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On Computing Addition Related Arithmetic Operations Via Controlled Transport of Charge
On Computing Addition Related Arithmetic Operations Via Controlled Transport of Charge
On Computing Addition Related Arithmetic Operations Via Controlled Transport of Charge
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Abstract nology (see for example [14]) show potential for room tem-
perature operation. However SET devices display a switch-
In this paper we investigate the implementation of basic ing behavior that differs from traditional MOS devices. This
arithmetic functions, such as addition and multiplication, provides new possibilities and challenges for implementing
in Single Electron Tunneling (SET) technology. First, we digital circuits.
describe the SET equivalents of Boolean CMOS gates and SET technology introduces the quantum tunnel junction
Threshold logic gates. Second, we propose a set of build- as a new circuit element for (logic) circuits. The tunnel
ing blocks, which can be utilized for a novel design style, junction can be thought of as a ”leaky” capacitor, such that
namely arithmetic operations performed by direct manipu- the ”leaking” can be controlled by the voltage across the
lation of the location of individual electrons within the sys- tunnel junction. Although this behavior at first glance ap-
tem. Using this new set of building blocks, we propose sev- pears similar to that of a diode, the difference stands in the
eral novel approaches for computing addition related arith- scale at which switching occurs. Charge transport though a
metic operations via the controlled transport of charge (in- tunnel junction can only occur in quantities of a single elec-
dividual electrons). In particular, we prove the following:
tron at a time. Additionally, given the feature sizes antici-
-bit addition can be implemented with a depth- network pated for such circuits, the transport of a single electron can
built with circuit elements; -input parity can be com- have a significant effect on the voltage across a tunnel junc-
puted with a depth- network constructed with circuit tion. This implies that transporting a few electrons through
elements and the same applies for counters; mul- a tunnel junction will inhibit further charge transport, mak-
tiple operand addition of -bit operands can be imple- ing it possible to control the transport of charge in discrete
mented with a depth- network using circuit ele- and accurate quantities.
ments; and finally -bit multiplication can be implemented The ability to control the transport of individual electrons
with a depth- network built with circuit elements. in SET technology introduces a broad range of new pos-
sibilities and challenges for implementing computer arith-
metic circuits. In this paper we investigate the computation
of addition related arithmetic operations in SET technology
1 Introduction
by controlling the transport of individual electrons. First,
we briefly present the SET equivalent of two conventional
Feature size reduction in microelectronic circuits has design styles, namely the equivalents of CMOS and thresh-
been an important contributing factor to the dramatic in- old logic gates. Second, we propose a set of building blocks,
crease in the processing power of computer arithmetic cir- which can be utilized for charge controlled computations.
cuits. However, it is generally accepted that sooner or later Third, using the new set of building blocks, we propose sev-
MOS based circuits cannot be reduced further in (feature) eral novel approaches for computing addition related arith-
size due to fundamental physical restrictions [15]. There- metic functions, e.g., addition, parity, counting, multiplica-
fore, several emerging technologies are currently being in- tion, via the controlled transport of charge. Related to these
vestigated [13]. Single Electron Tunneling (SET) [8] is one new schemes we prove that the following holds true:
such technology candidate and offers greater scaling poten-
tial than MOS as well as ultra-low power consumption. Ad-
The addition/subtraction of two -bit operands can be
ditionally, recent advances in silicon based fabrication tech-
computed with a depth- network composed out of
circuit elements1. has an equivalent capacitance of
. Given the approach
The -parity function can be computed with a depth-
presented in [5], we calculate for the junction as
network constructed with circuit elements. (1)
The
counter can be implemented with a depth-
network constructed with
circuit elements. In the equation above, as well as in the remainder of this
for the formulas which determine if a tunnel event will take
The multiplication of two -bit operands can be com- place or not. We will of course correct for this when we
puted with a depth- network with circuit ele- discuss the direction in which the tunnel event takes place.
ments. Generally speaking, if we define the voltage across a junc-
( )
tion as , a tunnel event will occur through this tunnel junc-
The remainder of this paper is organized as follows: Sec-
tion 2 briefly presents some SET background theory, ex-
tion if and only if . If tunnel events cannot occur
in any of the circuit’s tunnel junctions, i.e., ( * +
for all
plaining the basic switching behavior appearing in SET cir- junctions in the circuit, the circuit is in a stable state. For
cuits. Section 3 presents the SET equivalent of the CMOS our research we focus on circuits where a limited number
design style. Section 4 presents the implementation of of tunnel events may occur, resulting in a stable state. Each
threshold gates in SET technology. In Section 5 we propose stable state determines a new output value resulting from
a set of new building blocks for controlled charge transport. the distribution of charge throughout the circuit.
