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Kundur1989 PSS
Kundur1989 PSS
4, NOVEMBER 2006
TABLE I
SYNCHRONOUS MACHINE PARAMETERS
TABLE II
VJC SETTINGS
TABLE III
(1) RPC SETTINGS
TABLE IV TABLE V
AVR SETTINGS V/Hz COMPENSATION SETTINGS
TABLE VI
V/Hz LIMITER SETTINGS
C. Automatic Voltage Regulator (AVR)
The AVR output (Out) is generated with the limited error
(E_Lim) from the AVR limiters block (see Figs. 3–5). The AVR
transfer function is
TABLE VII
P/Q LIMITER SETTINGS
(2)
positive when the field current (IFD) is smaller than the limiter
The output of the IFD maximum limiter is set point (IFDMin).
The Min IFD limiter settings are shown in Table IX.
(6) Error Limiter: Fig. 5 shows a detail of error limiter block of
Fig. 4. Its inputs are all limiter outputs (OEL and UEL) together
where is the proportional gain. In this way, the output of the with the error conformed by the error between the limited set
IFD maximum limiter is negative when the field current (IFD) point (Lim_SP) and the controlled voltage (500 kV).
is greater than the limiter set point (IFDMax). The UEL outputs (IFDMin_Lim and P/Q Lim) and the previ-
The IFD thermal limiter sets when the field current (IDF) is ously conformed error are passed by a high value gate (HVG).
greater than the limiter set point (IFDTh) for a longer time than The HVG output and the OEL output (IFDMax_Lim) are passed
Th, with Th equal to by a low value gate (LVG).
The output of the LVG is the limited error output (E_Lim).
This error is the input of the control of AVR.
(7) The logic signal S_OEL sets when any OEL is operated. The
logic signal S_UEL sets when any UEL is operated.
When any limiter is set, it selects one of the three possible
where is equivalent to the energy in the field coil and
values of time constants for the two AVR lead-lag filter. This
the inverse of the equivalent thermal time constant with the
selection is made by setting the corresponding logic signals LL1
field coil warm.
and LL2.
When IFD thermal limiter is set, its output changes from
E. Rectifier
(8)
The SC excitation is of static inverting type. The controlled
rectifier bridge is fed by an auxiliary transformer connected to
to the 500-kV bus. The rectifier transfer function is
(9)
(12)
Fig. 6. AVR. Positive ceiling test. Open loop simulation. Lower traces: mea- Fig. 8(a). AVR. Small signal test. Closed loop simulation. Lower traces: mea-
sured (gray) and simulated (black) AVR Out [p.u.]. Upper traces: measured sured (gray) and simulated (black) AVR Out [p.u.]. Upper traces: measured
(gray) and simulated 1 and 2 (black) EFD [V]. (gray) and simulated 1 and 2 (black) EFD [V].
Fig. 7. AVR. Negative ceiling test. Open loop simulation. Lower traces: mea- Fig. 8(b). AVR. Small signal test. Closed loop simulation. Lower traces: mea-
sured (gray) and simulated (black) AVR Out [p.u.]. Upper traces: measured sured (gray) and simulated (black) UT [p.u.]. Upper traces: measured (gray) and
(gray) and simulated (black) EFD [V]. simulated (black) QT [p.u.].
of AVR and rectifier, inputting to AVR model the test records ulation was made by inputting the test record of the set point
of voltage set point (UT SP), voltage (U500 kV), and reactive pulse (UT SP) to the AVR model.
power (QT) for compensation calculation.
Fig. 7 shows records of a negative ceiling test that was made B. AVR Limiters Tests
by adding a pulse of 0.20 p.u. and 0.2 s of width to the voltage Several AVR tests were made with the RPC out of service to
set point (UT SP). Fig. 7 shows the measured and simulated verify the models of AVR limiters and the associated logics.
AVR output (Out) and the measured field voltage (EFD) to- V/Hz Limiter Test: V/Hz Limiter test was made by changing
gether with the respective simulations made in the same way settings to ; ; and
as for test reported in Fig. 6. .
