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GIXS - Hands-On Data Analysis. Joe Strzalka Beamline 8 - ID - E Time - Resolved Research, X - Ray Science Division Advanced Photon Source PDF
GIXS - Hands-On Data Analysis. Joe Strzalka Beamline 8 - ID - E Time - Resolved Research, X - Ray Science Division Advanced Photon Source PDF
GIXS - Hands-On Data Analysis. Joe Strzalka Beamline 8 - ID - E Time - Resolved Research, X - Ray Science Division Advanced Photon Source PDF
Joe
Strzalka
Beamline
8-‐ID-‐E
Time-‐Resolved
Research,
X-‐ray
Science
Division
Advanced
Photon
Source
strzalka@anl.gov
630-‐252-‐0283
Outline
2.2 m GISAXS
upstream
0.2
m
GIWAXS
GIWAXS:
mostly
in
air,
0.2
m,
vacuum
for
Undulator-‐based
(2
x
APS
Undulator
A;)
thermal
annealing
(qz,
qy
<
2.2
Å-‐1
)
Single
bounce
monochromator
(fixed
E)
Pilatus
1M
fast
opOon,
135
frames/sec
–
7.35keV
[Si(111)]
High-‐resoluOon
reflecOvity
for
qz
<
0.2
Å-‐1
No
focusing,
high
q-‐space
resoluOon
Sample
environment
Typical
flux:
5x1010
photon/s
100
(h)
x
50
(v)
μm2
– Vacuum
sample
chamber
(-‐20
to
230
°C)
Transverse
coherence
length:
5
(h)
x
140
(v)
μm2
– High-‐temperature
oven
(750
°C)
in
air
– XPCS
with
contrasts
of
~40%
– Humidity
controlled
chambers
GISAXS:
Adjustable
vacuum
flight
path
length
– Filmetrics
UV
for
thickness
monitor
(1.5
–
2.2m)
→qmax
≈
0.14-‐0.2
Å-‐1
Liquid
scauering
geometry
(Olt
<
0.5°)
– Langmuir
trough
2014
ACA
MeeOng:
WK02
GISAXS
Theory
&
Analysis
Z.
Jiang,
X.
Li,
J.
Strzalka,
et
al;
J.
Synchr.
Rad.
19
627-‐636
(2012).
3
Grazing Incidence X-ray Scattering (GIXS)
conventions
area
detector
pixels
↔
"
in-‐plane:
"↓%
out-‐of-‐plane:
"↓&
0
10
1
0.8
ReflecOvity
from
a
~800nm
polymer
-1
10 film
supported
on
Si
0.6
Reflectivity
0.2
Wave
guide
effect
– One
criOcal
angle
for
the
polymer
-3 0
film
αcp
10 0.02 0.025 0.03 0.035
qz (A -1) – One
criOcal
angle
for
the
Si
support
αcSi
qz
resolu,on
<
0.001
A-‐1
-4
10
– GIXS
usually
αcp
<
αi
<
αcSi
(penetrate
thin
film
but
not
substrate
→
surface
-5
resolve
films
up
to
1
μm
thick!
sensiOvity)
10
0.02 0.04 0.06 0.08 0.1 0.12 0.14 0.16 0.18 0.2
qz (A-1)
5
GIWAXS by Inspection: Ordering
GIWAXS
from
pBTTT
isotropic
as
cast
textured/oriented
with
broad
distribuOon
highly-‐oriented annealed
Adapted from DeLongchamp, Kline, Fisher, Richter, and Toney, Adv. Mater. 23 319-‐337 (2011).
P3HT GIWAXS
Crystal
Structure
Edge-‐on
Face-‐on
Adapted from DeLongchamp, Kline, Fisher, Richter, and Toney, Adv. Mater. 23 319-‐337 (2011).
+
VerOcal
linecut
→
out
of
plane
structure
Linewidths
correspond
to
grain
size,
but
Horizontal
linecut
→
in
plane
structure
can
also
be
affected
by
disorder.
The
experimental
width,
Δqexp,
must
be
corrected
for
the
resoluOon
Δqres
Δqhkl
=
((Δqexp)2–
(Δqres)2)1/2
The
resoluOon
is
dominated
by
the
geometry
of
the
area
detector,
related
to
the
angular
resoluOon,
Bres.
For
qz
direcOon:
Δqres=
(4π/λ)cos(αf/2)(Bres/2)
Diagram:
www.gisaxs.de
Prof.
Andreas
Meyer,
U.
Hamburg
YHL_temp1_P3HTbPFOp172_th0.15_cool_100c_001_GapFilled.tif YHL_temp1_P3HTbPFOp172_th0.15_cool_100c_001_GapFilled.tif
100
200
30
300
25
400
20
α (deg)
y pixel
500
f
600 15
700 10
800 5
900 0
1000
Diagram:
www.gisaxs.de
Prof.
Andreas
Meyer,
U.
Hamburg
YHL_temp1_P3HTbPFOp172_th0.15_cool_100c_001_GapFilled.tif YHL_temp1_P3HTbPFOp172_th0.15_cool_100c_001_GapFilled.tif
100
2
200
300
400 1.5
~"↓& (Å↑−1 )
qz (A-1)
y pixel
500
1
600
700
0.5
800
900 0
1000
Diagram: www.gisaxs.de
Map of constant qr values in pixel space. Prof. Andreas Meyer, U. Hamburg
YHL_temp1_P3HTbPFOp172_th0.15_cool_100c_001_GapFilled.tif
6
1.357
81
6
1.6275
1.08
1.898
0.
100
2
200
55
54
0.
