LSS+ Electronic Infobase Edition Version 5.

Different marks are created from various lock picks. Courtesy of Don
Shiles.

Chapter 27 Forensic Examination of Keys

Figure 27-1 Key cut by code vs. key cut by hand
Figure 27-2a Cutting wheels
Figure 27-2b Patterns for cutting teeth
Figure 27-3 Factory original code cut keys and duplicates
Figure 27-4 Tool marks from tracing stylus
Figure 27-5 Speed and design of cutting wheel
Figure 27-6 The bitting of a key can be disguised
Figure LSS+2701 Schlage 922 wafer lock diagram and photograph
Figure LSS+2702 A milled blank is made to fit a restricted keyway

Bypass of a Schlage 922 series wafer lock. Courtesy of Don Shiles.

Metal filings at the scene of a safe burglary. Courtesy of Don Shiles.

Investigations may require a determination of whether a key has been

copied. Courtesy of Hans Mejlshede.

Marks from key duplication. Courtesy of Don Shiles.

Chapter 28 General Introduction to Bypass

No Exhibits

Discussion of different bypass techniques. Courtesy of Don Shiles.

Bypass of an American Padlock Series 700. Courtesy of Don Shiles.

Forensic analysis of gang, jiggle, or tryout keys. Courtesy

of Hans Mejlshede.

Marks on Ford wafer locks produced by gang, jiggle, or tryout

keys. Courtesy of Hans Mejlshede.

External bypass of a solenoid using a magnetic field. Courtesy of Don

Shiles.

LSS303: Analysis of bypass techniques, by John Falle

LSS204: Brian Chan on the disassembly of a lock and derivation of the TMK

Chapter 29 Picking
Figure 29-1 Paracentric keyways

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(c) 1999-2004 Marc Weber Tobias