The currenlflowingduringIhetest
sh
all nolincrease aboveI h
atwhich i s expected from Ihe design o
fthe circu
itand shal
l nol
exceed5m Ar .m.s.alanyl ime.

DuringIhesel
ess，Iheres
l hal
lbenobreakdowno
fthei
nsu
lal
ionbetweenwindingso
rbetween
anywindingandIhecoreorIhescreen

Table10-Routinetestvoltagesfori
nfa
lli
bleIransformers

Wherea
ppl
ied RMSt
estv
olt
age
M
ain
str
ans
for
m巴『 Non-mainst
ran
sfo
rme
r Trans
formerswith
bo
thp ri
maryand
s
econdarywindin
gs
i
nani n
trin
sic
all
y
saf
ec i
rcu
it
ロド NcoEEEω﹀吉一 O﹁臼Z4 的 抗 告z一

B
etw
eeni
npu
tan
dou
tpu
twi
ndi
ngs 4U o
r2500V， 2 U +1OOOVor1500V， 500V
w
hich
eve
rist
hegr
eat
er w
hich e
veri
sth
egre
ate
r
Bet
weena
llt
hew
ind
ing
san
dth
e 2U o
r10 0
0V， 2U o
r5 0
0V，w
hic
hev
eri
s 500V
c
oreorsc
ree
n w
hich
eve
risth
egr
eat
er t
hegre
ater
Bet
weeneac
hw in
dingwhich 2U+1OOOVor 2U o
r500V，w
hic
hev
eri
s 5
00V
s
uppli
esanin
tri
nsi
cal
lysaf
ec i
rc
ui
t 150
0V wh
1ic
hev
eri
s t
hegr
eat
er
a
nda nyo
the
ro u
tputwin
ding t
hegre
ate
r
Bet
weeneac
hi n
tri
nsi
cal
lys
afe 2 Uo
r 500V， 2Uo
r500V，w
hic
hev
eri
s 5
00V
c
ir
cui
twin
ding w
hich
everi
sth
egr
eat
er t
heg
rea
ter
oUV
毛 hD ℃ωωωω00︿

COPYRIGHT
 7
4

12 Marking

1
2.1 General

Int
rinsi
cal
lys a
f eapparatusandassociatedapparatussha
llcarrya
tleas
ttheminimummarking
speci
fiedinIEC6007ふ O .Thetex
to ft hewarningmarkings，whenap
plica
ble，s
hal
lbederived
fromt hetex
to fwarningmarkingtab
leo fIEC60079-0

Apparatusmeetingtherequirementsof5.4sh
all be markedwit
ht h
esymbol“i
c".Whereiti
s
necessary t
oi nc
lud
e marking from one oft h eo the
r methods o
fp ro
tec
tionlist
ed i
n
IEC60079-0，thesymbol“ic
"s h
alloccurf
ir
st

Forassociated apparatust
hesymbol Exia，Exi
borExi
c(o
riao
ribo
ric，i
fExi
salready
marked)shal
lbeenclosedi nsquareb
ra c
kets

NOTE1 A
IIr
ele
van
tpa
ram
ete
rss
hou
ldb
ema
rke
d，f
ore
xam
pJeum.
Lj，G
j，L
o.co
.wh
ere
verp
rac
tic
abl
e
NOTE 2 Stan
dar
dsy
mbo
lsf
orm
ark
inga
ndd
ocu
men
tat
iona
reg
ive
ninC
lau
se 3o
fth
iss
tan
dar
dan
din
IEC6
0079・0

Pra
cti
calcons
ide
ratio
nsmayre
str
icto
rprecludeth
euseofit
ali
cchar
act
erso
rofs
ubs
cri
pts，
andas i
mpl
ifi
edpre
senta
tinmaybeused，f
o orexampleUor
ath
erthanUo・

I
nth
ecaseo
fapparatusmeetingt
herequirementso
f6.
1.1
. )，
3a t
heI
Pra
tin
gsh
allbemarked
{司且EacozきちωECE 伺d

I
nt hecaseo fapparatus meetingtherequirementso f6.1.1.3c)，t h
ec er
tifi
cat
enumbersh
all
in
cludethe“X" suf
fixin accordancewitht he marking requirements o
fIEC60079-0 andthe
﹄

s
peci
ficcond
itionsofusel iste
dont h
ecertif
icateshal
ld e
tailtherequirements.

I
nthecaseo fapparatusn otmeetingtherequirementso f6 .3.13，th
ec er
tif
ica
tenumbersh
all
i
nclud
ethe"X"s uf
fixi n accordancewi
tht he marking requirements o
fIEC60079-0 andthe
s
pec
ificc
ond
itionsofusel is
tedont h
ecert
ifi
cat
es hallde
tailtherequirements
﹃ 回担
o t
h

Whereitisnecessarytoprotec
tt heapparatusfrome xterna
lp hysi
c a
limpactinordertoprevent
dO
亡。ヒコO芭ωEコ

theimpactenergyo f10.7exceedingthes pec

ifiedvalues，d et
ailso fth
erequirementss h
allbe
spe
cified asspec旧 1c
onditi
onsf orsafeuse andt hec e
rtifi
cate numbersha
lli nclud
et he“X"
su
ffixinaccordancewiththemarkingrequirementso fIEC60079-0andt hespec
ificc on
ditio
ns
ofuselistedonthecer
tifi
cat
es ha
lldeta
ilt herequirement
0 0口)NFONoω

For apparatus complying w

ithth fAnnex G，each piece o
e requirements o fapparatus s
hal
l
add
itional
lybe markedw iththeword “ FISCO"f ollo
wed by an i
ndi
cat
ionofit
sf u
nctin，.
o ie
powersupply，fielddeviceorter
minator
ロド刊

Where apparatus i
sd ual marked so t
hatit can be used i
n both a FISCO system and a
COOL2co﹀MEO守臼Z﹂ω弘幸zo-ux寸hahuoωωω00︿

conve
ntio
nali nt
rin
sic
alysafesystem，c
l aresha
l lbetakent odif
fere
ntia
tebetweent heFISCO
markingandt h
emarkingf o
rt heco
nv e
ntion
alintri
nsi
cal
lysafesystem

I
nt he case o
fFISCO power s
upplies，ou
tptparameters Uo'1
u 0，Co'Lo，Po and LolRo and
FISCOf ie
lddeviceso
rte
rmin
ators，i
np u
tandint
ern
alparametersUj，I
j，Cj
，Lj，P
jandL f
;Rjneed
no
tbemarked.

1
2.2 Markingofconnectionf
aci
lit
ies

Connection f
acil
itis，t
e erm
inal boxes，plugs and sockets ofint
rin
sica
llysafe apparatus and
associatedapparatussh
allbec lea
rlymarkedands hallbec le
arlyid
entif
iabl
e.Whereac olour
i
susedf ort
hispurpose，i
ts h
allbel i
ghtb
lueforthei nt
rins
ica
llysafeconnections

COPYRIGHT
 75

Where parts ofan apparatus or di

ffere
ntpieces ofapparatus are interconnected using plugs
and sockets，these plugs and sockets sh
all be i
den
tifi
ed as containing onlyintr
insical
lysafe
ci
rcu
its.Whereacolouri susedf ort h
ispurpose，itsh
allbel i
ghtblue

In addition，s
uff
icien
tandadequate markings
hal
l beprovidedt
oensurecorrectconnectionf
or
thecontinuedi ntr
ins
icsafetyofthewhole

NOTE I
t may be nec
ess
arytoincl
udeadd
iti
onall
abe
ls，fo
rexamp[e on o
rad
jac
entt
opl
ugsand s
ock
ets，t
o
ac
hie
vet
hi
s.Ifcla
rit
yofint
ent
ioni
smain
tai
ned，th
eappa
ratu
sl a
belr
naysuf
fic
e

12.3 Warningmarkings

Where any of the following warning markings are required on the apparatus，the text as
described in Table 11，following the word "WARNING， " may be replaced by technically
equivalenttext
.Multiplewarningsmaybecombinedintooneequivalentwarning

Table11-Textofwarningmarkings

I
tem Reference WARNINGMarking
a
) 7.
4.
1 WARNJNG-USEQNLYYYYYYBATTERJES(Wh
ereYi
sth
ece
llm
anu
fac
tur
ersnamea
nd
te旬p
h enumbero
fth
ece
llo
rba
tte叩
).
b
) 4.
7. 8 WARNING-DONOTREPLACEBATTERYWHENANEXPLOSIVEATMOSPHEREI
S
PRESENT
c
) 4.
7. 9 WARNING- DONOTCHARGETHE島ATTERYI
NHAZARDOUSLOCATION
{
UOH

d
) 7.
4.8 WARNING-DONOTOPENWHENANEXPLOSIVEATMOSPHEREI
SPRESENT
Ea﹄zoz言明uωECEmuコ

12.4 Examplesofmarking

Thefollowingareexamplesofmarking
回担ochoco

a
) Self-containedintrinsicallysafeapparatus
ヒ
コozoEコ

C TOMELTD
PAGINGRECEIVERTYPE3
0 0口)NFDN00

Exi
aII
CT4
"Ta豆 +500C
-25oc'
IECExExCB0
4."
'**
*
ロド NE02コ芭ω﹀芭E 勺 臼ZJmEEo UUL勺ha宮古ω000︿

S
eri
alNo.XXXX

b
) I
ntr
ins
ica
llysafeapparatusdesignedtobeconnectedt
ootherapparatus

M HULOT
TRANSDUCTEURTYPE12
Exi
bII
BT4
一

AC8No:Ex05****
L
j:10μH C
j:1200pF
U
i:28V l
i
:250mA
P
;:1，
3W

COPYRIGHT
 76

c
) Associatedapparatus

JSCHMIDTA
.G
STROMVERSORGUNGTYP4
[
Exi
b]1
ACBN
o:E
x05
***
*
Um:250V P
o:0，
9W
0:1
1 50mA Uo:24V
L
o:20mH Co:4，
6μF

d
) AssociatedapparatusprotectedbyaIlameproolenclosure

PIZZAELECT.SpA
Exd[
ia
]11
8丁目
ACBN
o:E
x05
***
*
Um:250V P
o:0，
9W
Uo:36V 0:1
1 00mA
Co:0，
31μF L
o: 15mH
(
EV

S
eri
alN
o.XXXX
C
Eaz
ez言EBEE雪

e
)In
tri
nsi
cal
lysaleapparatusLevel01P
rot
ect
ion“
ic"

M HULOT
国 MEEtωt22EEコ00口)NENoωロ

TRANSDUCTEURTYPE12A
Exi
c11
8T4
AC8N
o:Ex05 帥 帥

U
j:28V Ci~ 0

町 IntrinsicallysaleapparatusLevel01Protection'
ib
'wi
th'
ia
'outputs

PRAHAELECT
ドNZOEコ官@﹀王O 勺 白Z﹂旦￡zo-UX 勺EZEBU︿

Exi
b[i
aII
C 旧 T6
]1
ACBN
o:E
x09
***
*
U
j:30V Uo:5.6V
j: 9
I 3mA P
o:0.014凶l
L
i:0
.01 mH 0:1
1 0mA
Cj:0.031μF L
o:0.15mH
S
eri
alN
o.XXXX Co:35uF

whereACBrepresentsthei
nit
ial
s01thecer
!il
yigbody，asapplicable
n

COPYRIGHT
 77

13 Documentation

The documentationsha
lli n
clud
et h
ei ns
truc
tio
nsrequir
ed bytheinst
ruc
tio
ns requirements o
f
IEC60079-0，ands ha
lli n
cludethefo
llo
winginfo
rma
tio
nasa p
plic
abl
e

a
)el
ect
ric
alparametersf
ort
hee
nti
tyconcept
) power sources: output data such as Uo，1
1 0，Po and，i
fap
pli
cab
le，Co，Lo a
nd/
or the
permissibleLolRorati
o;
2
) powerr
ece
ive
rs:i
npu j，
tdatasuchasU ，
;
1 Pj，Cj，LjandtheL
jlR
jra
tio
;
) anys
b pec
ialrequirementsf
ori
nst
all
ati
on，l
ivemaintenanceandu
se;

NOTE A co
ntr
old r
awingis a recommended f
ormo
fco
nso
lid
ati
ngc
onn
ect
ioni
nfo
rma
tio
nan
dsp
eci
al
re
qui
rem
ent
sforin
sta
lla
tio
nanduse
c
) the maximum value of Um which may be a
ppl
iedt
ote
rmi
nal
sofn
on-
int
rin
sic
all
y safe
c
ircu
itsorassociatedapparatus;
d
) any spe
cialc o
ndi
tions which are assumed i
n determining the type o
fp rotec
tin，f
o or
examplethatthevol
tageistobesuppliedfromap rot
ectivetransformerorthroughadiode
saf
etybarr
ier
;
) conformanceo
e rnon-conformancew
ith6
.3.
13;
η the designation of the surfaces o
f any enclosure o
nlyi
n circumstances where t
hisi
s
r
elevantt ointri
nsi
cs afe
ty;
g
) theenvironmentalconditionsf
orwhicht
heapparatusi
ssu
ita
ble
;
(USE-

) I
h fAnnexF has been appl
ied，the documentation s
hal
lst
atet
he ambientp
oll
uti
on degree
andovervoltagec
ate
gor
y.
﹄aEOZ主 UOOWCEEd四百 Ehotωヒ
コ U官。E コ00口)NFDNoo
ロド NZOω﹄コ芭 ω﹀苫5 ﹁白ZJωZ
、EE-uv﹃ hahuoωω000︿

COPYRIGHT
 7
8

AnnexA
(normative)

Assessmentofintrinsicallysafecircuits

A.1 Basiccriteria

Ani
ntr
ins
ica
llysalec
irc
uits
hal
lsa
tis
fythreebasicc
rit
eri
a

) no spark i
a g
niti
ons hallres
ult when the c
irc
ui s tested，o
ti r assessed as required by
Clause 10lorthes pec
ifi
edl e
vel01pr
o t
ecti
on(seeClause5)andgrouping(seeClause4 )
01ele
ctric
alapparatus;
b
) the temperature c l
assil
icati
on 01i ntr
insi
cally sale apparatus sha
ll be ca
rried out in
accordance with5 .6 and thetemperatures requirements 0
1IEC60079-0 so ast o ensure
tha
ti gnit
ionis not caused by hotsurlaces. Temperature class
ili
catio
nsha
ll not applyto
associatedapparatus;
) thec
c irc
uits
hal
lbeadequatelyseparatedIromotherc
irc
uit
s

NOTE 1 Cri
ter
iona ) may besa
tis
fie
db y assessmen.
tInfo
rmati
onr el
ati
ngtov o
ltag
e，c
urr
entandci
rc
ui
t
pa
rame
terssuchasc apac
itan
ceandindu
ctan
ceatt hebou
nda
ryf o
ri g
nit
ioni
sn e
ces
sary
.Theci
rc
uitc
anth
enbe
ass
essedasin
tri
nsi
cal
lysafei
nre
gardtospa
rkigni
tio
n
(

NOTE 2 C r
ite
rio
nb) may b
esati
sfi
edb
yes
tim
atingthe maximum s
urfa
cet
emp
erat
ureso
fcomponentsfr
om
刀25haEω ￡ 書 官ω

know
ledgeo fthe
irther
malbeh
aviou
randt
he maximum powertow hi
chth
ey may b
esubj
ect
edu nderth
e
ap
propr
iat
ef a
ul
tcond
iti
ons

NOTE3 Cr
ite
rio
nc)maybesa
tis
fie
dbythepr
ovi
sio
nofade
quatecr
eepaged istancesa n
dc Je
ara
nce
s，a
ndb
yth
e
us
eofco
mponentsc
onf
orm
ingt
oC la
use8，f
orexa
mpletr
ans
for
mersandcurrent~limiting r
esi
sto
rs
旦 ZEmコ四百 thocmωヒ30HCOE200口)NFDNOωロ

A.2 Assessmentusingreferencecurvesandtables

Wherethec irc
uittobeassessedl o
ri gn
iti
onc apa
b i
lityapproximatestothesimplec irc
uitIrom
s derived，Figures A.1 t
which the curve i o A.6 or Tables A
.1 and A.2 s
hal
l be used i n the
assessment. The l au
lt conditions i
n accordance w ith Clause 5 and the salety l
actorsi n
accordancew ith10.1.4.
2s ha
llalsobetakeni n
toaccount

Generally，thel
oll
owi
ngprocedures
hal
lbea
ppl
ied
:

determine the worst p

racti
calsitu
ati
on taking account 01 component tolerances，supply
voltageva
riations，in
sulat
ionlau
ltsandcomponentl aul
ts;
ド NZOω﹄コ芭 ω﹀芭=。﹁白 ZJmhzEOUXdhn 刀剣出ωω00︿

thenapplytheappropriatesalelylac
tors，whichdependonthetype01c i
rcui
t(see10.1.4.
2)
asw el
l asonthel evel01p rot
ecti
on01thee l
ect
ric
al apparatus(seeClause5)，i
n orderto
deriveacir
cui
ttobesubjectedt oassessment;
then check that the parameters 01the r
esu
lta
ntcirc
uit are acceptable according t
o the
relerencecurvesi nFiguresA.1toA.6oraccordingt
oTablesA.1 andA.2.