300
0.54
400 1.5
55
0.816
1.0865
1.357
0.2
qz (A-1)
y pixel
1.627 5
500
1.898
75
1
600
0.5455
2.1685
0.275
700
0.5
800
0.816
1.0865
0.275
1.357
900 0
1.898
1000
6
1.357
81
6
1.6275
1.08
1.898
0.
1.8
2
1.6
55
54
0.
1.4
0.54
1.2 1.5
55
0.816
qz (A-1)
1.0865
1.357
0.2
qz (A-1)
1
1.627 5
1.898
75
0.8 1
0.5455
2.1685
0.275
0.6
0.5
0.4
0.816
0.2
1.0865
0.275
1.357
0
1.898
0
0 0.5 1 1.5 2
-1 -2 -1.5 -1 -0.5 0
qr (A )
-1
qy (A )
Features
at
constant
qr
follow
straight
lines.
Features
follow
contours
of
equal
2014
ACA
MeeOng:
WK02
GISAXS
Theory
&
Analysis
"↓+ = √"↓) ↑2 +"↓% ↑2
15
Representing GIWAXS data
1.8 1.66
1.6
1.33
1.4
χ
1.2
q / A-1
1.00
qz (A-1)
0.8
0.66
0.6
0.2
0 0.00
qr
0 0.5 1 1.5 2 10 20 30 40 50 60 70 80 90
qr (A ) -1 chi / deg
Rogers, Schmidt, Toney, Kramer, and Bazan, Adv. Mater. 23 2284-‐2288 (2011).
Baker; Jimison; Mannsfeld; Volkman; Yin; Subramanian; Salleo; Alivisatos; Toney; Langmuir 26, 9146-‐9151 (2010).
GIXSGUI by Zhang Jiang is a Matlab package for GIXS data visualizaOon and reducOon.
GIXSGUI by Zhang Jiang is a Matlab package for GIXS data visualizaOon and reducOon.
Under
development:
• ReflecOon
indexing
YHL_temp1_P3HTbPFOp172_th0.15_cool_100c_001_GapFilled.tif
-570
470
370 270
-170
170
-560
1.5 460 360 260 -160
160
060
-550
(A-1)
450 350
-1
250 150
qz (A
-540 440
1 340 240 140 040
-520
0.5 420 320 220 120 020
-2 -1.5 -1 -0.5 0
Available
for
download
(requires
Matlab
license
to
run):
hup://www.aps.anl.gov/
-1
q (A )
y y
-1
Sectors/Sector8/OperaOons/GIXSGUI.html
2014
ACA
MeeOng:
WK02
GISAXS
Theory
&
Analysis
21
References
“Microstructural
CharacterizaOon
and
Charge
Transport
in
Thin
Films
of
Conjugated
Polymers,”
Alberto
Salleo,
R.
Joseph
Kline,
Dean
M.
DeLongchamp,
Michael
L.
Chabinyc
“Molecular
CharacterizaOon
of
Organic
Electronic
Films,”
Dean
M.
DeLongchamp,
R.
Joseph
Kline,
Daniel
A.
Fisher,
Lee
J.
Richter,
Michael
F.
Toney,
Adv.
Mater.
23(3)
319-‐337
(2011)
“QuanOtaOve
DeterminaOon
of
Organic
Semiconductor
Microstructure
from
the
Molecular
to
the
Device
Scale,”
Jonathan
Rivnay,
Stefan
C.
B.
Mannsfeld,
Chad
E.
Miller,
Alberto
Salleo,
Michael
F.
Toney,
Chem.
Rev.
,
112(10)
5488-‐5519
(2012).
“QuanOficaOon
of
Thin
Film
Crystallographic
OrientaOon
Using
X-‐ray
DiffracOon
with
an
Area
Detector,”
Jessy
L.
Baker,
Leslie
H.
Jimison,
Stefan
Mannsfeld,
Steven
Volkman,
Shong
Yin,
Vivek
Subramanian,
Alberto
Salleo,
A.
Paul
Alivisatos
and
Michael
F.
Toney,
Langmuir,
26(11)
9146-‐9151
(2010).
“Structural
Order
in
Bulk
HeterojuncOon
Films
Prepared
with
Solvent
AddiOves,”
James
T.
Rogers,
KrisOn
Schmidt,
Michael
F.
Toney,
Edward
J.
Kramer
and
Guillermo
C.
Bazan,
Adv.
Mater.
23(20)
2284-‐2288
(2011).
“Scherrer
grain-‐size
analysis
adapted
to
grazing-‐incidence
scauering
with
area
detectors,”
Detlef
Smilgies,
J.
Appl.
Cryst.
42
1030-‐1034
(2009).
"Hierarchical
Nanomorphologies
Promote
Exciton
DissociaOon
in
Polymer/Fullerene
Bulk
HeterojuncOon
Solar
Cells,”
Wei
Chen,
Tao
Xu,
Feng
He,
Wei
Wang,
Cheng
Wang,
Joseph
Strzalka,
Yun
Liu,
Jianguo
Wen,
Dean
J.
Miller,
Jihua
Chen,
Kunlun
Hong,
Luping
Yu,
Seth
B.
Darling,
Nano
Le7.
11(9)
3707-‐3713
(2011).
Joseph
Strzalka
strzalka@aps.anl.gov
GIXSGUI
by
Zhang
Jiang
Downloading GIXSGUI
GIXSGUI
is
a
Matlab
package
available
for
download:
www.aps.anl.gov/Sectors/Sector8/OperaOons/GIXSGUI.html
Use
requires
license
for
Matlab
(DistribuOon
2010a
or
newer).
29
30
Se‹ngs
on
previous
slide
produce
the
Constrained
Image
(leT)
and
the
linecut
(right)
below.