Fig. 8 shows records of a small signal test that was made by Fig. 9 shows V/Hz limiter test records. The test was made by
adding a pulse of 0.10 p.u. and 0.8 s of width to the voltage adding a pulse of 0.05 p.u. and 20 s of width to the voltage
set point (UT SP). Fig. 8(a) shows the measured and simulated set point (UT SP). Fig. 9(a) shows the measured and simu-
AVR output (Out) and the measured and simulated field voltage lated V/Hz limiter output (SP_Lim) and the measured and simu-
(EFD). Fig. 8(b) shows the measured and simulated terminal lated AVR output (Out). Fig. 9(b) shows the measured terminal
voltage (UT) and the measured and simulated reactive power voltage (UT) and the measured reactive power (QT).
(QT). Simulation was made in open loop, with the interconnected
Simulation was made in closed loop, with the interconnected models of AVR limiters, AVR, and rectifier. Simulation was
models of AVR, rectifier, synchronous machine, and grid. Sim- made by inputting to V/Hz limiter model the test records of
1804 IEEE TRANSACTIONS ON POWER SYSTEMS, VOL. 21, NO. 4, NOVEMBER 2006
Fig. 9(a). AVR. V/Hz limiter test. Open loop simulation. Lower traces: mea- Fig. 10(a). AVR. P/Q limiter test. Open loop simulation. Lower traces: mea-
sured (gray) and simulated (black) V/Hz limiter out [p.u.]. Upper traces: mea- sured (gray) and simulated (black) P/Q limiter out [p.u.]. Upper traces: measured
sured (gray) and simulated (black) AVR out [p.u.]. (gray) and simulated (black) AVR out [p.u.].
Fig. 9(b). AVR. V/Hz limiter test. Open loop simulation. Lower trace: mea- Fig. 10(b). AVR. P/Q Limiter test. Open loop simulation. Lower trace: mea-
sured (gray) QT [p.u.]. Upper trace: measured (gray) UT [p.u.]. sured (gray) QT [p.u.]. Upper trace: measured (gray) UT [p.u.].
speed (N), terminal or stator voltage (UT), and compensated set inputs to limiter error block (see Fig. 4) to conform error signal
point (SP_Com). Also, test record of 500-kV bus voltage (U500 to error limiter block (see Fig. 5).
kV) was the input to limiter error block (see Fig. 4) to conform Max IFD Limiter Test: Max IFD limiter test was made by
error signal for error limiter block (see Fig. 5). changing settings to ;
P/Q Limiter Test: P/Q limiter test was made by changing set- (expressed in pu of IFDN).
tings to (for all : 0, 0.25, 0.75 and Fig. 11 shows Max IFD limiter test records. The test was
1.0 p.u.). made by adding a pulse of 0.05 p.u. and 20 s of width to
Fig. 10 shows P/Q limiter test records. The test was made by the voltage set point (UT SP). Fig. 11(a) shows the measured
adding a pulse of 0.05 p.u. and 20 s of width to the voltage and simulated Max IFD limiter output (IFDMax_Lim) and the
set point (UT SP). Fig. 10(a) shows the measured and simulated measured and simulated AVR output (Out). At first, it can be
P/Q limiter output (P/Q Lim). Fig. 10(b) shows the measured seen the IFD maximum limiter operation followed by the IFD
terminal voltage (UT) and the measured reactive power (QT). thermal operation. Fig. 11(b) shows the measured field current
Simulation was made in open loop, with the interconnected (IFD) and the measured reactive power (QT).
models of AVR limiters, AVR, and rectifier. Simulation was Simulation was made in open loop, with the interconnected
made by inputting to P/Q limiter model the test records of reac- models of AVR limiters, AVR, and rectifier. Simulation was
tive power (QT) and terminal or stator voltage (UT), assuming made by inputting the test record of field current (IFD) to Max
active power (PT) equal to 0. Also, the test records of 500-kV IFD limiter model, and by inputting test records of 500-kV bus
bus voltage (U500 kV) and limited set point (SP_Lim) were the voltage (U500 kV) and limited set point (SP_Lim) to limiter
AGÜERO et al.: SYNCHRONOUS COMPENSATORS: MODELS VERIFIED BY TESTS 1805
Fig. 11(a). AVR. Max IFD limiter test. Open loop simulation. Lower traces: Fig. 12(a). AVR. Min IFD limiter test. Open loop simulation. Lower traces:
measured (gray) and simulated (black) Max IFD limiter [p.u.]. Upper traces: measured (gray) and simulated (black) Min IFD limiter [p.u.]. Upper traces:
measured (gray) and simulated (black) AVR out [p.u.]. measured (gray) and simulated (black) AVR out [p.u.].
