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Iec61340-5-1 2007
Iec61340-5-1 2007
Iec61340-5-1 2007
386 1 (1)
Company Confidential
NET/DO/PSCP/Electrostatics Laboratory
Pentti Heiskanen 22.06.2006
Environmental conditions:
Temperature: 22°C ±1°C Relative humidity: 12% ± 3% Stabilization time: 120 h
Equipment:
Humidity meter Vaisala HM34, s/n W1840018 Oscilloscope Tektronix 744A, s/n B021501
Megger BMM2000ESD, s/n 611-550/040804/1232 Voltage source Trek 610D, s/n 2352
Electrostatic voltmeter Trek 370, s/n 275 Current probe Tek CT-1
Resistance probe, Desco Industries Inc.
Instruments were verified in the beginning of test.
Test methods:
Surface resitivity: Measurements were made in accordance with IEC 61340-5-1. 5 readings of each
sample and side were taken. Median is used as a result.
CDM simulation: Parameters: 1000 V, 16 pF, 35Ω, 75 nH. First phase: Initial potential 1000 V was
applied to the source capacitor 16 pF. Source capacitor was discharged to the metal object. Discharge
waveform was captured with a current transformer and an oscilloscope. This is a reference waveform.
Second phase: Initial potential 1000 V was applied to the source capacitor and then discharged to the
sample. The peak current of the sample is compared to the reference waveform. Results are shown on
a logarithmic scale in terms of current attenuation. Measurements were carried out with 5 Gs/s
sampling rate and bandwidth of 500 MHz (3dB). Reference current was 11.0 A (average of 5 readings).
Current with samples was 10 mA (average of 10 readings).
Test results:
Surface resistivity: min < 5 x 105 Ω, max 7 x 107 Ω, median 5 x 105 Ω
CDM simulation: Current attenuation: > |-50| dB
Conclusions:
Surface resistivity meets IEC 61340-5-1 requirements of electrostatic conductive material.
Attenuation requirements of surfaces in contact with ESDS parts were met in reference with Nokia
MRY02043 (-25 dB minimum current attenuation).
The results relate only to the tested samples. This report shall not be reproduced except in full.