The c
irc
uitderivedlorassessmentpurposes maybetested usingthespark-testapparatus i
l
te
sti
ngisprelerredt
oassessment

NOTE Thei nf
ormationp ro
videdinFigure
sA .
1t oA.6andT ab
lesA .
1a n
dA .2rela
tesonlytosimplecircuitsa n dti
一

mayb edif
fi
cul
tinsomec asestoapplytheinfo
rmati
ontothed es
igno fpra
ctic
a[circ
uit
s.F o
re xampl
e，manyp ow er
sup
plie
sh ave non~linear outp
utc har
acte
rist
icsa nda r
en ota ssessabJef ro
mt her efere
ncec urvesb e cau se
Fig
ureA.1c anonlyb eu sedwhent h
ec i
rcu
itcanb erepres
entedb yac e
llorb at
teryandas e
riescurrent~limiting
﹃

re
sis
tor
.B ecauseoft hi
s，n on-
line
arcirc
uit
s，forexampleconstan
tc urr
entcirc
uit
s，wi]g
J ive泊n it
ionatl owerv al ues
ofcur
rentthanwouldb ep redic
tedf r
om円g ureA.1o nthebasisofopen-c
ircu
itv o
ltageands h
ort-
cir
cuitc urrent.I n
some type
so fn o
n-linearc i
rcu
it，the maximum permi
ttedc u
rrent may beo nl
yo ne
-fif
tho ftha
tp redict edf rom
ref
erenc
ec ur
ves.Gre atc ar
eist h
erefo
ren eededtoensur
et h
ata ssessmentsaremadeo nlywhent hec i
rcuitu n der
con
sider
ationcan，f o
rp r
acti
calp u
rposes，ber epre
sente
db yo neo fthes im
plec i
rcui
tsforw h
ichi nform ationi s

COPYRIGHT
 79

p
rovi
ded.Theinf
orm
atio
nav
ail
abl
eisl
imi
teda
ndc
ann
otc
ove
raJt
l h
ede
tai
ledp
rob
lem
sth
ata
ris
eint
hed
esi
gno
f
i
ntr
ins
ica
llys
afec
irc
uit
s

A.3 Examplesofsimplecircuits

a
) Simplei
ndu
cti
vec
irc
uit
Toi l
lus
tra
tet h
e procedure i
n moredet
ail，considera cir
cui
tforGroup IICc on
sist
ing ofa
powersupplycomprising a 20V bat
terywith as uit
abl
y mounted i
nfa
lli
ble 300 Q cu
rrent
i
Imit
ingresis
torfeedinginoa1100Q，100mHi
t ndu
ctorasshowninFigureA .7.
The300Q and1100Q valuesareminimumvaluesand100mHi samaximumv alu
e.Two
separateassessmentsare made: oneto ensureth
atthepowersupplyits
elfisin
trin
sic
all
y
safeandt h
eo th
ertotakeaccounto fth
ee ffec
toftheconnectedloadasf
ollow
s.
1
) Powersupply
Thestepsi
nth
eassessmenta
rethef
oll
owi
ng
The value ofthe c u
rrent-l
imiti
ngr e
sistoris quoted as 300 Q minimum and t h
is
represents t
he worst sit
uatio
n as fa
r as the res
i s
toris concerned. I
fthisresist
or
doesnotconformt otherequirementsf ori
nfa
lli
bil
ity(see8.5)，applic
ationofas i
ngle
fau
lt(seeClause5 )wouldproduceamodifiedc i
rcuiti
nwhicht heresi
storwouldbe
assumed t o be sh
ort-c
ircuite
d. With such a f
ault，the power supplywould not be
int
rinsi
call
ysafe
I
ti sa ls
o necessary t
o determine a maximum value f
or the b
att
eryvolta
gei
n
accordancewih7.
t 4.
4.Assumethemaximumba壮eryvoltagederivedi s22V.
(UBEzacozB百WOVCE回コ田副ozhO亡ωとコozoEコωo白)NF N00口 hNZOE3官。﹀吉一O可臼ZJωhASzo一口出司、E 百出ωω00︿

Themaximums
hor
t-c
irc
uitc
urr
en s22/300=73，
ti 3mA.
Since the c
irc
uitisr
esi
stive，a
pplic
atio
no f the requirements o
f Clause 5 and
10.1.
4.2giveriset
oamodifiedc
irc
uitinwhichthes ho
rt-ci
rcuitcur
rentisincreased
to1，5x73，3=110mA.
i
i
i) FromTableA .1，i
tcanbeseent hat，f
orGroupI
IC，theminimumign
iti
ngc
urr
entfor
ares
isti
vec i
rcui
tat22V i s337mA.Thepowersupplycant he
ref
orebeassessed
asin
tri
nsic
all
ysafeinregardtosparkign
iti
on
2
) Connectiono
flo
ad
Thestepsi
nth
eassessmenta
reasf
oll
ows
The maximum b att
ery voltage i
s 22 V. Since 300 Q and 1 100 Q are minimum
values，themaximump ossiblec u
rrentinthel oa
di s22/(300+ 1100)=15， 7mA.No
fau
ltsneedt obeappli
edsincethe300Q r esi
storisin
fall
ibl
eands ho
rt-
cir
cuitfa
ilu
re
ofthei nd
uct
orleadstothec irc
uitconsideredabove.
。

A
pplic
ationo ftherequirements o
fClause 5and 10
.1.4.
2requ
ire
sth
at，f
oras
afe
ty
f
act
oro f1，5，thecur
rentinthec ir
cui
tbeincreasedto1，5x15，
7 23， =
6mA
i
i
i o Figure A.
) Reference t 4f o
r Group II
C shows t
hat，fo
r a 100 mH in
ductor，the
minimumi gn
itin
gc ur
rentforasourceo f24V is28mA.Thec ir
cui
tcantheref
o r
ebe
assessedasi n
trin
sic
allysafeinregardt
osparkign
itio
nforGroupIICa
pplic
ations

NOTE1 F
oro
pen
-ci
rcu
itv
olt
age
ssi
gni
fic
ant
lyb
elo
w24V，F
igu
reA
.6s
hou
ldb
eus
ed

NOTE2 Thea b
ovea ss
essmentassumesthatthein
duct
orisair
-co
red.I
fthein
duc
torisnotair
-co
red，suc
h
asse
ssment
sc anber eg
ardedaso n
[ya p
proxim
ateandtiisneces
sarytotes
ttheci
rcui
twiththespa
rk-
tes
t
ap
paratu
s( A
nnexB)inorde
rtoe s
tab
lishwhet
herornott
i旧 int
ri
nsi
cal
lysa
fe.Inp
rac
tice，i
fth
ea sse
ssmenti
s
base
do nam easur
edi nd
uctan
cev a
lue，theact
ualminimumign
iti
ngcurr
entisu
sua
lly，aJt
houg
hn o
ta lw
ays，
gr
eate
rthantheasses
sedvalue
) Simplec
b apa
cit
ivec
irc
uit
Considernowt hecirc
uitofFigureA.8whichisintendedf rGroup1a
o ppl
ica
t旧 n
.Itc ons
ists
ofa30V b atteryconnectedtoa10μFcapacitorthroughas ui
tabl
ymountedi n
fal
lib
le10kQ
res
istor
. For the purpose ofths example，the values o
i f 30 V and 10μF are taken as
maximumvalues，and10kQasaminimumvalue

COPYRIGHT
 8
0

Two separale assessmenls are made: one 10 ensure Ihat Ihe power supply i
lse
lfi
s
in
lri
nsi
call
ysafeandtheolher10lakeaccounlofIhepresenceofIhecapacilor
1
) Powersupply

Since the procedure is almosl exactlyIhal described i

na)1)，no detail need be given
The power supply c i
rcuil alone can be readily assessed as being i
ntrins
ica
lly safe i
n
regard10sparki g
nil
ionwilha safelyfaclorexceeding 100.
2) Capacilor

Theslepsi
nIheassessmenlareasfollows

The maximumbatteryvollagei s30V，and10μFi sthemaximum capacilancevalue

No faults are appliedsinceIhe 10 kQresislori
sinfa
llib
le and eithershorl-circuilor
open-circuitfailureofIhecapacilorgivesr
ise10Ihecirc
uilconsideredi n b) 1)
) Applicalion ofthe requiremenls ofClause 5 and 10.1.
i
i 4.2requiresIhal，fora safety
faclorof1，5，Ihevollagebeincreasedt o. 5 x 30V=45V
1， .
i
ii
) Reference 10 Figure A.2 for Group Ishows Ihal al 45 V Ihe minimum value of
capacitance10 give i
gnil
ionis only3μF and al30V only 7，2μF，so IhalIhe cir
cuit
cannolbeassessedasi nlr
insica
llysafe

NOTE 3 To modifyt hecir

cuit50t ha
tit may beassessed as b eingintr
ins
ica
rrys afe，ther
ea resever
a l
po
ssib
ilit
ies.Thec i
rcu
itvoltageorcapacitancevaJuesc ouldbereduced，o rani nf
all
ibleresist
orco
uldbe
in
sertedins eri
esw it
ht he 10μF c ap
acito
r. Reference toF ig
ure A.2 shows th
att he minimum ig
niti
ng
vo
ltagef o
r10μFi s26V，50t hatthebaUeryv o
lta g
ewouldhavet obereducedt o26 パ， 5= 17，3v i
fth e
valu
eo f10μFweret obe m ainta
ined.Altern
atively，thecapa
citanceva[ u
ec ou
ldbereducedt o3μF，o r，
sine 10μF+5，
c 6ng ive
sami川 mumi gni
tingv o
lt ageof48V，i ns
erti
ono fani nf
alib
J leresist
orhavi
nga
minimumvalueo f5，6ni ns eri
esw i
tht h
ec apacit
orwoulda lsoproduceac ir
cui
twhichc oul
dbeassessed
{司

asintri
nsi
call
ysafeasr egardssparkigni
tio
nf orGroupI
﹄
一
o
wEazωzs宮古吉E

NOTE 4 One problem i gn

oredi nt he above discus
sioni st h
at，stri
ctl
yspeaking，t he minimum i g
niti
ng
volta
ge curves forcapacit
ivec ir
cuitsinF igures A.2 and A.3 re[
atet o a charged capa
c i
torn otd i
rect
ly
connectedtoapowers u
pply.Inp ract
ice，providedthepowers upp
lyconsideredbyi ts
e[fhasal a
r g
es af
ety
fac
tor，asi ntheaboveexample，t h
er eferenc
ecurvescanbea pplie
d.If，however，t hepowers upp[yalone
has only a minimum safetyf a
ctor，interconn
ectingitw i
tha c apaci
torcan l ea
dt oa s i
tuati
onwheret he
ci
rcui
ti snoti nt
rins
ical
lys af
e eventhoughi ntr
insicsafetymaybei n
ferred from F
iguresA.2 andA .3.ln
general，such cir
cuit
scannotbe r eli
abl
yassessed i nt he mannerd escrib
ed aboveand s hould bet e
sted
伺﹃四日

withthesparkt e
stapparatus( seeAnnexB)
o
z
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ωo口)
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NOω 白hNcoE2co﹀剖EO可 臼Z﹂ω﹀
gzo UX可ha百出ωoood

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393
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InductanceL(
H)

2 Minimumi
gni
tin
gcu
rre
ntI(
A)

NOTE1 Thec
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uitt
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NOTE2 Theenergyl
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FigureA.4-InductivecircuitsofGroup1
1

COPYRIGHT
 85

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① IEC 1394AJ6
u
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Key
三DEE000︿

1 InductanceL(mH)
2 Minimumi
gni
tin
gcu
rre
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A)
NOTE1 Thecu刊 escorrespondt
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ecurve

FigureA，
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COPYRIGHT
 8
6

100

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① IEC 1395106

Key

InductanceL(mH)
h￡zo-uv﹃hD宮古mouod

2 MinImumi
gni
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gcu
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NOTE2 Theenergyl
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FigureA.6-GroupIIC inductivecircuits

COPYRIGHT
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 88

TableA.1 - Permittedshor
!.circuitcurrentcorresponding
tothevoltageandtheEquipmentGroup

Permittedshort-circuitcurrent
mA

Voltage forGroupI IC f
orGroupI IB forGroup1 1A forGroupI
apparatus apparatus apparatus apparatus

V withafactorofsafety
01 f。
withafactorofsafety
。
withafactorofsafety
f
withafactorof
safetyof

x1 x1，
5 x1 x1，
5 x1 x1，
5 x1 x1，
5
12
。
。
。 3
120 3
460 2
210 z
261
3
397
870
0
25
7
~， 8 3
2
15
37
0
~， 9 3
3
3
32
5
30
8
1
92
6
7口
0
7
0
2020
13 191口
120 181
080 720
~ 450
~ 320 5000
(BHCcaco工芸BOWCE

210 ↓860
090 720
9
899
0 ↓5
485
0
0

1800 330
1750 210
1700
i0
998
0
0
1650
。 ，
雪

14，4 1600 1
70 80
国 wOEEtωLEO言。E コ

14.5 1550 日 '

60 510
146 1510 1010 ，60 2440
14 470 980 >
60 2380
14 SU
4: 950 3470 5000 3330
390 930 3380 Z
22
32
19
15
0
0 4860 3240
3bO 900 3290 4730 3150
310 875 3200 2 140 4600 3070
2t
lU 851 3120 2 J80 4480 2990
ωo口 ) 刊EN00

1 240 828 3040 )30 91

1
4
432
650
>，
4 210 806 2960 980 ~ 830
，>5 920 ↓140
1
111
850
0 }
l6
76
90
0
，)6 880 030
.7 1
ロド NEOEコ主ω

8
738
0
0
，)8
15.9
1090
1
00
63
00
2 。 1740
}
}
』89
7
22
20
0 2
22
65
42
58
0
0

。
。
。
16 1 6
6
70
86
9
7
5 2550 1700 1630 2420 3330
16 1UUU 2480 1660 3540 2360 3220
652 2420 3450 300
。 3110
﹀王 O勺白Z﹂旦長官-

9
985
0
0
93
910
636
620
604
2360
2311
2250
3360
3
322
800
，
!1 0
30
4
4
4
44
8
64
3
2
69
3
24
0
0 2990
2
288
830
0
16.
6 81 589 2200 1470 3120 2080 2770
4
401
680
0
16 8E 575 2150 1430 3040 2030 2720
16 84 560 210日 1400 ~ 970 4000 ~ 670
16 8: 547 2050 1370 2900 1
11
99
88
39
0
0 3740 2490
u

800 533 2000 1340 2B3U ~ 4

1:m 2320
v弓haEBBud

17.1 780 523 960 1310 2760 1840 3450 2300

17，2 770 513 930 1280 2700 1800 3420 2280
17.3 750
8
89
50
1260 ，
30 1760
3
396
0
0
2260
17，4 74 5
4
40
98
3
4 1240 1720 2240
17，5 73U 820 1210 510
~ 1680 320 2210

、
17.6
7.7
710
700
475
466
790
750
1190
1170
50
↓
2400
1640
1600
30日
3260
2200
2170

COPYRIGHT
 8
9

TableA.1 (
con
lin
ued
)
Permittedshort-circuitcurrent
mA

Voltage forGroupI IC forGroup1 18 forGroupI IA forGroup1

apparatus apparatus apparatus apparatus

V withafactorofsafety withafactorofsafety withafactorofsafety withafactorofsafety

01 01 01 01

x1 x1，
5 x1 x1，
5 x1 x1，
5 x1 x1，
5
，
8 4
: 1720 1150 3230 2150
6
697
0
0 1
15
56
30
0
，
9 '1
4 8 1690 130 2
2
22
32
9
44
0
0 3200 2130
660 1660 1110 3170 2111
1
14
49
50
9
648 41 2 1630 087 2188 3083 2055
8，
2 636 24
↓ 1601 1068 2139
8，
3 625 417 1573 049 1
1
14
33
6
29
3
4
6 3
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28
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0
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4 613 409 545 030
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309
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167 228 17 1
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361 1368 1812 208 2465
355 1345 784 189 2444 [629
523 348 1323 882 55 1170 2423 1615

9，5 。
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342
337
1301
1279
867 1152
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586
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14fS 986 2Uo4 [369
1457 971 2000 [333
120 281 1069 1435 957 1924
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387 989 659 133 889 [603 069
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4 369 6
↓ 945 630 76 851 [544 )29
364 930 620 1 839 1525 1017
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，
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09
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4
32 [20 804 141市 977，3
342 228 8/6 18~ 792 1446 964

，
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5
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3 21 8 543 [109
312 20 802 535 1
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7
6
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3 '9日 13 4 22 121 807，
3
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1 !87 19 36 491 672 1185
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2 !84 19 26 484 9
9
10
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6 '2 182 37 458 944 629 1079 719，
3

COPYRIGHT
 90

TableA.1 (
con
lin
ued
)
Permittedshort-circuitcurrent
mA

Voltage forGroupI IC forGroup1 16 forGroupI IA f

orGroupI
apparatus apparatus apparatus apparatus

V withafactorofsafety withafactorofsafety withafactorofsafety withafactorofsafety

01 f 。 01 01

x1 x1，
5 x1 x1，
5 x1 x1，
5 x1 5
x1，
2.7 180 167 1452 932 62 1073 715.3
1
.8 唱7" 1668 4A
.!
"
i Qフ
れ 613 1068 712
176 659 1439 908 605 1062 '08
つ
i主.
主 つF 17. !4.
650 1433 896 597 1057 日
2f 173 644 429 885 1048 698，
2
2
441
1
2
， 5
598
2
0
71 631
' 42 873 1040 693
フz 1fi
Q I631 575
8
86
52
i
22企
4
4
1
1土
5
3 2 167 I625 568 6
6
68
87
2
8
7，7
3
18 161 I618 841 561
24，
6 1
6ι 612 554 672
1
4 606 547
6 54口 1
91 2
66盟
6
562
5
7
3
，L

"
' 5
5
396
393
8
79
00
5
5
52
23
0
7
3
983
975 6
日

ワ
'
2"
5.2 2
156
155
5
578
389
385
780
77 514
964
953
7
' ，
6
3
，
つ
'
2
宍
"
'
152
日万
1567
38
378
762
752 ￨
15
54
09
0
6
82
942
93
(32czac@ SEBCE伺

5 50 156 1374 743 920

フ 149 1556 371 734 916 6

屡
I2~ 148 155 367 726 912 608
、

1-546
工

フ 146 717 3
605，
2 145 市耳: 708 602，
7
26 15 1536 700
26.1 13 53 694

.
.
6
5
59
80
3
0
71
13
3
フ白フ
市5訂 '9
コ20ZEto

26 滝6吉
8言
8

.
.
26，
3 )9 55 580，7
4
26， フr 1516 67 451 574，7
8
865
3
2
5
26， 2C 1512 67 447 56日
15白
子 444 564，
2
EE 3
333
5
8 6
66
60
6
ヒ
コGZωEコ

1502 440 84 56日

1332 655 437 835 556，
13 329 649 433 329 55
。
旬 131 19 326 644 429 824 549，3
uo口 ) 刊EN00

1 10 13C 15 323 426 818 i

，3
6
633
4
9
27，2 193 128 148C 32C 813
27，3 127 1'476 I629 し7
27.4 126 1472 I624 ，)3
1468 1619 532
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1464 1614

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146C ::
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33 1456 304 1403 33 152
庁玉可 日而
?1 「瓦百ヲ
民
喜 1399 778 518， 7

1，1
L2
18
11
1
19
18
448
444
44
299
296
293
590
1585
ヨ
3 773
768
764
515，
51
1509，
3

3
3
398
7
0
28.3 1
1 117 43E 29 58 76C 506， 7
ヲ" 4 1576 384 1504
2
2
88
28 1572 38 15( ， 3
「亘面子 378 1498
18 1563 375 1495， 3

29
116
16
16 1
1
12 118
115
41
「訂面
重 1372
370
367
7
7
73
33
5
9
1
49~， 7

4
498
7
013
163 408 364 485，
3
16 405 361 7
7
72
22
4
6
8 484
1
f
毛 401 268 7
482，
15 398 265 3
3
35
55
3
6
8 722 481，
3
1
.5 15 105 395 263 530 720 480

COPYRIGHT
 9
1

TableA.1 (
con
lin
ued
)
Permittedshort-circuitcurrent
mA

Voltage forGroupI IC forGroup1 18 forGroupI IA forGroupI

apparatus apparatus apparatus apparatus

V withafactorofsafety withafactorofsafety withafactorofsafety witha factorofsafety

01 01 01 01

x1 x1，
5 x1 x1，
5 x1 x1，
5 x1 x1，
5
10 261 526 351 718 1
3
398
8
2
10 522 348 716 .
3
10 385 2
Z
25
55
5
7
9 518 345 714
10 382 514 343 712
30 152 10 379 253 j10 340 173.3
，2 149 15
， 373 249 503 335 7
6
69
71
0
1 46 口
)4
， 147 9
， 367 245 496 330 44i， 3
)6
， 145 362 241 326 652 434
1
，8 142 8
， 356 231 32 1636 424
31 14口 93， 35口 2
233
0
3
I621
31，2 138 92， 345 614 .
09，3
3 17 339 462 607 .0
4.7

