Can Pro

Functional Specification
1 Introduction
1.1 Use of this Document
This document is an appendix of the main document ‘CAN Control System’

(47 92 201 - EPH - 001).
It is written for Project 20 - CT Scanner and describes all P20 specific measurement
and test modes.
1.2 Validity of this Document
This document is valid for the Project 20.
1.3 Definitions and Abbreviations

See main document (47 92 201 - EPH - 001).
Siemens AG Bereich Med EPH_203.001 - Revision 001 Seite 5 von 22

J. Grottel / CTE 7 last change: 04.04.1997
Copyright © SIEMENS AG. All rights reserved. For internal use only. Nur für internen Gebrauch. Alle Rechte vorbehalten.
2 List of Modes
2.1 General
The following list gives an overview over the different types of modes, selectable in
the machine.
There are five basic modes 01 - 05, signed as ‘standard’ (with adjust type 0). These
modes are used for nearly all scanning activities beside adjustment procedures.
For special adjustment procedures, where X-ray is needed, the standard modes are
signed with a special marker called ‘adjust type’ to indicate a specific controller to
execute a specified function while all other controllers ignore any difference.
In some cases, tests are needed to test HW. If these tests need X-ray, they are done
in the same way like adjustments.
If tests do not need X-ray, the mode type 06 is used to indicate, that a special
function is selected. In this case, X-ray exposure is not possible.
Mode Adj./Tes Name Description

Type t Type
00 all unknown used to indicate in Tx0 (table state) that no mode is
loaded (state STANDBY), not loadable
Seite 6 von 22 EPH_203.001 - Revision 001 Siemens AG Bereich Med

last change: 04.04.1997 J. Grottel / CTE 7
2.2 Premeasurement
Type t Type
01 00 PREMEASURE- PREMEASUREMENT is used to prepare the machine
MENT for a scan with exposure:
- the rotating anode is accelerated
- filament (focus) is heated up
standard - the HTP counter within the DMS is preset
with the absolute z-position of the couch
PREMEASUREMENT is always the first mode
before mode type 02, 03, 04 or 05!

2.3 Static

Type t Type
02 00 STATIC Static Mode is a scan without gantry rotation (tube is
in selected position) and without table feed in execute.
standard This mode is used for adjustments only.
02 5A sim. short inverter simulates one short inverter error in the half of the
scan time
02 5B sim. UT P82kV simulates one UT P82kV error in the half of the scan
time
02 5C sim. UT N82kV simulates one UT N82kV error in the half of the scan
time
02 5D sim tube arc time simulates short inverter errors with constant time gaps
while the scan is active
02 5E single pulse check of inverter function
02 5F inv. frequ. adjust adjustment of inverter frequency
02 6A no UDC without inverter voltage
02 A1 Z - adjust used during z-adjust procedure
02 F0 HV test test for the high voltage parts of the machine without
X-ray exposure, filament = off, X-ray = on

2.4 Rot

Type t Type
03 00 ROT MODE ROT Mode (or TOMO) is a scan with gantry rotation
standard (tube rotates with selected speed) and without table
feed in execute.
scan time
time
time
while the scan is active (see T56)
03 91 DLP - adjust used during adjustment of focus alignment
03 A1 Z - adjust used during z-adjust procedure
03 F0 HV test test for the high voltage parts of the machine without
X-ray exposure, filament = off, X-ray = on
03 F1 110% test ACU takes 1.25 times more angle pulses or readings
than selected

2.5 Topo

Type t Type
04 00 TOPO Topo Mode is a scan without gantry rotation (tube is in
standard selected position) and with table feed in execute.
scan time
time
time
04 F1 110% test ACU takes 1.25 times more HTPs than selected

2.6 Spiral

Type t Type
05 00 SPIRAL Spiral Mode is a scan with gantry rotation and with
standard table feed in execute.
scan time
time
time
05 F1 110% test ACU takes 1.25 times more HTPs than selected

2.7 Test Modes
2.7.1 MCU Tests

Mode Adj./Te Name Description end with
Type st Type
06 00 CAN TEST MCU CAN bus will be stress tested in scan XS after
execute between MCU and CIB scantime
01 WD TEST MCU Test of watchdog on MCU board, STOP, Reset

MCU opens STOP_REP if test is
correct, RESET needed
02 STOP TEST MCU Test of STOP circuit on MCU board, STOP, Reset
MCU opens STOP_REP if test is
03 reserved for common tests
05 (application test not yet specified)
06 Start Button Test test of HW input StartPos/Neg 2 x detected

XS
07 Footswitch Test test of HW input FootSwPos/Neg 2 x detected
XS
08 External Trigger test of HW input ExtTrigPos/Neg 2 x detected
Test XS
0A (application test not yet specified)
0B (application test not yet specified)
0C (application test not yet specified)
0D (application test not yet specified)
0E (application test not yet specified)
0F (application test not yet specified)