Section 6 proposes new schemes for the calculation of addi- Assuming that a tunnel event is possible, the orthodox
tion and multiplication via the controlled transport of single theory for single electron tunneling (see for example [5]
electrons. Finally, Section 7 concludes the paper with some for a more extensive introduction) states that tunneling is a
final remarks. stochastic process, in which the rate at which tunnel events
occur at !,
temperature is
2 Background - .
1/ 0 (2)
/20
3 5476
Single Electron Tunneling technology introduces the
quantum tunnel junction as a new circuit element. A tun- where is the tunnel resistance (usually ). Note
nel junction consist of two conductors separated by an ex- that a non- !,
temperature implies a lower event rate. As-
tremely thin insulating layer. The insulating layer acts as suming that an individual tunnel event can be described as
an energy barrier which inhibits charge transport under nor- a Poisson process, we can calculate the required delay for 8
mal (classical) physics laws. However, according to quan- a single tunnel event to occur for a given error chance 9 ; :<:
tum physics theory, charge transport of individual electrons as: > ? 9 ;:<: / 0
through this insulating layer can occur if this results in a re-
duction of the total energy present in the circuit. The trans-
8=
+ (3)
port of charge through a tunnel junction is referred to as tun- Given that the minimum amount of transportable charge
neling, while the transport of a single electron is referred to consists of a single electron, there exists a minimum en-
as a tunnel event. Electrons are considered to tunnel through ergy threshold, called the Coulomb energy, which must be
a tunnel junction strictly one after another. present in the circuit so that the transport of a single electron
Rather then calculating for each tunnel junction if a hy- reduces the total amount of energy in the system. Result-
pothetical tunnel event results in a reduction of the circuit’s
energy, we can calculate the critical voltage , which is the
ing, in order to utilize the electron tunneling phenomenon,
all other types of energy must be much smaller then the
voltage threshold needed across the tunnel junction to make Coulomb energy. For thermal energy, this implies that, if
a tunnel event through this tunnel junction possible. For we intend to add or remove charge to a circuit node by
calculating the critical voltage of a junction, we assume a
tunnel junction with a capacitance of . The remainder of
means of tunnel events, the total capacitance attached to
such circuit nodes must be less then for @ !BA5C
tem- ,
the circuit, as viewed from the tunnel junction’s perspective, perature operation, or less then for A(C !B,
(room tem-
1 By circuit element we mean in this context any of the building block perature) operation [10]. This represents a major SET fab-
presented in Section 5. rication technology hurdle as even for cryostat temperature
operation very small circuit features are required to im- ure 2. In the Figure, the upper and lower SET transistor
plement such small capacitors. Another major technology behave as a p-type and an n-type MOS transistor, respec-
challenge comes from the fact that thus far all experimen- tively. Additionally it was suggested in [6] that using p-type
tal circuits have displayed a random offset charge (random and n-type SET transistors as a basis, one can now convert
charge present on circuit nodes), which is assumed to be existing CMOS cell libraries to SET technology.
the result of trapped charge particles in the tunnel junc-
tions themselves or in the substrate. This random charge
V
results in a random additional voltage across tunnel junc- s
perature operations. Given this and the fact that in our in- j2
vestigation we focus on the efficient utilization of the SET Vo
V
behavioral properties we ignore the aspects related to offset i n2
n3
3 CMOS Like SET Gates n-type
transistor j4 V
s
One of the first SET circuits examined in literature is the
SET transistor (see [7] for an early review paper). The SET
transistor consists of two tunnel junctions in series, with a Figure 2. CMOS-type SET inverter.
capacitor attached to the interlaying circuit node, as is dis-
played in Figure 1. The resulting 3-terminal structure can
be seen as being similar to a MOS transistor, such that the The main disadvantage of the approach described above
gate voltage can control the transport of charge through
is that the current transport though an “open” transistor still
consists of a large number of individual electrons “drip-
the tunnel junctions (current ).
ping” through the tunnel junctions. This is obviously a far
V ds slower process then the transport of just one single elec-
Id tron through the same junction, and consequently does not
use the SET technology to its full potential. Therefore, the
Vg
C j1
Id
next step would be to limit the charge transport through an
open transistor to just electron. This results in the princi-
ple of Single Electron Encoded Logic (SEEL), in which the
Cg
C j2
Boolean logic values and are encoded as a net charge of
Vg
and on the circuit’s output node.