3
334
::S2~
455
449 。600
92
oc

87， 324 442 2

2
29
99
5
1
9 584 三
3弘
3
88
91
1
1之3
2
3， 130 86， 319 213 436 572
!
，4 29 315 210 431 287 560 373，
3
1
2，6 127 7 31 207 425 283 548 365，
3
(EMEEEω

，
1
2，8 305 279 536 357，
3
2
200
1
4
1
3 3口 276 350
198 27: 1
195 268 3
，
工言EBCE伺コ回ω

3 79~ 2
2
2
22
8
8
89
0
4
8
9
7
2
1
19
89
2 3
399
3
8 2
266
2
5
78， 1505
78 259
3
388
9
4
77， 27
274
75， 27 376
ozEtoと3

3 112 74， 372

368 245 4
4
46
55
0
4 1
3，3
，2 109 2
2
2
22
6
6
66
5
8
3
6
9
0 175 364 242 300
0芭ωEU

，4 174 360 240 297，3

人6 4
， 172 356 237 294，7
8
。 255 170 352 235 292
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253 168 348 z 289，3

口 2，
)NFON00白hN O

59， 25 167 345 287，3

68， 248 165 341 2
: 286
3 1
1 6 245 164 337 426
oc 66， 243 162 334 2
: 424 三
2
2笠
88
1
4乙
，3
99 2
， 241 160 330 ~20 422
，2 98 6!，
6 238 159 327 218 419 279，
3
にE

'4
， 91 6 9
'， 23E
，
" 324 216 417 2f8
ECO﹀吉一O﹃，白Z﹂旦五音一

'
.6 9
1 156 214 271
'8
， 9
' 6
， 154 21 27'，7
209 ，3
207
38， 61， 225 308 205 407 3
5
。 223 304 203 405
1
，8 90 )
，4 221 147 301 201 404 269，
3
18
， 16 403 7
，
2
299
B
8
2
， 8
， 2
， 15 399
4 16
， 13 293 3
，
UV弓EEZ80︿

39，6 58，
1 12 290 3
3
39
98
7
1
5 7
，
39，8 86，3 5
57， 211 け 21H 91 258
4( 85 209 139 190 383 3
255，
4(
，)5 83， i
，6 205 136 185 362 241，
3
4 81， ，3 20口 342 228
41 5
， 7! 196 336 224
4: 7 51里
， 192 259 331 220，
7
4:
，!5 71 50，
6 188 253 32 214

COPYRIGHT
 92

TableA
.1(
con
tin
ued
)
Permitteds
hor
t-c
irc
uitcurrent
mA
Voltage f
orGroupI IC f
orGroupI IB f
orGroupI IA f
orGroupI
apparatus apparatus apparatus apparatus

V withafactor0
1safety withafactor0
1safety withafactoro
fsafety withafactorofsafety
01 01 01 01

x1 x1，
5 x1 x1，
5 x1 1，
x 5 x1 x1，
5
43 74，3 49，
5 184 122 247 165 312 208
43，
5 72，6 48，
4 180 120 242 161 307 7
204，
44 71 47，
4 176 117 237 158 303 202
5
44， 69，5 46，
3 173 115 231 154 294 196
45 68 3
45， 169 113 227 151 286 190，
7
(32zzacoz書官。SEEmwコ
四日ochucobコO芭ωE200口}NFDNOω口hNCOEEEO﹀ 芭5 ozJωhzvzo-uuL ha uonwooO︿
，
﹃
，
﹃
明

COPYRIGHT
 93

TableA.2- Permittedcapacitancecorrespondingtothevoltage
andtheEquipmentGroup

IcapacitanceμF
Voltage f
orGroupI
ICapparatus f
orGroup1
18 f
orGroup1apparatus
f
oa
rpG
pra
or
au
tp
ul
slA

V withaf
act
orofs
afe
ty withafactorofsafety withafactorof safety withafactorof safety
01 。f 01 01
x1 x1，
5 x1 x
1，5 x1 x1，
5 x1 5
x1，
0
5， 100
5，

)6
， 1000 5
4
，7 860
1，8 750 !
6
人9 671 !
3
，)0 600 !
O 1000
6， 535 l
7 880
6，2 475 l
4 19U
6，3 420 l
1 720
6，
6，
4
5
370
320 ，
650
5
6，6 50C
6， 430
6，8 380
(

335
32

3UC
c
zaz
oz言EBEE雪

120
110
100
92
，
7 85
国担O

1主 79
7，9 74 15
C

。
E

8，0 100
-

6
65
9
-

8.
1 90
Oとき言。E コ

8 6 81
8 56 73
84 54 66
8 51 6口
00口)凹呂町0

8 49 55
日日日
0ロドNcoE2zo﹀Eo﹁臼Z J

3
( 7
， 口
70 000

1
5 '
8

0
， 。 。
450
旦室

，
1
8
， 88
F 。
一UU
L勺S

~，4
﹀ EZ80︿

~， 32
7
， 2
， 23
， 26口
24
1
2， 225 14，4 63
21
1 13.8 60 '5
，
195 13，2 57，
0 60

COPYRIGHT
 94

TableA.2(
con
lin
ued
)
hμF
Voltage 1
0 ICapparatus
rGroupl f
orGroup1
18 f
orGroupIapparatus
f
oar
pGp
ra
or
ua
tp
uH
sA

V withafactor01safety withaf
act
oof
rofsafety withaf
act
oof
rofsafety withafactor01safety
01 01
x1 x1，
5 x1 x
1，5 x1 x1，
5 x
1 x1，
5
.
84 180 58
1 .
79 170 54
160 02

1 8 4
:

人6

，;6

.
3

12. 28 .
3
12
12. 。
5

12. .06 30
12.9 6.
2 03
， ・
民
M 65 29
6， 10
， 1000 2; 28，
5
5.
7
。
0.
9 7 6， 850 21 27，
5
5.4
。94 46 8
，
(

13 ， 73 21 27
刀O

。 6
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9
， 1 44 20 26
11
，4 38 42 56 1!1
.5 6
25，

1
，6 。80
U，

。I
40 5C
45
1 k6
24，
8
，
4
.
7
。
。
420
3引O
1
8，
1
7，
1 15
，

。 。 4
4.60
360
330
1
7
，5
0， 4，49 1
0 1
，5
1
1，3
0，

。
0，
4，35
428
日
!
。
。
日O口
80C 164
，
，
4 1
，6
。
。
，67 26 18 500 19，
48
﹄

15 65 25 7 15 360 19，16
コOMCOEコuo

， 】

1
1
，
3
。
4
。，64
12
24
23 86
。)。
1
5
320
268
19
18，
6
1 2 0，61 22 76 14 220 18，
4
0，59 21 65 14 190 18
口)NFDNOω

1!
151
0.58
0，57
20.
19，
2
7
55
，
，
46
100
9'
14，
13， 。
18C 17.
8
17，48
15 ，55 91 1，4 32
，
15，3 88
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01
8
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1 8; )48
，
156
1
0

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32
，

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4f '
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1
6
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88 398
， 5 9 60 32
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1
6
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13
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2
375
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361
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0，
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4 1
，1 5C 16
1.62 0.353 1 1
1， 2.06 48 11.8
，59 日 346
， 10，
8 2，02 44 8 46 1
，6

COPYRIGHT
 95

TableA
.2(
con
lin
ued
)
PermittedcapacitanceμF
Voltage f
orGroupI
ICapparatus f
orGroup1 18 f
orGroupI IA f
orGroupIapparatus
apparatus apparatus
V withaf
act
orofs
afe
ty w
ithaf a
ctorofs a
fet
y w
ithaf a
ctorofs a
fet
y w
ithaf
act
orofs
afe
ty
01 0
1 0
1 f 。
×
旬 x1，
5 x1 )
(
1，5 x
1 x
1，5 x1 5
x1，
17，
5 1，56 0，339 10，5 1.
97 42 12
，
l 44 11，2
6
17， 1，53 0，333 10，2 1，
93 40 8，1 42 11
17，
7 1，50 0，327 9
9， 1，
88 39 8，0 40 10，64
17，
8 1，47 0，321 6
9， 1，
84 38 7，9 39，
2 10，48
17，
9 1，44 0，315 3
9， 1，
80 37 7，7 38，
6 10，16
18，
0 1，41 0，309 9，
0 78
1， 36 7，6 38 10
1
18， 1，38 0，303 8，
8 75
1， 35 7，45 37，
3 9，86
2
18， 1，35 0，297 6
8， 1，
72 34 7，31 36 ，~ 9，8
18，
3 1，32 0，291 8，
4 1，
70 33 7，15 36 9，68
18，
4 1，29 0，285 8，
2 1，
69 32 7，0 34，
6 9，62
18，
5 1，27 。28
， 日 8s 1，
67 31 6，85 34，
3 9，5
6
18， 1，24 0，275 9
7， 1，
66 30 6，70 34 9，42
18，
7 1，21 0，270 8
7， 1，
64 29 6，59 32 ，~ 9，28
8
18， 1，18 0，266 6
7， 1，
62 28 6，
48 3
32， 9，21
18，
9 1，15 0，262 4
7， 1，
60 27 6，
39 32 9，07
19，
0 1，12 0，258 2
7， 1，
58 26 6，
3 31，
2 9
19，
1 1，09 0，252 7，
0 1，
56 25，
0 6，
21 30，
5 8，86
19，
2 1，06 0，251 8
6， 1，
55 24，
2 6，
12 30 8，8
19，
3 1，04 日 248
， 6
6， 1，
52 6
23， 6，
03 29，
5 8，68
19，
4 1，02 0，244 6，
4 1，
51 23，
0 5.
95 29 8，62
5
19， 1，00 0，240 2
6， 1，
49 5
22， 5，
87 28，
5 8，5
O
W (官

19，
6 。 98
， 0，235 6，
0 1，
47 0
22， 5.
8 28 8，42
E﹄

。2 31
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7
19， 0，96 ， 9
5， 1，
45 2 5
1， 5，
72 27，
5 8，28
8
19， 0，94 0，227 8
5， 1，
44 21，
0 5，
65 27 8，21
19，
9 0，92 0，223 7
5， 1，
42 5
20， 5，
57 5
26， 8，07
20，
0 0，90 0，220 6
5， 1，
41 20，
0 5，
5 26 8
20，
1 0，88 0，217 5.5 1，
39 5
19， 5，
42 3
1
25， 7，87
20，
2 0，86 0，213 4
5， 1，
38 19，
2 5，
35 25，
2 7，8
20，
3 0，84 0，209 1
33
， 1，
36 18，
9 27
5， 24，
8 7，75
20，
4 0，82 0，206 5，
2 1，
35 18，
6 5，
2 24，
4 7，62
5
20， 0，8 0，203 5，1 1，
33 3
18， 5，
12 24 7，5
20，
6 0，78 0，200 5，
0 1，
32 18，
0 5，
05 3
23，1 7，42
7
20， 0，76 0，197 4，
9 3
1，1 17，7 97
4， 23 7，33
8
20， 0，75 0，194 4，
8 1，
30 17，4 9
4， 1
3
22， 7.16
0M

9
20， 。 74 。1 91 4，7 1，
28 2
17， 4，
84 22 7
E

， ，
ω￡

21，
0 0，73 0，188 4，
6 27
1， 17，
0 78
4， 2 3
1
1， 6.93
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2 1
1， 0，72 0，185 4，
52 25
1， 16，
8 73
4， 21 6，87
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2 2
1， 0，71 0，183 4，
45 1，
24 16，
6 4，
68 20，
5 6，75
21，
3 日7
， 0，181 4，
39 1，
23 16，4 4，
62 20 6，62
21，
4 0，69 0，179 4，
32 1，
22 16，
2 56
4， 19，
8 6，56
2 5
1， 0，68 0，176 4，25 1.
2日 16，0 4，
5 19，64 6，5
2 6
1， 0，67 0，174 4，18 1，
19 15，8 4，
44 19，48 6，37
ロド NCOEコ官。﹀︼CE可臼Z﹂ωE一

21，
7 0，66 0，172 4，11 1，
17 15，6 4，
38 19，:g 6.25
2 8
1， 。 65
， 。1
， 69 04
4， 1，
16 15，4 4，
32 19，16 6，18
21，
9 0，64 。1
， 67 97
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15 15，
2 4，
26 19 6，12
22，
0 0，63 0，165 3，
90 1，
14 15，
0 4，
20 18，8 6
22，
1 0，62 0，163 3，
83 1，
12 8
14， 4，
14 18，6 5，95
22，
2 0，61 0，160 3，76 1，
11 6
14， 4，
08 4
18， 5，92
3
22， 0，6 0，158 69
3， 1，
10 4
14， 4，
03 2
18， 5，9
22，
4 0，59 0，156 62
3， 1，
09 2
14， 3，
98 18 5，85
22，
5 0，58 0，154 3，55 1，
08 14，0 3，
93 17，
8 5，8
6
22， 0，57 0，152 3，49 1，
07 13，8 3，
88 17，64 5，77
22，
7 0，56 0，149 3，43 1，
06 13，6 3，
83 17，48 5，75
Eo-uv- 勺ha ちω

22，
8 0，55 。1
， 47 37
3， 1，
05 13，4 3，
79 17，32 5，7
9
22， 0，54 。1
， 45 3，
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04 13，
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3， 17，16 5，65
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23， 0，53 0，143 3，
25 1，
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71 17 5，62
23，
1 0，521 0，140 3，19 1，
02 8
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67 16 ，~ 5，6
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2 0，513 0，138 3，13 1，
01 12，
6 3，
64 16，
54 5，55
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08 1，
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6日 16，
48 5，5
ω
ω。

23，
4 0，497 0，134 3，
03 0，
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12， 3，
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。υ︿

5
23， 0，49 。1
， 32 98
2， 0，
98 12，0 3，
53 16
16， 5，45

COPYRIGHT
 9
6

TableA.2(
con
tin
ued
)
Permitted μF
Voltage f
orGroupI
ICapparatus
f
oa
rpG
pr
ao
ru
at
pus
l
lB f
orGroupI
IA f
orGroupIapparatus

V withaf
act
orofs
afe
ty withaf
act
oof
rofs
afe
ty withaf
act
orofs
afe
ty w
ithafa
ctoro
fs af
ety
01 01 0
1
.
1 x
1，5 .
1 x1，
5 .
1 x
1，5 .1 5
x1，
23，
6 484 30 93
， 0，9 1
1， 人50 16
2・
' 178 28 88
， 人9 1
1， 46 15
12 S3
，
!
: 1
1，
36 1
1，
1
1，

0， 7
， 8
，
64
，
24， 48
，
2' 32 )
5
24， '
4 16
， Z
】

24， 18 。 15 ，9
↓ 87
，
.
1412 1
，1
1 1
4 。 4.95
1
，406 8
。，
主5
主 9， 4，9
.
14 111 36
， 84
， 9，
5 4.87
395
0， 1
0，0! 32
， 83
0， 9，
4 480
25，2 390
， 。 29
， 0，
82 9，
3 16
，
25，3 385 。 06 26
， 82
， 9 ~.8{ 13 75
25，4 ，380 05 23 。，
81 9， 2 ， 8~ 12，
8 12
25，5 ，375 04 9， 2，
71 12，
64
(U2zzaEOZ言 官wECEω コ回百chotωヒ

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， 37 8， 75
， ~， 48 3
5
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， 16
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7
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26， 11， 1
2
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7 097 ，96 11，
'3
3 ).
096 ，93 11 35
26， '2
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26， '2
5 0，094 ，87 73
， 。 2， 10，64 27
26， 321
， 0.093 」
里空 旦11
2 9 2， 10.48 4.25
26，
8 317
， 092 1
，82 。7
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8 37
， 10，32 4，2
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26， 313 091 1
.8日 0， 7， 10.16 4，15
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309 0，090 ，78 705
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昌三
3 10 41 2
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93
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0， 0，6
1 12
， 8
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28， 249
， 75 。609
， 1
，98 8，
74 145
，
29， ).0 42
，
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D，
主6E0
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1
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0，
232 0，071 1，
46 0，582 '
5 8，
35 25
3，
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COPYRIGHT
 97

TableA.2(
con
lin
ued
)
唱
「 a μF
Voltage f
orGroupI
ICapparatus f
orGroup1
18 f
orGroupI
IA f
orGroupIapparatus

V withaf
act
or01s
afe
ty withaf
act
orofs
afe
ty withaf
acto
r01s
afe
ty withaf
acto
rofs
afe
ty
01 01 。f 01
x1 x1，
5 x1 x1，
5 x1 x1，
5 x1 x1，
5
45
， 578
。 570 1
8
2
2D
4S
P0
E旦
E
6L
8 44
， ，
1573 565 1
1 1
5
2 8 43
， ， OÖ~ 60 2
)0
， 61 ，
1564 )
7
1
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60 )5
日
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10
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5 551 '9
，)064 '
5 96
206 喧~，5主33
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15 57 3
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06
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96
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506 ，
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。0587 0，497 ，
62 2，
186 ).0
578 ，)8!
183 ，)0569 ，
24 己
U
1
14主
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7L
5
EL 4，
68 75 2，
180 4 52 2
177 日)
，0笠
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2 1467
， 4， 2，
174 0，0542 ，
19 1
，460 4， 3
7 2，66
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，452 4， ;
0 1
5 2 53
，
』D豆主
， 168 2O 52
4 15 人444 428 8 1
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0515 114 1
，437 420 6 2.54

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COPYRIGHT
 98

TableA
.2(
con
lin
ued
)
.;
r!1 iμF
Voltage f
orGroupI
ICapparatus f
orGroup1
18 f
orGroupI IA f
orGroupIapparatus
apparatus
V withafactor0
1safety withaf
actr0
o 1safety withafactorofsafety withafactor01safety
01 01 01 01
x1 x1，
5 x1 x1，
5 x1 x1，
5 x1 x1，
5
41.6 0.085 0.0301 1.
66: 28 2.
2日 0.866 3.85 ，
67
41，8 0，084 0，0299 C606 0，
278 2，
17 0，858 3，8 ，
66
42， 。 l 3 )291 650 75 2，
15 0，85 ，
65
4: 。 64 ~72 12 )
. 8
42 ，
62
1
】2
29
92
4
I

4: 。I 。269 ，834
4: 16
.: 。266 )
7 8: ，
6
42 0， 4
012
028主
主6 E;
2ε 0，264 ，81 3，
6 ，
59
'
7 0284 320 ，262 。 l，
55 ，
58
。)76 1
281 614 259 。 l，
5 ，
56
。，
07! )279 608 ，
12
! 。 ~， 45 ，
05
。，
074 )276 )2 ;4 。 ，
l4
43 ，
073 273 96 ;2 0，
7 ，35 ，
53
，
027 90 ，3 ;
2
84 18 。 25
0
02
26
66
8
78 16 。 ，2
)263 572 14 15 1
，47
)
.06
8 12 1 ，46

s
q
n色
E
日白、L
R
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41
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45 同 232 74 ).6
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46
46，4
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242
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524
518
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230
228
226
J之

