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NP Chart of Unidades Defectuosas: Sample
NP Chart of Unidades Defectuosas: Sample
5
UCL=4.862
2 2
Sample Count
3 3
22 2
2 __
NP=1.689
1.5
0 LCL=0
0
1 5 9 13 17 21 25 29 33 37 41 45
Sample
2 2
0.5 22 _
P =0.338 1
0.0 LC L=0 0
1 5 9 13 17 21 25 29 33 37 41 45 0.0 1.5 3.0
Sample O bser ved Defectives
12
Fr equency
Low er C I: 27.63
U pper C I: 40.36
30
Target: 30.00 8
P P M Def: 337778
25
Low er C I: 276267 4
U pper C I: 403629
20
P rocess Z: 0.4185 0
0 10 20 30 40 Low er C I: 0.2440 0 10 20 30 40 50 60
Sample U pper C I: 0.5940 % Defective
P Chart of Unidades defectuosas_1
1.0
UCL=0.972
0.8
2 2
0.6 0.6
Proportion
222
0.4 _
P=0.338
0.3
0.2
0.0 LCL=0
0
1 5 9 13 17 21 25 29 33 37 41 45
Sample
2 2
0.5 22 _
P =0.338 1
0.0 LC L=0 0
1 5 9 13 17 21 25 29 33 37 41 45 0.0 1.5 3.0
Sample O bser ved Defectives
12
Fr equency
Low er C I: 27.63
U pper C I: 40.36
30
Target: 30.00 8
P P M Def: 337778
25
Low er C I: 276267 4
U pper C I: 403629
20
P rocess Z: 0.4185 0
0 10 20 30 40 Low er C I: 0.2440 0 10 20 30 40 50 60
Sample U pper C I: 0.5940 % Defective
C Chart of c
6 6
UCL=5.825
4
Sample Count
3 3
2 _
C=1.8
0 LCL=0
0
1 5 9 13 17 21 25 29 33 37 41 45
Sample
C Chart of c
6 6
UCL=5.825
2
4
Sample Count
2
3 3
22 2
2 _
C=1.8
0 LCL=0
0
1 5 9 13 17 21 25 29 33 37 41 45
Sample
Poisson Capability Analysis of c
U C har t P oisson P lot
Sample C ount P er Unit
Expected Defects
2
0.8 3.0
22 _
0.4 U =0.36 1.5
C umulative DP U H istogr am
Fr equency
Low er C I: 1.4295
U pper C I: 2.2372
DP U
M ean DP U : 0.3600 8
0.3
Low er C I: 0.2859
U pper C I: 0.4474 4
M in DP U : 0.0000
0.2
M ax DP U : 0.8000 0
0 10 20 30 40 Targ DP U : 0.6000 0.0 0.2 0.4 0.6 0.8
Sample DP U
14
12
10
Value
0
c 0 1 2 3 >=4
Chart of Contribution to the Chi-Square Value by Category
1.4
1.2
1.0
Contributed Value
0.8
0.6
0.4
0.2
0.0
2 0 >=4 1 3
c
1.2 1.2
UCL=1.165
1.0
Sample Count Per Unit
2
0.8
2
0.6 0.6
222
0.4 _
U=0.36
0.2
0.0 LCL=0
0
1 5 9 13 17 21 25 29 33 37 41 45
Sample
Poisson Capability Analysis of unidad de producción xi
U C har t P oisson P lot
Sample C ount P er Unit
Expected Defects
2
0.8 3.0
22 _
0.4 U =0.36 1.5
C umulative DP U H istogr am
Fr equency
Low er C I: 1.4295
U pper C I: 2.2372
DP U
M ean DP U : 0.3600 8
0.3
Low er C I: 0.2859
U pper C I: 0.4474 4
M in DP U : 0.0000
0.2
M ax DP U : 0.8000 0
0 10 20 30 40 Targ DP U : 0.6000 0.0 0.2 0.4 0.6 0.8
Sample DP U