However, when the SEEL approach is applied to con-
verted CMOS cells with multiple p-type or n-type transis-
(a) (b) tors in series, the circuits will no longer operate correctly,
as clarified by the following example. Assume a series of
Figure 1. The SET transistor (a) circuit and (b) p-type transistors, of which the one bordering the load
transfer function.
capacitor is open while the other one is closed. This situ-
ation will result in the removal of electron from the load
capacitor, resulting in an incorrect “high” output. Only the
However, unlike the MOS transistor, the current inverter circuit itself will operate correctly under a single
through the SET transistor has a periodic response to the electron encoded logic regime. This implies that CMOS
input voltage . By adding a capacitively coupled bias
type SET logic must encode the Boolean logic values and
voltage to the interlaying node, the transfer function of the as “few” and “many” electron charges. We can therefore
SET transistor can be translated over the axis. conclude that CMOS-type SET logic cannot efficiently uti-
When two SET transistors with different biasing voltages lize the SET features. To circumvent this problem we in-
are combined in a single circuit, we arrive at the CMOS- troduce in the next section SET based threshold logic gates,
type inverter structure proposed in [6], as displayed in Fig- which can operate according to the SEEL paradigm.
4 Threshold Logic Gates 7 : and subtracted from the voltage across
*)
ported from node ' to node , which results in a high output.
C
if
if
(4) The generic threshold gate described above can be used
to implement any threshold function (including the standard
where
are the Boolean in-
Boolean logic gates). However, due to the passive nature
,
%
of this circuit we must apply sufficient buffering between
puts, and are the corresponding
integer weights. The different threshold gates in order to alleviate feedback ef-
linear threshold gate performs a comparison between the fects as well as to maintain correct logic levels [3]. The
weighted sum of the inputs and the threshold
value . If the weighted sum of inputs % CMOS style inverter described in Section 3 can act as a
is greater than or SEEL buffer [1]. A similar non-inverting buffer can also be
equal to the threshold, the gate produces a logic . Oth- derived from the inverter by removing both bias capacitors
erwise the output is a logic . Threshold logic gates are
inherently more powerful then standard Boolean gates [12].
($ and choosing a different set of capacitor values, resulting
in an even smaller buffer.
to occur. This critical voltage acts as a naturally oc- all the Boolean and/or Threshold logic schemes for the com-
curring threshold with which the junction voltage is putation of arithmetic functions can be potentially imple-
V 2p
7 :
%
In this figure, the input signals ! or removed from a charge reservoir. Typically, a charge
are weighted by their corresponding capacitors "
reservoir is a circuit node that is capacitively coupled to
7 :
:
%
# and added to the voltage across the tun- ground. A charge reservoir with a capacitance contain-
nel junction. The input signals
function of the SET transistor.
6.1 Addition & Subtraction If is the maximum number of extra electrons that can
be present in the result electron reservoir,
bits are required to represent this value in binary format.
7
In this subsection we assume binary encoded -
A A % 7 A $% 1
Then, following the base counting rules, any ADC output
%
bit operands, and
% 7
, and propose
$%
an electron counting bit ,
that includes consecutive
is equal to inside an interval
integers, every
integers,
to compute
%
scheme the result of their addition/subtraction.
The basic idea behind the method is first to convert the and otherwise. Thus each bit can be described by a
periodic symmetric function with period . Then each
operands from digital to charge representation, add/subtract
them in charge format, and convert the result back to binary output bit can be computed by a
block that had 9 C
digital representation. been adjusted in order to have a transfer function that copies
Assuming binary operands, the first step in any electron the periodic symmetric function required for the bit position
.
counting process will be to convert a binary integer value
Thus we can implement an -bit ADC using PSF
to its discrete analog equivalent
log Converter (DAC) which follows the general organiza-
using a Digital to Ana-
blocks (the PSF applied at bit position is tuned to exhibits
tion of the one introduced in [4]. As described in Section 5.1 the periodic transfer function corresponding to that bit)
the ) *
circuit (depicted in Figure 4) can be utilized to that operate in parallel on an electron reservoir. Given that
add/remove a number of electrons to/from a charge reser-
we are addressing the particular case of -bit operand ad-
voir. When multiple such ) +* blocks operate in parallel dition, such that
ADC circuit is in the order of
, then the cost of the required
.
on the same charge reservoir, electrons can be added to the
reservoir in parallel. More specific, to convert an operand
77
Summarizing, the electron counting based addi-
% 7
tion/subtraction of two -bit operands can be implemented
$%
, each bit ,
is
connected to the input of an ) * block that
has the with a depth- SET network built with circuit ele-
input hardwired to a bias potential that induces a , * value ments, therefor with an asymptotic complexity mea-
equal with . Therefore, the operand can be encoded as
sured in terms of circuit elements.