168
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0，6
9
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1l2
0.674 88
，38
36
35
46，6 0602 0，
0239 12 ~24 1，
666 86 34

，
46.8

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4， 0
0596
0590
，
0237
235
506
L
1，
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4 0578 ~29 490 '

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02: 480 74
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02 170 208
0548 0，
02 人465 206 68
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455 203 2，64 19
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主
主主土
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2 10 0， 0，445 198 6 1.
16
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4 05 8 0，0206 0，440 197 46 ，
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435 196 45 1
.5 ;2 114
0506 ，
。0202 ，
1430 194 44 46 13
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0500 0，020口 .
1425 .3 15。
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0，
049日 0，0194 ，
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9 40 55 43
51 。0480 019口 )，
415 54 08
5 0470 0，0186 人407 34 1
5 )
2
，
。0183
5
5
:
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0460
0450
0，
0440
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0178
人0174
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400
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392
18

1
" 1
'
4
512
，
501
25 1

52
5に 0430 ，
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1 主
塁
380
盗人
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COPYRIGHT
 9
9

A.4 Permittedreductionofeffectivecapacitancewhenprotectedbyaseries
resistance

Whenar esistanceisusedi nse

riesw i!
hacapacitance! oli
mi!!h
eenergy!ha!maydischarge
Irom!he combina!ion 0
1bo!h (energybe !ween nodesA and B i
nthe F
igueA.9below)，!he
r
assessmen!0 1!hee l
lec!i
vecapacitancebe!w een!hesetwonodesmaybes impl
ili
edbyusing
TableA.3
.A I!er
na!ive
ly，i
l! h
e!ableisno!a pp
lied，theci
rcu
itmaybe!ested

Ther esis!
orsha
llbeinaccordancew
ith7
.1，and!henodeX s
hal
lbesegrega!edIroma
llo
!he
r
conduc!ivepa
rtsaccordingt
o6.3
工
C
ef=Cxr
f edu
cti
onf
ac
to
r
X

工 IEC 1398106
(
刀Bc-a

FigureA.9-Equivalentcapacitance
﹄cosB 刀剣WOMEEm

t
TableA.3-Permi!edreduction01e
ffectivecapacitance
whenprotectedbyaseriesresistance

R
esi
sta
nceR R
edu
cti
onf
act
or
コ
田“ othuzωヒ

Q
日 1.00
1 0.9
7
2 0.9
4
コ ω芭ωE200口)NF NGO口hNEOE2zo﹀吉一O可 白 Z﹂ωhzEo-ox ha百w

3 0，9
1
4 0，8
7
5 。8
， 5
6 0，8
3
7 0.8
0
。

8 0.7
9
9 0，77
10 0，74
1
2 0.7
0
14 。.6
6
16 0，6
3
1
8 0，6
1
2
0 0.5
7
2
5 0，5
4
3
0 0.9
4
40 0，4
1

NOTE Ther
edu
cti
onss
pec
i自e
dint
hea
bov
eta
blea
rec
ons
erv
ati
vea
ndf
urt
herr
edu
cti
onsmayb
eac
hie
vedb
y
t
est
ing
，
﹃
mmu
ooo︿

COPYRIGHT
 100

AnnexB
(normative)

Sparktestapparatusforintrinsicallysafecircuits

8
.1 Testmethodsforsparkignition

8
.1.
1 P
rin
cip
le

Thecir
cui
l10bel esl
edisconnecled10lh
econlac
ls01l
hesparkl
eslapparalus，whicha
rei
n
anex
plosionchamberlh
alisfi
lle
dw i
lhanexp
los
ivele
slmix
lur
e.

Theparamelersollhec i
rcu
ilar
ea dj
usled10achievelhepre
scrib
eds a
let
yfacl
orandales
lis
made10 delerminewhelherornolignil
ion01l heexp
losi
veles
lm ix
lurelakespl
acewi
lhi
na
def
ine
dnumbero foper
al旧n so
fl h
ec on
laclsyslem.

Exceplwhere o
lherwises p
eci
fied，lhelol
era
nce on mechanical dimensions o
flhe machined
par
lsis:
t2% (lungslenwireleng
lh:t10%)andlh
al0 1vollagesandc urrenlis:
t1%

8
.1.
2 Apparatus

The apparalus s
hal
lc on
sislofa c onlacl arrangemenl in an explo
sio
n chamber having a
(

l250cm3.1i
刀
2czaEωζ ヨ宮古MCE伺コ回 vothugmwヒコωMCOE200

volume 01alleas s arranged1 0 produce make-sparksand break-sparks i

nlh
e
pres
cribedexplos
ivele
slm i
xlu
re.

NOTE 1 An exa
mpleofa pr
ac
ti
ca
ld es
igno
fth
ete
sta
ppa
rat
usi
ssh
owni
nFi
gur
e 8.
4.(
Fort
hec
ont
act
ar
ran
geme
n t，s
eeFig
ure
s6.1，8
.2and6
.3.
)

One ofl
helwo c
onlac
lel
ecl
rod
ess
hal
lco
nsi
sl0
1a r
ola
lin
gcadmium c
onl
acld
iscw
ilhlwo
sl
olsasi
nFigu
re8 .
2

NOTE2 Cadmiuma
ssu
ppl
iedf
ore
lec
tro
pla
tin
gmayb
eus
edf
orc
ast
ingc
adm
iumc
ont
actd
isc
s

Theo l
hercon
laclel
ecl
rodeco
nsisl
s01lourlungslen co
nlaclwireswi
l 10，
h a diameler0 2:
t
0，
02m mclampedonac i
rcl
e0150m mdiameler1
0ane l
eclr
odeh old
er(made0 1brassoro
lhe
r
su
ila
blemal
erialasi
nFigur
e8.
3).
口)NFDN00

NOTE3 I
tisa
dvant
ageou
storo
undof
fthecor
ner
soft
heel
ectr
odehol
ders
li
gh
tl
yatt
hep
oin
tsw
her
eth
ewi
res
a
recla
mpe
dtoav
oidpre
matur
ebr
eaka
geofth
ewire
satt
hes
harpedge
口ドNZO@

The conl
acl arrangemenl sha
ll be mounled as shown i
nF ig
ure8.1. The eleclrode holder
rola
lessol ha
ll helungslen conla
clw iressli
deoverlheslo
ltedcadmium di
sc.Thed islance
belweenlhee le
clrodeholderandl h
ecadmiumd iscis10mm.TheI re
el en
gl hollhec onlacl
﹄コ官ω﹀ ME。﹁白Z﹂ωhzEω OV

wiresis11 mm.Thec onlac

lw iresa r
es lr
aigh
landlitt
edsoas1 0benormal1 0lhes urlaceo f
lhecadmiumd iscwhenn olinc o
nlaclw i
lhil

Theaxes0 1lheshaf
tsdriv
inglhecadmiumd i
scandlheelecl
rodeholderare31 m map
arland
aree l
eclri
cal
lyinsu
lale
d什omeacho l
herandIroml
hebaseplale01lhea ppa
ralus
.Thec u
rre
nl
i
sl edi n and ou
llhrough s
lid
ingc o
nlacl
s on l
hesha
ftswhich are geared l
ogelh
erbynon-
conduclivegearswilhara
lio0150・12
一

The e
lec
lrodeh oldersh
allrol
al l8
ea 0 r/min by an e
lec
lric molor，w
ilhsuil
abler e
duc
lio
n
弓 hnumEωouu︿

gea
ringi
lnecessary.Thecadmiumd
isci
slurnedmores lowl
yinl heoppo
siled
irecl
ion
.

NOTE4 G
as-
tig
htb
ear
ingb
ush
esi
nth
eba
sep
lat
ear
ene
ces
sar
yun
les
sag
asf
lows
yst
emi
sus
ed

COPYRIGHT
 1
01

Eith
era countingdevicei
s providedtorecordt henumberofrev
o lu
tionsoft h
emotor-driven
shaf
to fthee lec
tro
deholderorat im
ing device maybeusedto determinethetestdurat
ion，
fromwhichthenumbero frev
olutionsofth
es h
afto ft
heel
ect
rod
eh oldercanbec al
cula
ted.

NOTE5 t
Iisad
vanta
geo
ustosto
pth
edr
ivi
ngm
otr，o
o ra
tlea
stt
hecou
ntin
gd e
vic
e，a
uto
mat
ic副 I
yaf
te
rani
gni
tio
n
o
fthee
xpl
osi
vemix
tur
e，f
ore
x a
mpleb
ymeanso
fapho
toc
elJo
rapre
ssur
es w
itc
h

The explosion chamber s

hal
l be capable o
fwithstanding an explosion pressure o
fatl
eas
t
1500kPa( 1
5b ars
)exceptwherep r
ovisio
nismadet oreleasethee xplos
io npressure

Atthetermi
nal
so fthecontactarrangement，theself
-cap
ac i
tanc
eo fthetestapparatussha
ll
notexceed30pFw i
tht h
ec ontac
tsopen.Ther e
sis
tanceshallntexceed0，
o 15Q atac ur
rent
of1A d.
c.andtheself
-inducta
ncesha
lln o
texceed3μHw iththecon
tactsclosed

8.1.3 Calibrationofsparkt
estapparatus

The s
ens
itiv
ityofthesparktes
tapparatuss
hal
lbechecked b
efo
re and a
fte
reachs
eri
eso
f
te
stsinaccordancew
ith10.
1.3
.

When the s
ensit
ivit
yis not as s
pec
ifi
ed，t
hef
oll
owi
ng procedure s
hal
l be f
oll
owe
dun
til the
re
qui
redsensit
ivityi
sachieved
) )U)
会U

checktheparameterso
fthec
ali
bra
tio
nci
rcu
it;
﹄

checkthecompositiono
fth
eex
plo
siv
ete
stm
ixt
ure
;
FMAUρν
(

))
司EczaEO￡B300VEE

cleanthetungstenw
ire
s;
r
epl
acethetungstenw
ire
s;
connecttheter
minal
stoa 95 mH/24V/100 mAc
irc
uitasspe
cif
iedin10.1
. 3andrunthe
te
stapparatuswit
htheco
ntac
tsi nai
rfo
raminimumo f20000revo
lut
ion
so ftheel
ectr
ode

。 hol
der;
悶コ四百zhoco

replacethecadmiumd
iscandc
ali
bra
tetheapparatusi
naccordancew
ith1
0.1
.3.

8.1.4 Preparationandcleaningoftungstenwires
ヒコ

Tungsten i
sa verybr
itl
lem a
teri
al andtungstenwireso
fte
ntendt
osp
lita
ttheends a世e
ra
ω官。 E200口)NFDNO@

rel
ativ
elyshor
tperi
odofo p
erati
on

Tor
eso
lvet
hisd
iff
icu
lty，oneo
fth
efo
llo
win
gproceduress
hal
lbef
oll
owe
d.

a
) Fuset heendsofthetungstenwiresinasimpledeviceasshowninF ig
ure8.5.Thisforms
a smallsphere on each w
irewhich s
hal be removed，f
l orexample bysl
igh
tpressureby
ロ

tweezers
ド NZO巴 2EO﹀吉一010Z﹂ω2

Whenpreparedinthsway，i
i ti
sfoundthat，onaverage，oneo
fthef
ourcontactwireshast
o
bechangedonlyaf
terabout50000sparks
b
) Cutthetungstenwiresw
ith a shearing a
cti
on，f
or example using heavyd
utys
cis
sor
sin
goodcon
ditio
n

The wires are then mounted i

n the ele
ctr
odehold
er and manually cleaned by rubbing the
surface，i
ncludi
n gtheendo fthewire，w
ithgrade0emeryclo
tho rsimi
la r
、 E

NOTE1 t
[i
sad
van
tag
eou
stor
emo
vet
hee
Jec
tro
deh
oJd
erf
romt
het
e5ta
ppa
rat
uswhenc
lea
nin
gth
ewi
res
一OOX司、A

NOTE2 Thes
pec
ifi
cat
ionf
org
rad
e0e
mer
ycl
othg
rai
nsd
ete
rmi
nedb
ysi
evi
ngi
sa 凶[
sf o
ws
D官wzouo︿

R
equ
ire
men
ts S
iev
eap
ert
ures
ize(
μm)
A
IIg
rai
nst
opa
ss 1
06
N
otm
oret
han2
4% t
ober
eta
ine
d 75
A
tle
ast4
0% t
ober
eta
ine
d 5
3

COPYRIGHT
 102

N
otm
oret
han10%t
opa
ss 45

Experiencehasshownt h
at，inordertosta
biliz
ethesens
itiv
ityduringuse，itisadvantageoust
o
cleanands t
rai
ghte
nthewiresa tregu
larint
erval
s.Thei n
terv
alchosendependsont heratea
t
whichd ep
o s
itsformonthew i
res.Thisrat
edependsont hecirc
uitbeingtest
ed.A wireshal
lbe
replacediftheendoft
hew i
rei ssp
litori
fthewirecannotbestraightened

8.1.5 Conditioninganewcadmiumdisc

Thef o
llowi
n gprocedurei
srecommendedf
orc
ond
iti
oni
nganewcadmiumd
isct
ost
abi
liz
ethe
se
nsi
tivit
yo fthesparktes
tapparatus

a
)fi
tthenewd
isci
ntot
hesparkt
estapparatus;
b
) connecttheterminalsto a 95 mH/24Vパ00mAc ir
cui
tasspe
cif
iedin10.1
. 3 andrunthe
tes
tapparatuswitht h
econtactsinairfo
raminimumof20000revo
lut
ion
so fth eel
ect
rode
hold
er;
c
)fitnewtungstenwirespreparedandcleanedinaccordancewit
h81.
. 4andconnectthet
est
apparatust
oa2μFn on
-elec
trol
yti
ccapacito
rchargedthrougha2kQres
ist
or;
d
) usingtheGroup I IA(orGroup1)explosivetestmixtureconformingto10.1
.3.1，apply70V
(or 95V for Groupりt othecapaci
tivec ir
cuitand operateth
e sparkte
stapparatusf ora
minimum o f400 revoluti
onsofthe electrodeh o
ldero runt
ilign
iti
onoccurs.Ifno ign
it旧n
takesplace，checkt hegasmixture，replacewires，o
rcheckthesparkt e
stapparatus.When
ign
itionoccurs，reducethevoltageinstepso f5V andrepeat.Repeatun
tilnoi g
nitio
ntakes
place;
obe45V f 5V frGroup 1
)
(

e
) thevoltagea twhich i
gni
tio
nshall be obtainedt o
rGroup IIA( 5 o
刀旦 c=aEO

and the voltage a

twhich no i
gnitio
n takes place s
hal be 40 V f
l or Group I
IA (50V f
or
Group1)ー
戸
﹄ヨ

8.1.6 Limitationsoftheapparatus
UωECE

The sparkt
estapparatus i
s designedf
ort
est
ingi
ntr
ins
ica
llysafe c
irc
uit
swi
thi
nth
efo
llo
win
g
li
mit
s:
伺コ四百己 h

a
) at
estc
urr
entnotexceeding3A;
ku

b
)re
sis
tiv
eorc
apa
cit
ivec
irc
uit
swheret
heoperatingv
olt
agedoesnotexceed300V
;
z
ωヒDOMCOE

c
)in
duc
tiv
eci
rcu
itswheretheinductancedoesnotexceed1H
;
)f
d o
rci
rcu
itsupt
o1βMHz
コ00

NOTE1 Thea
ppa
rat
usc
anb
esu
cce
ssf
ull
yap
pli
edt
oci
rcu
itse
xce
edi
ngt
hes
eli
mi
tsb
utv
ari
ati
onsi
nse
nsi
tiv
ity
口)NFDNOωロ

昨l
ayQc
cur

NOTE2 Ifth
et e
stcu
rre
nte
xcees3A，t
d het
emp
era
tur
eri
seo
fth
etu
ngs
tenw
ire
smayl
eadt
oad
dit
ion
ali
gni
tio
n
ef
fec
tsi
nva
lid
ati
ngth
etes
tre
sul
t
ド Ncoω﹄コ官。﹀言語、。 ZJmhZMFho-ux-

NOTE3 Within
duc
tiv
ec ir
cui
ts，c
ares
hou
ldb
eex
erc
ise
dth
ats
elf
-In
duc
tan
cea
ndc
Ir
cu
itt
imec
ons
tan
tsd
ono
t
ad
ver
sel
yaf
fec
ttheres
ult
s
NOTE4 C apa
cit
iveandindu
cti
vecir
cu
it
swithlar
getim
ec o
nstan
tsmayb etest
ed，f
orexam
p l
eb yre
duc
ingth
e
spe
edatw h
ichth
es p
arkte
stappa
rat
usisdr
ive
n.Capa
cit
iveci
rcu
itsmaybetes
tedbyrem
ovingtwoort
hre
eofth
e
tu
ngst
enw i
res
.Atte
ntio
nisdrawntothefa
cttha
tr e
duc
ingthes pe
edofthesparkt
es
ta p
paratu
smaya lt
eri
t
s
s
ens
iti
vit
y

The sparktestapparatus mightnot be s

uit
ablef o
rthet est
ingo fc
ircu
its，which shutoffthe
curren
to rreducethee le
ctri
calvaluesas a resu
lto fmaking o
rbreaking contactinthespark
apparatusduri
ngt h
er equirednumbero frevo
lution
s. Such c
ircu
itssh
allundert e
stdeli
verthe
worstcaseoutputconditi
onsthroughoutthetest
，ha吉田 ω@OG︽

NOTE5 F
ort
het
es
tofs
uchc
irc
uit
sAn
nexEa
ndA
nne
xHp
rov
idef
urt
heri
nfo
rma
tio
n

COPYRIGHT
 103

B
.1.
7 Modificationsoft
estapparatusforusea
thighercurrents

Testc
urr
ent
sof3A t
o10A maybet
est
edi
nthet
estapparaluswheni
lismodifiedasf
oll
ows

Thelungslenwires a
re replacedbywiresw
ilh diamelerincreasedfrom 0， 0 0，
2m m1 4士 0，
03
m mandIhef r
eel e
nglhreduced1 5m m
010，

NOTE1 Ther
edu
cti
oni
nfr
eel
eng
thr
edu
cest
hew
earo
nth
ecadmiumd
isc

The lol
alr e
sislanc
e01Ihe apparalus i
ncludi
ngIhe commulalion conlaclresi
slancesh
all be
reduced10l es
sIhan100 m Qo rIhecirc
uilunderle
sls ha
llbemodifiedt ocompensateforthe
int
erna
lr e
sistanc
eo ft
hesparkt e
stapparatus.