Fig. 11(b). AVR. Max IFD limiter test. Open loop simulation. Lower trace: Fig. 12(b). AVR. Min IFD limiter test. Open loop simulation. Lower trace:
measured (gray) IFD [p.u.]. Upper trace: measured (gray) QT [p.u.]. measured (gray) IFD [p.u.]. Upper trace: measured (gray) QT [p.u.].
error block (see Fig. 4) to conform the error signal to error lim- C. Reactive Power Control (Q Control) Tests
iter block (see Fig. 5). Several tests were made with the RPC in service to verify the
Min IFD Limiter Test: Min IFD Limiter test was made by models of RPC, AVR, and rectifier.
changing setting to (expressed in p.u. of Fig. 13 shows RPC test records. The test was made by adding
IFDN). a pulse of 0.2 p.u. and 20 s of width to the RPC set point (QT
Fig. 12 shows Min IFD limiter test records. The test was made SP). Fig. 13 shows the measured RPC set point (QT SP) with the
by adding a pulse of 0.05 p.u. and 20 s of width to the voltage added pulse, the measured reactive power, and the measured and
set point (UT SP). Fig. 12(a) shows the measured and simu- simulated RPC output (UT SP).
lated Min IFD limiter output (IFDMax_Lim) and the measured Simulation was made in open loop, with the interconnected
and simulated AVR output (Out). Fig. 12(b) shows the measured models of RPC, AVR limiters, AVR, and rectifier. Simulation
field current (IFD) and the measured reactive power (QT). Sim- was made by inputting to RPC model the test records of reactive
ulation was made in open loop, with the interconnected models power (QT) and RPC set point (QT SP). Also, test records of
of AVR limiters, AVR, and rectifier. Simulation was made by 500-kV bus voltage (U500 kV) was the input to limiter error
inputting to Min IFD limiter model the test record of field cur- block (see Fig. 4) together with simulated RPC out (UT SP) to
rent (IFD). Also, test records of 500-kV bus voltage (U500 kV) conform the error signal for the error limiter block (see Fig. 5).
and limited set point (SP_Lim) were the inputs to limiter error Fig. 14 shows RPC test records with the operation of P/Q lim-
block (see Fig. 4) to conform error signal to error limiter block iter. Test was made by adding a pulse of 0.2 p.u. and 20 s of
(see Fig. 5). width to the RPC set point (QT SP). Fig. 14 shows the measured
1806 IEEE TRANSACTIONS ON POWER SYSTEMS, VOL. 21, NO. 4, NOVEMBER 2006
Fig. 13. RPC. Small signal test. Open loop simulation. Lower traces: measured Fig. 15. Voltage joint control. Small signal test. Open loop simulation. Lower
(gray) and simulated (black) UT SP [p.u.]. Upper traces: measured (black) QT traces: measured (gray) and simulated (black) QT SP [p.u.]. Upper traces: mea-
SP with added pulse [p.u.] and measured (gray) QT) [p.u.]. sured (black) SP with added pulse [p.u.] and measured (gray) U500 kV [p.u.].
Fig. 14. RPC. Small signal test with UEL operation. Open loop simulation. Fig. 16. Voltage joint control. Out of service of 150-MVAr shunt reactor test.
Lower traces: measured (gray) and simulated (black) UT SP [p.u.]. Upper traces: Open loop simulation. Lower traces: measured (gray) and simulated (black) QT
measured (black) QT SP with added pulse [p.u.] and measured (gray) QT) [p.u.]. SP [p.u.]. Upper traces: measured (black) SP and measured (gray) U500 kV
[p.u.].
