Professional Documents
Culture Documents
Ian Appelbaum: Electrical and Computer Engineering University of Delaware
Ian Appelbaum: Electrical and Computer Engineering University of Delaware
Ian Appelbaum: Electrical and Computer Engineering University of Delaware
Anisotropic
Tunnel
Giant
TMR
Magnetoresistance
GMR
AMR
J
ferromagnet
Spin for Logic: Polarization and Lifetime
Charge: Spin:
e-
e-
e- “0”
“1”
e-
e-
e- e-
polarizer
polarizer
50% 50%
0%
unpolarized
“ballistic”=
without scattering
Magnetization
electrons:
Ferromagnet
Ferromagnet
Si
unpolarized
Ballistic Spin Filtering: an analogy
“Stoner” Metallic
Ferromagnet
Energy unpolarized polarized
EF
>>kBT
Energy
Fermi
Energy
d-band
DOS
FM polarizer
“Fermi’s Golden rule”
distance
Making Hot Electrons: Tunnel Junctions
insulator
Energy
EF eVbias EF
metal metal
Vbias
distance
Band diagram
injector
detector
Energy
Al2O3
CoFe
Al Single-crystal
undoped Si
350 μm n-Si
Al
Cu
NiFe
VE VC1 IC1
Cu
IC2
10 nm
8 nm
Distance
UHV metal wafer bonding
Cu thermal evaporation
NiFe
Device fabrication
undoped‐Si SiO2
a
n‐Si
After UHV Bonding
b
After sawing
c
After silicon etching
After SiO2 removal
Vertical geometry
VE IC1 VC1 IC2
FM
TJ base contact polarizer
In contact
Isolation insulator
TJ emitter
350 μm undoped Si
FM analyzer
n-Si second
collector
4
Band diagram
3.5
2.5
2.0
Energy
1.5
Schottky
Al2O3
1.0
barrier
0.5
CoFe
Al Single-crystal 0.0
undoped Si 35
350 μm n-Si
Al
Cu
25
20
NiFe
15
VE VC1 IC1
Cu
IC2 10
10 nm 5
8 nm 0
-5
Distance -1.6 -1.4 -1.2 -1.0 -0.8 -0.6 -0.4 -0.2 0.0 0.2
Emitter Voltage [V]
Spin-valve effect through 350 μm Si
120
115
110
Si
105 T=150K
100
-200 -100 0 100 200
In-Plane Magnetic Field [Oe]
r r
S || B
Phys. Rev. Lett. 99, 177209 (2007)
Precession in a Perpendicular Field
dS S
= μ × B = − gμB × B = ω × S
dt h
μB
ω=g B
h
Precession in a Perpendicular Field
dS S
= μ × B = − gμB × B = ω × S
dt h
μB
ω=g B
h
Precession in a Perpendicular Field
dS S
= μ × B = − gμB × B = ω × S
dt h
μB
ω=g B
h
g≈2 In Si
μ B = 5.8 ×10 eV / Oe
−9
ω = 2π 2.8 MHz / Oe
Spin Precession
Diffusion and Dephasing frequency g μ Bτ
ΔI c 2 ∝ cos( B)
Measurement axis θ = ωτ h
transit time
h
τ transit =
2 g μ B Bπ
Magnetic Field
injector detector
Wide distribution of
final spin angles at
detector reduces
observed spin
coherence
Diffusion and Drift
∞
ΔI c ∝
∫ P ( x = L, t ) cos(ωt )dt
0
dP d 2P dP P
= D 2 +v − Spin drift-diffusion
dt dx dx τ sf eqn.