NOTE2 Bru
sheso
fth
etypeu
sedi
nth
eauto
mobi
lein
dus
tryc
ombinedwit
hb r
asssl
eeve
so ntheapp
arat
ussha
fts
50ast
oin
crea
seth
eco
nta
ctar
eaha
vebee
nf o
undtob
eonepra
cti
calso
lut
iontore
duceth
ec o
ntac
tr e
sis
tan
ce

The to
tal inductance o
fthe t
est apparatus and the inductance 0
1th
ein
tercon
nec
tio
nto the
ci
rcu
itundert estmustbeminimized Amaximumvalueo
目 f1μHmustbeachieved

The apparatus can be usedl

orh
igh
erc
urr
ent
s buts
pec
ial care i
nin
ter
pre
tin
gth
ere
sul
tsi
s
necessary
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eal

6 Basep
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7 Contactw
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9 Clampingscrew 18 Drivemotorv
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Figure8.4-Exampleofa practicaldesignofsparktestapparatus
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 108

AnnexC
(informative)

Measurementofcreepagedistances，clearancesandseparationdistances
throughcastingcompoundandthroughsolidinsulation

C.1 Clearancesandseparationdistancesthroughcastingcompoundand
throughsolidinsulation

Thev
olt
age!
obeusedshouldbede!erminedi
naccordancew
i!h6
.3.
3

Theclearanceis!ake
nas! hesho
r!es!d
is!an
ceinai
rbe!ween!WO con
duc!ivepar
!sand，where
!he
rei saninsul
a!i
ngp a
r!，lo
rexampleabarri
er，be
!ween!hecon
d u
c!ivepar!s，!
hedis!
anceis
measureda lo
ng! h
ep a!hwhichw
illbe!akenbyas !r
e!c
hedpiece01s !
rin
ga scanbeseeni n
Figur
eC .1

、〆
〆/
( J
3

、-
-
S-
-J 、
、
(
℃2zzazω ￡言明記ω

IEC 1407
/06

K
ey
OMCEEd回-ozhuco

1C
ond
uct
or
2C
lea
ran
ce
38
arr
ier
ヒコ O官。Eコ00

FigureC
.1-Measuremen!ofclearance

Where !hed is!a

nce between t
hec o
nductiv
ep ar
tsisp ar
!ly clearance and par
tlyseparat旧n
口)NFDN00口 hNCOEEEO﹀吉一。可申ZJωh

dis
tance through cas
ting compound a n
d/orsoli
di n
sul
ati
on，! hee quiva
lent clearance o
r
sepa
r a
tiondistance!hroughcas
tin
gcompoundcanbec al
culatedint hefollow
ingmanner .The
valuecanthenbecomparedw i
ththev a
lueinth
er ele
vantcolumn0 1Table5

I
nF i
gur
eC.2l
etA beth
eclearance，B bethes
epara!i
ond
is!
anc
e!hroughc
as!
ingcompound
andCbe!h
esepa
ra!i
ondis
!an
ce!hroughsol
idinsu
la!
ion
￡
zυ-
ox 勺hamuoωωω00︿

COPYRIGHT
 109

IEC 1408
/06

Key

1C
ond
uct
or

FigureC.2-Measurementofcompositedistances

I
fA i sl
essthant h
ea ppli
cablevalueofTable5，oneo fthefol
low
ingtabu
lat
ionscanbeused.
Anyclearanceorseparationwhichisbelowone-
thirdofther
eleva
ntvaluespec
ifi
edinTable5
shouldbeignoredforthepurposeofthesecal
culat
ions

Ther e
sul
tso
fthesec
alc
ula
tio
nsshouldbeaddedandcomparedw
iththea
ppr
opr
iat
evaluei
n
(
司

Table5
2zzacosB宮EMEEmコ

fTable5，m
Tousecolumn2o ult
ipl
ythemeasuredvaluesbythef
oll
owi
ngf
act
ors
:

V
olt
aged
iff
ere
nce U<1
0V 10V ~ U<3
0V ;3
U，
; 0V
A 1 1
回

3 3 3
“ozhoco

c 3 4 6
ヒ
コω吉ωE200口)

Tousecolumn3o
fTable5，m
ult
ipl
ythemeasuredvaluesbythef
oll
owi
ngf
act
ors

V
olt
aged
iff
ere
nce U<1
0V 10V~U<30V U之 30V
A 。3
， 3 3
0，3 3
0，3
N

1 1
F

B
D
No

C 1 1
，33 2
ロド刊 ω

fTable5，m
Tousecolumn4o ult
ipl
yth
emeasuredvaluesbyt
hef
oll
owi
ngf
act
ors
COE2co﹀芭-

V
olt
aged
iff
ere
nce U<1
0V 10V~U<30V Uξ 30V
A 0，
33 0，
25 0，
17
1 。75
oウ臼Z﹂ω

B ， 0，
5
C 1 1 1
hzv

C.2 Creepagedistances
zu-
uv-﹁hnuoωωω00︿

Thev
olt
aget
obeusedshouldbedeterminedi
naccordancew
ith6
.3.
3.

Creepagedistanceshavet
o bemeasuredalongthesurfaceo
fin
sul
ati
on and，t
her
efo
re，are
measuredasshowni nthef
ollo
win
gsketch

COPYRIGHT
 110

IEC 1409
/06

Key

1S
ubs
tra
te 38
arr
ier
2G
roo
ve 4 Cement

FigureC.3-Measurementofcreepage

Thef
oll
owi
ngmeasurementsshouldbemadeasshowni
nFi
gur
eC.
3:

a
) thecreepage d
ist
anceshouldbemeasured aroundanyi
nte
nti
ona nthesurface，
lgroovei
pro
vidin
gt h
atthegroovei
sa tl
eas
t3m mwide;
(
USE

b
) whereani ns
ulati
ngpart
iti
onorb ar
rierconformingto6.3
.2isinse
rte
dbutnotcementedi n，
-acozBBOWCEE四百E E亡

the creepage di
stanceshould be measured eit
heroverorunderthe p
art
iti
on，whichever
﹂

give
st hesmallerval
ue;
c fthepaはi
) i t
iondescribedinb)i n，thent
scementedi hecreepagedistanceshouldalwaysbe
measuredovertheparti
tio
n

A B
。ヒ32EEコ
ω。口)NENoωロ

IEC 1410AJ6
ドNcoEコ言。﹀王O勺臼Z﹂主￡z

Key

1V
arn
ish
2C
ond
uct
or
3S
ubs
tra
te

FigureC.4-Measurementofcompositecreepage
o

Whenv ar
nishisusedt oreducetherequi
redcreepagedistances，ando nl
yp artofth
ecreepage
-u
u当EEzgu︿

dist
anceis varnished as shown inF igu
re C.4
， the tot
ale ffect
ive creepage dis
tanceis
comparedtoeithe
rcolumn5o rcolumn6o fTable5bythef ollowi
ngc a
lculat
ion:tocompareto
column5o fTable5，multi
plyBby1andA by3 ;tocomparet ocolumn6o fTable5，mult
ipyB
l
by0，33andA by1 .Thenaddther esul
tstoget
he r

COPYRIGHT
 1
11

Annex D
(normative)

Encapsulation

D
.1 Adherence

Asealsha
ll be main!ainedwhereanypa
r!of!he c
irc
ui!emergesfrom!heencapsula!ion and
!
her
efor
ethecompounds hal
ladherea
tthesei
nter
faces

Theexclusiono fcomponentsencapsulatedw ithcastin

gcompoundfromthecreepagedistance
requirementsisbasedupontheremovalo fthelik
elih
oodo fcontamination.Themeasurement
ofCTIi s，ineffe
c t，ameasuremento fthedegreeofcontaminationneededt ocausebreakdown
n a separation be!w
i een conductive p
art
s.Thef ol
lowing assumptions emerge骨omt h
is basic
consid
eration:

i
fa l
le lec
tric
alpartsandsubstratesaret
otallyenclosed，thati
si fno
thingemergesfromthe
encapsulation，then t
hereis no riskof contamination and hence breakdown from con-
taminationcannotoccur;
i
fanyp ar!oft
hec ir
cut，f
i orexamplea bare o ri n
su l
ated conductororcomponento rthe
substrate o
fa pri
ntedc i
rcu
it board，emerges 什om the encapsulation，then，unless the
compound adheres atthe i
nterfa
ce，contamination can e
nt erat! ha
tint
erfa
ce and cause
(EMCECOZ豆沼田吉E E 回目ocE亡ω

breakdown

D.2 Temperature

Thec
ast
ingcompounds
hal
lhaveatemperaturer
ati
ngconformingt
o6.
6

NOTE 1 AIc
I ast
ing compounds h
ave a maximum te
mpe
ratu
rea bovewhi
chthey may 1
05eorchang
ethe
ir
sp
eci
fie
dprope
rti
es.Suchc hange
smayc ausecrac
kin
gordeco
mposi
tionwh
ichcou
ldresu
lti
ns u
rfa
cesh
ott
ert
han
th
eouts
idesurf
aceofthecasti
ngcompoundbein
ge xp
osedt
oane x
plos
iveatm
osp
here
ヒコヱ己ωEEo口)NV口問。ω

NOTE2 tIsh
oul
dben
ote
dt h
atco
mponent
swh
ichar
eencap
sulatedmayb
eho
tte
rorc
old
ert
hant
heyw
oul
dbei
n
f
reea
ir，d
epe
ndin
gont
hethe
rmalc
ond
uct
ivi
tyo
fth
ecast
ingcompound
ロド NZOE220﹀至。﹃臼Z4mEEE
一UX勺左右 @ωωBU︿

COPYRIGHT
 トヱ O 一匡﹀且OU
O 叫l
rDNlsバ lll
j: )
:)! a
rAqpsa
s:)
x'f
i
' 叫
口)l~Ol 00口LZuoaJnlua八1
ω﹄
コ
崎町ozzωcωaDluF.口ω﹄
コ回
目L
a山 noo
22U
@れて 品川、

u
﹁旧

川p 包n
aalUBJ ll
610Uバouo刈 n:
~I

a
(palUpdulj
ω﹄
コ刷一ω
。 z
ωω -aEoulaF口ω m
-比
。
制 コ
﹄
6
9Aw
hmv
hQ凶、
"
'

3
σ
①¥
ω ω υzoozimwF口ω o
rL
コ
﹄一。 コ
﹄
QとZ U凶
也

N
NFF
 113

5
IEC 1414
/06

FigureD.1d-Enclosurewithcover

Key

Freesurface

2 Encapsulant-%
:ofcolumn3o
fTable5w
it f1，
haminimumo 00m m
3 Component encapsulantneedn
【 otp
ene
tra
te

4 Encapsulant-nos
pec
ifi
edthickness
5 M
eta
lori
nsu
lat
ingenclosure
(
刀BczacωFB 刀剣wo-zE

- nos
pec
ifi
edthicknessf
ormet副 l
i
cenclosure，b
utsee6
.1

-I
nsu
lat
ionthicknesss
hal
lconformt
ocolumn4o
fTab[e5

FigureD.1 - Examplesofencapsulated assembliesconformingto6

.3.
5and6
.6
v
-﹁h230同市出00︿ 国コ四百z
hnu
Eωヒ
コ OZωE
コuo口)NFDN00
口 hNEOE2c@﹀担EO守白Z﹂ω﹄吾￡ω一
口

COPYRIGHT
 114

「一一一一一一一一一一 l

l
件jl
￨一一一一一一一一一 」
日 1415106

Theminimumt
hic
kne
sst
oth
efr
ees
urf
acei
satl
eas
ty2t
hevalueg
ive
nincolumn3o
fTable5w
ithaminimumo
f
1m m
FigureD.2a-Mechanical

「一一一一一一一一一一 l

lτl
(
刀
OHczazoz ﹀﹀30ωHE伺﹄偲コ田MoghoEO﹄﹄コω-EOEコυo

￨ 一一 一一」
IEC 1416106

Theminimumthicknessi
sdeterminedbye
xte
rna
lsu
rfa
cetemperature
FigureD.2bー Temperature

「一一一一一一一一一一
口)NFDNOωロ
ド NC00﹄コ手ω﹀ MCO﹁ 白ZJωhzEU UV弓 hauωωωouod

Themarkeds epar
atio
ndistan
cescomplyw
it fTable5，TableF
hcolumn3o .1o
rTableF.
2.Theminimumthickness
tot
hefreesurfaceisatl
eas
t1rnm
一

Figure0.2c-Separationofc
irc
uit
s
一

COPYRIGHT
 115

「 一一一一一一一 l
r一
一-，
i-J I
I 1

L _ 一一一一一一一一一Il
EC 1418 6 /0

Theminimumt
hic
kne
sst
oth
efr
ees
urf
acei
satJ
eas
ty2t
hev
alu
egi
veni
ncolumn3o
fTable5wはhaminimum0
1
1m m

FigureD.2d-Protection01fusesi
nani
ntr
ins
ica
llysafec
irc
uit

1TCFl
LT J
t% t ncolumn3o
fTable5w
(EMEEEEBEBE旨コ回ωOEEtE204EEコuo口)NEN00白h

Theminimumthicknesst
oth
efr
eesurfacei
satl
eas hevalueg
ive
ni ithaminimum0
1
1m m

FigureD.2e-Exclusion01gas

FigureD.2-Applicationsofencapsulation usingcastingcompound
withoutan enclosure
UX﹁
EEE80︿ NEO世25﹀E40ZJ旦主音一

COPYRIGHT
 116

①¥

IEC 1420106

FigureD.3a-Mouldingoverun-mountedcomponents

①
(
SE﹄acoF主君。旦ZEEd四百 chO ω﹄言。芭ω Eコ00口)NFDN00白 hNEOE2co﹀吉一。勺 O Z﹂ωh
ち

2
IEC 14211
f)6

FigureD.3b-Mouldingovercomponentsmountedonaprintedc
irc
uitboard

Key
Moulding - The moulding s
hal
l have a minimum t
hic
kne
ss t
o f
ree s
urf
ace 0
1 o
t
許

lea
stTabJe5，column4，
wit
haminimumth
ick
nes
sofO，
5mm
2 Component(
e.g
.fu
se)
3 P
rin
tedc
irc
uitboardw
ithaminimumt
hic
kne
s fO，
so 5mm

Figure0.3- Examplesofassembliesusingmouldingconformingto6.6

NOTE Figu
res0 1，0.2 and 0.3 f
. orsim
plic
itydo n
ot showconnections i
nto and o
uto
fth
e assemblies. These
lu
i
J s
tra
tebyexamplep
artstha
tarei mpo
rtanttoth
etypeofprot
ectio
n

Figu
re0 .1illus
tra
tessome examples o
fassemblies u
sin
g encapsulation by c
astin
g compound.These showthe
e
ssentia
ld i
fferenc
esbetweencJearancedistancest
othesurfaceforpoured casti
ngcompoundandmetalo rso
lid
in
sulat
ionpott
ingboxes

F
igu
re0.1ashowsnoenclosure

F
igu
reD.1bshowsacompleteenclosure

F
igu
re0
.1cshowsanopenenclosurew
ithnocover
￡zo-uv﹃ ha官出切000︿

円gureD.1dshowsanenclosurew
ithacover

F
igu
re0.2showssomef
urt
herexampleso
fencapsulationu
sin
gca
sti
ngcompoundw
ith
outanenclosure

F
igu
re0.2ashowsmechanicalp
rot
ect
iono
fani
ndu
cto
randi
tssuppressioncomponents

F
igu
reD.2bshowst
hea
ppl
ica
tio
nofc
ast
ingcompoundt
oreducesurfacetemperature

F
igu
re0.2cshowst
hes
epa
rat
iono
fin
tri
nsi
cal
lys
afec
irc
uit
s

COPYRIGHT
 117

円gureD.2dshowst
hep
rot
ect
iono
ffusesbyc
ast
ingcompoundI
nani
ntr
ins
ica
llysafec
irc
uit

F
igu
re0.2eshowst
hea
ppl
ica
tio
nofc
ast
ingcompoundf
orthee
xcl
usi
ono
fgas

Figure 0.3 i
tru
stra
tes some examples o
fassemblies using encapsulating s
oli
di n
sul
ati
on. These showe s
sential
requirementswithrespectt
oc onstru
ctio
nandclearancedistancest ot hesurfa
ce.Thetechniqueofencapsulating
sol
idi nsu
lati
onistomouldt heassemblyasas ing
leunit

F
igu
re0.3ashowsencapsulatings
oli
din
sul
ati
onoveranun-mountedcomponentsuchasafuse

Thein
ten
tio
nofF i
gur
eD.3ai
stoshowadevicesuchasafuset
hati
smouldedunderpressureona
lls
ixs
ide
sal
l
att
hesametime

Figur
e D.3b showsencapsulating s
oli
din
sul
ati
onovera componentsuchas afuse mountedona p
rin
tedc
irc
uit
board

FigureD.3bisintendedtoshowt ha
talthoughitissi m
ilartoFigureD.3acomponentsuchasafuseisfi
rs
tmounted
onto a p
rin
tedcircu
it board (
ite
m3 )before being moulded underpres
sur
e.Thissometimes r
efe
rredtoasinse
rt
moulding
￡淳司
o
o
。-c
E
N00
口(
U
MBc
=ac
ω
Wコ田副o
zhg
zω とコOZωEコ
ωo白 )NF
h刊COOL2co﹀吉一。勺 OZJωhzwphu-ox﹁ha 百Z
ωωυ
υ︿

COPYRIGHT
 118

AnnexE
(informative)

Transientenergytest

E.1 Principle

Wheret hecircu
itmayd eliv
erat ransientvoltag
eandc urret，thenav
n o
ltageandc u
rrenthig
her
than the values provided in AnnexA may be a llowable，provided i
tcan be shown thatthe
trans
ientenergyi siImitedt othe values spe
ciliedin1 0.1.5.
3.An examplei swhen a power
supplyt hat uses a series semiconductor curr
ent-l
imitings w
itchd etect
s ah ig
hc urren
t and
shutsdown，b ut副 lowsab rieltrans
ientt obet ra
nslerredtothel oa
d.Anotherexamplei swhere
av olt
age-detectingcircu
ittrigger
sat hyrist
orconnectedi nshuntacrosst heload，butwherethe
highv ol
tagemaybeb riel
lypresentacrosst hel oadbelorethet h
yrist
orlire
s

Thec i
rcu
itundertestshouldbetest
edwiththosela
ult
sa ppl
ica
bleunder5
.1t
hatg
ivet
hemost
onerousenergyunderthec o
ndi
tio
nsdescribedint
hisclause

NOTE Thew
ors
tca
ses
itu
ati
onmayn
oto
ccu
ratt
hemaximumv
olt
age
.Lo
werv
olt
age
ssh
oul
dal
50b
eas
ses
sed

Thep r
inci
ple0 1thist e
stistomeasureth
eenergyl ort h
eperiodwhent hevoltageandcu
rre
nt
exceedt he values given i
nAnnexA orthe values known t
o be non-incendivewhen t
este
d
{

usin
gt hesparkt es
tapparatusasg i
veni
n1 0
.1
旬。“
Eac
o

Test
z﹀﹀方自主E E四百EESヒヨ言。Eコ

E.2

Theenergytha
tmaybereleasedt oth
ee xp
losiveatmosphereismeasuredbyt h
einte
gra
l0 1
thepowerandtime，d
urin
gt heper
iodatwhichthevoltageandcurr
entexceedth
evaluesgiven
i
n AnnexA ort h
evalues knownto be n
on-i
gni
tion capablewhen t
este
dw i
ththesparkt e
st
apparatus

The circu
iti st est
ed assumingt h
eworstp o
ssiblel oadundert h
el a
ultsapplicab
leunder5.1
Wheret hec ir
c u
itp rovi
despowert oe xte
rnal apparatus (
Iorexample，where apowersupply
wit
h as eries semiconductorcurr
ent-
limit
ings witchd el
iver
s power atit
s outputte
rmina
lsto
other apparatus locatedint heexpl
osive atmosphere) then t
heworstl oad maybeanyl o
ad
00口)NENO@口hNCOE2cO﹀Eoウ白Z﹂ωEEG-uxZSEE80︿

betweent heiImits0 1open-

cir
cuitands h
ort-c
ircuit

Asan example，ilapowersupplyd e
liv
ers15V undero pen-cir
cuit，andhasas eriescurre
nt
li
miti
ngs w
itchthatoperateswhent hecurretexceeds 1A，i
n tis expectedt
hatthec i
rcu
it，il
connected t
ot he worst case l
oad0 t approximately 14βV，would g
1a Zener a i
veab rie
l
tra
nsientwit
hcurrentg re
a t
erthan1A belorecausingt h
ec urrentswitchtoop
erat
e.Zenersa t
volta
geslowerthant hi
sshoulda ls
obeconsideredlorthetest

ForGroup1 1
8，themaximuma l
lowabl
ec urren
tat14，5V is3，76A (u
singTableA.1.Therelore，
)
thetestmeasurestheproduct01voltag
eandc u
rrentdur
ingthetimewhent hecurrentexceeds
3，76A. Thet ests
et-up andexpected volt
age and c
urren
tloggedw i
th adigi
talo s
c i
llosc
ope
shouldbe01t h
elormshowni nF i
guresE .
1andE .
2.

