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    View004: 200 M 200 M 200 M 200 M

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    This document is an electron microscope image and analysis of a sample. It includes the instrument details, acquisition parameters, image of the sample at 200 micrometers, and an elemental analysis identifying carbon at 30.72% mass and silicon at 32.38% mass. The sample is identified as being composed of carbon and silicon dioxide.

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    View004: 200 M 200 M 200 M 200 M

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    bon
    25 views1 page
    This document is an electron microscope image and analysis of a sample. It includes the instrument details, acquisition parameters, image of the sample at 200 micrometers, and an elemental analysis identifying carbon at 30.72% mass and silicon at 32.38% mass. The sample is identified as being composed of carbon and silicon dioxide.

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    SEM Example

    Original Title

    SEM

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    This document is an electron microscope image and analysis of a sample. It includes the instrument details, acquisition parameters, image of the sample at 200 micrometers, and an elemental analysis identifying carbon at 30.72% mass and silicon at 32.38% mass. The sample is identified as being composed of carbon and silicon dioxide.

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    © All Rights Reserved
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    25 views1 page

    View004: 200 M 200 M 200 M 200 M

    Uploaded by

    bon
    This document is an electron microscope image and analysis of a sample. It includes the instrument details, acquisition parameters, image of the sample at 200 micrometers, and an elemental analysis identifying carbon at 30.72% mass and silicon at 32.38% mass. The sample is identified as being composed of carbon and silicon dioxide.

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    © All Rights Reserved
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    of 1

    JEOL 1/1

    View004
    Title : IMG1

    ---------------------------

    Instrument : JCM-6000

    Volt : 15.00 kV

    Mag. : x 220

    Date : 2017/08/30

    Pixel : 512 x 384

    SEM2_002

    200
    200 µm
    µm
    SEM2_002
    Acquisition Parameter
    80000
    Instrument : JCM-6000
    SiKa

    70000
    Acc. Voltage : 15.0 kV
    60000
    Probe Current: 1.00000 nA
    50000 PHA mode : T3
    Counts

    40000 Real Time : 110.64 sec


    OKa

    30000 Live Time : 100.00 sec

    Dead Time : 9 %
    CKa

    20000
    Counting Rate: 11642 cps
    10000
    Energy Range : 0 - 20 keV
    0
    0.00 0.40 0.80 1.20 1.60 2.00 2.40 2.80

    keV
    ZAF Method Standardless Quantitative Analysis(Oxide)

    Fitting Coefficient : 0.0502

    Total Oxide : 24.0

    Element (keV) Mass% Sigma Mol% Compound Mass% Cation K

    C K 0.277 30.72 0.08 68.93 C 30.72 0.00 5.9464

    O 36.89

    Si K 1.739 32.38 0.09 31.07 SiO2 69.28 12.00 94.0536

    Total 100.00 100.00 100.00 12.00

    JED-2300 AnalysisStation

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