LSS+ Electronic Infobase Edition Version 5.

Forensic analysis of gang, jiggle, or tryout keys. Courtesy

of Hans Mejlshede.

Marks on Ford wafer locks produced by gang, jiggle, or tryout

keys. Courtesy of Hans Mejlshede.

Wear information and tests on pins. Courtesy of Hans Mejlshede.

Wear marks on pins. Courtesy of Hans Mejlshede.

Markings on components by manufacturers. Courtesy of Don Shiles.

Milling marks on pins during manufacture. Courtesy of Don Shiles.

Forensic marks and their observation with proper lighting. Courtesy of

Don Shiles.

Bypass techniques must be known to the forensic investigator. Courtesy

of Hans Mejlshede.

An analysis of latches and bolts may be required. Courtesy of Hans

Mejlshede.

Loids may be utilized to bypass latches and bolts. Courtesy of Hans

Mejlshede.

Virgin areas of the plug will provide an indication that the locks was
picked. Courtesy of Hans Mejlshede.

Normal appearance of pins and what type of marks appear. Courtesy of

Hans Mejlshede.

Forensic marks from the use of a lock pick. Courtesy of Hans Mejlshede.

Pickability or ease with which a lock can be picked. Courtesy of Hans

Mejlshede.

Turning wrench or torque wrench will leave identifiable tool marks.

Courtesy of Hans Mejlshede.

Tool mark comparison. Courtesy of Hans Mejlshede.

Picking marks on wafers from vehicle locks. Courtesy of Hans Mejlshede.

Marks produced by raking. Courtesy of Don Shiles.

Marks produced from keys making contact with pins. Courtesy of Don
Shills.

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(c) 1999-2004 Marc Weber Tobias