Inthis case，thetrans
ientenergywil
l needtobec a
l c
ulatedbymeasuringt hecurre
nttot he
Zener( usingac urr
entmeasuringclamp) andthev oltag
eacrosst heZener.A set01c urre
nt
versustime l o 1Zenercan then be measured，andt
reach value 0 h
earea undert heplot01
voltag
exc ur
rentversustime can be o
btai
ned. The area underth
e curve b
elor
et hec ur
rent
dropstoavaluebelowwhichi tisknownasn o
n-i
g n
itioncapablecanthusbeobtained，wi
tht h
is
beingt hetrans
ien
tenergytest

COPYRIGHT
 119

Inothercases，t hemostonerousl oadmaybeav aria

bler e
sisor
t .I
nt h
iscase，as etofcurre
n t
versus time can then be plo吐ed f or each res
istiv
el o
ad from p
ract
ica
llys ho
rt-
cir
cuittoa
resist
anc J
-
-
-.
ej _
-
-_
us.
.
_
.
.
tl es
sthanU nl
ln，a
-0"0' n
_..d
-t.
，
h，
-
e.i.
.
.
n-
;
;
t
e;
1
g.
r_
.
a
lo_
. .
ft.
.
h-.
e.powerandtimed el
iveredtotheresi
stor，
canthenbeusedt ocal
culateth et r
ansientpowerd eliv
ered.Thisloadmaya l
sobeac ap
acitor，
orinductor，dependingontheo utp utparameterss p
ecified

Care should betaken t ha

tt hev o
ltage and curre
nta re measured bya h ig
h speed storage
oscillos
cope，capableo fprovidi
ngatimebasespeedo flessthan 1μsperd iv
isi
on.Thet est
equipmentand i t
s connection t
ot hecircui
tundert estshould minimize anyvari
atio
no fthe
measurands due t oi ntroduc
tiono fthet et equipment
s . Current clamp probes and high
impedancev oltagemeasurementchannelsa rerecommended.A mercuryc onta
ctti
ltswitchis
recommendedasi tprovidesab ilate
ral
lo wconta
ctr e
sistancemechanism，b utothe
re qui
valent
switchesmaybeused

」 j
D
①
①
(刀
Bz=acωzg宮wo-cE

IEC 1420106

Key
国コ

1C
irc
uitu
nde
rte
st
四
戸othHUC2 OWEOEコ

2L
oad
3M
erc
urys
wit
ch
コ
﹄

4H
ighi
mpe
dan
cev
olt
met
er
。

5C
urr
entc
lam
ppr
obe
。口 )NFDNO@

FigureE
.1-Exampleoft
estc
irc
uit
ロド NcoEECO﹀吉一O可臼ZJωh
主FO一口豆、﹄D 刀剣wmωω00︿

COPYRIGHT
 120

C
urr
entA
2

一
一〆β

Time s
IEC 1421/06

Key

1 1i
sequalt
oth
emaximum p
erm
itt
edc
urr
entbysparkt
esto
rAnnexA

2 Transmittedenergy(
inJ
oul
es)=V (
inv
olt
s)xhatchedareao
fth
ecu刊 e(
inA's
)

FigureE.2- Exampleofoutputwaveform
﹀﹀古{
ち
B Ea
﹄coF
mwOMZEEd四日OEho己ωとコO芭ωEコ
。 00口)NF N00口 hNcoE2EO﹀吉一Oカ白Z﹂ωEEu-UX勺hauoωωω00︿

COPYRIGHT
 1
21

Annex F
(normative)

Alternativeseparation distancesforassembled
printedcircuitboardsand separationofcomponents

F.1 General

Compliance w ilhIhis annex yie

lds reduced separalion dislances o
f conduclive p
arls with
respecl 10 Table 5
.1 1isa p
plicabl
e when a maximum p ollul
ion degree 2 affec
lse l
ecl
rical
segregalionsunderconcernf or

• assembledp
rin
ledc
irc
uilboards，and
• separalioncomponenls，w
ilhIh fIransformers，complyingw
eexcepliono ilhTableF
.1o
rF.2
dependingonI heleve
lofp r
ole
cl旧 n.

NOTE Thegene
ralrequ
irem
entsforsep
ara
tio
nd ist
ancesofcon
.du
ctiv
ep ar
tsaregiv
enin6.3oft h
isstan
dard
The
searebas
edw i
del
yonp o
llu
tio
nd e
gree3(IEC6066
4-1).Con
cept
ually，adoub
leorrei
nfo
rce
di n
sula
tio
nb as
ed
onIEC606
64-
1i scon
side
redtocomplywit
hsafet
ys ep
arati
onrequi
rement
so fin
tr
in
si
cs a
fet
yl e
vel"i
a"and“ib
"
a
l50
W
ithprin
tedci
rc
uitboard
sandrela
ysa n
do pto
-cou
pler
sw her
eeith
erth 凶l
ep u
ti
onde
gree2isapp
lic
abl
ed u
eto
i
nst
al
Jat
ionco
ndi
tion
so rbyho
usi
ngorc o
atin
gw i
thpro
tect
ionfro
mi n
gre
sso
fdu
stan
dm o
ist
ure，t
herequ
ire
ment
s
(E-cEEOZPPESEEmコ

o
fthi
sa n
nexmayo f
ferle
sso
nero
usc o
nstr
uct
ionrequi
remen
ts
T
hea pp
lic
atio
nta
kesa
dva
nta
geo
f"I
nsu
lat
ionc
oor
din
ati
onf
ore
qui
pme
ntw
ith
inl
owv
olt
ages
yst
ems
"
(
IEC6
0664-1
)
D
atastat
edinTableF.1ar
ev idf
aJ o
rove
rvol
tagecat
egor
y1 /
1
11
11
1(non
-ma
ir官 I
main
sc i
rcu
its
)，an
dp o
Hut
iondeg
ree2
(
noconden
satio
nwheni ns
erv
ice
);th
eyarede
rive
df r
omI E
C6 0
664
-1.Thisalt
ern
ati
vem et
hodwid
elymakesuseo
f
i
nsu
lat
ioncoo
rdin
atio
n
田恒OEEto

F.2 Controlofpollutionaccess

Wherethepo
llul
ionlevel
loIhepr
inledci
rcui
lboardassemblieso rIheseparalioncomponents
ヒコO官。Eコ

i
slimi
led10po
llul
iondegree2orbet
ter，reducedseparaliondislancesapplyfor;

Levelso
fPr
ole
cti
on"
ia"and“
ib"s
lal
edi
nTableF
.1;
00口)NEN00白hNCOEECO﹀官一。﹃， OZJE

Levelo
fPr
ole
cli
on“
ic"s
lat
edi
nTableF
.2.

Reducliono
fpo
llu
lio
ndegree2i
sachievedby

aningressprolecl
ionral
ingofIheenclosurepr
oleclingIheprin
ledcir
cui
lboardassemblies
orIheseparalioncomponenlssui
lableforIherequiredins
lal
lali
on，w
ilhaminimumo fIP54
according1
0IEC60529.
The enclosure s
hal
l be subjecled 1
0al
lI he applicable requiremenls f
or enclosures as
providedi
nIEC60079-0w ilhaningresspro
leclionralingofa lminimumI P54
;o r
a
ppli
cal
ion0
1conformalc
oal
ingIype1o 0IEC60664-3，wheree
rtype2according1 ffe
cli
ve
;
or
insl
allal
ionina c o
nlro
lled environmenlwi
lhs uil
ably reduced poll
ulion
;in such case Ihe
五官

required c
ondili
ono fins
l訓l ali
ons hal
l be added 10 Ihe documenlalion provided by Ihe
一 U︺

manufaclurer，andIhesymbol" X"shallbeadded1 0themarkinggiveni nIEC60079-0.

毛 hnEω20υ ︿

COPYRIGHT
 122

F.3 Distancesforprintedcircuitboardsandseparationofcomponents

F
.3.
1 Levelsofprotection .
.
旧
..and"ib"
For Levels 01P ro
tecti
on “旧"and“ ib"，segregation d
istances accordingtoTable F .
1 maybe
usedi nt he cases s
tatedin Clause F.1，providedt ha
tt hecircuit
sa rel imit
edt oovervo
ltag
e
category111
11
11
1(nonmains/mainsc i
rcui
ts)asd efin
edinIEC60664-1.Thiss hallbei n
cludedi
n
thedocumentationprovidedbyt he manufacturerasac ondi
tiono fi ns
tall
ation
.Thec ert
i打cate
number s hall includet he" X"s uf
fix in accordance w itht he marking requirements 01
IEC60079-0 and t hes pe
cilicc on
ditionso f use liste
d on t hec erti
ficat
es h
alldeta
ilt he
ins
tallat
ionrequirements

Separationd istanc
est h
atcomplyw ithTableF .1shallbeconsideredinlal
libl
eands h
allnotbe
subjecttola i
luretoalowerr esis
tance.However，whereredundancy0 1componentsi sr e
quire
d
(I
or example 知的 c apacit
orsi ns e
ries)，s epa
ratio nd i
stanc
e0 1less than thelul
l value but
greatero r equal t
oh allthev alue according to Table F
.1s h
all be considered as a si
ngl
e
countablelault
;nol u
rth
erl a
ult
st obeconsidered

Distance under coating，d is

tance through casti
ng compound and d is
tance through sol
id
insu
latio
ns hall be subjected totype and routinet e
stinga sr equ
iredi n IEC60664-1 and
IEC60664-3，w hileclearanceandcreepagedistancesdon otneedt ypeo rrou
tinet es
ting
.As
rout
inet est
s can o nly be perlormed withgalvanic
ally separated cir
cuis，i
t tis considered
suit
ablet oi ncl
udes pecialt e
st conductors i
nt he design 01t hep rint
edc ir
cuit board l
or
conclusi
ont ha
tt heintendedmanulacturingprocedure( co
ating，pot
lin)wassuccesslu.
g l
(32cEEZFEES﹄

Type tes
tsshal
l be car
rie
do uttakin
gi n
to account t
he most onerous ambient c
ond
iti
ons
claimedlo
rteapparatus，l
h orexamplethemaximumandminimumtemperatures

Compositeseparationsasprovidedi
n6.
3.7s
hal
lno
tbea
ppl
iedwhenu
sin
gTableF
.1
﹀

F
.3.
2 Level01protection “i
c"
雪国 ωozEtEコ

For L
evel0 1P r
otect
ion“i"，reduced segregation d
c ist
anc
es according t
o Table F
.2 maybe
used，providedtha
tthefo
llowi
ngcondi
ti onsapply

I
ft her atedvoltageo ftheapparatus o
rt henominalvoltag
eo fanyp a
rto ftheapparatus
ZEOE200口)

being considered does n

otexceed60V peakvaluenos epar
ati
ond ista
ncerequirements
addit
ionaltot hegeneralind
ust
rialstandardsarerequ
ire
d.Apparatuswithar a
tedvoltageof
over 60V peak up t o 375V peak s hal
l comply wit
ht h
e creepage and clearance
requirementsinTableF .2
NEN

Pro
vis
ionsha
ll be made，ei
the
rintheapparatus o
rex
terna
lt othe apparatus，t
opr
ovi
de
Gω 口hNEOE25

t
hatthec
irc
uitsar
el im
ite
dtoover
vol
tag
ecategory1asd e
linedinIEC60664-1.
﹀王耳目 Z﹂ωEEG-ux
三aEω28︿

COPYRIGHT
 AccessedbyJKCI
cht
hysLNGJ
oin
tVentureon27Dec2012(Documentc
urr
enc
yno
tguaranteedwhenp
rin
ted
)

TableF
. ，
1-Clearances creepagedistancesand separationsforLevelofProtection "旧"and“ ib"when ingress protected ，
and specialconditionsofmaterialand inst
剖 lationarefulfilled

1 2 3 4 5 6 7
Ratedinsulation C[earanceandcreepagedistance Separationdistance Separationdistance Distanceundercoating Distanceunder Minimum
voltage Note2 throughcasting throughs ol
id Coatingtype1 coating Comparative
ACrmsorDC compound insu[ation Note4 Coatingtype2 tracking
Note1andNote5 Note4 index( CT
I)

V mm mm mm mm mm
Overvoltage 1
1
1 1
11 111
1 11
1 1
11111
1
1 1
1
1 1
/11 1
/11
111
1
category
Note3

10 0
.5 ，
。2 ，
。2 ，
。2 0，
5 0，
2 0，
2

50 0，
5 ，
。2 0，
2 ，
。2 0，
5 0，
2 0，
2 100
口O 可︿刀一の工↓

100 1，
5 0，
32 0，
2 ，
。2 0，
75 0，
32 0，
2 100

4Nω
150 3，
0 1，
3 0，
2 0，
2 1，
5 0，
65 ，
。2 175

300 5，
5 3，
2 0，
2 0，
2 2，
75 1，
6 0，
2 175

600 8，
0 6，
4 0，
2 0，
2 4，
0 3，
2 0，
2 275

NOTE1 Voltagestepsa
rebasedont
heR10s
eri
es.Thea
ctu
a[workingvoltagemayexceedt
hevaluegiveni
nth
eta
bl o10%.
ebyupt

NOTE2 I
ncl
udi
ngcomponentsandp
art
sont
hePCB.

NOTE3 Overvoltagecategoryaccordingt
oIEC60664-1.

NOTE4 Coatingtypeaccordingt
oIEC60664-3.

NOTE5 l
ncl
udi
nganyr
ecu
rri
ngpeakv
olt
agef
orexampJew
ithDC-DCconvertersb
utt
ran
sie
ntsmayben
egl
ect
ed.
 AccessedbyJKCI
cht
hysLNGJ
oin
tVe
ntu
reon27Dec2012(Documentcuπencyn
otg
uar
ant
eedwhenp
rin
ted
)

TableF. ，
2-Clearances creepagedistancesandseparationsforLevelofProtection "ic"
when ingressi
sprotected byanenclosureorbyspecialconditionsofinstallation

1 2 3 4 5 e 7
Voltage Clearance Separationdistance Separationdistance Creepagedistance Distance Comparativetracking
(peakvalue) through throughsolid undercoating index(C
TI)
mm castingcompound insul
ation
V mm nm
引

mm mm
90 0，
4 0，
15 0，
15 1，
25 0，
3 100
190 0，
5 0，
3 ，
。3 1，
5 0，
4 175

. . .
375 1，
25 0，
3 0，
3 2，
5 0，
85 175
>375 1
食 ・
1
・'
NOTE1 Fordistancesmarked山
， novaluesarea
vai
lab
lep
res
ent
ly.

NOTE2 Evidenceo
fcompliancew
itht
heCTIrequirem巴 n
tso
fin
sul
ati
ngm
ate
ria
lsshouldbep
rov
ide
dbyt
hemanufacturer.
口O刀︿刀一の工↓

4Mh#
 125

AnnexG
(normative)

Fieldbusintrinsicallysafeconcept(FISCO)一
Apparatusrequirements

G.1 Overview

This annex c
onlai
nsI hed et
ailsoft hec on
stru
cti
ono fapparatus f
or use w
iththe Fieldbus
Int
rinsi
cal
lySafeConcepl(FISCO). ItisbasedonI heconceptsofManchesterencoded，bus
powered syslems designed in accordance w
ilh IEC61158-2 which isIhep h
ysicall ayer
standardforFie
ldbusin
stall
atio
ns.

Thec onsl
rucli
onalrequiremenlso fFISCOapparalusa r
edelerminedbyIhisslandardexcept
asm odi
fiedbyI h
isannex.P arlofaF ie
ldbusdevicemaybep rotectedbyanyofIhemelhodso f
explo
sionp r
oleclio
nl i
sle
di nIEC60079-0， a
ppropr
iatetoIheEPLo rZoneo fintendeduse.In
Ihesecircumstances，Iherequiremenls o
fI hi
s annex a
pplyonl
y1 0I h
alpar
lofI heapparalus
dir
ecl
lyconnecledt otheint
rinsi
cal
lysafet r
unkors pu
rs.

NOTE1 Cer
tif
ica
tio
ntoth
eFISCOreq
uir
eme
ntsdoe
sn otpre
venta
ppa
rat
usa
l60b
ein
gce
rt
if
ie
dan
dma
rke
din
t
hecon
ven
tio
nalmanner5
0tha
tth
eymaybeusedi
nothe
rs y
stems
(EMCEEZ言EECE雪国wOEEtEコ

NOTE2 At
ypi
cals
yst
emi
ll
us
tr
at
in
gth
ety
peso
fFISCOa
ppa
rat
us1
ssh
owni
nFi
gur
eG.
1

G.2 Apparatusrequirements

G
.2.
1 General

Apparalus s
hal
l be conslrucled i
n accordancew
ilhI
hisstandard exceptas m
odi
fie
d byt
his
annex

Theapparalusdocumentations
hal
lc onf
irmI
hateachapparalusi
ssu
ita
blef
orusei
naFISCO
systemi
naccordancew ilhIEC60079-25
OMEEコ

G.2.2 FISCOpowersupplies
υo口)

G
.2.
2.1 General
NFO
No

Thepowersupplys h
allei
lhe
rber es
isl
ivelim
ile
do rhaveaI r
apezo
idalorrec
tang
ularoulpul
ω 口hNCOE25﹀室。﹁OZJ主主主ω

ch
arac
teris
lic.Themaximumo utpu
tv ol
lageUoshallbeint
h erange14V 1017，5V underthe
con
ditio
nss p
ecif
iedi
nIhi
sslandardforIhere
specli
velev
elofprot
ecli
on.