( x − vt )2
1 − − t / τ sf
P ( x, t ) = e 4 Dt
e
2 π Dt
Spin precession during transport through 350 μm Si
Collector 2 Current (IC2) [pA]
120
sweep direction
115
110
105
r r
100
S⊥B FM switch
T=150K
-200 -100 0 100 200
Perpendicular Magnetic Field [Oe]
L → AL Ohm’s law
∞ ( L − vt )2
1 − − t / τ sf v →v/A v = μV / L
∫
0 4π Dt
e 4 Dt
cos(ω t )e dt
ω → ω / A2
Phys. Rev. Lett. 99, 177209 (2007)
100
95 100
0.3 0.3
-150 -100 -50 0 50 100 150 -150 -100 -50 0 50 100 150
Perpendicular Magnetic Field [Oe] Perpendicular Magnetic Field [Oe]
0 5 10 15 20 220
80V
210
π
1.8
2π
3π
Dephasing (Eq. 17)
1.5
4π 200
1.2
0.9
190
0.6
-1000 -500 0 500 1000
0.3 Perpendicular Magnetic Field [Oe]
8 10 12 14 16 18 20
Accelerating Voltage [V] cond-mat/0801.1790
“Transit-time” SpinFET
θ = ωτ
Ic2
-0.05 -0.05
-0.05
-300 -200 -100 0 100 200 300 -300 -200 -100 0 100 200 300 -300 -200 -100 0 100 200 300
Magnetic Field B [Oe] Magnetic Field B [Oe] Magnetic Field B [Oe]
200 Oe
D E F
52 56 60
50 54 58
48 52 56
46 50 54
20V 25V 30V
44 48 52
-300 -200 -100 0 100 200 300 -200 0 200 -200 0 200
Perpendicular Magnetic Field [Oe] Perpendicular Magnetic Field [Oe] Perpendicular Magnetic Field [Oe]
1 .0 0
0 .9 5
0 .9 0
spin state
20 25 30 35 40 45 50 55 60
A ccelera tin g V o lta g e [V ]
68 72
80
66 70
78
64 68
76
62 66
74
60 64 72
350 micron
58
62 70 VE=-1.2V,
56 35V 60
58
40V 68
66
55V T=100K,
-200 0 200
Perpendicular Magnetic Field [Oe]
-200 0 200
Perpendicular Magnetic Field [Oe]
-200 0 200
Perpendicular Magnetic Field [Oe] Normalized
to B=0
spectra
Symmetry Breaking Bz
device plane
By
Bz
0.05
Spin Precession Signal [arb]
0.00
-0.05
-200 -100 0 100 200
Magnetic Field B [Oe]
experiment model
90 experiment 1 model
B//=128 Oe B//=128 Oe
85
0
90 1
B//=96 Oe B//=96 Oe
Second Collector Current [pA]
85
B//=64 Oe 1
90 B//=64 Oe
85
0
90 1
B//=32 Oe B//=32 Oe
85
0
90
1
B//=0 Oe B//=0 Oe
85
0
80
-1
75
-300 -200 -100 0 100 200 300 -300 -200 -100 0 100 200 300
device plane
By
Bz
0.05
Spin Precession Signal [arb]
0.00
-0.05
-200 -100 0 100 200
Magnetic Field B [Oe]
Misalignment: 30 degrees
90
1
experiment model
85
B//=128 Oe
0 B//=126 Oe
1
Second Collector Current [pA]
B//=96 Oe 0 B//=94 Oe
80
85 1
80
B//=64 Oe 0
B//=66 Oe
75
85
1
80
0
75 B//=32 Oe B//=35 Oe
-300 -200 -100 0 100 200 300 -300 -200 -100 0 100 200 300
Magnetic Field B⊥ [Oe] Magnetic Field B⊥ [Oe]
Spin Lifetime Measurement
Collector 2 Current [pA] 110
108 105
Perpendicular
60K
4 85K
100K
VOLTAGE
102
Perpendicular 125K
Collector 2 Current [pA]
98
150K
95
96 3
94
92 In Plane
Spin Valve Effect 90
90
88
2
86
84
-300 -200 -100 0 100 200 300 -90 -60 -30 0 30 60 90
88
Collector 2 Current [pA]
86 84 Perpendicular
Collector 2 Current [pA]
Hanle Effect
84
0 50 100 150 200 250
82
80
In Plane
Spin Valve Effect
81
Transit time [ns]
78
78
76
74
-300 -200 -100 0 100 200 300 -60 -50 -40 -30 -20 -10 0 10 20 30 40 50 60
100
Ic
E-Field p-type Ge
electrons
- Mobility
- Diffusion Coefficient
- Minority carrier lifetime
Acknowledgements
Al2O3
CoFe
Al Single-crystal
undoped Si
350 μm n-Si
Al
Cu
NiFe
VE VC1 IC1
Cu
IC2
10 nm
8 nm
Distance
Question 3
Question 4
Question 5