RPC set point (QT SP) with the added pulse, the measured re-
active power, and the measured and simulated RPC output (UT VJC set point (SP) and 500-kV bus voltage (U500 kV). Fig. 16
SP). It can be seen that I control does not integrate its error shows VJC records for disconnecting a 150-MVAr/500-kV bus
signal—the RPC output (UT SP) is constant—due to the oper- shunt reactor of substation Henderson. Fig. 16 shows the mea-
ation of S_UEL logic signal that was generated by P/Q limiter sured VJC set point (SP)—constant during test—the measured
operation. Simulation was made in the same way as for the pre- 500-kV bus voltage, (U500 kV) and the measured and simu-
vious test. lated VJC output (QT SP). Simulation was made in the same
way as for the previous test. Figs. 15 and 16 show that simula-
D. Voltage Joint Control (VJC) Tests tions match the tests and display the effect of the slow integra-
Several tests were made with the six SCs in service and in tion of the input error in the VJC output. Also, it can be noted
joint control to verify the VJC model. Fig. 15 shows VJC test that there are other equipments in the grid that affect the 500-kV
records. The test was made by adding a pulse of 0.003 p.u. bus voltage.
and 200 s of width to the VJC set point (SP).
Fig. 15 shows the measured VJC set point (SP) with the added V. CONCLUSIONS
pulse, the measured 500-kV bus voltage (U500 kV), and the The following conclusions can be pointed out.
measured and simulated VJC output (QT SP). Simulation was • The models furnished by manufacturers were valid with
made in open loop, by inputting to VJC model the test records of some corrections.
AGÜERO et al.: SYNCHRONOUS COMPENSATORS: MODELS VERIFIED BY TESTS 1807
• The results of several tests made at SC plant were shown. Jorge Luis Agüero (SM’01) was born in Mar del
Tests were made with SCs in service. Plata, Argentina, on January 31, 1953. He received
the Engineer degree from La Plata National Univer-
• The proposed models reproduce test records with a good sity, Buenos Aires, Argentina, in 1976.
agreement. Since graduation. he has worked in the IITREE-
LAT, a Research and Development University
• The models of VJC, RPC, AVR, and their limiters were de- Institute. He has been Vice-Director of IITREE-LAT
veloped as “user models” for the power system simulation since 2000. He has been a Professor with the
program PSS/E from PT inc. Electrical and Electronic Engineering Department,
Universidad Nacional de La Plata (UNLP), La Plata,
• These models with the corresponding modifications were Argentina, since 1983. He was elected as Vice-Dean
incorporated to the database for dynamic studies of the Ar- of the Engineering Faculty for 1997 to 1998 and re-elected for 1998 to 2001. His
gentinean grid. first research dealt with electronic equipment development for nonconventional
electrical measurements. Currently, his research interests include power system
The controls system described, particularly the VJC and the operation and control as well as transient and dynamic behavior of electric
RPC, will be readjusted in the next work stage. These readjust- power systems, particularly in the modeling and system tests development.
ments are needed to obtain a faster voltage control at 500-kV Mr. Agüero was the Argentina Power Engineering Society Chapter Vice-
Chairman in 1998 and the Chairman in 1999 and 2000.
bus, like those obtained with an HSVC that additionally im-
proves system voltage stability [2]–[4].
Patricia Liliana Arnera (SM’00) was born in
Buenos Aires, Argentina, on April 27, 1958. She
ACKNOWLEDGMENT received the Electrical Engineering degree from the
The authors would like to thank the personnel of Transener Universidad Nacional de La Plata (UNLP), La Plata,
Argentina, in 1981.
SA—the SCs plant owner—for their invaluable collaboration. She is a Professor of power systems with the
They also would like to thank Sr. R. Molina from CAMMESA Electrical Engineering Department, School of En-
gineering, UNLP. She has been IITREE director
for his fruitful comments about models. since 1998. She works for the IITREE-UNLP
studying transient conditions of electrical systems
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gentina, on April 10, 1952. He received the Engineer
Performance of Excitation Control Systems, IEEE Std. 421.2, 1990. degree from Engineering School, La Plata National
[9] IEEE Guide: Test Procedures for Synchronous Machines. Part II—Test University, Buenos Aires, Argentina, in 1976.
Procedure and Parameter Determination for Dynamic Analysis, IEEE Since graduation, he has worked in the En-
Std. 115-1995. gineering Faculty, La Plata National University.
[10] F. P. de Mello and J. R. Ribeiro, “Derivation of synchronous machine He has worked in the IITREE-LAT since 1986, a
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ANDESCOM Congr. IEEE,. Isla Margarita, Venezuela, Sep. 1999. frequency control.