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Cqe Equation
Cqe Equation
G. A. Larsen Consulting
Ops A La Carte
G.A. Larsen Consulting 2/23/2012 1
Discriminate among products
Monitor performance of production process
Manufacturing process improvement
Specification setting
6626A PS
PNEUMATIC SHUTOFF
Fail Pass
False Yield
Good Valid
Failure (1-P)
DUT
Defect
Bad Missed
Valid Rate (P)
Fault
Distribution
of the
Production
Process
Distribution of Distribution of
Test Errors Test Errors
Nominal
G.A. Larsen Consulting 2/23/2012 11
Different ways to assess the performance of a
measurement process
Classical “Gauge R&R”
ISO (International Standards Organization)
DOE/ANOVA
True Value:
The accepted correct value of the parameter being
measured.
Bias:
The difference between the average of repeated
measurements of a parameter on a single DUT, and
the true value.
Standard:
A measurement standard for which the true value is
known.
Accuracy:
The difference between an individual measurement and
the true value. For a measurement to be accurate, both
the bias and the measurement error must be small.
Single
True Value Average
Measurement
Accuracy
20 20
10 10
0 0
Y
Y
-10 -10
-20 -20
-30 -30
-30 -20 -10 0 10 20 30 -30 -20 -10 0 10 20 30
X X
30 30
20 20
10 10
0 0
Y
Y
-10 -10
-20 -20
-30 -30
-30 -20 -10 0 10 20 30 -30 -20 -10 0 10 20 30
X X
G.A. Larsen Consulting 2/23/2012 19
Reproducibility:
The variation in measurements due to all sources of
measurement variation except repeatability.
Repeatability:
The variation of repeated measurements using a single
test system and an individual DUT.
Interaction Repeatability
is a constant
Pi, Oj, (PO)ij, Eijk are iid normal with means of zero and
variances P2 , O2 , PO
2 ,
E2
These are called variance components
G.A. Larsen Consulting 2/23/2012 28
G.A. Larsen Consulting 2/23/2012 29
Measure Symbol
Repeatability E2
Measurement O2 PO
2
E2
Error
S/N Ratio
P2 /
P/T Ratio /(USL LSL)
FAIL PASS
FF
GOOD P(FAIL|GOOD) P(PASS|GOOD) P(GOOD)
1-
MF
BAD P(FAIL|BAD) P(PASS|BAD) P(BAD)
1-
SL TL TU SU
P(FAIL) P(PASS)
X=Y+E 2
E ~ N(0, m ) Test Limits (TL, TU)
Bad MF
USpec
FF
Y
Good
True FF
LSpec
Bad MF
Tl Tu
X = Y + Error
Measured
G.A. Larsen Consulting 2/23/2012 47
SL
P(BAD) =
f ( y )dy
SU
f ( y )dy
TL
P(FAIL) = f ( x)dx
TU
f ( x)dx
SL TU TU
P(PASS, BAD)
P(PASS|BAD) = = P(BAD)
FFindex =
_____Joint_______
P(BAD)*(1 - P(BAD))
MFindex =
____Joint _______
P(BAD)*(1 - P(BAD))
Cost of MF
Cost Ratio = CR =
Cost of FF
SN = SP/Sm
(SU - SL)
K= 2*SP
B= Z 1 SN 2 K
SN
TL = SL + B*Sm and TU = SU - B*Sm
Fail
Re-test without
Ship Pass removal from
fixture
Fail
Fail
43(2), 2001.
MSA when Measurements are Destructive
• “Improving and Applying Destructive Gauge Capability”, Bergeret,
Maubert, Sourd, and Puel, Quality Engineering, 14(1), 2001.
• “Gauge R&R Studies for Destructive Measurements”, De Mast and Trip,
Journal of Quality Technology, 37(1), 2005.
MSA when Metric of Interest is Derived from Other Variables
• “Approving Measurement Systems when Using Derived Values”,
Majeske and Gearhart, Quality Engineering, 18(4), 2006.
Effect of Measurement Error on Control Charts
• “Effect of Measurement Error on Shewhart Control Charts”, Linna and
Woodall, Journal of Quality Technology, 33(2), 2001.
G.A. Larsen Consulting 2/23/2012 57