This document contains 4 questions related to digital system design and embedded systems. Question 1 asks to explain digital system design using CPLDs and FPGAs. Question 2 asks to describe PAL design aspects and explain the Kohavi algorithm. Question 3 asks to explain fault detection and location in sequential circuits and describe Hamming experiments and synchronizing experiments. Question 4 asks about the properties of the Boolean difference method and how to diagnose various faults in sequential circuits.
This document contains 4 questions related to digital system design and embedded systems. Question 1 asks to explain digital system design using CPLDs and FPGAs. Question 2 asks to describe PAL design aspects and explain the Kohavi algorithm. Question 3 asks to explain fault detection and location in sequential circuits and describe Hamming experiments and synchronizing experiments. Question 4 asks about the properties of the Boolean difference method and how to diagnose various faults in sequential circuits.
This document contains 4 questions related to digital system design and embedded systems. Question 1 asks to explain digital system design using CPLDs and FPGAs. Question 2 asks to describe PAL design aspects and explain the Kohavi algorithm. Question 3 asks to explain fault detection and location in sequential circuits and describe Hamming experiments and synchronizing experiments. Question 4 asks about the properties of the Boolean difference method and how to diagnose various faults in sequential circuits.
Study of The Metal Filling Impact On Standard Cells and Their Associated Interconnects Using Ring Oscillators: Definition of The Metal Fill Corner Concept