2.7.2 GPC Tests

Type st Type
06 10 CAN TEST GPC CAN bus will be stress tested in scan XS after
execute between MCU and GPC scantime
controller board
11 WD TEST GPC Test of watchdog on GPC board, GPC STOP,

opens STOP_REP if test is correct, Reset
RESET needed
12 STOP TEST GPC Test of STOP circuit on GPC board, STOP,

GPC opens STOP_REP if test is Reset


2.7.3 RTC Tests

Type st Type
06 20 CAN TEST RTC CAN bus will be stress tested in scan XS after
execute between MCU and RTC scantime
controller board
21 WD TEST RTC Test of watchdog on RTC board, STOP, Reset

RTC opens STOP_REP if test is
22 STOP TEST RTC Test of STOP circuit on RTC board, STOP, Reset
RTC opens STOP_REP if test is
25 FC interface test of the interface to the frequency CS

rotation converter for the gantry rotation,
permanent test
26 max. speed limit test of the maximum speed limit E# which

causes AS or
STOP
27 AP test test of the slot ring and light barrier, XS from RTC
T2B
28 FC interface tilt test of the interface to the frequency CS

converter for the gantry tilt,
permanent test
29 Tilt test test of the tilt limits XS from RTC


2.7.4 PTH Tests

Type st Type
06 30 CAN TEST PTH CAN bus will be stress tested in scan XS after
execute between MCU and PTH scantime
controller board
31 WD TEST PTH Test of watchdog on PTH board, STOP, Reset

PTH opens STOP_REP if test is
32 STOP TEST PTH Test of STOP circuit on PTH board, STOP, Reset
PTH opens STOP_REP if test is
35 Adjust Top automatic adjustment of the top XS from PTH

Support support
36 Adjust Table Top automatic adjustment of the table top XS from PTH
poti (in combination with 38 and 39)
37 FDA Test automatic table top movement to XS from PTH

meet the FDA regulations
38 Adjust TT out Adjust Table Top in OUT position
39 Adjust TT in Adjust Table Top in IN position


2.7.5 PTV Tests

Type st Type
06 40 CAN TEST PTV CAN bus will be stress tested in scan XS after
execute between MCU and PTV scantime
controller board
41 WD TEST PTV Test of watchdog on PTV board, STOP, Reset

PTV opens STOP_REP if test is
42 STOP TEST PTV Test of STOP circuit on PTV board, STOP, Reset
PTV opens STOP_REP if test is
45 Adjust Upper measurement of A/D converter value XS from PTV

Position of the upper position, stored in RAM
46 Adjust Lower measurement of A/D converter value XS from PTV

Position of the lower position, stored in RAM
47 motor brake brake is released in execute and the CS

movement is controlled, permanent
test
48 spindle brake brake is released in execute and the CS

movement is controlled, permanent
test


2.7.6 XRS Tests

Type st Type
06 50 CAN TEST XRS CAN bus will be stress tested in scan XS after
execute between MCU and XRS scantime
controller board
51 WD TEST XRS Test of watchdog on XRS board, STOP, Reset

XRS opens STOP_REP if test is
52 STOP TEST XRS Test of STOP circuit on XRS board, STOP, Reset
XRS opens STOP_REP if test is


2.7.7 DLP Tests

Type st Type
06 90 CAN TEST DLP CAN bus will be stress tested in scan XS after
execute between MCU and DLP scantime
controller board
91 WD TEST DLP Test of watchdog on DLP board, STOP, Reset

DLP opens STOP_REP if test is
92 STOP TEST DLP Test of STOP circuit on DLP board, STOP, Reset
DLP opens STOP_REP if test is
95 DLP dose signal test voltage on D555 (PHIAMP) XS after

test causes dose signal in XRS via DOM scantime
96 Detector selftest of detector collimator XS from DLP

Collimator Test


2.7.8 ZCO Tests

Type st Type
06 A0 CAN TEST ZCO CAN bus will be stress tested in scan XS after
execute between MCU and ZCO scantime
controller board
A1 WD TEST ZCO Test of watchdog on ZCO board, STOP, Reset

ZCO opens STOP_REP if test is
A2 STOP TEST ZCO Test of STOP circuit on ZCO board, STOP, Reset
ZCO opens STOP_REP if test is
A3 reserved for common tests
A4 reserved for common tests
A5 Compensator test selftest of compensator XS from ZCO
A6 Comb test selftest of comb XS from ZCO
A7 Tube Collimator test of tube collimator XS from ZCO

test
A8 analog circuits test test of analog circuits of Z-control XS from ZCO

system
A9 (application test not yet specified)

AA (application test not yet specified)
AB (application test not yet specified)
AC (application test not yet specified)
AD (application test not yet specified)
AE (application test not yet specified)
AF (application test not yet specified)

2.7.9 DOM Tests

Type st Type
06 B0 CAN TEST DOM CAN bus will be stress tested in scan XS after
execute between MCU and DOM scantime
controller board
B1 WD TEST DOM Test of watchdog on DOM board, STOP, Reset