$%
at the cost of )
Thus this new DAC scheme has an
*
blocks in “add” mode.
asymptotic com-
a0
MV2 e
0 Charge
PSF s
0
Reservoir
plexity in terms of circuit elements. ’1’
Given the ) +* -DAC encoding scheme described a1
MV2 e
1 PSF s
1
plemented in a straightforward manner. The addition of two sn
PSF
-bit operands and can be embedded in the conversion a n−1 n−1
MV2 e
process if the operands are converted into charge format, via
a total of ) * blocks in “add” mode that share a sin-
’1’
gle charge reservoir. Similar, the subtraction operation, i.e., b0
MV2 e
0
, can also be embedded in the conversion process for
’1’
the same cost. In this case, the ) +* blocks converting
b 1
1
operate in “remove” mode, encoding as , while still MV2 e
’1’
operating on the same electron reservoir.
Once the result corresponding to the addition/subtraction
is available in the charge reservoir as a charge , where bn−1 n−1
MV2 e
’1’
2 By
circuit element we mean in this context any of the building blocks
presented in Section 5. We also assume that all the building blocks have
the same cost, measured in terms of tunnel junctions and capacitors, and Figure 7. Organization of -bit addi-
the same delay. More detailed computations can be also made in order to tion/subtraction circuit.
evaluate the proposed networks in terms of tunnel junctions and capacitors
but such computations are beyond the scope of the paper. We preferred
to use the generic concept of circuit element to keep the discussion imple-
mentation independent and to simplify the derivations. The overall organization of the circuit is depicted in Fig-
ure 7. We note here that in the Figure, the value * of the structure with the ) *
block input hardwired to a po-
) *
blocks has been drawn inside the block to suggest tential that reflects the correct weight for the partial prod-
that it was implemented by properly adjusting the value, uct it processes. This implies that DAC circuits are now
while all inputs
have been fixed to the equivalent of a
connected to the charge reservoir and that the ADC con-
charge reservoir with charge.
verter is adjusted in order to be able to convert values up to
Even though the proposed scheme was meant for addi- , . Thus the multiplication can be implemented
9 C
tion/subtraction it has a broader scope and some of its alter- with a depth-3 network constructed with -input AND
native utilizations are discussed in the following: gates, ) *
blocks, and
blocks. This im-
plies that the overall asymptotic complexity of the multipli-
-bit parity function: The scheme can be applied for cation circuit is in the order of circuit elements.
makes use of the ability to transport a variable number of
(all the inputs are hardwired to a bias potential that
electrons to/from a charge reservoir exhibited by the ) *
induces ,* ) to a charge reservoir that pro-
9 C
structure discussed in Section 5.1 and depicted in Figure 4.
vides input information to one
, molded to have Such a block can transport
,* electrons when * is a
the transfer function equal to inside an interval that
%
built-in constant (can be changed via a circuit parameter,
includes consecutive integers, every integers, and
i.e., value) and is a variable specified by the content
otherwise, i.e., corresponding to parity. Thus the - of a charge reservoir.
parity function can be computed with a depth- net-
=
work constructed with circuit blocks. When com- a0
MV2 e
0
Charge
PSF p0
Reservoir
pared to Boolean and Threshold logic based schemes
quires $%
-input AND gates and one
-input
(an AND-OR implementation of the -input parity re-
$% a1 MV2 e
1 PSF p1
n−1
additional 9
C blocks. Thus the
counter can be implemented with a depth- network
constructed with
circuit elements.
b0 0 Charge
MV2 e Reservoir
’1’
b1
MV2 e
1
Multiple operand addition: The addition scheme can ’1’
be easily extended to support multiple operand addi-
tion by connecting more than DAC circuits to the bn−1 n−1
same electron reservoir and adjusting the ADC con- MV2 e
’1’
verter in order to be able to convert values up to
, , where is the number of operands and
Figure 8. Organization of -bit multiplication
their bit length. Thus the -bit multiple operand ad-
9 C
circuit.
dition can be implemented using ,
and at most
blocks.
)
+* blocks
A #
77
previous section. To utilize that scheme we have to calcu- tive clock value, a number of electrons corresponding to
products ,
late first all the partialwith
7
, the value of the operand, i.e.,
, are added to
$%
-input AND gates.
Subse- 3 Weassume here a level triggered behavior but the scheme can work
quently, each
row of partial products is connected to a DAC with edge triggered policy as well.
the corresponding charge reservoir. This is achieved with
a depth- network with
circuit elements.
)
* blocks each of them assuming as inputs the
bit and having the input hardwired to the equivalent of
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