Themaximumunprolecledin
ter
na iandinductanceL
lcapacilanceC ish
allben
otg
rea
lerthan
5nFand10μH，respective
ly

Theoutputc
irc
uilfromt
hepowersupplymaybeconnecled1
0ea
rth

G
.2.
2.2 i
Additionalrequirementsof‘a
'and'
ib'FISCOpowersupplies
一UX﹁EEB8u︿

Themaximumo ul
putcurr
ent' 0fo
rany' i
a'o
r' i
b'FISCOpowersupplys h
allbedelerminedin
accordance w
iththi
s slandard bulsh
alln ot exceed 380 mA. For re
cta
ngu
lars uppli
es，
TableG.1 maybeusedforassessmenl

COPYRIGHT
 126

TableG.1-Assessmentofmaximumoutputcurrentforuse
with‘
ia
'and' i
b'FISCOrectangularsupplies

U 。 P
ermi
ssib
lec u
rre
nt，f
orII
C P巴 r
missi
blecu
rre
nt，f
orI旧
(i
ncl
ude
s1 5s
， afe
tyfa
cto
r) (inclu
des1，5s
afe
tyfa
oto
r)
v mA mA
1
4 1
83 3
80
1
5 1
33 3
54
1
6 1
03 2
88
1
7 8
1 2
40
1
7，5 7
5 2
13
NOTE Thet
wol
arg
estc
urr
entv
alu
esf
orr
rBa
red
eri
vedf
rom5，
32W

Themaximumo
utp
utpowerPos
halnotexceed5，
l 32W

G
.2.
2.3 Additionalrequirementsof'
ic
'FISCOpowersupplies

The maximum o ulpu

lc ur
renl'
0for an '
i
c' FISCO power supply sh
all be determined i
n
accordancew i
lht
hissla
ndard
.For'
i
c'FISCOr ect
ang
ularsupp
l iesTableG.2maybeusedf o
r
assessηlenl
(302zaEω

TableG.2-Assessmentofmaximumoutputcurrentforuse
with‘
ic
'FISCOrectangularsupplies

。
￡pp司O

U P
erm
iss
ibl
ecu
rre
nt，f
orI
IC P
erm
iss
ibl
ecu
rre
nt，f
or1
18
V mA mA
OMC句﹄国コ国“ozhozω ヒコωMCOEコ00

1
4 2
74 5
70
1
5 1
99 5
31
1
6 1
54 4
32
1
7 1
21 3
60
1
7，5 1
12 3
19
NOTE Themaximumo
utp
utp
owe
rpof
rom'
i
c'FISCOp
owe
rsu
ppl
iesi
sno
tre
str
ict
ed
口)NFDNOω口 hNCOω﹄コ手。﹀叫己一。﹁臼Z4mhz-zo

G.3 FISCOf
iel
ddevices

G
.3.
1 General

These requirementsapply10apparatus o
lherIhanthepowersupply，te
rminal
orsandsimple
apparalus connected 1
0 Ihe i
nlr
insi
cal
ly sale bus whether i
nsl
all
edins
ideo ro
uts
ide the
hazardousa r
ea.

Therequirementsa
reasl
oll
ows
)
auιunu

l
iel
ddevices s
hal
lhaveminimumi
npu
tvo
lta
g 1U
eparameter0 ;
:17，
5V;
))
u

thebust
erm
ina
lss
hal
lbei
sol
ate
dIrome
arl
hinaccordancew
itht
hiss
tan
dar
d;
一
x -，ha可。的ωω00︿

t
he bust ermi
nals0 1separ
atelypoweredl iel
d devicesshal
l be ga
lva
nic剖 I
yisola
tedIrom
oth
er sources 01 power i
n accordance wi
lht hs standard，so as t
i o ensure t
hat these
t
erminalsremainpassiveandm ul
tipleear
thing01t hebusisa v
oid
ed;
d
) themaximumunprotectedin
ler
nalcapacitanceC
i0 1eachliel
ddeviceshal
ln otbeg r
eater
than 5nF. No sp
eci
licat
ion01 the inp
ut and in
ter
nal parameters i
sr eq
uired on the
cer
til
ica
leorla
bel
;

COPYRIGHT
 127

) undernormalo
e rfau
ltcondilionsassp
ecif
iedi
nthisslandardt
hebuslerminalssha
llremain
passive，I
halisIheterminalsshal
lnolbe asource o
fenergytothe system exceplfo
ra
leakagecurr
entnotgrealerIhan50μA;
η f
iel
ddevicess
hal
lbea l
local
edal ev
elo fpro
tec
tio
nandbes
uit
abl
efrEquipmentGroup1，
o
I
ICo r1
1
1oranycombinationofthesegroups;
日
) Group IICfi
eld devices intended to be install
edwit
hinI h
e hazardous area sha
ll be
lempe旧 t
urecla
ssifie
d. Group 11
1 devices intendedt
o be i
nsla
lle
din the hazardous area
s
hal
lbea
llo
cat
edamaximumsurfacetemperature

G.3.2 Additionalrequirementsof'
i'and‘
a ib
'FISCOf
iel
ddevices

Thea
ddi
tio
nalrequiremenlso
f'i
a'and'
ib
'FISCOf
iel
ddevicesa
reasf
oll
ows

a
)fi
elddevicess
hal
lhaveminimumi
npu
lparamelerso
f';
:38
0mAandP
i:5，
32W;
b
) f
iel
ddevicess
hal
lhaveai
nte
rnlinduclanceL
a inotgrealerthan10μH.
G.3.3 Additionalrequirementof'
ic
'FISCOf
iel
ddevices

The a dd
ilio
nal requiremenl o
f'i
c
' FISCO f
iel
d devices i
sIh
al Ihey s
hal
l have an i
nte
rna
l
induclanceLInotgrealerthan20μH

G.3.4 Terminator

The li
nelerminalors r
e quired byIhe syslem shall comprise a r
esisl
or -
capa
cit
orcombinalion，
(EMCEEZBEB言語コ四百EEtE吉官。Eコ0 0口}NENooロ

which presents ali

ls terminals a c
ircu
il equivalenl 10ar esis
loro f minimum value 90Q in
seri
esw il
hac ap
acit
oro fmaximumvalue2， 2μF( includ
ingloleranc
es)

NOTE1 I
EC6
115
8-2s
pec
ifi
est
hec
omp
one
ntv
alu
esn
ece
ssa叩 f
oro
per
ati
ona
lre
aso
ns
a
) Theterminalors
hal
l;
b
) bea
llo
cal
edal
eve
lofp
rol
ect
ion
c
) bes
uil
abl
efrEquipmenlGroup1
o ，1o
r11
1oranycombinationoflhesegroups;
1
) Group I I
Cf i
eld devices inlended 1
0 be i
nst
all
edw
ilh
inI
he hazardous area s
hal
l be
lemperatureclas
s i
fied
) Group1
2 11fi
elddevicesintendedt obei
nsl
all
edi
nthehazardousareas
hal
lbea
llo
cal
ed
a町laximumsurfacelemperature.
d
)Ifthecap
acit
ivecomponent(s)areconsideredtobea
ble1
0fa
ilt
ocr
eat
eas
hor
lci
rcu
itthen
ther
equ
iredpowerralin
go fthere
sisl
orsis5， 1W;
)
e)

haveani
nptvollageparamelerU
u inoll
essIhan17，
5V;
nリ 何 回

bei
sol
ale
dfrome
arl
hinaccordancew
ithI
hisstandard;and，
ドNZOEEE﹀室。﹁臼Z4mEEG-ux

haveamaximumunprotectedi
nle
rnlinduclanceL
a inotgreaterthan10μH;
NOTE2 T
het
erm
ina
tor
smayb
ein
cor
por
ate
dwi
thi
nfi
el
dde
vic
eso
rpo
wers
upp
lie
s

NOTE3 Fo
rs af
etyasse
ssmen
tp ur
pos
es，t
hee
ffe
cti
vec
apa
cit
anc
e，C
j
'oft
het
erm
ina
tori
sco
nsi
der
edn
ott
o
a
ffe
ctt
hei
nt
rin
si
cs a
fet
yofth
es ys
tem

G.3.5 Simpleapparatus

Therequiremento fsimpleapparatususedi nani n

lri
nsic
all
ysafesystemi sthalI h
eapparalus
sha
ll comply w i
lhI hi
s standard. A
ddit
ion
allyI helola
l inductance and capacitance o
f each
simple apparatus connected to a FISCO syslem sha
ll not be greate
r than 10μH and 5nF
三D E耳目υ︿

respec
tively

NOTE C areshou
ldb etak
eninte
mpe
ratur
ec J
ass
ify
ingoraJ
loc
ati
ngamaximumsu
rfac
etem
per
atu
retosim
ple
ap
paratu
sw i
thi
na n'
ia
'or'i
b's
yst
emsinc
et h
ema別 mump ow
erav副 l
abl
emaybeashi
ghas5，
32W.Tem
per
ature
c
lass
ifi
cat
ionofan'i
c
's y
stemi
sdonei
nnormalop
erat
ion

COPYRIGHT
 128

G.4 Marking

Eachp iec
eo fapparatussh
allbemarkedw iththeword“FISCO"follo
wedbyani n
dicat
ionofits
fun
ction，i
.e.powersupply，fi
elddeviceo
rtermi
nator
.Ina dd
itin，eachp
o iec
eofapparatusshall
be marked in accordance wih IEC60079-11，except where m
t o
difie
d by t
his annex. For
example，themanufactur
er'snameandaddresss hal
lst
il
lbemarked

Where apparatus i
sd ual marked so t
hatit can be used i
nb oth a FISCO system and a
conven
tio
nali nt
rin
sic
all
ys afesystem，caresha
l lbetakentod if
fer
entia
tebetweent heFISCO
markingandt h
emarkingf o
rt heco
nv e
ntion
alintri
nsi
cal
lysafesystem

For FISCO power s

uppli
es，o ut
put parameters Uo''' Co，LoτPo and LolRo need n
0 o
tbe
marked.ForFISCOf ie
lddevicesort erm
inators，in
putandint
ern
alparametersU
i'li'Ci
'Li'P
i
andL i
lRineednotbemarked.

G
.4.
1 Examplesofmarking
) Powers
a upply
FISCOpowersupply
Um:
250V
[
Exi
a]I
IC
JohnJonesL
td
SW992AJUK
-Ea {唱。

Type:DRG001
﹄ z

-20oC豆 Ta豆 +50o

C
oz言明u

PTBNr01A2341
ωω芭EEs 回目O

S
eri
alNo.014321

)F
b i
eldd
evi
ce
Ehw
u

FISCOf
iel
ddevice
tω﹂
=

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COPYRIGHT
 130

AnnexH
(informative)

Ignitiontestingofsemiconductorlimitingpowersupplycircuits

H.1 Overview

Powers u
ppl
iesareane s
senli
alile
minanye le
clri
calcir
cu .WhereI
il h
epowerissu
pplie
d10
in
lri
nsi
cal
lysafec
irc
uil
sl oc
ale nhazardousareas，I
di h
eo ulp
ul01Ih
epowersu
pplysho
uldbe
in
lri
nsi
cal
lysal
e

NOTE1 Fort
hepur
pose
softh
isann
ex，t
heter
mιp
owers
upp
ly'isagene
rict
erm
.tImayb
ededi
cat
edequip
men
t
t
hatpr
ovi
desi
nt
ri
ns
ic
al
lysaf
epowe
r，andt
iaJ
somaybeacur
ren
tr e
gul
ato
roravol
tag
eenh
anc
ementci
rc
ui
twHhi
n
equ
ipm
ent
NOTE2 T
hisa
nne
xre
fe
rso
nlyt
oth
ein
tr
in
si
ca
ll
ysa
feo
utp
uto
fth
epo
wers
upp
ly

The earl
ieslinlr
ins
ica
llysale powers u
ppli
esc onsi
s l
ed0 1a ninl
all
ibl
eIransl
ormer，re
cli
lier，
smoolhingcapacil
or，loll
owedbyac u
rrenll
imi
lingresi
slor1
0l i
milIhemaximumo ul
pulcurrenl
.
Theo ulpu
lv ol
lagewasI hevollageonIhesmoolhingc a
paci
lorundernol o
adc on
dilio
ns，orIhe
voll
agea cro
ssI heshunlconnecledZenerdiodesIhallim
ilIhemaximumo ulp
ulvollag
e.

The c ur
ves and lable
si n Annex A are based on Ihev o
llages，c urren
ls，c ap
acilances and
(32EzaEω 工 言 刀OOHEE国コ回 MozhoEωヒコ OMCOE2uo

induclanceslesledonI hesparkl e
sla p
paralusu sin
gsuchs implepowers upplyci
rcui
ls，wilh
noi gn
ilion
sp ermi
ttedf or400r ev
olul
ions0 1Ihesparkl es
la ppa
ralusu sing4l ungs
lenw ire s
wil
h cadmiumd i
sk.M alhem
alica
lly，assumingI hal1600s parkshaveo ccurr
ed，ilmeansI h
a l
Iheprobabi
lil
y0 1igni
lion(basedonnumber0 1ignilio
nso b
l副 ned)onanopeningo rclosin
g0 1
Iheo ulp
ulc onnecli
ons0 1I h
e power supplyisl es
sI han 6，25 x 10-04 Acluall
y，due 10I h e
bouncing0 1IhelungslenwireonI hecadmiumd isk，anddue1 0Ihes l
olsonI hecadmiumd isk，
Ihenumber0 1sparksismuchh igh
er.Therelore，
Ihea clu
alp r
o b
abili
ly0 1ign
ili
onislower
.

8asedon e m
pirica
ld ala，i
lhasbeen seenI h
ala p
lol01logari
lhmic01p r
oba
bili
ly0 1igni
lio
n
versusI helogarilhm
ic0 1curr
enlinI hecir
cui
lshows a li
nea
rr ela
lions
hip(seeF igur
eH .1)
8asedo nI her e
quireme
n ls01Ihi
ss ta
ndar
d，powersuppli
es(Io
r“ i
a"and“ i
b"
)a reconsidere
din
compliancew i
tht heslandardonl
yiftheyaresparktes
ledusin
g1， 5timesthecurren
tI ha
lI he
y
wouldn orm
allyp rovi
de，wilhIh
et es
tgasb e
ingI h
ats
pecil
iedlo
rt hepar
licul
argroup
口)NFDNOωロ

8ased on I
her ela
tion
shi
pofpro
babi
lity and c
urrentdes
cri
bed above，such a powers
upp
ly
wouldhave，alnormalcur
ren
t，apr
obab
ilil
y0 1ig
nit旧 nl
ess
erIha
n1， 16x10-0
6
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I
nsummary，o nlysuchpowersupp
lie
sareconsi
der
eds a
tis
lac
loryI
hatprov
ideapr
oba
bil
ity01
i
gni
lio
n on an opening o
rclos
ing01th
eo ul
pulconn
eclio
ns0 1Ih
e powersup
plyalnormal
c
urren
tandv o
lt a
ge0 1le
ssIh
an1，16x10-0
6

La
lerdevelopmenlsinI hed esi
gn0 1powersuppl
iesi nl
roduced complex c
irc
uitsIh
alp rov
ide
i
ntri
nsi
cs al
etynolo n
lybyI h
el imi
lal
ion01cu
rrent，vol
tage，indu c
tanceandc a
pacil
ance，b u
t
al
sob yIheuse0 1arl
ili
cia
ll i
mita
lio
n0 1dis
char
ged ur
al旧 norl im
ilali
on01v ol
tagechangingat
sw
itchc o
nlact
s.C o
nvenliona
ll est
su sin
gIhesparklestapparalusbecameu nsa
tis
lactor
ydue
t
os eve
ralreason
s:

• i
lisn oteas
ilypo
ssibl
e1 0inc
rea
sethecurr
enlorvolta
geinIhepowersupp
lyt oprov
idet
he
necessary1，5s
alet
yl ac
tor，a
sIhec
ircu
itsinmoslcasescannolbeea
sil
ya ll
ered，
• I
hes u
pplycannotd
eli
verI
hei
ncr
eas
edc
urr
ento
rvo
lla
gedue1
0li
mit
ati
onsi
nth
era
lin
gof
i
lscomponenls，
• changesmade10Ihepowersupplytop
rovideanincreas
einI
hec
urr
enlo
rvo
lla
gea
lte
rsi
t
s
lim
ingcir
cui
tsandhencechangesil
scir
cui
lperlormance

COPYRIGHT
 1
31

n such cases，i
I t was g eneral
ly considered sati
sfact
oryt op rov
idet hes afe
tyf act
or by
increas
ingt hesen
sitiv
ityofthet es
tgasm ix
ture，usingthemix!uress p
ecifiedas' safe
tyfa c
tor
1，5
'.Thei n
!en!
ionwas! ha
!! hepowersupplywouldbe! es
!edwith! heincreaseds a
fe!yfa c
!or
of! h
et es
tgasm ixt
uret oshowt hatnoi gni
tiontookplacei nthe400r evo l
utio
nso fthespark
te
s tapparatus，hencep rovin
gt hatthei g
nitio
np r
obabi
litywasl essthan6， 25x 10-04 I
twas
hence assumed t hat under normal cond
itions，thei gn
itionprob
ability would be less than
1，16x10-0 6.

However，it has been found th

ati n some cases，t h
at although !
he power supplyhas been
testedfortheig
niti
onp ro
babi
lityofl e
s sthan6，25x10-0 4w iththegasm ixtu
reo fsafet
yf a
ctor
1，5，i
td idnotprovide!heigni
tionprobabi
lityof1，16x10- 06atnormalc on
ditionsbecausethe
powersupply didn otfollowthel ine
arr elat
ionsh
ipo flogarithm
ico fi
gni
t旧 np r
obab
ilitywit
h
logar
ithmicofcurrent
.Thishascausedconcern，andsuchpowersuppliesarenotconsidered
asp rov
idingan'accept
a b
lylowp ro
babilityofign
iti
on'atnormalc urrent
.

This annex p
rovidesth
et es
t methods f
ortestin
g such complex powersup
plies
; at
estgas
mixturewit
hincreaseds
ens
itivi
tyi
susedt oachievethesafetyfa
ctor(see1
0.1.3
.2)

I
tr equ
irestes
tingusingatestgaswi
ths a
fetyf
acto
ro f1，
5，andensuringt
hatnoi gnit
iontakes
placein 400revol
utio
ns.Thistes
tisdonet oensuretha
tthenormativerequirementsofthis
Standard，asspe
cifie
di n1
0.1.
4
， arefol
lowed
.

