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Fault Tree Analysis (FTA)
Fault Tree Analysis (FTA)
dec/jan 19
for reliability leaders and asset managers
DECEMBER/JANUARY 2019
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Using Quantitative Fault
Tree Analysis Based on
Method of Cut Sets to
PREDICT
FAILURE
36 dec/jan 19
Fault tree analysis (FTA) is being widely used
in any type of study that requires quantifying
frequency or probability
O
riginally, the intent of fault tree analysis (FTA) was to assess structural, control systems, subsystems, etc. It is also essential to know the
equipment reliability in the space industry. Nowadays, clients desire to perform an FTA, without falling into the trap of providing an
FTA is being widely used in any type of study that requires excessive amount of details, which can be useless for the client.
quantifying frequency or probability, or just for deductive The FTA should take the exact level of detail needed, which is normally
representation of events that, when triggered, result in an the equipment level. The internal design of a piece of equipment has a very
occurrence of a top event. This article summarizes FTA quan- low chance of redesign and requires specific expertise to assess internal com-
tification using the method of cut sets (MOCUS) and describes the methods ponents. Therefore, exploring detailed components may not always be the
of Birnbaum, criticality and Fussell-Vesely. best approach, especially during the initial engineering stages. Figure 1 shows
a simple example of a general FTA and its Boolean equation.
Background According to the American Institute of Chemical Engineers Center for
Chemical Process Safety (AIChE/CCPS), these assumptions should be consid-
FTA can be developed as far down as the analyst requires. The analyst ered during FTA development:
must have a logical mind and the ability to understand and visualize the logic
structure and the interactions of operability, chemical, electrical, mechanical, All failures are binary, meaning two states: operating or failed;
Instantaneous transition between each state, meaning no delays;
Statistically independent events;
dec/jan 19 37
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operational
excellence
Cut Sets and Minimal Cut Sets Combination Cut Sets Super Cut Sets Minimum Cut Sets
1 {C, E} {C, E} {C, E} {C, E}
A cut set is a set of basic events whose occurrence would trigger a top 2 {C, D} {C, D} {C, D} {D}
event. A minimal cut set is a combination of basic events that trigger the 3 {D, E} {D, E} {D, E}
top event. Minimal cut sets are used to calculate probabilities of events and, 4 {D, D} {D} {D}
consequently, the top events probability or frequency. The probability of the 5 {C, D, E} {C, D, E} {C, D, E}
top event is calculated based on the probability of the Boolean sum of the
6 {C, D, E, D} {C, D, E}
minimal cut sets probabilities. The cut sets for the previous Figure 1 are rep-
resented by {A} and {B}.
The following sections exemplify the cut sets and minimum cut sets Top Event Probability Based on Minimum Cut Sets
calculation for the FTA provided in Figure 2, which includes the Boolean equa- The top event probability is calculated as follows:
tion solution.
1. Combine basic events within minimal cut sets using an AND gate.
2. Combine minimal cut sets using an OR gate.
Definition of the Cut Sets
The top event P is triggered if the following combination of events occurs: {D} P{D} = 8.0E-01
{C, E} P{C,E} = P{C} * P{E} = 9.0E-01 * 7.0E-01
C and E occur {C, E} Top Event P{P} = P{D} + P{C,E} (P{D} * P{C,E})
C and D occur {C, D}
D and E occur {D, E} Event Sensitivity
D and D occur {D, D}
C, D and E occur {C, D, E} Event sensitivity using Birnbaum, criticality and Fussell-Vesely is used
C, D, E and D occur {C, D, E, D} to evaluate the basic event criticality to the top event probability. This is per-
formed following these tasks:
Using the correct representation of cut sets, Boolean simplification
(numbers 4 and 6 in the following list) and super cut sets would look like this: 1. Calculate the top event frequency assuming the one basic event has
completely failed (P=1).
2. Calculate the top event frequency assuming the one basic event is
operating (P=0).
38 dec/jan 19
Table 1 Event Sensitivity
Top Event Probability Top Event Probability
Birnbaum Fussell- Event
Basic Event Probability Assuming Basic Event Assuming Basic Event
Factor Vesely Factor Sensitivity
Completely Failed (P=1) Is Operating (P=0)
D 8.0E-01 1.0E-00 6.30E-01 0.37 0.296 54.01%
C 9.0E-01 9.4E-01 8.00E-01 0.14 0.126 22.99%
E 7.0E-01 9.8E-01 8.00E-01 0.18 0.126 22.99%
The cut sets criticality assessment shows that the minimum cut set {D} The next chapter...
has an 86.39 percent criticality, while the minimum cut set {C, E} is 68.03
percent. Baker Instruments has a new home
Baker Instruments, the industry leader in high-voltage electric
Advantages of MOCUS motor test equipment, is now a part of the Megger family. Fitting
An FTAs top event can be calculated considering different methods, right into Meggers comprehensive range of electrical testers, our
such as Boolean mathematics, Monte Carlo simulation, Markov chain, MO- on-line and off-line motor analyzers deliver everything you need for
CUS, etc. Depending on the complexity of the FTA, Monte Carlo methods predictive maintenance, motor repair and motor OEM production.
might take excessive amounts of effort to achieve convergence. Boolean Learn more at
math might become too complex to solve and Markov chain might not be
www.megger.com/baker
adequate to consider all types of failures.
or call 970-282-1200
As demonstrated, MOCUS is a deterministic solution that requires less
Baker Instruments
computer efforts to calculate the top events probability or frequency, thus
reducing error probability and taking less time to obtain the results.
dec/jan 19 39