DOM opens STOP_REP if test is
B2 STOP TEST DOM Test of STOP circuit on DOM board, STOP, Reset
DOM opens STOP_REP if test is
B3 reserved for common tests
B4 reserved for common tests
B5 selftest check of internal functions XS from DOM
B6 DOM dose signal dose signal generated by DOM is XS after

test checked by XRS scantime
B7 (application test not yet specified)

BA (application test not yet specified)
BB (application test not yet specified)
BC (application test not yet specified)
BD (application test not yet specified)
BE (application test not yet specified)
BF (application test not yet specified)

2.7.10 ACU Tests

Type st Type
06 C0 CAN TEST ACU CAN bus will be stress tested in scan XS after
execute between MCU and ACU scantime
controller board
C1 WD TEST ACU Test of watchdog on ACU board, STOP, Reset

ACU opens STOP_REP if test is
C2 STOP TEST ACU Test of STOP circuit on ACU board, STOP, Reset
ACU opens STOP_REP if test is
C3 reserved for common tests
C4 reserved for common tests
C5 RCOM memory test of memory on RCOM board XS from ACU

test
C6 (application test not yet specified)
CA (application test not yet specified)
CB (application test not yet specified)
CC (application test not yet specified)
CD (application test not yet specified)
CE (application test not yet specified)
CF (application test not yet specified)

2.7.11 Tests for all controllers

Type st Type
06 F0 CAN TEST ALL CAN bus will be stress tested in scan XS after
execute between MCU and all scantime
controller boards
F1 reserved for common tests
FA reserved for common tests
FB reserved for common tests
FC reserved for common tests
FD reserved for common tests
FE reserved for common tests
FF reserved for common tests


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Functional Specification

1.1 Use of this Document

This document is an appendix of the main document ‘CAN Control System’

1.2 Validity of this Document

This document is valid for the Project 20.

1.3 Definitions and Abbreviations

Siemens AG Bereich Med EPH_203.001 - Revision 001 Seite 5 von 22

Mode Adj./Tes Name Description

Seite 6 von 22 EPH_203.001 - Revision 001 Siemens AG Bereich Med

Siemens AG Bereich Med EPH_203.001 - Revision 001 Seite 7 von 22

Mode Adj./Tes Name Description

02 5E single pulse check of inverter function

02 5F inv. frequ. adjust adjustment of inverter frequency

02 6A no UDC without inverter voltage

02 A1 Z - adjust used during z-adjust procedure

Seite 8 von 22 EPH_203.001 - Revision 001 Siemens AG Bereich Med

Mode Adj./Tes Name Description

03 91 DLP - adjust used during adjustment of focus alignment

03 A1 Z - adjust used during z-adjust procedure

Siemens AG Bereich Med EPH_203.001 - Revision 001 Seite 9 von 22

Mode Adj./Tes Name Description

Seite 10 von 22 EPH_203.001 - Revision 001 Siemens AG Bereich Med

Mode Adj./Tes Name Description

Siemens AG Bereich Med EPH_203.001 - Revision 001 Seite 11 von 22

2.7 Test Modes

2.7.1 MCU Tests

01 WD TEST MCU Test of watchdog on MCU board, STOP, Reset

03 reserved for common tests

04 reserved for common tests

05 (application test not yet specified)

06 Start Button Test test of HW input StartPos/Neg 2 x detected

Seite 12 von 22 EPH_203.001 - Revision 001 Siemens AG Bereich Med

2.7.2 GPC Tests

11 WD TEST GPC Test of watchdog on GPC board, GPC STOP,

12 STOP TEST GPC Test of STOP circuit on GPC board, STOP,

13 reserved for common tests

14 reserved for common tests

15 (application test not yet specified)

Siemens AG Bereich Med EPH_203.001 - Revision 001 Seite 13 von 22

2.7.3 RTC Tests

21 WD TEST RTC Test of watchdog on RTC board, STOP, Reset

23 reserved for common tests

24 reserved for common tests

25 FC interface test of the interface to the frequency CS

26 max. speed limit test of the maximum speed limit E# which

28 FC interface tilt test of the interface to the frequency CS

29 Tilt test test of the tilt limits XS from RTC

2A (application test not yet specified)

Seite 14 von 22 EPH_203.001 - Revision 001 Siemens AG Bereich Med

2.7.4 PTH Tests

31 WD TEST PTH Test of watchdog on PTH board, STOP, Reset

33 reserved for common tests

34 reserved for common tests

35 Adjust Top automatic adjustment of the top XS from PTH

37 FDA Test automatic table top movement to XS from PTH

38 Adjust TT out Adjust Table Top in OUT position

39 Adjust TT in Adjust Table Top in IN position

3A (application test not yet specified)

Siemens AG Bereich Med EPH_203.001 - Revision 001 Seite 15 von 22

2.7.5 PTV Tests

41 WD TEST PTV Test of watchdog on PTV board, STOP, Reset

43 reserved for common tests

44 reserved for common tests