I
tthenr e
quiresfurthe
rt es
tstoensuret hatthec ir
cuitexhibi
tsar elation
shipbetweenp rob
abilit
y
ofi g
nitio
n ands afetyfactoroft hetestgast oensuret hatatnormalc urrentandu ni
tys afe
ty
factorgas，t heacceptablylowi gni
tiono f1，16x10- 06i sachieved.Thisi sdonebyt e
stingthe
(USE-﹂

powersupplyw it
hgasm ixtur
esw ithsafetyf acto
rso fSFx=1， 5，SFy= 2，0，SFz= 2，5
.Thep lot
acmwZB官富山C E句コ四百Ehozωヒ

ofp r
obabili
tyo fign
itio
nands afetyfactoronal og-Iogs caleistaken.Itist est
edt hateithe
rno
igni
tionhastakenp laceattheses afe
tyf actors，orifigniti
onshavetakenp lace，theslopeo fthe
semiconductorl imi
tedpowersupplyi sgr e
aterthant hatforsimplec i
rcui
ts.Also，t ha
tt heslope
oft he semiconductoriImited supply continues !o increase as thes afetyfactoris reduced，
hence ensuringt hatatnormal c urrentandu nitys af
et yfact
or，t h
ei gnit
i o
np rob
abilityisl es
s
thant h
atf o
rasimplec i
rcut，t
i hatis，lessthan1， 16x10-0 6

Thisannexi ssuitab
lef o
rsemiconductorcurr e
nto rvolta
geiImitedpowers uppliestha
tlimi
tor
shutthec urr
entwhent hec ur
rentorvoltag
el imitisexceeded，b utrecoversuffi
cie
ntlyrap
idl
y
コ OMCωEコuo口)NFDN00

betweent hesuccessivest r
ikesoropeningoft hewireandd i
sco fthesparkt e
stapparatusso
thattheyregainnormalo peratio
nbeforethenexts tr
ikeoropeningo ft hewire
.Thisannexi s
nots u
itab
lef orsupplie
st h
ats wi
tchofffor extended peri
odswhent hec ur
rento rvoltag
eis
exceeded.Insuchcases， AnnexEmaybea p
p li
cable.

H.2 Test
ロド NC022EO﹀芭百可臼 ZJω 為昌吉一日UV﹃﹀a宮山 ωωouu︿

Thepowersupplyshouldbet
est
edusingt
hesparkt
estapparatusf
ort
hef
oll
owi
ngcases:

• 400 revolu
tio
nsu
sin
gte
s!gas m
ixt
urep
rov
idi
ng as
afe
tyf
act
o f1，
ro 5，w
ith no i
gni
tio
ns
observed;and
• f
urt
hertes
ts as provided i
n Table H
.1，t
o ensure t
hatthe p
rob
abi
lityofi
gni
tio
natu
nit
y
s
afetyf
acl
orwouldbeacceptableandlowerthant ha
tf o
rasimpleci
rcu
it

Some ofthe gas mix!ur

essuit
abl
efo
rt he above t
ests，and the corresponding c
ali
bra
tin
g
cu
rre
ntsusingthestandard24V95mHcal
ibrati
ngcir
cuitareprovidedinTableH.2

ReferencetoDUTi nth
etes!sequenceofTableH .
1r ef
erstodeviceunderte st
.Iti
st hepower
sourcewith
int eequipment，w
h ithfau
ltsapp
liedaspert h
eleve
lo fpro
tecti
o n，andt h
ev ol
tage
andc ur
rentse!att hemaximumvalueswith
int h
etolerancesofthecir
cui
tcomponents.Safety
fac
torsaren o
ta pp
liedtoth
ec u
rrentorvo
ltage，becausetheseareapplie
dt ot h
et e
stgases

COPYRIGHT
 132

Wheretet
h es
tsequencedescribedi
nTableH.lrequirestheuseo fasimplecir
cut，i
i tw
il
lbe
madeupofal abo
rat
o r
ypowersupplywi
thavolta
ges etatt heUooftheDUT，ands hortcir
cui
t
cur
ren
tlimi
tedto10oftheDUTbyuseo faser
ieslow-inductancec
urre
ntlimi
tin
gresist
or

TableH.3i sanexampleo fac irc

uitIha
lpassesI heleslsequence ofTableH .
l.Thep lolof
th
isc ir
cui
li sprovide
di nFigureH.l，label
led' P
rー TableH.3-PASS'.Whent hepl
otoft h
is
cir
cui
liscomparedw iththeplo
tf o
rasimplec irc
uit，lab
elled‘
Pr-SimpleC i rc
ui，
'titshowsthat
whileIherea re more ig
nit
ion
swhen t hes afe
lyf act
ori shig
her，at 1，67 and2， 5，butasI he
safet
yf act
orisreduced，t heprob
abil
ityreducesf asl
erI hanf
orasimplec i r
cuil，andIher
efore
hasanac ceplablylowf i
gur
easI hesafetyfac
lorwoulddrop1 0uni
ly

TableH. 4isanexampleo fac ir

cui
lI haldoesn otpassI heleslsequenceo fTableH .
l.The
plo
lo fIhi
sc i
rcui
lisprovidedinF ig
ureH .l，labe
lled'Prー TableH. 4-F AI
L'.WhenI hep l
olo f
Ih
isc i
rcu
iliscomparedw ilhIheplolforasimplec ir
cui
l，labell
ed‘ Pr-SimpleCir
cui，
'
tilshows
Iha
lw hil
eI her
ea rel e
ssi g
nil
ion
swhenI h
es a
felyfaclo
rish igher，al1，67and2，5，bulasI h
e
safet
yf acl
oris reduced，Ihepro
babili
tydoesn olreducef a
slerI hanfo
rasimplec irc
uil，and
Iher
eforeildoesn olsloe1
p 0anacceplablylowfigur
easI hes afe
tyf a
ctrwoulddrop1
o 0unil
y
(ECECEBus-EE雪国百三E E2
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NFD
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COPYRIGHT
 AccessedbyJKCl
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TableH.1_ Sequenceoftests

Slep# Description Column'

x' Column'
y' Column'
z'
Targets
afe
tyf
act
or 1，
5 1，
67102，
0 2，
0102，
5
2 Determinationo
ftar
getc
alibr
ation 仁
(
cal
ibr
ati
on_curren (
cal
ibr
ati
on 仁
_curren (
cal
ibr
ati
on_current_
curr
entf or24V 95mHcali
brati
on
ci
rcui
t provided_in_Table乃 provided_in_Table乃 provided_in_Table7)
仁Saたty_Factor)
(Targe 仁Saたty_Facωり
(Targe (Target_Safety_Factor)
3 Testgasused UseTableH.2i
fus
efu
l UseTableH.2i
fus
efu
l UseTableH.2i
fus
efu
l
4 C
ali
bra
tio
ncu
rre
ntachieved Measureu
sin
g24V95mHc
ali
bra
tio
n Measureu
sin
g24V95mHc
ali
b悶 t
ion Measureu
sin
g24V95mHc
ali
bra
tio
n
ci
rcu
it ci
rcu
it ci
rcu
it
5 Safetyf
acto
rachieved(s
houl
dbe SFx= SFy= (
Cal
ib用 t
ionc
ur用 nし
with
inrangesp
ecifi
edinStep1) (C
ali
b用 tion_cu
庁 en仁 (C
ali
bra
tio
n_c
urr
ent
_
provided_in_Table刀
p
rovided
_in_Tab
le7
) SFz=
provided_in_Table乃 (
Cal
ibration_Current_Achieved)
(
Cal
ibr
ati
on 司j
_Current_Achieve (
Cal
ibrat
ion
_Curr
e n
t_Ach
iev
ed)
口O可︿河一の工↓

6 Numbero frevo
lutio
nsf
orDUT 4000 400 40

4
ω
(DeviceUnderTes
t)

ω
7 Numberofsparksassumedf
orabove 16000 1600 160
numbero
fr e
voluti
ons
8 DUTt es
tedf
ornumberofrev
oluti
ons Nx Ny Nz
atStep6andnumbero fig
nitio
ns
obtained
9 P
roba
bilit
ybasedonnumbero f Nx Nz
Py= Ny PZ=ー
一一
ー
i
gni
tion
spersparkobtained PX=ー
一一一
一一
16000 1600 160

10 P
oss
ibl
ecompliancer
esu
lt l
fei
thrPX=0，
e rPy=0，o
o rpz=0，t
heDUThaspassed.I
faJ
[ar
ent0，thencontinuet
o oStep1
1
1
1 Simplec i
rcu
it(madeupo flaborato
ry Na Nb Nc
powersupplyandc u
rrentlimi
ting
resi
stor)tes
tedasprovidedinStep8
above，andnumbero fignit
ions
obtained
12 ProbabiJ
iybasedonnumbero
t f Na Nb Nc
igni
tionspersparkobtainedf
orth
e Pa=ー
一一一
ー Pb= PC=一
一一
一
simplecircu
it 16000 1600 160

13 Compliancec
alc
ula
tio
n TheDUThaspassedi
fth
efo
llo
win
gco
ndi
tio
nsa
reme:
t
(
109p
x)s(
109P
a)，orPX"Pa
 AccessedbyJKCI
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Step# Description Column'

x' Column‘
y' Column'
z'

(
109Py-1
09P
x)ミ (
10
9Pb-109P
a)，orー
Py一三 pb
PX Pa

(
I
(
o
1
0仲 -Iog似) ， (logPzーlogm orpPyx
gSFy-IogSFx) (
IogSFz-IogSFy)
Lj 陶
器 亙(
;
;rま
口O可︿刃一の工↓

ω
4
ム
 135

TableH.2- Safetyfactorprovided byseveralexplosivetestmixtures

thatmaybeusedforthetestsi n TableH.1

Compositionsof Currentinthe Safetyf

act
orf
orgroupandsubgroupofe
lec
tri
cal
explosivet
e5tmixtures， calibrat
ion equipment
明 byvolumei ntheair circ
uit，
mA I
IA 1
18 I
IC

(
8，3土0，
3)弘 methane 110-111

(
5，25土 0，
25)%propane 100-101 1，
089-1，
11 1

(
52土 0，
5)% hydrogen 73-74 1，
49-1，
52 35・1，
1， 38

(
48土
日，5
)% hydrogen 66-67 1，
64-1，
68 1，
49-1，
53

(
7，8 土0，
5)% ethylene 65-66 1，
67-
1，7 1，
52-
1，55 1

(
38土 0，
5)% hydrogen 43-44 5
2，-2，
58 2，
27-2，
35 1，
47-
1，53

(
21土 2
)% hydrogen 30-30，
5 6-3，
3， 7 3，
27-3，
36 13-2，
2， 2 1

(
60土0，
5)%hydrogenl 20-21 5，
23-5，
55 4，
765，
05
句 3，
09-3，
3 1，
42-
1，53
(
40土0，
5)%oxygen

(
70土 0，
5)%hydrogenl 15-15，
3 1，
96-2，
03
(30土 0，
5)%oxygenunder
t
hepressureo
f 0，22MPa
(32zzaEω 53ωECE伺コ田u
、
工
oc、
stoと20言。 E コ00口)NFDNGO白ド NZOEEC@
﹀吉一。﹁白 ZJω、
円
五ε
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UXdhS30ωωω00
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Table H.3_ Exampleofa GroupIcircuitwithcharacteristicsdescribed byCu刊 e 1

1ofFigureH.1_
This passesthetestsequenceofTableH.1

Step# Description Column'

x' Columnγ Column‘
z'
1 Targets
afe
tyf
act
or 1，
5 1， o2，
67t 0 2，
0to2，
5
2 Determinationo
fta
rge
tca
l i
brati
on 110 m A 110 m A 110 m A
curr
entf or24V95mHcaJibra
tion =73mA =66t055mA =55t044mA
ci
rcui
t (
1.5
) (1.67
_to_2.0) (2.0_¥0_2.5)

3 Testgasused 52弘 H2:48% a

ir 48% H2:52% a
ir 38悦 H:
，62鳴 air
4 ib
CaJ r
ati
onc
urr
entachieved 73mA 66mA 44mA
5 Safetyf
acto
rachieved(s
houl
dbe (110_mA) (110_mA) (110_mA)
with
inrangesp
ecifi
edinStep1) SFx= '
._ . =1，
. 5 Okay SFy= .__ . =1，
_ 67 Okay SFz= ..
. =2，
5 Okay
(73_mA) (66_mA) (44_mA)

LogSFx=0，
17609 LogSFy=0，
22272 LogSFz=0，
39794
6 Numbero frevo
lutio
nsf
orDUT 4000 400 40

一
、。
(Deviceundertes
t)
口O可︿刀一の工↓

7 Numberofsparksassumedf
orabove 16000 1600 160

ω
numbero
fr e
voluti
ons
8 DUTt es
tedf
ornumberofrev
oluti
ons Nx=1i
gni
tio
n Ny=9i
gni
tio
n Nz=80i
gni
tio
n
atStep6andnumbero fig
nitio
ns
obtained
9 Pr
obabi
lit
ybasedonnumbero f 9 80
i
gnit
ionspersparkobtained PX=一一一ーーー=6.25X 1
0-
5
Py=一一一一-=5，
6x103 ・ pz=一一一一=5
.0x101 ・

16000 1600 160

4，
LogPX=- 20412 2，
LogPy=- 25181 0，
Logpz=- 30103
10 P
oss
ibl
ecompliancer
esu
lt . 0，
Px-
:
f . 0，
Py-
:
f .0，
pz-
:
f th
ere
for
econtinuet
oStep1
1
1
1 Simplec i
rcu
it(madeupofl ab
orat
ory Na=10i
gni
tio
ns Nb=3i
gni
tio
ns Nc=32i
gni
tio
ns
powersupplyandc u
rre
ntl i
miti
ng
resi
stor)test
edasprov
idedinStep8
above， andnumberofign
itio
ns
obtained
12 Prob
abili
tybasedonnumbero f 10 3 32
ign
itio
nspersparkobtainedf
orth
e Pa=ーー一一一一=6.25x104 ・ Pb=一
一一一一 =1.88x103 ・ Pc=ー
ーーー =2.0x101 ・

Simplecirc
uit 16000 1600 160

3，
LogPa=- 20412 LogPb=ー2，
72584 0，
LogPC=- 69897

13 Compliancec
alc
ula
tio
n TheDUThaspassedbecause:
(
[ogPx)豆 (
IogPa)?Yes，because -
4，20412<-
3，20412
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Step# Description Column'

x' Column'
y' Column'
z'

(
10
9Pyー 109Px)ミ (
109Pb-
109Pa)つ
Ves，because (
-2，
251
81+4，
204
12=+
1，9
523
1)>(
-2，
725
84+3，
204
12=+
0，4
782
8)
(
log
Py-logPx) (logPz-logPy)
〉 つ
(logSFy-logSFx) (logSFz-logSFy)

{(42m1+仰 引 2
) ω寸
ミ {(W103+m1811-111333
V
esι，because'
1
.'(
0，
22272_0，
17609) ，
---J - • (
0，39794-0，
22272)

一
、ω
ロO 勺︿司一Q↓

吋
Z
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TableH.4 四 Exampleofa GroupIcircuitwithcharacteristicsdescribed byCurve1

11ofFigureH.1 _
ThisdoesnotpassthetestsequenceofTableH.1

Step# Description Column'

x' Column'
y' Column'
z'
1 Target_saf
ety
_fa
cto
r 1，
5 67102，
1， 0 2，
0to2，
5
2 Determinationoft
arg
etc
alibr
atio
n 110 m A 110 m A 110 m A
curr
entf or24V 95mHcali
brati
on =73mA =66t
o55mA =551044mA
ci
rcui
t (
1，5
) (
1，67_10_ 2，
0) (2
， 5
0_10_ 2，)
3 Test_gas_used 52% H2:48切 a
ir 48切 H2:52怖 a
ir 38% H2:62% a
ir
4 C
ali
bra
tio
ncu
rre
nt achieved 7
3mA 6
6mA 4
4mA
5 Safetyf
acto
rachieved(s
houl
db巴 (
110_mA) (110_mA) (110_mA)
with
inrangesp
ecifi
edinStep1) SFx= '
._ =1，
5 Okay SFy= .__ =1，
67 Okay SFz= '
. _.
' =2，
5 Okay
(73_mA) (66_mA) (44_mA)

LogSFx=0，
17609 L09SFy=0，
22272 LogSFz=0，
39794
6 Numbero frevo
lutio
nsf
orDUT 4000 400 40
(Deviceundertes
t)
。。可︿河一の工↓

ω
4
7 Numberofsparksassumedf
orabove 16000 1600 160
numbero
fr e
voluti
ons

∞
8 DUTt es
tedf
ornumberofrev
oluti
ons Nx=6i
gni
tio
n Ny=1i
gni
tio
n Nz=1i
gni
tio
n
atStep6andnumbero fig
nitio
ns
obtained
9 P
robab
ilit
ybasedonnumbero f
i
gni
tionspersparkobtained =
ー一(
一6一
)一一=3.75X10.4 Py=ーーー一一=6，
25x10
・4 pz=
一一 一
一 =6.
25x10
・3
16000 1600 160

3，
LogPX=- 42597 LogPy=.
3，20412 Logpz=-
2，20412
10 P
oss
ibl
ecompliancer
esu
lt -0，Pyt0，pzt0，t
PXi her
efo
recontinuet
oStep1
1
1
1 Simplec i
rcu
it(madeupo flabora
tor
y Na=10i
gni
tio
ns Nb=3i
gni
tio
ns Nc=32i
gni
tio
ns
powersupplyandc u
rrentlimi
ting
resi
stor)test
edasprovidedinStep8
above，andnumbero fignit
ions
obtained
12 Probab
ilit
ybasedonnumbero f 10 3 32 __ ， _
.，
igni
tionspersparkobtainedf
orth
e Pa=ーーー一一ー=6，
25x10
・4 Pb=一
一一一
一 =1，
88x10
・3 Pc=
一一 一
一 =2.0x10'
simplecirc
uit 16000 1600 160

LogPa=-
3，20412 LogPb=-
2，72584 LogPc=-
0，69897
13 Compliancec
alc
ula
tio
n TheDUThasn
otpassedbecause:
(
Io 3，
gPx)ζ(IogPy)?Yes，because - 42597<-
3，20412
 AccessedbyJKCI
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Step# Description Column‘

x' Column'
y' Column'
z'

(
IogpY-l
ogP
x)三 (
IogPb-IogPa)?
NO，because卜3，
20412+3， =
42597 +0，
22185)n
otg
rea
terthan卜2，
72584+3， =
20412 +0，
47828)

(logPy-logPx) (logPz-logPy)
〉 つ
(
IogSFy-IogSFx) (IogSFz-IogSFy)

{(-W
NO，because' __
-:.
_-
_
仰 +3，間97)
-
__ _. ___. 4，
}
r
75766 notgreaterthan' .
I -
{
(
ー
2，
2附 2+3， 加 問
_____. ____
__， -5，
70711
}
(0，
22272-0，
17609)' • (0，
39794-0，
22272)
口O 勺︿刀-Q工

4
ω
ω
↓
 140

0
10

•
1
0.1 /7

，/
z
o--

・
-Z 四一﹄O ﹀﹄↑一一-D偲20﹄且

1
0-2 J

一一+ー Pr-Simplec
irc
uit

1/ ， -
-回
.
Pr.TableH.3.PASS
Pr TableH.4-FAIL
"
.
， #
骨

1
0-3 ~

1
0-4 ・
2
意思c

1
0-' 一一一一一一
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10
S
afe
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oro
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